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On-line X-ray diffraction for quantitative phase analysis:

Application in the Portland cement industry


Nicola V. Y. Scarlett and Ian C. Madsen
CSIRO Minerals, Box 312, Clayton South, Victoria 3169, Australia
Con Manias and David Retallack
Fuel and Combustion Technology Pty. Ltd. (FCT), 20 Stirling Street, Thebarton SA 5031, Australia
(Received 8 September 2000; accepted 12 October 2000)
The aim of this work was to design, construct, install, and commission an on-line, X-ray diffraction
(XRD) analyzer capable of continuously monitoring phase abundances for use in process plant
control. This has been achieved through a joint project between CSIRO Minerals and Fuel &
Combustion Technology Pty. Ltd. with an instrument designed for use in a Portland cement
manufacturing plant. Key factors in tailoring such an instrument to the cement industry were (i) the
handling and presentation of a dry sample and (ii) the development of an analytical method suitable
for the complex suite of phases contained within Portland cement. The instrument incorporates
continuous flow of sample through the diffractometer using a purpose-built sample presentation
stage. The XRD data are collected simultaneously using a wide range (120 20) position sensitive
detector, thus enabling rapid collection of the full diffraction pattern. The data are then analyzed
using a Rietveld analysis method to obtain a quantitative estimate of each of the phases present. The
instrument is controlled by a PC linked to the diffractometer through a purpose built interface. The
phase abundance information is then transmitted to the central computer in the cement plant where
it can be used for the control of mill parameters such as temperature and retention times as well as
gypsum feed rate. 2001 International Centre for Diffraction Data. [DOI: 10.1154/1.1359796]

I. INTRODUCTION the Rietveld method to extract the quantitative phase analy-


sis. This "on-line" determination of phase abundance has
Many processing industries require routine analysis at some significant advantages, namely:
various stages of processing as a means of controlling the
quality of their products. Frequently, this consists of an ' 'off- XRD determines the phase abundances directly from the
line" chemical analysis obtained by sub-sampling the pro- crystallography of the phases present, not by inference
cessing line and sending the material to the site laboratory from other measurements (e.g., chemical analysis).
for analysis. This "batch" mode of operation often incurs The moving sample significantly reduces the problems as-
sampling problems and poor turnaround times, both of which sociated with particle statistics encountered in conven-
can limit the usefulness of the results for plant control. tional "stationary sample" XRD instruments. Therefore,
In many cases, knowledge of the phase, rather than the larger particle sizes can be tolerated without affecting the
elemental, abundances is required to assess the processing reliability of peak intensity measurements, and hence the
conditions. In the Portland cement industry, phase abundance phase abundances.
determination has traditionally been achieved in an "off- The turn-around time for the analysis is very rapid (of the
line" manner either by: order of 1-10 min), thus enabling their direct use in plant
Optical microscopy using point counting techniques control.
(Campbell, 1986); or
Use of the Bogue (Bogue, 1929) method where phase CSIRO Minerals and Fuel & Combustion Technology Pty.
abundances are derived by reduction of the chemical Ltd. have collaborated in the design and construction of an
analyses assuming a detailed composition for each phase. on-line XRD instrument for the cement industry. The follow-
ing steps were involved in the development of the instru-
Optical microscopy is very labor intensive and can be se- ment:
verely affected by sampling errors. The Bogue method often
produces considerable error due to variation in the phase (1) Selection of XRD instrument geometry and components
composition resulting from changes in the feed-stock and/or required;
processing conditions. Further discussion of the errors in (2) Determination of the applicability of the phase suite to
these methods can be found in Madsen and Scarlett (1999) quantitative phase analysis via the Rietveld method and
and references therein. development of a suitably accurate and fast refinement
Both optical microscopy and the Bogue method are con- strategy;
sidered to be too slow to be directly incorporated into a plant (3) Devising a method for rapid data collection;
control circuit since the results may not be available for sev- (4) Design and construction of a sample presenter for the
eral hours. An alternative is to use X-ray diffraction methods continuous feeding of a sample suitable for X-ray dif-
with a continuously moving stream of material and to apply fraction studies; and

71 Powder Diffraction 16 (2), June 2001 0885-7156/2001/16(2)/71 /10/$18.00 2001 JCPDS-ICDD 71


TABLE I. Phases present in Portland cement clinker.

