Typical concentration
Phase Nominal formula (wt. %) Comments
(5) Design and coding of software for (i) remote control of Portland cement provides quality assessment of the finished
the instrument, (ii) data acquisition and analysis, and (iii) product as it is produced rather than relying on testing of
reporting of results to the site computer. material at the time of dispatch to the customer. The mea-
surement of the mineralogy allows (i) control of the setting
time (estimated from the gypsum, hemihydrate and C3A ra-
II. EXPERIMENTAL tios), and (ii) control of the weighfeeders for gypsum, lime-
stone, and clinker in the feed to the mill.
A. Cement analysis
1. Portland cement production and phases produced
2. Phase abundance determination procedure
The methodology of production for Portland cement is
well documented (Taylor, 1990) and will not be repeated in Traditional quantitative phase analysis using XRD has
detail here. In summary the process involves: been carried out using single peak methods based upon either
peak heights or integrated intensities (Klug and Alexander,
Feed material consisting mainly of CaO, SiO2, A12O3, and 1974; Cullity, 1978; Jenkins and Snyder, 1996). The appli-
Fe2O3 is prepared by milling predetermined quantities of cation of such methods to the quantitative analysis of cement
limestone, shale, sand and iron oxide. and clinker phases has not been entirely successful in the
The mixture is heated in a rotating kiln at approximately past (Aldridge, 1982). This is due to the high degree of over-
1400 C. The limestone decomposes and calcium silicate, lap between the main peaks of the major phases leaving few
calcium-aluminate, and calcium-alumino-ferrite phases are free-standing peaks available for the measurement of inte-
formed in "clinkers" of approximately 1-3 cm in diam- grated intensities. In order to avoid the overlap problem,
eter. The composition of the feed materials as well as kiln relatively weak peaks are often selected for analysis, leading
conditions can affect the final clinker properties and com- to large counting errors in the determination of peak inten-
position. Table I describes the clinker phases and their sity. Figure 1 shows an observed XRD pattern for clinker
nominal compositions. plus the individual components (calculated to represent typi-
Portland cement is prepared by grinding the clinkers in a cal clinker composition) for each of the major phases and
ball mill with approximately 5 wt. % each of gypsum clearly demonstrates the high degree of overlap in the region
(CaSO4.2H2O) and limestone. The mill temperature rises 31 to 35 26 (CuKa) where most phases have their strongest
to about 130 C during grinding, causing partial decompo- reflections.
sition of the gypsum to form hemihydrate Additional complications in the XRD analysis of Port-
(CaSO4.0.5H2O) and occasionally anhydrite (CaSO4). land cement include:
Table II gives the additional phases present in Portland
cement. Most of the phases display variable amounts of atomic
substitution (solid solution) which can have a substantial
At two crucial stages in the manufacture, phase abundance influence on the measured peak positions for a particular
estimations can be used to provide feedback for plant con- sample.
trol. First, analysis of the clinker material provides informa- Variation of the degree of crystallinity of the phases can
tion for control of kiln parameters such as temperature pro- affect the width and shape and hence the degree of overlap
file, residence times, and excess oxygen. Second, analysis of between the observed diffraction peaks.
TABLE II. Phases present in Portland cement in addition to those present in clinker.
\J!S
/
K \ V; \ contain information which can be correlated to processing
20 / conditions.
The reduction of peak overlap difficulties since the ob-
served data are compared with a calculated pattern which
31 32 33 34 35 is the sum of the component phase contributions.
29 ()
However, some of the disadvantages of the method are the
Figure 1. Observed XRD pattern (CuKa) for a sample of Portland cement requirements for:
clinker showing the individual components (calculated to represent their
abundance in a typical clinker) for each of the major phases. Note that the Detailed crystallographic knowledge of all phases present.
y-axis is depicted as the square root of the actual intensities to improve the Not all of the structures are well defined for the clinker
clarity for the minor phases. phases, i.e., reported structures may not calculate intensi-
ties which match those observed.
