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CSC-211

Multifunction Protection IED


Engineering and Operation
Manual
Version
V1.00
Doc. Code: 0SF.461.046(E)
Issued Date
2012.8
Copyright owner: Beijing Sifang Automation Co., Ltd

Note: The company keeps the right to perfect the instruction. If equipments do not agree with
the instruction at anywhere, please contact our company in time. We will provide you with
corresponding service.


is registered trademark of Beijing Sifang Automation Co., Ltd.

We reserve all rights to this document, even in the event that a patent is issued and a different
commercial proprietary right is registered. Improper use, in particular reproduction and
dissemination to third parties, is not permitted.

This document has been carefully checked. If the user nevertheless detects any errors, he is
asked to notify us as soon as possible.

The data contained in this manual is intended solely for the IED description and is not to be
deemed to be a statement of guaranteed properties. In the interests of our customers, we
constantly seek to ensure that our products are developed to the latest technological standards
as a result it is possible that there may be some differences between the hardware/software
product and this information product.

Manufacturer:
Beijing Sifang Automation Co., Ltd.

Tel: +86 10 62962554, +86 10 62961515 ext. 8998


Fax: +86 10 82783625
Email: sf_sales@sf-auto.com
Website: http://www.sf-auto.com
Add: No.9, Shangdi 4th Street, Haidian District, Beijing, P.R.C.100085
Preface
Purpose of this manual

This manual describes operation, installation, commissioning, protection test


and putting the IED into service. The manual includes the following chapters:

Introduction, this chapter presents the basic content and have a brief
introduction of this manual

Local human machine interface, this chapter presents the configuration


of HMI interface and how to use the HMI

Installing the IED, this chapter introduces the procedure to install IED and
how to check that the IED is properly connected to the protection system

Read and change setting, this chapter introduces how to read and
change the setting value via LHMI or software tool, and switch the setting
value group

Testing the communication connection and time synchronization, this


chapter presents how to test the communication port connection and
introduces how to test time synchronization

IED testing, this chapter contains that what should be tested and how to
test the IED

Operating maintenance, this chaper describes the items for maintenance


and how to maintain the IED when operating

Transportion and storage, this chapter presents how to transport and


store the IED

Appendix, this chapter presents the significant data and diagram of the
IED

Target audience

This manual mainly face to installation engineer, commissioning engineer and


operation engineer with perfessional electric and electrical knowledge, rich
experience in protection function, using protection IED, test IED, responsible
for the installation, commissioning, maintenance and taking the protection
IED in and out of normal service.

Applicability of this manual

This manual is valid for CSC-211 Multifunction Protection IED.

Technical support

In case of further questions concerning the CSC family, please contact Sifang
compay or your local Sifang representative.

Safety information

Strictly follow the company and international safety regulations.


Working in a high voltage environment requires serious approch to
aviod human injuries and damage to equipment

Do not touch any circuitry during operation. Potentially lethal


voltages and currents are present

Avoid to touching the circuitry when covers are removed. The IED
contains electirc circuits which can be damaged if exposed to static
electricity. Lethal high voltage circuits are also exposed when covers
are removed

Using the isolated test pins when measuring signals in open circuitry.
Potentially lethal voltages and currents are present

Never connect or disconnect wire and/or connector to or from IED


during normal operation. Dangerous voltages and currents are
present. Operation may be interrupted and IED and measuring
circuitry may be damaged

Always connect the IED to protective earth regardless of the


operating conditions. Operating the IED without proper earthing may
damage both IED and measuring circuitry and may cause injuries in
case of an accident.

Do not disconnect the secondary connection of current transformer


without short-circuiting the transformers secondary winding.
Operating a current transformer with the secondary winding open will
cause a high voltage that may damage the transformer and may
cause injuries to humans.

Do not remove the screw from a powered IED or from an IED


connected to power circuitry. Potentially lethal voltages and currents
are present

Using the certified conductive bags to transport PCBs (modules).


Handling modules with a conductive wrist strap connected to
protective earth and on an antistatic surface. Electrostatic discharge
may cause damage to the module due to electronic circuits are
sensitive to this phenomenon

Do not connect live wires to the IED, internal circuitry may be


damaged

When replacing modules using a conductive wrist strap connected to


protective earth. Electrostatic discharge may damage the modules
and IED circuitry

When installing and commissioning, take care to avoid electrical


shock if accessing wiring and connection IEDs

Changing the setting value group will inevitably change the IEDs
operation. Be careful and check regulations before making the
change
Contents
Chapter 1 IED Introduction ...............................................................................................................1
Chapter 2 Local human machine interface ....................................................................................3
1 Introduction .......................................................................................................................................4
2 Liquid crystal display (LCD) ...........................................................................................................5
3 LED ....................................................................................................................................................6
4 Keyboard...........................................................................................................................................7
5 IED menu ..........................................................................................................................................8
5.1 Menu construction ...........................................................................................................8
5.2 Operation status.............................................................................................................10
5.3 Operation configuration ................................................................................................10
5.4 Settings ...........................................................................................................................10
5.5 Report ..............................................................................................................................10
5.6 Communication configuration ......................................................................................11
5.7 Testing .............................................................................................................................11
5.8 Device setup ...................................................................................................................11
5.9 Device information .........................................................................................................13
Chapter 3 Installing IED ..................................................................................................................15
1 Unpacking and checking the IED ................................................................................................16
2 Installing the IED............................................................................................................................17
3 IED connection ...............................................................................................................................18
3.1 IED connector.................................................................................................................18
3.1.1 Introduction .............................................................................................................18
3.1.2 Terminals of Analogue Input Module (AIM) ........................................................19
3.1.3 Terminals of Fast binary Input & Output Module (FIO) ....................................23
3.1.4 Terminals of Fast binary Output Module (FOM) ................................................24
3.1.5 Terminals of Binary Input & Output module (BIO).............................................25
3.1.6 Terminals of CPU module (CPU).........................................................................26
3.1.7 Terminals of Power Supply Module (PSM) ........................................................27
3.1.8 RS232 port ..............................................................................................................28
3.2 Connecting to protective earth .....................................................................................28
3.3 Connecting the power supply module ........................................................................28
3.4 Connecting to CT and VT circuits ...............................................................................28
3.5 Connecting the binary inputs and outputs..................................................................28
3.6 Making the screen connection .....................................................................................29
3.7 RS485 and RS232 ports connection ..........................................................................29
3.7.1 RS485 port connection .........................................................................................29
3.7.2 RS232 port connection .........................................................................................30
3.8 Connecting the GPS...................................................................................................... 30
4 Checking before energizing .........................................................................................................32
4.1 Introduction .....................................................................................................................32
4.2 Checking the protective earth connection ................................................................. 32
4.3 Checking the power supply connection ..................................................................... 32
4.4 Checking the CT and VT circuits connection ............................................................ 32
4.4.1 Checking the CT circuits connection .................................................................. 32
4.4.2 Checking the VT connection ................................................................................ 33
4.5 Checking the binary input and output connection .................................................... 33
4.5.1 Checking the binary input connection ................................................................ 33
4.5.2 Checking the binary output connection .............................................................. 34
4.6 Checking the screened cables connection ................................................................ 34
4.7 Checking the S485 and RS232 port connectios ....................................................... 34
4.7.1 Checking the RS485 port connection ................................................................. 34
4.7.2 Checking RS232 port connection ....................................................................... 34
4.8 Checking GPS connection ........................................................................................... 34
4.9 Checking the insulation voltage and insulation resistance ..................................... 34
4.9.1 Checking the insulation voltage .......................................................................... 34
4.9.2 Checking the insulation resistance ..................................................................... 35
5 Checking after energizing ............................................................................................................ 36
5.1 Introduction..................................................................................................................... 36
5.2 Test LCD......................................................................................................................... 36
5.3 Test the keyboard.......................................................................................................... 36
5.4 Setting the IED time ...................................................................................................... 36
5.5 Checking the software and hardware version ........................................................... 37
Chapter 4 Read and change setting ............................................................................................. 39
1 Read and change the setting vaule ............................................................................................ 40
1.1 Read and change the setting value via LHMI ........................................................... 40
1.1.1 Introduction ............................................................................................................. 40
1.1.2 Communication parameter................................................................................... 40
1.1.3 Setting values, binary settings and soft connetors for protection function ... 41
2 Switching the setting group.......................................................................................................... 43
2.1 Introduction..................................................................................................................... 43
2.2 Method for switching setting group via LHMI ............................................................ 43
2.3 Method for switching setting group via binary input ................................................. 43
Chapter 5 Testing the communication connection and time synchronization ......................... 45
1 Testing the communication connection ...................................................................................... 46
1.1 Testing the Ethernet communication .......................................................................... 46
1.1.1 Testing the electrical Ethernet communication ................................................. 46
1.1.2 Testing the optical Ethernet communication...................................................... 46
1.2 Testing the RS485 port................................................................................................. 46
1.3 Testing the RS232 port................................................................................................. 46
2 Testing the time synchronization ................................................................................................. 48
2.1 Network mode ................................................................................................................ 48
2.2 IRIG-B mode .................................................................................................................. 48
Chapter 6 IED testing ...................................................................................................................... 49
1 Introduction..................................................................................................................................... 50
2 Points for attention during testing................................................................................................52
3 Preparing for test ...........................................................................................................................54
3.1 Introduction .....................................................................................................................54
3.2 Connecting test equipment to IED ..............................................................................54
4 Testing the power supply ..............................................................................................................56
4.1 Checking the self-startup performance ......................................................................56
4.2 DC power on and power off testing.............................................................................56
4.3 Checking the expiry date of power supply .................................................................56
5 Checking the analog channel ......................................................................................................57
5.1 Checking and adjusting the zero drift .........................................................................57
5.2 Checking and calibrating ..............................................................................................57
6 Testing binary input .......................................................................................................................59
7 Testing binary output .....................................................................................................................60
8 Verifying the IED functions ...........................................................................................................61
8.1 Overcurrent protection ..................................................................................................61
8.1.1 Verifying the settings .............................................................................................61
8.1.2 Completing the test................................................................................................68
8.1.3 Reference setting list for test ...............................................................................68
8.2 Earth fault protection ..................................................................................................... 70
8.2.1 Verifying the settings .............................................................................................70
8.2.2 Completing the test................................................................................................76
8.2.3 Reference setting list for test ...............................................................................76
8.3 Sensitive earth fault protection ....................................................................................78
8.3.1 Verifying the settings .............................................................................................78
8.3.2 Completing the test................................................................................................83
8.3.3 Reference setting list for test ...............................................................................83
8.4 Negative sequence overcurrent protection ................................................................85
8.4.1 Verifying the settings .............................................................................................85
8.4.2 Completing the test................................................................................................88
8.4.3 Reference setting list for test ...............................................................................88
8.5 Switch-onto-fault protection..........................................................................................89
8.5.1 Verifying the settings .............................................................................................89
8.5.2 Completing the test................................................................................................92
8.5.3 Reference setting list for test ...............................................................................92
8.6 Overload protection .......................................................................................................92
8.6.1 Verifying the settings .............................................................................................93
8.6.2 Completing the test................................................................................................95
8.6.3 Reference setting list for test ...............................................................................95
8.7 Overvoltage protection ..................................................................................................95
8.7.1 Verifying the settings .............................................................................................96
8.7.2 Completing the test..............................................................................................100
8.7.3 Reference setting list for test .............................................................................100
8.8 Undervoltage protection..............................................................................................101
8.8.1 Verifying the settings ...........................................................................................101
8.8.2 Completing the test ............................................................................................. 107
8.8.3 Reference setting list for test ............................................................................. 107
8.9 Thermal overload protection ...................................................................................... 108
8.9.1 Verifying the settings ........................................................................................... 108
8.9.2 Completing the test ............................................................................................. 113
8.9.3 Reference setting list for test ............................................................................. 113
8.10 Displacement voltage protection ............................................................................... 114
8.10.1 Verifying the settings ........................................................................................... 114
8.10.2 Completing the test ............................................................................................. 117
8.10.3 Reference setting list for test ............................................................................. 118
8.11 Circuit breaker failure protection ............................................................................... 118
8.11.1 Verifying the settings of stage 1 of CBF protection ........................................ 119
8.11.2 Completing the test ............................................................................................. 122
8.11.3 Reference setting list for test ............................................................................. 123
8.12 Dead zone protection.................................................................................................. 123
8.12.1 Verifying the settings ........................................................................................... 124
8.12.2 Completing the test ............................................................................................. 125
8.12.3 Reference setting list for test ............................................................................. 125
8.13 Synchro-check and energizing check function ....................................................... 125
8.13.1 Verifying the settings ........................................................................................... 125
8.13.2 Completing the test ............................................................................................. 132
8.13.3 Reference setting list for test ............................................................................. 132
8.14 Auto-recloser ................................................................................................................ 134
8.14.1 Verifying the settings ........................................................................................... 134
8.14.2 Completing the test ............................................................................................. 134
8.14.3 Reference setting list for test ............................................................................. 135
8.15 Low(under) frequency load shedding protection .................................................... 137
8.15.1 Verifying the settings ........................................................................................... 137
8.15.2 Completing the test ............................................................................................. 141
8.15.3 Reference setting list for test ............................................................................. 141
8.16 Low voltage load shedding protection ...................................................................... 142
8.16.1 Verifying the settings ........................................................................................... 142
8.16.2 Completing the test ............................................................................................. 146
8.16.3 Reference setting list for test ............................................................................. 146
8.17 Overload load shedding protection ........................................................................... 147
8.17.1 Verifying the settings ........................................................................................... 147
8.17.2 Completing the test ............................................................................................. 150
8.17.3 Reference setting list for test ............................................................................. 151
8.18 Unbalance protection .................................................................................................. 151
8.18.1 Verifying the settings ........................................................................................... 152
8.18.2 Completing the test ............................................................................................. 155
8.18.3 Reference setting list for test ............................................................................. 155
8.19 Under current monitoring ........................................................................................... 156
8.19.1 Verifying the settings ........................................................................................... 156
8.19.2 Completing the test..............................................................................................158
8.19.3 Reference setting list for test .............................................................................158
8.20 Current overload monitoring.......................................................................................158
8.20.1 Verifying the settings ...........................................................................................158
8.20.2 Completing the test..............................................................................................161
8.20.3 Reference setting list for test .............................................................................161
8.21 Control circuit faulty supervising................................................................................162
8.21.1 Verifying the settings ...........................................................................................162
8.21.2 Completing the test..............................................................................................163
8.21.3 Reference setting list for test .............................................................................163
8.22 Current transformer secondary circuit supervision ................................................. 164
8.22.1 Verifying the settings ...........................................................................................164
8.22.2 Completing the test..............................................................................................165
8.22.3 Reference setting list for test .............................................................................165
8.23 Voltage transformer secondary circuit supervision................................................. 165
8.23.1 Verifying the settings ...........................................................................................166
8.23.2 Completing the test..............................................................................................173
8.23.3 Reference setting list for test .............................................................................173
8.24 Monitoring function ......................................................................................................174
8.24.1 Auxiliary contact of circuit breaker monitoring................................................. 174
9 Checking before operation .........................................................................................................176
9.1 Checking the LED ........................................................................................................176
9.2 Checking the display on LCD.....................................................................................176
9.3 Checking the clock ......................................................................................................176
9.4 Checking the voltage and current .............................................................................176
9.5 Checking the setting group ........................................................................................176
9.6 Checking the setting .................................................................................................... 176
9.7 Checking the binary input ...........................................................................................177
9.8 Checking the normal operation mode.......................................................................177
9.8.1 Trip and close test with the circuit breaker.......................................................177
9.9 Put into operation.........................................................................................................177
Chapter 7 Operating maintenance ..............................................................................................179
1 Attentions during operating ........................................................................................................180
2 Routine checking .........................................................................................................................182
3 Periodical checking .....................................................................................................................183
4 The alarm information .................................................................................................................184
4.1 Alarm information class I and the description..........................................................184
4.2 Alarm information class II and the description for M1 ............................................184
Chapter 8 Transportation and storage ........................................................................................189
1 Transportion..................................................................................................................................190
2 Storage ..........................................................................................................................................191
Chapter 9 Appendix .......................................................................................................................193
1 Arrangement diagram of modules.............................................................................................194
2 Typical diagram ............................................................................................................................195
Chapter 1 IED Introduction

Chapter 1 IED Introduction

About this chapter


This chapter presents the overview of the operation and
engineering about the IED.

1
Chapter 1 IED Introduction
The Human Machine Interface (HMI) on the IED provides an ideal
mechanism for the day to day operation and even advanced use of the IED.
The keyboard, LCD and LEDs on the front of the IED are what constitute the
HMI. Troubleshooting, monitoring, setting and configuring are all possible via
this interface. Through the screens and menu elements available, as well as
the keypad, the user is able to navigate throughout the menu structure and
move from screen to screen.

The IED is unpacked and visually checked. The connection to the protection
system has to be checked in order to verify that the installation is successful.

The settings for each function must be calculated before the commissioning
task. The functions setting menu have been listed in detail so that the user
can find and change the required settings directly and correctly. For the
different application, the IED can be performed conveniently through
switching the setting group.

For the functions included in the IED can be tested by users, the testing
procedure have been listed as reference to verify that protection function
operate correctly.

After the IED is in service, some checking items also need to be done for
maintenance in order to ensure that the IED is in good condition during
operation, some suggestions have been preset as reference and the user can
perform some other checking items according to the relevant regulations.

2
Chapter 2 Local human machine interface

Chapter 2 Local human machine


interface

About this chapter


This chapter describes the structure of human-machine
interface (HMI), LCD, LED, keyboard, RS232 and IED menu.
Instruction on how to operate with keys, how to configure the
LED and menu information introduction.

3
Chapter 2 Local human machine interface

1 Introduction
The HMI is simple and easy to be used for routine operation, the front panel
of the HMI consists of LCD, LED and keyboard. As shown in the following
picture, the setting, configuration, monitoring, maintenance and fault analysis
can be performed in HMI.

Figure 1 Front plate

1. Liquid crystal display (LCD)

2. LEDs

3. Arrow keys

4. Reset key

5. Quit key

6. Set key

7. RS232 communication port

4
Chapter 2 Local human machine interface

2 Liquid crystal display (LCD)


When operating keys are pressed or in the case of IED alarming or operating
report appearance, the back light will turn on automatically until the preset
time delay elapse after the latest operation or alarm.

