ASHWIN VIJAYSAI

1102 S. Abel St., Milpitas, CA-95035 (806) 368-1881 ashwin.vijayasai@gmail.com OBJECTIVE

To secure a challenging position where I can apply my significant research and industrial experience with test and characterization of electro-mechanical systems and semiconductor devices.

SUMMARY
Microelectromechanical systems (MEMS) design, test and characterization. Experience in developing automated test - characterization setups using LabVIEW and NI hardware. Device and product reliability test development. Experience with material characterization and failure analysis tools. root cause analysis Over 2 years of Class-100 clean room experience (Texas Tech University and Fab-8, Malta, NY). Supervised and worked with a group of 4 Doctoral, 13 Masters Students and 50 industrial co-workers. Documentation of test procedures, test development and technology transfer to parent fab.

EDUCATION
Ph.D. candidate in EE Texas Tech University, Lubbock, Texas GPA: 3.83 2008 - 2012

TECHNICAL SKILLS
Test equipments: Agilent 4080 parametric tester, Texas Instruments Very Low Cost Tester (VLCT); Keithley 2400 source-meter; Agilient power supply, oscilloscope, NI DAQ boards PCI 6024E, USB 6259, USB 6281, USB 6009; NI PCI IMAQ-1407, NI PCI-GPIB, CSZ environmental chambers. Other characterization tools: probe stations; visual inspection optical microscope, interferometric microscope, SEM, TEM, goniometer; chemical inspection FTIR spectroscopy; scanning probe microscopy AFM, LFM, adhesion force. Nanocoating process tool: Integrated surface Technologies - RPX-550; Surface cleaning techniques- plasma asher Harrick plasma #PDC-32G; UV/O cleaner Novascan #PSD-UV4. Numerical computation software: MATLAB Control software for automated testing: C, C++, LabVIEW. Statistical analysis: JMP

EXPERIENCE
Display Systems Engineer, Qualcomm Inc., Mirasol Division, San Jose, CA (Sep13 - Present) System level reliability testing on various electro-mechanical display products. Characterize electro-mechanical systems and develop test programs. Development of in-situ correction factors for sensor systems. Life time testing and accelerated test method development. Data analysis and report generation for quality and reliability tests. Defect and root cause failure analysis. Process modifications and yield improvement.

Product Reliability Engineer, Globalfoundries Inc., Malta, NY (Jan12 Sep13) Wafer level reliability testing on various test devices fabricated by 32nm and 28nm technology. Performed high temperature and high input signal reliability testing of semiconductor devices. Test program development and debug for 32nm and 28nm products. Agilent SPECS-FA, Framework and Algorithm development. Test program automation and debug at wafer-die scale. Effective team player and responsible for conducting root cause analysis of failures by working on the Test floor. Handle tasks and worked with senior staff in taking Corrective Action to solve customer issues. Data analysis and automation of report generation. Research Assistant, Dept. of Electrical Engineering, Texas Tech University (Aug 08 May12) Design, development and characterization of micro electro-mechanical systems. Developed automated test setups that can be used to test and characterize the electro-mechanical systems. Develop recipes and idealize process parameters for deposition of nanocoatings to MEMS devices. Developed automated test and characterization setups for studying reliability and accelerated lifetime testing of electro-static actuators. Performed high and low temperature reliability testing, high and low humidity reliability testing of nanocoated MEMS devices. Developed a haptic controlled electro-mechanical sensor system for manipulation of mico-parts. Integrated a capacitance sensor system for measuring electro-mechanical system operation. Designed several electro-static and electro-thermal MEMS devices. Worked with Integrated Surface Technologies to develop nanocoating recipes.

ACCOMPLISHMENTS/ MEMBERSHIPS
Participated in Qualcomm Innovation Conference - QTech14 Executive committee member of IEEE Silicon Valley MEMS Chapter Globalfoundries appreciation award for outstanding dedication in work Published four journal articles and six conference paper Secured 1st place in Sandia National Laboratories UAP MEMS design competition Scholarship Texas Instruments Graduate scholarship Teaching and research assistant roles 2014 2013 2013 2010 2012 2010 2012 2010 2012 2008 2010

REFERENCES
Dr. Richard Gale and Dr. Tim Dallas, Department of Electrical and Computer Engineering, Texas Tech University, TX, USA. Dr. Michelle Pantoya, Department of Mechanical Engineering, Texas Tech University, TX, USA. Ravi Doraiswami, Linear Technology Corp., Milpitas, CA, USA