663

IEEE Transactions on Power Delivery, Vol. 11, No. 2, April 1996

STUDY ON DETECTION FOR THE DEFECTS OF XLPE CABLE LINES
Katsumi Uchida
Shin'ichi Kobayashi
Taka0 Kawashima
Chubu Electric Power Co., Inc.
Nagoya, Japan

Hideo Tanaka
Susumu Sakuma

Ken'ichi Hirotsu
Hitoshi Inoue
Sumitomo Electric Industries, Ltd.
Osaka, Japan

'Ihe Furukwa Electric Co., Ltd.

Tokyo, Japan

Abstract
This paper is a report on the results of a basic study of testing
methods to replace the dc after laying test that is presently most frequently used
as an after laying test for XLPE cable lines. Chosen as the alternative
waveforms for dc voltage were damped oscillating wave (OSW) and very-lowfrequency wave (VLF)voltage. Experiments were conducted on the ability to
detect various types of lme defects under these voltages. It was found that
these alternative waveforms are promising as after laying te'st voltage
waveforms to replace dc and that greater defect detection ability can be
achieved by combining them when conducting tests.

contaminants in the insulation, protrusions in the semiconductor layerinsulation interface, and external damage to the insulation wife cuts).
Sealing end breakdown

Cable breakedown
(9.3%)

Joint breakdown
Joint
breakdown

Cable breakdown

L INTRODUCTION
After laying tests are essential to verify the soundness of an XLPE cable
long-distance line, including its joints, after the lme has been laid. After laying
tests are generally done using dc voltage. With dc voltage, the pwwer source
for testing is compact, the test can be easily carried out, and fiied results are
obtained even with a dc after laying test.
But the electric field distribution within the insulation when a dc voltage is
applied is different from when an ac voltage is applied. There has therefore
been some doubt as to whether the defects that occur in a lme when the
operation voltage is applied can be efficiently detected by appllying a dc
voltage.[l] Concern has also been expressed that a perfectly good XLPE cable
might be damaged if a dc voltage is applied to it.[2] In addition there is a
demand for the development of testing methods to replace the dc after laying
test and provide improved screening ability.
From the standpoint of applying the same type of voltage as the operation
voltage, it is desirable to apply a commercial-frequency ac voltage.[3] But this
would require a large-capacity testing transformer, and such testing would not
be easy to carry out.
The authors, tuming to damped oscillating wave (OSW) andl very-lowfrequency (VLF)voltage,[4] carried out a study by model experiments to
determine whether the various defects that occur in XLPE cable lines can be
detected by tests using such voltages.
In this research we abstracted and modeled the defects in XLPlE cable and
its various types of joints, determined the insulation breakdown voltage by
OSW and VLF of samples of them, and compared the results with the
characteristics obtained by ac and dc voltages.
As a result, it was revealed that there exist specific types of defect that can
be better detected by either OSW or VLF and that the defect detection ability
can be improved by combining both waveforms.

II.

DEFECTS

AND

MODELING OF XLF'E CABLE AND VARIOUS

TYPES OF JOINTS

a Types of joints and defects

The defects that occur when a line is laid often occur mainly ]in the joints
and sealing ends of the XLPE cable line. Figure 1 presents a statistical
summary of the state of insulation breakdown in XLPE cable lines ]in the 66- to
77-kV class. These joints and sealing ends can be divided into the following
two broad categories.

Premold-type joints: As shown in Figure 2, these consist of a stress relief

cone made of rubber used for buffering the electric field of the lioint, and an
epoxy unit used for the material for a sealing end. Among the defects
associated with construction are the voids, contaminants, insufficient
compression, and water that is found in the interface between these
dissimilar insulators, the rubber-epoxy interface, and the rubber-XLPE
interface.
Mold-type and tape-wound-type joints: As shown in Figure 3, the
reinforcing insulation consists of material of the same type as the XLPE
cable insulation. Among the defects associated with construction are
95 SM 490-3 PWRD
A paper recommended and approved
by the IEEE Insulated Conductors Committee of the
IEEE Power Engineering Society for presentatlon at
the 1995 IEEE/PES Summer Meeting, July 23-27, 1995,
Portland, OR. Manuscript submitted December 28, 1994;
made available for printing April 2 1 , 1995.

