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1 INTRODUCTION
Heat transfer across a solid-solid contact appears quite often in many inter-
esting engineering situations and have a main role in there process success.
83
Surfaces are never perfectly flat and the interface at the contact comprises
point contacts and asperities (see figure 1). In practice many materials can be
added to full the asperities in order to make better contact. Note too that the
geometries of the contact details can vary in time under different physical and
chemical factors. The impact of pressure and thermo-elasticity on the contact
zone between two solids is widely studied in literature and can be found in
[9,10,11,12,13,14]. In our study we make the assumption of local thermody-
namic, equilibrium, so that two microscopic points in contact together at the
interface should have the same temperature.
FIGURE 1
(a) macroscopic details of contact and (b) microscopic details ones.
These potentials are not unique but they are additive ones:
A = A0 + (8)
V = V0 - (9)
t
In addition they are chosen with respect of the constraint called Lorentz
gauge:
1 V
. A + 2 . =0 (10)
c t
q is the density of heat flux, is the conductivity of the medium and T is the
temperature. This low means that the heat conduction flux (vector) derives
from the scalar potential temperature T. Thus, from the Maxwell equations,
the only way that we have found to make the similitude between electromag-
netism and heat conduction if it exits is:
qE (12)
T V (13)
When the energy balance is set, the heat conduction equation is obtained:
T
.q = T = c (14)
t
While the divergence of the electric field hasnt the same form:
.E = - . A + V = (15)
t 0 r
When the two last equations are compared, the conclusion is that in general
cases the above similitude is still not correct. In periodic regime of a period
of the electric sources (, J ) , the averaged potentials values over the electric
resource area can be estimated from the Lorentz gauge:
. A A
l 1
1 V V 2 (16)
. c
c 2 t
or
A l
2 (17)
V c
1
Where l is the mean space dimension of the studied electric devise, c =
is the velocity of the electromagnetic wave in the studied medium.
So that, one can compeer the two terms constituting the electric field
within the conductor:
A
t
Al
2
l (18)
V V c
l
When electro-magnetic waves are considered under condition e = << 1
l c.
or in term of the time retardation p = << , it is called to be in quasi-
c
stationary approximation regime (QSAR). One can guess the largest domain
of frequency at witch the (QSAR) is valid (for ordinary electric apparatuses
l~1m and f~1GHz). In this assumption of QSAR the potentials (V , A)
respect the same equations as in steady regime:
1 (S , t )
V (M, t) = dV (19)
4 D SM
J (S , t )
A(M, t) =
4 D SM
dV (20)
Where SM is the distance between source and field point. The magnetic
field is B = A andwe have .J = 0 as in steady regime. But, the electric
A
field respects E = - -V that is still not similar to the Fouriers Low.
t
temperature its 4.10-14s. For a bad conductor like the water of the sea: 0.23
m/s and r=81, we found d=1.7 10-10s. The volume density of charges
decreases exponentially and it can be taken zero with a good approximation
when d<<.
In the case of an electric conductor, the local Ohm law is:
J = E (22)
According to the Drde model describing the movement of electrons in a
conductor, this law is available under condition c<<. c is the relaxation
time (time of collision) given by:
m
c = (23)
nq 2
Where, m and q are respectively the electron masse and charge. For example
for cupper we have c10-14s.
In the case of a linear isotropic conductor and in the QSAR assumption
we have:
E
t = 0 << 1 (24)
E .
So that the electric field and the magnetic field intensity
respect the diffusion equation:
(E, H = B )
E
E - =0 (25)
t
In vacuum, we have =0, so that they respect the wave equation:
2 E
E - 0 0 2 = 0 (26)
t
For the transient diffusion of electric field in one dimensional conductor
system, one can set the analogies between T and E or T and B. But we dont
found any electric variable that is similar to the heat flux, so it rests only
mathematical comparison. Unless, inthe assumption of negligible induction
A
phenomena within the conductor 0 . This corresponds for a periodic
t
regime and in complex notation to j A = 0 . Obviously the general case
that respects the last assumption is the steady regime =0. In such a case
the physical similitude presented above (T , q ) (V , E ) is mathematically
convenient and valid for steady regimes. Otherwise, the assumption of neg-
ligible induction within the conductor medium leads to that the only electric
and thermal parameters to be in similitude are resistances. The thermal one
q1=q2=q and one can define the concept of the thermal resistance at a flux
tube t=Rc.q.
