IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 60, NO. 12, DECEMBER 2013
I. I NTRODUCTION
Manuscript received August 18, 2012; revised October 17, 2012; accepted
November 23, 2012. Date of publication November 30, 2012; date of current
version June 21, 2013.
Y. A. Mahmoud is with the Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada (e-mail:
ymahmoud@uwaterloo.ca).
W. Xiao is with the Electrical Power Engineering Program, Masdar Institute
of Science and Technology, Abu Dhabi, UAE (e-mail: mwxiao@masdar.ac.ae).
H. H. Zeineldin is with the Masdar Institute of Science and Technology,
Masdar City, UAE, and also with the Electrical Power and Machines Department, Cairo University, 12613 Giza, Egypt (e-mail: hzainaldin@masdar.ac.ae).
Color versions of one or more of the figures in this paper are available online
at http://ieeexplore.ieee.org.
Digital Object Identifier 10.1109/TIE.2012.2230606
Fig. 1.
There are various methods presented in literature, for extracting parameters of single diode PV models. One approach would
be to use the device physics to develop expressions for the IV
curve parameters, but such parameters would be in terms of
semiconductor material constants and manufacturing variables
such as doping densities [5], [13], [24]. Most semiconductor
constants vary considerably with production spread and are not
provided in a manufacturers data sheet [5], [13], [24]. A lookup table-based model to approximately represent the IV curve
of the PV cell is presented in [25], but it is highly simplified and
results in a high modeling error. Another approach is to use error minimization optimization analytical techniques [26], [27]
or numerical techniques [13], [21], [28] to estimate parameters
of the PV equation from a measured IV curve. Such approach,
in spite of its high accuracy, requires a measured curve which
may not be available for users. A common approach, which is
followed in this paper, is to parameterize the PV model based
only on information provided by product datasheets [1], [2], [8],
[14], [16], [29][34]. Although the extracted parameters do not
necessarily correspond to the PV module physical parameters
(for example, negative values for the series resistance might be
resulted) as explained in [6], [12], [35], [36], the simulated IV
and P V curves can highly match the real curves.
PV manufacturing datasheets provide only four information
about the output electrical characteristics of their PV modules at
standard test conditions (STC), which are short-circuit current
Isc , open circuit voltage Voc , operating voltage and current at
max power point (Vm , Im ), and the implicit information that the
peak of P V curve occurs at the voltage point (Vm ). Thus, only
four equations can be written accurately relying on datasheet
information. However, single diode PV models have five unknown parameters which need to be estimated. To compensate,
the parameterization in [6] starts with one predefined parameter,
the ideality factor, and then derives the rest four parameters accordingly. Similarly, the parameterization in [2] approximates
that one parameter, the shunt resistance Rsh , equals to inverse
of the slope at short-circuit point, and then derives the rest
four parameters accordingly. As a result, the accuracy of the
modeled curves is affected, although they exactly pass through
the four points provided by datasheets. Furthermore, they might
lead to a singular solution, if the approximated parameter is
significantly different from the exact value.
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A. Model Parameters
As shown in (1), there are five unknown parameters which
are A, Rs and Rsh , Iph , and Is . Estimating these parameters
will be based completely on datasheet information to avoid
the need of measurements which are not always available.
Substituting short-circuit point (0, Isc ) at STC into (1) gives
qIsc Rs
I R
sc s
(2)
Isc = Ipho Irs e( Ns KTo A ) 1
Rsh
where Ipho and Irs are the specific values of the photon current
and saturation current at STC. To is the STC temperature. The
second and third terms of (2) can be neglected resulting in the
following estimation of the photon current at STC:
Ipho
= Isc .
(3)
(4)
Ns KTo A
Rsh
Substituting the variables Ipho from (3) and Irs from (4) into
(5) and (6) produces (7) and (8)
qVoc
Isc Rsh Vm Im Rs Im Rsh ( N sKT
)
oA
0=
e
Isc Rsh Voc
q(Vm +Im Rs )
Voc Vm Im Rs Im Rsh
e Ns KTo A
(7)
Isc Rsh Voc
Ipho RVoc
sh
0 = Isc
qVoc
e( Ns KTo A ) 1
q(Vm +Im Rs )
Ns KTo A qVm
Ns KTo A
1
e
Ns KTo A
2Vm + Im Rs
.
Rsh
(8)
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IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 60, NO. 12, DECEMBER 2013
TABLE I
S HUNT R ESISTANCE B OUNDARY OF D IFFERENT PV M ODULES
j=1 (ij ij )
RM SD(I) =
(9)
n
i1
i1
i2
i2
where, I =
... and I = ... .
in
in
The normalized RMSD (NRMSD) of the PV current is the
RMSD divided by the range of PV current values which can be
expressed as
N RM SD =
RM SD
Isc
(10)
(11)
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TABLE II
ROOT M EAN S QUARE D EVIATION V ERSUS VARIATION
OF S HUNT R ESISTANCE
Fig. 3. Characteristics of the series resistance and the shunt resistance for
different PV modules.
bound on Rsh for the case of E19/320 and PS_P36, and thus the
maximum value of Rsh is equal to infinity which corresponds
to a non-zero Rs value. On the other hand, for the case of JAM5
and JAP6, Rsh has a finite upper bound which corresponds to
Rs equal to zero.
