Catalogo Ramman

Catalog & Corporate Profle
Innovative Solutions for

Your Application Needs
B&W Tek, Inc. +1-302-368-7824 www.bwtek.com B&W Tek, Inc.
Table of Contents
About B&W Tek
What does B&W Tek do? Page 2
Who uses B&W Tek products & services? Page 3
What added beneft does B&W Tek provide? Page 4
What can I expect from B&W Tek? Page 5
What makes B&W Tek diferent from other providers? Page 6
How will B&W Tek make my ideas a reality? Page 7
What types of products does B&W Tek ofer? Page 8
Innovative Solutions for Modular Spectroscopy
Introduction to Modular Spectroscopy Page 12
Part 1: The Slit Page 13
Part 2: The Grating Page 14
Part 3: The Detector Page 17
Part 4: The Optical Bench Page 21
Part 5: Spectral Resolution Page 23
Part 6: Choosing a Fiber Optic Page 25
Part 7: Fiber Optic Bundles Page 28
Part 8: Fiber Optic Probes Page 31
Applications of Spectroscopy Page 34
Spectrometer Modules
Exemplar Page 36
Exemplar LS Page 38
Exemplar Plus Page 40
Glacier X Page 42
Sol 1.7 Page 44
Sol 2.2A Page 46
Sol 2.6 Page 48
Spectrometer Accessories Page 50
Spectrometer Software
BWSpec Page 54
Software Development Kit Page 55
Innovative Solutions for Raman Spectroscopy
Introduction to Raman Spectroscopy Page 58
Theory of Raman Scattering Page 58
Components of a Raman Spectrometer Page 62
Applications of Raman Spectroscopy Page 64
Raman Systems
NanoRam Page 66
NanoRam FP Page 68
i-Raman Page 70
i-Raman Plus Page 72
i-Raman EX Page 74
Raman Accessories Page 76
Raman Software
BWID & BWID-Pharma Page 78
BWIQ Page 79
Laser Modules & Systems
Introduction to Laser Technology Page 82
BWN Series Page 83
BWB Series Page 84
BWR Series Page 85
Flex Page 86
CleanLaze Page 88
BWF 1 Page 89
BWF 2 Page 90
BWF-OEM Page 91
BWF 5 Page 91
Woldwide Distribution and Contact Information
B&W Tek Worldwide Distributors Page 92
B&W Tek Ofces and Contact Information Back Cover
Copyright 2014 B&W Tek, Inc.
B&W Tek, Corporate Headquarters
19 Shea Way Newark, DE 19713, USA
Phone: +1-302-368-7824
Web: www.bwtek.com
B&W Tek, Europe
Seelandstrae 14-16, 23569 Lbeck, Germany
Phone: +49(0)45130803854
B&W Tek, Japan
2-3-2 7F, Kamiochiai, Chuo-ku, Saitama-city, Saitama - 338-0001, Japan
Phone: +81(0)48 851 3150
B&W Tek, China
Ming Shen Business Plaza
400 CaoBao Rd., Suite 2206, Shanghai - 200233, China
Phone: +86 021-64515208
B&W Tek, Inc. +1-302-368-7824 www.bwtek.com B&W Tek, Inc. Page 2 Page 3
Who uses B&W Tek products & services?
B&W Tek is an advanced instrumentation company producing optical spectroscopy and laser
instrumentation, as well as laboratory, portable and handheld Raman systems. We provide
spectroscopy and laser solutions for the pharmaceutical, biomedical, physical, chemical, LED
lighting and research communities. Originally established as a producer of green lasers in 1997,
weve grown into an industry-leading, total solutions provider; coupling our core technologies
with custom design and manufacturing capabilities.
Since the companys establishment, weve emphasized strong vertical integration for better
efciency and faster growth. These values allow us to provide you with higher quality
products that still ft into your budget. B&W Tek uses core components that are designed and
manufactured in-house to create total solutions for a wide range of applications.
Our core technologies include:
Difraction Limited, Spectrum Stabilized, and High Power Lasers
UV, Vis, NIR, & Raman Spectrometers
Sampling Accessories & Broadband Light Sources
B&W Tek has always had a strong presence in the photonics industry, and now we are breaking into new
areas and applications like never before. Using our innovative engineering resources and fast-growing
technology, B&W Tek ofers products and services that provide solutions for a variety of industries:
Pharmaceuticals
Combining a number of our core technologies, we
have become the world leader in portable Raman
spectroscopy. Raman spectroscopy is a highly
selective and powerful tool for both qualitative
and quantitative analysis of organic and inorganic
compounds. Our CFR 21 Part 11 compliant
products reduce production costs within
cGMP facilities while simultaneously escalating
productivity.
LED Lighting
As part of the booming LED industry, B&W
Tek continues to provide solutions for LED
manufacturers and end-users alike. Our high
speed modular spectrometers are key building
blocks in LED binning and sorting machines,
while our spectral irradiance meters are used for
spectral power and colorimetric analysis of solid
state lighting, which is rapidly becoming todays
dominant light source.
Medical & BioMedical OEM/OED
B&W Tek has a long history of providing
components and integrated OEM and OED
solutions for the medical & biomedical industry.
We have designed and manufactured medical
laser systems for applications ranging from
equine airway surgery to photodynamic therapy
and we continue to be on the cutting edge of
high power medical laser technology. B&W Teks
spectrometers and low power lasers are also
frequently integrated into biomedical systems
such as microplate readers and fuorescence
imaging systems.
Academic / Government Labs
Our extensive line of lasers, spectrometers
and accessories are capable of generating and
detecting light for a wide variety of applications,
which makes them the ideal choice for
scientists looking for versatile equipment for
their laboratories. B&W Tek is partnering with
universities across the world to help foster the
next generation of breakthrough research in
areas such as cancer diagnostics, molecular level
archeological analysis, and green technology.
Semiconductor/Solar
B&W Teks products are often used in the solar and
semiconductor industry for various metrology
applications. Our Raman systems are ideal for
measuring stresses and strains in silicon wafers,
as well as performing quantitative analysis of
crystallinity. Our broadband spectrophotometers
are ideal for thin-flm thickness measurements,
and our modular spectrometers are ideal for
integration into plasma process monitoring
systems for end point detection.
What does B&W Tek do?
Specialty Chemicals
Optical spectroscopy is one of the most
commonly used techniques in analytical
chemistry, and B&W Tek ofers a full range of
spectroscopy solutions to suit the needs of this
industry. We ofer modular spectrometers and
excitation sources, complete laboratory Raman
and spectrophotometric systems, as well as
handheld and feld portable instrumentation.
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What added beneft does B&W Tek provide? What can I expect from B&W Tek?
At B&W Tek, not only do we design, manufacture and assemble all of our own products, we also
have the knowledge and expertise needed to guarantee that our products will ft the demands of
your application. We feel that providing instrumentation is just part of our commitment towards
providing your solution.
Our experienced staf is standing by to ofer service, support and their extensive knowledge to help
you fnd the answers youre looking for. Our research and development team consists of over 30
engineers in varying disciplines, each with an advanced degree in their feld, and were eager to share
our information and experience with you. We even post our knowledge on our website so you can
access the answers you need whenever and as often as youd like!
As part of our mission to provide knowledge, as well as products, to our customers, weve established
the New Horizons Academic Partnership Program. For over ffteen years, B&W Tek has supported
researchers with advanced instrumentation for optical spectroscopy and laser systems.
Now, we are looking to extend our research partnerships to academic institutions
with special pricing and applications support. We are thrilled to be supporting
breakthrough research in every way we can.
At B&W Tek, we guarantee superior performance, quality, and solid regulatory compliance standards
on each product that leaves our facility. We operate in ISO 13485 & ISO 9001 certifed facilities
equipped with clean room environments and apply an extensive Overall Quality Control Test (OQCT)
to make sure our products and services pass or exceed domestic and international standards and
regulations. Our mock FDA Quality Systems Inspections Technique (QSIT) allows us to conduct
Installation Qualifcation (IQ), Operational Qualifcation (OQ), and Performance Qualifcation (PQ)
checks, as well as software verifcation and validation. We also apply Six Sigma methodologies to
ensure that each product passes all tests at each production process level.
ISO 9001 & ISO 13485 Certifed
FDA & CDRH Registration and Compliance
CE Safety Standards
UL Safety Standards
Manufacturing FDA Class II and III Devices
Application of Six Sigma Methodologies
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What makes B&W Tek diferent from other providers? How will B&W Tek make my ideas a reality?
While there are many companies that can provide you with some of the components you need for your
application, we are a one-stop-shop that provides everything you need in one place. In many of the
industries we serve, were the only one of our kind. At B&W Tek, we pride ourselves on providing not
just the pieces of each project, but a total solution. Due to our resources and expertise, were able to do
this for our customers in a number of ways.
With a variety of extensive product families, were able to take an assortment of ready-to-use, of-
the-shelf products and put them together to form a complete setup. There are hundreds of possible
options by combining any variety of our lasers, spectrometers, accessories, and even software packages
- all of which are designed and built by our own staf.
Were also able to provide total solutions with input from you! By ofering various services in
industrial design, custom development, end-user training, and regulatory compliance testing
and certifcation, we work with you to make your ideas come to life. We design, engineer,
prototype and manufacture an extensive range of instrumentation for a variety of
applications, working with you from concept to completion. Though we may not
currently make the product thats perfect for your application, we are always open to
the challenge of creating new technologies and breaking into new applications.
Phase 1: Evaluation
From the very beginning, B&W Tek works closely with you to obtain a detailed view of your projects
requirements. After studying and evaluating the technical feasibility, we then propose a solution thats
unique to you.
Phase 2: Development and Prototype
Once you approve our proposal, we will demonstrate and deliver a collection of prototype products
for your feedback. In most cases, we provide these to you in less than 3 months!
Phase 3: Pilot Production
From here, B&W Tek works with you to resolve any manufacturing concerns, pursue any possibilities
for cost reduction, and scale up for full production. We will provide fnal qualifcation of the product
design and develop additional testing protocols to address the quality and reliability of your new
product.
Phase 4: Full Production
Next, we establish the fnal manufacturing process and bring your product into full volume
production. Our dedicated, high standard quality control team works hard to ensure that every single
one of your products meets performance and stability requirements.
Phase 5: Post Production Services
With facilities in the United States, Asia, and Europe, B&W Tek provides a full range of post-production
services to empower and support you. We ofer customized confgurations in order to deliver turn-key
solutions to your customers. We also provide customized warranty and service policies to eliminate
time consuming or costly repairs and give you the opportunity to access our technology upgrades and
product development news frst hand.
As part of our mission to provide a total solution,
weve developed the OEM Product Development
Cycle to ensure that we meet your goals at
each milestone. Our project management and
engineering team work closely with you to
understand not only the product requirements,
but your overall business goals. Our extremely
fexible and adaptable solutions are the perfect
answer for every OEM need.
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What types of products does B&W Tek ofer? What types of products does B&W Tek ofer?
B&W Tek ofers a complete line of high performance diode, DPSS and fber laser modules and systems.
Our product lines cover a range of wavelengths from 375nm to 1850nm with power outputs up to 150W.
We ofer a wide variety of high performance class IIIb & IV laser products in both end-user and OEM
confgurations, as well as high power medical OEM lasers.
Applications:
Fluorescence
Laser Biomodulation
Laser Printing
Laser Surgery
Metrology
Particle Counting
Photodynamic Therapy
Plastic Welding
Precision Alignment
Raman Spectroscopy/ Microscopy
Our line of spectrometers cover UV to NIR and everything in between. Fiber coupled and free space
miniature spectrometers are available with a wide selection of sampling accessories. Each spectrometer
comes with a USB interface and our own BWSpec software. We ofer set standard confguration and
customizable OEM solutions.
Applications:
Absorption
Fluorescence
Material Identifcation
Metrology
Process Monitoring
Quality Control
Raman Spectroscopy/ Microscopy
Refection
Spectral Irradiance
Wavelength Identifcation
Raman Spectrometers
Spectroscopy Software
Accessories
Spectrometers
Lasers
B&W Tek ofers a complete line of high performance laboratory, portable, and handheld Raman
spectrometers. We are the worldwide leader in Raman systems manufacturing, with over 10,000
spectrometers shipped. We have recently introduced the NanoRam, a new class of small, handheld
instruments for materials identifcation and verifcation within cGMP compliant facilities. The NanoRam is a
state-of-the-art compact Raman spectrometer and integrated computing system that can support a broad
range of applications in multiple industries. Based on our award winning i-Raman spectrometer, B&W Tek
has also released solutions for gemology and polymer analysis. Designed for use by non-specialists, these
new capabilities represent our focus on solution-oriented products.
Applications:
Agriculture
Bioscience
Forensic Analysis
Gemology
Geology/Mineralogy
Medical Diagnosis
Pharmaceuticals
Polymers/Chemical Processes
Raman Microscopy
B&W Tek ofers comprehensive software packages that provide solutions for all sorts of application needs.
Powerful calculations, easy data management, and user friendly, easy-to-follow work fow are all available at
the tips of your fngers.
BWSpec is the foundation for all B&W Tek software platforms and
comes standard with every spectrometer that we sell. Built on the
proven BWSpec platform, BWID is optimized for identifcation
and verifcation of materials. For industrial Raman applications
that require federal compliance, BWID-Pharma supports
all requirements of FDA 21 CFR Part 11 Compliance. BWIQ
chemometrics software is a multivariate analysis package that can
analyze spectral data and discover internal relationships between
spectra and response data or spectra and sample classes.
At B&W Tek, we believe in providing all of the elements for your solution; making the journey to fnd an
answer faster and easier. We ofer a wide range of accessories for all of our products, including:
External Batteries
Fiber Optics
Integrating Spheres
Light Sources
Multiplexers
Sample Holders
Sampling Probes
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Modular Spectroscopy
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Part 1: The Slit
A spectrometer is an imaging system which maps a plurality
of monochromatic images of the entrance slit onto the
detector plane. This slit is critical to the spectrometers
performance and determines the amount of light (photon
fux) that enters the optical bench. It is a driving force when
determining the spectral resolution; other factors are grating
groove frequency and detector pixel size.
The optical resolution and throughput of a spectrometer
will ultimately be determined by the installed slit. Light
entering the optical bench of a spectrometer via a fber or
lens is focused onto the pre-mounted and aligned slit. The slit
controls the angle of the light which enters the optical bench.
The function of the entrance slit is to defne a clear-cut object for the optical bench. The size (width (W
s
) and height
(H
s
)) of the entrance slit is one of the main factors that afect the throughput of the spectrograph. The image width
of the entrance slit is a key factor in determining the spectral resolution of the spectrometer when it is greater than
the pixel width of the detector array. Both the throughput and resolution of the system should be balanced by
selecting a proper entrance slit width.
The image width of the entrance slit (W
i
) can be estimated as,
Slit widths come in a number of diferent sizes from 5m to as large as 800m with a 1mm (standard) to 2mm height.
Selecting the right slit for your application is very important since they are aligned and permanently mounted into
a spectrometer and should only be changed by a trained technician.
The most common slits used in spectrometers are 10, 25, 50, 100, 200 m, etc. For systems where optical fbers are
used for input light coupling, a fber bundle matched with the shape of the entrance slit (stacked fber) may help
increase the coupling efciency and system throughput.
Overview
Technical Details
1
How Does a Spectrometer Work?
Over the past 20 years, miniature fber optic spectrometers have
evolved from a novelty to the spectrometer of choice for many
modern spectroscopists. People are realizing the advanced utility
and fexibility provided by their small size and compatibility with a
plethora of sampling accessories.
The basic function of a spectrometer is to take in light, break it into its
spectral components, digitize the signal as a function of wavelength,
and read it out and display it through a computer. The frst step in
this process is to direct light through a fber optic cable into the spectrometer through a narrow aperture
known as an entrance slit. The slit vignettes the light as it enters the spectrometer. In most spectrometers, the
divergent light is then collimated by a concave mirror and directed onto a grating. The grating then disperses
the spectral components of the light at slightly varying angles, which is then focused by a second concave
mirror and imaged onto the detector. Alternatively, a concave holographic grating can be used to perform all
three of these functions simultaneously. This alternative has various advantages and disadvantages, which
will be discussed in more detail later on.
Once the light is imaged onto the detector the photons are then converted into electrons which are digitized
and readout through a USB (or serial port) to a computer. The software then interpolates the signal based on
the number of pixels in the detector and the linear dispersion of the difraction grating to create a calibration
that enables the data to be plotted as a function of wavelength over the given spectral range. This data can
then be used and manipulated for countless spectroscopic applications, some of which will be discussed here
later on.
In the following sections we will explain the inner-workings of a spectrometer and how all of the components
work together to achieve a desired outcome, so that no matter what your application is, youll know what to
look for. Well frst discuss each component individually so that you have a full understanding of their function
in the workings of a spectrometer, then well discuss the variety of confgurations that are possible with those
components, and why each of them has a diferent function. Well even touch on some of the accessories used
to make your application as successful as they can possibly be.
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W
i
= (M
2
W
s
2
+W
o
2
)
1/2
,
Equation 1-1
where M is the magnifcation of the optical bench set by the ratio of the focal length of the focusing mirror / lens
to the collimating mirror / lens, W
s
is the width of the entrance slit, and W
o
is the image broadening caused by the
optical bench. Under the condition that the resolution requirement is satisfed, the slit width should be as wide as
possible to improve the throughput of the spectrograph.
For a standard Czerzy-Turner optical bench, W
o
is approximately a few tens of microns, so reducing the width of the
entrance slit below this value wont signifcantly improve the resolution of the system. Axial transmissive optical
benches can signifcantly reduce W
o
, thus achieving a fner spectral resolution. Another limit on spectral resolution is
set by the pixel width (W
p
) of the array detector. Reducing W
i
below W
p
will not increase resolution of the spectrometer.
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For fxed grating spectrometers, it can be shown that the angular dispersion from the grating is described by
where is the difraction angle, d is the groove period (which is equal to the inverse of the groove density), m is the
difraction order, and is the wavelength of light, as shown in Figure 2-1.
Equation 2-1
Figure 2-1 Geometric Representation of Difraction from Both a Concave and a Flat Grating
Equation 2-2
Equation 2-3
Equation 2-4
By taking into account the focal length (F) of the focusing mirror and by assuming the small angle approximation,
equation 2-1 can be rewritten as
which gives the linear dispersion in terms of nm/mm. From the linear dispersion, the maximum spectral range
(
max
-
min
) can be calculated based upon the detector length (L
D
), which can be calculated by multiplying the total
number of pixels on the detector (n) by the pixel width (W
p
) resulting in the expression
Based on equation 2-3, it is clear that the maximum spectral range of a spectrometer is determined by the detector
length (L
D
), the groove density (1/d) and the focal length (F).
The minimum wavelength diference that can be resolved by the difraction grating is given by
Part 2: The Grating
Groove Frequency
The difraction grating of a spectrometer determines the
wavelength range and partially determines the optical
resolution that the spectrometer will achieve. Choosing the
correct grating is a key factor in optimizing your spectrometer
for the best spectral results in your application. Gratings will
infuence your optical resolution and the maximum efciency
for a specifc wavelength range. The grating can be described
in two parts: the groove frequency and the blaze angle, which
are further explained in this section.
There are two types of difraction gratings: ruled gratings and
holographic gratings. Ruled gratings are created by etching
a large number of parallel grooves onto the surface of a
substrate, then coating it with a highly refective material.
Holographic gratings, on the other hand, are created by
interfering two UV beams to create a sinusoidal index of
refraction variation in a piece of optical glass. This process
results in a much more uniform spectral response, but a much
lower overall efciency.
While ruled gratings are the simplest and least expensive gratings to manufacture, they exhibit much more stray
light. This is due to surface imperfections and other errors in the groove period. Thus, for spectroscopic applications
(such as UV spectroscopy) where the detector response is poorer and the optics are sufering more loss, holographic
gratings are generally selected to improve the stray light performance of the spectrometer. Another advantage
of holographic gratings is that they are easily formed on concave surfaces, allowing them to function as both the
dispersive element and focusing optic at the same time.
The amount of dispersion is determined by the amount of grooves per mm ruled into the grating. This is commonly
referred to as groove density, or groove frequency. The groove frequency of the grating determines the spectrometers
wavelength coverage and is also a major factor in the spectral resolution. The wavelength coverage of a spectrometer
is inversely proportional to the dispersion of the grating due to its fxed geometry. However, the greater the dispersion,
the greater the resolving power of the spectrometer. Inversely, decreasing the groove frequency decreases the
dispersion and increases wavelength coverage at the cost of spectral resolution.
For example, if you were to choose a Quest X spectrometer with a 900g/mm, it would give you a wavelength
