Power Quality Standards: CBEMA,

ITIC, SEMI F47, IEC 61000-4-11/34

Mark Stephens, PE
Manager
Industrial Studies
Electric Power Research Institute
942 Corridor Park Blvd
Knoxville, Tennessee 37932
Phone 865.218.8022
mstephens@epri.com
 Equipment Design that is not Certified to a PQ
Standard can have Components that are highly Robust
and others that are Susceptible to voltage sags

PQ Events SEMI F47 AC "Ice Cube" Relay

IEC Style Starter Robust PLC Flame Controller
AC Drive

100%

90%

80%

70%
%Vnominal

60%

50%

40%

30%

20%

10%

0%
0 10 20 30 40 50 60

Cycles

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 Voltage Sag Standards

The best way to Guarantee that Process Equipment is Compatible

with its Electrical Environment is to Require the Equipment to
Comply with Voltage Sag Standards
OEMs have to be Forced to Incorporate Voltage Sag Tolerance into
their Equipment
The Push has to come from End Users
EPRI has shown that Machines can be Built to Comply with Voltage
Sag Standards, like SEMI F47, with almost no Difference in Cost
Recognized Voltage Sag Standards Discussed in Presentation
SEMI F47-0706 (Semiconductor Equipment and Materials
institute)
IEC 61000-4-11 and 61000-4-34 (International Electrotechnical
Commission)
ITIC (Information Technology industry Council)

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 Information Technology industry Council ITIC
(CBEMA) curve (1996)
1977 the Computer and
Business Equipment
Manufacturers Associations
(CBEMA) developed a
standard to address energy
performance profile for
computer equipment
Throughout the last thirty
years the CBEMA Curve grew
from a simple curve describing
the performance mainframe
computer equipment (PCs
were not available), to a curve
that was used to attempt to
define everything from
specification criteria for
electronic equipment to the
basis of power quality
performance contracts
between electric utilities and
large industrial customers.

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 SEMI F47-0706 Specification for Semiconductor
Processing Equipment Voltage Sag Immunity

SEMI F47-0706 Cost $50 and can be Downloaded from

www.semi.org
EPRI along with Utilities, Semiconductor Manufacturers and
Semiconductor Equipment Suppliers were all Instrumental in
Developing SEMI F47 which was adopted in 1999
SEMI F47-0706 Specification for Semiconductor Processing
Equipment Voltage Sag Immunity defines the minimum voltage sag
levels not to cause equipment misoperations of semiconductor
equipment to voltage sags
SEMI F47-0706 References an IEC Standard (IEC 61000-4-34) for Test
Protocol Information
SEMI F47 does not Address Product Quality or Factory Systems. For
factory Related Equipment and Power Requirements, see;
SEMI F49-0200 - Guide for Semiconductor Factory Systems Voltage
Sag Immunity
SEMI F50-0200 - Guide for Electric Utility Voltage Sag Performance
for Semiconductor Factories

2009 Electric Power Research Institute, Inc. All rights reserved. 5

 SEMI F47-0706 Test Levels

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 SEMI F47-0706 Specification for Semiconductor
Processing Equipment Voltage Sag Immunity

SEMI F47 does not Address Product Quality, the intent of the
Standard is to keep the equipment Running (i.e. No Operator
Interventions) when Exposed to Voltage Sags Above the Defined
Curve

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 IEC 61000-4-34 Low Frequency Phenomena
International Electrotechnical Commission - IEC

IEC 61000-4-11 is Intended to be used for Equipment LESS Then 16A

IEC 61000-4-34 is Intended to be used for Equipment GREATER Then
16A
Both Standards can be Downloaded from http://www.iec.ch/
The Intent of IEC 61000-4-11 and -34 is to Define Voltage Dip Test
Levels, not for Specific Types of Equipment, but Attempts to Define the
Environment of the Equipment
IEC 61000-4-34 applies to Equipment over 16A and IEC 61000-4-11 for
Equipment Under 16A
Table 1 Below are the Voltage Dip Test Levels from the IEC 61000-4-34
and -11 Standards

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 IEC 61000-4-34 Low Frequency Phenomena
Class 1
Class 1 - This class applies to protected supplies and has compatibility levels lower than public
network levels. It relates to the use of equipment very sensitive to disturbances in the power
supply for instance the instrumentation of technological laboratories, some automation and
protection equipment, some computers, etc.
NOTE Class 1 environments normally contain equipment which requires protection by such apparatus as
uninterruptible power supplies (UPS), filters, or surge suppressers.

