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X-ray diffraction is used to determine crystal structures of materials. When x-rays hit periodically spaced atoms in a crystal, they can undergo constructive or destructive interference depending on the path length differences. Bragg's law relates the x-ray wavelength, interplanar spacing, and diffraction angle. X-ray diffractometers measure diffraction patterns of powdered samples to determine lattice parameters and atomic arrangements in the unit cell from the positions and intensities of peaks. This provides information about a material's crystal structure.
X-ray diffraction is used to determine crystal structures of materials. When x-rays hit periodically spaced atoms in a crystal, they can undergo constructive or destructive interference depe…