range of 370 nm, with an optical resolution as low as 0.5nm. Comparably, if you were to choose a Quest
X with a 600g/mm grating, it would instead give you up to 700nm of wavelength coverage with an
optical resolution as low as 1.0nm. As this example shows, you are able to increase your wavelength
coverage at the sacrifce of optical resolution.
When the required wavelength coverage is broad, i.e.
max
> 2
min
, optical signals
in wavelengths from diferent difraction orders may end up at the same spatial
position on the detector plane, which will become evident once we take a look
at the grating equation. In this case, a linear variable flter (LVF) is required to
eliminate any unwanted higher order contributions, or perform order sorting.
Overview
2
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Part 3: The Detector
3
Weve discussed the importance that the entrance slit and
the difraction grating have in forming a spectral image
of the incident light in the image plane. In traditional
spectrometer (monochrometer) designs, a second slit is
placed in the image plane, known as the exit slit. The exit
slit is typically the same size as the entrance slit since the
entrance slit width is one of the limiting factors on the
spectrometers resolution (as was shown in Part 1). In this
confguration a single element detector is placed behind
the exit slit and the grating is rotated to scan the spectral
image across the slit, and therefore measure the intensity
of the light as a function of wavelength.
Overview
Detector Types
In modern spectrometers, CCD and linear detector arrays have facilitated the development of fxed grating
spectrometers. As the incident light strikes the individual pixels across the CCD, each pixel represents a portion of the
spectrum that the electronics can then translate and display with a given intensity using software. This advancement
has allowed for spectrometers to be constructed without the need for moving parts, and therefore greatly reduce
the size and power consumption. The use of compact multi-element detectors has allowed for a new class of low
cost, compact spectrometers to be developed: commonly referred to as miniature spectrometers.
where h is Planks constant and c is the speed of light. The product of Planks constant and the speed of light can be
expressed as 1240 eVnm or 1.24 eVm to simplify the conversion from energy to wavelength. For example, the
bandgap energy of Si is 1.11eV which corresponds to a maximum wavelength of 1117.117nm.
InGaAs, on the other hand, is an alloy created by mixing InAs and GaAs, which have a bandgap of 0.36eV and 1.43eV
respectively. Therefore, depending on the ratio of In and Ga the bandgap energy can be tuned in between those
two values. However, due to a variety of factors, not all ratios of In and Ga are easily fabricated, therefore 1.7m (or
0.73eV) has become the standard confguration for InGaAs detector arrays. It is also possible to use extended InGaAs
arrays which can detect out to 2.2m or 2.6m, but these detectors are much more expensive and are much nosier
than traditional InGaAs detectors.
While photodetectors can be characterized in many diferent ways, the most important diferentiator is the detector
material. The two most common semiconductor materials used in miniature spectrometers are Si and InGaAs. It is
critical to choose the proper detector material when designing a spectrometer because the bandgap energy (E
gap
) of
the semiconductor determines the upper wavelength limit (
max
) that can be detected by the following relationship
where N is the total number of grooves on the difraction grating. This is consistent with transform limit theory
which states that the smallest resolvable unit of any transform is inversely proportional to the number of samples.
Generally, the resolving power of the grating is much higher than the overall resolving power of the spectrometer,
showing that the dispersion is only one of many factors in determining the overall spectral resolution.
It should also be noted that the longest wavelength that will be difracted by a grating is 2d, which places an upper
limit on the spectral range of the grating. For near-infrared (NIR) applications, this long wavelength limitation may
restrict the maximum groove density allowed for your spectrometer.
As a grating difracts incident polychromatic light, it does not do so with uniform efciency. The overall shape of
the difraction curve is determined mainly by the groove facet angle, otherwise known as the blaze angle. Using
this property, it is possible to calculate which blaze angle will correspond to which peak efciency; this is called
the blaze wavelength. This concept is illustrated in Figure 2-1, which compares three diferent 150g/mm gratings
blazed at 500nm, 1250nm & 2000nm.
Gratings can be blazed to provide high difraction efciency (>85%) at a specifc wavelength, i.e. a blaze wavelength
(
B
). As a rule of thumb, the grating efciency will decrease by 50% at 0.6
B
and 1.8
B
. This sets a limit on the
spectral coverage of the spectrometer. Generally, the blaze wavelength of the difraction grating is biased toward
the weak side of the spectral range to improve the overall signal to noise ratio (SNR) of the spectrometer.
Figure 2-2 Comparison of Grating Efciency As a Function of Blaze Wavelenth
Blaze Angle
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Equation 3-1
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While there are distinct advantages to the use of BT-CCDs in spectroscopy, there are also two major drawbacks that
should be noted. First, this process greatly increases the cost of production, and second (since the detector is so
thin ) there can be an etaloning efect caused from refections of the front and back surfaces of the detector. The
etaloning phenomena associated with BT-CCDs can be mitigated by a process known as deep depletion, but once
again this adds additional cost to the production process.
PDA detectors are more traditional linear detectors which consist of a set of individual photodiodes that are arranged
in a linear fashion using CMOS technology. These detectors, while not having the small pixel size and high sensitivity,
have several advantages over CCD and BT-CCD detectors. First, the lack of charge transfer eliminates the need for a
gate structure on the front surface of the detector and greatly increases the readout speed. The second advantage
of PDA detectors is that the well depth is much higher than the well depth of a CCD; a typical PDA detector well
depth is ~156,000,000e- as compared to ~65,000e- for a standard CCD. The larger well depth of PDA detectors causes
them to have a very large dynamic range (~50,000:1) as well as an extremely linear response. These properties make
PDAs ideal for applications where it is necessary to detect small changes in large signals, such as LED monitoring.
The main noise sources found in an array detector include readout noise, shot noise, dark noise, and fxed pattern
noise.
Readout noise is caused by electronic noise in the detector output stage and related circuitry, which largely dictates
the detection limit of the spectrometer.
Shot noise is associated with the statistical variation in the number of photons incident on the detector, which
follows a Poisson distribution. Therefore, shot noise is proportional to the square root of the incident photon fux.
Detector Noise
Dark noise is associated with the statistical changes in the number of electrons generated in a dark state. A photo
detector exhibits a small output even when no incident light is present. This is known as the dark current or dark
output. Dark current is caused by thermally generated electron movements and is strongly dependent on ambient
temperatures. Similar to shot noise, dark noise also follows a Poisson distribution; as a result, dark noise is proportional
to the square root of the dark current.
CCDs, BT-CCDs, and PDAs
To mitigate both of these issues in spectroscopy applications where very high sensitivity is needed, BT-CCDs are
ideal. BT-CCDs are made by etching the P-Si substrate of the CCD to a thickness of approximately 10m. This process
greatly reduces the amount of absorption and increases the overall efciency of the detector. This process also allows
the detector to be illuminated from the back side (P-Si region) which eliminates the efects from the gate structure
on the surface of the detector. Figure 3-2 shows a typical comparison of the quantum efciency between a
traditional front illuminated CCD and a back illuminated BT-CCD.
The lower detection limit of a material is slightly harder to quantify because it is determined by the absorbance
characteristics of the semiconductor material, and as a result can vary widely with the thickness of the detector.
Another common method of lowering the detection limit of the detector is to place a fuorescent coating on the
window of the detector, which will absorb the higher energy photons and reemit lower energy photons which
are then detectable by the sensor. Figure 3-1 below shows a comparison of the detectivity (D*) as a function of
wavelength for both Si (CCD) and InGaAs.
While currently InGaAs detector arrays are only available in one confguration, Si multi-element detectors are readily
available in three diferent subcategories: charge coupled devices (CCDs) back-thinned charge coupled devices
(BT-CCDs), and photodiode arrays (PDAs).
CCD technology allows for small pixel size (~14m) detectors to be constructed because it eliminates the need for
direct readout circuitry from each individual pixel. This is accomplished by transferring the charge from one pixel to
another, allowing for all of the information along the array to be read out from a single pixel. CCDs can be constructed
very inexpensively which makes them an ideal choice for most miniature spectrometers, but they do have two
drawbacks. First, the gate structure on the front of the CCD can cause the incident light to scatter and therefore not
be absorbed. Second, CCDs need to have a relatively large P-Si substrate to facilitate low cost production limiting
the efciency of the detector (especially at shorter wavelengths) due to absorption through the P layer.
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Figure 3-1 Approximate D* Values As a Function of Wavelength for Some Typical Detectors
Figure 3-2 Typical Quantum Efciency of Front-illuminated CCD and Back-thinned CCD
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Part 4: The Optical Bench
4
As stated in Part 1: The Slit, a spectrometer is an imaging
system which maps a plurality of monochromatic images
of the entrance slit onto the detector plane. In the past
3 sections, we discussed the three key confgurable
components of the spectrometer: the slit, the grating,
and the detector. In this section, we will discuss how
these diferent components work together with diferent
optical components to form a complete system. This
system is typically referred to as the spectrograph, or
optical bench. While there are many diferent possible
optical bench confgurations, the three most common
types are the crossed Czerny-Turner, unfolded Czerny-
Turner, and concave holographic spectrographs (shown
in Figures 4-1, 4-2, and 4-3 respectively).
The crossed Czerny-Turner confguration ofers a compact and fexible spectrograph design. For a difraction grating
with a given angular dispersion value, the focal length of the two mirrors can be designed to provide various linear
dispersion values. This determines the spectral coverage for a given detector, sensing length and resolution of the
system. By optimizing the geometry of the confguration, the crossed Czerny-Turner spectrograph may provide a
fattened spectral feld and good coma correction. However, due to its of-axis geometry, the Czerny-Turner optical
bench exhibits a large image aberration, which may broaden the image width of the entrance slit by a few tens
of microns. Thus, the Czerny-Turner optical bench is mainly used for low to medium resolution spectrometers.
Although this design is not intended for two dimensional imaging, using aspheric mirrors (such as toroidal mirrors)
instead of spherical mirrors can provide a certain degree of correction to the spherical aberration and astigmatism.
Overview
Czerny-Turner
The crossed Czerny-Turner configuration
consists of two concave mirrors and one plano
difraction grating, as illustrated in fgure 4-1.
The focal length of mirror 1 is selected such
that it collimates the light emitted from the
entrance slit and directs the collimated beam
of light onto the difraction grating. Once the
light has been difracted and separated into its
chromatic components, mirror 2 is then used to
focus the dispersed light from the grating onto
the detector plane.
Figure 4-1 Crossed Czerny-Turner Spectrograph
Cooling an array detector with a built-in thermoelectric cooler (TEC) is an efective way to reduce dark noise as well
as to enhance the dynamic range and detection limit. For Si detectors, dark current doubles when the temperature
increases by approximately 5 to 7 C and halves when the temperature decreases by approximately 5 to 7C. Figure
3-3 shows the dark noise for an un-cooled and cooled CCD detector at an integration time of 60 seconds. When
operating at room temperature, the dark noise nearly saturates the un-cooled CCD. When the CCD is cooled down
to only 10C by the TEC, the dark current is reduced by about four times and the dark noise is reduced by about two
times. This makes the CCD capable of operating at a longer integration time to detect weak optical signals. When
a CCD based spectrometer is involved in non-demanding high light level applications such as LED measurement,
the dark noise reduction due to TE cooling is minimal because of the relatively short integration time used.
As a rule of thumb, when the integration time of a CCD spectrometer is set to less than 200ms, the detector is operating
in a read noise limited state. Therefore, there is no signifcant noise reduction due to the TE cooling; however the
temperature regulation under these conditions will be benefcial for long term baseline stability.
The fxed pattern noise is the variation in photo-response between neighboring pixels. This variation results mainly
from variations in the quantum efciency among pixels caused by non-uniformities in the aperture area and flm
thickness that arise during fabrication.
The total noise of an array detector is the root square sum of these four noise sources.
TE Cooling
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Figure 3-3 Dark Current for Cooled and Un-cooled CCD Detector (Integration Time = 60s)
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In comparison with a ruled grating, the holographic grating presents up to over a 10x reduction in stray light, which
helps to minimize the interferences due to unwanted light. A ruled difraction grating is produced by a ruling engine
that cuts grooves into the coating layer on the grating substrate (typically glass coated with a thin refective layer)
using a diamond tipped tool.
A holographic difraction grating is produced using a photolithographic technique that utilizes a holographic
interference pattern. Ruled difraction gratings, by the nature of the manufacturing process, cannot be produced
without defects, which may include periodic errors, spacing errors and surface irregularities. All of these contribute
to increased stray light and ghosting (false spectral lines caused by periodic errors). The optical technique used to
manufacture holographic difraction gratings does not produce periodic errors, spacing errors or surface irregularities.
This means that holographic gratings have signifcantly reduced stray light (typically 5-10x lower stray light compared
to ruled gratings) and removed ghosts completely.
Ruled gratings are generally selected when working with low groove density, e.g., less than 1200 g/mm. When high
groove density, low stray light, and/or concave gratings are required, holographic gratings are the better choice. It
is important to keep in mind that the maximum difraction efciency of concave holographic gratings is typically
~35% in comparison to plano ruled gratings, which can have peak efciencies of ~80%.
Figure 4-3 Concave-Holographic Spectrograph
Concave Holographic
Introduction The third most common optical bench is based on an aberration corrected concave holographic grating (CHG). Here,
the concave grating is used both as the dispersive and focusing element, which in turn means that the number of
optical elements is reduced. This increases throughput and efciency of the spectrograph, thus making it higher
in throughput and more rugged. The holographic grating technology permits correction of all image aberrations
present in spherical, mirror based Czerny-Turner spectrometers at one wavelength, with good mitigation over a
wide wavelength range.
Part 5: Spectral Resolution
5
One of the most important characteristics of a spectrometer
is the spectral (or optical) resolution. The spectral resolution
of a system determines the maximum number of spectral
peaks that the spectrometer can resolve. For example, if
a spectrometer with a wavelength range of 200nm had a
spectral resolution of 1nm, the system would be capable of
resolving a maximum of 200 individual wavelengths (peaks)
across a spectrum.
In dispersive array spectrometers, there are 3 main factors
that determine the spectral resolution of a spectrometer:
the slit, the difraction grating, and the detector. The slit
determines the minimum image size that the optical bench
can form in the detector plane. The diffraction grating
determines the total wavelength range of the spectrometer.
The detector determines the maximum number and size of
discreet points in which the spectrum can be digitized.
The relatively large f/# of Czerny-Turner optical benches,
in comparison to a typical multimode fber (NA 0.22),
can cause a fairly high level of stray light in the optical
bench. One simple and cost-efective way to mitigate
this issue is by unfolding the optical bench as shown in
Figure 4-2. This allows for the insertion of beam blocks
into the optical path, greatly reducing the stray light
and, as a result, the optical noise in the system. This issue
is not as damaging in the visible and NIR regions where
there is an abundance of signal and higher quantum
efciencies, but it can be a problem for dealing with
medium to low light level UV applications. This makes
the unfolded Czerny-Turner spectrograph ideal for UV
applications that require a compact form factor.
To minimize image aberrations, the Czerny-Turner optical bench is generally designed with an f-number (f/#) of
>3, which in turn places a limit on its throughput. The f-number of an optical system expresses the diameter of the
entrance pupil in terms of its efective focal length. The f-number is defned as f/# = f/D, where f is the focal length of
the collection optic and D is the diameter of the element. The f-number is used to characterize the light gathering
power of the optical system. The relation of the f-number with another important optical concept, Numerical
Aperture (NA), is that: f/# = 1/(2NA), where the numerical aperture of an optical system is a dimensionless number
that characterizes the range of angles over which the system can accept or emit light.
Figure 4-2 Unfolded Czerny-Turner Spectrograph
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Calculating Spectral Resolution:
Overview
Technical Details
When calculating the spectral resolution () of a spectrometer, there are four values you will need to know: the
slit width (W
s
), the spectral range of the spectrometer (), the pixel width (W
p
), and the number of pixels in the
detector (n). It is also important to remember that spectral resolution is defned as the FWHM. One very common
mistake when calculating spectral resolution is to overlook the fact that in order to determine the FWHM of a peak, a
minimum of three pixels is required, therefore the spectral resolution (assuming the W
s
= W
p
) is equal to three times
the pixel resolution (/n). This relationship can be expanded on to create a value known as resolution factor (RF),
which is determined by the relationship between the slit width and the pixel width. As would be expected, when
W
s
W
p
the resolution factor is 3. When W
s
2W
p
the resolution factor drops to 2.5, and continues to drop until W
s
> 4W
p
when the resolution factor levels out to 1.5.
All of this information can be summarized by the following equation,
A fber optic can be thought of as a light pipe. If you consider how the pipes in a home direct water from one
location to another by guiding it through twists and turns to the desired location, you can recognize that fber
optics guide light waves in a similar fashion. Instead of directing light to a bathroom or kitchen, though, we are
interested in guiding the light into a spectrometer or other optical detection system. This is achieved by a process
known as total internal refection.
In order to understand how total internal refection is achieved, we must frst look at the optical property known
as refraction. Refraction arises because the speed of light varies based on the material it is traveling through. As
a result, when light transitions from one medium to another, the angle at which the light is traveling is retarded
relative to the interface.
The refracting power of a material is defned as
where n is the index of refraction, v is the speed of light in the medium of interest, and c is the speed of light in a
vacuum. For example, the index of refraction of air is 1.000293, which shows that the speed of light in air is almost
exactly the same as it is in a vacuum, whereas the index of refraction of water is 1.333, showing that light travels
25% slower in water than in a vacuum.
The relationship between the index of refraction and the angle at which light travels is defned by Snells law
Equation 6-2
For example, if a spectrometer uses a 25m slit, a 14m 2048 pixel detector and a wavelength
range from 350nm 1050nm, the calculated resolution will be 1.53nm.
Part 6: Choosing a Fiber Optic
6
When confguring a spectrometer for a given experiment,
one of the commonly overlooked considerations is in
choosing the best fber optic cable. Although there are many
diferent factors to consider for this choice, this section will
focus on the following two key factors: core diameter and
absorption.
First, we will briefy review what a fber optic cable is and
how it is used to direct light into a spectrometer. Then, we
will discuss the two characteristics stated above and why
they are important for determining the throughput of the
fber optic.
Measuring Spectral Resolution
It is important to understand that the observed signal (S
o
) is not solely dependent on the spectral resolution (R) of
the spectrometer but it is also dependent on the linewidth of the signal (S
r
). As a result, the observed resolution is
the convolution of the two sources,
When the signal linewidth is signifcantly greater than the spectral resolution, the efect can be ignored and one
can assume that the measured resolution is the same as the signal resolution. Conversely, when the signal linewidth
is signifcantly narrower than the spectrometer resolution, the observed spectrum will be limited solely by the
spectrometer resolution.
For most applications it is safe to assume that you are working in one of these limiting cases, but for certain
applications such as high resolution Raman spectroscopy, this convolution cannot be ignored. For example, if a
spectrometer has a spectral resolution of ~3cm
-1
and uses a laser with a linewidth of ~4cm
-1
, the observed signal will
have a linewidth of ~5cm
-1
since the spectral resolutions are so close to each other (assuming a Gaussian distribution).
For this reason, when attempting to measure the spectral resolution of a spectrometer it is important to assure that
the measured signal is signifcantly narrow to assure that the measurement is resolution limited. This is typically
accomplished by using a low pressure emission lamp, such as an Hg vapor or Ar, since the linewidth of such sources
is typically much narrower than the spectral resolution of a dispersive array spectrometer. If narrower resolution is
required, a single mode laser can be used.
After the data is collected from the low pressure lamp, the spectral resolution is measured at the full width half
maximum (FWHM) of the peak of interest.
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Equation 5-1
Equation 5-2
Equation 6-1