Typical concentration
Phase Nominal formula (wt. %) Comments

C3S Ca3SiO5 50-70 Seven known polymorphsthree present in clinker


C2S Ca2SiO4 15-30 Five known polymorphs/J-C2S known to be present in
clinker, but some evidence for presence of another two
C4AF C:a4(Al;tFe, -,) 4 O 1 0 5-15 Only one polymorph, but composition varies
(0.0<;t<0.5)
C3A Ca3Al2O6 5-10 Two polymorphscubic and orthorhombic
Lime Ca, _ ,Mg.O 0.5-2 Mg substitution for Ca (0.0<;t<0.02)
Hydrates rapidly to portlanditeCa(OH)2

(5) Design and coding of software for (i) remote control of Portland cement provides quality assessment of the finished
the instrument, (ii) data acquisition and analysis, and (iii) product as it is produced rather than relying on testing of
reporting of results to the site computer. material at the time of dispatch to the customer. The mea-
surement of the mineralogy allows (i) control of the setting
time (estimated from the gypsum, hemihydrate and C3A ra-
II. EXPERIMENTAL tios), and (ii) control of the weighfeeders for gypsum, lime-
stone, and clinker in the feed to the mill.
A. Cement analysis
1. Portland cement production and phases produced
2. Phase abundance determination procedure
The methodology of production for Portland cement is
well documented (Taylor, 1990) and will not be repeated in Traditional quantitative phase analysis using XRD has
detail here. In summary the process involves: been carried out using single peak methods based upon either
peak heights or integrated intensities (Klug and Alexander,
Feed material consisting mainly of CaO, SiO2, A12O3, and 1974; Cullity, 1978; Jenkins and Snyder, 1996). The appli-
Fe2O3 is prepared by milling predetermined quantities of cation of such methods to the quantitative analysis of cement
limestone, shale, sand and iron oxide. and clinker phases has not been entirely successful in the
The mixture is heated in a rotating kiln at approximately past (Aldridge, 1982). This is due to the high degree of over-
1400 C. The limestone decomposes and calcium silicate, lap between the main peaks of the major phases leaving few
calcium-aluminate, and calcium-alumino-ferrite phases are free-standing peaks available for the measurement of inte-
formed in "clinkers" of approximately 1-3 cm in diam- grated intensities. In order to avoid the overlap problem,
eter. The composition of the feed materials as well as kiln relatively weak peaks are often selected for analysis, leading
conditions can affect the final clinker properties and com- to large counting errors in the determination of peak inten-
position. Table I describes the clinker phases and their sity. Figure 1 shows an observed XRD pattern for clinker
nominal compositions. plus the individual components (calculated to represent typi-
Portland cement is prepared by grinding the clinkers in a cal clinker composition) for each of the major phases and
ball mill with approximately 5 wt. % each of gypsum clearly demonstrates the high degree of overlap in the region
(CaSO4.2H2O) and limestone. The mill temperature rises 31 to 35 26 (CuKa) where most phases have their strongest
to about 130 C during grinding, causing partial decompo- reflections.
sition of the gypsum to form hemihydrate Additional complications in the XRD analysis of Port-
(CaSO4.0.5H2O) and occasionally anhydrite (CaSO4). land cement include:
Table II gives the additional phases present in Portland
cement. Most of the phases display variable amounts of atomic
substitution (solid solution) which can have a substantial
At two crucial stages in the manufacture, phase abundance influence on the measured peak positions for a particular
estimations can be used to provide feedback for plant con- sample.
trol. First, analysis of the clinker material provides informa- Variation of the degree of crystallinity of the phases can
tion for control of kiln parameters such as temperature pro- affect the width and shape and hence the degree of overlap
file, residence times, and excess oxygen. Second, analysis of between the observed diffraction peaks.

TABLE II. Phases present in Portland cement in addition to those present in clinker.

Nominal Typical concentration


Phase formula (wt. %) Comments

Gypsum CaSO4.2H2O 2-5 Exhibits severe preferred orientation


Hemihydrate CaSO4.;tH2O 2-5 Hydration state varies ( 0 . 3 < J : < 0 . 8 )
Anhydrite CaSO4 0-3
Calcite CaCO3 0-5 Exhibits preferred orientation
Quartz SiO2 0-3

72 Powder Diffr., Vol. 16, No. 2, June 2001 Scarlett et al. 72


90 should be noted that the so-called ZMV method provides a
Observed
-C3S
dynamic calibration throughout the refinement process but
provides only relative phase abundance, i.e., the analyzed
phases are normalized to 100%.
A
70
The advantages of the Rietveld method for the quantita-
tive phase analysis of Portland cement are:
60
The use of the entire diffraction pattern (where tens or
C4AF I 1
f 50 hundreds of peaks may contribute to the analysis) rather
C3A
than just one or two peaks as in conventional methods.
1
\
40
C2S A V The potential for refinement of the crystal chemistry of the
component phasesthe structural parameters may then
30
Lime

