1 2 Analyzing The HV Circuits With The VA62A Analyzing The Horizontal Output Pulse With The Waveform Analyzer 3 4 The TVA92s Horizontal Output Tests Understanding the LC103s In-Circuit Capacitor Test 5 Understanding Horizontal Output Stages of Computer Monitors
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Fig. 1: The horizontal output pulse is responsible for the efficient operation of the TV.
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3) Adjust the vertical volts per division control to the 200 volts position. Switch your time base control all the way down to the video preset position. Push in the horizontal preset button and you will see waveforms that include two lines of video information.
Fig. 3: Two common faulty waveforms which cause problems with the operation of a TV.
lines in the video picture. Look for a shorted secondary power diode, shorted IHVT diodes or shorted windings. The trace time should be clean of any noise before performing the measurements to follow .
How Important Is The Duration Measurement Of The Horizontal Output Transistor Waveform?
Of all the horizontal output transistor waveform parameters, theduty-cycle measurement tells you the most. Because of the many jobs that this critical circuit performs, TV manufacturers carefully specify the horizontal output transistor duty-cycle or time duration in exact microseconds as follows: Retrace time: 11.5 - 16 microseconds Trace time: 47.5 - 52 microseconds They make these specifications for a very good reason. If the time duration (dutycycle) is too short during retrace, speed and excessive voltage will be developed; therefore, excessive power will be dissipated. This generates heat which will cause TV parts damage in time. IMPORTANT: Always refer to the manufacturers' schematic or literature for the particular chassis timing. The Waveform Analyzer is especially equipped to measure portions of a waveform with the DELTA TIME feature.
To make this important measurement: 1. Align the pulse by using the VOLTS/DIVISION and the CAL. knobs so the top of the retrace pulse is on the 100% graticule marking. 2. Select the dual channel mode by pushing the A & B button. 3. Switch the CHANNEL B INPUT COUPLING switch to ground, and align the trace with the VERTICAL POSITION control so it lies on the 10% graticule marking. 4. Press the DELTA TIME button, 5. Adjust the DELTA BEGIN knob so the left-side of the intensified trace aligns with the left-side intersection of the CHANNEL A and CHANNEL B traces (Figure 4).
Increased scan time means increased scan derived power supply levels. The power supply capacitors have a longer time to charge and reach higher voltages. All the circuits are now stressed and must work at this higher voltage.
Isolate Start-up and Shut-Down Problems With The Horizontal Output Pulse
The CRT can be used to watch for an instantaneous start-up pulse. Simply connect the Waveform Analyzer and preset the CRT controls as described earlier. Then, watch the CRT as you apply power to the TV's circuitry. If you see a pulse appear then disappear your start-up circuitry is operating correctly and the set is in the shut-down mode. If this happens, you have to service the chassis in a powered down condition., at either half the normal B+ level, supplied separtately, or reduce the AC input power to half power (60 VAC) and monitor the collector of the horizontal output transistor with your scope.
NOTE: If the chassis uses a switch mode power supply (SMPS) as the B+ source, you need to determine if the SMPS is defective, or if the porblem is on the horizontal output stage. Refer to Tech Tip #205 "Identify SMPS Problems" for information on how to do this.
Fig. 4: The time duration measurement of the retrace puse should be made from the 10% to 10% levels.
6. Adjust the DELTA END knob to align the right-side of the intensified trace with the right-side intersection of the two traces.
3200 Sencore Drive, Sioux Falls, SD 57107
7. Read the digital display directly in microseconds to see that you are within 11.5 to 16 microseconds .
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CAUTION
The HORIZ OUTPUT LOAD TESTS produce flyback voltages at the collector of the chassis horizontal output transistor and the flyback secondaries. Do not come in contact with energized circuit points during the Load Tests. A. Current mA 1. Remove power from the TV. These tests should never be performed with AC power applied to the chassis. The load tests can be performed with the H.O.T. in or out-of-circuit. If you find the H.O.T. is shorted, remove it and proceed with the Load Tests. 2. Connect the RINGER/LOAD TEST leads as follows: black lead to the H.O.T.s emitter or equivalent connection if the H.O.T. is removed, yellow lead to the H.O.T.s collector or equivalent connection if the H.O.T. is removed, and orange to the B+ connection on the flyback. 3. Set the HORIZ OUTPUT TEST selector to HORIZ OUTPUT LOAD TEST mA and note the current reading on
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TVA92
HORIZ OUTPUT TESTS
RINGER TESTS YOKE & FLYBACK SWITCHING XFORMER HORIZ OUTPUT LOAD TEST
uS
mA
TV OFF
TV ON
SUB ON
OVERLOAD
OFF
1.5A MAX
(Orange)
OFF: TVS HORIZ OUTPUT ACTIVE ON: TVS HORIZ OUTPUT SUBISTITUTED
RINGER/LOAD TESTS
DYNAMIC TESTS
1500V MAX
!
