INSTRCTION DIVISION
FIRST SEMESTER 2015-16
(Course Handout (Part II)
01 August 2015
In addition to Part I (General Handout for all courses appended to the time table, this portion gives
further specific details of the course
Course No.:
Course Title:
Instructor-in-Charge:
Team of Instructor:
Dipankar Pal
Praveen Mane
1. Course Description
The course presents a broad base of circuit-techniques used in designing analog and digital VLSI. Current
mirror and temperature invariant source for biasing, op-amp topologies, feedback, noise models, MOS
inverter, switching circuits, combinational and sequential circuits, memory design shall be discussed.
Additionally an overview of IC-fabrication process, design rules and scaling shall be introduced in the
beginning.
2. Scope and Objective
To understand the circuit approach to VLSI design. After doing this course, the students ideally should be
able to design both analog and digital full-custom circuits that are implementable in integrated form.
3. Book
Text Book
i.
ii.
Rabay, J. M., Chandrakashan, A. and Borivoje, N., Digital Integrated Circuit Design: A Design
Perspective, PHI Leaning Pvt. Ltd.
Behzard Razavi, Design of Analog Integrated Circuit, Tata McGraw Hill, 2001
Reference Books
i.
ii.
Kang, S. M. and Leblebici, Y., CMOS Digital Integrated Circuits, McGraw Hill International
Edition, 3rd Edition 2003
John, David & Martin, K., Analog Integrated Circuit Design, John Wiley & Sons Inc. 2002
Page 1 of 3
4. Course Plan
Lecture
No.
1-2
3-6
7-10
11-18
Learning Objective
Topics to be Covered
Reference
To be introduced to the
subject
Understanding of
technology generation
To understand layout
rules for VLSI Design
To learn analog circuit
elements
19-24
To understand the
concept of noise
25-30
To learn combinational
digital circuit elements
31-36
37-40
To learn memory-design
techniques
Scaling
CMOS Technology, Design Rule
Check, Capacitors
Advanced current mirrors, reference,
op-amp topologies, feedback
Noise: Time domain and frequency
domain analysis, noise models of
circuit elements
CMOS inverter, performance, delay,
robustness, noise margin; static
CMOS design, ratioed logic, dynamic
CMOS design
CMOS sequential circuits, latches,
registers, flip-flops, timing issues,
hold time, set-up time, delays
Static & Dynamic RAM, non-volatile
memory
5. Presentation Topics:
There shall be 2 X surprise-quizzes (unannounced) each of 15 minutes and for 5% weightage which will
add up to 10%. There shall also be a unstructured lab which will account for another 10% to have a total
of 20% covered under this item of evaluation.
6. Evaluation Scheme:
Component
Surprise Quiz
(10%)+ Unstructured Lab
(20%)
Unit Test 1
Unit Test 2
Comprehensive
Examination
Duration
Weightage
Quizzes (15
minutes X 2);
Lab evaluation
30%
details to be
communicated
later
60 minutes
15%
60 minutes
15%
180 minutes
40%
Venue
Remarks
Closed book
Closed book
Closed book
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Instructor-in-Charge
EEE F-313; INSTR F-313
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