\J!S
/
K \ V; \ contain information which can be correlated to processing
20 / conditions.
The reduction of peak overlap difficulties since the ob-
served data are compared with a calculated pattern which
31 32 33 34 35 is the sum of the component phase contributions.
29 ()
However, some of the disadvantages of the method are the
Figure 1. Observed XRD pattern (CuKa) for a sample of Portland cement requirements for:
clinker showing the individual components (calculated to represent their
abundance in a typical clinker) for each of the major phases. Note that the Detailed crystallographic knowledge of all phases present.
y-axis is depicted as the square root of the actual intensities to improve the Not all of the structures are well defined for the clinker
clarity for the minor phases. phases, i.e., reported structures may not calculate intensi-
ties which match those observed.
Data which cover a wide angular range need to be col-
C3S (as defined in Table I) exhibits strong preferred ori- lected.
entation about the (001) crystallographic direction. This Potentially long computational times. Many of the phases
affects not only its own relative peak intensities, but also present in cement and clinker have complex crystal struc-
the derived peak intensities of overlapping phases, espe- tures that generate many peaks in the calculated pattern.
cially C2S. The computational time is proportional to the number of
peaks in the calculation. In addition, some phases are poly-
In recent years it has been recognized that peak overlap prob- morphic and may be present as a mixture of two or more
lems (and, to a lesser extent, preferred orientation) can be forms within a single material.
largely solved by using the entire diffraction pattern for Calculation of relative rather than absolute phase abun-
analysis, rather than a small number of preselected, free- dances. This does not account for the presence of any
standing peaks. The Rietveld method (Rietveld, 1969; amorphous component in the sample stream. In the case of
Young, 1993) uses a model which includes the crystal struc- the Portland cement industry the amount of amorphous
ture for each phase, the pattern background, and peak width content was deemed to be of an insignificant level and thus
and shape parameters to generate a calculated diffraction pat- quantification of relative phase abundances is adequate for
tern which is then compared with observed diffraction data. plant control. If large amounts of amorphous material were
Parameters in the model are varied through a least-squares a regular component of another sample stream it may be
process to minimize the difference between the calculated possible to include an assessment of the amount by mea-
and observed patterns. surement of the area of the amorphous peak. In many in-
For each phase a scale factor is included to adjust the dustrial applications the appearance of trends in the rela-
intensity or "height" of the calculated pattern. In a multi- tive proportions of phases is still useful for plant control
phase sample consisting of n phases, there is a relatively even if absolute quantification is not possible.
simple relationship between the Rietveld scale factor and the The need for long data sets and computational times has
relative abundance of phase i [Eq. (1)]. This technique was the potential to reduce the efficacy of the method as a tool
first proposed by Hill (1983) and further developed and for rapid feedback of results for the purpose of plant con-
tested by Hill and Howard (1987) and is given by: trol.
Si(ZMV)t Modified Rietveld approach. In order to address the dif-
(1) ficulties of ill-defined structures and long computational
times, a modified Rietveld approach (Taylor and Rui, 1992)
where w, = weight fraction of phase /, 5 = refined Rietveld has been taken to the analysis of Portland cement. Where the
scale factor, ZMV'= the "calibration constant" where Z is conventional Rietveld method utilizes crystal structure infor-
the number of formula units per unit cell, M is the mass of mation to generate peak intensities, the modified approach
the formula unit, and V is the volume of the unit cell. uses intensities based, in part, on intensities observed in
The Rietveld method is now widely used (Madsen et al., "real" materials. This technique is particularly useful for the
2001) for phase abundance determination from diffraction analysis of C3S since the reported structural information
data since no calibration is required; in this case knowledge does generate peak intensities which accurately reflect those
of the crystal structure provides the calibration constant. It observed in real clinker material. In summary, the method-

73 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 73
ology (described more fully in Taylor and Rui, 1992; Mad-
sen and Scarlett, 1999) comprises:
Calculate the structure factors using the partially known
structure and write to a text file.
Manually modify the structure factors according to the ob-
served intensities to obtain a better fit during Rietveld re-
finement.
Adjust the absolute scale of the modified structure factors
to ensure compliance of the ZMV relationship used for
derivation of phase abundances.
During analysis, read the structure factors from the file
rather than generate them from the crystal structure. To
speed up processing it is also possible to read in unmodi-
fied values of the structure factors rather than repeatedly
calculate them from the structure throughout the refine- Figure 2. The upper cabinet of the on-line XRD instrument showing the
ment. In the case of the Portland cement detailed here, all continuous feed sample presenter.
phases were read in from structure factor files from which
the very weak reflections (less than 0.5% of the maximum
for the phase) had been omitted to further speed the calcu- that the diffraction patterns are reported in terms of channel
lations. numbers rather than diffraction angle required by the Ri-
etveld program. This has been overcome by devising a cali-
Although detailed structural knowledge is not required for bration routine that is relatively easy to use in a plant envi-
this approach, it is necessary to know the unit cell of the ronment. However, small residual errors remain in the
phase in question (i.e., all peaks must be able to be indexed) reported 20 values and must be accommodated by the Ri-
to adjust the peak positions if necessary. etveld refinement software (Coelho et al, 1997). Additional
In this work only the structure factors for C3S were problems are caused by the inability to place a post-
modified (based on the average intensities observed from diffraction monochromator in the instrument, resulting in an
several "real" clinker samples) in order to provide the best increase in pattern background due to sample fluorescence
match between the calculated and observed XRD patterns. (Figure 3). This difficulty can be partially solved by using
Madsen and Scarlett (1999) have noted that the XRD pattern CoKa radiation to eliminate the generation of FeA"a fluores-
of cement clinker exhibits a peak at approximately 36.8 26
(CuKa) which can be attributed to C3S (ICDD-PDF,
1995card number 31-301). In addition, the peak can be A
indexed using the structure of Mumme (1995) but is not 500