V
I (t ) = C t
n (27)
When integrating the heat equation over a sample of the composite medium,
we obtain a result that is in an apparent analogy with the above one:
T
q n = c
t
dV (28)
V
FIGURE 2
Samples used to thermal resistance determination.
value then the initial one of both samples. Thermocouples type K at different
position along them are implanted to measure transient temperature needed
for the resistance estimation. An electronic cart AIM7 is used for the acquisi-
tion. It has a resolution of 1.5V/C.
This study considers one-dimensional heat conduction with zero thermal
capacitance at the contact interface. The mathematical model using the vari-
able i (x,t)=Ti (x,t)-T is:
2i 1 i
= i = 1, 2 (30)
x2 a t
1 (0, t )
1 (0, t ) - 2 (0, t ) = -R (31)
x
1 (0, t ) 2 (0, t )
= (32)
x x
1 (-L1 , t )
(1 - F ) 1 (-L1 , t ) - F = .(1 + cos t ) (33)
x
2 ( L2 , t ) = 0 (34)
1 ( x, 0) = 0 (35)
2 ( x, 0) = 0 (36)
Where = (1 - F )T0 + F0
i ( x, t ) = pi ( x ) + ti ( x, t ) + si ( x, t ) (37)
-
A1 = A2 = (38)
[(1 - F )L1 + F] + (1 - F ) R + L2
.[ R + L2 ]
B1 = (39)
[(1 - F )L1 + F] + (1 - F ) R + L2
.L2
B2 = (40)
[(1 - F )L1 + F] + (1 - F ) R + L2
Let xr be a position of one reference sensor implanted in the first sample and
x the position of a second one. Introducing the temperature ratio at these posi-
p1 ( x ) p 2 ( x)
tions: Fa1 = if x belongs to the first sample or Fa 2 = if
p1 ( xr ) p1 ( xr )
x belongs to the second one. Utilizing equations 38, 39 and 40, then we
obtain the thermal resistance in terms of the measured temperature ratio as
follows:
1 x - L2
R = - L2 - xr + (41)
Fa 2
1 1
R = - L2 + ( xr Fa1 - x) (42)
1 - Fa1
The sinusoidal temperature qs is determined by considering the complex
temperature Wi(x,t)=qsi(x,t)+j.Ui(x,t). Where j = -1 and W respects:
2Wi 1 Wi
2 = i = 1, 2
x a t
W1 (-L1 , t )
(1 - F )W1 (-L1 , t ) - F = .e jt
x
W1 (0, t )
W1 (0, t ) - W2 (0, t ) = -R (43)
x
W (0, t ) W (0, t )
1 = 2
x x
W ( L , t ) = 0
2 2
The solution of the above system is in the form Wi(x,t)=Zi(x).e j. The result
of substituting in 43 is:
2
Z1 ( x ) = . ( MR cosh ( ML2 ) cosh ( Mx ) - sinh M ( x - L2 ) ) (44)
D
2
Z 2 ( x) = - .sinh M ( x - L2 ) (45)
D
j
Where M 2 = and D is a complex number independent of x and time:
a
D = (1 - F) {MR {cosh [M 02 ] + cosh [M 01 ]} + 2 sinh [ M 01 ]}
(46)
- F M {MR {sinh [ M 02 ]- sinh [M 01 ] } - 2 cosh [M 01 ] }
2 2
Zi ( x) = ( fiR ( x ) + j fiI ( x )) = Mi ( x ) e- j(i ( x)-0 ) (47)
D D0
Where:
f
i ( x ) = arctg iI (49)
fiR
2
si ( x, t ) = Re [Wsi ( x, t ) ] = Mi ( x ) cos t - (i ( x ) - 0 ) (50)
D0
The Analytic expression of the amplitude M and the phase one are deter-
mined as functions of the position x and the resistance R. Using
M= (1 + j ) , the different values of the above variables f are derived
2a
1
for both solids in terms of the thermal penetration depth m = = as
follows: 2 a t
2
Where = is the temporal period. So the sinusoidal temperature is
deduced from the measured temperature by elimination of the permanent
one:
1
0
si ( x ) = i ( x, t ) - i ( x, t )dt (56)
2
0
Mi2 ( x ) = si2 ( x, t )dt (57)
Then the phase is easily concluded and finally Fai(x) and Fi(x) are calcu-
lated.