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From this equation, we can see that the refracted angle (
2
) is dependent on the ratio of the indices of the two
materials (n
1
/n
2
) as well as the incident angle (
1
). As a result, by controlling the ratio of the indices, one can engineer
the refracted angle such that all of the light is refected back from the interface. This is known as total internal
refection and is the method that allows for light to be contained and guided inside of a fber optic.
Another important factor to consider is the absorption properties of the fber optic. If the light is absorbed by the
fber, it will never be detected by the spectrometer.
During the traditional manufacturing process for fber-optics, OH
-
ions are inadvertently doped into the glass by
the plasma torches used to soften the bulb so that it can be drawn into fbers. The presence of these ions creates
very strong absorption bands (known as water peaks) in the NIR, which can greatly interfere with the ability to make
broad band measurements through this region. In order to avoid this when using fber optics for NIR spectroscopy,
fber optics need to be manufactured using special low OH
-
plasma torches.
Inversely, there are also severe absorption properties in the UV spectrum. This property arises from a photo-chemical
efect known as solarization, which worsens over time with extended UV exposure especially below 290nm.

For these reasons, it is extremely important to pay close attention when selecting a fber for a specifc application.
When operating in the NIR spectra, make sure to choose low OH- fber optics (also commonly called NIR fber optics).
When working in the visible and near UV spectral region, standard fber optics commonly referred to as UV fber
optics are acceptable. When working in the deep UV (<290nm), solarization resistant fbers generally referred to
as SRUV fbers are required.
Since all of the light in a fber optic is collected in the core, the diameter of the core directly correlates to the amount
of light that can be transmitted. Based on this principle, it would seem intuitive that a larger core diameter will
improve the sensitivity and signal-to-noise ratio of a spectrometer. While this is true to a certain extent, there are
other limiting factors that need to be considered when selecting the right fber optic.
The frst thing to consider is the pixel height of the detector. As shown in previous sections, the optical bench of a
spectrometer is designed to form an image of the slit onto the detector plane. If the detector pixels are only 200m
in height and you select a 400m core fber, 50% of the light incident on the detector is wasted. In this case, there
appears to be no advantage gained from having a larger core, but there is a way to get around this issue by adding
a cylindrical lens into the optical bench in front of the detector.
Figure 6-1 illustrates how a fber optic is designed to facilitate
total internal refection by using two diferent types of glass,
a lower index cladding, and a higher index core in order to
trap the light within the core of the fber and guide it through
the fber optic. This ability to collect light from one place and
direct it to another is the reason fber optic cables are the ideal
solution for coupling light into a spectrometer.
The cylindrical lens focuses the image of the slit in the axis that is orthogonal to the array without
distorting the image along the axis that is parallel to the array in the detector plane. This allows
for the light from the entire core to be directed onto the pixel, greatly increasing the sensitivity
of the overall setup. Figure 6-2 shows that this approach works quite well up to a 600m
core fber.
Figure 6-1 Total Internal Refection in a Fiber Optic
Figure 6-2 Signal Intensity for Various Core Diameters with a Cylindrical Lens Installed
Figure 6-3 Comparison of Standard and LowOH- Fiber Optics in the NIR
Core Diameter
Absorption
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Part 7: Fiber Optic Bundles
Overview
7
For many spectroscopic applications, proper sampling
requires more than just a simple fber optic patch cord.
In cases that require you to measure various samples
simultaneously or those that require improved signal
to noise ratio (as in the case of weak signals), the use
of fber optic bundles are required. In this section, we
will discuss the advantages and disadvantages of some
common fber optic bundle confgurations.
Fiber Optic Bundles
A fber optic bundle is defned as any fber optic assembly that contains more than one fber optic in a single cable.
The most common example of a fber optic bundle is known as a bifurcated fber assembly. The goal of using a
bifurcated fber assembly is either to split a signal or to combine signals. Figure 7-1 shows an example of a typical
bifurcated fber assembly.
A bifurcated fber can also be used to couple the signal from multiple samples into the same spectrometer. When
using a bifurcated fber in this fashion, only one sample can emit light at a time, or special care should be taken
to make sure the signals do not have spectral overlap.
The same basic principal and applications can be scaled up to trifurcated and quadfurcated fber assemblies as
well. An example of a trifurcated fber assembly is shown in Figure 7-3 below.
Another common bundled fber optic assembly is called a round to slitconfguration. This confguration consists
of multiple small core fbers (typically 100m) that are put into one fber assembly with fbers bundled tightly
in a circular fashion on one end, and stacked linearly on top of each other on the other end. The end with fbers
stacked linearly on top of one another form a pattern to match the entrance slit of the spectrometer, as shown
in Figure 7-4 below.
Some of the most common applications for bifurcated fber
assemblies are those that require you to direct light from a
sample into two diferent spectrometers. This is generally used
to extend the spectral coverage of the measurement, either
to maintain higher resolution or to cover an extended range.
For example, if someone is looking to make a broadband
measurement from 350 1700nm, they need to use
both an InGaAs and a Si detector array. By using
a bifurcated fber assembly with one UV fber
and one NIR fiber to direct light into each
spectrometer, they can make a simultaneous
measurement. Figure 7-2 shows an example
spectrum of this type of measurement.
Figure 7-1 Example of a Bifurcated Fiber Assembly
Figure 7-2 Spectrum of a Tungsten Halogen Lamp
from 350 1700nm
Figure 7-3 Trifurcated Fiber Assembly
Figure 7-4 Round to Slit Fiber Optic Bundle
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This confguration allows for much higher throughput into the spectrometer, as opposed to simply using a
larger core fber. As shown in Figure 7-5 below, when a large core fber is placed in front of the entrance slit of a
spectrometer, the majority of the light is vignetted and doesnt make it into the spectrometer. By contrast, when
the smaller fbers are stacked along the entrance slit, signifcantly more light enters into the spectrometer, allowing
for much higher sensitivity and signal to noise. As a result, the slit can remain relatively narrow and maintain
resolution without sacrifcing throughput.
By combining various combinations of single, round, and stacked confgurations with regular, bifurcated,
trifurcated, and quadfurcated fber assemblies, there are countless options available to suit any
application. In the next section, we will discuss how to combine fber bundles with other various
opto-mechanical components to create more specifc applications.
When using a fiber optic assembly with a slit
confguration, it is important to remember two
important details. First, in order to get any beneft
from the fber stacking, a cylindrical lens must be
used to prevent the vast majority of the light to be
imaged above and below the detector. Second, it
is important to properly align the fber stack to the
entrance slit, which can be done by shining light
into the round end of the assembly and monitoring
the signal as the fber is rotated in the SMA905
connection port. When peak signal is achieved,
the fber can then be screwed down to lock the
position. One very common application using this
kind of fber optic assembly is NIR transmission
spectroscopy, where there are very few photons
and photon energy is extremely low. An example
of a transmittance setup is shown in Figure 7-6.
Figure 7-5 Comparison of Stacked Fiber to Single Large Core Fiber
Figure 8-1 Fiber Optic Refectance Probe
Figure 7-6 Example Transmittance Setup Utilizing
a Round to Slit Fiber Bundle
Overview
Refectance Probes
The most basic fber optic probe is a refectance probe, which in its simplest form consists of a bifurcated fber where
the distal (bundled) end is placed in a metal sheath instead of a SMA connector, as shown in fgure 8-1. This setup
allows for one of the bifurcated ends to be connected to a light source, such as a fber coupled tungsten halogen
lamp, while the other is connected to a spectrometer. In this setup, the light from the lamp will travel through the
1st bifurcated end to the distal end of the probe and refect of of the sample. The refected light from the sample
will then travel from the distal end to the 2nd bifurcated end and into the spectrometer for analysis.
It is important to note that before refection data can be collected by the spectrometer, the system must be calibrated
by taking a reference scan. This reference scan is taken by placing a white light refectance standard, such as PTFE,
at the same geometry from the probe as will be used in the actual measurement. This will allow the spectrometer
to measure the ratio between a perfectwhite light refector and the sample of interest in order to determine which
wavelengths of light are refected and which are absorbed.
Part 8: Fiber Optic Probes
8
Now that we understand the basics of fber optic cables
and bundles and how they can be used to collect and direct
light, we will explore how fber optics can be packaged and
combined with diferent opto-mechanical components to
construct fber optic probes. Fiber optic probes are the
ideal solution for analyzing large or awkwardly shaped
samples, monitoring real-time kinetic reactions, sampling
in vivo, and any other application where it is difcult to
bring the sample to the spectrometer. The fexibility and
user-friendliness of fber optic probes has made them one
of the most widespread tools in modern spectroscopy. In
this section, we will briefy discuss four of the most common
fber optic probes: refectance probes, dark-feld refection
probes, transfectance dip probes, and Raman probes.
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A slightly more complex approach to the design of refectance probes is to employ a round-to-slit fber optic bundle.
As described in the previous section, this is one common approach to overcoming the issue of weak photon energy
in the NIR. In many refection probes designed to work in the NIR, this method is applied by stacking 6 fbers on the
bifurcated end attached to the spectrometer and employing a 6-around-1 confguration on the distal end. The 6
outer fbers are going to the slit confguration on the spectrometer and the center fber connects to the light source
in the other bifurcated end, as shown in fgure 8-2 below.
While refection probes can be used to measure liquids, they are primarily designed for the measurement of solids.
When measuring liquid samples, a dip probe is generally the probe of choice since it can be submerged into the
sample, allowing for kinetic data to be collected. The design of a fber dip probe is very similar to that of a refection
probe, though special efort is taken to guarantee that it is liquid tight and inert. The key functional diference is the
presence of a cavity which, when immersed, flls with the liquid sample. This cavity contains an optically transparent
window placed at the distal end of the fber and a small mirror placed at the bottom of the cavity to refect the
transmitted light back through the sample and into the collection fber as shown below in fgure 8-4. This setup is
commonly referred to as a transfectance, due to the fact that this method combines transmission and refection,
doubling the optical path length.
The last probe that we will discuss in this section is called a Raman probe, which is used to measure the inelastic
scattering of light of of a sample. Raman scattering is a nonlinear efect resulting in the shift in wavelength from a
known monochromatic source. This shift is equal to the vibrational frequency of the molecular bonds in the material.
As a result, a Raman probe must be capable of directing and focusing the monochromatic excitation source (typically
a laser) to the sample, collecting the scattered light and then directing it to the spectrometer. Figure 8-5 shows a
typical design for a Raman probe.
The Raman probe is a perfect example of how fber optics can be combined with other optical components to
enable simple and fexible measurement of even the most complicated spectroscopy.
Since a pure signal is extremely important to Raman spectroscopy, a narrow band-pass flter is placed in the optical
path of the excitation source before it reaches the sample. It is also important to note that since the Raman efect
is extremely weak, the signal must be collected at a 0
o
angle normal to the sample. As discussed earlier, this causes
interference from specular refections, which in this case is referred to as Rayleigh scattering. Therefore, it is essential
to flter the collected signal through the use of a long pass flter before it is directed to the spectrometer.
It is important to note that transfectance
measurements can also be made using a
dark-feld refectance probe confguration.
Figure 8-3 shows an adaptor which can be
placed over the dark-feld probe to enable
transflectance measurements in liquids
and slurries.
Refectance probes can also be scaled up to trifurcated and quadfurcated designs in order to increase the spectral
range over which the refection data is collected.
Specular refection does not contain any useful information for NIR spectroscopy, but it can typically be removed
by measuring the sample at a 45
o
angle. However, if the sample cannot be measured at a 45
o
angle, such as when
working in a feld or production setting, dark-feld illumination (a method borrowed from microscopy) can be used.
The dark-feld probe works by illuminating the sample with an annulus of 7 fbers. The difusely refected light is
then collected by a bundle of 7 fbers in the center of the probe which directs the light to the spectrometer in a slit
confguration, as shown in fgure 8-3 below. The specular components of the light are further reduced by the use
of a lens at the distal end of the probe to redirect the light away from the center fber bundle.
Figure 8-2 Fiber Optic Refection Probe with Slit-to-Bundle Confguration
Figure 8-4 Fiber Optic Transfectance Dip Probe
Figure 8-5 Typical Design of a Raman Probe
Figure 8-3 Dark-feld Fiber Optic Probe
Dark Field Refectance Probes
Transfectance Dip Probes
Raman Probes
When measuring refection, there are two standard geometries that are employed: 0
o
and 45
o
normal to the sample.
When measuring at 0
o
, the probe will pick up the specular (mirror like) component of the refected light as well as
the difuse component, but when measuring at 45
o
, the majority of the specular light is not collected by the probe.
This is an important consideration for applications such as colorimetry and NIR spectroscopy, where the specular
component can distort the spectrum and skew the results.
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Refectance:
Refectance is determined by frst measuring a white refectance standard and
then measuring the surface of the material of interest in order to calculate the ratio
between the two. Refectance is one of the fundamental spectral properties of a
material, and is one of the simplest measurements to make using a spectrometer.
There are two primary components in a refected spectrum: specular and difuse.
Each contains diferent information about the material. Depending on the
component of interest, refectance can be measured using a variety of accessories.
Integrating spheres and fber optic refectance probes measure both difuse and/
or specular components, whereas a simple collimating lense can be used if you are
only interested in the specular components.
Refectance can be used to characterize color (both specular & difuse), coated
& un-coated optical components, thin-flm thickness, semiconductors, precious
metals, and countless other materials.
Transmission, which is also one of the most fundamental spectral properties of a
material, has a very similar defnition to refectance. Transmission is defned as the
ratio of the spectrum of incident light normal to the surface of the material and
the spectrum of the light that is transmitted out of the other side of the material.
Transmission measurements can be taken on solid, liquid and gas phase materials.
Typically for solid materials, these measurements are made using two collimating
lenses. For more challenging samples like liquids and gases, fber coupled cuvette
holders, fow cells, or immersion probes are used.
Transmittance data is typically used for the characterization of optical
components.
Transmission:
Absorption:
Absorption is the log of transmission, but is the preferred method for most
molecular spectroscopic analyses of materials. Absorption can be measured at
any wavelength but is typically employed in the UV (200 - 400nm) and NIR (900 -
2200nm) ranges.
Typical absorption set-ups are similar to transmission set-ups utilizing
cuvette holders, fow cells, and immersion probes.
Absorption allows for information to be gathered about the
fundamental structure of a molecule and can be used for both
qualitative and quantitative analyses.
Applications of Modular Spectroscopy
Emission:
Emission measurements are the simplest spectroscopic technique, and may be
the most commonly used in history. When measuring emission, any variety of
accessories can be utilized since in most cases you are not restricted by the size of the
sample. Most of the time, a standard fber optic patch cable is perfectly acceptable
for the measurement.
Examples of these types of measurements include elemental emission spectroscopy,
spectral irradiance measurements, laser characterization, plasma endpoint detection,
and countless others.
Fluorescence:
In fuorescence spectroscopy, a molecule is analyzed by exciting the species with a
high energy photon (traditionally in the UV). This causes the electrons to transition
from a ground state to a higher energy state. When the electron returns to the
ground state, it emits a photon with lower energy which is equal to the energy
level of which it was excited to. Therefore, by measuring the spectrum of the
emitted light, you can investigate the diferent electronic and vibrational states of
the molecule.
Fluorescence spectroscopy can also be used to identify non-fuorescent
compounds by tagging it with another molecule with known fuorescent
properties and an afnity for the compound of interest.
Typical fuorescence setups will employ a UV excitation source such as a pulsed
xenon lamp or a UV laser directed onto a sample with a dichroic mirror to redirect
the emitted light into a spectrometer. A right-angle (3-port) cuvette holder can
also be used for liquid or powder samples.
Raman:
Raman spectroscopy, a molecular spectroscopy which is observed as inelastically
scattered light, allows for the interrogation and identifcation of vibrational
(phonon) states of molecules. As a result, Raman spectroscopy provides an
invaluable analytical tool for molecular fnger printing as well as monitoring
changes in molecular bond structure (e.g. state changes and stresses & strains).
In comparison to other vibrational spectroscopy methods, such as FT-IR and
NIR, Raman has several major advantages. These advantages stem from the fact
that the Raman efect manifests itself in the light scattered of of a sample as
opposed to the light absorbed by a sample. Similar to FT-IR, Raman spectroscopy
is highly selective which allows Raman to identify and diferentiate molecules and
chemical species that are very similar.
Since Raman spectroscopy is such a weak process, it is imperative that you use a
TE Cooled spectrometer and a high quality laser.
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Exemplar
Smart CCD Spectrometer
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SMART:
SPEED:
SYNCHRONOUS:
Applications:
UV, Vis, and NIR: Spectroscopy /
Spectroradiometry / Spectrophotometry
Absorbance / Refectance / Transmittance
Kinetic Reaction Monitoring
Transient Spectral Analysis
OEM Systems Integration
Multi-point Sampling
On-board processing including averaging, smoothing,
and dark compensation
Acquires and transfers more than 900 spectra per second at
an integration time of 1050s
Supports up to 32 devices with ultra-low trigger
delay (35ns) & gate jitter (+/- 5ns)
The Exemplar is the next step in the evolution of miniature CCD
spectrometers. It is the frst smart spectrometer featuring on board data
processing, USB 3.0 communication, and temperature compensation. The
Exemplar is also optimized for multi-channel operation featuring ultra-
low trigger delay and gate jitter. Additionally, the Exemplar features a
2048 element detector and built-in 16-bit digitizer with greater than 2.0
MHz readout speed.
The Exemplar is ideal for most visible and near-infrared applications and
is available in the following standard confguration: wavelength range
of 350-1050nm, 25m slit, an LVF flter, a ruled grating (600mm/400nm),
and a spectral resolution of 1.5nm.
SIGNAL TO NOISE RATIO:
On-board Averaging 1 ~295
Difraction Grating
Slit Option Dimensions
Approx. Resolution
350-1050nm
10m 10m wide x 1mm high ~1.0nm
200m 200m wide x 1mm high Call
Custom Slit Widths Available
Spectrograph
Best
Efciency
Spectral
Coverage (nm)
Grating
UV / NIR 350 - 1050 600/400
Vis 380 - 750 900/500
Vis / NIR 550 - 1050 830/800
NIR 750 - 1000 1200/750
Custom Confgurations Available
Software:
BWSpec
TM
is a spectral data acquisition software with a
wide range of tools that are designed to perform complex
measurements and calculations at the click of a button. It
allows the user to choose between multiple data formats
and ofers optimization of scanning parameters, such as
integration time. In addition to powerful data acquisition
and data processing, other features include automatic dark
removal, spectrum smoothing, and manual/auto baseline
correction.
Specifcations:
Power Input USB @ < 0.5 Amps
Detector Type Response Enhanced Linear CCD Array
Wavelength Range 200nm - 1050nm
Detector Pixel Format 2048 x 1 Elements @ 14m x 200m Per Element
Spectrograph f/# 3.6
Spectrograph Optical Layout Crossed Czerny-Turner
Dynamic Range 1300:1 Single Acquisition
Digitizer Resolution 16-bit or 65,535:1
Data Transfer Speed > 900 Spectra per Second in Burst Mode
Trigger Delay 35ns +/- 5ns
Readout Speed >2.0 MHz
Integration Time 1ms, Adjustable in 1s Increments
Thermal Drift 29 Counts/
o
C (Max)
Aux Port External Trigger, Digital IOs & Analog IOs
Operating Temperature 5C - 35C
Operational Relative Humidity 85%Noncondensing
Weight ~ 0.75 lbs (0.34 kg)
Dimensions 4.02in x 2.64in x 1.34in (102mm x 67mm x 34mm)
Computer Interface USB 3.0 / 2.0
Operating Systems Windows: 7, 8 (32-bit & 64-bit)
Additional Features:
Temperature Compensation for Ultra-low Thermal Drift
1ms Minimum Integration Time
< 0.5nm Spectral Resolution
UV - NIR (200nm - 1050nm)
>2.0 MHz Readout Speed
Entrance Slit
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Exemplar LS
Low Straylight Smart CCD Spectrometer
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SMART:
SPEED:
SYNCHRONOUS:
Applications:
UV, Vis, and NIR: Spectroscopy /
Spectroradiometry / Spectrophotometry
Absorbance / Refectance / Transmittance
Kinetic Reaction Monitoring
Transient Spectral Analysis
OEM Systems Integration
Multi-point Sampling
On-board processing including averaging, smoothing,
and dark compensation
an integration time of 1050s
Supports up to 32 devices with ultra-low trigger
delay (35ns) & gate jitter (+/- 5ns)
The Exemplar LS is a smart CCD spectrometer optimized for low straylight
by utilizing an unfolded Czerny-Turner spectrograph. It features on board
data processing, USB 3.0 communication, and temperature compensation.
The Exemplar LS is also optimized for multi-channel operation, featuring
ultra-low trigger delay and gate jitter. Additionally, the Exemplar LS features
a 2048 element detector and built-in 16-bit digitizer with greater than 2.0
MHz readout speed.
The Exemplar LS is available in the following standard configuration:
wavelength range of 200-850nm, 25m slit, an LVF flter, a ruled grating
(800mm/250nm), and a spectral resolution of 1.5nm.
Temperature Compensation for Ultra-low Thermal Drift
1ms Minimum Integration Time
Low Straylight Spectrograph
< 0.4nm Spectral Resolution
>2.0 MHz Readout Speed
UV - Vis (200nm - 850nm)
Difraction Grating
Spectrograph
Software:
BWSpec
TM
correction.
Specifcations:
Entrance Slit Power Input USB @ < 0.5 Amps
Detector Pixel Format 2048 x 1 Elements @ 14m x 200m Per Element
Spectrograph Optical Layout Czerny-Turner
Dynamic Range 1300:1 Single Acquisition
Readout Speed >2.0 MHz
Data Transfer Speed > 900 Spectra per Second in Burst Mode
Integration Time 1ms, Adjustable in 1s Increments
Thermal Drift ~29 Counts/
o
C (Max)
Aux Port External Trigger, Digital IOs & Analog IOs
Approx. Resolution
200-400nm
Best
Efciency
Spectral
Coverage (nm)
Grating
UV 200 - 400 1800/250
UV - NIR 200 - 850 600/250
Accessories:
Inline Filter Holders
Fiber Optic Probes
Fiber Patch Cords
Cuvette Holders
Light Sources
Exemplar Plus
High Performance Smart Spectrometer
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SMART:
SPEED:
SYNCHRONOUS:
Applications:
Low Light Level UV to NIR Spectroscopy
Raman and Fluorescence Spectroscopy
On-line Process Monitoring
LCD Display Measurement
BioMedical Spectroscopy
Gas and Water Analysis
LED Characterization
On-board processing including averaging, smoothing, and
dark compensation
an integration time of 6.3ms
Supports up to 32 devices with ultra-low trigger delay
(95ns) & gate jitter (+/- 20ns)
The Exemplar Plus is a high performance smart spectrometer utilizing
a low stray light unfolded Czerny-Turner spectrograph. It features
a highly sensitive TE Cooled back-thinned (BT) CCD detector which
is linearly summed for high dynamic range. Its long focal length,
coupled with a high quantum efciency detector, provides superior
data quality over the entire 190-1100nm spectral range. The Exemplar
Plus features a high signal to noise ratio, making it ideal for low light
level applications, and also features a built-in shutter allowing for
dark scan measurements, even while illuminated. As a member of the
Exemplar product line, it features on board data processing and USB 3.0
communication. The Exemplar product line is also optimized for multi-
channel operation featuring ultra-low trigger delay and gate jitter.
The Exemplar Plus is available in the following standard confguration:
wavelength range of 200-850nm, 25m slit, an LVF flter, a ruled grating
(800mm/250nm), and a spectral resolution of 1.5nm.
Difraction Grating
Software:
BWSpec
TM
is a spectral data acquisition software with a wide range
of tools that are designed to perform complex measurements and
calculations at the click of a button. It allows the user to choose
between multiple data formats and ofers optimization of scanning
parameters, such as integration time. In addition to powerful data
acquisition and data processing, other features include automatic
dark removal, spectrum smoothing, and manual/auto baseline
correction.
Specifcations:
Entrance Slit
Power Input
5V DC @ 6A (Maximum at Startup)
5V DC @ 2.5A (Typical at Normal Operation)
Detector Type Back-thinned CCD Array
Detector Pixel Format 2048 Efective Detector Elements
Efective Pixel Size 14m x ~ 0.9mm
Spectrograph Optical Layout Standard Czerny-Turner
Dynamic Range 50,000 (Typical)
Data Transfer Speed
>140 Spectra per Second at Integration Time of 6.3ms in
Burst Mode
Readout Speed > 400kHz
Integration Time 6.3ms, Adjustable in 1s Increments
Aux Port
External Trigger, 4 Digital Outputs (2 with Shutter Control), 2
Digital Inputs, Analog Input, Analog Output and System Reset
CCD Cooling Default: 0
o
C at Ambient of 25
o
C.
Weight 3.6 lbs
Slit
Option
Dimensions
Approx. Resolution
350 - 750nm
Best
Efciency
Spectral
Coverage (nm)
Grating
Vis / NIR 350-1050 400/550
NIR 750-1050 1000/900
UV- NIR 190-1100 300/280
UV 190-380 1500/250
Spectrograph
High UV, Vis, and NIR Response
2048 Detector Elements
Over 60% QE at 200nm
Confgurable Cooling Temperature (0 Default)
Over 90% Peak QE
Built-in Shutter
Accessories:
Fiber Sampling Probes
Fiber Sample Holders
Fiber Patch Cords
Light Sources
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Glacier X
The Glacier X is a TE Cooled linear CCD array spectrometer. It features
a 2048 element detector, built-in 16-bit digitizer, and USB 2.0 interface.
Compared to non-cooled CCD spectrometers, the Glacier X ofers higher
dynamic range, signifcantly reduced dark counts, and superior long-term
operation stability, making it ideal for low light level detection and long-
term monitoring applications.
The Glacier X is ideal for most UV, Vis, and NIR applications with spectral
confgurations from 200nm to 1050nm and resolutions between 0.2nm
and 4.5nm. Custom confgurations and application support are available
for OEM applications.
UV - NIR Ranges
<0.2nm Resolution
TE Cooled / Regulated
16-bit Digitizer
500 kHz Readout Speed
Plug-and-play USB 2.0
OEM Version Available
Features: Applications:
Specifcations:
Compact High Performance TE Cooled CCD Spectrometer
UV, Vis, and NIR:
Spectroscopy / Spectroradiometry /
Spectrophotometry
Absorbance
Refectance
OEM Optical Instrumentation
Accessories:
Software:
Fiber Patch Cords
Light Sources
Cuvette Holders
Inline Filter Holders
Fiber Optic Probes
BWSpec
TM
correction.
DC Power Input 5V DC @ < 1.5 Amps
AC Adapter Input 100 - 240VAC 50/60 Hz, 0.5A @ 120VAC
Pixels 2048 x 1 Elements @ 14m x 200m Per Element
Dynamic Range 300 (Typical)
Readout Speed 500 kHz
Data Transfer Speed Up to 180 Spectra Per Second Via USB 2.0
Integration Time 5 ~ 65,535ms x Multiplier
External Trigger Aux Port
TE Cooling 14C
Dimensions 5in x 1.5in x 3.6in (127.0mm x 39.0mm x 90.7mm)
Operating Systems Windows: XP, Vista, 7
Technical Details
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Fiber Coupler
Secures Fiber to Ensure Repeatable Results
By coupling a fber optic to the SMA 905 adaptor, light will be guided to the
slit and optically matched, ensuring reproducibility. For free space sampling,
a difuser or lens assembly can be connected directly to the SMA 905 adaptor.
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Thermoelectric Cooler
Reduces Dark Noise and Increases Detection Limits
Cooling an array detector with a built-in thermoelectric cooler (TEC)
is an efective way to reduce dark current and noise, as well as to
enhance the dynamic range and detection limit.
When the CCD detector array is cooled from a room temperature
of 25
o
C down to 14
o
C by the TEC, the dark current is reduced by a
factor of 4 and the dark noise is reduced by a factor of 2. This allows
the spectrometer to operate at longer exposure times and to detect
weaker optical signals.
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Approximate
Resolution
350 - 1050nm
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Entrance Slit
Determines Photon Flux and Spectral Resolution
Light entering into a spectrometers optical bench is vignetted by a
pre-mounted and aligned slit. This ultimately determines the spectral
resolution and throughput of the spectrometer after grating selection.
We ofer a variety of slit widths to match your specifc application needs:
from 10m - 200m wide, with custom slits available.
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Focusing Mirror
Refocuses Dispersed Light onto Detector
Collimating Mirror
Collimates and Redirects Light Towards Grating
Both mirrors are f/# matched focusing mirrors coated with AlMg
2
,
which produces approximately 95%refectance when working in the
UV-Vis spectrum. Aluminum (Al) provides refectance and magnesium
(Mg
2
) protects the aluminum from oxidation.
Both mirrors are f/# matched focusing mirrors coated with AlMg
2
, which
produces approximately 95%refectance when working in the UV-Vis
spectrum. Aluminum (Al) provides refectance and magnesium (Mg
2
)
protects the aluminum from oxidation.
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Difraction Grating
Difracts Light, Separating Spectral Components
The groove frequency of the grating determines two key aspects of the
spectrometers performance: the wavelength coverage and the spectral
resolution. When the groove frequency is increased, the instrument will
achieve higher resolution, but the wavelength coverage will decrease.
Inversely, decreasing the groove frequency increases wavelength coverage
at the cost of spectral resolution.