generated with significant intensity by any of the structures I


400 i I
used for pattern calculation. Modified structure factors for a |
Intensity (coun

this peak have also been included in the modified C3S file.
While this approach was effective in improving the gen- !
eral level of fit between the observed and calculated patterns i , i
in these samples, additional modifications to the structure
factor files may be required for clinker or cement samples 100

from other sources. Changes to the source of raw materials


0
or to kiln operating conditions at a particular location may 10 20 30 40 50 60 70 80
also produce minor changes in the observed peak intensities. 29 H

B. Instrument design
1. X-ray diffractometer
_ 4000
The diffractometer used for the XRD analyzer was com-
posed of (i) an Inel CPS 120 curved detector plus electronic
control panel, (ii) interface card, (iii) X-ray generator with $

RS232 interface, (iv) a graphite, incident beam monochro-


mator (v) Co target tube, and (vi) a purpose-built instrument
cabinet. It is the use of the curved detector, which allows the
simultaneous collection of 120 20 of data, that forms the
basis of the on-line XRD analyzer. The resolution of this
detector is of the order of 0.03 20. It is the only one cur- 26 f)
rently available capable of simultaneously collecting the an-
gular range required for this application. Figure 2 shows the Figure 3. X-ray diffraction data collected using the on-line analyzer using
diffractometer with the sample presenter in place. total collection times of 1 min (A) and 10 min (B) duration. Note (i) the
relatively high pattern background due to sample fluorescence and (ii) the
There remain some problems inherent in the use of the general improvement in the definition of the minor phases above the pattern
curved detector in this application. The most important is background with increased counting time.

74 Powder Diffr., Vol. 16, No. 2, June 2001 Scarlett et al. 74


point, thus providing a representative sample for analysis.
:. 9
\

This should be compared to conventional laboratory based


\ , measurements (using X-ray fluorescence spectrometry)
where only about 5 kg of material is sampled over a 2-4 h
period and then sub-sampled down to a few grams for analy-
sis.
The sample presenter provides a smooth, flat sample sur-
face of constant height by means of a roller and knife-edge
system. Following irradiation, the sample is withdrawn by
means of a scraper and vacuum system that returns the ma-
terial to the cement storage bin. The rate at which the sample
passes through the diffractometer can be adjusted to vary the
total amount of sample examined in each analysis. Figure 4
shows the sample presenter mounted on the diffractometer.
The ability to examine a continuous stream of sample in this
manner significantly increases the number of crystallites ex-
amined during the data collection, and hence improves the
Figure 4. Sample presenter for on-line XRD cement analyzer showing the
sample feed tube (A), the body of the presenter (B), and the sample surface precision of the quantitative phase analyses.
(C).

3. Software/instrument controller
cence. However, the presence of high concentrations of cal-
cium in the samples still causes problems due to CaKa fluo- The operation of the on-line diffractometer is controlled
rescence. While much of the CaKa is absorbed in the air gap remotely by a PC. Purpose-written software (Figure 5) con-
trols all aspects of the operation of the instrument including
between the sample and the detector, there is still sufficient
power on/off, checking of instrument status parameters, cali-
to increase the pattern background and hence increase the
bration of the detector, control of the XRD instrument pa-
lower limits of detection for the minor phases.
rameters, collection and analysis of data, and the reporting of
results to the plant operating room.
2. Sample feeder and presenter Data quality can be controlled through the use of a data
The sample handling devices have been purpose-built to collection regime in which single data sets (typically of 60 s
provide a continuous flow of material from the cement mill, duration) are collected and several (typically ten) are
through the diffractometer, and back to the cement hopper. summed prior to Rietveld analysis. The benefits of this re-
While the total amount of cement manufactured is some 75 gime include (i) improvement of the X-ray counting statistics
tonnes per hour, only a fraction of this (several kg/h) is through the addition of multiple data sets, and (ii) the gen-
passed through the XRD analyzer. The grinding process in eration of rapid analyses (every 1 min) which are based on
the mill ensures uniform mixing of material at the sampling the running sum of the previous ten data sets. The software

