Configuration
System Three individual compartments:
Advance Electronics Controller
Analyzer compartment containing spectrometer and data processor
Optically isolated sample-cell compartment
Field-Replaceable Modules Detector, light-source, laser, sample cells, and interferometer
Measurement Modes Transmission, attenuated total reflectance, remote measurement
with fiber optics, multiple probes or cells, and multiple detectors
Sample Cells Liquid or gas cells from 0.28 mm to 1 m
Up to 4 cells for extractive systems
Up to 8 cells for fiber-optic systems
NIR MIR
Detectors DTGS or InAs DTGS
Light-Source Quartz halogen lamp Globar
Performance
Spectral Range 3800-15000 cm-1 350-7000 cm-1
Spectral Resolution 2, 4, 8, 16, 32, 64 cm -1
1, 2, 4, 8, 16, 32, 64 cm-1
Wavenumber Precision Better than +/- 0.01 cm-1 Better than +/- 0.01 cm-1
Absorbance Non-Linearity < 0.3% < 0.02%
Intensity Variability Better than 0.01 AU between
instruments
Baseline Stability < 0.2% standard deviation < 0.5% standard deviation
at 4100 cm over 8 hours
-1
at 4000 cm-1 over 8 hours
Scan Speed 45 scans/min InAs detector at 39 scans/min for DTGS at
4 cm-1 resolution 4 cm-1 resolution
RMS Signal-to-Noise > 20,000:1 RMS at 2100 cm-1 for 39 scans at 4 cm-1 (MIR)
> 9,000:1 RMS at 4800 cm-1 for 16 scans at 4 cm-1 (NIR)
Vibration Tolerance Analyzer isolated with vibration mounts. Optical components rigidly
mounted and aligned to a single base plate. Interferometer design
is vibration resistant
Mean Time to Failure 5 years excluding source
Mean Time to Repair Source replacement - 15 minutes
Laser replacement - 10 minutes
System operation validation - 20 minutes
System Diagnostics Automatic diagnostics for determining spectrometer performance,
sample-cell cleanliness, sample-cell pathlength, optical-purge air quality,
and outlier result detection
Sample Requirements
Sample Flow 100 cc/min typical
Sample Filtration 0.2 micron, Swirl Klean filter typical on fast loop
Minimum Sample Pressure Differential 20 psig (137.9 kPa) typical
Maximum Sample Pressure 350 psig (2413.25 kPa) typical
Maximum Sample Temperature 212 F (100 C) typical
Sample Wetted Materials Stainless steel, quartz typical. Monel, Hastelloy and others available.
Material in Contact with Sample A variety of construction materials, optical materials, and gaskets
available to meet application requirements
Communication Options
Networks Integrated into the Advance Data Hiway through the integral Electronics
Controller. Compatible with Modbus. Access via Advance Application
Personal Computer and via modem with Close-up.
I/O Chassis Contains slots for nine plug-in I/O boards
Overview The FTPA2000-400 series from ABB is a commercially proven process analyzer with an
installed base of over 140 units in refineries and chemical plants across the globe.
4077
MINIMUM CLEARANCE SCALE
(Scale Reduced)
ADVANCE
24 9/16 [624]
ELECTRONICS
ENCLOSURE
TOP VIEW
EC
2002-12
ELECTRONICS
ENCLOSURE
HEATER
AIR
SPECTROMETER SAMPLE
PRINTED IN CANADA
COMPARTMENT COMPARTMENT
G
MOUNTING
UNISTRUT
MOUNTING UNISTRUT
DRILL HOLES IN
UNISTRUT FOR
INSTALLATION
BASE TO BE REMOVED
UPON INSTALLATION
BUA-FTPA2000-400 series
ABB Inc.
Analytical and Advanced Solutions
585 Charest Blvd. East, Suite 300
Qubec, QC G1K 9H4 CANADA
Phone: 418-877-2944
North America: 800-858-3847 Copyright 2002 by ABB Ltd. The IndustrialIT wordmark, the IndustrialIT Enabled wordmark and symbol,
France: 0810 020 000 Aspect Object, Aspect Integrator Platform and all product names in the form XXXXXIT are registered or
Fax: 418-877-2834 pending trademarks of ABB. All rights to trademarks reside with their respective owners.
E-mail: ftir@ca.abb.com
www.abb.com/analytical