Fig. 1. Statistics on breakdown in 66- to 77-kV-class lines

Rubber-epoxy interface

Rubber-XLPE interface
Fig. 2. Example of cross-sectional view of a premold-type joint

Fig. 3. Example of cross-sectional view of mold-type, tape-wound-type joint

In the XLPE cable itself we can also have contaminants in the insulation,
semiconductor layer protrusions, and external damage to the insulation. But
because contaminants and protrusions are tested for when the cable is shipped
from thefactory, we need consider only external damage as a defect that can
occur during construction.
b. Selection of defects
A selection of types of defects to consider was made based on the above
classifications. In making the selection, by preliminary tests we considered
that they are defects that can occur during construction and that their
occurrence is harmful, and we studied their size and types. As a result, the
defects selected for study are as listed in Table 1.

Table 1. Types of defects selected

Rubber-epoxy interface

Rubber-epoxy interface

XLPE insulation

Closed void
Conductive contaminant
Insulating contaminant
Water
Conductive contaminant
Insufficient compression of interface
(Knife) cut in cable insulation
Conductive contaminant
Insulating contaminant
Conductive protrusion

In the foregoing, we devised a model constructed so as to make it possible

to test in the laboratory the types of defects that can occur in the selected XLPE
cable lines, and we tested the model in experiments.

0885-8977/96/$05.00 0 1995 IEEE

664

Interfacedefects

XLPE insulation defect

Insulauon
shielding
layer
ion

Ddfect

Gm

Closed void
Conductive Contaminant
Insulating contammant

Conducta
miv)

Conductive contaminant
Insufficient compression of interface
Water

Conducnve prormsion

III. HIGH-VOLTAGE GENERATORS FOR ALTEWATWE

WAVEFORMS

(Knife) cut in cable mulation

Conductive contaminant
Insulaung contaminant

the device is given in Figure 8, the generated waveform is shown in Figure 9,

and a picture ofthe device appears in Figure 10.

For the altemative waveform generators to replace dc, OSW and VLF were
selected, in consideration of the results seen in various literature as well as
applicability to cable power transmission lines. These voltage generators were
developed for laboratory use and were used in experiments.

Damped oscillating wave generator

In an after laying test, it is important that a uniform voltage waveform be

applied along the entire length of the line. We studied the results obtained in
various countries,[4],[5] and keeping in mind that reflection at the sealing end
does not pose a problem in long-distance lines of about 10 km length, we
developed a generator having the following specifications. The OSW that can
be generated with this device is a type in which there is no dc prestress. The
basic specifications are listed in Table 2, the circuit is diagramed in Figure 5,
the generated waveform is shown in Figure 6, and a picture of the device
appears in Figure 7.

1 :;.

Table 2. Specifications for damped oscillating wave generator

Oscillation frequency
Constant during damping
Maximum output

about 170 kV

Fig. 7. Appearance of damped oscillating wavegenerator

WOOMR ZWOMR

Table 3. Specifications for very-low-frequency wave generator

0 Out put

I 0.1 Hz

Oseiuation frequency
Generated waveform

I Triangular wave (sine wave is also possible)

Maxi" outout
1 200kV
M&k" load canacitance I 5000 OF

+ DC

Out put E

Fig. 5. Circuit diagram of damped oscillating wave generator

500 ps

775-

Fig. 8. Block diagram of very-low-frequency wave generator

......... ....................

...

......................

..........................

. .. !
:
;
;
!
,
,
i_l,.-i_..-i: : ; ; .... :. :.........j. ,
... ...
I......... :.........i....... i.......?+Ab!>
..

..;.....a

..

,,

.................
.

,.

....

'

/'

Here 0.1 Hz was selected as the frequency for the very-low-frequency

voltage. The waveforms that suggest themselves include a sine wave,
triangular wave, quasi-triangular wave, and rectangular wave. A triangular
wave was selected as the very-low-frequency wave for this research because a
quasi-triangular wave can be generated relatively easily by RC charging and
discharging. The basic specifications are listed in Table 3, a block diagram of

.......