Data which cover a wide angular range need to be col-
C3S (as defined in Table I) exhibits strong preferred ori- lected.
entation about the (001) crystallographic direction. This Potentially long computational times. Many of the phases
affects not only its own relative peak intensities, but also present in cement and clinker have complex crystal struc-
the derived peak intensities of overlapping phases, espe- tures that generate many peaks in the calculated pattern.
cially C2S. The computational time is proportional to the number of
peaks in the calculation. In addition, some phases are poly-
In recent years it has been recognized that peak overlap prob- morphic and may be present as a mixture of two or more
lems (and, to a lesser extent, preferred orientation) can be forms within a single material.
largely solved by using the entire diffraction pattern for Calculation of relative rather than absolute phase abun-
analysis, rather than a small number of preselected, free- dances. This does not account for the presence of any
standing peaks. The Rietveld method (Rietveld, 1969; amorphous component in the sample stream. In the case of
Young, 1993) uses a model which includes the crystal struc- the Portland cement industry the amount of amorphous
ture for each phase, the pattern background, and peak width content was deemed to be of an insignificant level and thus
and shape parameters to generate a calculated diffraction pat- quantification of relative phase abundances is adequate for
tern which is then compared with observed diffraction data. plant control. If large amounts of amorphous material were
Parameters in the model are varied through a least-squares a regular component of another sample stream it may be
process to minimize the difference between the calculated possible to include an assessment of the amount by mea-
and observed patterns. surement of the area of the amorphous peak. In many in-
For each phase a scale factor is included to adjust the dustrial applications the appearance of trends in the rela-
intensity or "height" of the calculated pattern. In a multi- tive proportions of phases is still useful for plant control
phase sample consisting of n phases, there is a relatively even if absolute quantification is not possible.
simple relationship between the Rietveld scale factor and the The need for long data sets and computational times has
relative abundance of phase i [Eq. (1)]. This technique was the potential to reduce the efficacy of the method as a tool
first proposed by Hill (1983) and further developed and for rapid feedback of results for the purpose of plant con-
tested by Hill and Howard (1987) and is given by: trol.
Si(ZMV)t Modified Rietveld approach. In order to address the dif-
(1) ficulties of ill-defined structures and long computational
times, a modified Rietveld approach (Taylor and Rui, 1992)
where w, = weight fraction of phase /, 5 = refined Rietveld has been taken to the analysis of Portland cement. Where the
scale factor, ZMV'= the "calibration constant" where Z is conventional Rietveld method utilizes crystal structure infor-
the number of formula units per unit cell, M is the mass of mation to generate peak intensities, the modified approach
the formula unit, and V is the volume of the unit cell. uses intensities based, in part, on intensities observed in
The Rietveld method is now widely used (Madsen et al., "real" materials. This technique is particularly useful for the
2001) for phase abundance determination from diffraction analysis of C3S since the reported structural information
data since no calibration is required; in this case knowledge does generate peak intensities which accurately reflect those
of the crystal structure provides the calibration constant. It observed in real clinker material. In summary, the method-
73 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 73
ology (described more fully in Taylor and Rui, 1992; Mad-
sen and Scarlett, 1999) comprises:
Calculate the structure factors using the partially known
structure and write to a text file.
Manually modify the structure factors according to the ob-
served intensities to obtain a better fit during Rietveld re-
finement.
Adjust the absolute scale of the modified structure factors
to ensure compliance of the ZMV relationship used for
derivation of phase abundances.
During analysis, read the structure factors from the file
rather than generate them from the crystal structure. To
speed up processing it is also possible to read in unmodi-
fied values of the structure factors rather than repeatedly
calculate them from the structure throughout the refine- Figure 2. The upper cabinet of the on-line XRD instrument showing the
ment. In the case of the Portland cement detailed here, all continuous feed sample presenter.