The blaze angle or blaze wavelength of the grating is also a key parameter
in optimizing the spectrometers performance. The blaze angle determines
the maximum efciency that the grating will have in a specifc wavelength
region.
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Array Detector
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Measures Entire Spectrum Simultaneously
The Glacier X features a 2048 x 1 linear TE Cooled CCD array detector
with a 14m pixel width and > 2000 active pixels. As the incident light
strikes the individual pixels across the CCD, each pixel represents a
portion of the spectrum that the electronics can then translate and
display with a given intensity using BWSpec software.
The quantum efciency (QE) and noise level of the array detector
greatly infuences the spectrometers sensitivity, dynamic range and
signal-to-noise ratio. The spectral acquisition speed of the spectrometer
is mainly determined by the detector response over a wavelength
region.
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Specifcations
Pixels 2048
Pixel Size 14m x 200m
Well Depth ~90,000 e
-
Digitization Rate 500 kHz
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5
3
6
4
2
7
Theextensionof theQE curve
after theUV enhancement.
RoomTemperature Cooledto14oC
DarkCurrent: Uncooledvs. CooledCCDDetectorsat 30Seconds
Best Efciency Spectral Coverage (nm) Grating
UV / Vis 200-400 1800/250
UV / NIR 200-800 716/222
UV / Vis 250-600 1200/250
UV 280-370 3600/240
UV / NIR 300-900 600/400
UV / NIR 350-1050 700/530
Vis 380-750 900/500
Vis / NIR 400-800 1200/500
Vis / NIR 450-1050 830/800
Vis 530-700 1800/500
Vis / NIR 600-800 1714/650
Vis / NIR 750-1050 1200/750
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Sol 1.7
The Sol 1.7 is a high performance linear InGaAs array spectrometer,
featuring 256, 512 (standard), and 1024 pixels with TE Cooling down to
-10
o
C, all while providing high throughput and large dynamic range.
Each spectrometer features an SMA 905 fber optic input, a built-in 16-
bit digitizer, and is USB 2.0 plug-and-play compatible. With our spectral
acquisition software, you can select between High Sensitivity and High
Dynamic Range mode within your pre-configured spectral range.
Customized spectral resolution and application support are available.
900nm - 1700nm Spectral Range
Resolution as Fine as 0.35nm
Built-in 16-bit Digitizer
-10
o
C TE Cooling
Two Gain Modes for
Specific Application Needs
Specifcations:
900 - 1700nm NIR TE Cooled InGaAs Array Spectrometer
Process Monitoring
NIR Spectroscopy
Quality Control
On-line Analyzer
Accessories:
Software:
Light Sources
Fiber Patch Cords
BWSpec
TM
correction.
DC Power Input 5V DC @ 3.5 Amps
AC Power Input 100 - 240VAC 50/60 Hz, 0.5A @ 120VAC
Detector Type Linear InGaAs Array
Pixels 512 x 1 @ 25m x 500m Per Element
Dynamic Range
High Dynamic Mode: 13,000:1
High Sensitivity Mode: 6,250:1
Data Transfer Speed >200 Spectra Per Second Via USB 2.0
Integration Time 200s to >= 64 Seconds
TE Cooling Two-Stage: -5C@Relative Humidity =90%(-10C OptionAvailable)
Technical Details
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Fiber Coupler
By coupling a fber optic to the SMA 905 adaptor, light will be guided
to the slit and optically matched, ensuring reproducibility. For free
space sampling, a difusor or lens assembly can be connected directly
to the SMA 905 adaptor.
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Reduces Dark Noise and Improves Detection Limits
Cooling an array detector with a built-in thermoelectric cooler (TEC) is
an efective way to reduce dark current and noise, as well as to enhance
the dynamic range and detection limit.
When the InGaAs array detector is cooled from a room temperature of
25
o
C down to -10
o
C by the TEC, the dark current is reduced by 12.25
times and the dark noise is reduced by 3.5 times. This allows the
spectrometer to operate at longer exposure times and to detect weaker
optical signals.
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5
3
6
4
2
Approximate
Resolution
900 -1700nm
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Focusing Mirror
Collimating Mirror
Both mirrors are f/# matched focusing mirrors coated with a special
coating, which enhances the NIR signal.
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Difraction Grating

region.
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Array Detector
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The Sol 1.7 features a 512 x 1 TE Cooled linear InGaAs photo diode array
detector with pixel dimensions of 25m x 500m and 512 active pixels.
Using BWSpec, the detector mode can be switched between High
Sensitivity and High Dynamic Range modes, allowing for greater control
over the detectors sensitivity.
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Specifcations
Pixels 256, 512 (standard), 1024
Well Depth
High Dynamic Mode: ~100 Me
-
High Sensitivity Mode: ~40 Me
-
Spectral
Coverage (nm)
Grating
Approximate
Resolution
25mSlit
1500-1600 1000/1310 0.35nm
1260-1355 1000/1310 0.4nm
1450-1650 600/1200 0.8nm
1200-1400 600/1200 0.7nm
900-1300 300/1200 1.5nm
1200-1600 300/1200 1.5nm
900-1700 150/1250 4.0nm
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Sol 2.2A
The Sol 2.2A is a high performance linear InGaAs array spectrometer featuring
256 pixels and providing high throughput and large dynamic range with TE
Cooling down to -15
o
C via a built-in 3-stage cooler.
Each spectrometer features an SMA 905 fber optic input, built-in 16-bit
digitizer, and is USB 2.0 plug-and-play compatible. The built-in autozero
function automatically reduces dark current and dark non-uniformity, resulting
in an increased signal-to-noise ratio.
Software control allows the user to choose from four types of operation modes:
Maximum Dynamic, High Dynamic, High Sensitivity, and Maximum Sensitivity.
Customized spectral resolution and application support are also available.
900nm - 2200nm Spectral Range
Resolution as Fine as 9.0nm
-15
o
C TE Cooling
Built-in Autozero (Noise Level Reduction)
Four Sensitivity & Dynamic Range Modes for
Specific Application Needs
Specifcations:
900 - 2200nm NIR TE Cooled InGaAs Array Spectrometer
Process Monitoring
NIR Spectroscopy
Quality Control
On-line Analyzer
Accessories:
Software:
Light Sources
Fiber Patch Cords
BWSpec
TM
correction.
DC Power Input 5V DC @ 5 Amps
Dynamic Range
Maximum Dynamic Mode: 20,000:1
Maximum Sensitivity Mode: 250:1
TE Cooling Three-Stage: -15C @ Relative Humidity = 90%
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Fiber Coupler
By coupling a fber optic to the SMA 905 adaptor, light will be guided to
the slit and optically matched, ensuring reproducibility. For free space
sampling, a difuser or lens assembly can be connected directly to the
SMA 905 adaptor.
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When the InGaAs array detector is cooled from a room temperature
of 25
o
C down to -15
o
C by the TEC, the dark current is reduced by
~32 times and the dark noise is reduced by ~5.7 times. This allows
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Resolution
1100 - 2200nm
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Collimating Mirror
Both mirrors are f/# matched focusing mirrors coated with a
special coating, which enhances the NIR signal.
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region.
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Array Detector
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The Sol 2.2A features a 256 x 1 TE Cooled linear InGaAs photo diode
array detector with pixel dimensions of 50m x 250m and 256 active
pixels. Using BWSpec, the detector mode can be switched between
two sensitivity and two dynamic modes, allowing for greater control
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Specifcations
Pixels 256
Well Depth
Maximum Dynamic Mode: ~250 Me
-
-

High Sensitivity Mode: ~12.5 Me
-
Maximum Sensitivity Mode: 1.25 Me
-
Spectral
Coverage (nm)
Grating
Approximate
Resolution
50mSlit
1100-2200 100/1600 9.0nm
900-2200 85/1350 15.0nm
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Sol 2.6
The Sol 2.6 is a high performance linear InGaAs array spectrometer featuring
256 pixels and providing high throughput and large dynamic range with TE
Cooling down to -15
o
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Each spectrometer features an SMA 905 fber optic input, built-in 16-bit digitizer,
and is USB 2.0 plug-and-play compatible. The built-in autozero function
automatically reduces dark current and dark non-uniformity, resulting in an
increased signal-to-noise ratio.
Software control allows the user to choose from four types of operation modes:
Maximum Dynamic, High Dynamic, High Sensitivity, and Maximum Sensitivity.
Customized spectral resolution and application support are also available.
1550nm - 2550nm* Spectral Range
Built-in Autozero (Noise Level Reduction)
Built-in 16-bit Digitizer
Low Dark Noise and High Sensitivity
Four Sensitivity & Dynamic Range Modes for
Specifc Application Needs
Specifcations:
1550nm - 2550nm* NIR TE Cooled InGaAs Array Spectrometer
Process Monitoring
NIR Spectroscopy
Quality Control
On-line Analyzer
Biological Applications
Accessories:
Software:
Light Sources
Fiber Patch Cords
BWSpec
TM
correction.
*Custom Ranges Available
DC Power Input 5V DC @ 5 Amps
Dynamic Range
Maximum Dynamic Mode: 20,000:1
Maximum Sensitivity Mode: 250:1
TE Cooling Three-Stage: -15C @ Relative Humidity = 90%
Technical Details
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Fiber Coupler
By coupling a fber optic to the SMA 905 adaptor, light will be guided to
the slit and optically matched, ensuring reproducibility. For free space
sampling, a difuser or lens assembly can be connected directly to the
SMA 905 adaptor.
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When the InGaAs array detector is cooled from a room temperature
of 25
o
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o
C by the TEC, the dark current is reduced by
~32 times and the dark noise is reduced by ~5.7 times. This allows
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Resolution
1550 -2550nm
75mm 75mm wide x 1mm high ~15.0nm
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The Sol 2.6 has a slit width of 75m with custom slits available.
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Collimating Mirror
Both mirrors are f/# matched focusing mirrors coated with a
special coating, which enhances the NIR signal.
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The Sol 2.6 features a 256 x 1 TE Cooled linear InGaAs photo diode
array detector with pixel dimensions of 50m x 250m and 256 active
pixels. Using BWSpec, the detector mode can be switched between
two sensitivity and two dynamic modes, allowing for greater control
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Specifcations
Wavelength Range 1550nm - 2550nm*
Pixels 256
Well Depth
Maximum Dynamic Mode: ~250 Me
-
-