( 2 + 2 ) - ( 2 + 2 ) F 2 R 2 + 2 (b + ) - ( b + ) F 2 R
r r a1 r r r r a1
(58)
+ (b + ) - (br + r ) Fa1 = 0
2 2 2 2 2
tg( x ) - tg( y)
Using the mathematical identity tg( x - y) = , the Expres-
1 + tg( x ).tg( y)
sion of R as a function of phase difference, x belongs to the cylinder 1:
(r - r ) - (r + r ) tg(-F1 ) R 2 + (br + r - r - b r ) -
(br + br + r + r ) tg(-F1 ) R + (59)
(br - b r ) - (bbr + r ) tg(-F1 ) = 0
Expression of R as a function of the amplitude ratio, x belongs to the cylin-
der 2
( 2 + 2 ) F 2 R 2 + 2 ( b + ) F 2 R
r r a 2 r r r r a 2
(60)
+ (br + r ) Fa 2 - (b + ) = 0
2 2 2 2 2
f 2 R ( x ) f 2 I ( x ) 4 m ( L2 - x ) (63)
F1 ( x ) = F 2 ( x ) = 0 (64)
In such a case the thermal resistance respects the same formula as in station-
ary regime:
1 x - L2
R = - L2 - xr + (65)
Fa 2 ( x)
1 1
R = - L2 + ( xr Fa1 ( x ) - x ) (66)
1 - Fa1 ( x )
( x - xr )
-
(67)
Fa1 ( x ) = e t
( x - xr )
2 . Rt - (68)
Fa 2 ( x ) = e t
R
2
The second corresponds to R << = 2 Rt , in such a case we have:
m
( x - xr )
-
Fa1 ( x ) = Fa 2 ( x ) = e t (69)
It is important to note that for high frequencies the thermal resistance doesnt
respect the formula of stationary regime. From the forgoing results and at
the range of high frequencies, Fa1 is independent of the thermal resistance
to be estimated. So, it is recommended to use two sensors one in each sam-
ple. Otherwise, the estimation is not viable for high frequencies when the
x - xr
F 2 Rt - t
R a2 = e (70)
R R
It means that the positions of the reference sensor and the one in the second
sample should be as near as possible to the contact interface. However, for
practical reasons and precision they can not be in the macro-constriction
zone. This coefficient shows that the error made to calculate the thermal
resistance increase exponentially with the relative distance between the sen-
sors to the contact interface.
The measurements are made using many cupper samples and having
different smoothed surfaces. Their lengths and roughness are given in
table 1.
The figures 3, 4, 5 and 6 present the Thermal resistance of two samples
under different pressure. From this figures, it is easy to see that using high
pressures permit to reduce the thermal contact resistance. The obtained ther-
mal resistances are minimal for the samples having the minimum of RMS
surface roughness. The estimated resistance Ra and R are different and fre-
quency dependent. The difference between Ra and R increases when the
frequency increases and it attains 40% at high frequencies. Both of them
are decreasing with a regular manner when the frequency is increased. For
the different samples, Ra is approximately constant for low frequencies
f<0.02Hz. That is in accordance with the mathematical analysis presented
above. The figure 7 presents the evolution of Ra with time for the third sam-
ple, during this experience the frequency is varied and it is found that the
thermal resistance is function of the used frequency and it depends too of the
transient temperature history in the sample. These remarks confirm that we
can not consider zero capacitance at the interface in transient regime and the
concept of a const thermal resistance can be sufficient only when using low
frequencies.
TABLE 1
Roughness of the different samples.
FIGURE 3
Thermal resistance (sample 1), P=2.21 MPa.
FIGURE 4
Thermal resistance (sample 1), P=5.79 MPa.
FIGURE 5
Thermal resistance (sample 2), P=2.12 MPa.
FIGURE 6
Thermal resistance (sample 2), P=5.80 MPa.
FIGURE 7
Thermal resistance (sample 3), P=2.12 MPa.
4 CONCLUSION
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