Date: 22.3.2015
INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
ABSTRACT
This paper presents the investigation of a novel concept
involving the combination of piezoelectrics and new thin-film
battery technology to form multifunctional self-charging, loadbearing energy harvesting devices. The proposed selfchargingstructures contain both power generation and energy
storagecapabilities in a multilayered, composite platform
consisting of active piezoceramic layers for scavenging energy,
thin-film battery layers for storing scavenged energy, and a
central metallic substrate layer. Several aspects of the design,
modeling, fabrication, and evaluation of the self-charging
structures are reviewed. A focus is placed on the evaluation of
the load-bearing capabilities of the fabricated self-charging
structures through both classical static failure testing as well as
dynamic vibration failure testing.
INTRODUCTION
With recent growth in the development of low-power
electronic devices such as portable consumer electronics and
wireless sensor nodes, the topic of energy harvesting has
received much attention in the research community. Several
modes of energy harvesting exist including conversion of solar,
thermal, vibration, and wind energy to electrical energy.
Among these schemes, piezoelectric vibration-based harvesting
has been most heavily researched [1, 2]. Previous studies have
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MATHEMATICAL BACKGROUND
A theoretical background for the static mechanical and
dynamic electromechanical strength calculations of a thin selfcharging beam is given in this section. For the three-point
bending test, the static load required for brittle failure or ductile
failure via a transition from elastic to plastic material behavior
is considered in this work as the mechanical failure load that
leads to the mechanical failure strength. For the dynamic
vibration test, the base acceleration amplitude that corresponds
to a prescribed electrical failure level (depending on the chargedischarge performance of the battery layers) is defined as the
failure load (acceleration) that leads to the electrical failure
strength of the self-charging structure. It is expected that in the
dynamic testing, the devices will fail electrically before they
fail mechanically, hence the dynamic failure strength is defined
as an electrical failure strength. Expressions are derived in
order to estimate the static and dynamic strength values in the
following sections.
Strength Calculations for Three-Point Bending Tests
Bending tests (or flexure tests) are usually employed to
evaluate tensile strengths of brittle materials [13] (such as the
piezoceramic layers in self-charging structures). The two basic
types of bending tests are the three-point and four-point
bending tests. The former type is used in this paper not only for
the piezoceramic layers of the self-charging structure shown in
Figure 2(a) but also for its other individual layers (Figure 2(b)),
as well as for the two sections of the resulting self-charging
assembly (Figure 2(c)). Details of the fabrication of the self-
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ISBN: 978-15-086565-24
Date: 22.3.2015
INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
max
Yh
T
max
kn
YI
M
f
Yk hkn L P
f
4YI
(1)
where hkn is the distance from the neutral axis to the outer
surface of the layer of interest (layer k ), Yk is its elastic
modulus, and YI is the overall bending stiffness of the multilayer beam. Equation (1) applies to the multi-layer cases of
Figure 2(c) and it can be simplified to the following expression
for a single-layer rectangular beam (Figure 2(b)):
f
T hL P 3L P
f
2
8I
2bh f
(2)
IAETSD 2015
v (t )
(3)
r_(t)0
(4)
Rl
where
M ,C, andKare the mass, damping, and stiffness
*
M is
matrices, is the electromechanical coupling vector,
the effective forcing vector,
Rlis
the external load resistance, r(t) is the
modal
mechanical response, v(t) is the voltage response across the
load resistance, aB is the base acceleration of the harvester, and
an over-dot represents differentiation with respect to time.
Here, proportional damping is assumed so that standard modal
analysis can be used with mathematical convenience (i.e., the
damping matrix has the form CMK where and
are constants of proportionality). Expressions for the elements
of the mass, stiffness, damping, effective forcing,
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Date: 22.3.2015
INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
w( x , t )i ( x ) ri (t ) ( x )r(t )
(5)
i1
2i 1 x
i ( x) 1 cos
(6)
2L
where i is the modal index. Note that one should use sufficient
number of admissible functions for convergence of the natural
frequencies of interest to the exact values.
If the base acceleration is assumed to be harmonic of the
j t
v (t ) j
jCp
l
K M j C
jCp
(7)
j t
aBe
T
w( x , t ) ( x)
2
K M j C j
jCp
(8)
j t
aBe
Tf
k
w( x , t)
( xcr , t ) Ykh kn
v(t)
ke31
2
x x cr
h pk
(9)
x
where cr is the critical position on the beam where the
curvature is maximum (e.g. it is the root for the fundamental
mode of a uniform cantilever), the elastic modulus
Yk is the
constant electric field modulus for a piezoceramic layer,
e31k,
vk(t ), and
w( x , t )/aB e
jt
,
respectively.