ASSIS
FLOATING GROUND 1000V ISO
the LCD. The acceptable range is 5-80mA. 4. A reading of greater than 80mA indicates excessive current. To isolate the defect, disconnect the yellow clip lead from the collector and note the current reading. a) DC leakage is indicated if the current stays above 15mA. The defect is caused by a DC leakage path on the primary side of the flyback, such as a damper diode, retrace capacitor or leaky component in the B+ line. b) AC leakage is indicated if the current falls below 15mA. A defective IHVT, horizontal yoke, or secondary loading can cause a short of this type. ote: A reading close to or above 250mA ndicates a direct DC short to ground, sually caused by a shorted H.O.T. or amper diode. 5. A reading of less than 5mA or dashes indicates an invalid connection or open in the circuit. Be sure the mA reading is within the acceptable range before proceeding to the Dynamic Test.
B.Timing uS 1. Set the HORIZ OUTPUT TESTS selector to HORIZ OUTPUT LOAD TEST uS and note the timing reading on the LCD. 2. The acceptable range is 11.3-15.9uS with a stable reading. 3. A reading that is stable but outside this range indicates a defective timing component. a) A reading that is greater than 15.9uS is likely caused by an open yoke or yoke series capacitor. b) A reading that is less than 11.3uS is likely caused by defective retrace timing capacitors, IHVT, or excessive loading on the secondaries. Note: A few chassis manufactured by NAP may normally return timing readings slightly less than 11.3uS. 4. A reading that is fluctuating indicates that the flyback pulse waveshape contains ringing or multiple pulses. This is likely due to a defective flyback, excessive loading on the secondaries, or leakage.
Note: A few chassis may return a reading that fluctuates from normal to 0.1-0.5uS. This is due to the different impedance in the leads and circuit, not a defect in the set. 5. A reading of dashes (- - -) indicates improper lead hook-up or an open in the circuit. Be sure the pulse time is within the acceptable range before proceeding. II.Horizontal Output Dynamic Tests The three sections of the TVA92s Horizontal Output Dynamic Tests provide a quick and easy B+ voltage measurement, input drive test, horizontal output waveform analysis, and horizontal output device substitution. A. Dynamic B+ and Input Drive Measurements The first Dynamic Test enables you to check the regulated B+ supplied to the horizontal output stage and the input drive to the base of the H.O.T. 1. Remove the H.O.T. from the chassis and connect the Dynamic Test Leads
TEST: mA S
flash ON. If it reads ON, or will momentarily when the set is powering up, a drive signal is present. If it reads OFF there is a defect previous to the base of the H.O.T. This defect does not necessarily need to be repaired before continuing. B. Dynamic H.O.T. Sub & Drive These next steps allow you to substitute for the H.O.T. and operate the TV at full voltage without risking an expensive replacement H.O.T. 1. Set the HORIZ OUTPUT TESTS selector to DEVICE SUB CURRENT. 2. Turn the HORIZ OUTPUT DEVICE SUB & DRIVE slightly on until the SUB ON LED lights and watch the current reading on the LCD. If the current exceeds 500mA, turn the HORIZ DEVICE SUB & DRIVE off. There is likely a defect in the circuit that needs to be repaired before continuing. If the current stays below 500mA turn the knob quickly to the 12 or 1 oclock position (higher for larger sets). Adjust the HORIZ OUTPUT DEVICE SUB & DRIVE control to get normal horizontal deflection without foldover in the center of the CRT display. The current reading may now be over 1A depending on the size of the set. 3. With the HORIZ OUTPUT TESTS selector, check the DCV to see that the power supply is regulating and the PULSE PPV and PULSE TIME uS to measure the amplitude and width of the horizontal output pulse to be sure that the horizontal output stage is operating properly. Repair any problems before continuing. C.Dynamic Horizontal Output Parameter Measurements This final step monitors the horizontal circuits operation at full voltage so you can be sure that it is working properly with the H.O.T. installed. 1. Install a good H.O.T. and reconnect the Dynamic Tests leads as described above. Note: Be sure the HORIZ OUTPUT DEVICE SUB & DRIVE knob is in the OFF position. 2. Apply AC power to the chassis. 3. With the HORIZ OUTPUT TESTS selector, check DCV, PULSE PPV, and PULSE TIME uS for correct values.