.......

Fig. 6. Waveform of damped oscillating wave

b. Very-low-frequency voltage generator

.......

......
.............. .......
............... .........
,
.
. . .. : :. :. ;. :.
;........i.......;...... ...... .......i......:.......;.......... ....... i
: ; ! ; : : : $
,,
..
i.:...... .:,...___
:. J!.......i;.......i..:........I.:.......;:.'.......i;'........................,,, ...
..
..
, , . . . ,
:

................ I

.: :

....:
/

...:...... :.......: ......:. . .................I

......j

Fig. 9. Waveform of very-low-frequency voltage

665
1) The voltage class considered is 77 kV.
2) A defect is defined as one that leads to breakdown of the line within two
years of its start of operation.
3) The ac breakdown voltage at the after laying test time equivalent to (2
years/operation voltage) is calculated according to the inverse power law.
When this is done, the characteristic l i e exponent n for each type of defect
is used.
4) The after laying test voltage for each waveform is set to the above voltage
multiplied by the breakdown voltage ratio of each waveform with respect
to ac that is shown in Figure 11.

VT : ac test voltage

log

Fig. 10. Appearance of very-low-frequency wave generator

Vo: m a t i o n voltaEe

IV. BREAKDOWN VOLTAGE CHARACTERISTICS BY VARIOUS

VOLTAGE WAVEFORMS

a Number of samples and test outline for breakdown tests

Breakdown tests by ac, dc, OSW, and VLF voltage were carried out for the
models described above. The test quantities chosen were 6 samples per model
for ac, and 5 samples per model for the other wavefom. In consideration of
actual after laying test conditions, the voltage was incremented every 10
minutes for ac, dc, and VLF, and for OSW the voltage was applied once per
step. The voltage was innemented until sample breakdown or until the
. maximum output voltage of the power source used for testing.

logt
Time

IT

2years

'ITa,,: alternaave waveform test voltage

k : breakdown voltage raho of altemaave waveform with respect to ac

Fig. 12. After laying test voltage calculation method by alternative waveform
Life exponent n for each type of defect

b. Experimental results

b.

The following is a summary of the results of breakdown tests conducted

for the four voltage waveforms. Because the experiments are done by
modeling, the breakdown voltage varies depending on the size of the model
and the size of the given type of defect. Therefore the ratio of the breakdown
voltage of each model is important as a characteristic value depending on
differences in the voltage waveform.
Accordingly, the experimental results were evaluated as the ratio of each
type of breakdown voltage to the ac breakdown voltage. The resdlts are given
in Table 4 and Figure 11. For dc, the breakdown voltage ratio was corrected in
consideration of differences in the dc electric field distribution between the
model and the actual device.

The l i e exponent n for each type of defect listed in Table 1 was

determined in order to make a conversion to the equivalent voltage in ac
voltage. Where such values are clear from the literature, those values were
used. When not clear, they were determined through experiment.

Table 4. Ratio of dc, OSW, and VLF breakdown voltage with respect to
ac voltage, for defects of various types
Insulation

BD voltage ratio

Type of defect

Closed void
Conductive contaminant
Insulating contaminant
Water
Conductive contaminant
Insufficient compression of interface
(Knife) cut in cable insulation
XLPE
Conductive contaminant
Insulation Insulating contaminant
Conductive protrusion
RubberXLPE
Interface
Rubber
-Epoxy
Interface

Closed Void

dc
4.7
2.0
1.1
2.7
2.5
3.0
2.8
2.1
1.4

VLF OSW
5.0
1.9

2.2
1.0

2.0
1.1
0.9
1.6
0.9
1.3
2.1

1.9

2.6

1.0

1.5
1.4

I
I 1.1 I
I 3.1 I 1.1 1

1) Results for literature search: For rubber-XLPE interface closed voids,

rubber-epoxy interface conductive contaminants, and knife cuts in the
XLPE insulation, a life exponent of n=9[6] was adopted, with the idea of
applying the void discharge degradation by causing void discharge in each
case. For semiconductive protrusions and conductive contaminants in the
XLPE insulation, the literature[7] reports n=22-25. Thus, to be on the safe
side, a value of n=20 was adopted. For fiber contaminants in the XLPE
insulation, n=9 was taken, following literature reference [SI.
2) Experimental results: Values were determined by experiments for
conductive contaminants and insulating contaminants in the rubber-XLPE
insulation and for insufficient interface compression and water in the
rubber-epoxy interface. Three levels of voltage were selected for each type
of defect, and long-term tests were carried out on five samples each. The
results are given in Figures 13 and 14.