5
Chapter 2 Local human machine interface

3 LED
There are 11 LEDs on the left side of the LCD. The definition for each LED is
shown as following table.

Table 1 HMI keys on the front of the IED

NO. Definition Color Explanation


Green The IED operate nomally
1. Run/Alarm
Red The alarm is issued
Green The overcurrent protection is enabled
2. OC
Red The overcurrent protection has operated
Green The earth fault protection is enabled
3. EF
Red The earth fault protection has operated
Green The sensitive earth fault protection is enabled
4. SEF
Red The sensitive earth fault protection has operated
Green The negative sequence overcurrent protection is enabled
5. NSOC The negative sequence overcurrent protection has
Red
operated
The circuit breaker failure or dead zone protection is
Green
enabled
6. CBF/DZ
The circuit breaker failure or dead zone protection has
Red
operated
Green The thermal overload protection is enabled
7. Themal OL
Red The thermal overload protection has operated
Green The displacement voltage protection is enabled
8. 3V0
Red The displacement voltage protection has operated
Green The overvoltage or undervoltage protection is enabled
9. OV/UV
Red The overvoltage or undervoltage protection has operated
Green The load shedding protection is enabled
10. Load SHED
Red The load shedding protection has operated
Green The autorecloser or manual reclose function is enabled
11. AR/MC
Red The autorecloser or manual reclose function has operated

6
Chapter 2 Local human machine interface

4 Keyboard
The keyboard is used to monitor and operate IED. The keyboard has the
same look and feel in CSC family. As shown in Figure 1, keyboard is divided
into Arrow keys, Reset key, Quit key and Set key. The specific instructions on
the keys as the following table described:

Table 2 HMI keys on the front of the IED

Key Function
Up arrow key Move up in menu
Page up between screens
Increase value in setting
Down arrow key Move down in menu
Page down between screens
Decrease value in setting
Left arrow key Move left in menu
Right arrow key Move Right in menu
Reset key Reset the LEDs
Return to normal scrolling display state directly
Set key Enter main menu or submenu
Confirm the setting change
Quit key Back to previous menu
Cancel the current operation and back to previous menu
Return to scrolling display state
Lock or unlock current display in the scrolling display state (the
lock state is indicated by a "solid diamond" type icon on the botton
right corner of the LCD)

7
Chapter 2 Local human machine interface

5 IED menu

5.1 Menu construction

Analog BI

Metering Connect
OpStatus
Energy GOOSEINF

GOO Ctrl GOOSESUB

Switch Time
OpConfig
Connect GOO Ctrl

Read Switch
Settings
Write Delete

Event Operation

Report Alarm Clear

Wave

MainMenu
Eth 1# Serial

ComConf Eth 2# Label

Monitor

BO Zero

BI Remote
Testing
LED Test TestMode

Accuracy

Module Print

DevSetup Remote Metering

SysParam Backlit

DevInfo Version OpInfo

8
Chapter 2 Local human machine interface
Table 3 Full name for the menu

Sub-menu Full name Sub-sub menu Full name


Analog Analog
Metering Metering
Energy Energy
GOO Ctrl GOOSE control
OpStatus Operation status
BI Binary input
Connect Connector
GOOSEINF COOSE information
GOOSESUB GOOSE subscribe
Switch Switch
Operation Connect Connector
OpConfig
configuration Time Time
GOO Ctrl GOOSE control
Read Read
Write write
Settings Settings
Switch Switch
Delete Delete
Event Event
Alarm Alarm
Report Report Wave Wave
Operation Operation
Clear Clear
Eth 1# Ethernet port 1
Eth 2# Ethernet port 2
Communication
ComConf Monitor Monitor
configuration
Serial Serial port
Label Label
BO Binary output
BI Binary input
LED Test LED Test
Testing Testing Accuracy Accuracy
Zero Zero drift
Remote Remote
TestMode Test mode
Module Module
Remote Remote
SysParam System parameter
DevSetup Device setup
Print Print
Metering Metering
Backlit Back light
DevInfo Device Version Version

9
Chapter 2 Local human machine interface
Sub-menu Full name Sub-sub menu Full name
information OpInfo Operation information

5.2 Operation status

Sub menu Sub-sub menu Explanation


Analog Read the analog input of the IED
Metering Read the measurement analog input of the IED
Energy Read the energy inputs of the IED
GOO Ctrl Read the status of the GOOSE connector
OpConfig
BI Read the status of binary inputs
Connect Read the status of the connector
GOOSEINF Read the transmission of the report
GOOSESUB Read the information of the GOOSE

5.3 Operation configuration

Sub menu Sub-sub menu Explanation


Switch Switching setting group
Connect Enable or disable the protection function
OpConfig
Time Setting the current time of the IED
GOO Ctrl Function related GOOSE ON/OFF

5.4 Settings

Sub menu Sub-sub menu Explanation


Read Read the settings
Write Set the settings
Settings
Switch Switch setting group
Delete Delete settings

5.5 Report

Sub menu Sub-sub menu Explanation


Event Display latest 40 event records
Alarm Display latest 40 alarm records
Report Wave Display latest 10 recording wave
Operation Display latest 40 IED operation records
Clear Clear all history reports saved by the IED and delete

10
Chapter 2 Local human machine interface
Sub menu Sub-sub menu Explanation
unnecessary test records before IED operation.

5.6 Communication configuration

Sub menu Sub-sub menu Explanation


Eth 1# Set Ethernet port 1 in CPU module.
Eth 2# Set Ethernet port 2 in CPU module.
Monitor Set parameter related BIO module
ComConf Serial Serial 1 is used for SIO in panel, serial 2 is used for 485
port in CPU module and Serial 3 is reserved for dual
485 CPU module.
Label Set IED address (hex), STA name and Bay name

5.7 Testing

Sub menu Sub-sub Sub-sub-sub Explanation


menu menu
BO Test the binary outputs
BI Test the binary inputs
LED Test Test the panel LED
Test the analog quantites precision and
Accuracy
linearity
Zero View the zero drift
Event Report event report to monitor and SCADA
Alarm Report alarm report to monitor and SCADA
Testing Report the virtual SOE event to the monitor
Remote Signal
and SCADA
Report virtual remote measurement
Metering
over-limit event to the monitor and SCADA
The IED enters/exit test state, and it will not
send the event information to the local
TestMode monitor and remote communication under
the test state. The IED should exit the test
status after the test completed

5.8 Device setup

Sub menu Sub-sub Sub-sub-sub Explanation


menu menu

11
Chapter 2 Local human machine interface
Sub menu Sub-sub Sub-sub-sub Explanation
menu menu
Hardware support is necessary, the setup
NetConf must be consistent with the hardware, and
LON/485/Ethernet are optional
The default is the soft connector mode, for
soft and hard combined mode, only the
Connect specific protection hard contact is provided,
Module
the other protection hard connector starts up
by default
BIO module setup depends on the practical
BIO
equipment
AI module setup depends on the practical
sql
equipment
Setup of CSC2000 protocol, identify the
CSC2000 communication requirement of this station
and practical hardware configuration
Setup of 103 protocol, identify the
Prot103 communication requirement of this station
and practical hardware configuration
Remote Setup of 61850 protocol, identify the
IEC61850 communication requirement of this station
and practical hardware configuration
DevSetup
Setup of signal, protocol version, report
Signal parameter and time synchronization, identify
the external condition of this station
Setup of the related parameters for external
Modify
conditions
SysParam
Load the default value when upgrade CPU
Default
program
Print Set network printer address
Adjust the compensation coefficient of the
Zero measurement module under the zero input
status
Scale Scale adjustment
Metering Confirm and save zero setup and scale
Save
setup
Clear the current memorized operation value
Reset of the measurement module (power and
impulse counter)
Set the back light to keep constant on or
Backlit automatically turn off when the keyboard is
free

12
Chapter 2 Local human machine interface

5.9 Device information

Sub menu Sub-sub Sub-sub-sub Explanation


menu menu
Display the version of protection program,
Version protection scheme, MMI program, and IED
firmware.
DevInfo Display operation statistical data of the BIO
BIO Com
communication.
OpInfo
Display operation statistical data of the MMI
MMI
communication.

13
Chapter 2 Local human machine interface

14
Chapter 3 Installing IED

Chapter 3 Installing IED

About this chapter


This chapter describes how to install the protection IED,
introduces connection of the contactor, analogue quantities,
binary inputs and outputs and power supply, and what should to
do before and after energizing.

15
Chapter 3 Installing IED

1 Unpacking and checking the IED


Procedure:

1. Remove the transporting case

2. Visually inspect the IED

3. Check all items included in accordace with the delivery documents. Once
the IED has been started make sure that the software functions ordered
have been included in the delivery

4. Check for transport damages

If transport damage is discovered appropriate action must be taken


against the latest carrier and the latest SiFang office or representative
should be informed. If there are any discrepancies in relation to the
delivery documents, the SiFang company should be notified immediately

5. If the protection IED is repacked for transport again, the storage packing
of the IED must provide proper degree of protection against possible
damage, in accordance with the standard of IEC 60255-21-1 class 1 and
IEC 60255-21-2 class 1

16
Chapter 3 Installing IED

2 Installing the IED


Procedure:

1. Insert the IED into cabinet and the bottom of the IED should be supported
on the frame of cabinet

2. Fix the IED by tightening all screws against the cabinet. The IED should
be fixed in the cabinet and each screw should be firmed

3. Connect the earthing screw on the rear panel to the nearest protective
earthing point in the cubicle. The protective earth cables should be green
or yellow conductors with cross-sectional area 2.5mm2 according to
electrical regulations and electrical standards requirement

The cubicle must be properly connected to station earthing system, using


the conductor with cross-sectional area of at least 4mm2.

4. Power supply module connection

The wiring from the cubicle terminal block to the IED terminals must be
connected in accordance with the established guidelines for this type of
IED. The wires from binary inputs and outputs and the auxiliary power
supply must be routed separated from the current transformer cables
between the terminal blocks of the cubicle and the IEDs connections.

5. Connection to CT and VT circuits

CT and VT are connected to the analogue input module on the rear side
of the IED.

6. Connecting the binary input and output signals

Auxiliary power supply and binary input and output signals are connected
using female connectors. Signal wires are connected to a female
connector, which is then plugged into the corresponding male connector,
located at the rear of the IED.

17
Chapter 3 Installing IED

3 IED connection

3.1 IED connector

3.1.1 Introduction

The quantity and designation of connectors depend upon the ordering


information and application. The rear cover plates are prepared with enough
space for each configuration in ordering information.

18
Chapter 3 Installing IED

3.1.2 Terminals of Analogue Input Module (AIM)

A. Terminals of Analogue Input Module A series

Table 4 Description of terminals of AIM A


I01 series
I02
I03 Analogue
Terminal Remark
Protection
I04 Input
I05 I01 I1 Star point

I06 I02 I1
I03 Null
I07
I04 Null
I08
I05 Null
I09
I06 Null
I10
I07 Null
Metering

I11 I08 Null


I12 I09 Null
I10 Null
Star point,
I11 ImB
for metering
Figure 2 Terminals arrangement of AIM A
series For
I12 ImB
metering

19
Chapter 3 Installing IED

B. Terminals of Analogue Input Module B series

Table 5 Description of terminals of AIM B


I01 series
I02
U03 Analogue
Terminal Remark

Protection
U04 Input
U05 I01 I1 Star point

U06 I02 I1
U03 UC1 Star point
U07
U04 UC1
U08
U05 UC2 Star point
I09
U06 UC2
I10
U07 UC3 Star point
Metering

I11 U08 UC3


I12 I09 Null
I10 Null
Star point,
I11 ImB
for metering
Figure 3 Terminals arrangement of AIM B
series For
I12 ImB
metering

20
Chapter 3 Installing IED

C. Terminals of Analogue Input Module C series

Table 6 Description of terminals of AIM C


series

Analogue
Terminal Remark
Input
I01 I1 Star point
I02 I1
I03 IC1 Star point
I04 IC1
I05 IC2 Star point
I06 IC2
I07 IC3 Star point
I08 IC3
I09 Null
I10 Null
Star point,
I11 ImB
for metering
Figure 4 Terminals arrangement of AIM C
series For
I12 ImB
metering

21
Chapter 3 Installing IED

D. Terminals of Analogue Input Module C series

Table 7 Description of terminals AIM D-1 of


AIM D series

Analogue
Terminal Remark
Input
I01 IA Star point
I02 IA
I03 IB Star point
I04 IB
I05 IC Star point
I06 IC
I07 I0 Star point
I08 I0
Star point
I09 ImA
For metering
I10 ImA For metering
Star point For
I11 ImC
metering
I12 ImC For metering

Table 8 Description of terminals AIM D-2 of


AIM D series

Terminal Definition Remark


U01 UA Star point
U02 UB Star point
U03 UC Star point
Figure 5 Terminals arrangement of AIM D U04 UN
series U05 U4 Star point
U06 U4

22
Chapter 3 Installing IED

3.1.3 Terminals of Fast binary Input & Output Module (FIO)

Table 9 Definition of terminals of FIO

Output
Terminal Definition
relay
01 Binary input 1
02 Binary input 2
03 Binary input 3
04 Binary input 4
Common terminal
for all binary
05 inputs above,
connect with DC
negative terminal
06 Null
07 Trip contact 1-1 Relay 1
08 Trip contact 1-0 Relay 1
09 Trip contact 2-1 Relay 2
10 Trip contact 2-0 Relay 2
11 Trip contact 3-1 Relay 3
12 Trip contact 3-0 Relay 3
13 Trip contact 4-1 Relay 4
14 Trip contact 4-0 Relay 4
15 Trip contact 5-1 Relay 5
16 Trip contact 5-0 Relay 5
17 Trip contact 6-1 Relay 6
18 Trip contact 6-0 Relay 6
19 Trip contact 7-1 Relay 7
20 Trip contact 7-0 Relay 7
Figure 6 Terminals arrangement of FIO

23
Chapter 3 Installing IED

3.1.4 Terminals of Fast binary Output Module (FOM)

Table 10 Definition of terminals of FOM

Output
Terminal Definition
relay
01 Trip contact 1-1-1 Relay 1
02 Trip contact 1-1-0 Relay 1
03 Trip contact 1-2-1 Relay 1
04 Trip contact 1-2-0 Relay 1
05 Trip contact 2-1-1 Relay 2
06 Trip contact 2-1-0 Relay 2
07 Trip contact 2-2-1 Relay 2
08 Trip contact 2-2-0 Relay 2
09 Trip contact 3-1-1 Relay 3
10 Trip contact 3-1-0 Relay 3
11 Trip contact 3-2-1 Relay 3
12 Trip contact 3-2-0 Relay 3
13 Trip contact 4-1-1 Relay 4
14 Trip contact 4-1-0 Relay 4
15 Trip contact 4-2-1 Relay 4
16 Trip contact 4-2-0 Relay 4
17 Trip contact 5-1-1 Relay 5
18 Trip contact 5-1-0 Relay 5
19 Trip contact 5-2-1 Relay 5
20 Trip contact 5-2-0 Relay 5
Figure 7 Terminals arrangement of FOM

24
Chapter 3 Installing IED

3.1.5 Terminals of Binary Input & Output module (BIO)

Table 11 Definition of terminals of BIO


01
Relay 1
Terminal Definition Remark
02
Relay 2 Common
01 Contact group 1-0
03 terminal
04
02 Contact group 1-1 Relay 1
Relay 3

05 03 Contact group 1-2 Relay 2


06 04 Contact 2-0 Relay 3
Relay 4

07 05 Contact 2-1 Relay 3


Relay 5 Common
06 Contact group 3-0
08 terminal
09
Relay 6
07 Contact group 3-1 Relay 4
10 08 Contact group 3-2 Relay 5
Relay 7
Common
11 09 Contact group 4-0
terminal
12
Relay 8 10 Contact group 4-1 Relay 6
13 11 Contact group 4-2 Relay 7
Relay 9
Common
14 12 Contact group 5-0
terminal
15
13 Contact group 5-1 Relay 8
16 14 Contact group 5-2 Relay 9
15 Binary input 1
17
16 Binary input 2
18 17 Binary input 3
18 Binary input 4
19
19 Binary input 5
20
20 Binary input 6

21 21 Binary input 7
Common terminal
DC -
22 for all binary
22 inputs, connect
Figure 8 Terminals arrangement of BIO with AUX.DC
negative terminal

25
Chapter 3 Installing IED

3.1.6 Terminals of CPU module (CPU)

Table 12 Definition of terminals of CPU

Terminal Definition

01 Binary input 1
02 Binary input 2
03 Binary input 3
04 Binary input 4
05 Binary input 5
06 Binary input 6
07 Binary input 7
Common terminal for all
08 binary inputs above, connect
with DC -24V. terminal
09 Time synchronization
10 Time synchronization GND
11 RS485 port - 1B
12 RS485 port - 1A
Optional optical fiber or RJ45
Ethernet
port for station automation
Port A
system
Optional optical fiber or RJ45
Ethernet
port for station automation
Port B
system

Figure 9 Terminals arrangement of CPU

26
Chapter 3 Installing IED

3.1.7 Terminals of Power Supply Module (PSM)

Table 13 Definition of terminals of PSM

Terminal Definition

01 Binary input 1
02 Binary input 2
03 Binary input 3

Binary inputs
04 Binary input 4
05 Binary input 5
06 Binary input 6
07 Binary input 7
08 Binary input 8
09 Binary input 9
Common terminal for all
binary inputs above, connect
10
with AUX.DC negative
terminal
11 AUX.DC 24V+ output
DC 24V
output

12 AUX.DC 24V- output


13 Alarm contact (NC) 0
14 Alarm contact (NC) 1
Alarm

15 Isolated terminal, not wired


16 AUX. power input 1, DC +
17 Isolated terminal, not wired
18 AUX. power input 2, DC -
Power input

Figure 10 Terminals arrangement of PSM

27
Chapter 3 Installing IED

3.1.8 RS232 port

RS232 serial port is located on front panel, the software tool in PC can be
connected with the IED via this port to make setting, testing and cofiguration,
etc.

3.2 Connecting to protective earth

Connect the earthing screw on the rear panel to the nearest protective
earthing point in the cubicle. The protective earth cables should be green or
yellow conductors with cross-sectional area 2.5mm2 according to electrical
regulations and electrical standards requirement.

The cubicle must be properly connected to station earthing system, using the
conductor with cross-sectional area of at least 4mm2.

3.3 Connecting the power supply module

The wiring from the cubicle terminal block to the IED terminals must be
connected in accordance with the established guidelines for this type of IED.
The wires from binary inputs and outputs and the auxiliary power supply must
be routed separated from the current transformer cables between the terminal
blocks of the cubicle and the IEDs connections.