MOST LIKELY CAUSES Improper Connections Open Flyback Open Output Stage Circuit Paths
BAD
----
Severe B+ Supply Short Or Leakage Path < 5 mA = Open Flyback Or Circuit Path Open Flyback Improper Collector Connection Open Ringer/Load Fuse No Severe Loading Or Timing Defects Severe B+ Leakage And/Or Flyback Secondary Short Or Leakage Path Flyback Transformer Defective Output Timing Components Flyback Transformer Severe Flyback Secondary Short Or Leakage Path Severe B+ Leakage Flyback Secondary Short Or Leakage Path Flyback Transformer Defective Output Timing Components
GOOD ----
GOOD BAD
BAD
BAD
NOTE: Fluctuating S readout values indicate abnormal flyback pulse ringing or timing.
Table 2: Possible HORIZ OUTPUT LOAD TEST readings and likely causes.
as follows: red to the collector connection, blue to the base connection, and black to the emitter connection or circuit ground. Note: A few chassis do not connect the H.O.T. emitter to ground. In this case, connect the black clip-lead to circuit ground, not the emitter connection. 2. Set the HORIZ OUTPUT TESTS selector to DCV, apply AC power to the chassis, and note the voltage reading on the LCD. This reading should closely match the schematics value for regulated B+. If the reading does not stabilize to this value, turn the HORIZ OUTPUT DEVICE SUB &
DRIVE on just enough so the SUB ON LED lights. This will provide feedback to the power supply if necessary. The DCV reading should be near the schematics value. If it is not, the power supply is malfunctioning and should be repaired before continuing. Turn the DEVICE SUB & DRIVE off before continuing. 3. Set the HORIZ OUTPUT TEST selector to INPUT DRIVE, apply power to the chassis, and note the reading on the LCD. The LCD should read ON. Some chassis horizontal circuits run off of a scan derived supply. With these types of sets you need to turn the TV off and back on again watching the LCD to see if it will momentarily
TVA92
HORIZ OUTPUT TESTS
HORIZ OUTPUT TESTS
RINGER TESTS YOKE & FLYBACK SWITCHING XFORMER DYNAMIC TESTS DCV PULSE PPV PULSE TIME uS INPUT DRIVE
130
0
uS
mA
TV OFF
TV ON
SUB ON
OVERLOAD
OFF
1.5A MAX
OFF: TVS HORIZ OUTPUT ACTIVE ON: TVS HORIZ OUTPUT SUBISTITUTED
RINGER/LOAD TESTS
DYNAMIC TESTS
1500V MAX
!
DISCONNECT YOKE FROM CHASSIS
SYMPTOM
B+ = 0 Volts Low B+ Volts
PROBABLE CAUSES
Open Fuses Bad B+ Supply Shorted B+ Path B+ Power Supply Regulation Low AC Voltage B+ Power Supply Regulation Open Loads On B+ Supply No B+ No Input Drive Open HOT Open Flyback Primary Leaky Retrace Capacitor or HOT Flyback Loading Reduced Value Of Yoke Capacitor Bad Yoke Low B+ Insufficient Input Drive Retrace Capacitors Flyback Shorted Turn High B+ (regulator) No B+ No Input Drive Open HOT Open Flyback Primary Flyback Loading Flyback Shorted Turn Retrace Capacitors Yoke Yoke Series Capacitor Flyback Loading Flyback Shorted Turn Leaky HOT Damper Diode, Yoke, Retrace Capacitors, Yoke Or Yoke Capacitor Drive present to base of HOT No Drive To Base Of HOT
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High Pulse PPV Pulse Time = 0 S Pulse Time < 11.3 S Pulse Time >15.9 S Multiple Pulse Times
ig. 4: Possible HORIZ OUTPUT DYNAMIC TEST indications and their possible causes.
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with the LC103s In-Circuit Capacitor Good/Bad test and explains how to interpret the test results.
looking at the test instrument could easily cause you to slip off the capacitor resulting in improper measurements, frustration and potential circuit damage. Sencore has overcome these mechanical difficulties with the innovative Adjustable In-Circuit Test Probe. The Adjustable In-Circuit Test Probe (AP291) joins two probe tips and provides an adjustable spacing wheel. The probe mechanically adjusts providing the versatility to fit the lead spacing of capacitors ranging from surface mount to large electrolytics. The angled tips provide ease in probing surface mount electrolytic capacitors. A push button switch conveniently located on the test probe enables the LC103s in-circuit capacitor test to avoid probe slippage. For most applications, the probe can be adjusted and connected to the in-circuit capacitor with one hand. In addition, the LC103 beeps when the first complete measurement is complete and the readings are momentarily frozen on the LC103 display after the test button is released to be sure you have sufficient time to view the in-circuit test result.
