The previous mentioned steps describe the learning

mode of the computer (Manual lead through in DCC

Programming).
If other similar parts wer^ to be measured they are
clamped on the table ih approximately the same
position as the first part.
Accurate positioning is lot necessary, the correct
command is given via the computer and the
measuring process is repeated by the machine (DCC
measuring machines).
When combined with rotary tables, most complex
shapes can be measured.
These machines are very expensive and are only
economic where used for measurement of large
25
quantities and complex shapes.

5. Automatic Handling of Measuring Instruments

and Workpieces
Measurement and test equipment are integrated into
the material flow of production applications.
Especially useful if various! workpieces and production
features must be measured in a short period of time.
Fully automated measurements requires fully
automated handling of measurement instruments and
workpieces.
A measurement station which is automated through
the use of robots, can be made available during
assembly to acquire tre data needed for the
workpiece selection. It can control the material flow
depending on the selection and provide ideally paired
26
workpieces for the assemb y process.
:

Industrial
robot

palette
transport
systeta

Measurement station
for inner and outer
diameter

Digitate/analogue
modules for
input &
output

computer
Processor system wttH analogue/digital connections
between separate measurement stations

6. Interfacing Production Machines and Measuring

Systems
One of the problems with conventional machine
tools is that the leadscrews, which cause the
, slideway to move, are also expected to be
responsible for measuring the motion.
In C.N.C. machine tools;, the distance moved is
measured by a device cjompletely separate from
the actuator that caused' that movement.
A C.N.C. machine will produce conforming parts
as long as the process variability is better than
the part's tolerance.
28

 Tool wear, for example, changes the initial

setting of the C.N.C. machine and accordingly
the process variability.
Therefore a separate product measuring
system, for the product,! is still required but may
be fitted to the machine.
The measured data may be fed to a computer to
perform the following:
Perform necessary borrections to machine
motion.
Establishment and updating of control charts.

29

Video Link:
->

https://www.dropbox.cdm/s/vndtd5titt4g2ft/C
MM.mp4

30

Virtual Metrology

Virtual Metrology (predictive Metrology)

'
When each workpiece on ithe production line should
be measured, a significant number of metrology
tools and procedures is required.
Production cycle time is, accordingly, significantly
increased.
(VM) is a technology to predict metrology variables
using information about tpe state of the process for
every workpiece.

: '

1. Development Phase
A range of production runs is used to develop an empirical
prediction model that correla es actual measurements with
process data.
The model is refined until the Dredicted measurement values
show a reasonable correlation.

li
Correlati n of Predicted vs.
Observed Values

2. Production Phase

The model is used during production to

measurement values for the parts being produced.

estimate

Variations from desired product parameters are used to

update the,process parameters.

 Adjustments in process parameters can be made on a

product-to-product basis wi hout requiring a separate
measurement set-up.
Actual measurements are still made in the production flow,
but their role has shifted to trjat of calibrating/updating the
prediction model.
Actual measurements are no [ the primary tools used to
control the process.
i
Control, at the single product level, reduces within-lot
variability thus increasing proceiss capability index.

Challenges

iii
Large number of procesjs variables need to be
managed to provide prediction of a few quality
parameters .(which process variables are most
important?).

Accuracy and reliability problems.

Noise and accuracy of VM prediction may make it not

practical or usable.

Benefits
Reduction of metrology costs.
Control, at the single prodtict level, reduces within-lot
variability thus increasing process capability index.
Reduces cycle time.
Eliminates stand-alone metrology steps when the results can
be accurately predicted.
Provides cost-effective alternative to integrated metrology
for processes that exhibit hard to predict variation within the
process run.
Lowers the number of sampled products thus increasing
production efficiency.
Prediction model transparen :y (Ex. Being updated after
maintenance).

VM Versus Integrated Metro ogy (IM)

> Both, VM and IM, are used to reduce process variability and
improve the control of a produ :tion process.
VM is an algorithm technique requiring
measurements.

no

in situ

IM includes measurement harcware that can be incorporated

into the production equipment to provide measured values
during production.
IM may include special software to calibrate the obtained
readings with reference artifacts.
In IM the hardware portion
investment required.

represents most of the

In IM there is a tradeoff be1ween speed and accuracy of

measurement.