phases were read in from structure factor files from which
the very weak reflections (less than 0.5% of the maximum
for the phase) had been omitted to further speed the calcu- that the diffraction patterns are reported in terms of channel
lations. numbers rather than diffraction angle required by the Ri-
etveld program. This has been overcome by devising a cali-
Although detailed structural knowledge is not required for bration routine that is relatively easy to use in a plant envi-
this approach, it is necessary to know the unit cell of the ronment. However, small residual errors remain in the
phase in question (i.e., all peaks must be able to be indexed) reported 20 values and must be accommodated by the Ri-
to adjust the peak positions if necessary. etveld refinement software (Coelho et al, 1997). Additional
In this work only the structure factors for C3S were problems are caused by the inability to place a post-
modified (based on the average intensities observed from diffraction monochromator in the instrument, resulting in an
several "real" clinker samples) in order to provide the best increase in pattern background due to sample fluorescence
match between the calculated and observed XRD patterns. (Figure 3). This difficulty can be partially solved by using
Madsen and Scarlett (1999) have noted that the XRD pattern CoKa radiation to eliminate the generation of FeA"a fluores-
of cement clinker exhibits a peak at approximately 36.8 26
(CuKa) which can be attributed to C3S (ICDD-PDF,
1995card number 31-301). In addition, the peak can be A
indexed using the structure of Mumme (1995) but is not 500
this peak have also been included in the modified C3S file.
While this approach was effective in improving the gen- !
eral level of fit between the observed and calculated patterns i , i
in these samples, additional modifications to the structure
factor files may be required for clinker or cement samples 100
B. Instrument design
1. X-ray diffractometer
_ 4000
The diffractometer used for the XRD analyzer was com-
posed of (i) an Inel CPS 120 curved detector plus electronic
control panel, (ii) interface card, (iii) X-ray generator with $
3. Software/instrument controller
cence. However, the presence of high concentrations of cal-
cium in the samples still causes problems due to CaKa fluo- The operation of the on-line diffractometer is controlled
rescence. While much of the CaKa is absorbed in the air gap remotely by a PC. Purpose-written software (Figure 5) con-
trols all aspects of the operation of the instrument including
between the sample and the detector, there is still sufficient
power on/off, checking of instrument status parameters, cali-
to increase the pattern background and hence increase the
bration of the detector, control of the XRD instrument pa-
lower limits of detection for the minor phases.
rameters, collection and analysis of data, and the reporting of
results to the plant operating room.
2. Sample feeder and presenter Data quality can be controlled through the use of a data
The sample handling devices have been purpose-built to collection regime in which single data sets (typically of 60 s
provide a continuous flow of material from the cement mill, duration) are collected and several (typically ten) are
through the diffractometer, and back to the cement hopper. summed prior to Rietveld analysis. The benefits of this re-
While the total amount of cement manufactured is some 75 gime include (i) improvement of the X-ray counting statistics
tonnes per hour, only a fraction of this (several kg/h) is through the addition of multiple data sets, and (ii) the gen-
passed through the XRD analyzer. The grinding process in eration of rapid analyses (every 1 min) which are based on
the mill ensures uniform mixing of material at the sampling the running sum of the previous ten data sets. The software
Eh U * Cat
p PHASE WSUlT
c
q-77
^
Figure 5. The main screen for the soft-
imTiaCwftr [ i MM
Brila 7 437 ware interface for the on-line XRD ce-
M* 5 623 ment analyzer. Features include (i)
Frtb o/Ts display of the number of data sets re-
AkJimtro '43f.
quired for analysis and the number al-
Almnta-c J0O1
ready collected, (ii) the elapsed time
Una UXO
for the current data set, (iii) controls to
FMInto '343
power the XRD analyzer up and down
Sjwum --
as well as to start data collection and
.(6!4
Rietveld analysis, (iv) display of the
Mvdto KP4
quantitative phase abundances and de-
Cafcto 4 H.'t
rived oxide contents for the most re-
cently analyzed data set, and (v) the
OiMb L *4
RFKKX ?*=
status of various sections of the instru-
ment.
U) f.4 ,--.;.
ua I8f37
75 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 75
(QPA) with which to compare results from XRD phase
analysis. The industry standard methods of point counting or
the Bogue method both suffer severe limitations (Madsen
and Scarlett, 1999). However, given that the Bogue method
is the most commonly used benchmark, it was necessary
from an industrial point of view to relate the method de-
scribed here to it. More accurate verification of the analytical
method was obtained by comparing "reduced oxide" values
calculated from the Rietveld QPA and the detailed phase
compositions obtained from microprobe analysis against the
oxide values measured by X-ray fluorescence.