Eh U * Cat

p PHASE WSUlT
c
q-77
^
Figure 5. The main screen for the soft-
imTiaCwftr [ i MM
Brila 7 437 ware interface for the on-line XRD ce-
M* 5 623 ment analyzer. Features include (i)
Frtb o/Ts display of the number of data sets re-
AkJimtro '43f.
quired for analysis and the number al-
Almnta-c J0O1
ready collected, (ii) the elapsed time
Una UXO
for the current data set, (iii) controls to
FMInto '343
power the XRD analyzer up and down
Sjwum --
as well as to start data collection and
.(6!4
Rietveld analysis, (iv) display of the
Mvdto KP4
quantitative phase abundances and de-
Cafcto 4 H.'t
rived oxide contents for the most re-
cently analyzed data set, and (v) the
OiMb L *4
RFKKX ?*=
status of various sections of the instru-
ment.
U) f.4 ,--.;.

ua I8f37

ALMMl MESSAGE |MLgr.lnMml

y Mctwolr Wad Dronii| 1334

75 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 75
(QPA) with which to compare results from XRD phase
analysis. The industry standard methods of point counting or
the Bogue method both suffer severe limitations (Madsen
and Scarlett, 1999). However, given that the Bogue method
is the most commonly used benchmark, it was necessary
from an industrial point of view to relate the method de-
scribed here to it. More accurate verification of the analytical
method was obtained by comparing "reduced oxide" values
calculated from the Rietveld QPA and the detailed phase
compositions obtained from microprobe analysis against the
oxide values measured by X-ray fluorescence.
A series of samples of plant material were provided
along with their relevant Bogue and XRF analyses for veri-
fication work. XRD data were collected on these samples
using a traditional Bragg-Brentano geometry, scanning dif-
fractometer incorporating a post-diffraction monochromator
to eliminate sample fluorescence. This provided high quality
data sets with good counting statistics and high peak-to-
background ratios.
The results of QPA using the modified Rietveld ap-
proach are compared with the Bogue results in Figure 7,
while a comparison of the oxide contents from XRF and the
XRD "reduced oxides" is shown in Figure 8. Table III
shows the standard deviation (s.d.) for each method derived
from the covariance between the (i) XRD and Bogue, and (ii)
XRD and XRF oxide estimates using the method of Grubbs
(1948). Also included is the mean difference between the
estimates for each of the major phases (BogueXRD) and
oxides (XRFXRD reduced oxides). The individual s.d.'s
provide a measure of the precision of each analysis method,
Figure 6. The on-line XRD cement analyzer installed in the purpose-built while the mean difference provides an indication of the over-
instrument room adjacent to the cement mill. The upper cabinet houses the all accuracy (incorporating the bias present in each method).
XRD instrumentation and sample presenter, while the lower cabinet houses
the generator, detector electronics, and computer. For the most abundant phases (C3S and C2S), the high
s.d. values reflect relatively poor precision in the determina-
tion, with the Bogue being much poorer than XRD. For the
allows the setting of both the data collection time and the
number of data sets prior to analysis. other phases (C4AF and C3A) both methods contribute ap-
proximately equally to the overall error estimate. For all
The instrument described here employs a flat graphite,
incident beam monochromator. Data quality could be im- phases, the large values of the average difference indicates
proved by the inclusion of a multi-layer mirror in the inci- relatively poor accuracy when attempting to use Bogue re-
dent beam path to provide an increase in pattern intensity of sults as a point of comparison for the XRD analyses.
about 5 to 10 times. Adequate data could then be collected in For all of the major oxide components, the s.d. values
a total of 1-2 min. are generally much lower than for the phase data with the
XRF estimates and those derived from XRD contributing
4. Instrument construction and installation approximately equally to the overall error estimate. In addi-
The XRD instrument is housed in a purpose-built cabinet tion, the values for average difference for the oxides are
(Figure 6) comprised of two sections that can be sealed to much lower than those given for the phase abundances.
exclude dust and separated for transportation. The upper sec- These results show that the comparison of reduced oxides
tion houses the INEL XRD instrument and sample presenter, calculated from XRD results with XRF measurements is a
while the lower section houses the detector electronics, more reliable measure of success of the XRD analysis than
X-ray generator, instrument interface, and computer. The comparison of XRD phase abundances with the Bogue
lower cabinet is equipped with a heat exchanger to remove method.
the excess heat generated by the electronics. The upper cabi- 1. Sensitivity of lime measurement
net section has been designed to minimize the risks of radia-
tion leakage, with special attention paid to the conditions Lime (CaO) is present in clinker at a level of approxi-
likely to be encountered in a plant installation. mately 0.2-3 wt. % and is a useful indicator for kiln operat-
ing conditions. Ideally, an accuracy of 0.1 wt. % is re-
quired in the analysis, but 0.2 wt. % is useful for obtaining
III. RESULTS AND DISCUSSION
trends. Verification of the accuracy of lime measurement by
A. Verification of analytical method XRD was achieved by preparing a synthetic sample consist-
One of the difficulties with the analysis of cement and ing of clinker with various known lime additions. XRD data
clinker is in establishing a "true" quantitative phase analysis were collected using a conventional, laboratory based scan-

