10
-34 -30 -26 b -34 -30 -26 Introduction: The conformal mapping technique has been
average received power,dBm
largely used in the analysis of striplines, e.g. References 1 and
Fig. 3 Bit-error-rate characteristics 2. By means of successive conformal transformations the
a 600 Mbit/s stripline geometry is modified into another one whose capac-
b 2 Gbit/s itance is known, which is usually that of parallel plates. This
ELECTRONICS LETTERS 4th June 1987 Vol. 23 No. 12 637
process generally requires three conformal transformations. with p = tanh (ntJAv), p' = (1 - p2)1/2, q = - 2 In (n/4)~l, and
This can become cumbersome owing to the need to manipu- C is the per-unit length capacitance normalised to e0.
late the resultant elliptic integrals. Eqn. 3 then gives the capacitance of the original structure,
In the past few years, microstrip and stripline have been from which the characteristic impedance is calculated as
analysed by different methods. One of particular interest is Z = 120TT/C.
that of Reference 3, where, via the standard Green function Fig. 3 shows a comparison with the results of Reference 1,
technique and variational analysis, the authors obtained which were calculated from the parallel-plate configuration by
closed-form expressions for the capacitance of open micro- means of three conformal transformations. The agreement is
strip, i.e. strip over an infinite ground plane. These expressions seen to be very good. The present procedure can be extended
are reported as being accurate to within 1% of the actual to evaluate the charge distribution on the shielded stripline.
value for any ratio of strip width to spacing. It is shown in this
letter that these expressions enable the open microstrip to be 4-0
used as the auxiliary geometry in the conformal mapping h/b = 1
analysis of shielded striplines. One immediate advantage is a/w = 10
that only one conformal transformation is needed.
30
y
B' [D B z zx+jy 20
I Reference 1
II' II
2b
E' J F E 10 i i
~ 2~w t
10 2 0 30 4-0
a/b
1
r I
i Fig. 3 Per-unit length capacitance of shielded stripline
A iC A
Conclusion: In this letter an approximate method for the
2a |269/11 analysis of the shielded stripline is presented. The results are
valid for narrow strips, both symmetrically and asym-
Fig. 1 Asymmetrical shielded stripline metrically enclosed. This is believed to be an improvement
over other conformal mapping analyses found in the literature,
Formulation and results: Fig. 1 shows an asymmetrical strip- once they only apply to each case separately.
line, where the strip is assumed to be narrow compared with
the shielding (W <^ a). The region inside the rectangle ABB'A' Acknowledgment: The author wishes to thank E. C. Talboys of
in the z-plane can be mapped into the upper half of the the City University, London, for helpful discussions.
complex t-plane of Fig. 2 via the Schwartz-Christoffel trans-
formation,14 which here takes the form J. R. SOUZA 21st April 1987
Instituto Militar de EngenhariaSE/3
Praca General Tiburcio, 80
= fcM df (1) 22290 Rio de JaneiroRJ, Brazil
References
with a/b = 2K(k)/K(k'), M = a/kK(k), k! = (1 - k2)1'2, and
K(k) is the complete elliptic integral of the first kind and 1 TIPPET, j . c , and CHANG, D. c : 'A new approximation for the
modulus k. capacitance of a rectangular-coaxial-strip transmission line', IEEE
Trans., 1976, MTT-24, pp. 602-604
The centre (z = jh) and the edges (z = + W + jh) of the strip 2 RAD, J. s., and DAS, B. N.: 'Analysis of asymmetric stripline by
are mapped into t =jv and t = +tx +jt2, respectively, with conformal mapping', ibid., 1979, MTT-27, pp. 299-303
3 KUESTER, E. D., and CHANG, D. c : 'Closed-form expressions for the
v = sn (/!', k')/cn (h, k') (2a) current or charge distribution on parallel strips or microstrips',
ibid., 1980, MTT-28, pp. 254-259; Addendum: ibidn 1980,
tl = sn (W, k) dn (h, k')/den (2b) MTT-28,p. 1143
t2 = sn (W, k) dn (W\ k) sn (h\ k') en (W, (2c) 4 KOBER, H.: 'Dictionary of conformal representations' (Dover Pub-
lications Inc., New York, 1952)
2 2 2 2
den = en (h, k') + k sn (w\ k) sn (H, k') (2d)
where h' = hK(k')/2b, W = WK(k)/a, and sn, en, dn are Jaco-
bian elliptic functions.
It was observed that the percentage difference between v SPACE-CHARGE-INFLUENCED
and t2 was always around or lower than 1% whenever the AVALANCHE-BREAKDOWN
ratio a/W was greater than 10. This means that the original CHARACTERISTICS: AN IMPROVED
stripline can be considered as being mapped into a configu- APPROXIMATION
ration of a strip of width 2tx at a height v above an infinite
ground plane. The results of Reference 3 can then be applied
to the latter structure: Indexing terms: Semiconductor devices and materials, Space-
charge effect
1/C = K(p)/2K(p') - v2 In (1 + 4t2/qv)/4nt2 ' ' The space-charge effect in millimetre-wave avalanche transit-
time diodes is investigated. It is shown that for high current
densities and especially for diodes punched through at break-
down, the well known space-charge resistance expression is
Di not in accordance with the I/V data measured under pulse
II t= conditions. By introducing the effective doping approx-
imation, the measured characteristics can be explained. An
\ expression for a current-density-dependent space-charge
/ I \ resistance is proposed.
-E B' !E A B
1
-1/k -1 1 i/k
Introduction: In millimetre-wave devices employing avalanche
Fig. 2 Conformal mapping of geometry in Fig. 1 multiplication the field distribution is influenced by mobile
638 ELECTRONICS LETTERS 4th June 1987 Vol. 23 No. 12