1.5
2.0

30'

' ' --!

io-'

ioo

'

luUvl

io'

~ 3 - t

io2

lo3

- - , c r J

io4

Tiine until breakdown {hours]

DC -VLF

OW

Fig. 13. V-t characteristics of contaminants and insulating contaminants

in rubber-XLPE interface conductive
&
.

-..

'

'"

x,e*~
I F 9 4 A.Water
'
Compression of VF

Fig. 11. Ratio of dc, OSW, and VLF breakdown voltage with
respect to ac voltage, for defects of various types
V. CALCULATION O F AIiTER LAYING TEST VOLTAGE BY
ALTERNATIVE WAVEFORM
a

Approach

The after laying test voltage by alternative waveform is calculated

according to the following approach. This is shown in Figure 12as well.

Time until breakdown [hours]

Fig. 14. V-t characteristics of insufficient interface compression and water
in rubber-epoxy interface

666
VI. CONSlDERATION OF EXPERTMENTAL RESULTS
Rubber-XLPE
interface

Conductive contaminant
Insufficient compression of interface
(Knife) cuts in the cable insulation
Conductive contaminant
Insulating contaminant
Conductive protrusion

insulation

c.

9
16
17

Closed void
Conductive contaminant
Insulating contaminant

20
20

Results of test voltage calculation

Based on the above considerations, a calculation was made of the voltage

that would allow screening of defects that would cause breakdown within two
years of start of operation. The results are presented in Figure 15and Table 6.

Insulating
Contaminant

i
I

Cutm Cable
Insulahon

veforms

The resuIts of calculation of after laying tests by 4 voltage waveforms are

summarized as follows.
1) dc breakdown characteristics: Except for insulating impurities, for dc a
high voltage must be applied in order to detect defects. This indicates that
the defect detection ability of dc is low.
2) OSW breakdown characteristics: For OSW the test voltage is relatively
close to ac, and it is thought to be able to detect defects of various types
with good balance. It is found to be particularly good for the detection of
various interface defects. On the other hand, its test level with respect to
impurities m XLPE and knife cuts is about the same as dc.
3) VLF breakdown characteristics: VLF offers superior ability to detect
defects in XLPE insulation. But ifs ability to detect various types of
interface defects is not very high. In particular, its test level is about the
same as dc for rubber-XLPE interface defects.
As seen from the foregoing, dc has only inadequate ability for detecting
defects.
OSW and VLF differ in the types of defects that they can detect well.
l3us OSW and VLF are in a complementary relationship with each other
concerning their ability to detect defects. This suggests that the ability to detect
defects might be further improved by tests in which both voltage waveforms
are combined.

Insulating
Contaminant

b. Voltage waveforms and breakdown mechanism

It was fomd that depending on the specific voltage waveform applied,
there are specific Characteristics to the ability to screen for defects. The
mechanism by which these characteristics arise were considered in relation to
the breakdown mechanism.

Water1

a Screening of defects by various

1) The pattern of the breakdown process: It was confirmed that various

interface defects and knife cuts in the XLPE insulation indicate a condition
in which void discharge occurs and breakdown takes place. This is based
on the fact that with ac and VLF, a steady partial discharge occurs at a
voltage that is lower than the insulation breakdown voltage. With the other
defects, the amount of discharge tended to increase rapidly, leading to
breakdown, simultaneously with the occurrence of partial discharge.
The breakdown process with each type of defect is thought to be
divided into the following WObroad pattems.