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CAPACITOR GOOD/BAD
CAPACITOR VALUE
CAPACITOR ESR
CAPACITOR LEAKAGE
INDUCTOR VALUE
INDUCTOR RINGER
Fig. 1: The Sencore LC103 ReZolver provides a patent pending in-circuit capacitor test to reduce servicing time and expense.
Fig. 2: A push button switch conveniently located on the test probe enables the LC103s in-circuit capacitor test.
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While capacitors fail in several ways a combination of two common measurements, capacitor value and equivalent series resistance (ESR), can determine if a capacitor is likely good or suspect in-circuit with a high level of reliability. Aluminum Electrolytic capacitors and tantalum capacitors commonly fail from increased ESR prior to changing value and increasing in leakage. Other capacitor types commonly change value. Testing both value and ESR provides the most comprehensive and accurate in-circuit test results. An ESR tester alone would mistakenly report a shorted capacitor or circuit short as good. Likewise, a capacitor value test alone would miss capacitors with excessive ESR. Accurate in-circuit capacitor testing can be hindered by the presence of components in parallel with the capacitor. Capacitance, resistance, inductance and semiconductor junctions in parallel with the capacitor may influence the accuracy and reliability of in-circuit capacitor tests. At times the parallel components may have little effect on the accuracy of the tests but at other times the parallel components cause significant changes to the test results. It is important to know when the parallel components are effecting the in-circuit capacitor measurements.
The LC103s In-Circuit Capacitor test performs several sophisticated tests to determine if parallel components are present which may be effecting the accuracy of the in-circuit capacitance value and ESR measurements. The tests include a test to determine how much current is needed to hold a capacitor charge. Current exceeding the original charging current by 20% indicates parallel resistance that can impact the capacitor value test. A second test uses a selection of test frequencies and analyzes the Xc of the circuit. A capacitance value is determined and compared to a capacitance value determined with an RC time constant value measurement. Large differences in the capacitance values indicate parallel components which would impact the in-circuit measurement accuracy.
rating. A calculator would be needed to determine if the measured capacitance value is within a normal tolerance. The LC103 provides Good/Bad test analysis with every in-circuit capacitor test to help determine if the capacitor value and ESR is within a normal range. ESR evaluations are based upon maximum allowable limits established by component manufacturers and the Electronic Industries Association (EIA). Capacitor measured values are automatically compared to maximum and minimum values calculated from the entered value and tolerance of the capacitor being tested.
The LC103s In-Circuit Capacitor test function measures the capacitance value It can be difficult to determine if a and ESR of an in-circuit capacitor. These capacitor ESR readout is normal or not measurements are simultaneously as capacitor ESR values vary among displayed in the COMPONENT TEST different capacitor types and also vary RESULTS display. Capacitance value with the capacitors value and voltage measurements range from 0.002 uF to 20,000 uF. Capacitor ESR measurements are In-Circuit Capacitor Test Component Parameters Good/Bad Judgement Factors displayed for capacitors ranging Basic Good/Bad Check None Measured capacity and 50V in value from 0.02 Tantalum ESR Chart if >1 F uF to 20,000 uF. Ceramic (10) if <1uF Measurement voltages are below PN EIA Good/Bad Test Capacitor type, value, Based on the EIA chart for entered capacitor type forward bias volttolerance, rated voltage Measured capacity versus entered value/tolerance ages so the tests are unaffected by semconductor Chart 1: The LC103 performs a basic Good/Bad test of the capacitor or a complete EIA Good/Bad test. Both testing junctions. alternatives perform the same in-circuit analyzing tests but use different references for Good/Bad interpretation.
Fig. 3: The LC103 analyzes the capacitor for parallel components that would alter the accuracy of the in-circuit test results.
To perform a basic Good/Bad check apply power to the LC103 and attach and zero the test probe. Connect the Adjustable In-Circuit test probe to the capacitor legs and push & hold the front panel CAPACITOR GOOD/BAD push-button switch or the small push-button switch on the In-Circuit Test Probe. The test results are shown in the COMPONENT TEST RESULTS display.
The display readouts shown during the basic Good/Bad check include the capacitance value, capacitor ESR and a GOOD?? or BAD?? or SUGGEST REMOVAL display readout. ESR is not displayed for capacitor values below 0.02 uF. The good or bad evaluation is based upon the ESR measurement and the measured capacitance value. For measured capacitance values over 1 uF, the measured ESR is compared to the maximum ESR values for a similar value tantalum capacitor as determined by the EIA. For measured capacitor values less than 1 uF, a 10 ohm good/bad reference is used. ESR values of 10 ohms or more are considered BAD?? while less than 10 ohm are considered GOOD??. Question marks accompany both the good or bad readouts during a basic Good/Bad check because the LC103 can not compare the measured capacitance value to the rated value of the capacitor being tested. When you see the question marks, remember to check the LC103s capacitance measurement to the capacitors rated capacitance value to determine if it is within a normal tolerance.
