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Time Domain Reflectometry

Experiment 90 Right Angle Bends

C=

2 A Z0

Cannot resolve single bends, only both bends together


Parasitic C: C 0.8 pF (two bends) C 0.4 pF (per bend), Tc 10 ps C < 0.04pF and Tc < 1 ps.
1
2009 Wolfgang Maichen (Wolfgang@TestTechniques.com)

Real PCB traces are 10 times narrower

Time Domain Reflectometry

Simulating 90 bends Sonnet 2.5D Field Solver


We will model only a single bend (run time, memory restrictions!). Modeling trace & ground plane Box size 15mm (+/-2 line widths on each side), 0.25mm resolution De-embedding structure up to bend (need sufficiently long feed lines to avoid influence of box walls). Calculate reflection (S11), transmission (S21), current distribution Generate Pi-Model PSpice parameters. Need to verify that parameters are largely frequency independent! After that, complete model could be built by concatenating lossy, homogeneous microstrip sections and our bend models.

2
2009 Wolfgang Maichen (Wolfgang@TestTechniques.com)

Time Domain Reflectometry

Simulating 90 bends Sonnet 2.5D Field Solver


simulation box input port

output port
3
2009 Wolfgang Maichen (Wolfgang@TestTechniques.com)

Time Domain Reflectometry

Simulating 90 bends Sonnet 2.5D Field Solver


calibration / de-embedding

trace current
90deg bend - 3mm trace

return current

current crowding on inside bend has less effect than basic calculation would assume.

return current closely follows trace.


4

2009 Wolfgang Maichen (Wolfgang@TestTechniques.com)

Time Domain Reflectometry

Simulating 90 bends Sonnet 2.5D Field Solver

.subckt SON3_8 1 2 GND C_C1 1 GND 0.188067pf C_C2 1 2 0.675044pf C_C3 2 GND 0.188067pf L_L1 1 2 0.269399nh .ends SON3_8

5
2009 Wolfgang Maichen (Wolfgang@TestTechniques.com)

Time Domain Reflectometry

Simulating 90 bends Sonnet 2.5D Field Solver


Spice-Model: parameters virtually frequency independent up to a few GHz. C_C2 from Sonnet output has negligible influence (dominated by L1)

Pi-Model: useful if Tpd << Tr (size << smallest wavelength)

Only excess capacitance causes reflection (measured: approx. 0.40pF):

Cexcess

L 0.269nH = C 2 = 2 0.188 pF = 0.27 pF 2 Z0 50


6

2009 Wolfgang Maichen (Wolfgang@TestTechniques.com)

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