High Sensitivity Mode: ~12.5 Me
-
Maximum Sensitivity Mode: 1.25 Me
-
Spectral
Coverage (nm)
Grating
Approximate
Resolution
75mSlit
1550-2550 100/2500 15.0nm
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5
3
6
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*Custom Ranges Available
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BDS100 Deuterium/Tungsten Light Source
BDS130 Deuterium/Tungsten Light Source
The BDS100 is a DC powered turnkey SMA 905 fber coupled UV/Vis/NIR light source with
spectral output from 200 to > 1100nm. The 3W UV lamp is an electrode-less, RF induced
deuterium lamp which shares a single optical path with the 3W tungsten halogen lamp.
Features include a safety shutter and individual On/Of controls for both the deuterium
and tungsten sources.
The BDS130 is an AC powered turnkey SMA 905 fber coupled UV/Vis/NIR light source
with a spectral output of 190 to > 2500nm. The 30W deuterium lamp and 5W tungsten
halogen lamp share a single optical path. Features include a safety shutter and individual
On/Of controls for both the deuterium and tungsten lamps.
BPS101 Tungsten Halogen Light Source
SCL100 Spectral Calibration
The BPS101 is a DC powered high performance SMA 905 fber coupled constant current
tungsten halogen light source with a spectral output of 350 to > 2600nm. A user
replaceable 5W input power bulb has a ~10,000 hour lifetime with a color temperature
of 2800K. Constant current provides precision current control for stable performance.
A remote control port provides On/Of modulation, operating current monitoring, and
external operating current control.
The SCL100 is a series of DC powered compact SMA 905 fber coupled spectral calibration
light sources. The SCL100 can be used for wavelength calibration of monochromators,
spectrometers, and spectroradiometers. By exciting these various gases, they will
produce narrow intense lines of the corresponding element(s). There are 6 lamp
models to select from: Argon (Ar), Krypton (Kr), Mercury (Hg), Mercury/Argon
(Hg/Ar), Neon (Ne), and Xenon (Xe).
Accessories Accessories
ICL Irradiance Lamps
The ICL series calibrated lamp standards are tungsten coiled-coil flaments enclosed in
quartz envelopes. Calibrated Lamps provide reliable spectral irradiance calibration data.
Calibrated 100W lamps can cover 350-1050nm and 350-1700nm. Calibrated 1000W
lamps can cover 350-1700nm, 350-2200nm, and 250-1100nm. Lamps are seasoned and
calibration is traceable to the National Institute of Standards and Technology (NIST) scale
of spectral irradiance. The lamps are provided with calibration data and respective lamp
holders for easy installation and adjustment.
BPX100 Pulsed Xenon Light Source
The BPX100 is an AC powered compact SMA 905 fber coupled 5W Xenon fash lamp module
with a spectral output of 185 - 2000nm. By passing an electrical current through a Xenon
gas, the BPX100 produces both continuous and line spectra. Low pulse-to-pulse variations
and long operating life characteristics makes the BPX100 ideal as an excitation light source
for fuorescence spectroscopy and UV rich sources for refectance and transmittance
spectrophotometry.
BPS2.0 Tungsten Halogen Light Source
The BPS2.0 is a DC powered, high performance, SMA 905 fber coupled, constant current
tungsten halogen light source with a spectral output of 350 to > 2600nm. A user replaceable
20W bulb has a ~2,000 hour lifetime with a color temperature of 2900K. Constant current
provides precision current control for stable performance. The BPS2.0 incorporates a fan
for thermal stability for low drift. A remote control port provides On/Of modulation,
operating current monitoring, and external operating current control.
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Accessories
Fiber Patch Cords
BFA & BRS Bifurcated Fibers
Fiber Dip Probe
The Fiber Patch Cords (FPC) are fber optic cables terminated with SMA905 connectors
on both ends (FC connectors available upon request). These are available in UV, NIR,
and MIR grade fused silica optical fbers with various core diameters. Fiber core sizes
range from 50mm to 1000mm with a standard length of 1.5 meters with custom lengths
available upon request.
The Bifurcated Fiber Assembly (BFA) series combines optical fbers at a common end with
the fber bundle bifurcated into two separate channels. These channels can connect
to a light source and a spectrometer or split an incoming signal into two separate
spectrometer channels. When a collimating lens is attached to the common end of the
assembly and positioned correctly, the specular refectance for 0 angle of incidence can
also be measured.
The fber dip probe (FDP) series can be used for measuring the transmittance and
absorbance of liquid solutions. The fber dip probe can be inserted into liquids for in
situ transfectance measurements. Typical applications include observing changes in
solutions for kinetic reaction studies or dissolution testing.
Fiber Refectance Probe
The Fiber Refectance Probe (FRP) series combines 7 optical fbers at the sample end
into a bifurcated fber. This bifurcated fber splits into one fber and 6 stacked fbers with
the single fber connecting to a light source and the 6 stacked fbers connecting to a
spectrometer. These stacked fbers align to the spectrometers slit for increased signal
input. When properly setup, the FRP can measure difuse or specular refectance from
surfaces.
BCH100A & BCH103A Cuvette Holders
BIP2.0 Integrating Sphere
The BCH100A & BCH103A cuvette sample holders are designed for fber optic illumination/
detection. A standard 12.5 x 12.5mm (OD) (1 cm path length) cuvette can be used for liquid
sample transmittance and absorbance. Two SMA 905 fber couplers with collimated optics
come with the BCH100A and three come with the BCH103. Both can be used with any
B&W Tek, Inc. fber, array spectrometer and BPS or BDS light sources. The BCH100A comes
with two straight through SMA 905 ports. The BCH103A can be used for fuorescence
when set up for right angle measurements with respect to illumination.
The BIP2.0 is a compact, fber coupled integrating sphere with an integrated 20W tungsten
halogen lamp which emits over the UV-NIR Spectrum. The two inch diameter integrating
sphere is machined from PTFE. PTFE is refective and highly Lambertian over the broad
spectral range of 250-2500nm and 99% from 400-800nm. The BIP2.0 incorporates a fan
for thermal stability for low drift and operates on 12 V DC. It is designed for measuring
difused refectance using any B&W Tek, Inc. array spectrometer.
Accessories
BIS1.5 Integrating Sphere
The BIS1.5 is a compact, integrating sphere designed as a sampling accessory for
measuring difused transmittance using any B&W Tek, Inc. array spectrometer.
The 1.5 inch diameter integrating sphere is machined from PTFE. PTFE is
refective and highly Lambertian over the broad spectral range of 250-
2500nm and 99% from 400-800nm.
For more information and additional accessories, please visit our website at www.bwtek.com
BFH105 Inline Filter Holder
The BFH105 inline flter holder is designed to hold up to three standard 1 in x 5 mm
flters (sold separately). The BFH105 has two SMA 905 fber connections with collimated
optics and can be used with any B&W Tek, Inc. array spectrometer and light source.
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Software Development Kit
B&W Teks SDK (Software Development Kit) provides
you with the detailed function calls to our .DLL fles.
This package is designed for customers who wish to
create their own custom software interface allowing
complete control over your spectrometer or system.
Every spectrometer / system we sell can be run using
the SDK, including RS232 and USB units, from non-
cooled spectrometers to complete Raman systems
with laser power control.
Features:
Program Examples:
SDK Supports:
Raman Systems
Refectance Systems
Transmittance Systems
USB Cleanlaze Lasers
RS232 Spectrometers
USB Spectrometers
C#
C++ Builder 6
Visual C++ 6.0
Visual Basic 6.0
VBA
Labview
VB.NET
The SDK Package comes complete with
simple programming examples done
with our various spectrometer models to
get you started.
Specifcation Interface
C# SDK USB Spectrometers
VB.Net SDK USB Spectrometers
C++ Builder 6 SDK USB Spectrometers
Visual C++ 6.0 SDK USB Spectrometers
Visual Basic 6.0 SDK USB Spectrometers / Lasers
VBA SDK USB Spectrometers
Labview 8.2 SDK USB Spectrometers
RS232 Interface SDK RS232 Spectrometers
BWSpec
BWSpec is a spectral data acquisition software developed
by B&W Tek, Inc. and is the foundation for all B&W Tek, Inc.
software platforms. It is included with the purchase of all B&W
Tek products that use it to operate, which include spectrometers,
systems, and accessories. BWSpec is ideal for broad range
applications since it delivers a wide range of features designed
to perform complex measurements and calculations at the click
of a button. It features multiple data formats and the capability
to optimize scanning parameters, such as integration time and
laser output power control. In addition to data acquisition and
data processing, other features include automatic dark removal,
spectrum smoothing, and manual/auto baseline correction.
Features:
Applications:
Included with B&W Tek Spectrometers, Systems, and Accessories (if applicable)
Performs Emission, Absorbance, Percent Transmission / Refection, and Raman Measurements
Capable of Continuous and Single Scan Acquisition
Subtracts Dark Noise
Ofers Spectral File Formats: txt & spc
Exports Spectral Files to Excel
Features Manual and Automatic Baseline Correction
Includes Peak Smoothing Algorithms: FFT, Savitzky-Golay, & Boxcar
Includes Derivative Algorithms: Point Dif, Savitzky-Golay, & Diferentiate
Performs Area Calculations
Ofers Peak Analysis Options: Center Wavelength, Integrated Power Density, FWHM Calculations, and More
Contains Basic Spectral Math: Addition, Subtraction, Multiplication, and Division
Also Features: Tristimulus, Chromaticity, and Color Calculations
Transmission
Absorption
Refectance
Fluorescence
Raman
Color / Irradiance
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Raman Spectroscopy
R
a
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In comparison to other vibrational spectroscopy methods, such
as FT-IR and NIR, Raman has several major advantages. These
advantages stem from the fact that the Raman efect manifests
itself in the light scattered of of a sample as opposed to the
light absorbed by a sample. As a result, Raman spectroscopy
requires little to no sample preparation and is insensitive to
aqueous absorption bands. This property of Raman facilitates
the measurement of solids, liquids, and gases not only directly,
but also through transparent containers such as glass, quartz,
and plastic.
Similar to FT-IR, Raman spectroscopy is highly selective, which
allows it to identify and diferentiate molecules and chemical
species that are very similar. Figure R-1 shows an example of
fve similar molecules Acetone, Ethanol, Dimethyl Sulfoxide,
Ethyl Acetate, and Tolune. Although each chemical has a
similar molecular structure, their Raman spectra are clearly
diferentiable, even to the untrained eye. Using Raman spectral
libraries, it is easy to see how easily Raman spectra can be used
for material identifcation and verifcation.
When considering Raman scattering, we can think about the physics in one of two ways: the classical wave
interpretation or the quantum particle interpretation. In the classical wave interpretation, light is considered as
electromagnetic radiation, which contains an oscillating electric feld that interacts with a molecule through its
polarizability. Polarizability is determined by the electron clouds ability to interact with an electric feld. For example,
soft molecules such as benzene tend to be strong Raman scatterers while harder molecules like water tend to be
fairly weak Raman scatterers.
When considering the quantum particle interpretation, light is thought of as a photon which strikes the molecule
and then inelasticaly scatters. In this interpretation the number of scattered photons is proportional to the size of
the bond. For example, molecules with large Pi bonds such as benzene tend to scatter lots of photons, while water
with small single bonds tends to be a very weak Raman scatterer. Figure R-2 shows a visual comparison of the two
methods.
Theory of Raman Scattering:
Introduction to Raman Spectroscopy
Raman spectroscopy, a molecular spectroscopy which is observed
as inelastically scattered light, allows for the interrogation and
identification of vibrational (phonon) states of molecules. As a
result, Raman spectroscopy provides an invaluable analytical tool for
molecular fnger printing as well as monitoring changes in molecular
bond structure (e.g. state changes and stresses & strains).
When deriving the Raman effect, it is generally easiest to
start with the classical interpretation by considering a simple
diatomic molecule as a mass on a spring (as shown in fgure
R-3) where m represents the atomic mass, x represents the
displacement, and K represents the bond strength.
Figure R-2 Comparison of Raman Scattering Interpretations
Figure R-1 Example Raman Spectra of Various Molecules
Figure R-3 Diatomic Molecule as a Mass on a Spring
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When using this approximation, the displacement of the molecule can be expressed by using Hookes law as,
Equation R-1
By replacing the reduced mass (m
1
m
2
/[m
1
+m
2
]) with and the total displacement (x
1
+x
2
) with q, the equation can
be simplifed to,
Equation R-2
By solving this equation for q we get,
Equation R-3
where
m
is the molecular vibration and is defned as,
Equation R-4
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In Equation R-7 we see that there are two resultant efects from the interaction of the molecule and the incident light.
The frst term is called Rayleigh scattering, which is the dominate efect and results in no change in the frequency
of the incident light. The second term is the Raman scattered component and when expanded to,
can be shown to shift the frequency of the incident light by plus or minus the frequency of the molecular vibration.
The increase in frequency is known as an Anti-Stokes shift and the decrease in frequency is known as a Stokes
shift. By measuring the change in frequency from the incident light (typically only the Stokes shift is used for this
measurement) the Raman efect now gives spectroscopists a means of directly measuring the vibrational
frequency of a molecular bond.
When this occurs, there are three diferent potential outcomes. First, the molecule can relax back down to the
ground state and emit a photon of equal energy to that of the incident photon; this is an elastic process and is again
referred to as Rayleigh scattering. Second, the molecule can relax to a real phonon state and emit a photon with
less energy than the incident photon; this is called Stokes shifted Raman scattering. The third potential outcome
is that the molecule is already in an excited phonon state, is excited to a higher virtual state, and then relaxes back
down to the ground state emitting a photon with more energy than the incident photon; this is called Anti-Stokes
Raman scattering. Due to the fact that most molecules will be found in the ground state at room temperature, there
is a much lower probability that a photon will be Anti-Stokes scattered. As a result, most Raman measurements
are performed considering only the Stokes shifted light.
Now that we have derived the Raman effect using
the classical wave interpretation, we can now use the
quantum particle interpretation to better visualize
the process and determine additional information. As
discussed earlier in the quantum interpretation, the
Raman efect is described as inelastic scattering of a
photon of of an molecular bond. From the Jablonski
diagram shown in fgure R-4, we can see that this results
from the incident photon exciting the molecule into a
virtual energy state.
Equation R-8
Figure R-4 Jablonski Diagram Representing Quantum
Energy Transitions for Rayleigh and Raman Scattering
Equation R-7
which when combined with equations R-3 and R-5 results in,
where E
o
is the intensity and
o
is the frequency of the electric feld. Using the small amplitude approximation, the
polorizability can be described as a linear function of displacement,
Equation R-5
Equation R-6
From equations R-3 and R-4, it is apparent that the molecule vibrates in a cosine pattern with a frequency proportional
to the bond strength and inversely proportional to the reduced mass. From this we can see that each molecule
will have its own unique vibrational signatures which are determined not only by the atoms in the molecule, but
also the characteristics of the individual bonds. Through the Raman efect, these vibrational frequencies can be
measured due to the fact that the polorizability of a molecule, , is a function of displacement, q. When incident
light interacts with a molecule, it induces a dipole moment, P, equal to that of the product of the polorizability of
the molecule and the electric feld of the incident light source. This can be expressed as,
From equation R-10 it is clear that there is a linear relationship between the power of the scattered light and the
intensity of the incident light as well as a relationship between the power of the scattered light and the inverse of
the wavelength to the fourth power. Therefore, it would appear that it is always desirable to use a short excitation
wavelength and a high power excitation source based on these relationships. However, as we will see in the next
section, this is not always the case.
where l equals the wavelength of the incident photon. Therefore,
By further investigating the quantum interpretation of the Raman efect, it can be shown that the power of the
scattered light, P
s
, is equal to the product of the intensity of the incident photons, I
o
, and a value known as the
Raman cross-section,
R
. It can be shown that,
Equation R-9
Equation R-10
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As previously discussed, Raman scattering is very weak and therefore tends to require long integration times in order to
collect enough photons to measure a discernible signal. This makes the use of a TE cooled spectrometer a requirement
in order to reduce the dark noise. For very low concentrations or weak Raman scatters, it may be necessary to use a
back-thinned CCD to further increase the sensitivity of the spectrometer. By etching the detector to only a few microns
thick the probability of an electron being reabsorbed as it travels through the detector based on Beers law is greatly
reduced. This increases the sensitivity of the detector from a maximum quantum efciency of 35% to greater than 90%.
Due to the highly selective nature of Raman spectra, they may contain peaks which are fairly close together. Depending
on the application, it may be necessary to resolve these closely spaced peaks, which requires the use of a high resolution
spectrometer. Typically standard spectrometer confgurations are for 532nm and 785nm laser excitation wavelengths,
with custom excitation wavelengths also available. These spectrometers can be ofer a variety of spectrometer
confgurations specially designed for wide spectral range and high resolution. Typical spectral ranges are available
from as low as 65cm
-1
(flter dependent) to as high as 4000cm
-1
, with a spectral resolution as fne as 3.0cm
-1
.
When measuring the sample, there is no more efective method of directing the laser light to the sample, collecting
the Raman scatter, and directing it to a spectrometer than a fber optic probe.
A Raman probe must be capable of directing and focusing the monochromatic excitation source (typically a laser) to
the sample, collecting the scattered light and then directing it to the spectrometer. Figure R-6 shows a typical design
for a Raman probe.
Since a pure signal is extremely important to Raman spectroscopy, a narrow band-pass flter is placed in the optical
path of the excitation source before it reaches the sample. It is also important to note that since the Raman efect
is extremely weak, the signal must be collected at a 0
o
angle normal to the sample. This causes interference from
Rayleigh scattering and therefore it is essential to flter the collected signal through the use of a long pass flter before
it is directed to the spectrometer.
The fexibility aforded by fber optics not only allows for the probe to be taken to a solid sample, but also allows it to
be immersed in liquids or slurries in both laboratory and process environments (for real time kinetic measurements).
It can also be connected to microscopes, cuvette holders, as well as a plethora of sampling accessories.
For organic molecules it is important to shift the laser wavelength into the near infrared to minimize fuorescence
while not exceeding CCD spectral detection limits. Due to their availability and the fact that they allow
for the maximum fuorescence reduction without the sacrifce of spectral range or resolution, 785nm
diode lasers have become the industry standard. For increased sensitivity with inorganic molecules,
a 532nm laser is the best choice because fuorescence is no longer an issue.
There are three primary components to any Raman spectrometer: an excitation source, a sampling apparatus, and a
detector. While these three components have come in varying forms over the years, modern Raman instrumentation
has developed around using a laser as an excitation source, a spectrometer for the detector, and either a microscope
or a fber optic probe for the sampling apparatus.
Since Raman spectroscopy is predicated on the ability to measure a shift in wavelength (or frequency) it is imperative
that a monochromatic excitation source be employed. While a laser is typically the best excitation source, not all lasers
are suitable for Raman spectroscopy, so it is imperative that the laser frequency is extremely stable and does not mode
hop, since this will cause errors in the Raman shift. It is also essential to utilize a clean, narrow bandwidth laser because
the quality of the Raman peaks are directly afected by the sharpness and stability of the excitation light source.
The fnal consideration when deciding which laser to use for a Raman spectrometer is the wavelength. From the previous
section, it is clear that the shorter the wavelength the more powerful the Raman signal. However, as was already stated,
this is not the only consideration especially when dealing with organic molecules. Most organic molecules will tend
to fuoresce when excited by high energy (short wavelength) photons. Although fuorescence is typically considered
to be a low light level process, it can still overwhelm the signal in the Raman spectrum as shown in Figure R-5. This
is because the Raman efect is comprised of a very small fraction (about 1 in 10
7
) of the incident photons. As a result,
visible lasers are typically only used for inorganic materials such as carbon nanotubes.
Components of a Raman Spectrometer:
Figure R-5 Comparison of Raman Spectrum at Varying Excitation
Wavelengths Demonstrating Fluorescence Interference
Figure R-6 Typical Design of a Raman Probe
Bioscience and Medical Diagnosis:
Detection of subtle changes within biomolecules, such as drug interactions, tissue
healing, cosmetics, and disease diagnosis
Intercellular SERS localization and interaction, identifcation of drug binding to cells for
Drug-DNA and cellular interaction analysis
Investigation of microorganisms in single cells; yeast cell classifcations, single bacterium
Molecular level cancer detection (cervical, lung, etc.)
Cardiovascular disease diagnosis (atherosclerosis)
Analysis of tablets, liquids, and gel caps
High throughput screening techniques
Crystallization, end point detection
Process Analytical Technology (PAT) on-line, at-line monitoring and control: real-time
monitoring of drying, coating, and blending
Identifcation and analysis of API, additives, and excipients
Drug identifcation control: purity and quality
Raw material inspection: 100% incoming material identifcation and verifcation
Pharmaceutical Industry:
Raman Microscopy:
Pharmaceutical drug analysis: micro-Raman and localized molecular species analysis in
complex drug mixtures, such as beta-carotene in multivitamins
Material science thin flm analysis, such as diamond flm quality characterization
Trace forensic evidence analysis, including fbers, fabrics, pigments, inks, etc.
Applications of Raman Spectroscopy
Polymers and Chemical Processes:
Quality Control: incoming/outgoing
Identifcation of contaminants during manufacturing
Real time monitoring of polymerization
Predicting the morphological properties of polymers
Multivariate analysis/chemometrics to predict physical properties: glass transition
temperature, crystallization temperature, etc.
Chemical composition analysis
Semiconductor & Solar Industry:
Characterization of silicon crystallinity: monitoring of the Raman band shift as silicon
crystallinity changes from amorphous to a polycrystalline structure
Analysis of micron sized particles in situ to provide information on potential
contamination
Mechanical stress monitoring for semiconductor process
Forensic Analysis:
Nondestructive drug and narcotic drug identifcation
Explosives: exact chemical compositions of materials, PETN, RDX and binding agents
within explosive materials
Identifcation and analysis of toxic solvents and bio-warfare agents
Forensic evidence analysis and tracing, including fbers, fabrics, pigments, inks, etc., by
Raman microscopy
Gemology:
Non-invasive gemstone identifcation and examination
Identifcation of unknown gemstone by unique Raman signal
Identifcation of isomorph or subspecies of gemstone
Analysis of gemstone origin through Raman microscopy
Anti-counterfeiting, such as identifcation of diamond from zircon
Environmental Science:
Water pollution detection using SERS technology
Identifcation of contaminants in water
Petrochemical analysis
Identifcation and analysis of sediments in water
Geology and Mineralogy:
Identifcation of geological materials
Examination of inclusions in minerals
Analysis of cement clinker by Raman microscopy
Ancient fossil analysis
Food & Agriculture Industry:
Measurement of unsaturated fatty acid in food oils
Detection of bacteria and/or contaminants in food products
Identifcation of additive drugs: nutraceuticals in fruit drinks
Analysis of components in grain kernel
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NanoRam
Handheld Raman Spectrometer
The NanoRam is a state-of-the-art handheld Raman instrument for nondestructive identifcation and
verifcation of materials such as APIs, excipients, intermediates, & fnished products. Compact and agile,
the NanoRam can be used by non-technical users to rapidly identify samples in the lab, warehouse,
loading dock or feld, helping to eliminate quarantine areas and expedite materials through the
manufacturing lifecycle. Utilizing Raman technology, non-contact analysis can be performed through
transparent containers, all while maintaining the volume and integrity of the sample.
Raman spectroscopy is an approved method by the U.S. and European Pharmacopoeia, as well as the
Pharmacopoeia of the Peoples Republic of China. It is also a well-recognized method for compliance
with the PIC/S GMP guide regarding 100% identity assurance for starting materials. The NanoRam
is fully compliant with all governing regulations, including 21 CFR Part 11 and Part 1040.10, and
can play an integral role in cGMP compliant facilities. B&W Tek ofers a wide variety of services,
including assistance with method and/or new library development as well as support with IQ/OQ/PQ
implementation.
Intuitive Software a user-friendly interface for both technical & non-technical users to make their job easier
Versatility measure a variety of samples in a variety of environments and packaging with just one unit
Data Reproducibility superior hardware ensures that results are consistent and reliable
Performance robust multivariate algorithms guarantee accuracy when testing and identifying materials
Incoming Material Identifcation
Unknown Substance Investigation
At-line Sampling & Final Inspection
Nondestructive Counterfeit Detection
High-Brightness Touch Screen Display
Embedded 1 & 2 Dimensional Barcode Scanner
IP-64 Dust Tight and Splash Proof Rated Housing
Sampling Accessories for Almost Any Environment
Batch Scanning Option for Large Volume Operation
Intuitive Software for Technical & Non-technical Users
Wi-Fi & Ethernet Communication for Data Sync & Management
Why Choose Raman?
Measure Through Plastic, Glass, & Quartz Packaging
High Selectivity with No Sample Preparation Required
Samples Can be Solid or Liquid, Transparent or Opaque
Maintains Integrity and Volume of Sample (Nondestructive)
Sampling Accessories:
Easy Transition Between Sample Types
The NanoRam includes a variety of sampling accessories to assist you in the measurement of various materials in the form of
liquids, gels, powders, or solids under both a laboratory setting and under demanding environmental conditions. The NanoRam
is designed to facilitate fast and convenient transitions between sample adaptors.
The NanoRam comes standard with the point and shoot, vial holder, and bottle adaptor accessories. Additionally, a right angle,
tablet holder, and immersion shaft are available to facilitate even more fexible sampling. These accessories allow you to measure
through plastic and glass containers, take in situ measurements of liquids and powders, and measure larger containers only
accessible from the top or located in difcult to reach areas. More details about individual accessories are available upon request.
Software:
State of the Art Identifcation Software
The NanoRam comes standard with B&W Teks
proprietary NanoRam OS software installed
within the unit, which allows for identifcation and
verifcation, library and method development, and
data storage/ transfer. The NanoRam ID software
is designed for use on PCs for data and methods
management, allowing customers to export data
and generate reports. The NanoRam ID and NanoRam OS
software packages are 21CFR part 11 compliant with available
IQ/OQ validation documentation for pharmaceutical customers.
Additionally, the NanoRam
provides secure Wi-Fi and Ethernet
synchronization capabilities with
network terminals in order to optimize
time and resources. NanoRam OS is
capable of data and report transfers in
order to centralize information (such as
libraries, methods and fnal reports) in general servers.
Identifcation Investigation
Specifcations:
Immersion Shaft
Point &Shoot
Tablet Holder Vial Holder
Right Angle
Bottle Adapter
Excitation Wavelength 785nm
Laser Output Power 300mW Max Adjustable in 10%Increments
Spectral Range 176cm
-1
to 2900cm
-1
Spectral Resolution ~ 9cm
-1
@ 912nm
Detector Type TE Cooled Linear CCD Array
Display High Brightness and High Resolution Touch Screen
Bar Code Reader Linear and 2D Standards
Software NanoRam OS (Embedded), NanoRam ID (PC)
Data Formats .txt, .csv, .spc
Connectivity Ethernet, Wi-Fi
Battery Rechargeable Li-ion, >4 hrs Operation
AC Adapter Output: DC 12V, 2A Minimum
Weight ~2.5 lbs (~1.2 kg)
Size 8.8in x 3.9in x 2.0in (22cm x 10cm x 5cm)
Operating Temperature -20C to +40C
Storage Temperature -30C to +60C
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NanoRam FP
The NanoRam FP is a state-of-the-art handheld Raman instrument
for nondestructive identifcation and verifcation of materials such
as APIs, excipients, intermediates, & fnished products. Compact
and agile, the NanoRam FP can be used by non-technical users
to rapidly identify samples in the lab, warehouse, loading dock or
feld, helping to eliminate quarantine areas and expedite materials
through the manufacturing lifecycle. The fber probe provides
additional versatility for sampling in hard to reach places. Utilizing
Raman technology, non-contact analysis can be performed through
transparent containers, all while maintaining the volume and
integrity of the sample.
Raman spectroscopy is an approved method by the U.S. and European Pharmacopoeia, as well as the Pharmacopoeia of the
Peoples Republic of China. It is also a well-recognized method for compliance with the PIC/S GMP guide regarding 100%
identity assurance for starting materials. The NanoRam FP is fully compliant with all governing regulations, including 21 CFR
Part 11 and Part 1040.10, and can play an integral role in cGMP compliant facilities. B&W Tek ofers a wide variety of services,
including assistance with method and/or new library development as well as support with IQ/OQ/PQ implementation.
Intuitive Software a user-friendly interface for both technical & non-technical users to make their job easier
Versatility measure a variety of samples in a variety of environments and packaging with just one unit
Data Reproducibility superior hardware ensures that results are consistent and reliable
Performance robust multivariate algorithms guarantee accuracy when testing and identifying materials
Features:
Applications:
Handheld Fiber Probe Raman System
Incoming Material Identifcation
Unknown Substance Investigation
At-line Sampling & Final Inspection
Nondestructive Counterfeit Detection
High-Brightness Touch Screen Display
Embedded 1 & 2 Dimensional Barcode Scanner
Fiber Probe with Trigger and LED Indicator Lights
Sampling Accessories for Almost Any Environment
Batch Scanning Option for Large Volume Operation
Intuitive Software for Technical & Non-technical Users
Wi-Fi & Ethernet Communication for Data Sync & Management
Why Choose Raman?
Measure Through Plastic, Glass, & Quartz Packaging
High Selectivity with No Sample Preparation Required
Samples Can be Solid or Liquid, Transparent or Opaque
Maintains Integrity and Volume of Sample (Nondestructive)
Sampling Flexibility:
The NanoRam FP has a fexible fber optic probe that is perfect for convenient sampling in warehouse settings and other hard to
reach places. The probe has a trigger feature and LED indicator lights to show pass/fail results, making it easy to sweep through
samples without needing to view the screen of the instrument.
The NanoRam FP is designed to facilitate fast and convenient transitions between sample adaptors, and comes standard with
distance regulator, vial holder, and bottle adaptor accessories. Additionally, a tablet holder and immersion shaft are available
to facilitate even more fexible sampling. These accessories allow you to measure various materials in the form of liquids, gels,
powders, or solids under demanding environmental conditions. More details about individual accessories are available upon
request.
Software:
State-of-the-Art Identifcation Software
The NanoRam FP comes standard with B&W
Teks proprietary NanoRam OS software installed
on the unit, which allows for identifcation and
verifcation, library and method development, and
data storage/ transfer. The NanoRam ID software
is designed for use on PCs for data and methods
management, allowing customers to export data
and generate reports. The NanoRam ID and NanoRam OS
software packages are 21CFR part 11 compliant with available
IQ/OQ validation documentation for pharmaceutical customers.
Additionally, the NanoRam FP
provides secure Wi-Fi and Ethernet
synchronization capabilities with
network terminals in order to optimize
time and resources. NanoRam OS is
capable of data and report transfers in
order to centralize information (such as libraries, methods and
fnal reports) in general servers.
Identifcation Investigation
Specifcations:
Excitation Wavelength 785nm
Laser Output Power 300mW Max Adjustable in 10%Increments
Spectral Range 176cm
-1
to 2900cm
-1
Spectral Resolution ~ 9cm
-1
@ 912nm
Detector Type TE Cooled Linear CCD Array
Display High Brightness and High Resolution Touch Screen
Bar Code Reader Linear and 2D Standards
Software NanoRam OS (Embedded), NanoRam ID (PC)
Data Formats .txt, .csv, .spc
Connectivity Ethernet, Wi-Fi
Battery Rechargeable Li-ion, >4 hrs Operation
AC Adapter Output: DC 12V, 2A Minimum
Weight (Excluding Probe) ~2.5 lbs (~1.2 kg)
Size (NanoRam Unit) 8.8in x 3.9in x 2.0in (22cm x 10cm x 5cm)
Operating Temperature -20C to +40C
Storage Temperature -30C to +60C
Distance Regulator
Tablet Holder
Vial Holder Bottle Adapter
Immersion Shaft
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i-Raman
The i-Raman is unique for its high resolution
combi ned wi th fi el d-por tabi l i ty, wi th
performance comparable to large bench-top
Raman systems and weighing less than 7
lbs. The systems small footprint, lightweight
design, and low power consumption provides
research grade Raman capabilities anywhere!
Spectral Resolution of 3cm
-1
175cm
-1
of the Rayleigh Line
65cm
-1
Option Available
Wide Raman Shift Coverage
Patented CleanLaze Technology
for Laser Stabilization
TE Cooled 2048 Pixel Array
Fiber Optic Interface for
Convenient Sampling
Features:
Why Choose Raman?
Applications:
Specifcations:
Sensitive, Versatile, Simple
Bioscience and Medical Diagnosis
Pharmaceutical Industry
Raman Microscopy
Polymers and Chemical Processes
Environmental Science
Forensic Analysis
Gemology
Geology and Mineralogy
Food & Agriculture Industry
Semiconductor & Solar Industry
Accessories:
Raman Probes
Cuvette Holder
Probe Holder
Video Microscope
Microscope Adaptor
Raman Flow Cells
Laser Safety Goggles
Laser
532nm Excitation > 50mW
Laser Linewidth (FWHM) < 0.3nm
Laser Power Control 532nm, 785nm, 830nm
Spectrometer Range Resolution
*
i-Raman-532S 175cm
-1
- 4000cm
-1
~ 4.0cm
-1
@ 614nm
i-Raman-532H 175cm
-1
- 3300cm
-1
~ 3.0cm
-1
@ 614nm
i-Raman-785S 175cm
-1
- 3200cm
-1
~ 4.5cm
-1
@ 912nm
i-Raman-785H 175cm
-1
- 2700cm
-1
~ 3.5cm
-1
@ 912nm
i-Raman-830 200cm
-1
- 2300cm
-1
~ 4.0cm
-1
@ 912nm
Detector
Detector Type TE Cooled Linear Array
Pixel Number 2048
TE Cooling Temperature 10
o
C
Dynamic Range 300:1 (Typical)
Digitization Resolution 16-bit or 65,535:1
Integration Time 5ms - 65,535ms
Electronics
Trigger Mode 5V TTL
Power Options
DC (Standard) 5V DC @ 8 Amps
AC (Optional) 100 - 240V AC, 50 - 60Hz
Battery Optional w/ DC only
Physical
Dimensions 6.7 x 13.4 x 9.2in (17 x 34 x 23.4cm)
Weight ~6.6 lbs (~3 kg)
Operating Temperature 10
o
C - 35
o
C
Storage Temperature -10
o
C - 60
o
C
Humidity 10%- 85%
*Typical Resolution Measured Using Pen Lamp Emission Center wavelength and linewidth not guaranteed
No Sample Preparation Required
Measure Through Glass, Quartz, Plastic (Non-contact)
Samples Can Be Solid, Liquid or Gas, Transparent or Opaque
Small Sample Size to Reduce Cost
Wide Spectral Coverage For Diversity of Applications
Cleaner and More Precise Spectra than FTIR or NIR
Laser
Spectrometer Creating Raman Scatter
Optimized for Raman Spectroscopy
In Raman spectroscopy, it is essential to utilize a clean, narrow bandwidth
laser due to the fact that the quality of the Raman peaks are directly
afected by the sharpness and stability of the delivered light source. The
i-Raman spectrometer system features a patented CleanLaze
technology
with a linewidth < 0.3nm when equipped with our 785nm and 830nm
laser. This technology
results in the correct
center wavelength and
avoids the phenomenon
of mode hopping. In
addition, the laser output
power can be adjusted
in the software from 0
- 100%, allowing you to
maximize the signal-to-
noise ratio and minimize
integration time.
Laser lifetime of 10,000 hours ensures quality data for years to come!
The spectrometer design in the i-Raman is dedicated for Raman
applications. You can customize your spectrometer by choosing from
a variety of excitation wavelengths. In addition, each confguration can
be further customized for your individual detection needs. Choose from
wider spectral range or high resolution optimized systems. Research
grade spectral resolution of 3cm
-1
can be achieved with our double pass
transmission optics. Most
Raman applications do not
requiresuch tight resolution,
so a wider spectral range
would be the better choice
in that case. The high-
throughput optical layout of
all i-Raman confgurations
are ideal for those low-light
level Raman applications.
Filter
Collects Data within 175cm
-1
of the Rayleigh Line
The center wavelength of the laser line is precisely maintained even when
the peak power is increased by utilizing a series of high end flters. A
laser line flter is used to clean up any side bands and ensure a narrow
excitation is delivered to the sample by removing all secondary excitation
lines before exciting the sample. The light collected from the sample is
then fltered via a notch flter. Finally, an ultra steep long pass flter further
removes lingering laser lines to allow accurate measurement of Raman
peaks as close as 175cm
-1
from the Rayleigh line. An E-grade flter upgrade
is available, allowing the measurement of Raman peaks as close as 65cm
-1