I M P O R TA N T Do not hold-in the CAPACITOR GOOD/BAD switch or Adjustable Test Probe push-button switch while connecting the Test Probe to an in-circuit capacitor. The LC103 circuitry may be damaged because capacitor discharge protection is lost. A complete EIA Good/Bad test evaluates both the measured in-circuit capacitance value and ESR. The display readouts shown during the EIA Good/Bad test includes the capacitance value, capacitor ESR and a GOOD or BAD or SUGGEST REMOVAL indicator. An ESR measurement readout is not displayed for capacitor values below 0.02 uF. The good or bad evaluation is based upon both the measured capacitance value and measured ESR. The measured capacitance value is compared to the entered value and tolerance. The measured ESR is compared to the maximum ESR determined by the EIA for the entered capacitor type. If the measured capacitance value is out-of-tolerance and/or the ESR exceeds the maximum determined by the EIA, a BAD readout is indicated. If the capacitance value is within the rated tolerance and the ESR is below a maximum EIA level, a GOOD readout is indicated.
To Perform an In-Circuit Capacitor - EIA Good/Bad Test: 1. Apply Power to the LC103. 2. Connect the In-Circuit Adjustable Test Probe to the LC103s TEST LEAD jack. 3. Perform the Lead Zero Adjustment. 4. a. Enter the capacitor - Component Type Example: Push the ALUMINUM LYTIC push-button. b. Enter the capacitor value. Example: Push the 2, 2, 0, uF, push-buttons. c. Enter the capacitor value tolerance. Example: Push the 2, 0, +%, -%, push-buttons. d.Enter the capacitors rated voltage. Example: Push the 5, 0, V, push-buttons. 5. Connect the probe tips to the capacitor leads. 6. Push & hold the In-Circuit CAPACITOR GOOD/BAD push-button or the test probes push-button. 7. Read the COMPONENT TEST RESULTS display
Note: Double Layer Lytics and High R Double Layer capacitor values are beyond the range and testing capability of the In-Circuit Capacitor Good/Bad test. The In-Circuit Capacitor Good/Bad test should not be used on these capacitor types.
To Perform an In-Circuit Capacitor Basic Good/Bad Check: 1. Apply Power to the LC103. 2. Connect the In-Circuit Ajustable Test Probe to the LC103s TEST LEAD jack. 3. Perform the Lead Zero Adjustment. 4. Connect the probe tips to the capacitor leads. 5. Push & hold the In-Circuit CAPACITOR GOOD/BAD push-button or test probe push-button. 6. Read the COMPONENT TEST RESULTS display
Fig. 4: The Adjustable In-Circuit Test Probe provides reliable in-circuit connections and push-button test ease.
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S
Form #6939 Printed In U.S.A.
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determining if the capacitor likely has a problem. Occasionally, the readings may help you avoid removal and testing time. For example, a capacitor value readout that is much higher than the rated value of the capacitor is likey caused by a capacitor in parallel with the one being tested. If the schematic shows a capacitor in parallel with the one being tested that results in a total capacitance near the displayed value, the value of the capacitor being tested is likely fine. At other times, you may know from previous experience what to expect for capacitance and ESR readouts with the in-circuit capacitor tests across a particular capacitor.
Fig. 5: The SUGGEST REMOVAL readout indicates there are components in parallel with the capacitor being measured that will influence the test results.
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Four Key Components: 1.Horizontal Output transistor 2.Transformer Primary or Coil 3.Retrace Timing Capacitor 4.Damper Diode
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BIPOLAR
Flyback Transformer B+ Volts
MOSFET
+V
H.O.T. D1
+V H.O.T.
D1 Damper CT Retrace/Timing Capacitor
CT Retrace/Timing Capacitor
Damper Diode
Driver Amp.
Fig: 1: Typical bipolar and MOSFET high voltage only horizontal output stages and their driver stage.