76 Powder Diffr., Vol. 16, No. 2, June 2001 Scarlett et al. 76


70

60

50

c
n
a 40

30

a.
S 20
CD C3S
C2S
10 C4AF
x C3A-0
1:1

10 20 30 40 50 60 70 5 10 15
XRD Phase Abundance (wt%) XRD Phase Abundance (wt%)

Figure 7. Comparison of quantitative phase abundance determination for plant samples using the modified Rietveld approach with that from Bouge analysis.
"A" shows all phases present simultaneously. " B " is an expansion of " A " which shows the minor phases in greater detail.

ning diffractometer incorporating a dry nitrogen atmosphere periods for the clinker and the use of a water spray to control
and a sample stage heated to 110 C to prevent the hydration mill temperature will ensure that all of the lime has hydrated.
of lime to portlandite. The results of the analyses are com- The presence of portlandite provides an indication of
pared with the known additions in Table IV. The results pre-hydration (related to problems with cement mill water
indicate that lime can be measured to an accuracy of about sprays or clinker storage) and is a factor used in the predic-
0.2 wt. % at levels up to 2 wt. % which should be sufficient tion of cement strength (Manias et al, 2000). While portlan-
for obtaining trends in the lime content. Future developments
dite can be included in the quantitative phase analysis, it
will aim to improve the level of accuracy of the method.
The estimation of the lime (CaO) content will only be should be noted that the crystallite size of portlandite is rela-
effective for freshly manufactured clinker since lime readily tively small. This results in broad diffraction peaks that are
hydrates to portlandite [Ca(OH)2]. It is unlikely that lime not readily observed above the pattern background unless the
will be detected in finished cement since extended storage counting statistics are adequate. The instrument operators

o
A B /
60
/ 5

50
/ I.
a
u
XRI F Oxide Abundar

IS 40
o
c
I 30
/
/
CaO CaO

S / SiO2 SiO2

Li- 20
* AI2O3 / A AI2O3
ce
x / x Fe2O3 / x Fe2O3

/ MgO
1
MgO
+ Na2O
10 / + Na2O
- K2O - K2O
1:1
0 / 1:1
n
10 20 30 40 50 60 70 1 2 3 4 5
XRD "Reduced Oxide" Abundance (wt%) XRD "Reduced Oxide" Abundance (wt%)

Figure 8. Comparison of reduced oxide values derived from XRD phase abundances with analyzed values from X-ray fluorescence for the same suite of
samples as shown in Figure 7. Once again " A " shows all phases present simultaneously and " B " is an expansion of " A " which shows the minor phases
in greater detail.

77 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 77
TABLE III. Estimates of the covariance and average difference for (i)
Bogue and XRD for the major phases and (ii) XRF oxide estimates and the A
"reduced oxides" derived from XRD. The average difference is defined as
the mean of (BogueXRD phase estimate) or (XRFXRD reduced oxide) C3S
16 i
for each determination.

Standard deviation C4AF


Derived from covariance

Phase Bogue XRD Average difference C3A O


9
C3S 4.38 0.85 2.3 o
C2S 4.08 1.57 -2.8 8
o C2S o
C4AF 0.25 0.40 -1.6 6 ID
C3A -1.4 O
0.36 0.37
4

Standard deviation
Derived from covariance 17:00 19:00 21:00 23:00 1:00 3:00 5:00 7:00

Oxide XRF oxides XRD reduced oxides Average difference Time (hours:minutes)

CaO 0.42 0.37 -0.75


SiO 2 0.30 0.29 -0.47
A12O3 0.15 0.24 -0.09
Fe 2 O 3 0.10 0.15 -0.02
MgO 0.03 0.08 -0.29