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 IEC 61000-4-34 Low Frequency Phenomena
Class 2
Class 2 - This class applies to points of common coupling (PCCs for consumer systems) and
points of common coupling (IPCs) in the industrial environment in general. The compatibility
levels in this class are identical to those of public networks; therefore components designed for
application in public networks may be used in this class of industrial environment.

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 IEC 61000-4-34 Low Frequency Phenomena
Class 3
Class 3 - This class applies only to IPCs in industrial environments. It has higher compatibility
levels than those of class 2 for some disturbance phenomena. For instance, this class should
be considered when any of the following conditions are met:
a major part of the load is fed through converters;
welding machines are present;
large motors are frequently started;
loads vary rapidly

NOTE 1 The supply to highly

disturbing loads, such as arc-
furnaces and large converters
which are generally supplied from
a segregated bus-bar, frequently
has disturbance levels in excess
of class 3 (harsh environment). In
such special situations, the
compatibility levels should be
agreed upon.
NOTE 2 The class applicable for
new plants and extensions of
existing plants should relate to the
type of equipment and process
under consideration.

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 IEC 61000-4-34 Low Frequency Phenomena
Class X
Class X User Defined and in case of SEMI F47-0706, the test Points are Defined in the
SEMI F47 Standard

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 Comparison of SEMI and IEC Voltage Sag
Standards
SEMI F47 standard for the semiconductor industry
Voltage sag immunity testing
Relevant for single, two and three phase manufacturing
equipment
IEC standards 61000-4-11 (less than 16 amps) and 61000-4-
34 (greater than 16 amps)
Voltage sag and short interruption testing
Relevant for single, two and three phase manufacturing
equipment
The SEMI F47 and IEC standards appear similar but have
subtle differences, especially for three-phase testing
The IEC standard allows for the use of two phase-to-phase test
vectors while the SEMI F47 adds an additional acceptable test
vector
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 Single-Phase Sags

If the Equipment Under Test

(EUT) has a neutral
conductor, then some loads
may be wired with respect to
neutral. 70%
70%
Therefore, single-phase to 70%
neutral tests should be done
to determine
sensitivity/robustness of Type A as shown IEC 61000-4-34, Figure 3A
EUT to such events.
Considerations are
Magnitude
Duration
Point-on-Wave
(0 degrees reference)
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 Phase-to-Phase Sags

IEC allows two types of phase-

to-phase testing
Type B
Type C
SEMI F47 allows three types of
phase-to-phase testing
Type B
Type C
Type D
Neither IEC 61000-4-34 or
SEMI F47 calls for 3-phase
symmetrical sags.
The test methods can have
implications on the test results
with respect to pass/failure.

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 Phase-to-Phase Sags

EPRI traditionally did Method D

testing for all SEMI F47 work
and System Compatibility
Testing.
Needed a neutral was
difficult to obtain at times.
Others chose Method B as an
alternative due to lack of
neutral and ease of test.
Method C is the most
frequently occurring in the
power system and the most
realistic off all three. It does not
require a neutral.
(a.k.a. Type C per Bollen)

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 Diode Front-End ASD Response to Different
Type of Voltage Sags

Adjustable speed drives are

one of the most important %Vdc Min=82%
(Occurs at 50% Vdip)
loads affecting overall
process response to voltage
dips.
Example 5HP drive trips for
Method D and E
Did not trip for A, B and C Drive Loaded
to 80% FLA

