Is this problem an error, a bug, a fault, a failure, or a defect? Explain why or why not for each of
these terms.
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Midterm Examination ECSE429 / Fall 2013
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Midterm Examination ECSE429 / Fall 2013
Part 1 (15 marks): Show your categories, choices, and constraints in a formal test specification.
Part 2 (5 marks): Derive test frames using the each choice criterion, i.e., each choice for each category
must be used at least in one test frame. Use the table below to report your test frames. Make sure
that one can clearly identify the choices in your test frames (e.g., by using unique IDs for the choices
in your formal test specification). You do not need to show actual test data.
Frame ID Choices
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Midterm Examination ECSE429 / Fall 2013
c1 e1
c2 e2
card rejected
(fill in this missing cause)
c3 e3
c4 e4
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Midterm Examination ECSE429 / Fall 2013
Part 2 (4 marks): Derive a Boolean formula each for the effect card accepted and the effect card
rejected in the cause effect graph.
Part 3 (8 marks): From the Boolean formula for the effect card accepted only, derive a compact
decision table using the each-condition/all-condition approach. Use the table below for your
decision table.
c1 c2 c3 c4 result
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Midterm Examination ECSE429 / Fall 2013
Part 4 (8 marks): From the Boolean formula for the effect card rejected only, derive a list of test
cases that fulfill the modified condition/decision coverage criteria. In the provided table, show for
each test case the ID, the required input, the expected result, and which two test cases are paired
with each other as required by modified condition/decision coverage.
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Midterm Examination ECSE429 / Fall 2013
Part 2 (5 marks): List the paths for result that satisfy the all-uses data flow coverage criteria. State for
each path whether the path is feasible or not.
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Midterm Examination ECSE429 / Fall 2013
S0
a/y
S1 S2
a[n>0]/x
b/x c/y
S4
a/y S3 d/z
a/x
Part 2 (5 marks): Generate all sneak path test cases for the given state model using the provided
table. The actual test data does not need to be specified.
Test
State Event Condition
ID
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