TN-FD-19: M500 SSD SMART Attributes Introduction

Technical Note
SMART Attributes for the M500 SSD Introduction
This document defines the self-monitoring, analysis, and reporting technology (SMART) attributes recorded by Micron's M500 solid state drive (SSD) firmware revisions, MU02 and MU03, for the 2.5-inch, mSATA, and M.2 configurations (M500MTFDDAxxxxMAV). These attributes are not applicable to other Micron products and may not be applicable to drives installed as original equipment in a desktop or notebook computer. (If your SSD has been purchased as part of a computer system, please contact the computer manufacturer to verify SMART definitions.) The SMART command (B0h) feature set protects user data and minimizes the likelihood of unscheduled system downtime that may be caused by predictable degradation and/or fault of the device. By monitoring and storing critical performance and calibration parameters, SMART feature set devices attempt to predict the likelihood of nearterm degradation or a fault condition. Notifying the host system of a negative reliability condition enables the host system to warn the user of the impending risk of data loss and advise the appropriate action. Support of this feature set is indicated in the IDENTIFY DEVICE data. SMART attributes are subject to change with new firmware revisions. These changes are implemented to improve the quality of the data and to remove attributes that are not helpful in determining SSD health. Updating firmware in the field from MU02 to MU03, or to the latest revision, will change attributes appropriately with no loss of SMART data.

PDF: 09005aef8512019a tnfd19_m500_ssd_smart_attributes.pdf - Rev. C 8/13 EN

Products and specifications discussed herein are for evaluation and reference purposes only and are subject to change by Micron without notice. Products are only warranted by Micron to meet Micron's production data sheet specifications. All information discussed herein is provided on an "as is" basis, without warranties of any kind.

Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.

TN-FD-19: M500 SSD SMART Attributes Introduction

Table 1: SMART Attribute Definitions (Revision MU03 or Later)
ID (Dec) 1 5 9 12 171 172 173 174 180 183 184 187 194 196 197 198 199 202 206 210 246 247 248 Note: ID (Hex) 1 5 9 C AB AC AD AE B4 B7 B8 BB C2 C4 C5 C6 C7 CA CE D2 F6 F7 F8 Description Raw-read error rate Reallocated NAND block count Power-on hours count Device power-cycle count Program fail count Erase fail count Average block-erase count Unexpected power-loss count Unused reserve (spare) NAND blocks SATA interface downshift Error correction count Reported uncorrectable errors Enclosure temperature Reallocation event count Current pending sector count SMART offline-scan uncorrectable sector count Ultra-DMA CRC error count Percent lifetime used Write error rate (errors/MB) Successful RAIN recovery count Total host sector writes Contact factory Contact factory

1. Attributes are subject to change.

PDF: 09005aef8512019a tnfd19_m500_ssd_smart_attributes.pdf - Rev. C 8/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.

TN-FD-19: M500 SSD SMART Attributes Introduction

Table 2: SMART Attribute Definitions (Revision MU02)
ID (Dec) 1 5 9 12 13 170 171 172 173 174 181 183 184 187 188 194 195 196 197 198 199 202 206 Note: ID (Hex) 1 5 9 C D AA AB AC AD AE B5 B7 B8 BB BC C2 C3 C4 C5 C6 C7 CA CE Description Raw-read error rate Reallocated sector count Power-on hours count Device power-cycle count Soft error rate Reserved block count Program fail count Erase fail count Average block-erase count Unexpected power-loss count Vendor-unique data SATA interface downshift Error correction count Reported uncorrectable errors Command timeout count Enclosure temperature Vendor-unique data Reallocation event count Current pending sector count SMART offline-scan uncorrectable sector count Ultra-DMA CRC error count Percent lifetime used Write error rate (errors/MB)

1. Attributes are subject to change.

PDF: 09005aef8512019a tnfd19_m500_ssd_smart_attributes.pdf - Rev. C 8/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.

TN-FD-19: M500 SSD SMART Attributes Revision History

Revision History
Rev. C 8/13
Added M500 firmware revision MU03

Rev. B 3/13
Added hexadecimal IDs Updated descriptions of attribute 5, 181, and 195 to Vendor-Unique Data Made technical note specific to M500 firmware revision MU02

Rev. A 1/13
Initial release.

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PDF: 09005aef8512019a tnfd19_m500_ssd_smart_attributes.pdf - Rev. C 8/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.