Diffraction methods
Low energy electron diffraction (LEED)
Photoelectron diffraction (Ph D)
He scattering
Reflection high energy electron diffraction
X-ray diffraction
Real space methods
Scanning tunneling microscopy (STM)
Atomic Force Microscopy (AFM)
Ion scattering (MEIS, RBS)
Superstructures
Interference between
different layers (single
scattering)
Note: Usually d12d23 etc
Summary
RHEED summary
Diffraction condition
for a simple cubic
structure
Felici et al
Quantum tunneling
STM of Si(111) (7x7) at good (top left) and optimal (right) resolution
Atomic manipulation
using the STM tip
Spectroscopy: Si(111)
adatom sites A,
corner holes B
vacancy sites C