Thus, the solution of (7) and (8) either results in a solution
where Rs is equal to zero or Rsh is equal to infinity. The finding
is verified for the different types of commercial PV panels under
study: single crystalline, multi-crystalline, and thin film. Using
the above, a simple procedure can be implemented to determine
the best parameters for PV models.
Finally, it is worth to mention that it is not required, from
users, to utilize measured IV curves to estimate the value
of Rsh . Measured curves are used in this paper only for the
purpose of showing that Rsh results in the lowest RMSD at its
maximum value.
D. Modeling Parameterization
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IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 60, NO. 12, DECEMBER 2013
Fig. 5. Simplified single-diode models resulting from the proposed parameterization: (a) with Rsh only; (b) with Rs only.
where Voc (G, To ) and Voc (G, T ) are the open circuit voltages
at a certain temperature (T ) and the STC temperature (To ),
respectively, for a specific irradiance level. || is the absolute
value of the voltage temperature coefficient given by the product datasheets. T is the temperature deviation from the STC,
which is calculated as T = T To . Assigning I = 0 into (1),
the open circuit formula is approximated as in (15)
Iph
Ns KT A
ln
Voc
+1 .
(15)
q
Is
By substituting (14) into (15), Is can be expressed as
||T q
Is =
(14)
(12)
e Ns KT A G(Isc + T )
To
||T q
(GIsc /Irs + 1) T e Ns KT A
(16)
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IV. E VALUATION
Fig. 7 demonstrates the modeled IV curves with respect
to the experimental data for the KC200GT poly-crystalline PV
model, for various temperatures and irradiance levels. It can
be seen that simulation results of the proposed model coincides closely with the experimental measurements. In addition,
the accuracy of the proposed approach was evaluated experimentally and compared against previous approaches. Fig. 8
presents the IV curves, P V curves, and absolute error for
two modeling approaches with respect to the experimental data
of the JAM5(L)-72/165 mono-crystalline PV module. By comparing with the modeling approach in [6], the proposed method
demonstrates small modeling errors in the span of the PV voltage. Similar evaluation is conducted for poly-crystalline and
thin film modules. Fig. 9 illustrates the smaller modeling error
of the proposed approach in comparison with the modeling approach in [6]. Fig. 10 demonstrates the modeling performance
of a thin film solar module with respect to the IV and P V
curves. The results show that the proposed modeling approach,
for all cases, outperforms the method presented in [6].
The modeling accuracy is compared with respect to the
NRMSD, which is defined in (8). The comparison includes nine
solar panels from different manufacturers, built with different
materials in term of mono-crystalline, poly-crystalline, and thin
Fig. 8. Modeling performance comparison between the proposed parameterization and the modeling process in [6] regarding (a) IV curves, (b) P-V
curves, and (c) absolute modeling errors; based on the JAM5(L)-72/165 monocrystalline PV module at STC.
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IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 60, NO. 12, DECEMBER 2013
Fig. 10. Modeling performance comparison between the proposed parameterization and the modeling process in [6] regarding (a) IV curves, (b) P-V
curves, and (c) absolute modeling errors; based on the MPT3.6-75 thin film PV
module at STC.
Fig. 9. Modeling performance comparison between the proposed parameterization and the modeling process in [6] regarding (a) IV curves,
(b) P-V curves, and (c) absolute modeling errors; based on the JAP6-60/240
poly-crystalline PV module at STC.
In addition to the modeling accuracy, the proposed parameterization approach provides benefits, which include simplified
structure and fast simulation. As described in Section II, the
parameterization leads to the equivalent circuits without either
Rsh or Rs , as shown in Fig. 5(a) and (b) respectively. The
simulation study shows that the simplified models contribute
less computation time compared to the practical model per-
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TABLE III
PARAMETERIZATION R ESULT AND M ODELING D EVIATION C OMPARISON
V. C ONCLUSION
This paper has proposed an effective approach to improve the
accuracy of the single diode PV model. The model parameters
are extracted according to the output electrical characteristics
given by manufacturing datasheets, which include the shortcircuit current, the open circuit voltage, and the maximum
power point. Although the manufacturer datasheets provide
four information about the electrical characteristics, while the
model has five unknowns, the proposed approach provides a
method to accurately estimate the values of five parameters
without any approximations. This achieves the best accuracy of
PV model as well as avoiding reliability problems involved in
PV parameter identification. It ensures high accuracy through
the three characteristic points in the PV datasheet (the opencircuit voltage, short-circuit current, and the maximum power
point), guarantees that the maximum point generated by the
mathematical model coincides with the datasheet, and achieves
the best curvature. The proposed modeling approach results
in two simplified models demonstrating the advantage of fast
simulation. The method is also easier to be implemented in
various simulation platforms for solar power systems studies.
Experimental measurements validated and proved the effectiveness of the generalized modeling approach for three types
of PV materials, made of mono-crystalline, multi-crystalline,
and thin film.
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