A series of samples of plant material were provided
along with their relevant Bogue and XRF analyses for veri-
fication work. XRD data were collected on these samples
using a traditional Bragg-Brentano geometry, scanning dif-
fractometer incorporating a post-diffraction monochromator
to eliminate sample fluorescence. This provided high quality
data sets with good counting statistics and high peak-to-
background ratios.
The results of QPA using the modified Rietveld ap-
proach are compared with the Bogue results in Figure 7,
while a comparison of the oxide contents from XRF and the
XRD "reduced oxides" is shown in Figure 8. Table III
shows the standard deviation (s.d.) for each method derived
from the covariance between the (i) XRD and Bogue, and (ii)
XRD and XRF oxide estimates using the method of Grubbs
(1948). Also included is the mean difference between the
estimates for each of the major phases (BogueXRD) and
oxides (XRFXRD reduced oxides). The individual s.d.'s
provide a measure of the precision of each analysis method,
Figure 6. The on-line XRD cement analyzer installed in the purpose-built while the mean difference provides an indication of the over-
instrument room adjacent to the cement mill. The upper cabinet houses the all accuracy (incorporating the bias present in each method).
XRD instrumentation and sample presenter, while the lower cabinet houses
the generator, detector electronics, and computer. For the most abundant phases (C3S and C2S), the high
s.d. values reflect relatively poor precision in the determina-
tion, with the Bogue being much poorer than XRD. For the
allows the setting of both the data collection time and the
number of data sets prior to analysis. other phases (C4AF and C3A) both methods contribute ap-
proximately equally to the overall error estimate. For all
The instrument described here employs a flat graphite,
incident beam monochromator. Data quality could be im- phases, the large values of the average difference indicates
proved by the inclusion of a multi-layer mirror in the inci- relatively poor accuracy when attempting to use Bogue re-
dent beam path to provide an increase in pattern intensity of sults as a point of comparison for the XRD analyses.
about 5 to 10 times. Adequate data could then be collected in For all of the major oxide components, the s.d. values
a total of 1-2 min. are generally much lower than for the phase data with the
XRF estimates and those derived from XRD contributing
4. Instrument construction and installation approximately equally to the overall error estimate. In addi-
The XRD instrument is housed in a purpose-built cabinet tion, the values for average difference for the oxides are
(Figure 6) comprised of two sections that can be sealed to much lower than those given for the phase abundances.
exclude dust and separated for transportation. The upper sec- These results show that the comparison of reduced oxides
tion houses the INEL XRD instrument and sample presenter, calculated from XRD results with XRF measurements is a
while the lower section houses the detector electronics, more reliable measure of success of the XRD analysis than
X-ray generator, instrument interface, and computer. The comparison of XRD phase abundances with the Bogue
lower cabinet is equipped with a heat exchanger to remove method.
the excess heat generated by the electronics. The upper cabi- 1. Sensitivity of lime measurement
net section has been designed to minimize the risks of radia-
tion leakage, with special attention paid to the conditions Lime (CaO) is present in clinker at a level of approxi-
likely to be encountered in a plant installation. mately 0.2-3 wt. % and is a useful indicator for kiln operat-
ing conditions. Ideally, an accuracy of 0.1 wt. % is re-
quired in the analysis, but 0.2 wt. % is useful for obtaining
III. RESULTS AND DISCUSSION
trends. Verification of the accuracy of lime measurement by
A. Verification of analytical method XRD was achieved by preparing a synthetic sample consist-
One of the difficulties with the analysis of cement and ing of clinker with various known lime additions. XRD data
clinker is in establishing a "true" quantitative phase analysis were collected using a conventional, laboratory based scan-
60
50
c
n
a 40
30
a.
S 20
CD C3S
C2S
10 C4AF
x C3A-0
1:1
10 20 30 40 50 60 70 5 10 15
XRD Phase Abundance (wt%) XRD Phase Abundance (wt%)
Figure 7. Comparison of quantitative phase abundance determination for plant samples using the modified Rietveld approach with that from Bouge analysis.