1
Insufficient
Compression ofI/F

Fig. 15, Results of calculation of after laying test voltage according to

alternative waveform
Table 6. Results of calculation of after laying test voltage according to
alternative waveform

2) Relationship between tree inception and propagation and the applied

voltage waveform: The following knowledge has been gained conceming
the effect of the waveform of the applied voltage on the initiation and
propagation of the electric tree.
&actors for acceleration of electric tree initiation>

- Frequency is high,[9] and change of voltage waveform with respect to

time (dV/dt) is large[lO]

- When the space charge accumulation in the vicinity of the defect and the
polarity reversal are superimposed[ll]
*acton for acceleration of electric tree propagaiion>
- Frequency is high,[9] and the voltage with dV/dt is applied for a long
time
- The gas pressure inside the tree pipe does not readily increase.[ll]
Table 7 summarizes the above characteristics for dc, OSW, and VLF.

<Type I>

Each type of interface defect model, XLPE insulatton external damage defects: easy to detect with OSW
and propagation

<Type 2>

XLPE insulation conductive contaminants, insulating contaminants, semiconductlve protrusions: easy to detect with VLF

+
Fig. 16.

Electnc tree mception and propagauon

Insulahon breakdown process classified by type

667
Table 7. Various voltage waveforms and tree inception and propagation

Polarity
reversal
dc
Osw

0:
excellent
c.

no
yes
yes

Electric tree
inception
I

Waveform Electric tree

holding time propagation

long

I.

0 1
large
A
I
smd
x : inferior A: intermediate

short
long

I.

n
0

Voltage waveform and breakdown mechanism

From the above considerations, the differences in defect detection ability

according to applied voltage waveform are explained using Figure 17, which
shows the typical breakdown process of type 1,which is characterized by void
discharge, and of type 2, which is characterized by the direct inception of a
electric tree.

1) Type 1: At V W voltage, void discharge takes place continuously from

low voltage. But because the dV/dt is small, the electric tree conversion is
slow. On the other hand, with OSW the dV/dt is large, so the charge with
void discharge concentrates in the void ends. Here the irise of the
waveform resembles an impulse voltage, and this is thought to be similar to
the phenomenon in the impulse breakdown process.[l2] And with OSW,
because there is polarity reversal, conversion takes place from low voltage
to a electric tree.
2) Type 2 The initiation of an electric tree with VLF is slow. But once the
tree gets started, it propagates quickly, so breakdown is reached at a
relatively low voltage. With OSW, on the other hand, although the tree
initiation voltage is low, the tree propagation every time voltage is applied
is short. Thus some time (voltage steps) is needed until breakdown is
reached, and the breakdown voltage is high.
Tree Inception

Tree hopagation

propagate, leading to breakdown. This should make it possible to screen for

defects at a lower voltage than would be required with either single waveform.
The results of breakdown voltage reduction by this combination were
verified using block-type test samples.

a Experimental method
The discussion thus far predicts that the tree inception and propagation
properties of OSW and VLF should be different between type 1, which is
characterized by void discharge, and type 2, which is characterized by the
direct inception uf a electric tree. Samples representing these two types of
defects were tested in an experiment. They are shown in Figure 18.

c.:;

(b) Type 2 (electric tree type) sample

(a) Type 1 (void type) sample

Metal tree needle

Semiconductive
electrode

0.5 m m

Electrode tip radius : 5pm

: 05"
Void length
: 0.5 mm
Gap length

Electrode tip radius : 1Fm

Gap length
: lmm

Fig. 18. Block samples for basic study of combination test method
The content of the experiment is as follows.

VLF

o s w b
I

BD

<Type 1> + Breakdown voltage

Tree Inception Tree Propagation

1) Measurement of the tree inception and breakdown voltage individually for

OSW and VLF
2) Measurement of the tree repropagation voltage and breakdown voltage
with VLF of samples in which tree inception is initiated by OSW

In this way, an evaluation was made of the (tree inception voltageisingle

breakdown voltage) with OSW, and the (tree repropagation starting
voltage/single breakdown voltage) and (breakdown voltage after
repropagation/single breakdown voltage) with VLF.
b. Experimental results

<Type 2>
Fig. 17.

Breakdown voltage

Breakdown process by damped oscillatingwave and very-lowfrequency voltage

The experimental results are shown in Figure 19.