must consider the importance of counting statistics when se-


lecting the data collection times. s
E

B. Laboratory based stability testing


I
$
Prior to the installation of the on-line XRD analyzer,
extensive laboratory based testing was conducted to deter-
mine the stability of the instrument. Some of these tests in-
21:00 23:00 1:00 3:00
volved the collection of data from a recirculating sample 17:00 19:00
Time (hours:minutes)
over a period of 15 h. Data sets of 60 s duration were col-
lected continuously and analyses carried out on the summa- Figure 9. Results of laboratory based stability testing for on-line cement
tion of ten sets. The result of this was the production of a analyzer over a 15 h period for (A) C3S, C4AF, C3A, and C2S and (B)
Gypsum and Hemihydrate. For the duration of the test, the same cement
QPA result every 1 min which is the average of the previous
sample was allowed to remain on the sample presenter. For (A), the left
ten minutes of data collection. Figure 9 shows the results of hand scale refers to the amount of C3S present, while the right hand scale
these stability trials for the major phases contained within the refers to the amount of all other phases. For (B), the left hand scale refers to
Portland cement. Table V shows the means, standard devia- the amount of gypsum present, while the right hand scale refers to the
tions, and % relative standard deviations (%RSD) for these amount hemihydrate.
results. The maximum deviation over the course of 15 h was
3.70% relative in the gypsum (for example) which was
present at a level of about 3 wt. %. This indicates good re- strument's commissioning process. In this instance, the ce-
producibility and internal stability of the instrument in a ment manufacturers were interested in trialing faster turn-
laboratory environment. around times than those considered in the laboratory so
analyses were carried out on single data sets of 80 s duration.
C. Plant based testing The sample was fed continuously from the cement mill and
Testing similar to that carried out in the laboratory was data were collected over a period of 8.5 h. The QPA results
also carried out in the plant as part of the on-line XRD in- for the major phases obtained during plant testing are shown
in Figure 10 and Table VI. Note that the cement used in this
TABLE IV. Results of quantitative phase analysis for known lime additions trial was not the same as that used in the laboratory trials, so
to a sample of cement clinker. The figures in brackets for the analyzed the magnitude of the results will be slightly different.
values represent the errors derived from the errors in the Rietveld scale
factors. The line of best fit is given by ana!yzed=0.8994*Weighed
+ 0.1016, K2 = 0.9923.
TABLE V. Means, standard deviations and % relative standard deviations
Weighed Analyzed Bias (RSD) for laboratory based stability trials. Individual analyses were based
(wt. %) (wt. %) (wt. %) on the rolling sum of 10X60 second data sets.

0.00 0.17(0.10) 0.17 = 815 C3S C2S C4AF C3A Gypsum Hemihydrate
0.47 0.31(0.10) -0.16
0.91 1.13(0.12) 0.22 Mean 58.47 8.08 11.86 8.84 3.02 3.40
1.95 1.78(0.14) -0.17 S.D. 0.38 0.23 0.27 0.17 0.11 0.09
5.00 4.61(0.16) -0.39 %RSD 0.64 2.81 2.31 1.98 3.70 2.71

78 Powder Diffr., Vol. 16, No. 2, June 2001 Scarlett et al. 78


the material fed continuously from the cement mill. While
A .
correlation of the QPA results with actual mill operating con-
ditions has not been performed to date, the variations ob-
served in the gypsum/hemihydrate values (Figure 10) could
C3S
provide valuable data for control of the mill operating con-
ditions.

C4AF

S 50 IV. CONCLUSIONS
V)
o
o I An on-line, X-ray diffraction instrument capable of con-
tinuously monitoring phase abundances has been constructed
45
and installed in an operational cement plant. This has been
' C2S
achieved through (i) the use of a curved, position sensitive
0
detector to simultaneously collect wide-range diffraction
8:30 9:30 10:30 11:30 12:30 13:30 14:30 15:30 16:30 17:30 data, (ii) the incorporation of a continuous feed mechanism
T i m e (hours:minutes)
for sample presentation, and (iii) the use of a modified Ri-
etveld approach for quantitative phase analysis, thus provid-
B ing more accurate analyses than conventional methods.
* * Gypsum The continuous nature of the sample feed significantly
-- - - '-;. :\:- ./ : - reduces the problems associated with obtaining a representa-
% tive sample by more traditional methods of sampling. An
' ."'. '. " . . . additional benefit of the use of a moving sample is the in-
crease in the total number of particles examined during the
s
g data collection. This leads to increased accuracy in the peak

o intensities and hence the quantitative phase analyses.
In its current configuration, this instrument can be used
-: .?r*X*,' * 5"
- a . . . . . to analyze any multi-phase system that is amenable to analy-

