SN54ALS259 . . . J PACKAGE
SN74ALS259 . . . D OR N PACKAGE
(TOP VIEW)
S0
S1
S2
Q0
Q1
Q2
Q3
GND
16
15
14
13
12
11
10
VCC
CLR
G
D
Q7
Q6
Q5
Q4
SN54ALS259 . . . FK PACKAGE
(TOP VIEW)
S1
S0
NC
VCC
CLR
description
These 8-bit addressable latches are designed for
general-purpose storage applications in digital
systems. Specific uses include working registers,
serial-holding registers, and active-high decoders
or demultiplexers. They are multifunctional
devices capable of storing single-line data in eight
addressable latches and being a 1-of-8 decoder or
demultiplexer with active-high outputs.
2 1 20 19
18
17
16
15
S2
Q0
NC
Q1
Q2
14
9 10 11 12 13
G
D
NC
Q7
Q6
Q3
GND
NC
Q4
Q5
OUTPUT OF
ADDRESSED
LATCH
EACH
OTHER
OUTPUT
FUNCTION
Addressable latch
QiO
QiO
QiO
Memory
8-line demultiplexer
Clear
SN54ALS259, SN74ALS259
8-BIT ADDRESSABLE LATCHES
SDAS217A DECEMBER 1982 REVISED DECEMBER 1994
LATCH
ADDRESSED
S2
S1
logic symbol
S0
S1
S2
3
14
G
D
CLR
13
15
8M
0
7
2
G8
Z9
Z10
4
9, 0D
10, 0R
9, 1D
10, 1R
9, 2D
10, 2R
9, 3D
10, 3R
9, 4D
10, 4R
10
9, 5D
10, 5R
11
9, 6D
10, 6R
12
9, 7D
10, 7R
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
SN54ALS259, SN74ALS259
8-BIT ADDRESSABLE LATCHES
SDAS217A DECEMBER 1982 REVISED DECEMBER 1994
14
13
S0
10
Q3
Q4
Q5
11
12
CLR
Q2
S2
Q1
S1
Q0
Q6
Q7
15
SN54ALS259, SN74ALS259
8-BIT ADDRESSABLE LATCHES
SDAS217A DECEMBER 1982 REVISED DECEMBER 1994
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Input voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Operating free-air temperature range, TA: SN54ALS259 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55C to 125C
SN74ALS259 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0C to 70C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65C to 150C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
SN74ALS259
MIN
NOM
MAX
MIN
NOM
MAX
4.5
5.5
4.5
5.5
UNIT
VCC
VIH
Supply voltage
VIL
IOH
0.7
0.8
0.4
0.4
mA
IOL
mA
tw
Pulse duration
tsu
Setup time
th
Hold time
TA
G low
20
10
10
Data before G
20
15
Address before G
20
15
Data after G
Address after G
15
CLR low
55
125
V
V
ns
ns
ns
70
TEST CONDITIONS
VCC = 4.5 V,
VCC = 4.5 V to 5.5 V,
II = 18 mA
IOH = 0.4 mA
VOL
VCC = 4 5 V
4.5
IOL = 4 mA
IOL = 8 mA
II
IIH
VCC = 5.5 V,
VCC = 5.5 V,
VI = 7 V
VI = 2.7 V
IIL
IO
VCC = 5.5 V,
VCC = 5.5 V,
VI = 0.4 V
VO = 2.25 V
SN54ALS259
TYP
MAX
MIN
SN74ALS259
TYP
MAX
MIN
1.5
VCC 2
1.5
VCC 2
0.25
0.4
V
V
0.25
0.4
0.35
0.1
UNIT
0.5
0.1
V
mA
20
20
20
0.1
0.1
mA
112
mA
112
30
ICC
VCC = 5.5 V
14
22
14
22
mA
All typical values are at VCC = 5 V, TA = 25C.
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
SN54ALS259, SN74ALS259
8-BIT ADDRESSABLE LATCHES
SDAS217A DECEMBER 1982 REVISED DECEMBER 1994
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
tPHL
tPLH
tPHL
tPLH
tPHL
tPLH
CLR
Any Q
Data
Any Q
Address
Any Q
Execute
Any Q
MAX
MIN
MAX
15
12
22
19
15
12
26
22
15
12
22
20
13
tPHL
2
16
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
UNIT
ns
ns
ns
ns
SN54ALS259, SN74ALS259
8-BIT ADDRESSABLE LATCHES
SDAS217A DECEMBER 1982 REVISED DECEMBER 1994
VCC
S1
RL
R1
Test
Point
From Output
Under Test
CL
(see Note A)
From Output
Under Test
RL
Test
Point
From Output
Under Test
CL
(see Note A)
CL
(see Note A)
LOAD CIRCUIT
FOR OPEN-COLLECTOR OUTPUTS
3.5 V
Timing
Input
Test
Point
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
3.5 V
High-Level
Pulse
1.3 V
R2
1.3 V
1.3 V
0.3 V
0.3 V
Data
Input
tw
th
tsu
3.5 V
1.3 V
3.5 V
Low-Level
Pulse
1.3 V
0.3 V
1.3 V
0.3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATIONS
3.5 V
Output
Control
(low-level
enabling)
1.3 V
1.3 V
0.3 V
tPZL
Waveform 1
S1 Closed
(see Note B)
tPLZ
[3.5 V
1.3 V
tPHZ
tPZH
Waveform 2
S1 Open
(see Note B)
1.3 V
VOL
0.3 V
VOH
1.3 V
0.3 V
[0 V
3.5 V
1.3 V
Input
1.3 V
0.3 V
tPHL
tPLH
VOH
In-Phase
Output
1.3 V
1.3 V
VOL
tPLH
tPHL
VOH
Out-of-Phase
Output
(see Note C)
1.3 V
1.3 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
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