Effects of Slit Width and Separation in Single-Slit and Double-Slit

Diffraction Patterns of Monochromatic Light

John Paul B. de Blas1, Kira Andrea C. Chan2, Renz Joshua B. Labay3, Marion P. Ordillano4*
1
Department of Mining, Metallurgical and Materials Engineering, University of the Philippines, Diliman, Quezon
City
2
Department of Industrial Engineering, University of the Philippines, Diliman, Quezon City
3
Department of Mechanical Engineering, University of the Philippines, Diliman, Quezon City
4
Department of Geodetic Engineering, University of the Philippines, Diliman, Quezon City
*Corresponding author: mordillano88@yahoo.com

Abstract
The experiment studied light as a wave using the concepts of interference and
diffraction. Laser was used to hit a screen and produced different patterns and
widths depending on variables such as slit-to-screen distance and use of double
or single slits. Boundaries of each bright fringe were marked and measured.
After collecting data, calculations were made. It was observed that an inverse
relationship between slit width and the diffraction envelope exists. The
calculated wavelength of the laser diode was both 7 14 .29 nm for the 0.02
mm and 0.04mm slit width which yielded to a percent difference of 9.89% from
the theoretical value of 650 nm.
1. Introduction
Light can behave as a particle or wave, depending on how it is manipulated. In this experiment, light is
studied as an electromagnetic wave using the concept of interference and diffraction. Interference is a phenomena of
waves. It is observed when light passes through a narrow slit. Diffraction is a phenomena when many sources of
waves are present. These occur due to the principle of superposition. When waves encounter one another, they either
add up (constructive) or cancel out (destructive).
When light passes through a slit with finite width, it makes a diffraction pattern of alternating bright
(constructive) and dark (destructive) fringes. The widest bright fringe is called the central maximum. The intensity
of brightness is inversely proportional to the distance between a fringe and the central fringe. Thus, brightness in
fringes closer to the central fringe is greater than the ones farther or having larger distance from the central one.
When light passes through two identical slits with finite width, light will diffract at both slits, but at the
same time, interferes with one another. This forms a pattern of both double-slit interference and single-slit
diffraction.
Laser beam is used in this experiment as the source of monochromatic light. Laser will be passed through
slits and distance between the center to side (y) will be measured. The following equations are used to solve for the
wavelength and slit width in the double-slit interference and single-slit diffraction:
mL
ym,diff= a (m=1,2,3,)

(1)
mL
ym,int= d (m=1,2,3,)

(2)
where is the wavelength of the light source, L is slit-to-screen distance, a is slit width, and d is the slit
separation. Equation (1) tells position of intensity minima in a single-slit setup, while equation (2) tells the intensity
maxima in a double-slit setup.
The experiment aims to observe behavior as variables are changed by differentiating patterns produced by
single-slit and double-slit, and to quantitatively relate the pattern to slid width.

2. Methodology
A. Single-Slit diffraction
The experiment was set up by placing a 650 nm laser diode on the end of the optical bench and the single
slit disk together with its holder 3 cm away from the laser. Then, a white sheet of paper was fixed to a vertical
surface and was placed on the other end of the optical bench making sure that the beam would hit it. The 0.04-mm
slit width single slit was selected by rotating the disk until it was centered in the slit holder. The laser beam was then
aligned on the slit by adjusting the knob horizontally and vertically until the beam was centered. Utmost precaution
was taken to avoid direct eye contact with the laser beam. Figure 3 shows this experimental setup.

The lights were turned off before the experiment started to clearly observe diffraction patterns in the paper
background. The boundaries of dark fringes were marked using a pencil and the intensity minima were also
identified. The distance between the first order minima and second order minima were measured and recorded. The
distances between side orders were divided by two to get the distances from the center of the pattern to the first and
second order minima and were recorded as y m. The diffraction pattern displayed on the sheet of paper was
subsequently sketched. The steps were repeated for slit widths 0.02 mm and 0.08 mm. Then, the wavelength and the
percent difference were calculated.

B. Double-Slit diffraction
The 650 nm laser diode was placed on one end of the optical bench and the multiple slit disk together with
its holder 3 cm away from the laser. Then, a white sheet of paper was fixed to a vertical surface and was placed on
the other end of the optical bench making sure that the beam would hit it. A qualitative observation on a variable
double slit with a width of 0.04 mm and a slit separation of 0.125 mm to 0.75 mm was done. The interference
fringes and diffraction envelopes were observed as the slit width is kept constant and the slit separation was varied.
The variable double slit was replaced by double slit with a slit width of 0.04 mm and a slit separation of
0.25 mm. The distance between the slit and screen (paper) were measured and recorded. The group made sure that
the slit and the pattern were at the same level vertically before measuring the distance. Then, the diffraction
envelope and the interference fringes were observed. The dark fringes boundaries were then marked and the
intensity minima were located using a ruler. The distances between the first order minima and second order minima
were measured and divided into two to get the distance from the center. Using the obtained data, the slit width and
percent difference were calculated.
The double-slit pattern was projected onto the white paper fixed on a vertical surface. The position of the
screen was fixed all throughout the experiment. The interference fringes located inside the central maximum were
counted and recorded. Also the width of central maximum was measured and divided by the number of interference
fringes this gave an approximate value for the width of each interference fringe. The double-slit diffraction pattern
was then sketched to scale.