requirements than if combined. A typical high voltage only horizontal output stage consist of a flyback transformer, timing or retrace capacitor, damper diode and horizontal output transistor(s) as shown in Fig. 1. Either a bipolar transistor, MOSFET transistor or paralleled MOSFET transistors may be used. Because of the reduced current in a high voltage only horizontal output stage compared to a combination stage, a MOSFET horizontal output transistor can be used reliably. In cases where the current is still substantial, matched paralleled MOSFET transistors may be used to divide the H.O.T. conduction current for increased reliability. Considering the reduced costs of MOSFETs and drive components, the cost of a mosfet compared to a bipolar horizontal output transistor is slightly better. Two important differences exist when using a MOSFET horizontal output transistor compared to a bipolar type. First, the flyback voltage pulses induced into the output stage must be reduced because MOSFETs have a lower breakdown voltage rating than bipolar transistors. Secondly, the input drive signal and driver circuits must be different to match the differences in the MOSFET's transistor's operating characteristics. For these reasons bipolar and MOSFET output transistors cannot be interchanged. Todays MOSFET horizontal output transistors typically have a maximum voltage rating from drain to source of either 800 volts or 1000 volts. In comparison, bipolar tran-
sistors have a maximum voltage rating collector-to-emitter of 1500 volts. Typically, flyback pulses in MOSFET output stages are at least 100 volts under their maximum rated voltage or less than 900 volts peak-to-peak. In comparison, flyback pulses in a bipolar transistor output commonly exceed 1000 VPP. Lesser induced voltages are compensated for with a different flyback transformer turns ratio to produce the needed high voltage. A MOSFET transistor is a voltage operated device while a bipolar transistor is a current operated transistor. Switching a bipolar transistor on requires that the drive produce base current of several hundred milliamps. The base drive current switches the transistor fully on enabling it to conduct collector currents of several amps. A MOSFET output transistor turns fully on when positive voltages greater than 4 volts are applied to the gate. The input signal typically ranges from near 0 volts (H.O.T. off) to between 5 and 15 volts (H.O.T. on). When switched on the MOSFET transistor reduces its drain-to-source resistance path to less than 2 ohms permitting peak currents to build in the flyback primary winding. Because MOSFET and bipolar output transistors have different input drive requirements, the horizontal driver stages for each are considerably different. Driver stages for bipolar output transistors use an amplifier and current stepup transformer to produce the needed drive current to the bipolar transistor's low impedance base. Driver stages for MOSFET output transistors use an amplifier to provide a changing voltage to the MOSFET'S high impedance gate.
thousand volts or more. The induced voltage would produce excessive high voltage and/or deflection and quickly damage the horizontal output transistor. Because of this key role in controlling the flyback or kickback voltage, the timing capacitor is often called a "safety capacitor". After the magnetic field has completely collapsed, Ct begins to discharge, causing current flow back into the transformer or coil in the opposite direction. A magnetic field builds, but with the opposite magnetic polarity. This action completes the second part of retrace and corresponds to the falling portion of the voltage waveform or pulse at the collector or drain of the H.O.T. When Ct has completely discharged the magnetic field of the transformer or coil begins to collapse. The collapsing field induces a voltage with a polarity that forward biases the damper diode. The damper diode conducts producing an inductive circuit similar to when the H.O.T. was conducting. The damper diode allows the magnetic energy of the transformer or coil winding to decay at a controlled inductive rate returning energy (current) back to the B+ supply capacitor. As the magnetic field is nearly fully collapsed the horizontal output transistor is turned on and the cycle repeats.
comprise the yoke's current path. A typical deflection horizontal output stage is shown in Fig. 2. Because of the yoke's high current requirements, bipolar output transistors are used. A high frequency coil or transformer replaces the flyback transformer. The horizontal yoke and its series components parallel the timing or retrace capacitor of the horizontal output stage. Included in the yoke's current path is always a linearity coil and an "S-shaping" capacitor. These components shape the rise and fall of the alternating current in the yoke to produce a linear and uniform deflection on the CRT. The series components can be arranged in any order. Other components that may be found in the horizontal yoke's current path are a pincushion transformer and efficiency or width control transformer or coil (not shown in Fig. 2). Operation of a deflection only horizontal output stage is the same as described for the high voltage only horizontal output stage, but with the additional path for yoke current. To produce yoke current that is in sync with the video's horizontal retrace time, a common horizontal drive signal originating from the locked horizontal oscillator feeds the separate HV and deflection output stages. The common horizontal drive synchronizes the high voltage and deflection output stages to produce flyback pulses at nearly the same time. Current for the horizontal yoke is derived from the output stage's retrace or timing capacitor. When the H.O.T. is turned on, the bottom side of the S-shaping capacitor connects to the top of the linearity coil. Because the S-shaping capacitor is fully charged from the previous cycle, it begins to discharge through the horizontal output transistor. The resulting current flow produces an expanding magnetic field in the linearity and yoke coils. The polarity of the increasing current deflects the CRT's electron beam from the center to the right. At the same time, B+ power supply current flows through the H.O.T. to energize the transformer or coil winding. When the horizontal output transistor is switched open, the retrace timing capacitor effectively is placed in parallel with the yoke and its series components increasing the resonant frequency or rate of current
