FEATURES
! Avalanche Rugged Technology ! Rugged Gate Oxide Technology ! Lower Input Capacitance ! Improved Gate Charge ! Extended Safe Operating Area ! Lower Leakage Current : 10 #A (Max.) @ VDS = 100V ! Lower RDS(ON) : 0.101! (Typ.)
IRL530A
BVDSS = 100 V RDS(on) = 0.12! ID = 14 A
TO-220
1 2 3
% 300
Thermal Resistance
Symbol R$JC R$CS R$JA Characteristic Junction-to-Case Case-to-Sink Junction-to-Ambient Typ. -0.5 -Max. 2.41 -62.5 %/W Units
Rev. B1
IRL530A
Electrical Characteristics (TC=25% unless otherwise specified)
Symbol BVDSS .BV/.TJ VGS(th) IGSS IDSS RDS(on) gfs Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Characteristic Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff. Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse Drain-to-Source Leakage Current Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain()Miller)) Charge Min. Typ. Max. Units 100 -1.0 -----------------0.1 ------10.2 --2.0 100 -100 10 100 0.12 -#A * * V V/% V nA
Test Condition VGS=0V,ID=250#A ID=250#A VGS=20V VGS=-20V VDS=100V VDS=80V,TC=150% VGS=5V,ID=7A VDS=40V,ID=7A
, ,
See Fig 7
VDS=5V,ID=250#A
VGS=0V,VDS=25V,f =1MHz See Fig 5 VDD=50V,ID=14A, RG=6* See Fig 13 VDS=80V,VGS=5V, ID=14A See Fig 6 & Fig 12 , ,-
Test Condition Integral reverse pn-diode in the MOSFET TJ=25%,IS=14A,VGS=0V TJ=25%,IF=14A diF/dt=100A/#s
,
Notes ; & Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature ' L=2mH, IAS=14A, VDD=25V, RG=27*, Starting TJ =25% ( ISD+14A, di/dt+350A/#s, VDD+BVDSS , Starting TJ =25% , Pulse Test : Pulse Width = 250#s, Duty Cycle + 2% - Essentially Independent of Operating Temperature
IRL530A
Fig 2. Transfer Characteristics
1 1 0
1 1 0
1 7 5 oC
0 1 0
2 5 oC
0 1 0
@N o t e s: 1 .2 5 0 s P u l s eT e s t 2 .T 5 oC C =2
0 1 0 1 1 0
-5 5 oC
-1 1 0
@N o t e s: 1 .V GS = 0 V 2 .V 0V DS = 4 3 .2 5 0 s P u l s eT e s t 4 6 8 1 0
-1 1 0
0 . 1 5
V GS = 5 V
1 1 0
0 . 1 0
V 0V GS = 1 0 . 0 5 @N o t e:T 5 oC J =2 0 . 0 0 0 1 5 3 0 4 5 6 0
0 1 0
1 7 5 oC 2 5 oC 1 0
-1
@N o t e s: 1 .V GS = 0 V u l s eT e s t 2 .2 5 0 s P 1 . 0 1 . 2 1 . 4 1 . 6 1 . 8 2 . 0 2 . 2
0 . 4
0 . 6
0 . 8
8 0 0
C iss
V 0V DS = 2 V 0V DS = 5 V 0V DS = 8 4
Capacitance [pF]
@N o t e s:I 4A D =1 0 0 3 6 9 1 2 1 5 1 8
00 1 0
1 1 0
IRL530A
Fig 7. Breakdown Voltage vs. Temperature
1 . 2 3 . 0
1 . 1
2 . 5
BVDSS , (Normalized)
2 . 0
1 . 0
1 . 5
1 . 0 @N o t e s: 1 .V GS = 5 V 2 .I D =7A 5 0 2 5 0 2 5 5 0 7 5 1 0 0 1 2 5 1 5 0 1 7 5 2 0 0
0 . 9
@N o t e s: 1 .V =0V
GS D
0 . 5
2 .I =2 5 0 A 0 . 8 7 5 5 0 2 5 0 2 5 5 0 7 5 1 0 0 1 2 5
o
1 5 0
1 7 5
2 0 0
0 . 0 7 5
TJ , Junction Temperature [ C]
2 1 0
DS(on)
1 2
1 0 0 s 1m s
1 1 0
1 0m s D C
1 0
@N o t e s: 1 .T =2 5 oC
C J
7 5 oC 2 .T =1 3 .S i n g l eP u l s e
-1 1 0 0 1 0 1 1 0
0 2 5
5 0
7 5
1 0 0
1 2 5
1 5 0
1 7 5
100
C/W Max.
(t)
Z (t) ,
10- 1
JC
t2
10- 5
10- 4
10- 3
10- 2
10- 1
100
101
[sec]
IRL530A
* Current Regulator
50K! 12V 200nF 300nF
VGS Qg
10V
Qgs
Qgd
R1
Current Sampling (IG) Resistor
R2
Current Sampling (ID) Resistor
Charge
Vout VDD
( 0.5 rated VDS )
90%
LL VDS
Vary tp to obtain required peak ID
BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD BVDSS IAS C VDD VDD
tp
ID
RG DUT 5V
tp
IRL530A
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+ VDS --
IS L Driver RG VGS
Same Type as DUT
VGS
VDD
VGS ( Driver )
10V
IS ( DUT ) IRM
di/dt
VDS ( DUT )
Vf
VDD
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Rev. H7