3.4 Connecting to CT and VT circuits

CT and VT are connected to the analogue input module on the rear side of
the IED.

Using solid conductor with cross-sectional 2.5-6mm2 (AWG14-10) or stranded


conductor with cross-sectional 2.5-4mm2 (AWG14-12). The screws used for
fixation conductor should be tightened.

3.5 Connecting the binary inputs and outputs

Auxiliary power supply and binary input and output signals are connected
using female connectors. Signal wires are connected to a female connector,
which is then plugged into the corresponding male connector, located at the

28
Chapter 3 Installing IED
rear of the IED.

Procedure:

1. Connect signals to the female connector

All wiring to the female connector should be done before it is plugged into
the male part and screwed to the case. The conductors can be of rigid
type (solid, stranded) or of flexible type.

The female connectors accept conductors with a cross section area of


0.2-1.5 mm2 (AWG 24-15). If two conductors are used in the same
terminal, the maximum permissible cross section area is 0.2-0.8 mm2
(AWG 24-18, each conductor corresponding to one cross section area).

If two conductors, each with area 1.5 mm2 (AWG 15) need to be
connected to the same terminal, a ferrule must be used to combine the
two conductors, no soldering is needed. Wires with a smaller gauge can
be inserted directly into the female connector receptacle and the
fastening screw shall be tightened.

2. Plug the connector to the corresponding back-side mounted male


connector

3. Lock the connector by fastening the lock screws

3.6 Making the screen connection

When using screened cables always make sure screens are earthed and
connected according to applicable engineering methods. This may include
checking for appropriate earth points near the IED, for instance, in the cubicle
and/or near the source of measuring. Ensure that earth connections are
made with short conductors of an adequate cross section, at least 6 mm2
(AWG10) for single screen connections.

3.7 RS485 and RS232 ports connection

3.7.1 RS485 port connection

The RS485 interface is capable of half-duplex service with the signals A/A'
and B/B' to transmit signals.

29
Chapter 3 Installing IED
The network topology of RS485 adopts bus type of terminal matched, do not
support ring or star network. Use the single and continuous channel as bus.
The terminating resistance is located on beginning and terminal of the bus
cable. The other ports do not need the terminating resistance.

As shown in Figure 9, RS485 port located on the rear side of communication


module. The IED provides two electrical isolation RS485 ports, the two ports
can work at the same time with IEC60870-5-103 protocol supported.

3.7.2 RS232 port connection

One RS232 serial port is provided and located on front panel, which is used to
connect personal computer. The RS232 port adopts half-dupex
communication mode, usually which is connected with 9-pin D-subminiature
female connectors

Connection method: direction connection cable for serial port, the IED
terminal is pins and the PC termianl is female connector. The terminal of 2, 3,
4 and 5 is connected directly. As shown in the following picture:

Figure 11 Example for serial port connection

The line 4 must be connected directly

3.8 Connecting the GPS

Mount the GPS antenna on the building roof or the place of visibility to all
direction is obtained, top of the antenna should be horizontal. Mount the
antenna to console and fix the console on the building roof with expansion
bolts. The turning radius should not be too small when laying the cables. The
length of antenna cables is designed strictly based on antenna gain, so, it is
not allowed to lengthen, shorten or add connectors that will affect signal
reception or can't receive any signals.

30
Chapter 3 Installing IED
The principle for mounting GPS antenna is that the position is visible
completely to all directions in 360, however, for some special conditions,
mount the antenna at the place with best visibility as far as possible.

The GPS port is located on the rear side of communication module, as shown
in Figure 9, which can be connected with screened twist-pair cable.

31
Chapter 3 Installing IED

4 Checking before energizing

4.1 Introduction

After completing the IED connections, the related connections need to be


checked, this section descirbes what should be checked before energizing.
This is done with IED and all connected circuits de-energized.

4.2 Checking the protective earth connection

Check the protective earthing connection of IED is connected reliably in


accordance with the related electrical regulations and standards.

4.3 Checking the power supply connection

Check that the auxiliary power supply voltage remains within the permissible
input voltage range under all operating conditions. Check that the polarity is
correct.

4.4 Checking the CT and VT circuits connection

4.4.1 Checking the CT circuits connection

Check that the wiring is in strict accordance with the supplied connection
diagram. If any errors appearance, do not continue before any errors are
corrected. The following tests shall be performed on every primary CT
connected to IED:

Primary injection test to verify the current change ratio of the CT, the
correct wiring up to the protection IED and correct phase sequence
connection (i.e. A, B, C)

Polarity checking to prove that the predicted direction of secondary


current flow is correct for a given direction of primary current flow

CT secondary loop resistance measurement in order to confirm that the


current transformer secondary loop DC resistance is within specification
and that there are no high resistance joints in the CT winding or wiring

32
Chapter 3 Installing IED
CT excitation test in order to confirm that the current transformer is of the
correct accuracy rating and that there are no shorted turns in the current
transformer windings. Manufacturer's design curves should be available
for the current transformer in order to compare the actual results

Check the earthing of the individual CT secondary circuits to verify that


each three-phase set of main CTs is properly connected to the station
earth and only at one electrical point

Checking the insulation resistance

Phase identification of CT shall be made

Both primary and secondary sides must be disconnected from the


line and IED when plotting the excitation characteristics

If the CT secondary circuit earth connection is removed without the


current transformer primary being de-energized, dangerous voltages
may result in the secondary CT circuits

4.4.2 Checking the VT connection

Check that the wiring is in strict accordance with the supplied connection
diagram. If any errors appearance, do not continue before any errors are
corrected.

The following tests are recommended:

Polarity check

VT circuit voltage measurement (primary injection test)

Grounding check

Phase relationship

Insulation resistance check

4.5 Checking the binary input and output connection

4.5.1 Checking the binary input connection


33
Chapter 3 Installing IED
When checking the binary inputs, it's better to disconnect the binary input
connector from binary input module. Check all connected signals in order to
make sure that both the input level and polarity of voltage are in accordance
with the IEDs specifications.

4.5.2 Checking the binary output connection

When checking the binary outputs, it's better to disconnect the binary output
connector from binary output module. Check all connected signals in order to
make sure that both the input level and polarity of voltage are in accordance
with the IEDs specifications.

4.6 Checking the screened cables connection

Check that the screened cables are connected correctly.

4.7 Checking the S485 and RS232 port connectios

4.7.1 Checking the RS485 port connection

Check that the RS485 port connections are correct.

4.7.2 Checking RS232 port connection

Check that the RS232 serial port connections are correct.

4.8 Checking GPS connection

Check that the GPS connections are correct.

4.9 Checking the insulation voltage and insulation


resistance

4.9.1 Checking the insulation voltage

34
Chapter 3 Installing IED
Using the withstand voltage tester to apply correspondung level voltage
between tested circuit and earth, and between circuits (e.g. 2000VAC
/2800VDC), lasting 1 min. No flashover and breakdown apperance, the
leakage current is less than 10mA.

4.9.2 Checking the insulation resistance

Using a rotating meter with 500V to test insulation resistance in turn between
analog circuits and earth, and the circuits to each other. Every resistance
must not be less than 100 M. And the lasting time for resistance test is not
less than 5s to ensure that the value of insulation resistance is read in a
steady state.

35
Chapter 3 Installing IED

5 Checking after energizing

5.1 Introduction

After completing of the external circuits connection, checking all connections


and energizing the IED, LCD and keyboard should be tested. Check that the
software version, serial number and the installed modules are in accordance
with ordering information. The IED time need to be set to ensure that the IED
time is synchronized with local time. The self-supervision function should also
be checked to verify that the IED operates properly.

5.2 Test LCD

After energizing the IED, the blue back light of LCD light up, operate the keys
to turn pages to check that the LCD display is correct.

5.3 Test the keyboard

All the keys on front panel including Arrow keys, Reset key, Set key and Quit
key can be operated to check that these keys satisfy with the correpsonding
function, the detail functions of each key are described in Table 2.

5.4 Setting the IED time

This procedure describes how to set the IED time from the local HMI.

1. Enter into the time setting menu: OpConfig/Time, press the Set button to
enter into the setting menu

2. Set the date and time

Use the Left and Right arrow buttons to move between the time and date
values (year, month, day, hours, minutes and seconds). Use the Up and
Down arrow buttons to change the value.

3. Confirm the setting

Press the Set button to set the data and clock to the new values.

36
Chapter 3 Installing IED

5.5 Checking the software and hardware version

Enter into menu: DevInfo/Version

Checking the software version: In this menu, to check the protection


programm and protection scheme and HMI program version.

Check the hardware version: In this menu, to check the equipment code.

37
Chapter 3 Installing IED

38
Chapter 4 Read and change setting

Chapter 4 Read and change setting

About this chapter


This chapter describes how to set and read the setting values
and parameters either through LHMI or software tool, and how
to switch the setting value group.

This chapter does not contain instructions on how to calculate


the setting value, for the detail setting calculation information
please refer to the Technical application manual.

39
Chapter 4 Read and change setting

1 Read and change the setting vaule

1.1 Read and change the setting value via LHMI

1.1.1 Introduction

All the function settings, binary settings and connectors can be read and set
through LHMI. The user can browse to the desired settings and enter into the
appropriate vaules. The parameters for each function can be found in the
LHMI. See the Technical applciation manual for a complete list of setting
parameters for each function.

1.1.2 Communication parameter

1.1.2.1 Ethernet address

Enter into menu: ComConf/Eth 1#

Enter into menu: ComConf/Eth 2#

The address of Ethernet port 1and Ethernet 2 can be modified in this setting.

1.1.2.2 BIO parameter

Enter into menu: ComConf/Monitor

The related parameter about BIO module can be modified in this setting.

1.1.2.3 Serial port parameter

Enter into menu: ComConf/Serial

In this menu, the parameter for RS232 and RS485 port can be set, such as
baud rate, transmission protocol, etc.

1.1.2.4 Label parameter

Enter into menu: ComConf/Label

In this menu, the LON address, STA name and Bay name can be set.

40
Chapter 4 Read and change setting
1.1.2.5 Time synchronization mode

Network mode

Enter into menu: DevSetup/Remote/Signal/SynType

The time synchronization mode can be changed into network time mode via
this setting.

IRIG-B Mode

Enter into menu: DevSetup/Remote/Signal/SynType

The time synchronization mode can be changed into IRIG-B time mode via
this setting.

1.1.3 Setting values, binary settings and soft connetors for

protection function

1.1.3.1 Protection setting

Enter into menu: Settings/Write/Select

The menu of protection setting is used to check and modify every function
setting, using left and right button to chose the vaule and the up and down
buttons are used to modify the value, the upper and lower limits of setting
value will be displayed when the cursor move to corresponding setting items.

1.1.3.2 Protection binary setting

Enter into menu: Settings/Write/Select

The protection binary settings are used to enable or disable each function.
Two ways for modifying the binary setting via LHMI:

1. Modify the value of hex format displayed in this menu to enable or disable
the corresponding function.

2. Press the right button for a while, the detail information for this binary
setting will be displayed, using up and down button to select the required
function and the left and right button to enable or disable this function.

41
Chapter 4 Read and change setting
1.1.3.3 Protection soft connector

Enter into menu: OpConfig/Connect

The protection soft connectors are used to enable or disable each function,
On means enable and Off means disable. Use the up and down button to
select the required connector and the left and right button to enable or disable
this function.

42
Chapter 4 Read and change setting

2 Switching the setting group

2.1 Introduction

There are 16 setting groups with same setting items in the IED, for each
group settings can be set and saved separately, the different setting groups
can be switched according to different application.

2.2 Method for switching setting group via LHMI

Enter into the menu: Settings/Switch

Enter into the menu: Opconfig/Switch

The current setting group number and the chosen setting group number are
displayed in the LCD, change the setting group number by up and down
button, comfirm the result by Set button after the setting group number is
chosen.

After setting group switching success, the information about switching


success will be reported.

Note: the functions are related with setting value, binary setting as well as
connector, so, the group number for setting value and connector should be
consistent in order to make sure the IED operate normally.

2.3 Method for switching setting group via binary


input

Enter into the menu: Settings/Switch

The binary setting "BI SetGrp Switch" in the menu described above is used
for switching setting group via binary input, when this binary setting is set to 1,
and the corresponding binary input is active, the setting group is switched
from group 1 to group 2. If the binary setting is set to 1 and the binary input is
inactive, the setting group is switched from group 2 to group 1.

Note: The method for swithing setting group via binary input is only available
for switching between group 1 and group2.

43
Chapter 4 Read and change setting

44
Chapter 5 Testing the communication connection and
time synchronization

Chapter 5 Testing the communication


connection and time
synchronization

About this chapter


This chapter describes how to test each communication port and
the function of time synchronization.

45
Chapter 5 Testing the communication connection and
time synchronization
1 Testing the communication connection

1.1 Testing the Ethernet communication

1.1.1 Testing the electrical Ethernet communication

Connect the IED with automation system to check the connection is


successful, if connection fail, check the communication network.

If connection successes, in the menu: Testing/Remote/Signal, send the


simulation point information to automation system, check the information and
compare with IED information, if the automation system does not receive any
information or the information received is not true, check the automation
system configuration.

1.1.2 Testing the optical Ethernet communication

Connect the IED with automation system to check the connection is


successful, if connection fail, check the communication network.

If connection successes, in the menu: Testing/Remote/Signal, send the


simulation point information to automation system, check the information and
compare with IED information, if the automation system does not receive any
information or the information received is not true, check the automation
system configuration.

1.2 Testing the RS485 port

Connect the IED with automation system to check the connection is


successful, if connection fail, check the communication network.

If connection successes, in the menu: Testing/Remote/Signal, send the


simulation point information to automation system, check the information and
compare with IED information, if the automation system does not receive any
information or the information received is not true, check the automation
system configuration.

1.3 Testing the RS232 port

46
Chapter 5 Testing the communication connection and
time synchronization
Using the dedicated cable for serial port to connect the PC with IED, if
connection fail, check the corresponding configuration of IED is true or not. If
all configurations are true, and the connection is still unsuccessful, please
check the connection cable and communication port.

47
Chapter 5 Testing the communication connection and
time synchronization
2 Testing the time synchronization

2.1 Network mode

Select time synchronization mode:

DevSetup/Remote/Signal/SynType

Change the IED time to any other time

Wait for a period of time

Check that the IED time is changed automatically in accordance with time
synchronization source

2.2 IRIG-B mode

Select time synchronization mode:

DevSetup/Remote/Signal/SynType

Change the IED time to any other time

Wait for a period of time

Check that the IED time is changed automatically in accordance with time
synchronization source

48
Chapter 6 IED testing

Chapter 6 IED testing

About this chapter


This chapter describes the method of hardware testing, such as
power supply, binary input and output, analog quantities and all
functions testing method and testing procedure.

49
Chapter 6 IED testing

1 Introduction
IED test requirements:

Setting value list

The IED setting value must be completed before the testing can start.

Application configuration diagram

Terminal diagram

The terminal diagram and module arrangement diagram, available in the


Technical reference manual, is a general diagram of the IED. but note
that the same diagram is not always applicable to each specific delivery
(especially for the configuration of all the binary inputs and outputs).
Therefore, before testing, check that the available terminal diagram
corresponds to the IED.

Technical application maunal

The Technical application manual contains application and functionality


summaries, function block, logic diagram, input and output signals,
setting parameters and technical data sorted per function.

The three-phase test equipment

The test equipment should be able to provide a three-phase supply of


voltages and currents. The magnitude of voltage and current as well as
the phase angle between voltage and current must be variable. The
voltages and currents from the test equipment must be obtained from the
same source and they must have minimal harmonic content. If the test
equipment cannot indicate the phase angle, a separate phase-angle
measuring instrument is necessary.

Prepare the IED for test before testing a function. Consider the logic diagram
of the tested protection function when perform the test. All included functions
in the IED are tested according to the corresponding test instrunctions in this
chapter.

The response from a test can be viewed in different ways:

Binary output signals

50
Chapter 6 IED testing
Display value in HMI

All setting groups that are used should be tested.

The IED is designed for a maximum continuous current of three


times the rated current

Please observe the measuring accuracy of the IED, the test


equipment and angular accuracy for both of them

51
Chapter 6 IED testing

2 Points for attention during testing


Be familiar with the engineering drawings, engineering and operation
manual and technical application manual

Before testing, check that the short-circuited wire used to avoid CT


secondary circuit opening is connected correctly and firmly. The
short-circuited phenomenon of VT secondary circuit does not exist

It is allowed to plug-in and pull out each module after the power supply
disconnection. Aviod AC current circuit opened when plug in and pull out
the modules

Keep cleaning and pay attention to dust prevention for each module

Adoption the measure of the human body electrostatic grounding


prevention to make sure that the IED is not damaged by hunam
electrostatic

In principle, the electric iron can't be used in field, if the electric iron need
to be used for welding during testing, the welding can be performed after
the power disconnection or using the electric iron with earthed wire

During testing, do not insert the module into the wrong position. When
plug in and pull out the module apply appropriate force instead of
overexerting to avoid pins bending or damage the fastening components
of module

Short-circuited or disconnected terminals temporarily for checking, it


should be recorded one by one and return to original state after the
testing is completed

Using the electronic devices (e.g. oscillograph, etc.) with AC power


supply to measure the circuit parameters, the case of the device should
be earthed in the same grounding with protection IED cabinet

During testing, consider the safety measure between the IED and other
running equipment and the safety measure of related circuit between
external running equipment and the IED

During testing, if the current magnitude that is input into IED is large than
three times of rated current, it should be noticed that the time should not
be too long

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Chapter 6 IED testing
When energizing the IED in the first time, using multimeter to check the
power supply, the circuit of voltages and currents are connected correcly
to avoid short circuit or open circuit

Tighten all the screws of all terminals again for the new project in order to
prevent improper connection, and plug in and pull out all the modules
again to aovid the modules loosing result from operation or installation

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Chapter 6 IED testing

3 Preparing for test

3.1 Introduction

Please read the corresponding manuals that is provided by manufacturer


in detail before testing, try best to understand the basic operation,
protection principle and the relevant capabilities. If have any questions in
this procedure, please inquire the field service engineer or the technical
support engineer of SiFang.

All checking should be done before energizing, inspection well and no


damage on the surface, all modules are inserted firmly, the insulation of
the power circuit are satisfied the specified requirement.