from the Rayleigh line.
CleanLaze
775 780 785 790 795

-80
-70
-60
-50
-40
-30
-20
-10
0
l (nm)
N
orm
alized P
ow
er (dB
)
l =0.02nm
Cyclohexane
Probe
Detector
Cooled Detector for Low-Light Level Detection
The probe allows for measurement of various materials in the form of
liquids, gels, powders, or solids under both lab conditions (lab grade) or
demanding environmental conditions (industrial grade). Constructed
with state-of-the-art telecom packaging techniques, the probe has a
fexible fber coupling encased in a durable protective jacketing material
which delivers Rayleigh scatter rejection as high as 10 photons per billion.
Wavelength excitation probes come in 532nm, 785nm, or 830nm.
Custom wavelength excitation probes available.
Cooling an array detector with a built-in thermoelectric cooler (TEC) is an
efective way to reduce dark current and noise to enhance the dynamic
range and detection limit. The graphs below show the dark current and
noise for an uncooled versus a cooled CCDdetector at an integration time
of 30 seconds. Operating at room temperature, the dark current nearly
saturates the uncooled CCD. When the CCD is cooled to 10
o
C, the dark
current is reduced by four times. This allows the spectrometer to operate
at long integration times and detect weak optical signals.
RoomTemperature Cooledto10
o
C
DarkCurrent: Uncooledvs. Cooled CCDDetectorsat 30Seconds
Software
State of the Art Chemometric Software
B&W Tek ofers comprehensive
software packages that provide
solutions for all application
needs. Powerful calculations,
easy data management, and
user friendly easy-to-follow
work fow are all at the tips of
your fngers.
BWSpec is the foundation for all B&W Tek software platforms and comes
standard with every spectrometer. Built on the proven BWSpec platform,
BWID is optimized for identifcation and verifcation of materials. For
industrial Raman applications that require federal compliance: BWID-
Pharma supports all requirements for FDA 21 CFR Part 11 Compliance.
The most recent addition to B&W Teks software portfolio is BWIQ
chemometrics softwarefor usewith thei-Raman and other high resolution
Raman products. BWIQ is a multivariate analysis software package which
can analyze spectral data and discover internal relationships between
spectra and response data or spectra and sample classes. By coupling
new and transitional chemometric methods with cutting edge computer
science technology such as sparse linear algebra algorithms, BWIQ
represents the next generation in speed, accuracy, and performance.
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i-Raman Plus
Highly Sensitive, High Resolution Fiber Optic Raman System
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SENSITIVE:
COMPREHENSIVE:
QUANTITATIVE:
Applications:
Geology, Mineralogy, and Gemology
Bioscience and Medical Diagnostics
Semiconductor & Solar Inspection
Pharmaceutical Material Analysis
Polymer and Chemical Analysis
Raman Microscopy
Forensic Analysis
High quantum efficiency CCD array detector
with deeper cooling and high dynamic range
Our comprehensive package of sampling accessories for
measuring solid and liquid samples provide you the utmost
utility right out of the box.
Our state of the art BWIQ quantitative Raman analysis software package
provides an intuitive user interface, intelligent algorithms, and efcient
matrix calculation power, making it easy to use by both expert and
novice users.
The i-Raman Plus is an enhanced version of our award winning i-Raman portable
Raman spectrometer, now powered by our innovative smart spectrometer
technology. Using a high quantum efciency CCD array detector with deeper
cooling and high dynamic range, this portable Raman spectrometer delivers
an improved signal to noise ratio for up to 30 minutes of integration time,
making it possible to measure weak Raman signals. The i-Raman Plus features
the unique combination of wide spectral coverage and high resolution with
confgurations measuring out to 4000cm
-1
, enabling you to measure stretching
bands around 3100cm
-1
. The systems small footprint, lightweight design, and
low power consumption provide research grade Raman capabilities anywhere.
The i-Raman Plus comes standard with a fber optic probe, probe holder with
XYZ positioning stage, cuvette adaptor for measuring liquid samples, and our
proprietary BWIQ multi-variant analysis software. With the i-Raman Plus, a
high precision qualitative and quantitative Raman solution is at your fngertips.
Software:
B&W Tek ofers comprehensive software packages that provide
solutions for Raman application needs. Powerful calculations, easy
data management, and user friendly, easy-to-follow work fow are
all at the tips of your fngers.
BWSpec
TM
is the foundation for all B&W Tek software platforms and
comes standard with every Raman spectrometer. Built on the proven
BWSpec
TM
platform, BWID
TM
(optional) is optimized for identifcation
and verifcation of materials. For industrial Raman applications that
require federal compliance: BWID
TM
- Pharma (optional) supports all
requirements for FDA 21 CFR Part 11 Compliance.
TM

chemometrics software for use with the i-Raman Plus and other
high resolution Raman products. BWIQ
TM
is a multivariate analysis
software package which can analyze spectral data and discover
internal relationships between spectra and response data or spectra
and sample classes. By coupling new and transitional chemometric
methods with cutting edge computer science technology such
as sparse linear algebra algorithms, BWIQ
TM
represents the next
generation in speed, accuracy, and performance.
Specifcations:
Laser
532nm Excitation < 50mW
Laser Power Control 532nm, 785nm
*
BWS465-532S 175cm
-1
- 4000cm
-1
~ 4.0cm
-1
@ 614nm
BWS465-532H 175cm
-1
- 3300cm
-1
~ 3.0cm
-1
@ 614nm
BWS465-785S 175cm
-1
- 3200cm
-1
~ 4.5cm
-1
@ 912nm
BWS465-785H 175cm
-1
- 2700cm
-1
~ 3.5cm
-1
@ 912nm
Detector
Detector Type High quantum efciency CCD Array
Pixel Number 2048 Efective Detector Elements
Efective Pixel Size 14m x ~ 0.9 mm
CCD Cooling Temperature -2
o
C
Dynamic Range 50,000:1 (Typical)
Integration Time 100ms - 30 mins
Electronics
Trigger Mode 5V TTL
Power Options
DC (Standard) 12V DC @ 6.6 Amps
AC (Optional) 100 - 240V AC, 50 - 60Hz
Battery Optional w/ DC only
Physical
Dimensions 6.7x13.4x9.2inc (17x34x23.4cm)
Weight ~6.6lbs (~3kg)
Operating Temperature 0
o
C - 35
o
C
Storage Temperature -10
o
C - 60
o
C
Humidity 10%- 85%
*Typical resolution measured using pen lamp emission
Center wavelength and linewidth not guaranteed
Accessories (Included):
Accessories (Optional):
Fiber Optic Raman Probes
Cuvette Holders
Probe Holders
Immersive Raman Probe Shaft
Microscope Adaptor
Video Microscope
Raman Flow Cells
Patented CleanLaze Technology for Laser Stabilization
175cm
-1
of the Rayleigh Line (65cm
-1
Option Available)
Fiber Optic Coupling for Convenient Sampling
Up to 4000cm
-1
Raman Shift Coverage
Spectral Resolution as fne as 3cm
-1
i-Raman EX
Applications:
1064nm Fiber Optic Raman System
The i-Raman EX is an extension of our award winning i-Raman portable
Raman spectrometer featuring a 1064nm version of our patented
CleanLaze excitation laser. Using a high sensitivity InGaAs array detector
with deep TE cooling and high dynamic range, this portable Raman
spectrometer delivers a high signal to noise ratio without inducing auto-
fuorescence, making it possible to measure a wide range of biological
samples. The i-Raman EX provides spectral resolution as fne as 9.5cm
-
1
and a spectral coverage range from 175-2500cm
-1
, enabling you to
measure the entire fngerprint region. The systems small footprint,
lightweight design, and low power consumption provide research grade
Raman capabilities anywhere. The i-Raman EX comes standard with a fber
optic probe, probe holder with XYZ positioning stage, cuvette adaptor
for measuring liquid samples, and our proprietary BWIQ multi-variant
analysis software. With the i-Raman EX, a high precision qualitative and
quantitative Raman solution is at your fngertips.
Comparison of the measured spectra
of a fsh oil capsule with 785nm and
1064nm Raman system
Comparison of the measured spectra
of a sesame seed sample with
785nm and 1064nm Raman system
Comprehensive:
Quantitative:
Our comprehensive package of sampling accessories for
measuring solid and liquid samples provide you the utmost
utility right out of the box.
Our state of the art BWIQ quantitative Raman analysis software package
provides an intuitive user interface, intelligent algorithms, and efcient
matrix calculation power, making it easy to use by both expert and novice
users.
Forensic Analysis, Including Narcotics
Bioscience & Biomedical Diagnostics
Chemical Warfare Agent Detection
Pharmaceutical Material Analysis
Polymer & Chemical Analysis
Explosives Detection
Petroleum Analysis
Food & Agriculture
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Software:
B&W Tek ofers comprehensive software packages that provide
solutions for Raman application needs. Powerful calculations, easy
data management, and user friendly, easy-to-follow work fow are
all at the tips of your fngers.
Built on the proven BWSpec
TM
platform, BWID
TM
(optional) is
optimized for identifcation and verifcation of materials. For
industrial Raman applications that require federal compliance:
BWID
TM
- Pharma (optional) supports all requirements for FDA 21 CFR
Part 11 Compliance.
TM