change in the yoke. The yoke's magnetic field rapidly collapses producing current which charges the retrace timing capacitor and S-shaping capacitor. Because of the difference in capacitor values, most of the energy is returned to Ct. Corresponding with this time, is the collapsing magnetic field of the B+ transformer or coil which replenishes or fully charges the retrace capacitor. You may recall this is the rising edge of the inductive "kickback" voltage pulse at the collector of the output transistor. Now, fully charged, Ct becomes the current source for the yoke for the remainder of the cycle. This time corresponds to the 1st part of retrace when the CRT's electron beam is quickly returned to the center of the display. During the 2nd part of retrace, Ct and the S-shaping capacitor produce discharging current through the yoke in the opposite direction. The current rises to a peak building the magnetic field in the yoke and quickly moving the electron beam from the center of the CRT to the left. Also, during this time, Ct is energizing the B+ supply transformer or coil. When the retrace capacitor and the S-shaping capacitor are fully discharged, the yoke's magnetic field begins to collapse. This corresponds with the collapsing magnetic field of the transformer or coil energized by the B+ supply. The induced voltage forward biased the damper diode into conduction. The circuits timing now agrees with the timing during the right trace time when the H.O.T. was conducting. The yoke's collapsing magnetic field returns energy to the circuit charging the S-shaping capacitor. Yoke current moves the CRT's electron beam slowly from the right to the center of the CRT. When the yokes magnetic field is collapsed, the damper diode stops conducting. This corresponds with the beginning of the H.O.T.'s conduction and the cycle repeats.
CT
For example, Fig. 3 shows a high voltage only horizontal output stage in which the flyback transformers primary current is provided by the retrace capacitor Ct. This configuration is nearly the same as the deflection only horizontal output stage of figure 2. The only difference is that the yoke is replaced by the flyback transformer primary winding. Recall that when the H.O.T. is switched on by gate drive, B+ supply current flows to energize the coil and produce an expanding magnetic field. When the H.O.T. is switched off, the coil's magnetic field induces voltage and charging current to Ct. Ct then becomes the supply or current source of flyback current. Current alternates in the tuned circuit including the flyback transformer primary in the same manner as described earlier for the deflection only horizontal output stage.
B+ Volts Coil
output stage. The single damper combination horizontal output stage is used in the majority of television receivers. The single damper output stage produces high voltage and deflection with the fewest parts and component costs. It offers good performance and reliability for single frequency operation. The single damper output stage is also popular in computer display monitors that operate over only a few frequency modes or a limited operating frequency range. The single damper diode output stage can be recognized by the fact it has only one damper diode. (See Fig. 2). The diode is placed from the H.O.T. collector to emitter. The damper diode may be a discrete component or integrated into the bipolar horizontal output transistor. In a single damper diode horizontal output stage, the flyback transformer primary winding connects from the collector of the output transistor to the B+ power supply. The yoke and series components connect between the H.O.T. collector and emitter or ground. The timing capacitor provides energy to produce yoke current much like the deflection only horizontal output stage. Operation of the single damper horizontal output stage is identical to the deflection only horizontal output stage explained earlier. The only exception is that the coil between the collector and B+ supply is replaced with the primary winding of a flyback transformer. Conduction of the H.O.T. energizes the primary of the flyback transformer. When the H.O.T. is switched off the collapsing magnetic field of the flyback transformer charges Ct. The charge in Ct produces current in the yoke and flyback transformer primary. The damper diode shunts the H.O.T. and is biased into conduction by the induced voltage from the flyback and yoke to return magnetic energy to the power supply. While the single damper diode combination output stage reliably produces high voltage and deflection current with the fewest components and costs, it is limited in multi-frequency applications. This is because any changes to the output stage to increase high voltage would also increase yoke current and
vice versa. With extreme horizontal frequency changes it becomes difficult to change the operating parameters to both establish normal high voltage and proper yoke deflection current simultaneously. For a complete explanation of a single damper diode combination horizontal output stage request Sencore Tech Tip #207.
Flyback Transformer
CT
15mH
Cs
D1
C T1 S-Shaping Yoke
Linearity Coil
D2
C T2
B+ Volts
Multiplier
B+ Volts
B+ Volts
B+ Volts
Charge ++ ++ 80%
B+ Cap.
C T1
++ ++ B+ Cap.