Disconnect the external circuit before testing to avoid safety accident or


injuries to the human

If the modules are needed to be plugged in or pulled out, make sure that
the power is disconnected, and the measure of prevention electrostatic
should be done in order to avoid the damage to module or performance
degradation

The opened or short-circuited terminal temporarily should be recorded in


detail in order to return to original state reliably

3.2 Connecting test equipment to IED

Before testing, connect the test equipment according to the IED specific
connection diagram. Pay special attention to the correct connection of the
input and output current terminals. Check that the input and output logical
signals in the logic diagram for the function under test are connected to the
corresponding binary inputs and outputs of the IED. The testing connection
diagram is shown in Figure 12.

The user must verify that the connections are correct and the analog signals
are measured correctly after connection completed.

Procedure:

1. Inject a symmetrical three-phase current and voltage at rated value

2. Inject a phase-to-phase voltage and phase-to-phase current at rated

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Chapter 6 IED testing
value

3. Check that the magnitude and phasor of analog quantities displayed in


LHMI are in accordance with the input values

4. Inject an asymmetrical three-phase current and voltage at rated value in


two phases

5. Check that the magnitude and phasor of analog quantities displayed in


LHMI are in accordance with the input values

6. If the compared value is consistent, perform the testing, if the compared


value is different, check the analog circuit connections

Tester IED

IA IA IA

IB IB IB

IC IB IC

IN IN IN

UA UA

UB UB

UC UC

UN UN

Trip A

Trip B

Trip C

Figure 12 Testing connection diagram

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Chapter 6 IED testing

4 Testing the power supply

4.1 Checking the self-startup performance

Power on the IED, in order to check the self-startup performance of the IED,
energizing the IED with the voltage rised slowly from zero to 80% rated
voltage, at this time, observe the green Run LED on the front panel that
should be lighted continuously. After the DC power disappears, the normal
closed contact should be disconnected, which can be tested using the
multimeter, the contact is show in Figure 10.

4.2 DC power on and power off testing

Changing the DC power to 80% rated voltage, power off and power on the
power supply some times, the Run LED on the front panel should turn off
and turn on correspondingly. The normal closed contact should be in the on
or off state. The contact is show in Figure 10.

4.3 Checking the expiry date of power supply

When period checking, check the expiry date of the power supply module, if
the power supply module has been used more than 5 years, please replace it.

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Chapter 6 IED testing

5 Checking the analog channel

5.1 Checking and adjusting the zero drift

MainMenu/Testing/Zero

In this menu, the zero drift values of all analog channels have been listed in
detail, check that the zero drift is met the requirement. Generally, the
requirement of the current channels is <0.01In, the voltage channels is <0.5V.
If the zero drift value is not satisfied the requirement, adjust the corresponding
zero drift.

MainMenu/DevSetup/Zero

MainMenu/DevSetup/Save

It is allowed to check zero drift after energizing the IED for 5 minutes, when
adjusting the zero drift, disconnect electrical connection of the IED, test
equipment, standard source and external circuit, make sure that there are no
any inputs to analog terminals, select the menu and adjust zero drift. After
zero drift adjustment succeed, enter into the " Save " menu to complete the
adjustment.

5.2 Checking and calibrating

MainMenu/OpConfig/Analog

MainMenu/OpConfig/Metering

The analog quantities scale for protection function is not used to be adjusted,
the accuracy is guaranteed by hardware. For the scale adjustment, Only the
measurement channel is adjusted.

Before testing, disable all of the connectors and binary settings in order to
avoid the protection function startup or maloperation.

Using the test equipment with 0.1 grade, connect the voltages and currents of
test equipment to the corresponding input terminals to check the magnitude
and phase angle of voltage and current. The magnitude tolerance of IED
displaying value and external injected value should be less than 2.5%
(phase voltage vaule tolerance <0.2V when voltage channel is 1V, zero

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Chapter 6 IED testing
sequence voltage tolerance <0.2V when voltage channel is 3V; current value
tolerance <0.02In when current channel is 0.08 In).

MainMenu/DevSetup/Scale

MainMenu/DevSetup/Save

Make sure that zero adjustment have been completed before scale
adjustment, and then inject rated voltage and current, after the standard
source output steadily, enter into the menu described above to adjust scale.
After scale adjustment succeed, enter into the " Save " menu to complete the
adjustment. And then check the measurement value, the accuracy
requirement is: tolerance of voltage and current should be less than 0.2%
and tolerance of power should be less than 0.5%.

Note: during testing, if the measuring tolerance of the analog quantities are
large than the required range, check that the testing connection, testing
method and external measurement meter is correct, the testing source has
not wave distortion, before all of the exteral equipments are checked, it
should not adjust or change the components of the IED immediately.

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Chapter 6 IED testing

6 Testing binary input


MainMenu/Testing/BI

Check the binary input status in this menu, all the binary input status should
be displayed as "empty circle" icon. Make sure that the circuit of binary input
is in good condition, the power of binary input have been connected (24V,
110V or 220V). Test the binary input one by one according to the engineering
drawing, the tested binary input status displayed in HMI should be displayed
as "solid circle" icon.

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Chapter 6 IED testing

7 Testing binary output


MainMenu/Test BO

Testing binary output in this menu to verify the correctness of signal circuit
and output circuit.

During testing the binary output, the corresponding relay contact operate, the
irrelevant contacts should not operate. Use the multimeter to measure the
corresponding output contacts of the tripping and signal.

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Chapter 6 IED testing

8 Verifying the IED functions


Procedure:

1. Enable the protection function binary setting via software tool or LHMI

2. Input the corresponding settings value via software tool or LHMI

3. Input the rated currents and voltages to make the IED operating
normally for 20s

4. Active the binary input for the corresponding protection function

5. Simulate the fault occurance

6. Observe the testing result

7. Stop the output from test equipment and restore to original state

8. Continue to test another function or complete the test

8.1 Overcurrent protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.1.1 Verifying the settings

8.1.1.1 Verifying the settings of stage 1 of overcurrent protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 14 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_OC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1

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Chapter 6 IED testing
Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_OC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 15 Time setting verifying

Test item Description


OpConfig/Connect/Func_OC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.3 Verifying the direction angle setting

Table 16 Direction angle setting verifying

Test item Description


OpConfig/Connect/Func_OC1, set the connecotr as "On"
Binary setting
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

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Chapter 6 IED testing
Test item Description
as 1
Settings/Write/Select/Ctr Word 1/OC1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Fault simulation Fault current: 200% of the setting value
Fault voltage: 85% rated voltage
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

1.4 Verifying the low voltage setting

Table 17 Low voltage setting verifying

Test item Description


95% of the voltage blocking setting verifying
OpConfig/Connect/Func_OC1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/OC1 V_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Phase-to-phase voltage value: 95% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the inrush restraint setting verifying
OpConfig/Connect/Func_OC1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/OC1 V_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation
Phase-to-phase voltage value: 105% of setting value

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Chapter 6 IED testing
Test item Description
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.5 Verifying the inrush restraint setting

Table 18 Inrush restraint setting verifying

Test item Description


95% of the inrush restraint setting verifying
OpConfig/Connect/Func_OC1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 95% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the inrush restraint setting verifying
OpConfig/Connect/Func_OC1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 105% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

Table 19 Cross-blocking setting verifying

Test item Description


OpConfig/Connect/Func_OC1, set the connecotr as "On"
Binary setting
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

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Chapter 6 IED testing
Test item Description
as 1
Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Harmonic phase: phase B or phase C
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 200% of the setting value
Cross-blocking time: the same as setting value
Fault time: longer than (cross-blocking time + operate setting value)
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of technical data (cross-blocking time +
operate time)

Table 20 The maximum inrush current setting verifying

Test item Description


95% of the maximum inrush current restraint setting verifying
OpConfig/Connect/Func_OC1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 95% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
105% of the maximum inrush current restraint setting verifying
OpConfig/Connect/Func_OC1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault simulation Fault type: phase A, instantanuous

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Chapter 6 IED testing
Test item Description
Ratio of I2/I1: 200% of the setting value
Fault current: 105% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.1.1.2 Verifying the settings of stage 2 of overcurrent protection

The test method and test items of verifying the stage 2 of overcurrent
portection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.

8.1.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 21 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_OC Inv, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_OC Inv, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Chapter 6 IED testing
Test item Description
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 22 Time setting verifying

Test item Description


OpConfig/Connect/Func_OC Inv, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of calculated by inverse time stage
equation of technical data

Table 23 Inverse time stage characteristic

Inverse time stage characteristic


Normal inverse
Very inverse
IEC
Extremely inverse
Long inverse
Normal Inverse
Short inverse
Long inverse
ANSI Moderately inverse
Very inverse
Extremely inverse
Definite inverse

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Chapter 6 IED testing
Inverse time stage characteristic

User-defined characteristic

Time factor of inverse time, A


Delay of inverse time, B
Index of inverse time, P
Set time Multiplier for step n: k

2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding other phase required.

8.1.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.1.3 Reference setting list for test

Table 24 Overcurrent protection connector list

NO. Default Abbr. Explanation


1. On Func_OC1 Enable or disable the stage 1 of overcurrent protection
2. On Func_OC2 Enable or disable the stage 2 of overcurrent protection
Enable or disable the inverse time stage of overcurrent
3. On Func_OC Inv
protection

Table 25 Overcurrent protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


1. In I_OC1 Current setting for stage 1 A 0.05In 20.00In
2. 0.4 T_OC1 Time setting for stage 1 S 0.00 60.00
3. 1.5In I_OC2 Current setting for stage 2 A 0.05In 20.00In
4. 0.1 T_OC2 Time setting for stage 2 S 0.00 60.00
5. 90.0 U_OC_UnBlk Low voltage setting for V 1.00 120.0

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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
blocking overcurrent
protection
Current setting for inverse
6. 0.5In I_OC Inv A 0.05In 20.00In
time stage
Time factor for inverse time
7. 0.056 AK_OC Inv S 0.001 1000
stage
8. 0.02 P_OC Inv Index for inverse time stage 0.01 10.00
Delay time for inverse time
9. 0 BK_OC Inv S 0.00 60.00
stage
10. 30 Angle_OC Direction characteristic angle degree 0.00 90.00
Maximum inrush current
11. In I_2H_UnBlk A 0.25In 20.00In
setting
Ratio for second harmonic
12. 0.15 Ratio_I2/I1 current to fundamental 0.07 0.50
component
Time setting for
13. 0.2 T2h_Cross_Blk S 0.00 60.00
cross-blocking function

Table 26 Overcurrent protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the direction
1.0 1 OC1 Dir Off OC1 Dir On
for stage 1
Enable or disable the low
1.1 1 OC1 V_Blk Off OC1_V Blk On
voltage blocking for stage 1
Enable or disable the inrush
1.2 1 OC1 2H_Blk Off OC1 2H_Blk On
restraint for stage 1
Enable or disable the direction
1.3 1 OC2 Dir Off OC2 Dir On
for stage 2
Enable or disable the low
1.4 1 OC2 V_Blk Off OC2 V_Blk On
voltage blocking for stage 2
Enable or disable the inrush
1.5 1 OC2 2H_Blk Off C2 2H_Blk On
restraint for stage 2
Enable or disable the direction
1.6 1 OC Inv Dir Off OC Inv Dir On
for inverse stage
Enable or disable the inrush
1.7 1 OCInv 2H_Blk Off OCInv 2H_Blk On
restraint for inverse stage
Select voltage connection way
2.9 0 3Ph V Connect 1Ph V Connect
by single phase or three phase
Enable the function of VT fail
2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail
blocking

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Chapter 6 IED testing
Bit Default 0 1 Explanation
Stage 1 of overcurrent
4.0 1 OC1 Alarm OC1 Trip
protection alarm or trip
Inverse stage of overcurrent
4.1 1 OC Inv Alarm OC Inv Trip
protection alarm or trip

8.2 Earth fault protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.2.1 Verifying the settings

8.2.1.1 Verifying the settings of stage 1 of earth fault protection

1 Verifying the phase A setting

1.1 Verifying the zero-sequence current setting

Table 27 Zero-sequence current setting verifying

Test item Description


105% of the zero-sequence current setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the zero-sequence current setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault simulation Fault type: phase A, instantanuous

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Chapter 6 IED testing
Test item Description
Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 28 Time setting verifying

Test item Description


OpConfig/Connect/Func_EF1, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.3 Verifying the direction angle setting

Table 29 Zero-sequence direction angle setting verifying

Test item Description


OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 Dir, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Fault simulation Zero sequence current: 200% of the setting value
Zero sequence voltage: 85% rated voltage
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

Table 30 Negative-sequence direction angle setting verifying

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Chapter 6 IED testing
Test item Description
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 1/EF1 Dir, set the binary setting as
1
Settings/Write/Select/Ctr Word 1/EF U2/I2 Dir, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Negative sequence current: 200% of the setting value
Fault simulation
Zero sequence voltage: 0 V
Negative sequence voltage: 85% rated voltage
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

1.4 Verifying the inrush restraint setting

Table 31 Inrush restraint I2/I1 setting verifying

Test item Description


95% of the inrush restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 95% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the inrush restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1

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Chapter 6 IED testing
Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 105% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

Table 32 Inrush restraint I02/I01 setting verifying

Test item Description


95% of the inrush restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I02/I01: 95% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the inrush restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I02/I01: 105% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

Table 33 The maximum inrush current setting verifying

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Chapter 6 IED testing
Test item Description
95% of the maximum inrush current restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 95% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
105% of the maximum inrush current restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 105% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.2.1.2 Verifying the settings of stage 2 of earth fault protection

The test method and test items of verifying the stage 2 of earth fault
portection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.

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Chapter 6 IED testing
8.2.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 34 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_EF Inv, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/EF Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_EF Inv, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/EF Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 35 Time setting verifying

Test item Description


OpConfig/Connect/Func_EF Inv, set the connecotr as "On"
Binary setting Settings/Write/Select/Ctr Word 4/EF Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault simulation Fault type: phase A

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Chapter 6 IED testing
Test item Description
Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of calculated by inverse time stage
equation of technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding other phase required.

8.2.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.2.3 Reference setting list for test

Table 36 Earth fault protection connector list

NO. Default Abbr. Explanation


Enable or disable the stage 1 of earth fault
1. On Func_EF1
protection
Enable or disable the stage 2 of earth fault
2. On Func_EF2
protection
Enable or disable the inverse time stage of earth
3. On Func_EF Inv
fault protection

Table 37 Earth fault protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Zero-sequence current
1. In 3I0_EF1 A 0.05In 20.00In
setting for stage 1
2. 0.4 T_EF1 Time delay for stage 1 S 0.00 60.00
Zero-sequence current
3. 1.5In 3I0_EF2 A 0.05In 20.00In
setting for stage 2
4. 0.1 T_EF2 Delay time for stage 2 S 0.00 60.00
Zero-sequence current
5. 0.5In 3I0_EF Inv setting for inverse time A 0.05In 20.00In
stage

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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
Time factor for inverse
6. 12 AK_EF Inv S 0.001 1000
time stage
Index for inverse time
7. 1 P_EF Inv 0.01 10.00
stage
Delay time for inverse
8. 0 BK_EF Inv S 0.000 60.00
time stage
Characteristic angle for
9. 30 Angle_EF degree 0.00 90.00
zero-sequence direction
Characteristic angle for
10. 30 Angle_Neg negative-sequence degree 0.00 90.00
direction
Maximum inrush phase
11. In I_2H_UnBlk A 0.25In 20.00In
current setting
Maximum inrush zero
12. In 3I0_2H_UnBlk sequence current A 0.25In 20.00In
setting
Ratio for second
13. 0.15 Ratio I2/I1 harmonic current to 0.07 0.50
fundamental component
Ratio for zero sequence
second harmonic
14. 0.15 Ratio I02/I01 current to zero 0.07 0.50
sequence fundamental
component

Table 38 Earth fault protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the
1.8 1 EF1 Dir Off EF1 Dir On
direction for stage 1
Enable or disable the inrush
1.9 1 EF1 2H_Blk Off EF1 2H_Blk On
restraint for stage 1
Enable or disable the
1.10 1 EF2 Dir Off EF2 Dir On
direction for stage 2
Enable or disable the inrush
1.11 1 EF2 2H_Blk Off EF2 2H_Blk On
restraint for stage 2
Enable or disable the
1.12 1 EF Inv Dir Off EF Inv Dir On
direction for inverse stage
Enable or disable the inrush
1.13 1 EFInv 2H_Blk Off EFInv 2H_Blk On
restraint for inverse stage
Enable or disable inrush
1.14 1 EF Chk I2/I1 EF Chk I02/I01
restraint by I2/I1 or I02/I01

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Bit Default 0 1 Explanation
Enable or disable the
1.15 0 EF U2/I2 Dir Off EF U2/I2 Dir On
negative sequence direction
2.7 0 3I0 Measured 3I0 Calculated 3I0 measured or calculated
2.8 1 3U0 Measured 3U0 Calculated 3U0 measured or calculated
Enable or disable the function
2.11 0 Blk EF_CT Fail UnBlk EF_CT Fail
of CT fail blocking
Enable or disable the function
2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail
of VT fail blocking
Stage 1 of overcurrent
4.2 1 EF1 Alarm EF1 Trip
protection alarm or trip
Inverse stage of overcurrent
4.3 1 EF Inv Alarm EF Inv Trip
protection alarm or trip

8.3 Sensitive earth fault protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.3.1 Verifying the settings

8.3.1.1 Verifying the settings of sensitive earth fault protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 39 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_SEF1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Sensitive current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

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Chapter 6 IED testing
Test item Description
95% of the current setting verifying
OpConfig/Connect/Func_SEF1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Sensitive current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 40 Time setting verifying

Test item Description


OpConfig/Connect/Func_SEF1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Sensitive current: 200% of the setting value
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.3 Verifying the direction setting

1.3.1 U0/I0- measurement

Table 41 Direction angle setting verifying

Test item Description


OpConfig/Connect/Func_SEF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Chapter 6 IED testing
Test item Description
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Fault simulation Sensitive current: 200% of the setting value
Zero sequence voltage: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

Table 42 Displacement voltage setting verifying

Test item Description


105% of the displacement voltage setting verifying
OpConfig/Connect/Func_SEF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: same as default setting in setting list
Fault simulation Sensitive current: 200% of the setting value
Zero sequence voltage: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the displacement voltage setting verifying
OpConfig/Connect/Func_SEF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: same as default setting in setting list
Fault simulation Sensitive current: 200% of the setting value
Zero sequence voltage: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.3.2 Cos measurement

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Chapter 6 IED testing
Table 43 Direction angle setting verifying

Test item Description


105% of the IsCos setting value
OpConfig/Connect/Func_SEF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
IsCos value: 105% of the setting value
Fault simulation Sensitive current: 200% of the setting value
Zero sequence voltage: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the IsCos setting value
OpConfig/Connect/Func_SEF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
IsCos value: 95% of the setting value
Fault simulation Sensitive current: 200% of the setting value
Zero sequence voltage: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.3.1.2 Verifying the settings of stage 2 of sensitive earth fault protection

The test method and test items of verifying the stage 2 of sensitive earth fault
portection are same as stage 1, only need to change the corresponding test

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Chapter 6 IED testing
conditions and settings into the conrresponding stage 2 required.