"A" shows all phases present simultaneously. " B " is an expansion of " A " which shows the minor phases in greater detail.
ning diffractometer incorporating a dry nitrogen atmosphere periods for the clinker and the use of a water spray to control
and a sample stage heated to 110 C to prevent the hydration mill temperature will ensure that all of the lime has hydrated.
of lime to portlandite. The results of the analyses are com- The presence of portlandite provides an indication of
pared with the known additions in Table IV. The results pre-hydration (related to problems with cement mill water
indicate that lime can be measured to an accuracy of about sprays or clinker storage) and is a factor used in the predic-
0.2 wt. % at levels up to 2 wt. % which should be sufficient tion of cement strength (Manias et al, 2000). While portlan-
for obtaining trends in the lime content. Future developments
dite can be included in the quantitative phase analysis, it
will aim to improve the level of accuracy of the method.
The estimation of the lime (CaO) content will only be should be noted that the crystallite size of portlandite is rela-
effective for freshly manufactured clinker since lime readily tively small. This results in broad diffraction peaks that are
hydrates to portlandite [Ca(OH)2]. It is unlikely that lime not readily observed above the pattern background unless the
will be detected in finished cement since extended storage counting statistics are adequate. The instrument operators
o
A B /
60
/ 5
50
/ I.
a
u
XRI F Oxide Abundar
IS 40
o
c
I 30
/
/
CaO CaO
S / SiO2 SiO2
Li- 20
* AI2O3 / A AI2O3
ce
x / x Fe2O3 / x Fe2O3
/ MgO
1
MgO
+ Na2O
10 / + Na2O
- K2O - K2O
1:1
0 / 1:1
n
10 20 30 40 50 60 70 1 2 3 4 5
XRD "Reduced Oxide" Abundance (wt%) XRD "Reduced Oxide" Abundance (wt%)
Figure 8. Comparison of reduced oxide values derived from XRD phase abundances with analyzed values from X-ray fluorescence for the same suite of
samples as shown in Figure 7. Once again " A " shows all phases present simultaneously and " B " is an expansion of " A " which shows the minor phases
in greater detail.
77 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 77
TABLE III. Estimates of the covariance and average difference for (i)
Bogue and XRD for the major phases and (ii) XRF oxide estimates and the A
"reduced oxides" derived from XRD. The average difference is defined as
the mean of (BogueXRD phase estimate) or (XRFXRD reduced oxide) C3S
16 i
for each determination.
Standard deviation
Derived from covariance 17:00 19:00 21:00 23:00 1:00 3:00 5:00 7:00
Oxide XRF oxides XRD reduced oxides Average difference Time (hours:minutes)
0.00 0.17(0.10) 0.17 = 815 C3S C2S C4AF C3A Gypsum Hemihydrate
0.47 0.31(0.10) -0.16
0.91 1.13(0.12) 0.22 Mean 58.47 8.08 11.86 8.84 3.02 3.40
1.95 1.78(0.14) -0.17 S.D. 0.38 0.23 0.27 0.17 0.11 0.09
5.00 4.61(0.16) -0.39 %RSD 0.64 2.81 2.31 1.98 3.70 2.71
C4AF
S 50 IV. CONCLUSIONS
V)
o
o I An on-line, X-ray diffraction instrument capable of con-
tinuously monitoring phase abundances has been constructed
45
and installed in an operational cement plant. This has been
' C2S
achieved through (i) the use of a curved, position sensitive
0
detector to simultaneously collect wide-range diffraction
8:30 9:30 10:30 11:30 12:30 13:30 14:30 15:30 16:30 17:30 data, (ii) the incorporation of a continuous feed mechanism
T i m e (hours:minutes)
for sample presentation, and (iii) the use of a modified Ri-
etveld approach for quantitative phase analysis, thus provid-
B ing more accurate analyses than conventional methods.
* * Gypsum The continuous nature of the sample feed significantly
-- - - '-;. :\:- ./ : - reduces the problems associated with obtaining a representa-
% tive sample by more traditional methods of sampling. An
' ."'. '. " . . . additional benefit of the use of a moving sample is the in-
crease in the total number of particles examined during the
s
g data collection. This leads to increased accuracy in the peak
o intensities and hence the quantitative phase analyses.