chemometrics software for use with B&W Tek Raman spectrometers.
BWIQ
TM
is a multivariate analysis software package which can analyze
spectral data and discover internal relationships between spectra
and response data or spectra and sample classes. By coupling new
and transitional chemometric methods with cutting edge computer
science technology such as sparse linear algebra algorithms, BWIQ
TM

represents the next generation in speed, accuracy, and performance.
Specifcations:
Laser
Laser Power Control
0 to 100%
*
i-Raman-1064S-05 175cm
-1
- 2500cm
-1
~ 9.5cm
-1
@ 1295.66nm
Detector
Detector Type TE Cooled InGaAs
Dynamic Range 25,000:1
Integration Time 200 s to >20 minutes
Electronics
Trigger Mode 5V TTL
Power Options
DC Power Adaptor 12V DC @ 6.6 Amps
Battery Optional
Physical
Dimensions 6.7 x 13.4 x 11 inch (17 x 34 x 28 cm)
Weight Main Unit ~7.6 lbs
*Typical resolution measured using pen lamp emission
Center wavelength and linewidth not guaranteed
Patented CleanLaze Technology for Laser Stabilization
1064nm Excitation for Removal of Fluorescence
Integration Time 0.2ms to >20 minutes
Adjustable Laser Power, Up to 450mW
Deep Cooled InGaAs Array Detector
Spectral Coverage of 175-2500cm
-1
Resolution as Fine as <9.5cm
-1
Features:
Accessories (Included): Accessories (Optional):
Fiber Optic Raman Probe
Cuvette Holder
Probe Holder
Immersion Raman Probe Shaft
Raman Flow Cells
BAC100 / BAC102 Lab Grade Raman Probes
BAC101 Industrial Grade Raman Probe
Our fber optic lab grade Raman probes are compatible with 532nm or 785nm
excitation wavelengths; custom wavelengths are also available. The Raman probe
is suitable for laboratory, feld, and select process applications/conditions and can
sample materials such as liquids, powders, slurries, and solids. The BAC102 hand
trigger is located on the probe head for convenient point and click acquisition that
connects to a compatible Raman system. Standard data collection falls within 175cm
-1
to the Rayleigh Line, though all of our fber optic probes can be upgraded with an
E-grade flter, enabling measurement of Raman peaks as close as 65cm
-1
to the Rayleigh
line. The innovative design uses state-of-the-art telecom packaging techniques and
optimized optical lenses. Fiber ends feature FC/PC for excitation and SMA for collection.
Our fber optic industrial grade Raman probe is compatible with 532nm or 785nm
excitation wavelengths; custom wavelengths are also available. This highly durable
Raman probe is suitable for demanding laboratory, feld, and select process applications/
conditions and can sample materials such as liquids, powders, slurries, and solids.
Standard data collection falls within 175cm
-1
to the Rayleigh Line with an optional
E-grade flter available for collection within 65cm
-1
to the Rayleigh Line. The innovative
design uses state-of-the-art telecom packaging techniques and optimized optical
lenses. Fiber ends feature FC/PC for excitation and SMA for collection.
BCR100A Cuvette Holder
BAC160 Liquid Sample Flow Cell
The BRC100A provides Raman signal up to 3 times clearer than standard cuvette holders.
Using an internal mirror with a three point precision locking mechanism, it achives
unmatched reproducibility. The BCR100A can be used with any standard 12.5mm x
12.5mm size cuvette for liquid or powder sampling. High stability, repeatability, and
enhanced Raman signal can be expected with the BCR100A.
This sampling device is designed for Raman on-line process monitoring and provides a
sampling platform with high throughput and stability when used with a B&W Tek, Inc. lab
grade or industrial grade Raman probe. Our fow cells are constructed using a choice of
three diferent cell materials: 316 SS, titanium, or tefon. Window options include quartz
or sapphire. A Kalrez O-ring is used to create a chemically resistant sampling device.
Custom cell materials and window construction are also available.
Accessories Accessories
For more information and additional accessories, please visit our website at www.bwtek.com
BAC150 Raman Probe Holder BAC151A Video Microscope Sampling System
The BAC150 Raman probe holder is compatible with any B&W Tek, Inc. Raman probe
and delivers precision X, Y, and Z axis control with coarse and fne adjustment options.
Adjustment of the Z-axis focuses the laser on the desired plane to maximize the Raman
signal.
The BAC151A Video Microscope Sampling System is compatible with all B&W Tek Inc.
Raman probes and is designed with the highest level of fexibility. One port can be used
with two diferent input laser wavelengths due to the optional dual laser wavelength
confguration. The integrated camera facilitates precision Raman sampling through
BWSpec, which allows for laser beam tracking and image capturing.
Software
Safety & Security
B&W Tek ofers comprehensive software packages that provide solutions for all
application needs. Powerful calculations, easy data management, and user friendly
easy-to-follow work fow are all at the tips of your fngers. Built on the proven
BWSpec platform, BWID

is optimized for identifcation and verifcation of materials.
For industrial Raman applications that require federal compliance: BWID-
Pharma supports all requirements for FDA 21 CFR Part 11 Compliance.
chemometrics software for use with the i-Raman and other high
resolution Raman products. BWIQ is a multivariate analysis
software package which can analyze spectral data and discover
internal relationships between spectra and response data or
spectra and sample classes.
B&W Tek, Inc. recommends the use of laser safety goggles for Raman spectrometer
systems due to their Class IIIb lasers. Class IIIb lasers produce radiation that can cause
damage to the eyes when viewed directly or indirectly.
For transporting your Raman system, rolling black suitcases with protective foam inserts
are available.
Also, ask about our Extended Warranty Program for our Raman systems.
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BWID & BWID-Pharma
BWID has been specifcally designed for material identifcation using
Raman spectroscopy. It will rapidly identify and verify materials stored
in your own personal easy-to-create library or one of B&W Teks easy-
to-load libraries. The combination of BWID and any of B&W Teks
Raman spectrometer systems create a powerful and efective solution
for identifcation and verifcation of materials. The reporting capability
enables a user to save, view, and print any analysis report.
BWID-PHARMA is designed for pharmaceutical manufacturing
facilities that are facing the increasing need for 100% inspection of
incoming raw materials. In addition to all the features provided in
BWID, BWID-PHARMA provides enhanced system access security
and an audit trail of data activities that support compliance with the
FDA 21 CFR Part 11 regulation for Electronic Records and Electronic
Signatures, beneftting pharmaceutical system validations including
Installation Qualifcation (IQ) and Operational Qualifcation (OQ)
procedures.
Features of BWID:
Fast Identifcation of Unknown Materials with MATCH or NO MATCH Results
Fast Verifcation of Known Materials with PASS or FAIL Results
User-defnable Method for Automated Sequences of Testing
Facilitates Inspection of Incoming Raw Materials
Build User-defned Spectral Libraries
Supports Third-party Libraries
Seven Search Algorithms
Capable of Automatic Performance Test
Simplifed Menu Driven GUI
Save, View and Print Analysis Reports
FDA 21 CFR Part 11 Regulation Compliance:
Electronic ID Signatures for Records Analysis: Review, Reject, Approve
Three User Levels: Administrator, Developer, Operator
Pharmaceutical System Validations - IQ and OQ Procedures
System Access Security
Audit Trails
Features of BWID-Pharma:
BWIQ
BWIQ chemometrics software package is intended for use with the i-Raman and other
high resolution Raman products. It is a multivariate analysis software package that analyzes
spectral data and discover internal relationships between spectra and response data or
spectra and sample classes. BWIQ combines traditional chemometric methods such as Partial
Least Squares Regression (PLS) and Principal Component Analysis (PCA), with new methods
such as B&W Teks proprietary adaptive iteratively reweighted Penalized Least Squares (airPLS)
algorithm for automatic baseline correction and Support Vector Machine (SVM) algorithms for
non-linear datasets.
Applications:
Multivariable Quantitative Analysis
Multivariable Classifcation Analysis
Exploratory Analysis
Features:
Progressive Structure and Easy-to-follow Work Flow
Wide Variety of Regression and Classifcation Routines
Three Diferent Automatic Sample Partition Algorithms
High Performance and Accuracy with the Help of BLAS and LAPACK
High Speed and Less Memory with Sparse Linear Algebra Algorithms
Chemometric Modeling Markup Language (CMML) for Easy Model
Storage and Sharing
Innovative Algorithms: airPLS for Baseline Correction and Whittaker
Penalized Least Squared Algorithm for Spectra Smoothing
The Next Generation in Speed, Accuracy, and Performance
Main Functions:
Automatic Sample Partition Algorithms for Sampling Process
Various Spectra Preprocess Algorithms, Including Automatic Baseline Correction airPLS (adaptive iteratively
reweighted Penalized Least Squares); Smoothing Algorithms and Spectra Diferential; As Well As Mean Centering and
Auto Scaling
Intuitive Variable Selection Based on Spectra As Well As Correlative Coefcient.
Exploratory Data Analysis Through Principle Component Analysis (PCA)
Regression Analysis Through Various Algorithms Including MLR, PCR, PLS1, PLS2
Support Vector Machine Regression for Non-linear Datasets
Classifcation with Cluster Analysis and Discriminant Analysis with Algorithms including SIMCA, PCA-MD, PLS-DA, SVC
Sample Partition
Baseline Correction using airPLS
Spectra Smoothing
Predict Unknown Samples
Build Chemometric Model using PLS Regression
Example Software Work Flow
Advantage of airPLS compared to
common baseline correction routines
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BWN Series
The BWN laser series is a line of solid-state electrically pumped
diode lasers and diode pumped, solid-state lasers. Compact
and self-contained, the BWN series emits a pure TEM
00
beam
with difraction limited performance and a typical M
2
of 1.05.
Available in green (532 nm), yellow (594 nm), red (635 nm and
660 nm), and NIR (780 nm and 830 nm) with variable power
options, these modules are ideal for demanding applications
such as metrology, photoluminescence, printing, illumination,
scanning, inspection, particle counting, and a variety of
biomedical applications. These OEM laser modules maintain
outstanding optical performance over a broad temperature
range, guaranteeing minimal power fuctuations and virtually
eliminating high frequency noise. They have the worlds smallest
OEM controller with power consumption < 5 Watts. They have
been qualifed for use in some of the most demanding high-end
instruments, with deployments in the tens of thousands.
Green (532 nm), Yellow (594 nm), Red (635 nm,
660 nm), and NIR (780 nm, 830 nm)
TEM
00
Beam Quality
> 10,000 Hours Expected Lifetime
Low Noise and Excellent Power Stability
Integratable into Larger OEM Systems
Features:
Applications: Specifcations:
OEM Diode and DPSS Lasers
Optical Trapping
Metrology
Wafer Inspection
Laser Printing
Particle Counting
Photoluminescence
Illumination
Pointing
Bio Instrumentation
Spectroscopy
Signal Transmission
Wavelength (nm) 532 +/- 1 594 +/- 1 635 +/- 10 660 +/- 5 780 +/- 5 830 +/- 10
Output Power (mW) 5, 10, 20,
50, 100
300 5, 10,
20
50 5, 10, 20 5, 10, 20,
40, 60
5, 10, 20,
40, 60
5, 10
Spatial Mode TEM
00
FWHMLinewidth (nm) - < 1
M
2
< 1.1 < 1.2 < 1.1
Beam Diameter at 1/e
2
(mm) (Typical) < 1.0 < 2.0 < 1.5 < 2.0 < 1.0
Beam Divergence (mrad) (Typical) < 1.5
Beam Asymmetry < 1.2:1 < 1.5:1 < 1.2:1
Mode of Operation CW / Modulated
Long-Term Power Stability (pk-pk) <+/-3% < +/- 5% < +/- 10% < 5%
RMS Noise
20 Hz to 10 MHz < 0.5% - < 1.0%
10 MHz to 500 MHz < 0.5% - < 1.0%
Digital Modulation/External Trigger*
Maximum Bandwidth (kHz) > 20 On/Of only > 20
Rise Time (10%to 90%) (sec) < 20 - < 4
Fall time (10%to 90%) (sec) < 20 - < 4
Modulation Depth (Extinction Ratio) > 100:1
Analog Modulation*
Maximum Bandwidth (kHz) > 1 Set Power
Only
- > 1
Rise Time (10%to 90%) (sec) < 50 - < 10
Fall time (10%to 90%) (sec) < 50 - < 10
Modulation Depth (Extinction Ratio) > 100:1 - > 100:1
Polarization Ratio > 100:1 -
Warm-Up Time (Minutes) < 5 < 10 < 5
Beam Position (mm) 20 +/- 1 30.8 +/- 1 20 +/- 1
Beam Angle (mrad) < +/- 5
Pointing Stability (rad/C) < 10
Ambient Temperature (C) 10 - 35 15 - 35 10 - 35
*Optional
Note: OEM Laser Components Are Not CDRHCompliant
The BWN includes an external laser
driver, thermoelectric cooling, and
optical fber coupling with an expected
lifetime > 10,000 hours. The BWN has
been proven reliable up to a 5% peak-
to-peak long term power stability
rating.
Excellent Power Stability
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
0.8
0.85
0.9
0.95
1
1.05
1.1
1.15
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Laser Power Stability (532nm)
=0.0014
Weeks
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
0.8
0.85
0.9
0.95
1
1.05
1.1
1.15
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P
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Laser Power Stability (532nm)
=0.0014
Introduction to Laser Technology
Since the invention of the laser 50 years ago, laser technology has truly evolved into
an extremely diverse discipline with applications in countless felds. A wide variety of
laser types have enabled countless technologies that afect the way we live our daily
lives, with examples ranging from simple CD players and barcode scanners to complex
instrumentation such as DNA sequencers and 3D imagers.
Lasers are typically categorized by two parameters: frst by the type of gain material
employed (i.e. solid, liquid, or gas) and secondly by the pump source (i.e. optical or
electrical). In the following section, we will provide a brief introduction of laser technology
with specifc examples from the two most popular laser types.
The word laser is an acronym that stands for light amplifcation by stimulated
emission of radiation. A laser consists of three basic components: (1) a gain
material, (2) a resonant cavity, and (3) a pump source. In order for a material
to qualify as a gain material, it must possess a unique property known as
metastability. A material is in a metastable state when an outside source (pump)
excites its electrons to a higher energy level, causing them to temporarily
remain in an excited state. This excited state allows population inversion, which
occurs when more electrons are in an excited state than in the ground state.
When population inversion occurs, the material becomes a gain material (amplifer) because a photon with the proper energy
is able to pass through the material, causing an electron to lose its energy in the form of a photon with equal energy. This
process, known as stimulated emission, causes a net photon gain.
Under the conditions of population inversion, lasing cannot occur until the
material is placed in a resonant cavity (oscillator), typically consisting of a set
of mirrors. One mirror, known as the high refector, will redirect most of the
incident photons back into the gain material, while the other mirror, known
as the output coupler, will only direct a selected amount of incident photons
back into the gain material. The redirection of photons back into the gain
material allows amplifcation of the photons until the system reaches lasing
threshold. When the loss from the output coupler is equal to the gain from
the pumped material the lasing threshold has been met. Only then is a true
laser beam emitted.
Diode lasers achieve population inversion by applying a voltage across the p-n junction. If a strong enough voltage is applied,
the Fermi level of the diode will break into two quasi-Fermi levels. When the diference between those two levels is greater
than the band gap of the material, population inversion has been achieved. Alternatively, diode pumped solid-
state (DPSS) lasers use a diode laser to pump a diferent crystal such as Nd:YAG or Nd:YVO4. Diode pumping is
a very efcient method of pumping dielectric materials because the diode pump wavelength can be tuned
to maximize the photon absorption into the gain material.
DPSS lasers have many advantages over standard diode lasers, especially when it comes to linewidth
and beam quality. However, through the use of distributed gratings etched into the diode or
external gratings, diode lasers can be enhanced to drastically narrow the laser linewidth as well.
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BWR Series
The BWR laser series is a line of solid-state, optically pumped
lasers known as diode pumped solid-state lasers (DPSS).
Compact and self-contained, the BWR series emits a pure
TEM
00
beam with difraction limited performance and a typical
M
2
of 1.4. Available in NIR (1064 nm) and with variable power
options, these modules are ideal for demanding applications
such as metrology, photoluminescence, printing, illumination,
scanning, inspection, particle counting, and a variety of bio-
medical applications. These OEM laser modules maintain
outstanding optical performance over a broad temperature
range, guaranteeing minimal power fuctuations and virtually
eliminating high frequency noise. They utilize the worlds
smallest OEM controller with power consumption < 20
Watts. They have been qualifed for use in some of the most
demanding high-end instruments, with deployments in the
tens of thousands.
NIR (1064 nm)
TEM
00
Beam Quality
Excellent Power Stability
Features:
Applications:
Specifcations:
OEM Diode Pumped Solid-State (DPSS) Lasers
Optical Trapping
Material Processing
Metrology
Wafer Inspection
Printing
Medicine
Particle Counting
Photoluminescence
Illumination
Pointing
Bio Instrumentation
Spectroscopy
Signal Transmission
*Optional
Wavelength (nm) 1064 +/- 2
Output Power (mW) 20, 50, 100 450 600, 1200
Spatial Mode TEM
00
M
2
< 1.4 < 1.2 < 1.5
2
(mm) (Typical) < 2.0
Beam Divergence (mrad) (Typical) < 2.0 < 1.5 < 2.0
Beam Asymmetry < 1.5:1
Long-Term Power Stability (pk-pk) < +/- 5%
Maximum Bandwidth (kHz) > 5 > 1
Rise Time (10%to 90%) (sec) < 50 < 100
Fall time (10%to 90%) (sec) < 50 < 100
Analog Modulation*
Maximum Bandwidth (kHz) > 1
Rise Time (10%to 90%) (sec) < 50 < 100
Fall time (10%to 90%) (sec) < 50 < 100
Polarization Ratio > 100:1
Warm-Up Time (minutes) < 5
Beam Position (mm) 15 +/- 1 30.8 +/- 1
Beam Angle (mrad) < +/- 5
Pointing Stability (rad/C) < 10
Ambient Temperature (C) 10 - 35 15 - 35
Spatial Mode Profle
By internally coupling the laser output into a single-
mode fber optic that acts as a mode flter, the BWR
laser series delivers a single-mode (TEM
00
) spatial
beam profle with circularity < 1.5:1 and a typical M
2

of 1.4 for lasers above 600 nm.
BWB Series
The BWB laser series is a line of solid-state diode lasers and diode pumped
solid-state lasers. Compact and self-contained, the BWB series emits a
pure TEM
00
beam with difraction limited performance and a typical M
2

