inject electrons into Agn excited states through the Ag2O conduction band. Because Agn nanocluster ground states are within
the Ag2O bandgap, injected holes are trapped by the oxide layer
(Fig. 2). Independent of electrode separation, the entire applied
voltage is dropped at the emissive junction. The narrow recombination zone leads to the high-frequency enhancement attainable in these discrete single-molecule elements (20).
To probe the time scales relevant to the EL process and
perform logic operations, two consecutive high repetition rate
narrow pulses (25 MHz) were used to initially inject holes then
reinject electrons. EL intensities were recorded as functions of
pulse width, polarity, amplitude, and interpulse delay. Contrary
to dc studies, (20) pulsed excitation introduces polarity; EL is
observed only for positive- followed by negative-pulse combinations. Emission is most enhanced when narrow positive and
negative pulses (3.5 ns, full width half maximum) are sequentially injected within 4 ns of each other. Although some
variability in pulse widths arises in different devices (2.83.5
ns), interpulse delay is always limited by the two pulse widths and
corresponds to the ac enhancement frequency. The first pulse
establishes a field across the junction to inject holes into the
nanoclusters by tunneling through the oxide layer, essentially
concentrating charges in the nanocluster region for a short time.
Because of the junction capacitance and the higher energy
nanocluster excited states relative to the Ag electrode Fermi
level, only when a negative second pulse follows a positive first
pulse can the second pulse reach the nanocluster junction and
directly reinject electrons into the EL-producing Agn nanocluster-excited electronic energy levels. Because the oxide barrier at
the junction prevents direct electron reinjection into the nanocluster ground states, quenching of EL is avoided (Fig. 2).
Obviating the need for a third electrode, the first short pulse acts
as a gate by concentrating holes in and around the active
molecules for a short time. Establishing a field to extract
electrons, the first-pulse amplitude does not interact with discrete Ag nanocluster energy levels, but relates to a probability of
hole injection in the active medium. Acting as a gate in this
two-terminal device, increasing first-pulse amplitude increases
the probability of hole injection in each individual molecule,
thereby increasing total EL (Fig. 3).
When applied within 4 ns of the positive first pulse (gate),
the negative second pulse reinjects electrons into discrete Agn
nanocluster-excited electronic energy levels. When properly
applied, these pulse combinations enable current to flow with EL
resulting from electronhole recombination within each nanocluster. Intrinsically molecular species, different nanoclusters
produce strong EL only when the second-pulse amplitude precisely corresponds to excited-state electronic energy levels.
Because the first pulse is for hole injection, only the second pulse
directly injects electrons into the discrete energy levels of the
single Agn nanocluster junctions composing the recombination
zone. Measurements of EL intensity (IEL) from individual
This paper was submitted directly (Track II) to the PNAS office.
Abbreviation: EL, electroluminescence.
*To whom correspondence should be addressed. E-mail: dickson@chemistry.gatech.edu.
PHYSICS
CHEMISTRY
Edited by Allen J. Bard, University of Texas, Austin, TX, and approved December 12, 2002 (received for review September 9, 2002)
Fig. 1. Microscopic images of an Ag nanocluster junction. (A) Scanning electron micrograph (Hitachi S-3500H, 15-keV electron energy) of a typical silver
nanocluster junction. (B) Optical image (0.2-s charge-coupled device exposure collected with a 1.4 numerical aperture, 100 oil-immersion objective) from the
region bounded by the white box in A. White circles represent the EL areas corresponding to those further magnified in the scanning electron micrograph images
(C and D). Formed in situ by dc excitation (20), ac-excited emission [163-MHz sine wave with 5-Vpp (2.5 V) amplitude] arises from species too small to be observed
with scanning electron micrography (5 nm).(E) Degree of oxidation with distance from the junction as determined with energy dispersive spectroscopy
(ThermoNoran, Middleton, WI, attached to Hitachi S-3500H) from 3-m diameter regions. The poor energy dispersive spectroscopy spatial resolution was
necessary to obtain sufficient signals, but it still clearly indicates a silver-rich junction surrounded by silver oxide between the pure silver electrodes. Numbers
on the curve (AgO ratio) are the inverse of the y axis (OAg ratio) to more clearly indicate approximate AgO atomic ratios in different regions.
ization potential (5.66 eV) (25), and calculated electronic energy levels (26, 27)
of Ag3 all are plotted on the same energy scale to illustrate EL from silver
trimer. Other small nanoclusters also have both visible emission and molecular
energy levels favorable for EL in this device geometry (25). (A) This diagram
shows that holes can be trapped in silver nanoclusters because the hole (h)
is located within the oxide band gap. After the hole is formed by field
extraction, election reinjection causes either nonradiative thermal decay (B) or
excited-state injection with subsequent emission (C) (20). Optimal hole formation and electron reinjection times are found to range between 2.8 and 3.5
ns from two-pulse excitation experiments.
CHEMISTRY
PHYSICS
explicitly shown here, the fundamental data are given in Fig. 3. The
high nanocluster emission onoff ratio is a strong function of
first-pulse (gate) and second-pulse amplitudes and polarity, turning
on only with specific second-pulse voltages. Provided that the
positive first pulse for field-dependent electron extraction (hole
injection) is always added at the prescribed time before the second
pulse, the nonmonotonic IEL-V characteristics enable combination
of several input signal pulses as a composite second pulse to yield
different logic gates. In this manner, AND, OR, NOT, and XOR
gates, as well as complicated combinations of these logic gates,
are readily produced from different molecules within individual
two terminal devices (Fig. 4). Although the output is light and
therefore difficult to propagate to subsequent devices, these optoelectronic devices are an important advance as they use discrete
room-temperature energy levels to form true single molecule logic
devices.
All emissive nanoclusters in all such devices exhibit similar
discrete injection behavior and can perform different logic
operations. Differently designed input pulses can even yield
different operations from the same molecule by being on or off
resonance with EL-producing excited nanocluster energy levels.
For example, one individual EL nanocluster (Fig. 4C, molecule
S) was gated with a 2.2-V first pulse followed by different
composite negative second pulses. Because this particular molecule produces EL when excited with a second pulse of 1.05 V,
but not at 2.1 V, combinations of two signal pulses each either
0.0 or 1.05 V (i.e., 0 or 1, respectively) produce four possible
composite second pulses with amplitudes of 0 V (one combination), 1.05 V (two combinations), or 2.1 V (one combination). Thus, only a 0 combined with a 1 in either channel yields
EL. This nanocluster, therefore acts as an XOR gate with two
0- or 1.05-V input signal pulses overlapped to make one
composite second pulse (Fig. 4, molecule S). Contrary to serial
concatenation of multiple logic gates (typically using eight
standard three-terminal field-effect transistors) to construct one
XOR gate, the single XOR nanocluster between only two
terminals successfully performs the parallel XOR operation.
This same molecule also operates as a NOT gate with more
complex pulse sequences. By repetitively applying a composite
gate pulse consisting of a 2.2-V first pulse 4 ns ahead of a
trailing 1.05-V pulse, single-molecule EL is continuously ob-
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