Electric tree type sairiples

Void discharge type samples

The above mechanism can explain qualitatively the characteristic

breakdown properties according to OSW and VLF.
d. Summary

As described above, it has become clear that OSW and VLF voltage
selected as an altemative waveform for dc voltage exhibits better properties
than dc for the ability to detect defects. This shows that these voltage
waveforms hold promise as alternative test waveforms in dc after laying tests.
Moreover, it has been shown that the breakdown characteristics of both
alternative waveforms are in a mutually complementary relationship for
detecting defects. This suggests that the defect screening ability can be further
improved by after laying tests that combine both waveforms.
Keeping in mind tests on actual lines, it is very desirable to be able to
detect defects with as low a voltage as possible. In this sense, considering
applicability to actual lines, by taking full advantage of the properties of both
waveforms it should be possible to come up with a method for aftex laying tests
that is just better than a dc after laying test but even rivals an ac after laying
test.

VLF

The above considerations suggest a testing method that makes use of the
tree inception properties of OSW and the tree propagation properties of VLF.
This is a method in which a tree is initiated at low voltage by applying an OSW
voltage, and then, by applying VLF, at low voltage the tree is made to

OSW
t

0 : tree

VII. BASIC 5 v " Y OB AFTER LAYING TEST METHOD

COMBINING DAMPED OSCILLATING WAVE AND VERY-LOWFREQUENCY WAVE

OSW

VLF OSW

VLF
m: breakdown voltage

inception vohage
0 : lree repropagation voltage

OS+W

VLF

U: breakdown voltage after repropagation

Fig. 19. OSW, VLF combination test: results of basic experiment

Summarizing these results, we have the following.
1) When only OSW is applied, with both models the tree inception voltage is
much lower than the breakdown voltage.

668
2) When only VLF is applied, with both models, breakdown is reached
shortly after electric tree inception, so the tree inception voltage and the
breakdown voltage agree.
3) In samples in which the electric tree was initiated with the application of
OSW, the voltage from tree repropagation to breakdown with VLF is much
lower than the breakdown voltage with VLF alone.
Thus it has been confirmed that in a test that combines OSW and VLF,
breakdown can be made to occur at a lower voltage than with either applied
singly. This suggests that a test that combines both waveforms comports with
general principles and is desirable. At present, verification experiments on this
point are being carried out using a model that closely resembles actual cable.
Areport on this work is to be presented on another occasion.

VIII. SUMMARY
a

Conclusions
The following has been learned as a result of above experiments and study.

1) A technique has been established for abstracting, modeling, and conducting

experiments on the defects thought to occur in XLPE cable lines.
2) The breakdown properties of the above samples were investigated with
respect to ac, dc, OSW, and VLF voltage. As a result, it was learned that
the detection of defects with dc voltage requires a higher voltage than with
ac, and that the detection of defects with OSW 01 VLF voltage can be done
at a lower voltage than with dc.
3) OSW has a high capability of detecting defects that cause void discharge
type breakdown. VLF has a high capability of detecting defects that cause
electrictree direct inception type breakdown. Thus it has been leamed that
the two waveforms are in a complementary relationship with respect to
defect detection capability.
4) It has further been shown that defect detection capability is further
enhanced by combining the two waveforms of OSW and VLF.
b. TasksAhead
On the basis of the results of the present study we will undertake the
following tasks.

BIOGRAPHY
Katsumi Uchida was bom in Aichi, Japan, on
November 18,1963. He received the B.E., M.E. and
Ph D degrees from Nagoya University in 1986, 1988
and 1992 respectively. He joined Chubu Electric
Power Co., Inc. in 1988. He has been engaged in
research on under ground power transmission lines.
Dr. Uchida is a member of Institute of Electrical
Engineers of Japan (IEH).
Shinichi Kobayashi was bom in Nagano, Japan, on
June 2,1966. He rceived the B.E. degree in electrical
and computer engineeringfrom Yokohama National
University, Japan in 1989. He joined Chubu Electric
Power Co.,Inc. in 1989. He has been engaged in
constructionand research on the underground power
transmission lines. Mr. Kobayashi is a member of

IFEJ.
Taka0 Kawashima was bom in Aichi, Japan, on
January 6, 1947. He received the B.E. degree in
electrical engineering from Nagoya Institute of
Technology, Japan in 1969. He joined Chubu
Electric Power Co., Inc. in 1969. He has been
engaged in construction and research on transmission
lies. Mr. Kawashima is a member of IEEJ.