8.3.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 44 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_SEF Inv, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Sensitive current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_SEF Inv, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Sensitive current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close

1.2 Verifying the current setting

Table 45 Time setting verifying

Test item Description


OpConfig/Connect/Func_SEF Inv, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Chapter 6 IED testing
Test item Description
Binary input None
Fault type: phase A
Fault simulation Sensitive current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of calculated by inverse time stage
equation of technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding other phase required.

8.3.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.3.3 Reference setting list for test

Table 46 Sensitive earth fault protection connector list

NO. Default Abbr. Explanation


Enable or disable the stage 1 of sensitive earth fault
1. On Func_SEF1
protection
Enable or disable the stage 2 of sensitive earth fault
2. On Func_SEF2
protection
Enable or disable the inverse time stage of sensitive
3. On Func_SEF Inv
earth fault protection

Table 47 Sensitive earth fault protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


0.005 1.00
Sensitive current (SEF) (SEF)
1. In I_SEF1 A
setting for stage 1 0.05In 20.00In
(Normal) (Normal)
2. 0.4 T_SEF1 Time delay for stage 1 S 0.00 60.00
0.005 1.00
3. 1.5In I_SEF2 Sensitive current A
(SEF) (SEF)

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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
setting for stage 2 0.05In 20.00In
(Normal) (Normal)
4. 0.1 T_SEF2 Time delay for stage 2 S 0.00 60.00
0.005 1.00
Sensitive current
(SEF) (SEF)
5. 0.5In I_SEF Inv setting for inverse A
0.05In 20.00In
stage
(Normal) (Normal)
Time factor for inverse
6. 12 AK_SEF Inv S 0.001 1000
time stage
Index for inverse time
7. 1 P_SEF Inv 0.01 10.00
stage
Delay time for inverse
8. 0 BK_SEF Inv S 0.000 60.00
time stage
Characteristic angle
9. 30 Angle_SEF for U0/I0- degree 0.00 90.00
measurement
Sensitve current for
direction determination
10. 0.01 IsCOS_SEF A 0.005 1.00
of IsCos
measurement
Displacement voltage
for stage 1 of
11. 20 U_3V01 V 2.00 100.0
displacement voltage
protection

Table 48 Sensitive earth fault protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the
2.1 1 SEF1 Dir Off SEF1 Dir On
direction for stage 1
Enable or disable the
2.2 1 SEF2 Dir Off SEF2 Dir On
direction for stage 2
Enable or disable the
2.3 1 SEF Inv Dir Off SEF Inv Dir On
direction for inverse stage
Direction determination by
2.4 1 SEF Chk Iscos SEF Chk U0/I0 U0/I0- measurement or
IsCos measurement
2.8 1 3U0 Measured 3U0 Calculated 3U0 measured or calculated
Enable or disable the function
2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail
of VT fail blocking
4.4 1 SEF1 Alarm SEF1 Trip Stage 1 of sensitive earth

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Chapter 6 IED testing
Bit Default 0 1 Explanation
fault protection alarm or trip
Stage 2 of sensitive earth
4.5 1 SEF2 Alarm SEF2 Trip
fault protection alarm or trip
Inverse stage of sensitive
4.6 1 SEF Inv Alarm SEF Inv Trip earth fault protection alarm or
trip

8.4 Negative sequence overcurrent protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.4.1 Verifying the settings

8.4.1.1 Verifying the settings of negative sequence overcurrent


protection

1 Verifying the phase A setting

1.1 Verifying the negative sequence current setting

Table 49 Negative sequence current setting verifying

Test item Description


105% of the negative sequence current setting verifying
OpConfig/Connect/Func_NSOC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/NSOC1 Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the negative sequence current setting verifying
OpConfig/Connect/Func_NSOC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/NSOC1 Trip, set the binary
setting as 1
Setting value Settings/Write/Select, the detail setting list refer to the Reference

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Chapter 6 IED testing
Test item Description
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 50 Time setting verifying

Test item Description


OpConfig/Connect/Func_NSOC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/NSOC1 Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.4.1.2 Verifying the settings of stage 2 of negative sequence overcurrent


protection

The test method and test items of verifying the stage 2 of negative sequence
overcurrent portection are same as stage 1, only need to change the
corresponding test conditions and settings into the conrresponding stage 2
required.

8.4.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

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Chapter 6 IED testing
Table 51 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_NSOC Inv, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/NSOC Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_NSOC Inv, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/NSOC Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 52 Time setting verifying

Test item Description


OpConfig/Connect/Func_NSOC Inv, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/NSOC Inv Trip, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of calculated by inverse time stage
equation of technical data

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Chapter 6 IED testing
2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the other phase required.

8.4.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.4.3 Reference setting list for test

Table 53 Negative sequence overcurrent protection connector list

NO. Default Abbr. Explanation


Enable or disable the stage 1 of negative sequence
1. On Func_NSOC1
protection
Enable or disable the stage 2 of negative sequence
2. On Func_NSOC2
protection
Enable or disable the inverse time stage of negative
3. On Func_NSOC Inv
sequence protection

Table 54 Negative sequence overcurrent protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Negative sequence current
1. In 3I2_NSOC1 A 0.05In 20.00In
setting for stage 1
2. 0.4 T_NSOC1 Time delay for stage 1 S 0.00 60.00
Negative sequence current
3. 1.5In 3I2_NSOC2 A 0.05In 20.00In
setting for stage 2
4. 0.1 T_NSOC2 Time delay for stage 2 S 0.00 60.00
Negative sequence current
5. 0.5In 3I2_NSOC Inv A 0.05In 20.00In
setting for inverse stage
Time factor for inverse time
6. 0.056 AK_NSOC Inv S 0.001 1000
stage
7. 0.02 P_NSOC Inv Index for inverse time stage 0.01 10.00
Delay time for inverse time
8. 0 BK_NSOC Inv S 0.000 60.00
stage

Table 55 Negative sequence overcurrent protection binary setting list

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Chapter 6 IED testing
Bit Default 0 1 Explanation
Stage 1 of negative sequence
4.7 1 NSOC1 Alarm NSOC1 Trip overcurrent protection alarm
or trip
Inverse stage of negative
4.8 1 NSOC Inv Alarm NSOC Inv Trip sequence overcurrent
protection alarm or trip

8.5 Switch-onto-fault protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.5.1 Verifying the settings

8.5.1.1 Verifying the overcurrent element of switch-onto-fault protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 56 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_OC1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_OC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
as 1

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Chapter 6 IED testing
Test item Description
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

1.2 Verifying the time setting

Table 57 Time setting verifying

Test item Description


OpConfig/Connect/Func_OC1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value
The corresponding output contacts should be closed, the operate
Test result
time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.5.1.2 Verifying the earth fault element of switch-onto-fault protection

1 Verifying the phase A setting

1.1 Verifying the zero-sequencecurrent setting

Table 58 Current setting verifying

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Chapter 6 IED testing
Test item Description
105% of the current setting verifying
OpConfig/Connect/Func_EF1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_EF1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed

1.2 Verifying the time setting

Table 59 Time setting verifying

Test item Description


OpConfig/Connect/Func_EF1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value

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Test item Description
The corresponding output contacts should be closed, the operate
Test result
time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.5.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.5.3 Reference setting list for test

Table 60 SOFT protection connector list

NO. Default Abbr. Explanation


1. On Func_OC1 Enable or disable the stage 1 of overcurrent protection
2. On Func_EF1 Enable or disable the stage 1 of earth fault protection

Table 61 SOTF protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


1. In I_OC1 Current setting for stage 1 A 0.05In 20.00In
Zero-sequence current setting
2. In 3I0_EF1 A 0.05In 20.00In
for stage 1

Table 62 SOTF protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the SOFT
2.0 0 SOTF Off SOTF On
protection

8.6 Overload protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

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8.6.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 63 Current setting for trip verifying

Test item Description


105% of the current setting verifying
Binary setting OpConfig/Connect/Func_OL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select, the detail setting list refer to the Reference


Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

Table 64 Current setting for alarm verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The alarm should be issued

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Test item Description
95% of the current setting verifying
OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The alarm should not be issued

1.2 Verifying the time setting

Table 65 Time setting for trip verifying

Test item Description


Binary setting OpConfig/Connect/Func_OL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the alarm
Test result
time meet the requirement in technical data

Table 66 Time setting for alarm verifying

Test item Description


OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value
The alarm should be issued, and the alarm time meet the
Test result
requirement in technical data

2 Verifying the settings of other phase

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The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.6.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.6.3 Reference setting list for test

Table 67 Overload protection connector list

NO. Default Abbr. Explanation


1. On Func_OL Enable or disable the overload protection

Table 68 Overload protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Current setting for alarm of
1. 1.5In I_OL Alarm A 0.05In 20.00In
overload protection
Time setting for alarm of
2. 5 T_OL Alarm s 0.10 6000.0
overload protection
Current setting for trip of
3. 1.2In I_OL Trip A 0.05In 20.00In
overload protection
Time setting for trip of overload
4. 10 T_OL Trip s 0.10 6000.0
protection

Table 69 Overload protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the alarm
4.7 1 OL Alarm Off OL Alarm On
function of overload protection

8.7 Overvoltage protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

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8.7.1 Verifying the settings

8.7.1.1 Verifying the settings of stage 1 of overvoltage protection

1 Phase-to-earth voltage discrimination

1.1 Verifying the phase A settings

1.1.1 Verifying the voltage setting

Table 70 Voltage setting verifying

Test item Description


105% of the voltage setting verifying
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase A
Fault simulation Overvoltage value: 105% of the setting value
Overvoltage time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the voltage setting verifying
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase A
Fault simulation Overvoltage value: 95% of the setting value
Overvoltage time: longer than the setting value
Test result The corresponding output contacts should not close

1.1.2 Veritying the time setting

Table 71 Time setting verifying

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Test item Description
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase A
Fault simulation Overvoltage value: 120% of the setting value
Overvoltage time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.1.3 Veritying the dropout ratio setting

Table 72 Dropout ratio setting verifying

Test item Description


101% of the dropout ratio setting verifying
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase A
Overvoltage value: 120% of the setting value
Fault simulation
Overvoltage time: longer than the setting value
Dropout ratio: 101% of the setting value
Test result The protection function does not dropout
99% of the voltage setting verifying
Settings/ProtContwd/Pls Input SetGrNo/Voltage/Func_OV1, set
the binary setting as 1
Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV PE, set the
Binary setting
binary setting as 1
Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV1 Trip, set
the binary setting as 1
Settings/ProtSet/Pls Input SetGrNo/Current, the detail setting list
Setting value
refer to the Reference setting list for test in this section
Binary input None

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Test item Description
Overvoltage phase: phase A
Overvoltage value: 120% of the setting value
Fault simulation
Overvoltage time: longer than the setting value
Dropout ratio: 99% of the setting value
Test result The protection function dropout

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

2 Phase-to-phase voltage discrimination

2.1 Verifying the phase AB settings

2.1.1 Verifying the voltage setting

Table 73 Voltage setting verifying

Test item Description


105% of the voltage setting verifying
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase AB
Fault simulation Overvoltage value: 105% of the setting value
Overvoltage time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the voltage setting verifying
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None

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Test item Description
Overvoltage phase: phase AB
Fault simulation Overvoltage value: 95% of the setting value
Overvoltage time: longer than the setting value
Test result The corresponding output contacts should not close

2.1.2 Veritying the time setting

Table 74 Time setting verifying

Test item Description


OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase AB
Fault simulation Overvoltage value: 120% of the setting value
Overvoltage time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

2.1.3 Veritying the dropout ratio setting

Table 75 Dropout ratio setting verifying

Test item Description


101% of the dropout ratio setting verifying
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase AB
Overvoltage value: 120% of the setting value
Fault simulation
Overvoltage time: longer than the setting value
Dropout ratio: 101% of the setting value
Test result The protection function does not dropout

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Test item Description
99% of the voltage setting verifying
Settings/ProtContwd/Pls Input SetGrNo/Voltage/Func_OV1, set
the binary setting as 1
Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV PE, set the
Binary setting
binary setting as 0
Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV1 Trip, set
the binary setting as 1
Settings/ProtSet/Pls Input SetGrNo/Current, the detail setting list
Setting value
refer to the Reference setting list for test in this section
Binary input None
Overvoltage phase: phase AB
Overvoltage value: 120% of the setting value
Fault simulation
Overvoltage time: longer than the setting value
Dropout ratio: 99% of the setting value
Test result The protection function dropout

2.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.7.1.2 Verifying the settings of stage 2 of overvoltage protection

The test method and test items of verifying the stage 2 of overvoltage
protection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.

8.7.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.7.3 Reference setting list for test

Table 76 Overvoltage protection connector list

NO. Default Abbr. Explanation


1. On Func_OV1 Enable or disable the stage 1 of overvoltage protection
2. On Func_OV2 Enable or disable the stage 2 of overvoltage protection

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Table 77 Overvoltage protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


40.00 100.0
Voltage setting for stage 1 of (PE) (PE)
1. 70 U_OV1 V
overvoltage protection 80.00 200.0
(PP) (PP)
Time setting for stage 1 of
2. 0.1 T_OV1 s 0.00 60.00
overvoltage protection
40.00 100.0
Voltage setting for stage 2 of (PE) (PE)
3. 70 U_OV2 V
overvoltage protection 80.00 200.0
(PP) (PP)
Time setting for stage 2 of
4. 0.1 T_OV2 s 0.00 60.00
overvoltage protection
Dropout ratio for overvoltage
5. 0.95 Dropout_OV 0.90 0.99
protection

Table 78 Overvoltage protection binary setting list

Bit Default 0 1 Explanation


Phase-to-phase or
3.3 1 OV PP OV PE phase-to-earth discrimination
for overvoltage protection
Stage 1 of overvoltage
4.12 1 OV1 Alarm OV1 Trip
protection alarm or trip

8.8 Undervoltage protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.8.1 Verifying the settings

8.8.1.1 Verifying the settings of stage 1 of undervoltage protection

1 Phase-to-earth voltage discrimination

1.1 Verifying the phase A settings

1.1.1 Verifying the voltage setting

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Table 79 Voltage setting verifying

Test item Description


95% of the voltage setting verifying
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 95% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 105% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should not close

1.1.2 Verifying the time setting

Table 80 Time setting verifying

Test item Description


OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Test item Description
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.1.3 Verifying the current setting

Table 81 Current setting verifying

Test item Description


95% of the current setting verifying
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation
Current value: 95% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should not close
105% of the current setting verifying
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation
Current value: 105% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should be closed

1.1.4 Verifying the auxiliary contact of circuit breaker

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Table 82 Auxiliary contact supervision verifying

Test item Description


CB closed
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three-phase CB state is On
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should be closed
CB opened
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three-phase CB stage is Off
Undervoltage phase: phase A
Undervoltage value: 80% of the setting valu
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should not close

1.1.5 Verifying dropout ration setting

Table 83 Dropout ratio setting verifying

Test item Description


101% of the dropout ratio setting value
OpConfig/Connect/Func_UV1, set the connector as "On"
Binary setting
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

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Test item Description
as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Dropout ratio: 101% of the setting value
Test result The undervoltage protection function should dropout
99% of the dropout ratio setting value
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Dropout ratio: 99% of the setting value
Test result The undervoltage protection function should not dropout

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

2 Phase-to-earth voltage discrimination

The test method and test items of verifying the phase-to-phase voltage
discrimination are same as phase-to-earth voltage discrimination, only need
to change the corresponding test conditions and settings into the

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conrresponding phase-to-phase voltage discrimination required.

3 Undervoltage for three phases discrimination

Table 84 Three-phase undervoltage verifying

Test item Description


95% of the voltage setting verifying
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk All Phase, set the
binary setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A, B, C
Undervoltage value: 95% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk All Phase, set the
binary setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: any one or two or three phase of phase A, B, C
Undervoltage value: 105% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Test result The corresponding output contacts should not close

8.8.1.2 Verifying the settings of stage 2 of undervoltage protection

The test method and test items of verifying the stage 2 of undervoltage
protection are same as stage 1, only need to change the corresponding test

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conditions and settings into the conrresponding stage 1 required.