r Hemihydrate
sis by powder X-ray diffraction. The instrument can be rap-
idly reconfigured to allow a "single sample" mode of op-
eration for the periodic investigation of smaller samples for
8:30 9:30 10:30 11:30 12.30 13:30 14:30 15:30 16:30 17:30
research purposes. Currently, the sample feed system is lim-
Time (houre:minutes) ited to dry feed materials but work is in progress to allow for
the continuous analysis of slurry samples resulting from min-
Figure 10. Results of plant based stability testing for the on-line cement eral processing operations.
analyzer over an 8 h period for C3S, C2S, C4AF, and C3A (A) and Gyp-
sums and Hemihydrate (B). During testing, the sample was fed continuously
from the cement mill. For (A), the left hand scale refers to the amount of
C3S present, while the right hand scale refers to the amount of all other ACKNOWLEDGMENTS
phases. For (B), the left hand scale refers to the amount of gypsum present,
while the right hand scale refers to the amount hemihydrate. The solid lines Edmund Schneider is gratefully acknowledged for his
represent the mean of each set of analyses in this diagram while the dotted input to the design and construction of the sample feed and
lines represent 2 esds derived from the laboratory based testing and show presentation system. The staff of the Birkenhead works of
the limits of variability that can be expected from instrumental variation Adelaide Brighton Management Ltd. are gratefully acknowl-
alone.
edged for their assistance during installation and commis-
sioning of the XRD cement analyzer. Dr. Cheryl Lim and Dr.
In addition to quantitative phase analyses, Figure 10 Nick Cutmore of CSIRO Minerals are gratefully acknowl-
shows the mean for the plant based results as well as lines edged for their reviewing of an early version of the manu-
representing 2 estimated standard deviations (esd) derived script.
from the laboratory based testing. The 2 esd lines indicate
the limit of variation that could be attributed to instrument Aldridge, L. P. (1982). "Accuracy and precision of phase analysis in Port-
land cement by Bogue, microscopic and X-ray diffraction methods,"
stability alone. For the sulphate phases (gypsum and hemi- Cem. Concr. Res. 12, 381-398.
hydrate) variations are apparent which exceed these limits Bogue, R. H. (1929). "Calculation of the compounds in Portland cement,"
and could be attributed to variability in the composition of Ind. Eng. Chem. 1, 192-197.
Campbell, D. H. (1986). "Microscopical examination and interpretation of
Portland cement and clinker," Portland Cement Association, USA, Li-
TABLE VI. Means, standard deviations, and % relative standard deviations brary of Congress catalogue card number 85-63563.
(%RDS) for plant based trials. Individual analyses were based on single 80 Coelho, A. A., Madsen, I. C , and Cheary, R. W. (1997). "A New Rietveld
second data sets. refinement program using a fundamental parameters approach to synthe-
sizing line profiles," Proceedings of Crystal XX, The Twentieth Meet-
n = 315 C3S C2S C4AF C3A Gypsum Hemihydrate ing of the Society of Crystallographers in Australia, April 2-5, 1997,
Queenstown, New Zealand.
Mean 61.71 6.65 12.60 7.10 3.33 2.14 Cullity, B. D. (1978). Elements of X-ray Diffraction, 2nd ed. (Addison Wes-
S.D. 1.48 0.95 0.92 0.63 0.50 1.60 ley, New York).
%RSD 2.40 14.32 7.27 8.94 14.90 21.40 Grubbs, F. E. (1948). "On estimating precision of measuring instruments
and product variability," J. Am. Stat. Assoc. 43, 243-264.

79 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 79
Hill, R. J. (1983). "Calculated X-ray powder diffraction data for phases on Powder Diffraction Round Robin on Quantitative Phase Analysis:
encountered in lead/acid battery plates," J. Power Sources 9, 55-71. Samples 1A to 1H," J. Appl. Crystallogr. (submitted).
Hill, R. J., and Howard, C. J. (1987). "Quantitative phase analysis from Manias, C , Retallack, D., and Madsen, I. (2000). "XRD for on-line analysis
neutron powder diffraction data using the Rietveld method," J. Appl. and control," World Cem. 31 78-81.
Crystallogr. 20, 467-474. Mumme, W. G. (1995). "Crystal structure of tricalcium silicate from a
ICDD-PDF (1995). "The database of diffraction data compiled by the Portland cement clinker and its application to quantitative XRD analy-
JCPDS International Centre for Diffraction Data." sis," Neues Jahrb. Mineral., Abh. 169, 35-68.
Jenkins, R., and Snyder, R. (1996). Introduction to Powder Diffractometry
Rietveld, H. M. (1969). "A profile refinement method for nuclear and mag-
(Wiley, New York).
Klug, H. P., and Alexander, L. E. (1974). X-ray Diffraction Procedures for netic structures," J. Appl. Crystallogr. 2, 65-71.
Polycrystalline Materials, 2nd ed. (Wiley, New York). Taylor, H. F. W. (1990). Cement Chemistry (Academic, London).
Madsen, I. C , and Scarlett, N. V. Y. (1999). "Cement: Quantitative phase Taylor, J. C , and Rui, Z. (1992). "Simultaneous use of observed and cal-
analysis of Portland cement clinker," in Industrial Applications of X-ray culated standard profiles in quantitative XRD analysis of minerals by the
Diffraction, edited by F. H. Chung and D. K. Smith (Marcel Dekker, multiphase Rietveld method: The determination of pseudorutile in min-
New York). eral sands products," Powder Diffr. 7, 152-161.
Madsen, I. C , Scarlett, N. V. Y., Cranswick, L. M. D., and Lwin, T. (2001). Young, R. A. (1993). The Rietveld Method (Oxford University Press, Ox-
"Outcomes of the International Union of Crystallography Commission ford).

80 Powder Diffr., Vol. 16, No. 2, June 2001 Scarlett et at. 80

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