Hideo Tanaka was bom in Tokyo, Japan, on

October 21, 1963. He received the B.E. and M.E.
degee in electrical engineering from Tokyo
University, Japan in 1986 and 1988, respectively. He
joined The Fumkawa Electric Co, Ltd. in 1988. He
has been engaged in research on testing method of
XLPE cables and development of 500 kV XLPE
cables. Mr. Tanaka is a member of IEEJ.

1) Verificationby cable model of the effects of combining OSW and VLF

2) Development of a small, lightweight OSW, VLF generator that can be used

on site
3) Determination of the after laying test conditions to be applied to actual
lies

E.REFERENCE
[l] W. Kalkner, R. Bach, R. Platch, Zhiyong. Investigation of alternative
after laying test for MV cables,Jicable, B. 3. 2, 1994.
[2] G. S. Eager Jr., B. Fryszczyn, C. Katz, H. A. Elabadaly, A. R Jean.
Effect of DC testing on water tree deteriorated cable and preliminary
evaluation of V.L.F as alternative, IEEE T&D Conference, 1991.
[3] M. Ogino et al. Recent development in Japan of insulation diagnostic
technology for extra-high voltage XLPE cable lines, CIGRE, 21-103,
1994.
[4] H. Auclair, W. Boone, M. S . Papadopulous. Development of a new
after laying test method for high voltage power cable systems, CIGRE,
21-06, 1988..
[5] C. Aucourt, W. Boone, W. Kalkner, R.D. Naybour, F. Ombello.
Recommendation for a new after laying test method for high voltage
extruded cable systems, CIGRE, Session 21-105, 1990..
[6] F. H. Kreuger. Endurance tests with polyethylene insulated cable,
CIGRE, 21-02, 1968.
171
. _R. Jocteur et al. Research and develoument in France in the field of
extruded polyethylene insulated high voltage cables, CIGRE, 21-07,
1972.
[SI Tsuchiya et al, National convention of IEEJ (Institute of Electrical
Engineers of Japan) paper No. 1549,1994 (in Japanese).
[9] IEEJ Technical Report part I No. 100 (in Japanese).
[lo] IEET Technical Report part I1 No. 237 (in Japanese).
[ll] P. Gonefeld et al, 5th ISH 21. 10, 1987.
[12] Yasui et al, Transactions of the IEEJ vol. 90, No. 1, 1970 (iJapanese).

Susumu Sakuma was born in Tokyo, Japan, on

February 8, 1954. He received the B.E. degree in
electrical engineering from Tokyo University, Japan
in 1977. He joined The Furukawa Electric Co., Ltd.
in 1977. He has been engaged in design, research and
development of EHV cables, their accessories and
their forced cooling systems. Mr. Sakuma is a
member of the IEEJ, IEEE and CIGRE WG. 21-04.
Kenichi Hirotsu was born in Kyoto, Japan, on
August 17, 1959. He received the B.E. and M.E.
degrees from Kyoto University, Japan and the Ph. D.
degree from Georgia Institute of Technology all in
Electrical Engineering in 1982, 1984 and 1993
respectively. He joined Sumitomo Electric Industries,
Ltd. in 1984. He has been engaged in development of
EHV XLPE cables and their accessories, testing
method, diagnosis method and application of neural
networks. Dr. Hirotsu is a member of IEEJ.

Hitoshi Inoue was born in Osaka, Japan, on October

15, 1951. He received the B.E. degree in electrical
engineering &om Hiroshima University in 1974. He

joined Sumitomo Electric Industries, Ltd. 1974. He

has been engaged in development on EHV oil filled
and XLPE cables, their accessories, on-site testing
method and diagnosis methods for XLPE cables. Mr
Inoue is a member of IEEJ.