8.8.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.8.3 Reference setting list for test

Table 85 Undervoltage protection connector list

NO. Default Abbr. Explanation


Enable or disable the stage 1 of undervoltage
3. On Func_UV1
protection
Enable or disable the stage 2 of undervoltage
4. On Func_UV2
protection

Table 86 Undervoltage protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


5.00 75.0
Voltage setting for stage 1 of (PE) (PE)
1. 40 U_UV1 V
undervoltage protection 10.00 150.0
(PP) (PP)
Time setting for stage 1 of
2. 0.1 T_UV1 s 0.00 120.0
undervoltage protection
5.00 75.0
Voltage setting for stage 2 of (PE) (PE)
3. 40 U_UV2 V
undervoltage protection 10.00 150.0
(PP) (PP)
Time setting for stage 2 of
4. 0.1 T_UV2 s 0.00 120.0
undervoltage protection
Dropout ratio for undervoltage
5. 1.05 Dropout_UV 1.01 2.00
protection
Current setting for
6. 0.2In I_Chk A 0.00In 2.00In
undervoltage protection

Table 87 Undervoltage protection binary setting list

Bit Default 0 1 Explanation


Single phase or three phase
2.9 0 3Ph V Connect 1Ph V Connect
voltage connection

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Bit Default 0 1 Explanation
Enable or disable the function
3.0 1 UV Chk CB Off UV Chk CB On
of checking CB status
Enable or disable the function
3.1 1 UV Chk All Phase UV Chk One Phase of checking single phase or
three phase voltage
Phase-to-phase or
3.2 1 UV PP UV PE
phase-to-earth discrimination
Stage 1 of undervoltage
4.11 1 UV1 Alarm UV1 Trip
protection alarm or trip

8.9 Thermal overload protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.9.1 Verifying the settings

8.9.1.1 Verifying the Hot Curve of thermal overload protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 88 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting
Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

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Test item Description
as 1

Settings/Write/Select, the detail setting list refer to the Reference


Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 89 Time setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.3 Verifying the cool ratio setting

Table 90 Cool ratio setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
First thermal accumulation phase:
Fault simulation Fault type: phase A
Fault current: 80% of the setting value

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Test item Description
Accumulation time: for a certain time

Cooling phase:
Fault type: phase A
Fault current: 0
Accumulation time: for a certain time

First thermal accumulation phase:


Fault type: phase A
Fault current: 120% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed

1.4 Verifying the alarm ratio setting

Table 91 Alarm ratio setting verifying

Test item Description


105% of the alarm ratio setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The alarm should be issued
95% of the alarm ratio setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation

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Test item Description
Test result The alarm should not be issued

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.9.1.2 Verifying the Cold Curve of thermal overload protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 92 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 93 Time setting verifying

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Test item Description
105% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

1.3 Verifying the alarm ratio setting

Table 94 Alarm ratio setting verifying

Test item Description


105% of the alarm ratio setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the time calculated by the equation
Test result The alarm should be issued
95% of the alarm ratio setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation

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Test item Description
Test result The alarm should not be issued

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.9.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.9.3 Reference setting list for test

Table 95 Thermal overload protection connector list

NO. Default Abbr. Explanation


1. On Func_ThermOL Enable or disable the thermal overload protection

Table 96 Thermal overload protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Current setting for thermal
1. In I_Therm OL A 0.10In 10.00In
overload protection
Time constant for thermal
2. 60 T_Const Therm S 6.0 9999
overload protection
Cool ratio for Hot Curve of
3. 1 Ratio_Cool 0.100 10.00
thermal overload protection
Alarm ratio for thermal
4. 0.9 Ratio_Alarm 0.500 1.000
overload protection

Table 97 Thermal overload protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the alarm
2.5 1 Therm Alarm Off Therm Alarm On function of thermal overload
protection
Enable or disable the Hot
2.6 1 Hot Curve Cold Curve
Curve or Cold Curve

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8.10 Displacement voltage protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.10.1 Verifying the settings

8.10.1.1 Verifying the settings of stage 1 of displacement voltage


protection

1 Verifying the phase A settings

1.1 Verifying the voltage setting

Table 98 Voltage setting verifying

Test item Description


105% of the voltage setting verifying
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Fault simulation Displacement voltage phase: phase A
Displacement voltage value: 105% of the setting value
Displacement voltage time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the voltage setting verifying
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None

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Test item Description
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Fault simulation Displacement voltage phase: phase A
Displacement voltage value: 95% of the setting value
Displacement voltage time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Veritying the time setting

Table 99 Time setting verifying

Test item Description


OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Fault simulation Displacement voltage phase: phase A
Displacement voltage value: 120% of the setting value
Displacement voltage time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.10.1.2 Verifying the settings of stage 2 of overvoltage protection

The test method and test items of verifying the stage 2 of overvoltage
protection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.

8.10.1.3 Verifying the settings for determining the fault phase

1 Verifying the phase A settings

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1.1 Verifying the low voltage setting

Table 100 Low-voltage setting verifying

Test item Description


105% of the low voltage setting verifying
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Low voltage phase: phase A
Fault simulation
Low voltage value: 105% of the low voltage setting value
Phase B and phase C: large than the high voltage setting value
Low voltage time: longer than the setting value
Test result The corresponding fault pahse should not be reported
95% of the low voltage setting verifying
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Low voltage phase: phase A
Fault simulation
Low voltage value: 95% of the low voltage setting value
Phase B and phase C: 120% the high voltage setting value
Low voltage time: longer than the setting value
Test result The corresponding fault pahse should be reported

1.2 Verifying the low voltage setting

Table 101 High-voltage setting verifying

Test item Description


105% of the high voltage setting verifying

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Test item Description
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Low voltage phase: phase A
Fault simulation Low voltage value: 80% of the low voltage setting value
Phase B: 105% of the high voltage setting value
phase C: 120% of the high voltage setting value
High voltage time: longer than the setting value
Test result The corresponding fault pahse should be reported
95% of the high voltage setting verifying
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Low voltage phase: phase A
Fault simulation Low voltage value: 80% of the low voltage setting value
Phase B: 95% of the high voltage setting value
phase C: 120% of the high voltage setting value
High voltage time: longer than the setting value
Test result The corresponding fault pahse should not be reported

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.10.2 Completing the test

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Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.10.3 Reference setting list for test

Table 102 Displacement voltage protection connector list

NO. Default Abbr. Explanation


Enable or disable the stage 1 of displacement voltage
1. On Func_3V01
protection
Enable or disable the stage 2 of displacement voltage
2. On Func_3V02
protection

Table 103 Displacement voltage protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Voltage setting for stage 1 of
1. 20 U_3V01 V 2.00 100.0
displacement voltage protection
Time setting for stage 1 of
2. 1 T_3V01 S 0.00 60.00
displacement voltage protection
Voltage setting for stage 2 of
3. 30 U_3V02 V 2.00 100.0
displacement voltage protection
Time setting for stage 2 of
4. 0.5 T_3V02 S 0.00 60.00
displacement voltage protection
Low voltage setting for
5. 20 U_Phase low V 10.00 100.0
determining fault phase
High voltage setting for
6. 45 U_Phase up V 10.00 100.0
determining fault phase

Table 104 Displacement voltage protection binary setting list

Bit Default 0 1 Explanation


3U0 is measured or
2.8 1 3U0 Measured 3U0 Calculated
calculated
Stage 1 of displacement
4.9 1 3V01 Alarm 3V01 Trip voltage protection alarm or
trip
Stage 2 of displacement
4.10 1 3V02 Alarm 3V02 Trip voltage protection alarm or
trip

8.11 Circuit breaker failure protection

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Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.11.1 Verifying the settings of stage 1 of CBF protection

8.11.1.1 Verifying the settings of stage 1 of CBF protection

1 Verifying the phase A settings

1.1 Verifying the current setting

Table 105 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Fault simulation Current value: 105% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Fault simulation Current value: 95% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the zero-sequence current setting

Table 106 Zero-sequence current setting verifying

Test item Description

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Test item Description
105% of the zero-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Zero-sequence current value: 105% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the zero-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Zero-sequence current value: 95% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close

1.3 Verifying the negative-sequence current setting

Table 107 Negative-sequence current setting verifying

Test item Description


105% of the negative-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection

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Test item Description
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Negative-sequence current value: 105% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the negative-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Negative-sequence current value: 95% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close

1.4 Verifying the CB status

Table 108 CB status verifying

Test item Description


The CB status is On
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk CB On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Active the binary input of initiation circuit breaker failure protection
Binary input
The CB status is On
CBF phase: phase A
Fault simulation Current value: 70% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should be closed
The CB status is Off
OpConfig/Connect/Func_CBF, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/CBF Chk CB On, set the binary
setting as 1

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Test item Description
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Active the binary input of initiation circuit breaker failure protection
Binary input
The CB status is Off
CBF phase: phase A
Fault simulation Current value: 70% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close

1.5 Verifying the time setting

Table 109 Time setting verifying

Test item Description


OpConfig/Connect/Func_CBF, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Fault simulation Current value: 200% of the setting value
CBF time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the settings of other phase
protection are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding phase A required.

8.11.1.2 Verifying the settings of stage 2 of CBF protection

The test method and test items of verifying the stage 2 of CBF protection are
same as stage 1, only need to change the corresponding test conditions and
settings into the conrresponding stage 2 required.

8.11.2 Completing the test

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Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.11.3 Reference setting list for test

Table 110 CBF protection connector list

NO. Default Abbr. Explanation


1. On Func_CBF Enable or disable the circuit breaker failure protection

Table 111 CBF protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Phase current setting for CBF
1. In I_CBF A 0.05In 20.00In
protection
Zero-sequence current setting
2. In 3I0_CBF A 0.05In 20.00In
for CBF protection
Negative-sequence current
3. In 3I2_CBF A 0.05In 20.00In
setting for CBF protection
Delay time for stage 1 of CBF
4. 0 T_CBF1 s 0.00 60.00
protection
Delay time for stage 2 of CBF
5. 0.2 T_CBF2 s 0.10 60.00
protection

Table 112 CBF protection binary setting list

Bit Default 0 1 Explanation


3U0 is measured or
2.7 1 3I0 Measured 3I0 Calculated
calculated
Enable or disable the function
3.6 1 CBF Chk I0/2 Off CBF Chk I0/2 On for checking zero or negative
sequence current
Enable or disable the function
3.7 1 CBF Chk CB Off CBF Chk CB On
for checking CB status

8.12 Dead zone protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

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8.12.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 113 Current setting verifying

Test item Description


105% of the current setting verifying
Binary setting OpConfig/Connect/Func_DZ, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Three phase CB status is Off
Binary input
Active the binary input of initiation circuit breaker failure protection
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
Binary setting OpConfig/Connect/Func_DZ, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Three phase CB status is Off
Binary input
Active the binary input of initiation circuit breaker failure protection
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 114 Time setting verifying

Test item Description


Binary setting OpConfig/Connect/Func_DZ, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Three phase CB status is Off
Binary input
Active the binary input of initiation circuit breaker failure protection
Fault type: phase A, instantanuous
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the setting value

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Test item Description
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.12.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.12.3 Reference setting list for test

Table 115 Dead zone protection connector list

NO. Default Abbr. Explanation


1. On Func_DZ Enable or disable the dead zone protection

Table 116 Dead zone protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Time delay for dead zone
1. 0.2 T_Dead Zone s 0.00 60
protection
Phase current setting for CBF
2. In I_CBF A 0.05In 20In
protection

8.13 Synchro-check and energizing check function

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.13.1 Verifying the settings

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Figure 13 Connection example of synchro-check function

If the tester can't provide the reference voltage U4, the wiring connection is
shown in Figure 14.

Figure 14 Connection example of synchro-check function

8.13.1.1 Synchro-check function

1 Verifying the phase A of synchro-check

1.1 Verifying the voltage difference

Table 117 Voltage difference setting verifying

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Test item Description
1 V of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: less than (rated voltage value voltage
Synchronism condition difference setting + 1 V)
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchronazation OK is issued
> 1 V of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: large than (rated voltage value voltage
Fault simulation difference setting + 1 V)
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of voltage difference failure is issued

1.2 Verifying the frequency difference

Table 118 Frequency difference setting verifying

Test item Description


20 mHz of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request

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Test item Description
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Synchronism condition Voltage difference: 0
Frequence difference: less than (setting value + 20 mHz)
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchronazation OK is issued
> 20 mHz of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Fault simulation Voltage difference: 0
Frequence difference: large than (setting value + 20 mHz)
Angle difference: 0
Checking time: longer than the setting value
Test result The report of frequency difference failure is issued

1.3 Verifying the angle difference

Table 119 Angle difference setting verifying

Test item Description


3 of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Synchronism condition Voltage difference: 0
Frequence difference: 0
Angle difference: less than (setting value + 3)
Checking time: longer than the setting value

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Test item Description
Test result The report of synchronazation OK is issued
> 3 of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Fault simulation Voltage difference: 0
Frequence difference: 0
Angle difference: large than (setting value + 3)
Checking time: longer than the setting value
Test result The report of angle difference failure is issued

1.4 Verifying the minimum voltage for synchro-check

Table 120 Minimum voltage for synchro-check setting verifying

Test item Description


105% of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: 120% of the setting value
Reference voltage: 105% of the setting value
Synchronism condition Voltage difference: less than the voltage difference setting value
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchro-check meet is issued
95% of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Test item Description
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: 120% of the setting value
Reference voltage: 95% of the setting value
Fault simulation Voltage difference: less than the voltage difference setting value
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchro-check failure is issued

2 Verifying the synchro-check settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.13.1.2 Energizing check

1 Verifying the phase A setting

1.1 Checking the dead line live busbar

Table 121 Maximum energizing voltage setting verifying

Test item Description


98% of the setting verifying
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkDLLB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Energizing check phase: phase A
Three-phase voltage: rated voltage
Voltage condition
Reference voltage: 98% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check meet is issued
102% of the setting verifying
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkDLLB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Test item Description
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: rated voltage
Fault simulation
Reference voltage: 102% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check failure is issued

1.1.1 Checking the live line dead busbar

Table 122 Maximum energizing voltage setting verifying

Test item Description


98% of the setting verifying
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkLLDB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: 0
Voltage condition
Reference voltage: 98% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check meet is issued
102% of the setting verifying
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkLLDB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: 0
Fault simulation
Reference voltage: 102% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check failure is issued

1.1.2 Checking the dead line dead busbar

Table 123 Maximum energizing voltage setting verifying

Test item Description


98% of the setting verifying

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Test item Description
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkDLDB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: 0
Voltage condition
Reference voltage: 98% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check meet is issued
102% of the setting verifying
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkDLDB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: 0
Fault simulation
Reference voltage: 102% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check failure is issued

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.13.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.13.3 Reference setting list for test

Table 124 Synchro-check and energizing check function connector list

NO. Default Abbr. Explanation


1. On Func_AR Enable or disable the synchronization check function

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NO. Default Abbr. Explanation
2. On Func_MC Enable or disable the synchronization check function

Table 125 Synchro-check and energizing check function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Time for synchro-check
1. 500 T_Syn Chk S 0.05 60.00
function
Maximum time for exiting
2. 0.1 T_MaxSynExt S 0.05 60.00
synchronization check
Maximum time for
3. 0.1 T_MaxSynReq S 0.05 60.00
synchronization check
4. 1 Phase_UL Phase determination setting 1.00 6.00
Angle difference for
5. 10 Angle_Syn Diff synchro-check function Degree 1.00 80.00

Voltage difference for


6. 5 U_Syn Diff synchro-check function V 1.00 40.00

Frequency difference for


7. 0.02 Freq_Syn Diff HZ 0.02 2.00
synchro-check function
Minimum voltage for
8. 43 Umin_Syn V 60.00 130.0
synchronization check
Maximum voltage for
9. 17 Umax_Energ V 20.00 100.0
Energizing check

Table 126 Synchro-check and energizing check binary setting list

Bit Default 0 1 Explanation


Synchrozination check mode
3.8 1 Energizing for DLLB check
mode
Energizing for LLDB check
3.9 0 Selection of AR check mode
mode
Energizing for DLDB check
mode
3.10 0
Override mode
Synchrozination check mode
3.11 1 Energizing for DLLB check
mode
Selection of MC check mode Energizing for LLDB check
3.12 0
mode
Energizing for DLDB check
3.13 0 mode

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Bit Default 0 1 Explanation
Override mode

8.14 Auto-recloser

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.14.1 Verifying the settings

8.14.1.1 Verifying the shot 1 of autoreclosure function

1 Three-phase autoreclosure mode

Table 127 Three phase autoreclosing verifying

Test item Description


OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
The binary input of three phase autoreclosure initiation from 1 to 0
Binary input
Active the binary input of synchronization request
Precondition: the time of autoreclosure reset is met
Autoreclosure Synchronism: synchro-check is satisfied
condition Current: no current of phase ABC
Time: longer than the setting value
Test result The corresponding contact of autoreclosure is colsed

8.14.1.2 Verifying the other shots of autoreclosure function

The test method of verifying the other short is same as shot 1, only need to
change the corresponding test conditions and settings into the
conrresponding shot 1 required.

8.14.2 Completing the test

Continue to test another function or end the test. Restore connections and

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settings to their original values, if they were changed for testing purposes.

8.14.3 Reference setting list for test

Table 128 Auto-recloser function connector list

NO. Default Abbr. Explanation


1. On Func_AR Enable or disable the auto-recloser function

Table 129 Auto-recloser function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Time delay setting for shot 1
1. 0.5 T_3P AR1 S 0.05 60.00
of three phase autoreclosure
Time delay setting for shot 2
2. 0.5 T_3P AR2 S 0.05 60.00
of three phase autoreclosure
Time delay setting for shot 3
3. 0.5 T_3P AR3 S 0.05 60.00
of three phase autoreclosure
Time delay setting for shot 4
4. 0.5 T_3P AR4 S 0.05 60.00
of three phase autoreclosure
Pulse length setting for
5. 4 Times_AR 1.00 4.00
autoreclosure
Time setting for
6. 3 T_Reclaim S 0.05 60.00
autoreclosure succeed
Time setting for spring
7. 3 T_AR Reset S 0.05 60.00
charging
Maximum time setting for CB
8. 0.1 T_Max. CB Open S 0.05 60.00
open
Time for synchro-check
9. 500 T_Syn Chk S 0.05 60.00
function
Maximum time for exiting
10. 0.1 T_MaxSynExt S 0.05 60.00
synchronization check
11. 1 Phase_UL Phase determination setting 1.00 6.00
Angle difference for
12. 10 Angle_Syn Diff Degree 1.00 80.00
synchro-check function
Voltage difference for
13. 5 U_Syn Diff V 1.00 40.00
synchro-check function
Frequency difference for
14. 0.02 Freq_Syn Diff HZ 0.02 2.00
synchro-check function
Minimum voltage for
15. 43 Umin_Syn V 60.00 130.0
synchronization check
Maximum voltage for
16. 17 Umax_Energ V 20.00 100.0
Energizing check

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NO. Default Abbr. Explanation Unit Min. Max.
17. 10 T_CB Faulty Time setting for CB faulty S 0.10 60.00

Table 130 Auto-recloser function binary setting list

Bit Default 0 1 Explanation


3.8 1 Synchrozination check mode
3.9 0 Energizing for DLLB check
mode
Energizing for LLDB check
Selection of AR check mode
mode
3.10 0
Energizing for DLDB check
mode
Override mode
Enable or disable the AR
5.0 0 OC1 Init AR Off function is initiated by stage 1
of overcurrent protection
Enable or disable the AR
5.1 0 OC2 Init AR Off function is initiated by stage 2
of overcurrent protection
Enable or disable the AR
function is initiated by inverse
5.2 0 OC Inv Init AR Off
stage of overcurrent
protection
Enable or disable the AR
5.3 0 EF1 Init AR Off function is initiated by stage 1
of earth fault protection
Enable or disable the AR
5.4 0 EF2 Init AR Off function is initiated by stage 2
of earth fault protection
Enable or disable the AR
5.5 0 EF Inv Init AR Off function is initiated by inverse
stage of earth fault protection
Enable or disable the AR
function is initiated by stage 1
5.6 0 SEF1 Init AR Off
of sensitive earth fault
protection
Enable or disable the AR
function is initiated by stage 2
5.7 0 SEF2 Init AR Off
of sensitive earth fault
protection
Enable or disable the AR
5.8 0 SEF Inv Init AR Off function is initiated by inverse
stage of sensitive earth fault

