1. Introduction
2. Two-dimensional stationary processes
3. Moments of a multivariate distribution
4. Use generalized variance and bivariate kurtosis to
measure image sharpness
5. Software to measure SEM image sharpness
6. Conclusions
1. Introduction
In industry applications, such as automated on-line
semiconductor production, there is a growing realization
of the need for the development of a procedure for
periodic performance testing of the image sharpness for
scanning electron microscope (SEM).
Postek and Vladar (1996) and Vladar, Postek and Davidson
(1998) proposed a procedure to test image sharpness
based on the spatial Fourier transform of the SEM
images.
It is observed that when an SEM image is visually sharper
than a second one, the high spatial frequency components
of the first image are larger than those of the second.
We proposed two statistical image sharpness measures
based on the spectral density for a 2-d stationary process.
1a
1c
1b1b
1d1d
Figure 1. Two SEM Images and their 2-D periodograms
and
( s, u ) =
R ( s, u )
x2
1
f (, ) =
2
is iu
(
,
)
s
u
e
dsdu
The spectral
density function has the following properties:
1.
f ( , )d d = 1
2.
3.
f ( , ) 0
f ( , ) = f ( , )
12 W W
1
2
W2
W2
12 W W
12 W W
W2
The generalized
= W21 W2 2 (1 122 ).
E[( Z z ) 4 ]
2 =
{E[( Z z ) 2 ]}2
Assuming the probability density function f z ( x) exists, the
kth central moments is
mk = E[( Z z ) k ] =
k
(
x
)
f z ( x)dx
z
Thus,
m4
2 =
(m2 ) 2
2,2
k ,l =
E[(W1 1 ) k (W2 2 )l ]
1k 2l
Figures 3 and 4 show that the curvatures for the 2-d Gaussian
distribution and the bivariate t distribution with a df = 9.
1
( , ) =
2 N
for
it i
w
e
t ,
t =1 =1
, = 2 / N ; [( N 1) / 2] [ N / 2]
1
I ( , ) = ( , ) =
2
(2 N )
2
it i
w
e
t ,
t =1 t =1
h(i , j ) =
I (i , j )
N
I (
m =1 n =1
, n )
i =1
j =1
j =1
i =1
= i h(i , j )
= j h(i , j )
= (i )
2
i =1
h( ,
= ( j )
j =1
h( ,
j =1
i =1
The k ,l is given by
N
k ,l =
k
l
h
(
)(
)
(
)
i j i j
j =1 i =1
k l
h( , )
2 2
and
min( , )
2
rK =
2, 2,
min( 2, , 2, )
5a
5b
5c
5d
5e
Spectel Research Co. in collaboration with NIST and HewlettPackard developed the software package running on a workstation
system.
Sharp
image
Astigmatic
image
6. Conclusions
While the variance is used to measure the dispersion of a probability
distribution, the kurtosis of a probability distribution has been used to
measure the shape and width of the shoulder of the distribution. These
properties are exploited for the spectral density for a two-dimensional
stationary process and then successfully applied to SEM image to
measure image sharpness. The bivariate kurtosis and the
corresponding relative difference of the marginal kurtoses are
implemented in a workstation system and used in semi-conductor
industry for SEM performance monitoring.