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2SK2225

Silicon N-Channel MOS FET

ADE-208-140
1st. Edition

Application
High speed power switching

Features

High breakdown voltage (VDSS = 1500 V)


High speed switching
Low drive current
No Secondary Breakdown
Suitable for Switching regulator, DC-DC converter

Outline

TO-3PFM

D
G

1. Gate
2. Drain
3. Source

2SK2225
Absolute Maximum Ratings (Ta = 25C)
Item

Symbol

Ratings

Unit

Drain to source voltage

VDSS

1500

Gate to source voltage

VGSS

20

Drain current

ID

Drain peak current

I D(pulse)*

Body to drain diode reverse drain current

I DR

Channel dissipation

Pch*

50

Channel temperature

Tch

150

Storage temperature

Tstg

55 to +150

Notes 1. PW 10 s, duty cycle 1 %


2. Value at Tc = 25 C

Electrical Characteristics (Ta = 25C)


Item

Symbol

Min

Typ

Max

Unit

Test conditions

Drain to source breakdown


voltage

V(BR)DSS

1500

I D = 10 mA, VGS = 0

Gate to source leak current

I GSS

VGS = 20 V, VDS = 0

Zero gate voltage drain current I DSS

500

VDS =1200 V, VGS = 0

Gate to source cutoff voltage

VGS(off)

2.0

4.0

I D = 1 mA, VDS = 10 V

Static drain to source on state


resistance

RDS(on)

12

ID = 1 A
VGS = 15 V*1

Forward transfer admittance

|yfs|

0.45

0.75

ID = 1 A
VDS = 20 V*1

Input capacitance

Ciss

990

pF

VDS = 10 V

Output capacitance

Coss

125

pF

VGS = 0

Reverse transfer capacitance

Crss

60

pF

f = 1 MHz

Turn-on delay time

t d(on)

17

ns

ID = 1 A

Rise time

tr

50

ns

VGS = 10 V

Turn-off delay time

t d(off)

150

ns

RL = 30

Fall time

tf

50

ns

Body to drain diode forward


voltage

VDF

0.9

I F = 2 A, VGS = 0

Body to drain diode reverse


recovery time

t rr

1750

ns

I F = 20 A, VGS = 0,
diF / dt = 100 A / s

Note

1. Pulse Test

2SK2225
Power vs. Temperature Derating

I D (A)

Drain Current

(1

sh

ot

c
(T
25
)
C

this area is
limited by R DS(on)

0.1 Operation in

Ta = 25 C
50
100
Case Temperature

150
Tc (C)

200

0.01
10

Typical Output Characteristics


5

30
100 300 1000 3000 10000
Drain to Source Voltage V DS (V)

Typical Transfer Characteristics


2.0

10 V

8V

Pulse Test
(A)

15 V

1.6

V DS = 25 V
Pulse Test

ID

7V
3
6V

5V

Drain Current

I D (A)

tio
ra

0.3

0.03

Drain Current

1
10

pe

20

40

PW

Pch (W)

0
10

60

C
D

Channel Dissipation

Maximum Safe Operation Area


10
s

10

80

1.2

0.8

0.4

Tc = 75 C
25 C
25 C

VGS = 4 V
0

20
40
60
Drain to Source Voltage

80
100
V DS (V)

2
4
6
Gate to Source Voltage

8
10
V GS (V)

2SK2225
Static Drain to Source State Resistance
vs. Drain Current

Pulse Test
40
I D= 3 A
30

Static Drain to Source on State Resistance


R DS(on) ( )

2A

20

1A

10

0.5 A
0

Drain to Source On State Resistance


R DS(on) ( )

50

4
8
12
Gate to Source Voltage

16

20

Static Drain to Source on State Resistance


vs. Temperature
20
I D= 2 A

16

12

0.5 A, 1 A

4
0
40

50
20

VGS = 10 V
15 V

10
5

2
Pulse Test
1
0.5
0.1

0.2

V GS (V)

VGS = 15 V
Pulse Test
0
40
80
120
160
Case Temperature Tc (C)

0.5
1
Drain Current

2
5
I D (A)

10

Forward Transfer Admittance vs.


Drain Current
Forward Transfer Admittance |yfs| (S)

Drain to Source Saturation Voltage


V DS(on) (V)

Drain to Source Saturation Voltage vs.


Gate to Source Voltage

10
V DS = 25 V
Pulse Test

5
2
1

Tc = 25 C
25 C
75 C

0.5

0.2
0.1
0.05

0.1

0.2

0.5

Drain Current I D (A)

2SK2225

10000

2000
1000
500

200

VGS = 0
f = 1 MHz

Capacitance C (pF)

Reverse Recovery Time trr (ns)

5000

Typical Capacitance vs.


Drain to Source Voltage

Body to Drain Diode Reverse


Recovery Time

di / dt = 100 A / s, Ta = 25 C
V GS = 0, Pulse Test

Ciss

1000

Coss

100

Crss
100
10

50

0.05 0.1 0.2


0.5
1
2
Reverse Drain Current I DR (A)

400

V DD = 250 V
400 V
600 V

I D = 2.5 A

20
40
60
80
Gate Charge Qg (nc)

0
100

500

Switching Time t (ns)

12

V GS (V)

V DS (V)
Drain to Source Voltage

16
VGS

600

200

40

50

1000

Gate to Source Voltage

20

VDS

30

Switching Characteristics

Dynamic Input Characteristics

800

20

Drain to Source Voltage V DS (V)

1000

V DD = 250 V
400 V
600 V

10

t d(off)

V GS = 10 V
PW = 2 s
duty < 1 %

200
100

tf
50

20

tr
t d(on)

10

0.05 0.1

0.2
0.5
Drain Current

1
2
I D (A)

2SK2225
Reverse Drain Current vs.
Source to Drain Voltage
5
Reverse Drain Current I DR (A)

Pulse Test
4

10 V, 15 V
V GS = 0, 5 V

0.4

0.8

1.2

1.6

Source to Drain Voltage

2.0

V SD (V)

Normalized Transient Thermal Impedance vs. Pulse Width


Normalized Transient Thermal Impedance
s (t)

0.3

Tc = 25C

D=1
0.5

0.2

0.1

ch c(t) = s (t) ch c
ch c = 2.50 C/W, Tc = 25 C

0.1

0.03

0.05

0.02
0.01

PDM

uls

100

1m

10 m
Pulse Width

PW
T

PW

p
ot

sh

0.01
10

D=

100 m
PW (S)

10

2SK2225
Switching Time Test Circuit

Waveform
Vout
Monitor

Vin Monitor

90%

D.U.T.
RL
Vin
Vin
10 V

50

V DD
= 30 V

Vout

10%
10%
90%

td(on)

tr

10%
90%
td(off)

tf

15.6 0.3

5.5 0.3

5.0

1.6
1.4 Max

3.2
21.0 0.5

4.0
2.6
1.4 Max

2.7

19.9 0.3

3.2

+ 0.4
0.2

5.0 0.3

Unit: mm

1.0 0.2
5.45 0.5

0.6 0.2

5.45 0.5

Hitachi Code
JEDEC
EIAJ
Weight (reference value)

TO-3PFM

5.6 g

Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachis or any third partys patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third partys rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachis sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachis sales office for any questions regarding this document or Hitachi semiconductor
products.

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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.

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