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Bit Default 0 1 Explanation
protection
Enable or disable the AR
function is initiated by stage 1
5.9 0 NSOC1 Init AR Off
of negative sequence
overcurrent protection
Enable or disable the AR
function is initiated by stage 2
5.10 0 NSOC2 Init AR Off
of negative sequence
overcurrent protection
Enable or disable the AR
function is initiated by inverse
5.11 0 NSOC Inv Init AR Off
stage of negative sequence
overcurrent protection
Enable or disable the AR
function is initiated by single
5.15 0 3P Fault Init AR 3P Fault Blk AR
phase fault or three phase
fault

8.15 Low(under) frequency load shedding protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.15.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the frequency setting

Table 131 Frequency setting verifying

Test item Description


95% of the frequency setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault simulation Fault type: phase A

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Test item Description
Frequency value: 105% of the low frequency setting
Voltage value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the frequency setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 95% of the low frequency setting
Fault simulation Voltage value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 132 Time setting verifying

Test item Description


OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

1.3 Verifying the voltage setting

Table 133 Voltage setting verifying

Test item Description

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Chapter 6 IED testing
Test item Description
95% of the voltage setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 95% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 105% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.4 Verifying the current setting

Table 134 Current setting verifying

Test item Description


95% of the current setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation
Voltage value: 70% of the voltage checking setting
Current value: 95% of the current checking seeting

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Test item Description
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 105% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.5 Verifying the dF/dt setting

Table 135 dF/dt setting verifying

Test item Description


105% of the dF/dt setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Voltage value: 70% of the voltage checking setting
Fault simulation
Current value: 70% of the current checking seeting
dF/dt value: 105% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the dF/dt setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1

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Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Voltage value: 70% of the voltage checking setting
Fault simulation
Current value: 70% of the current checking seeting
dF/dt value: 95% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.15.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.15.3 Reference setting list for test

Table 136 Low frequency load shedding protection connector list

NO. Default Abbr. Explanation


Enable or disable the low frequency load shedding
1. On Func_LF LS
protection

Table 137 Low frequency load shedding protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Frequency setting for low frequency
1. 49.5 F_LF LS HZ 45.00 60.00
load shedding protection
Time setting for low frequency load
2. 0.5 T_LF LS S 0.05 60.00
shedding protection
dF/dt setting for low frequency load
3. 3 dF/dt_LS HZ/S 1.00 10.00
shedding protection
Voltage checking setting for low
4. 70 U_Chk V 10.00 120.0
frequency load shedding protection

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Chapter 6 IED testing
Current checking setting for low
5. 0.2In I_Chk A 0 2.00In
frequency load shedding protection

Table 138 Low frequency load shedding protection binary setting list

Bit Default 0 1 Explanation


Single phase or three phase
2.9 0 3Ph V Connect 1Ph V Connect
voltage connection
Enable or disable the binary
3.4 1 dF(dU)/dt Off dF(dU)/dt On
setting of dF(dU)/dt

8.16 Low voltage load shedding protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.16.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the voltage setting

Table 139 Voltage setting verifying

Test item Description


95% of the voltage setting verifying
OpConfig/Connect/Func_LV LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 95% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_LV LS, set the connector as "On"
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

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Test item Description
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 105% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 140 Time setting verifying

Test item Description


OpConfig/Connect/Func_LV LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

1.3 Verifying the voltage checking setting

Table 141 Voltage checking setting verifying

Test item Description


95% of the voltage checking setting verifying
OpConfig/Connect/Func_LV LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault simulation Fault type: phase A

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Test item Description
Voltage value: 70% of the voltage setting
Voltage checking value: 95% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage checking setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 105% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.4 Verifying the current setting

Table 142 Current setting verifying

Test item Description


95% of the current setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 95% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the current setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Test item Description
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 105% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.5 Verifying the dU/dt setting

Table 143 dF/dt setting verifying

Test item Description


105% of the dU/dt setting verifying
OpConfig/Connect/Func_LV LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Voltage checking value: 70% of the voltage checking setting
Fault simulation
Current value: 70% of the current checking seeting
dU/dt value: 105% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the dU/dt setting verifying
OpConfig/Connect/Func_LV LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
dU/dt value: 95% of the setting

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Test item Description
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.16.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.16.3 Reference setting list for test

Table 144 Low frequency load shedding protection connector list

NO. Default Abbr. Explanation


Enable or disable the low voltage load shedding
1. On Func_LV LS
protection

Table 145 Low frequency load shedding protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Voltage setting for low voltage load
1. 100 U_LV LS V 50.00 110.00
shedding protection
Time setting for low voltage load
2. 1 T_LV LS S 0.05 60.00
shedding protection
dF/dt setting for low voltage load
3. 5 dU/dt_LS HZ/S 1.00 10.00
shedding protection
Voltage checking setting for low
4. 70 U_Chk V 10.00 120.0
voltage load shedding protection
Current checking setting for low
5. 0.2In I_Chk A 0 2.00In
voltage load shedding protection

Table 146 Low frequency load shedding protection binary setting list

Bit Default 0 1 Explanation


Single phase or three phase
2.9 0 3Ph V Connect 1Ph V Connect
voltage connection

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Bit Default 0 1 Explanation
Enable or disable the binary
3.4 1 dF(dU)/dt Off dF(dU)/dt On
setting of dF(dU)/dt

8.17 Overload load shedding protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.17.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 147 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

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1.2 Verifying the time setting

Table 148 Time setting verifying

Test item Description


OpConfig/Connect/Func_OL LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 200% of the current setting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

1.3 Verifying the voltage checking setting

Table 149 Voltage checking setting verifying

Test item Description


95% of the voltage checking setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/OL LS Chk V On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation
Voltage value: 95% of the voltage checking setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage checking setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/OL LS Chk V On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Test item Description
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation
Voltage value: 105% of the voltage checking setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.4 Verifying the dF/dt setting

Table 150 dF/dt setting verifying

Test item Description


105% of the dF/dt setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation dF/dt value: 105% of the setting
dU/dt value: 120% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the dF/dt setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation dF/dt value: 95% of the setting
dU/dt value: 120% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

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1.5 Verifying the dU/dt setting

Table 151 dU/dt setting verifying

Test item Description


105% of the dU/dt setting verifying
OpConfig/Connect/Func_OL LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation dF/dt value: 120% of the setting
dU/dt value: 105% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the dU/dt setting verifying
OpConfig/Connect/Func_LV LS, set the connector as "On"
Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation dF/dt value: 105% of the setting
dU/dt value: 95% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.17.2 Completing the test

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Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.17.3 Reference setting list for test

Table 152 Overload load shedding protection connector list

NO. Default Abbr. Explanation


Enable or disable the low voltage load shedding
1. On Func_Lv LS
protection

Table 153 Overload load shedding protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Current setting for over load load
1. In I_OL LS V 50.00 110.00
shedding protection
Time setting for over load load
2. 1 T_OL LS S 0.05 60.00
shedding protection
dU/dt setting for over load load
3. 5 dU/dt_LS V/S 1.00 10.00
shedding protection
dF/dt setting for over load load
4. 3 dF/dt_LS HZ/S 1.00 10.00
shedding protection
Voltage checking setting for low
5. 70 U_Chk V 10.00 120.0
voltage load shedding protection

Table 154 Overload load shedding protection binary setting list

Bit Default 0 1 Explanation


Single phase or three phase
2.9 0 3Ph V Connect 1Ph V Connect
voltage connection
Enable or disable the binary
3.4 1 dF(dU)/dt Off dF(dU)/dt On
setting of dF(dU)/dt
Enable or disable the function
3.5 1 OL LS Chk V Off OL LS Chk V On
of checking voltage

8.18 Unbalance protection

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

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8.18.1 Verifying the settings

8.18.1.1 Verifying the setting for tripping

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 155 Current setting verifying

Test item Description


105% of the current setting verifying
Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the voltage setting

Table 156 Voltage setting verifying

Test item Description


105% of the voltage setting verifying
Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Voltage value: 105% of the voltage setting
Fault time: longer than the setting value

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Test item Description
Test result The corresponding output contacts should be closed
95% of the voltage setting verifying
Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Voltage value: 105% of the voltage setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.3 Verifying the time setting

Table 157 Time setting verifying

Test item Description


Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 200% of the current setting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.18.1.2 Verifying the setting for alarming

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 158 Current setting verifying

Test item Description


105% of the current setting verifying
Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

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Test item Description
Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_UBL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the voltage setting

Table 159 Voltage setting verifying

Test item Description


105% of the voltage setting verifying
OpConfig/Connect/Func_UBL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Voltage value: 105% of the voltage setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the voltage setting verifying
OpConfig/Connect/Func_UBL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Setting value Settings/Write/Select, the detail setting list refer to the Reference

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Test item Description
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Voltage value: 105% of the voltage setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.3 Verifying the time setting

Table 160 Time setting verifying

Test item Description


OpConfig/Connect/Func_UBL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 200% of the current setting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.18.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.18.3 Reference setting list for test

Table 161 Unbalance protection connector list

NO. Default Abbr. Explanation


1. On Func_UBL Enable or disable the unbalance protection

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Table 162 Unbalance protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Voltage setting for alarm of
1. U_UBL Alarm V 0.50 100.0
unbalance protection
Current setting for alarm of
2. I_UBL Alarm A 0.10 20.0
unbalance protection
Time setting for alarm of
3. T_UBL Alarm S 0.10 60.00
unbalance protection
Voltage setting for tripping of
4. U_UBL Trip V 0.50 100.0
unbalance protection
Current setting for tripping of
5. I_UBL Trip A 0.10 20.0
unbalance protection
Time setting for tripping of
6. T_UBL Trip S 0.00 60.00
unbalance protection

Table 163 Unbalance protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the alarm
4.8 UBL Alarm Off UBL Alarm On function of unbalance
protection

8.19 Under current monitoring

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.19.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 164 Current setting verifying

Test item Description


95% of the current setting verifying
Binary setting OpConfig/Connect/Func_UC, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section

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Test item Description
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 95% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the current setting verifying
Binary setting OpConfig/Connect/Func_UC, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 165 Time setting verifying

Test item Description


Binary setting OpConfig/Connect/Func_UC, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 70% of the current setting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

1.3 Verifying the inhibition time setting

Table 166 Inhibition time setting verifying

Test item Description


Binary setting OpConfig/Connect/Func_UC, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 70% of the current setting
Fault time: longer than the setting value

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Test item Description
The corresponding output contacts should be closed, and the
Test result
inhibition time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.19.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.19.3 Reference setting list for test

Table 167 Under current protection connector list

NO. Default Abbr. Explanation


1. On Func_UC Enable or disable the under current protection

Table 168 Unbalance protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Current setting for under current
1. I_UC A 0.50In 20.00In
protection
Time setting for tripping of under
2. T_UC S 0.10 60.00
current protection
Time setting for inhibition of under
3. T_Inhibition S 30.00 6000.0
current protection

8.20 Current overload monitoring

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.20.1 Verifying the settings

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8.20.1.1 Verifying the setting for tripping

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 169 Current setting verifying

Test item Description


105% of the current setting verifying
Binary setting OpConfig/Connect/Func_OL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
Binary setting OpConfig/Connect/Func_OL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Current value: 95% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 170 Time setting verifying

Test item Description


Binary setting OpConfig/Connect/Func_OL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Current value: 200% of the current setting
Fault time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data

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8.20.1.2 Verifying the setting for alarming

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 171 Current setting verifying

Test item Description


105% of the current setting verifying
OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The alarm should be issued
95% of the current setting verifying
OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Current value: 95% of the current setting
Fault time: longer than the setting value
Test result The alarm should not be issued

1.2 Verifying the time setting

Table 172 Time setting verifying

Test item Description


OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault simulation Fault type: phase A

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Test item Description
Current value: 200% of the current setting
Fault time: longer than the setting value
The alarm should be issued, and the alarm time meet the
Test result
requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.20.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.20.3 Reference setting list for test

Table 173 Current overload protection connector list

NO. Default Abbr. Explanation


1. On Func_OL Enable or disable the current overload protection

Table 174 Current overload protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Current setting for alarm of current
1. I_OL Alarm A 0.50In 20.00In
overload protection
Time setting for alarm of current
2. T_OL Alarm S 0.10 6000.0
overload protection
Current setting for tripping of
3. I_OL Trip A 0.50In 20.00In
current overload protection
Time setting for tripping of current
4. T_OL Trip S 0.10 6000.0
overload protection

Table 175 Current overload protection binary setting list

Bit Default 0 1 Explanation


Enable or disable the alarm
4.7 OL Alarm Off OL Alarm On function of current overload
protection

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8.21 Control circuit faulty supervising

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.21.1 Verifying the settings

8.21.1.1 Verifying the CB status

Table 176 CB status verifying

Test item Description


Active One of the two binary input
Settings/Write/Select/Ctr Word 4/CB Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input 3Ph CB Open or 3Ph CB Close
Fault simulation Active time: longer than the setting value
Test result The alarm should not be issued
Active both of the two binary input
Settings/Write/Select/Ctr Word 4/CB Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input 3Ph CB Open and 3Ph CB Close
Fault simulation Active time: longer than the setting value
Test result The alarm should be issued

8.21.1.2 Verifying the DS(Disconnection switch) status

Table 177 DS status verifying

Test item Description


Active One of the two binary input
Settings/Write/Select/Ctr Word 4/DS Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input DS Open or DS Close
Fault simulation Active time: longer than the setting value

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Test item Description
Test result The alarm should not be issued
Active both of the two binary input
Settings/Write/Select/Ctr Word 4/DS Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input DS Open and DS Close
Fault simulation Active time: longer than the setting value
Test result The alarm should be issued

8.21.1.3 Verifying the ES(Earth switch) status

Table 178 ES status verifying

Test item Description


Active One of the two binary input
Settings/Write/Select/Ctr Word 4/ES Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input ES Open or ES Close
Fault simulation Active time: longer than the setting value
Test result The alarm should not be issued
Active both of the two binary input
Settings/Write/Select/Ctr Word 4/ES Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input ES Open and ES Close
Fault simulation Active time: longer than the setting value
Test result The alarm should be issued

8.21.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.21.3 Reference setting list for test

Table 179 Control circuit faulty supervising function setting list

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NO. Default Abbr. Explanation Unit Min. Max.
Time setting for supervising the
1. 10 T_CB POS S 0.10 60.00
CB status
Time setting for supervising the
2. 10 T_DS POS S 0.10 60.00
DS status
Time setting for supervising the
3. 10 T_ES POS S 0.10 60.00
ES status

Table 180 Control circuit faulty supervising binary setting list

Bit Default 0 1 Explanation


Enable or disable the function
4.13 1 CB Faulty Off CB Faulty On
of supervising the CB status
Enable or disable the function
4.14 1 DS Faulty Off DS Faulty On
of supervising the DS status
Enable or disable the function
4.15 1 ES Faulty Off ES Faulty On
of supervising the ES status

8.22 Current transformer secondary circuit


supervision

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.22.1 Verifying the settings

1 Verifying the phase A setting

Table 181 Zero-sequence current setting verifying

Test item Description


105% of the zero-sequence current setting verifying
Settings/Write/Select/Ctr Word 2/CT Fail On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation
Fault current: 105% of the setting value
Test result The CT failure alarm is reported

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Test item Description
95% of the zero-sequence current setting verifying
Settings/Write/Select/Ctr Word 2/CT Fail On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation
Fault current: 95% of the setting value
Test result The CT failure alarm is reported

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.22.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.22.3 Reference setting list for test

Table 182 CT failure supervision function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Maximum zero-sequence current for
1. 0.5In 3I0_CT Fail A 0.05In 2.00In
detecting CT failure

Table 183 CT failure supervision binary setting list

Bit Default 0 1 Explanation


Enable or disable the function
2.13 1 CT Fail Off CT Fail On
of CT fail supervising

8.23 Voltage transformer secondary circuit


supervision

Before starting the test, please make sure that the protection function setting

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values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.23.1 Verifying the settings

8.23.1.1 Three-phase VT failure surpervision

1 Verifying the phase-to-earth voltage setting

Table 184 Phase-to-earth voltage setting verifying

Test item Description


95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 95% of the phase-to-earth setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 70% of the phase-to-earth setting value
Test result The VT failure alarm is reported
105% of the phase-to-earth voltage setting verifying
Settings/ProtContwd/Pls Input SetGrNo/Common/VT Fail, set
Binary setting
the binary setting as 1
Settings/ProtSet/Pls Input SetGrNo/Common, the detail setting
Setting value
list refer to the Reference setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 105% of the phase-to-earth setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 70% of the phase-to-earth setting value
Test result The VT failure alarm is not reported

Table 185 Phase-to-earth voltage setting for zero-sequence voltage verifying

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Test item Description
95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the phase-to-earth setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 95% of the phase-to-earth setting value
Test result The VT failure alarm is reported
105% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the phase-to-earth setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 105% of the phase-to-earth setting value
Test result The VT failure alarm is not reported

2 Verifying the current setting

2.1 Verifying the phase current setting

Table 186 Current setting verifying

Test item Description


105% of the current setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1

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Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the setting value
Fault simulation
Current value: 105% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is reported
95% of the current setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the setting value
Fault simulation
Current value: 95% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is not reported

2.2 Verifying the zero/negative sequence current setting

Table 187 Current setting verifying

Test item Description


105% of the Zero/negative sequence current setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Fault simulation
Voltage value: 80% of the setting value
Current value: 150% of the setting value

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Test item Description
Zero/negative sequence current value: 105% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is reported
95% of the Zero/negative sequence current setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 95% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is not reported

8.23.1.2 Single/ two phases VT failure surpervision

1 Solid earthed system

1.1 Verifying the phase A setting

1.1.1 Verifying the phase-to-earth voltage setting

Table 188 Phase-to-earth voltage setting verifying

Test item Description


105% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Solid earthed, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Fault simulation Phase failure: phase A
Zero-sequence voltage value: 105% of the phase-to-earth setting

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Test item Description
value
Test result The VT failure alarm is reported
95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Solid earthed, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A
Fault simulation
Zero-sequence voltage value: 95% of the phase-to-earth setting
value
Test result The VT failure alarm is not reported

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

2 Isolated system

2.1 Verifying the phase A setting

2.1.1 Verifying the phase-to-earth voltage setting

Table 189 Phase-to-earth voltage setting verifying

Test item Description


105% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None

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Test item Description
Precondition: no protection startup
Phase failure: phase A
Zero-sequence voltage value: 105% of the phase-to-earth setting
Fault simulation
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 120% of the phase-to-phase
setting value
Test result The VT failure alarm is reported
95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A
Zero-sequence voltage value: 95% of the phase-to-earth setting
Fault simulation
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 120% of the phase-to-phase
setting value
Test result The VT failure alarm is not reported

2.1.2 Verifying the phase-to-phase voltage setting

Table 190 phase-to-phase voltage setting verifying

Test item Description


105% of the phase-to-phase voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Fault simulation Phase failure: phase A
Zero-sequence voltage value: 120% of the phase-to-earth setting

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Test item Description
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 105% of the phase-to-phase
setting value
Test result The VT failure alarm is reported
95% of the phase-to-phase voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A
Zero-sequence voltage value: 105% of the phase-to-earth setting
Fault simulation
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 95% of the phase-to-phase
setting value
Test result The VT failure alarm is not reported

2.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.