D1 Charge ++ ++
++ ++ C T2 ++ ++ Charge 20% C T2
Charge
+ +
+ + D2 C T2
D2
creating an expanding flyback magnetic field. Current is also supplied from the Sshaping capacitor charged from the previous cycle. Current flows from the S-shaping capacitor through the bottom damper (D2), H.O.T. linearity coil and yoke. Yoke current deflects the CRT's electron beams from center to the right of the picture. When the H.O.T. is switched off, the magnetic fields in the flyback and yoke collapse. The flyback's collapsing magnetic field produces induced voltage and charging current to timing capacitors CT1 and CT2. Values of Ct1 and Ct 2 are chosen so approximately 80-90% of the charge is delivered to CT1 and 10-20% to CT2. The yokes induced voltage produces charging current to CT1 and the S-shaping capacitor. The difference in capacitor values returns the greatest charge to CT1. This portion of the cycle is the 1st part of retrace which quickly returns the CRT beam from the right to the center of the picture. With the flyback and yoke magnetic fields fully collapsed, capacitors CT1 and CT2 begin to discharge. Capacitor CT1, now fully charged, supplies discharge current along with the lesser charged S-shaping capacitor to the horizontal yoke. The yoke current moves the CRT's electron beam from the center to the left completing retrace. Capacitors CT1 and CT2 produce current through the flyback primary, but in the opposite direction, producing an expanding magnetic field. When the timing capacitors are discharged, the flybacks magnetic field collapses biasing on the damper diodes. Diodes D1 and D2 conduct providing a current path for the magnetic energy of
the flyback to recharge the power supply filter capacitor. The collapsing magnetic field of the yoke charges the S-shaping capacitor with current flowing through D1. Yoke current moves the CRT electron beams from the left slowly to the center. When the yoke magnetic field is fully collapsed, the S-shaping capacitor nears full charge. The H.O.T. is then switched on to repeat the horizontal cycle.
encountered. One such change is found in several computer display monitors from Gateway and several other manufacturers. The modification changes the manner in which the H.O.T. is switched on and off by the input drive signal. (See Fig. 6) All other operations of the output stage are the same as the single damper combination output stage. The emitter driven horizontal output stage places a switching MOSFET at the emitter lead of the bipolar horizontal output transistor to ground. The horizontal drive signal is applied to the gate of the MOSFET turning its source-to-drain conduction path on or off. Effectively the emitter lead of the H.O.T. is connected to ground when the MOSFET is switched on. The supply
B+ Volts Flyback Transformer
Multiplier
H.O.T. C T1 Yoke
Damper
Horiz Drive
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Emitter Output HV
B+ Volts
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Deflection Only
B+ Volts
Multipler
DCV
Fig. 7: Typical Emitter Output high voltage or deflection only horizontal output stages.
voltage to the base of the H.O.T. permits a low level of base current enabling the H.O.T. to start conducting flyback primary current. As the current slowly increases in the flyback primary, the base drive transformer induces voltage to the base lead. The voltage draws additional base current enabling the H.O.T. to produce additional collector current. In this manner, the inductive base drive dynamically increases the base current to produce the increasing collector current. The base drive transformer also improves the switching speed to turn the H.O.T. off. This H.O.T. switching method provides more efficient H.O.T. operation reducing its heat and improving stage reliability.
The flyback primary or coil winding leads to ground typically through a voltage regulation stage (not shown) which regulates the ground side of the current path. A damper diode and timing capacitor parallel the H.O.T. The yoke and its series components draw energy from Ct to produce deflection. Operation of an emitter output type horizontal output stage is nearly the same as those with the flyback or coil in the collector lead. However, because the emitter is not grounded and contains the inductive component to ground, DC voltages and flyback induced voltages are developed at the emitter in reference to circuit ground. For this reason, the stage's output is seemingly at the emitter of the H.O.T. To better understand the emitter output, consider the horizontal cycle. During the conduction time of the horizontal output transistor, the emitter is effectively connected to the B+ supply voltage at the collector. Current flows through the flyback or coil winding to energize the stage. When the transistor is switched opened, the coil's magnetic field collapses producing current to charge Ct. The voltage at the emitter decreases with the induced voltage in the flyback or coil winding as Ct charges. When the magnetic field is fully collapsed, Ct discharges through the flyback or coil winding. This causes the voltage at the emitter to increase or become less negative. The charging and discharging action of Ct results in a negative going
induced voltage pulse at the emitter of the H.O.T. in respect to circuit ground. During damper diode time, the collapsing magnetic field returns energy to the circuit producing current flow though the damper diode. The current charges the B+ power supply capacitor. During damper diode time, the B+ supply voltage is switched to the emitter. This configuration produces no waveform at the collector of the H.O.T. as it is connected to the B+ supply voltage. A DC voltage measurement at the collector reads the B+ supply voltage. Because of the configuration and switching action of the stage, a DC voltage and waveform at the emitter reflect the normal operation of the stage. Negative going flyback pulses of several hundred volts peak-to-peak are typical. The DC voltage at the emitter reflects the B+ supply voltage to the output stage. This is determined by a regulation stage typically along the ground current path on the input side of the flyback or coil.
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