The maximum dynamic stress of the kth layer of a thin
self-charging structure under base excitation can be expressed
as [12]
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INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
Parameter
Aluminum
Substrate
QP10N*
Active
Element
Thickness (mm)
0.127
0.254
Width (mm)
25.400
20.574
Length (mm)
63.500
45.974
Mass (g)
0.530
* Dimenions for active piezo element only
QP10N
Device
Thinergy
Batteries
0.381
25.400
50.800
2.250
0.178
25.400
25.400
0.460
IAETSD 2015
Figure 6: (a) Three-point bending fixture, selfcharging structure sections after failure testing for
(b) root section, (c) tip section
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INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
Load (N)
10
8
Ductile Failure
6
4
Aluminum
QuickPack
Thinergy
Linear Curve Fit
2
0
-20
0.5
1.5
2.5
3.5
Displacement (mm)
3 Point Bend Test Data - Self-Charging Structure
Root Section
Tip Section
Linear Curve Fit
250
170
165
160
150
Minimum (N)
Aluminum
Substrate
QP10N
Piezoceramic
Thinergy
Batteries
3.21
3.36
3.66
3.21
7.25
8.80
8.50
7.25
6.58
5.47
5.89
5.47
Root Section
Tip Section
39.9
165.3
145
140
0.14
Load (N)
Parameter
155
200
0.16
0.18
0.2
0.22
0.24
0.26
Parameter
150
Aluminum
Substrate
QP10N
Piezoceramic
Thinergy
Batteries
Individual Layers
100
Failure Stress
(MPa)
Brittle Failure
50
229.27
159.82
199.33
0.5
1.5
2.5
3.5
Displacement (mm)
Failure Stress
(Mpa)
14.62
99.57
N/A
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Failure Stress
(Mpa)
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20.15
137.23
155.44
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INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
given in Table 3.
From the results it can be seen that failure in the root
section of the self-charging structure is due to failure of the
piezoceramic layers. At the point of failure, the maximum stress
in the aluminum layer is much less than the failure stress
observed in a single aluminum layer. The failure stress in the
QuickPack is about half of the failure stress obtained for a
single layer, however, it is on the same order of magnitude.
Although there is a significant difference between the failure
stress of the single layer and composite device, it is typical in
brittle failure to observe a wide range of failure loads (thus
stresses) for a single material. The results for the tip section of
the self-charging structure show failure in both the
piezoceramic and battery layers with stresses similar to the
failure stress of the individual layers in both cases. This result is
confirmed by the simultaneous brittle and ductile failure
observed in Figure 7(b). Overall, it can be concluded that the
piezoceramic and battery layers are the critical layers in threepoint bending failure.
Dynamic Failure Testing
To gain an understanding of the dynamic loading that can
be withstood by the self-charging structures without failure, a
series of dynamic tests are conducted with the device mounted
in a cantilever configuration on a small TMC Solution
Dynamic TJ-2 electrodynamic shaker, as shown in Figure 8(a).
The dynamic failure testing is conducted by subjecting the
cantilevered harvester to resonant base excitations of increasing
amplitude until electrical failure is observed. Electrical failure
is defined as a 10% decrease in either the charge or discharge
behavior of the device as compared to baseline
charge/discharge curves. Prior to the dynamic testing, a selfcharging structure is clamped with an overhang length of 43.7
mm and mounted on the shaker. The device is not disturbed for
the duration of testing.
In order to determine the resonant frequency and optimal
load resistance of the clamped device, experiments are
conducted to obtain the electromechanical FRFs of the selfcharging structure for a set of resistive electrical loads (ranging
from 100 to 1 M ). SigLab data acquisition hardware is
Figure 8: (a) Self-charging structure mounted to shaker and (b) overall experimental setup for dynamic testing
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INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
10
Experiment
10
10
10
10
10
Model
Rl increases
-1
-2
-3
10 180
190
200
210
220
230
240
250
Frequency (Hz)
Experiment
Model
Experiment
(circuit with battery)
0.4
25
0.3
Rl increases
0.2
0.1
0
180
0.5
190
200
210
220
230
240
10
5
0
180
190
200
210
220
230
240
250
Frequency (Hz)
Frequency (Hz)
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Aluminum layer
15
250
Piezoceramic layer
Battery layer
20
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1
Charge
Discharge
Capacity (mAh)
0.8
8
4.1
4.1
3.9
6
2
0.4
0.2
Voltage (V)
Voltage (V)
C
u
r
r
e
n
t
(
m
A
)
Current (mA)
0.6
0
Baseline 0.2 0.4 0.6 0.8 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0
Acceleration (g)
500
1000
1500
500
Time (sec)
1000
1500
2000
0.35
Time (sec)
0.3
0.4
2
0.1
Voltage (V)
0.2
r
r
e
n
t
(
m
A
)
Current (mA)
Voltage (V)
0.3
(mAh)
4.1
3.9
Capacity
4.1
Charge
Discharge
0.25
0.2
0.15
0.1
0.05
0
0
0
Time (sec)
0
0
100
200
300
400
500
2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0
Acceleration (g)
Time (sec)
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v
rect
Rin
1
T
2L
D2T
rect
D1TS
0iLdt
DT
1 S
T 0
vrect
L
tdt
(10)
1 s
2L
D
1,opt
(11)
T
in , opt
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INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
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INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING RESEARCH
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