8.23.1.3 Verifying the voltage restoring setting

1 Verifying the voltage setting

Table 191 Voltage setting verifying

Test item Description


105% of the voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None

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Test item Description
Precondition: VT failure
Voltage value: 105% of the setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Test result The information of voltage restoring should be reported
95% of the voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: VT failure
Voltage value: 95% of the setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Test result The information of voltage restoring should not be reported

8.23.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

8.23.3 Reference setting list for test

Table 192 VT failure supervision function setting list

NO. Default Abbr. Explanation Unit Min. Max.


Maximum current for detecting VT
1. 0.2In I_VT Fail A 0.05In 0.25In
failure
Maximum zero- and negative-
2. 0.2In 3I02_VT Fail sequence current for detecting VT A 0.05In 0.25In
failure
Maximum phase to earth voltage
3. 8 Upe_VT Fail V 7.00 20.0
for detecting VT failure
Maximum phase to phase voltage
4. 16 Upp_VT Fail V 10.00 30.0
for detecting VT failure
Minimum normal phase to earth
5. 40 Upe_VT Normal V 40.00 65.00
for VT restoring

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Table 193 VT failure supervision function setting list

Bit Default 0 1 Explanation


Single phase or three phase
2.9 0 3Ph V Connect 1Ph V Connect
voltage connection
Solid earthed system or
2.10 0 Isolate/ Resist Solid earthed
isolated system
Enable or disable the function
2.15 1 VT Fail Off VT Fail On
of VT failure

8.24 Monitoring function

8.24.1 Auxiliary contact of circuit breaker monitoring

Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.

8.24.1.1 Testing the function

1 Checking the auxiliary contact of CB of phase A

Table 194 Auxiliary contact of circuit breaker verifying

Test item Description


Binary setting None
Setting value None
Binary input The position of phase A of circuit breaker is Off
Fault simulation Current: input the rated current into the phase A
Test result The alarm is issued

2 Checking the auxiliary contact of CB of other phase

The test method of checking the other phase are same as phase A, only need
to change the corresponding test conditions into the conrresponding other
phase required.

8.24.1.2 Completing the test

Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.

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Chapter 6 IED testing

9 Checking before operation


Note: The following items are only for reference. Users should make the
proper operation guideline based on the actual site conditions

9.1 Checking the LED

Power on the IED, the LED Run is lit steadily in green, other LEDs should be
extinguished.

9.2 Checking the display on LCD

In normal operation condition, the information of year-month-day, hour :


minute : second, magnitude and angle of analog quantities, measurement
value, the function connectors status and the current setting group should be
scrolling displayed on the LCD.

9.3 Checking the clock

After setting the date and time of the IED, power on and off the IED with five
times in short time, checking the tolerance of date and time is within the
permissible range.

9.4 Checking the voltage and current

Inject system currents (load current must be larger than 0.08In) and voltages
into the IED, and then check whether the magnitude, phase angle, polarity
and phase sequence of each measuring analog value are correct or not.

9.5 Checking the setting group

Make sure the active setting group is correct.

9.6 Checking the setting

Checking the settings one by one of each group which are possibly used in
the actual operation modes.

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Chapter 6 IED testing

9.7 Checking the binary input

Check the state of all binary inputs. Particularly ensure that the IED is not in
test mode, meaning that the green Run LED is not flash continuously

9.8 Checking the normal operation mode

9.8.1 Trip and close test with the circuit breaker

9.8.1.1 Switching the circuit breaker state by local command

Trip and close the circuit breaker, the corresponding feedback state of circuit
breaker injected via binary inputs should be read out and compared with the
actual state of circuit breaker, the displayed state should be in accordance
with the actual state.

9.8.1.2 Switching the circuit breaker state from remote control center

If the IED is connected to a remote substation via SCADA, the corresponding


switching tests may also be checked from the substation.

9.9 Put into operation

If all the checking items described above and the other checking items need to be
performed according to the site condition have been checked and correct, the IED can be
put into operation.

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178
Chapter 7 Operating maintenance

Chapter 7 Operating maintenance

About this chapter


This chapter introduces attentions and the required checking,
operation after updating software or replacing modules and the
measure for alarm information.

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Chapter 7 Operating maintenance

1 Attentions during operating

Warning

Do not disconnect the secondary circuit connection of current


transformer without short-circuiting the transformer's secondary
winding. Operating a current transformer with the secondary
winding open will cause a masssive potential that may damage the
current transformer and may cause injuries to humans.

Caution

Never connect or disconnect a wire and/or a connector to or from a


IED during normal operation. Dangerous voltages and currents are
present that may be lethal. Operation may be disrupted and IED and
measuring circuitry may be damaged.

Note

Strictly follow the power system operation maintenance instruction


or regulations, the following items for reference:

During operating, prohibition the following operation manually:

Touch the parts of IED with electricity

Plug in and pull out each module

Manually operation to the HMI menu:

Testing binary output

Changing setting value

Set setting value

Set systme parameter

Change the IP address

Fault occurrence during operation, if the protection IED tripping, the

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Chapter 7 Operating maintenance
corresponding LED in front panel will be lighted, and the event reports
will be displayed in HMI; if the autoreclosure function operate, the
corresponding LED will be lighted and the reports will be displayed in
HMI

If the alarming class I appearance during operation, stop running the IED,
record the alarm information and inform the responsible engineer, at this
time, it is not allowed to press the Reset button. If the alarming class II
appearance, record the alarm information and inform the responsible
engineer to analyse and deal with.

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Chapter 7 Operating maintenance

2 Routine checking
Checking the LEDs status

Checking scroll display information in HMI

Checking the setting group number

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3 Periodical checking
Check that the inside and outside of the IED are cleanly and no ash
deposition

All components (including the chips, transformer and relay, etc.) of the
IED are fixed well, no loosing phenomenon, the IED apperance is regular
and no damage and distortion phenomenon

The buttons are operated flexibly with good feeling and fixed reliably

All the IED terminals for connection are firmd without loosing
phenomenon, and the marked number are clear and correct

Energizing the IED with DC power supply for several seconds, the green
Run LED and protection function LED that connector have been
enabled will be lighted without any alarm or operation lED lighted (if
lighted, press Reset button to reset), the analog quantities is displayed in
HMI

Check the zero drift and scale

Check the operation setting values

Measure the output voltage of power supply

Check the alarm circuit

Check the binary input

Check the tripping and closing circuit

Test the insulation resistance

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4 The alarm information

4.1 Alarm information class I and the description

Table 195 Alarm information class I and the description

Information Description
RAM Error RAM is abnormal
EPROM Error EPROM is abnormal
Flash Error Flash is abnormal
BO Abnormal Binary output is abnormal
AD Error AD is abnormal
Zero Offset Zero drift is out of limitation
Invalid SetGr Pointer of setting group is error
Setting Chk ERR Setting value is error
Logic Scheme ERR Logic file and CPU file do not cooperate

4.2 Alarm information class II and the description for


M1

Table 196 Alarm information class II and the description for M1

Information Description
File ERR Read configuration files wrong
BIO OUT ERR Fail to response the BO in BIO module
BIO COM ERR Communication failure in BIO module
GOO_A_COMMU_ERR Communication failure in GOOSE A
GOO_A_CFG_ERR Configuration failure in GOOSE A
GOO_B_COMMU_ERR Communication failure in GOOSE B
GOO_B_CFG_ERR Configuration failure in GOOSE B
VT Fail VT failure in circuit of voltage transformer
V1P VT Fail VT failure in circuit of the forth voltage transformer
CB Faulty 3Ph CB Open and 3Ph CB Close are both active or inactive
DS Faulty DS Open and DS Close are both active or inactive
ES Faulty ES Open and ES Close are both active or inactive
Trip Fail Trip command is issued lasting for more than 9s
MMI Com Fail Communication failure between HMI and CPU module
CB Not Ready BI2 is active to indicate CB is not ready
Frequency difference measured from software and hardware is
Frequency Differ
0.5Hz

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Information Description
OC1 Alarm Overcurrent protection stage 1 issues an alarm signal
OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal
EF1 Alarm Earth fault protection stage 1 issues an alarm signal
EF Inv Alarm Earth fault protection inverse stage issues an alarm signal
Negative sequence overcurrent protection stage 1 issues an alarm
NSOC1 Alarm
signal
Negative sequence overcurrent protection inverse stage issues an
NSOC Inv Alarm
alarm signal
SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal
SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal
SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal
3V01 Alarm Displacement Voltage protection stage 1 issues an alarm signal
3V02 Alarm Displacement Voltage protection stage 2 issues an alarm signal
PhA Grounded Phase A is grounded
PhB Grounded Phase B is grounded
PhC Grounded Phase C is grounded
UV1 Alarm Undervoltage protection stage 1 issues an alarm signal
OV1 Alarm Overvoltage protection stage 1 issues an alarm signal
Therm OL Alarm Thermal overload protection issues an alarm signal
CT Fail Failure in circuit of current transformer
BI Set SetGr2 Setting group switches to 1 when binary input is 0
BI Set SetGr1 Setting group switches to 2 when binary input is 1

Table 197 Alarm information class II and the description for M6

Information Description
File ERR Read configuration files wrong
BIO OUT ERR Fail to response the BO in BIO module
BIO COM ERR Communication failure in BIO module
GOO_A_COMMU_ERR Communication failure in GOOSE A
GOO_A_CFG_ERR Configuration failure in GOOSE A
GOO_B_COMMU_ERR Communication failure in GOOSE B
GOO_B_CFG_ERR Configuration failure in GOOSE B
CB Faulty 3Ph CB Open and 3Ph CB Close are both active or inactive
DS Faulty DS Open and DS Close are both active or inactive
ES Faulty ES Open and ES Close are both active or inactive
Trip Fail Trip command is issued lasting for more than 9s
MMI Com Fail Communication failure between HMI and CPU module
Frequency difference measured from software and hardware is
Frequency Differ
0.5Hz
OC1 Alarm Overcurrent protection stage 1 issues an alarm signal
OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal

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Information Description
EF1 Alarm Earth fault protection stage 1 issues an alarm signal
EF Inv Alarm Earth fault protection inverse stage issues an alarm signal
SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal
SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal
SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal
CT Fail Failure in circuit of current transformer
BI Set SetGr2 Setting group switches to 1 when binary input is 0
BI Set SetGr1 Setting group switches to 2 when binary input is 1

Table 198 Alarm information class II and the description for C1

Information Description
File ERR Read configuration files wrong
BIO OUT ERR Fail to response the BO in BIO module
BIO COM ERR Communication failure in BIO module
GOO_A_COMMU_ERR Communication failure in GOOSE A
GOO_A_CFG_ERR Configuration failure in GOOSE A
GOO_B_COMMU_ERR Communication failure in GOOSE B
GOO_B_CFG_ERR Configuration failure in GOOSE B
VT Fail VT failure in circuit of voltage transformer
V1p VT Fail VT failure in circuit of the forth voltage transformer
CB Faulty 3Ph CB Open and 3Ph CB Close are both active or inactive
DS Faulty DS Open and DS Close are both active or inactive
ES Faulty ES Open and ES Close are both active or inactive
Trip Fail Trip command is issued lasting for more than 9s
MMI Com Fail Communication failure between HMI and CPU module
Frequency difference measured from software and hardware is
Frequency Differ
0.5Hz
OC1 Alarm Overcurrent protection stage 1 issues an alarm signal
OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal
EF1 Alarm Earth fault protection stage 1 issues an alarm signal
EF Inv Alarm Earth fault protection inverse stage issues an alarm signal
SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal
SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal
SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal
3V01 Alarm Displacement Voltage protection stage 1 issues an alarm signal
3V02 Alarm Displacement Voltage protection stage 2 issues an alarm signal
PhA Grounded Phase A is grounded
PhB Grounded Phase B is grounded
PhC Grounded Phase C is grounded
UV1 Alarm Undervoltage protection stage 1 issues an alarm signal
OV1 Alarm Overvoltage protection stage 1 issues an alarm signal

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Information Description
UBL Alarm Unbalance protection issues an alarm signal
OL Alarm Over load protection issues an alarm signal
Inhibit close Drive a contact to inhibit reconnection of capacitor
CT Fail Failure in circuit of current transformer
BI Set SetGr2 Setting group switches to 1 when binary input is 0
BI Set SetGr1 Setting group switches to 2 when binary input is 1

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Chapter 8 Transportation and storage

Chapter 8 Transportation and storage

About this chapter


This chapter describes how to transport and store the IED.

189
Chapter 8 Transportation and storage

1 Transportion
The IED can be transported by means of conveyance, such as car, train, ship,
etc. In order to ensure the perfect performance of the IED, prevent the IED
from rain, snow, vibration, shock and bump.

190
Chapter 8 Transportation and storage

2 Storage
If the IED is to be stored before installation, this is must be done in the original
transport casing in a dry and dust free place. The packed IED should be
stored in a waterproof and snow proof place without acid or alkaline or other
corrosive gas and explosive gas. The storage temperature is from -25C to
+40C, and the relative humidity does not exceed 80%. Observe the
environmental requirements stated in the technical data.

191
Chapter 8 Transportation and storage

192
Chapter 9 Appendix

Chapter 9 Appendix

About this chapter


This chapter contains the diagram of modules arrangement,
typical connection, glossary and the protocol data table.

193
Chapter 9 Appendix

1 Arrangement diagram of modules

Figure 15 The arrangement diagram of modules

194
Chapter 9 Appendix

2 Typical diagram

A. For incoming or outgoing feeder protection or line

backup protection

Figure 16 Application of feeder protection to measure three phase and earth currents

195
Chapter 9 Appendix
Figure 17 Application of feeder protection to measure three phase and earth currents and three phase
voltages (bus side)

Figure 18 Application of feeder protection to measure three phase and earth currents and three phase
voltages (line side)

196
Chapter 9 Appendix

A
B
C

AIM2
U01
UA
U02
UB
U03
UC
U04
UN

AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN

Figure 19 Application of feeder protection to measure three phase and earth currents and single phase
voltage (Ph-Ph) (bus side)

197
Chapter 9 Appendix

A
B
C
AIM2
U01
UA
U02
UB
U03
UC
U04
UN

AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN

Figure 20 Application of feeder protection to measure three phase and earth currents and single phase
voltage (Ph-E) (bus side)

198
Chapter 9 Appendix
A
B
C

AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN

AIM1
I01
*
I1
I02

Figure 21 Application of feeder protection to measure three phase currents, earth current, and
sensitive earth current

199
Chapter 9 Appendix

Figure 22 Application of feeder protection to measure three phase currents, earth current and sensitive
earth current, and three phase voltages (bus side)

200
Chapter 9 Appendix

A
B
C

AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN

AIM2
U01
UA
U02
UB
U03
UC
U04
UN

AIM1
* I01

I1
I02

Figure 23 Application of feeder protection to measure three phase currents, earth current and sensitive
earth current, and three phase voltages (line side)

201
Chapter 9 Appendix

Figure 24 Application of feeder protection to measure three phase currents, earth current and sensitive
earth current, and single phase voltage (Ph-Ph) (bus side)

202
Chapter 9 Appendix

Figure 25 Application of feeder protection to measure three phase currents, earth current, and
sensitive earth current, and single phase voltage (Ph-E) (bus side)

203
Chapter 9 Appendix

B. For transformer backup protection

Figure 26 Application of transformer backup protection to measure three phase currents, earth
current, and neutral current

204
Chapter 9 Appendix

Figure 27 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and three phase voltages (bus side)

205
Chapter 9 Appendix
A
B
C

AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN

AIM2
U01
UA
U02
UB
U03
UC
U04
UN

AIM1
* I01

I02 I1

Figure 28 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and three phase voltages (line side)

206
Chapter 9 Appendix

A
B
C

AIM2
U01
UA
U02
UB
U03
UC
U04
UN

AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN

AIM1
* I01

I02 I1

Figure 29 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and single phase voltage (Ph-Ph) (bus side)

207
Chapter 9 Appendix

Figure 30 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and single phase voltage (Ph-E) (bus side)

208
Chapter 9 Appendix

C. For synch-check function

Figure 31 Typical connection for synch-check on bus coupler applications

209
Chapter 9 Appendix

Figure 32 Typical connection for synch-check and feeder current protection

210
Chapter 9 Appendix

D. For capacitor bank protection

Figure 33 Typical connection for capacitor bank unbalanced current protection with three current
inputs

Figure 34 Typical connection for capacitor bank unbalanced voltage protection with three voltage
inputs

211
Chapter 9 Appendix

Figure 35 Typical connection for capacitor bank unbalanced current protection with one current input

Figure 36 Typical connection for capacitor bank unbalanced voltage protection with one voltage input

grounded capacitor bank

Figure 37 Unbalanced current detection for

212
Chapter 9 Appendix
Figure 38 Neutral current differential protection
for grounded Split-Wye capacitor bank

Figure 41 Neutral voltage unbalanced protection


for unrounded Wye capacitor bank
Figure 39 Neutral current protection for
ungrounded split-Wye capacitor bank

A
B
C

Figure 42 Neutral voltage unbalanced detection


I1
I2 for ungrounded split-Wye capacitor bank
I3

Figure 40 Three unbalanced currents detection


for capacitor bank

213
Chapter 9 Appendix
Figure 46 Three unbalanced voltages detection
for Capacitor Bank

Figure 43 Summation of Intermediate tap-point


voltage for grounded Wye capacitor bank

A
B
C

U1

Figure 44 Neutral voltage unbalance detection by


3VTs for unrounded Wye capacitor bank

Figure 45 Neutral voltage protection for


ungrounded split-Wye capacitor bank

214
Chapter 9 Appendix

E. For Load shedding function

Figure 47 Typical connection for load shedding function

215