WG Reference Doc: CIGRE-C4.110-2006-24

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 Example Simulation Outputs

Simulation Output for Method B Simulation Output for Method C Simulation Output for Method D
(Figure 3B in IEC 61000-4-34) (Figure 3C in IEC 61000-4-34) (Figure 3D in IEC 61000-4-34)
(50% one L-L voltage, 12 cycles) (50% one L-L voltage, 12 cycles) (50% one L-L voltage, 12 cycles)
700 700 800

Vdc
Vdc
Vdc

650 600 600

600 500 400

0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45
1000 1000 1000

Vab
Vab
Vab

0 0 0

-1000 -1000 -1000

0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45
1000 1000 1000

Vbc
Vbc
Vbc

0 0 0

-1000 -1000 -1000

0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45
1000 1000 1000

Vca
Vca
Vca

0 0 0

-1000 -1000 -1000

0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45
200
100 100

Ia
Ia

0
Ia

-100 -100 -200

0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.15 0.2 0.25 0.3 0.35 0.4 0.45
time (s) time (s) time (s)

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 Simulation Results - Summary

Method B Method C Method D 80% Trip Level

70% Trip Level 60% Trip Level 50% Trip Level
650

600

550
Drive Min DC Bus

500

450

400

350

300
40 50 60 70 80 90 100 110 120 130 140 150 160 170 180 190 200 210 220 230 240

MicroFarad/Hp

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 Testing Capabilities Expanded
due to Standards Requirements

EPRI has now patented the the

TRI-Mode voltage sag generator
design. This unit can test all IEC
and SEMI test vectors plus
asymmetrical and symmetrical 3-
phase voltage sags.
We expect this type of test
equipment to be useful in
evaluating system compatibility
for multiple types of test vectors.
The EPRI PQStar testing
program tests are being done as
Type C for three-phase loads
now since this is most realistic
and is applicable to both SEMI
F47 and IEC 61000-4-11 & 34.

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 NEW IEEE Standard Development P1668
http://grouper.ieee.org/groups/ias/1668/index.html

This project will undertake the development of a

standard for the response of electrical equipment
to voltage sags.
The standard will describe a level of performance
to be used as a criteria for acceptance of the
product. End users will be able to use the standard
in their purchase specifications to ensure the
required level of performance.
The project will apply to any electrical equipment
that can experience nuisance shutdowns due to
reductions in supply voltage.
Issues:
Existing Standards Advocate Different Test
Methods and in some cases conflict
Existing Standards do not require 3-Phase
Sags
Existing Standards do not provide
methodology for characterization testing.
Pass/Fail Information is all that is obtained in
existing standard
Effort is underway to develop the standard.

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 Voltage Dip Concepts for Type 1, Type 2, and Type 3

Proposed Actual Dip Vectors Actual Approximation for Approximation RMS

Comment
Types and Types [5] RMS Testing Purposes Plot for Testing Purposes
Plot
1.1 Approximation does not
1 include phase shifting or
Type 1: 0.9 magnitude change of
Single- non-dipped phases.
Vol tag e [pu]

0.8

Phase 0.7 Added phase shift may

Voltage 0.6
be difficult to obtain with
Dip 0.5
standard transformer-
0.4
switch type voltage dip
Formerly Type D 0 2 4
Time [Cycles]
6 8
generators.
1.1 1.1

1 1

Type 2: 0.9 0.9

Two-
Vol tag e [pu]

Voltage [pu]
0.8 0.8
Approximation matches
Phase 0.7 0.7
with actual dip type
Voltage 0.6 0.6
Dip 0.5 0.5

0.4 0.4
0 2 4 6 8 0 2 4 6 8
Formerly Type C Time [Cycles] Ti me [Cycl es]

1.1 1.1

1 1

Type 3: 0.9 0.9

Three-
Vo ltag e [pu]

Voltage [pu]
0.8 0.8
Approximation matches
Phase 0.7 0.7
with actual dip type
Voltage 0.6 0.6
Dip 0.5 0.5

0.4 0.4
0 2 4 6 8 0 2 4 6 8
Formerly Type A Time [C ycle s] Time [Cycl es]

2009 Electric Power Research Institute, Inc. All rights reserved. 22