of 1.4. Available in UV (405 nm) and blue (440 nm, 475 nm) with variable
power options, these modules are ideal for demanding applications
such as metrology, photoluminescence, printing, illumination, scanning,
inspection, particle counting, and a variety of biomedical applications.
These OEM laser modules maintain outstanding optical performance over
a broad temperature range, guaranteeing minimal power fuctuations and
virtually eliminating high frequency noise. They have the worlds smallest
OEM controller with power consumption < 5 Watts. They have been
qualifed for use in some of the most demanding high-end instruments,
with deployments in the tens of thousands. The 375 nm, 405 nm, and 440
nm systems replace bulky, expensive gas ion lasers for biomedical and
fuorescence applications without sacrifcing beam quality.
UV (405 nm) and Blue (440 nm, 475 nm)
TEM
00
Beam Quality
Features:
Applications:
Specifcations:
OEM Diode and DPSS Lasers
Optical Trapping
Material Processing
Metrology
Wafer Inspection
Printing
Medicine
Particle Counting
Photoluminescence
Illumination
Pointing
Bio Instrumentation
Spectroscopy
Signal Transmission
Low Noise
The BWB can be operated in a wide temperature range
(10
o
C - 35
o
C) with a stable, quiet laser output power at
most wavelengths. The BWB has a proven history of RMS
noise stability < 1.0%. The combination of excellent beam
characteristics (such as mode quality, low divergence, and
brightness) makes the BWB laser series suitable for beam
focusing as well as long distance beam positioning.
* > 60%Energy for TEM
00
Mode for 405nm Option
**Optional
Wavelength (nm) 405 +/- 10 440 +/- 10 475 +/- 2
Output Power (mW) 20, 40, 80, 100 4, 10 4, 10,
20
150
Spatial Mode TEM
00
*
M
2
- < 1.4 < 1.2
2
(mm) (Typical) < 1.4 x 3.0 < 1.0 < 2.0
Beam Divergence (mrad) (Typical) < 1.5
Beam Asymmetry < 3:1 < 1.5:1
Long-Term Power Stability (pk-pk) < 5% < +/- 5%
RMS Noise
20 Hz to 10 MHz <0.5% -
10 MHz to 500 MHz <0.5% -
Digital Modulation/External Trigger**
Maximum Bandwidth (kHz) > 20 On/Of Only
Rise Time (10%to 90%) (sec) < 4 -
Fall Time (10%to 90%) (sec) < 4 -
Modulation Depth (Extinction Ratio) > 100:1 > 100:1
Analog Modulation**
Maximum Bandwidth (kHz) > 1 Set Power Only
Rise Time (10%to 90%) (sec) < 10 -
Fall Time (10%to 90%) (sec) < 10 -
Modulation Depth (Extinction Ratio) > 100:1 -
Polarization Ratio > 50:1 > 100:1 > 50:1 > 100:1
Warm-Up Time (Minutes) < 5 < 5
Beam Position (mm) 20 +/- 1 20 +/- 1 30.8 +/- 1
Beam Angle (mrad) < +/- 5 < +/- 5
Pointing Stability (rad/C) < 10 < 10
Ambient Temperature (C) 10 - 35 10 - 35
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High Performace Laser Diode Systems
Fiber Coupled Laser Diode Systems
Diode Pumped Solid-State Lasers
Specifcations: High Permormance Laser Diode Systems
Specifcations: Diode Pumped Solid-State Lasers
Beam Circularity: <1.2:1 (<3:1 for 405nm)
Spatial Mode**: TEM
00
, M
2
<1.1
Polarization: Random (>100:1 Linear for 405nm)
RMS Noise: <1%(<0.5%for 405nm)
Power Stability: 3%
Warm-Up Time: <5 Minutes
Analog Modulation: >1kHz
Digital Modulation: >20kHz
Operating Temp.: 10C to 35C
Input Voltage: 100-240V AC, 50/60Hz
Dimensions
Main Unit:
Laser Head:

7.75in x 12.5in x 3.25in
106.8 x 50.8 x 35.5mm
Wavelength 405nm 10nm 635nm 10nm 660nm 5nm 780nm 5nm 830nm 10nm
Output Power: 100mW 20mW 60mW 60mW 10mW
Beam Diameter (1/e2): <1.4mm x 3.0mm <1.0mm <1.0mm <1.0mm <1.0mm
Beam Divergence (Typical): <1.5mrad <1.5mrad <1.5mrad <1.5mrad <1.5mrad
Pointing Stability: <10rad/C <10rad/C <10rad/C <10rad/C <10rad/C
Wavelength 475nm 2nm 532nm 1nm 594nm 1nm 1064nm 2nm
Beam Circularity: < 1.5:1 < 1.2:1 < 1.5:1 < 1.5:1
Output Powers 4, 10, 20, 150mW 5, 10, 20, 50, 100, 300mW 5, 10, 20, 50mW 20, 50, 100, 450
Beam Diameter (1/e2, Typical): < 1.0mm (< 2.0 for 100mW) < 1.0mm (< 2.0 for 300mW) < 1.0mm (< 2.0 for 50mW) < 2.0mm
Beam Divergence (Typical): < 1.5mrad < 1.5mrad < 1.5mrad < 2.0mrad
Pointing Stability (rad/C): <10 < 10 < 10 < 10
Spatial Mode: TEM
00
, M
2
<1.2 TEM
00
, M
2
<1.1 TEM
00
, M
2
<1.2 TEM
00
, M
2
<1.4
RMS Noise: - < 0.5% - -
Power Stability: 5% 3%(5%for 300mW) 5% 5%
Warm-Up Time: < 5 Minutes < 5 Minutes < 5 Minutes < 5 Minutes
Analog Modulation: Set Power Only >1KHz (300mW: Set Power Only) - >1KHz (450mW: Set Power Only)
Digital Modulation: On/Of Only >20KHz (300mW: On/Of Only) On/Of Only >5KHz (450mW: On/Of Only)
Baseplate Temperature: 10C to 35C 10C to 35C 10C to 35C 10C to 35C
Power Supply: 100-240VAC, 50/60Hz 100-240VAC, 50/60Hz 100-240VAC, 50/60Hz 100-240VAC, 50/60Hz
Dimensions: (L x W x H): 7.75in x 12.5in x 3.25in 7.75in x 12.5in x 3.25in 7.75in x 12.5in x 3.25in 7.75in x 12.5in x 3.25in
Laser Head (L x W x H): 106.8 x 50.8 x 35.5 mm
(120 x 90 x 60 mm for 150mW)
106.8 x 50.8 x 35.5 mm
(120 x 90 x 60 mm for 300mW)
120 x 90 x 60 mm 71.4 x 30 x 30 mm
(120 x 90 x 60 mm for 450mW)
Wavelength 635nm 10nm 660nm 5nm 780nm 5nm 830nm 10nm
Output Power: 20mW 60mW 60mW 10mW
Fiber Coupling: Single Mode FC/PC Port Single Mode FC/PC Port Single Mode FC/PC Port Single Mode FC/PC Port
Fiber Core Diameter: 4.5m 4.5m 5m 5m
Fiber Numerical Aperture: 0.14 0.14 0.14 0.14
** >60%energy in TEM
00
for 405nm
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Flex
The Flex
TM
high performance continuous wave (CW) laser system provides a
fully integrated end-user laser system based on our proven BWN, BWR, and
BWB OEM laser engines in one compact class IIIb certifed laser system. All
models come standard with both RS232 and USB 2.0 plug-and-play interfaces
and our easy to use software package. The Flex software allows full control
over output power, base plate temperature, and TTL triggering control setup.
An hour meter to monitor laser usage is also included. These turnkey lasers
maintain outstanding optical performance over a broad temperature range,
guaranteeing minimal fuctuations in power and virtually eliminating high fre-
quency noise.
The Flex is available in nine diferent wavelength options spanning the ultra-
violet to the near-infrared with output powers up to 450mW. All wavelengths
are available with external laser heads for easy alignment. Additionally, wave-
lengths between 600nm and 900nm are also available with single mode fber
coupling. Each Flex provides a pure TEM
00
beam with M
2
values as low as 1.05.
Internal TE Coolers increase reliability over a temperature range of 10
o
to 35
o
C. The Flex is powered by a single AC 100
240VAC input which runs the internal low consumption (<40W) power supply, providing a regulated universal DC output.
Applications:
Compact Low Noise Class IIIb Lasers
Fluorescence
Bio Instrumentation
DNA Sequencing
Photoluminescence
Metrology
Flow Cytometry
Optical Trapping
Laser Pumping
Photo Lithography
Confocal Microscopy
DNA Sequencing
Particle Counting
Biomedical Research
Precision Alignment
Optical Signal Transmission
Microscopy
Laser Projection
Software Interface
The Flex laser series comes equipped with
USB and RS232 connections and our easy-to-use
software interface for laser power control and
real time monitoring of internal laser conditions.
Wavelengths from 405nm to 1064nm
Close to Difraction Limited Beam Quality
User-friendly Graphical User Interface
Features:
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BWF 1
BWF 1 systems provide up to 450mW of continuous power, combining
a high brightness, fber coupled to a laser diode with a thermoelectric
cooler, heatsink, fan, power supply, and component electronics all in
one package. Their unique design includes an external TTL modulation
port (BNC connector) and an LCD that displays output as current
values (mA). The fber uses a non-epoxy high power connector with
an industry standard termination for high power lasers. An optional
collimating lens can be threaded directly onto the SMA connector of
the emitting fber.
High-brightness Fiber Coupled Laser
Stand-alone Self-contained System
Compact Thermoelectric Cooling
600-1600 nm Wavelengths Available
Features:
Applications:
Specifcations:
High Brightness Fiber Coupled Laser System
Fluorescence
Laser Pumping
Selective Soldering/De-soldering
Heat Treating
Quick Curing of Epoxy
Transformation Hardening
Plastic Welding
Optical
Class IIIb, CW Output
Beam Divergence 0.22 NA Nominal
Bandwidth (FWHM) 1-3 nm @ <1000 nm and 10-15 nm @ 1000-1850 nm
Output 0.5 Meter Fiber with SMA905 Termination
Fiber Size 105m core (Multimode)
Electronic
Input Voltage 100-240V AC, 50/60Hz
Modulation DC - 20KHz, TTL
Mechanical
Dimensions 6in x 3in x 10in
Cooling Thermoelectric Cooler with Forced Air
Weight 2.5 lbs
Environmental
Ambient Temperature 10 to 35
o
C
Humidity 5-95%, Non-condensing
Wavelength Available Output Power
635 +/-5nm 0 - 100mW
650 +/-5nm 0 - 150mW
670 +/-5nm 0 - 300mW
690 +/-5nm 0 - 300mW
730 +/-5nm 0 - 300mW
750 +/-5nm 0 - 300mW
785 +/-5nm 0 - 450mW
808 +/-5nm 0 - 450mW
830 +/-5nm 0 - 450mW
860 +/-5nm 0 - 450mW
915 +/-5nm 0 - 450mW
940 +/- 5nm 0 - 450mW
975 +/-5nm 0 - 450mW
1064 +/-10nm 0 - 450mW
1320 +/- 20nm 0 - 250mW
1450 +/- 20nm 0 - 250mW
1550 +/- 20nm 0 - 250mW
1850 +/- 30nm 0 - 250mW
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CleanLaze
The CleanLaze spectrum stabilized laser system is a narrow, spectral linewidth laser
available in both OEM and end-user confgurations. Specifcally suited for Raman
spectroscopy, it ofers a hermetically sealed laser component integrated with a laser and a
driver. The compact, rugged package makes it suitable for various industrial applications.
This laser combines a high brightness fber coupling with a thermoelectric cooler and
TEC controller. Expected lifetime is > 10,000 hours.
The CleanLaze laser series is capable of maintaining a linewidth of less than 0.03nm
(15GHz) in single transverse mode operation at 785nm. The CleanLaze novel cavity
design is capable of maintaining a stable, clean, narrow linewidth source over a wide
range of temperatures and drive currents. The temperature sensitivity of the central
wavelength is as low as 0.01nm/
o
C with a -35
o
C to 50
o
C operating temperature range.
Narrow Linewidth (< 0.03nm)
Power Output from 50mW to 1W
Excellent Spectral and Power Stability
USB Software Interface Available
Features:
Applications:
Specifcations:
Spectrum Stabilized Lasers
Raman Spectroscopy
Metrology, Microscopy, and Holography
Injection Seeding and Pumping
U.S. patent number 7,245,369
Wavelength (nm) 532 +/- 1 785 +/- 0.5 808 +/- 1 830 +/-1 976 +/-1 1064 +/- 1
Minimum Output Power (mW) 15, 40,
80
20, 50,
100
75, 100 50 300,
450
550,
1000
300, 450 450 450
Spatial Mode Mult-
Mode
Single-Mode Multi-Mode
FWHMLinewidth (nm) < 0.03 < 0.3
M
2
- < 1.1 < 2 < 1.1 -
2
(mm) (typical) - 1.0 -
Beam Divergence (mrad) (typical) - < 1.5 2.5 -
Fiber Core Diameter (m) 105 - - 5 105
Fiber Numerical Aperture 0.22 - - 0.13 0.22
Beam Circularity < 1.1:1 < 1.2:1 < 2:1 < 1.1:1
Mode of Operation* CW / Modulated
Long-Term Power Stability (pk-pk) <+/-3%
RMS Noise
20Hz to 10MHz < 0.5%
10MHz to 500MHz < 0.5% < 2.0%
Maximum Bandwidth (kHz) > 20 on/of only > 100
Rise Time (10%to 90%) (sec) < 20 - < 1
Fall time (10%to 90%) (sec) < 20 - < 1
Modulation Depth (extinction ratio) > 100:1
Analog Modulation*
Maximum Bandwidth (kHz) > 1 - > 1
Rise Time (10%to 90%) (sec) < 50 - < 5
Fall time (10%to 90%) (sec) < 50 - < 5
Modulation Depth (extinction ratio) > 100:1 - > 100:1
Polarization Ratio - > 100:1 -
Warm-Up Time (minutes) < 5
Beam Position (mm) - 20 +/- 1 38 +/-1 -
Of-axis Angle (mrad) - < +/-5 -
Pointing Stability (rad/C) - < 10 < 30 -
CDRH Laser Classifcation IIIb IV IIIb
Ambient Temperature (C) 10 - 35
* Optional
For More Details on OEM Confgurations, Contact An Applications Specialist
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BWF-OEM
The BWF-OEM fber coupled, high-power laser diode OEM module is a compact
integrated package containing a laser driver, thermoelectric cooler, TEC
controller and a high-brightness fber pigtailed laser diode. It is available at
various wavelengths and a power output of up to 2 Watts. All components are
sealed in an airtight, extrusion aluminum housing. The module is powered
by 5 VDC, making it convenient for OEM applications. It also provides a TTL
modulation port, which can operate at up to 100 KHz.
6302000 nm Wavelength
Power up to 2 Watts
Narrow Spectral Width (< 3 nm)
Compact, Rugged Package
Convenient 5VDC Input
Available TTL and Analog
Compact Fiber Coupled Laser Module
High Power Industrial Instrumentation
Sensors and Medical Instrumentation
Fluorescence Spectroscopy
Nd/Yb/Er Laser Pumping
BWF-5
BWF-5 is a portable high power diode laser designed for applications
requiring easy operation and fber delivered, high output power at specifed
wavelengths. With a microcontroller and LCD color touch screen, this system
provides intelligent safety features, ease of operation, and programmable
operation settings. The innovative fber calibration port design allowes use
of a variety of fbers and provides well regulated, optimum output power.
The calibration mechanism also alerts operators about degraded or defective
fbers.
Intuitive User Interface
Stand-Alone, Self-Contained Laser System
Custom Form Factors Available
Medical Grade Standards
Features:
Applications:
Medical OEM/OED High Power Diode Laser
Medical
Dental Surgery
Brain Tumor Surgery
Aesthetic Medicine
Endovenous
Laser Therapy
Cardiac Surgery
Incontinence
BPH
Veterinary Medicine
Epiglottic Entrapment
Ventriculocordectomy
Soft Palate Scarifcation
Industrial
Selective Soldering/
De-Soldering
Heat Treating
Transformation
Hardening
Plastic Welding
Biomedical Research
Contact Cutting, Ablation
Coagulation Necrosis
Tissue Welding/Fusion
Laser Hyperthermia
Photodynamic Studies
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BWF 2
The BWF2 series is a compact turnkey fber-coupled laser system providing
up to 30 Watts of continuous power. Combined with a high brightness
fber-coupled laser diode, thermoelectric cooler, power supply and control
electronics, the BWF2 comes in one complete package. The system operates
from standard wall plug line power. The unique design of BWF2 includes
features such as a red aiming beam, multifunctional relay controller for
versatile laser operations, and a remote port for external modulation and
control purposes. Optional features include lens assemblies that can be
attached to the end of a fber with an SMA 905 connector. By using a lens
projection assembly, spots as small as 0.3mm in diameter can be achieved,
providing the user with an intense, non-contact heat source. In addition,
optional control interfaces via TTL or analog ports are available for laser
and aiming power.
Power Delivered by High-brightness Fiber
Stand-alone Self-contained System
Compact Thermoelectric Cooling
635-2000 nm Wavelengths Available
Conversion into OEM System for Qualifed OEM Customer
Features:
Applications:
Specifcations:
High Power Fiber Coupled Laser System
Industrial
Selective Soldering/De-soldering
Heat Treating
Transformation Hardening
Plastic Welding
Medical Research
Contact Cutting, Ablation
Coagulation Necrosis
Tissue Welding/Fusion
Laser Hyperthermia
Photodynamic Studies
Wavelength 635 - 1850 nm
Output Power Up to 30W
Spatial Mode Multi-Mode
FWHMLinewidth 1-3 nm @ <1000 nm and 10-15 nm @ 1000-1850 nm
Fiber Core Diameter 105 - 1000 m Core
Fiber Numerical Aperture 0.22 - 0.4 NA Nominal
Beam Circularity < 1.1:1
Mode of Operation* CW/Modulated
Output Port SMA905
Input Voltage 100-240V AC, 50/60Hz
Dimensions 250mm x 120mm x 320mm
Weight 5-8 lbs
CDRH Laser Classifcation IV
Ambient Temperature 10 - 35C
Aiming Beam (Optional) 650+/-10nm @ >1mW
Control
Front Panel Current Control and Display 0-max
TTL or Analog Ports for Laser Output and Aiming Beam (Optional)
Cooling Thermoelectric Cooler with Internal Fan
Humidity 5-95%, Non-condensing
Accessory (Optional) Collimator Readily Threaded onto SMA 905 Connector (Beam Diameter 6.2mm @
1/e2, f=11.0mm @ NA=0.25)
China B&W Tek has two state-of-the-art
facilities located in Shanghai, both with ISO-
13484 and ISO-9001 certifcations. Our 30,000
square feet of laboratory space is used for
research, development, customization and
testing.
Japan In Saitama, Japan (near Tokyo) B&W
Tek has an ofce with sales and marketing
capabilities, as well as engineering and QA/QC
support. This ofce also manages several major
OEM accounts in addition to multiple channel
partners, including Konica Minolta.
With ofces and distributors in over 18 countries, B&W Teks global
presence makes it easy to get in touch with us, no matter where you are.
France:
Opton Laser International
Phone: +33 (0) 1-69-41-04-05
Web: www.optonlaser.com
Germany:
Polytec GmbH
Phone: +49 (0) 7243-604-0
Web: www.polytec.de
Italy
Madatec srl
Phone: +39-02-36542401
Web: www.madatec.com
Japan:
Konica Minolta Sensing, Inc
Phone: +81 03-3349-5321
Web: www.konicaminolta.jp/instruments
Spain:
Microbeam, S.A.
Phone: +34-93-450-08-75
Web: www.microbeam.es
Global:
Edmund Optics Worldwide
Tel.: +1-800-363-1992
Web: www.edmundoptics.com
Visit our website to view contact information for our worldwide distributors.
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Where can I fnd a B&W Tek location or distributor near me?
United States Our headquarters is located in
Newark, DE, where much of the engineering,
design, and manufacturing for B&W Tek takes
place. This location, along with a second
facility in Delaware and our R&D facility in
Princeton, New Jersey make up half of
our total employees and 40% of our
engineering capabilities.
Europe In Lbeck, Germany (near Hamburg)
B&W Tek has a dedicated sales and marketing
ofce to provide additional support, training,
and materials to all of our current European
customers, as well as to cultivate new sales
channels and customers in Europe.
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Key Distributors:
Copyright 2014 B&W Tek, Inc.
B&W Tek, Corporate Headquarters
19 Shea Way Newark, DE 19713, USA
Phone: +1-302-368-7824
Web: www.bwtek.com
B&W Tek, Europe
Seelandstrae 14-16, 23569 Lbeck, Germany
Phone: +49(0)45130803854
B&W Tek, Japan
2-3-2 7F, Kamiochiai, Chuo-ku, Saitama-city, Saitama - 338-0001, Japan
Phone: +81(0)48 851 3150
B&W Tek, China
Ming Shen Business Plaza
400 CaoBao Rd., Suite 2206, Shanghai - 200233, China
Phone: +86 021-64515208

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