3. Results and Discussion

The Interference and Diffraction Experiment aims to find the difference between single-slit and double-slit
diffraction through varying slit widths and separation.

Table W1. Wavelength of the laser diode

= 0.02 mm, m = 1 = 0.04 mm, m = 1

Distance between side orders,

y1 2 1

Distance from center to side,

y1 1 0.5

Calculated wavelength 7.1428571 x 107 m 7.1428571 x 107 m

Percent difference 9.89% 9.89%

Average wavelength ( ) 7.1428571 x 107 m

Slit-to-screen distance (L) 28

Table W1 shows the experimental wavelength of the laser diode using different slit widths. The wavelength was
determined using the equation
= ya/mL (3)
where y is the distance from center to side, a is the width of the slit, the intensity minima and L is the slit-to
screen-distance. The calculated average wavelength of the laser diode is 714.29 nm yielding a 9.89% percent
difference from the theoretical wavelength, 650 nm.

Figure W1. Sketches (to scale) of diffraction pattern for various slit widths and fixed slit-to-screen distance

Table W2. Data and results for the = 0.04 mm, d = 0.25 mm double slit

m=1 m=2

Distance between side orders,

ym 1 2

Distance from center to side,

ym 0.5 1

Calculated slit width 0.00364 0.00364

Percent difference 9% 9%

Slit-to-screen distance (L) 28

Table W2 shows the distances between side orders for double-slit with slit width 0.04mm and slit
separation of 0.25 mm. Given the mth intensity minima and the measurement of the central maximum width, the
experimental slit width was calculated using Equation 4,

a = mL/y m,diff (4)

Since actual slit width is a = 0.04 mm, calculated percent difference for slit width on m=1 and m = 2 is both
9%.

Table W3. Data and results for double-slit interference II

 = 0.04 mm = 0.04 mm = 0.08 mm = 0.08 mm
d = 0.25 mm d = 0.50 mm d = 0.25 mm d = 0.50 mm

Number of fringes 10 22 6 10

Width of central maximum 2.5 2.5 1.75 1.25

Fringe width .25 .11363636 .29166667 .125

Table W3 shows pertinent measurements of the diffraction pattern and the fringes on a double-slit using
different slit widths and separations which can be calculated using Equation 5.

Fringe width = width of central maximum/no. of fringes (5)

Figure W2. Sketches (to scale) of interference pattern for various slit widths and slit separations

Based on these observations, the increase in slit width results into the decrease in diffraction length, and
vice versa. On the other hand, the increase in slit separation length results into the increase in the number of fringes.
This means that the slit separation is directly proportional to the number of fringes. However, this also means that
the width of each fringe is inversely proportional to the slit separation. Based on the table, the fringe width,
decreases as the slit separation increases, and increases as the latter decreases.
When the slit width is being increased, interference in waves occurs, thus, more wave antinodes are created
which are represented by the dark bands observed in the diffraction pattern and as a result, bright bands are more
separated from one another..
The resulting fringes are caused by the interference that arises from secondary waves formed from the two
slits. Increasing slit separation results to a higher number of fringes but a decrease in fringe width. The reason here
lies on the fact that increasing slit separation also increases the difference in distance travelled by light waves
emerging from the slits to reach the same point in the screen. On the other hand, slit width affects diffraction pattern
specifically on the intensity of emergent diffraction envelopes. Furthermore, decreased slit width increases the
width of the central maximum and diffraction envelope due to wider wave diffraction as a result of increased
secondary wave curvature. Also, a smaller slit width results to increased number of fringes and therefore, smaller
fringe width.

4. Conclusion
In this experiment of interference and diffraction of monochromatic light, the effect of the slit width and slit
separation on diffraction patterns of laser beam was observed. As the slit width increases, the diffraction envelopes
decreases and vice versa. With this, it could be said that there is an inverse relationship between slit width and the
diffraction envelope. On the other hand, the slit separation was observed to have no significant effect on diffraction
envelopes. In the case of double-slit diffraction, the change in slit width had no significant changes on the fringe
width while the change in slit separation does affect the width of the fringes. The experimental wavelength of the
laser diode was also calculated to be both 714.29 nm for the 0.02mm and 0.04mm slit width respectively.
These calculated value yield to a percent difference of 9.89% from the theoretical value of 650 nm. For better
results, it is recommended to conduct this experiment in a darker room so that the fringes would be observed more
sharply and minimize the percent difference

5. Acknowledgement
We would like to express our gratitude to our Physics 72.1 professor, Mr. Denny Lane Sombillo, for his
guidance and for providing careful intructions throughout the whole experiment. Likewise, we would like to extend
our gratitude to the National Institute of Physics for providing us with the facilities needed to complete this study.

6. References
1. Young, H. D. and Freedman, R. A. (2012). University physics with modern physics (13th ed.). San
Francisco, California: Pearson Education, Inc.
2. Kamal, A. A. (2010). 1000 Solved Problems in Modern Physics. New York: Springer-Verlag Berlin
Heidelberg