(Si/SiGe heterostructures
MOSFETs)
by
Research Advisor
prof. BINDHU.B
SiGe MOSFET Technology
Issues in Scaled CMOS
Bandstructure, Transport and Strain
Enhanced Mobility Channels
- Strained Si and SiGe
Process Integration Challenges
CONVENTIONAL MOSFET
Isometric view of
device and
equilibrium band
diagram along
channel
Experimental output characteristics of n-channel and p-channel MOSFETs with 0.1
micron channel lengths. The curves exhibit almost equal spacing, indicating a linear
dependence of ID on VG, rather than a quadratic dependence. We also see that /D is not
constant but increases somewhat with VD in the saturation region. The p-channel
devices have lower currents because hole mobilities are lower than electron mobilities.
BULK Si MOSFETs
μ=qτ /mC
For strained silicon
reduced effective mass (lower mass in transport
direction)
increased relaxation time (fewer states into which to
scatter)
Therefore
--- increased mobility
--- increased velocity
--- increased current
Strained-silicon : improved performance
HETERO STRUCTURES
✔ Cause
changesbandgap
effective mass
mobility
optical properties
STRAIN IN SILICON
Si/SiGe-lattice mismatch
SiGe (larger
lattice
constant)
Si (smaller lattice
constant)
Si/Strained-SiGe/Si Structure
silicon