1 23
1 23
Received: 1 February 2013 / Accepted: 5 April 2013 / Published online: 18 April 2013
Springer Science+Business Media New York 2013
123
1 Introduction
In electronic industry, solders are important materials
because they provide both the electrical connections and
mechanical response between integrated circuit devices
and the substrate [1]. The strength of solder joints is
affected by thermal stability of the solder alloys. They must
have long-term reliability under extreme conditions; particularly at relatively high working temperatures. During
the past seven decades, eutectic and near eutectic PbSn
solders have been used as the principal joining materials
because of their low cost, low melting point (183 C), good
solderability and good mechanical properties [25]. PbSn
solders are also highly compatible with electronics assembly
processes and can form stable joints that are usable under a
wide variety of service environments [25]. Because of its
hazardous nature to health and the environment and with
arrival of legislative restriction on the use of lead solders by
European Union, restricting the usage of lead solder alloys
has now become a reality [2].
Motivated by the above reasons, nowadays, with device
miniaturization and high performance demands in Microsystems, it has become very significant to improve properties
and reliability of lead-free solder joints [1]. An attractive and
potentially available method of enhancing solder joint is
carried out by adding reinforcements (third and fourth elements) to solder alloys, to form a composite solder. The
reinforcing particles should have suppressing effect for grainboundary sliding, large intermetallic compound formation,
and suppresses also the grain growth, thereby causing the
stress in the solder joints to be distributed uniformly. In this
way the solder joint could provide better reliability with
improved thermal stability of the microstructure [2].
Conventional SnAgCu (SAC) solder alloys are considered to be one of the best lead-free alloy systems. The
2 Experimental procedures
A Lead-free solder, Sn3.5 wt%Ag0.5 wt%Cu (SAC355)
solder alloy, is prepared from Sn, Ag and Cu ingots of
99.99 % purity. SAC355 lead free composite solder was
prepared by mechanically mixing 0.5 wt% of nano-sized
ZnO particles into the prepared conventional SAC355 lead
free solder with subsequent remelting in a vacuum furnace
3211
123
20
(a)
SAC
0
-20
-40
o
221.18 C (494.18 K)
-60
20
150 160 170 180 190 200 210 220 230 240 250 260 270 280 290
(b)300
SAC+ZnO
0
-20
-40
o
222.26 C (495.26 K)
-60
160
180
200
220
240
260
280
300
Temperature (C )
123
nano-sized
ZnO
(104)
(202)
(201)
(200)
(103)
(110)
(102)
(100)
(002)
3213
(101)
2 Theta
(b)
123
(a)
(b)
particle sizes in the composite solder (reinforced) compared to the SAC355 (un-reinforced) solder one. The
relationship between rUTS and the strain rates (_e) for both
alloys can be expressed by the equation [17, 18]:
rUTS C _em
where C is a constant, e_ is the strain rate and m is the strain
rate sensitivity index. Values of m describe the capacity
of the material for necking resistance [18]. These values of
the index m can be obtained from the loglog relation of
the strain rate (_e) and the ultimate tensile stress (rUTS). The
mean value of m for the SAC355 composite solder was
found to be slightly higher than that in the SAC355 solder
indicating higher resistance for necking. This may be
attributed to its finer microstructure which allow for more
interaction between dislocations that created during
deformation and the fine IMC particles beside the nanosized ZnO particles.
The similar variation of ry0.2 with testing temperature
and strain rate on can be understood by considering the
deformation as stress assisted and thermally activated
process. Hence, at high strain rates and low testing
Fig. 4 SEM micrographs for the whole surface of: a SAC355 solder and their corresponding EDS curve and b SAC composite solder and their
EDS curve
123
3215
(a)
Cu6Sn5
Ag3Sn
(b)
- Sn
Fig. 5 SEM micrographs showing the IMCs and the corresponding EDS curves in a SAC355 solder and b SAC355 composite solder alloys
123
(a)
Stress (MPa)
(3)
(3)
(2)
40
(2)
(1)
(1)
-1
(sec ):
(1):
(2):
(3):
(4):
(4)
(4)
50
T testing = 298 K
-4
1.7 x10
-4
3.8 x10
-4
7.4 x10
-3
1 x10
30
20
10
0
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
Strain
(b)
60
-4
=7.4 x10
-1
sec
(1)
(1)
50
Stress (MPa)
(2)
40
Testing temperature:
(1): 298 K
(2): 323 K
(3): 348 K
(4): 373 K
(2)
(3)
(3)
(4)
30
(4)
20
10
0
0.00
0.05
0.10
0.15
0.20
0.25
0.30
Strain
60
298 K
55
323 K
UTS (MPa)
50
45
348 K
40
373 K
35
30
25
0.0002
0.0004
0.0006
.
0.0008
0.0010
0.0012
-1
(Sec )
Fig. 7 Relation between the strain rate e_ and ultimate tensile strength
(rUTS) for both SAC355 (solid lines) and SAC355 composite solder
alloys (dashed lines)
123
3217
1.7 x10
-4
3.8 x10
-4
7.4 x10
-3
1 x10
(MPa)
3.9
UTS
4 Conclusions
Effect of nano-sized ZnO particles on thermal, microstructure and tensile properties of Sn3.5 wt% Ag
0.5 wt% Cu (SAC355) solder alloy was studied. Some
important conclusions are summarized as follows:
-4
4.0
Ln
-1
(sec ):
3.8
1.
2.
3.7
3.6
3.5
3.
3.4
Q= 0.57 eV
3.3
4.
0.29
0.30
0.31
0.32
0.33
0.34
0.35
0.36
0.37
0.38
-1
1000/T (K )
Fig. 8 Relation between LnrUTS and (1000/T (K)) for both SAC355
(solid lines) and SAC355 composite solder alloys (dashed lines)
5.
123
consistent with the conditions of usage for conventional SAC solder alloys and to overcome the serious
problem of the excessive growth of IMCs and the
formation of microvoids in the SAC Pb-free solder
alloys.
References
1. F. Tai, F. Guo, Z.D. Xia, Y.P. Lei, Y.W. Shi, J. Mater. Sci. Mater.
El 21, 702 (2010)
2. C. Han, Q. Liu, D.G. Ivey, Mat. Sci. Eng. B-Struct 164, 172
(2009)
3. K. Suganuma, Advances in lead-free electronics soldering. Curr.
Opin. Solid State Mater. Sci. 5, 55 (2001)
4. K.J. Puttlitz, K.A. Stalter, Handbook of lead-free solder technology for microelectronic assemblies (Marcel Dekker Inc., New
York, 2004)
5. E. Cadrl, H. Kaya, M. S ahin, J. Electron. Mater. 40, 1903 (2011)
6. F.X. Chea, W.H. Zhu, Edith.S.W. Poh, X.W. Zhang, X.R. Zhang,
J. Alloy. Compd. 507, 215 (2010)
7. Z.B. Luo, J. Zhao, Y.J. Gao, L. Wang, J. Alloy. Compd. 500, 39
(2010)
8. H. Mavori, S. Jin, J. Electron. Mater. 27, 1216 (1998)
9. L.C. Tsao, S.Y. Chang, Mater. Design 31, 990 (2010)
10. L.C. Tsao, S.Y. Chang, C.I. Lee, W.H. Sun, C.H. Huang, Mater.
Design 31, 4831 (2010)
123