In its current configuration, this instrument can be used
-: .?r*X*,' * 5"
- a . . . . . to analyze any multi-phase system that is amenable to analy-
r Hemihydrate
sis by powder X-ray diffraction. The instrument can be rap-
idly reconfigured to allow a "single sample" mode of op-
eration for the periodic investigation of smaller samples for
8:30 9:30 10:30 11:30 12.30 13:30 14:30 15:30 16:30 17:30
research purposes. Currently, the sample feed system is lim-
Time (houre:minutes) ited to dry feed materials but work is in progress to allow for
the continuous analysis of slurry samples resulting from min-
Figure 10. Results of plant based stability testing for the on-line cement eral processing operations.
analyzer over an 8 h period for C3S, C2S, C4AF, and C3A (A) and Gyp-
sums and Hemihydrate (B). During testing, the sample was fed continuously
from the cement mill. For (A), the left hand scale refers to the amount of
C3S present, while the right hand scale refers to the amount of all other ACKNOWLEDGMENTS
phases. For (B), the left hand scale refers to the amount of gypsum present,
while the right hand scale refers to the amount hemihydrate. The solid lines Edmund Schneider is gratefully acknowledged for his
represent the mean of each set of analyses in this diagram while the dotted input to the design and construction of the sample feed and
lines represent 2 esds derived from the laboratory based testing and show presentation system. The staff of the Birkenhead works of
the limits of variability that can be expected from instrumental variation Adelaide Brighton Management Ltd. are gratefully acknowl-
alone.
edged for their assistance during installation and commis-
sioning of the XRD cement analyzer. Dr. Cheryl Lim and Dr.
In addition to quantitative phase analyses, Figure 10 Nick Cutmore of CSIRO Minerals are gratefully acknowl-
shows the mean for the plant based results as well as lines edged for their reviewing of an early version of the manu-
representing 2 estimated standard deviations (esd) derived script.
from the laboratory based testing. The 2 esd lines indicate
the limit of variation that could be attributed to instrument Aldridge, L. P. (1982). "Accuracy and precision of phase analysis in Port-
land cement by Bogue, microscopic and X-ray diffraction methods,"
stability alone. For the sulphate phases (gypsum and hemi- Cem. Concr. Res. 12, 381-398.
hydrate) variations are apparent which exceed these limits Bogue, R. H. (1929). "Calculation of the compounds in Portland cement,"
and could be attributed to variability in the composition of Ind. Eng. Chem. 1, 192-197.
Campbell, D. H. (1986). "Microscopical examination and interpretation of
Portland cement and clinker," Portland Cement Association, USA, Li-
TABLE VI. Means, standard deviations, and % relative standard deviations brary of Congress catalogue card number 85-63563.
(%RDS) for plant based trials. Individual analyses were based on single 80 Coelho, A. A., Madsen, I. C , and Cheary, R. W. (1997). "A New Rietveld
second data sets. refinement program using a fundamental parameters approach to synthe-
sizing line profiles," Proceedings of Crystal XX, The Twentieth Meet-
n = 315 C3S C2S C4AF C3A Gypsum Hemihydrate ing of the Society of Crystallographers in Australia, April 2-5, 1997,
Queenstown, New Zealand.
Mean 61.71 6.65 12.60 7.10 3.33 2.14 Cullity, B. D. (1978). Elements of X-ray Diffraction, 2nd ed. (Addison Wes-
S.D. 1.48 0.95 0.92 0.63 0.50 1.60 ley, New York).
%RSD 2.40 14.32 7.27 8.94 14.90 21.40 Grubbs, F. E. (1948). "On estimating precision of measuring instruments
and product variability," J. Am. Stat. Assoc. 43, 243-264.
79 Powder Diffr., Vol. 16, No. 2, June 2001 On-line X-ray diffraction for quantitative phase 79
Hill, R. J. (1983). "Calculated X-ray powder diffraction data for phases on Powder Diffraction Round Robin on Quantitative Phase Analysis:
encountered in lead/acid battery plates," J. Power Sources 9, 55-71. Samples 1A to 1H," J. Appl. Crystallogr. (submitted).
Hill, R. J., and Howard, C. J. (1987). "Quantitative phase analysis from Manias, C , Retallack, D., and Madsen, I. (2000). "XRD for on-line analysis
neutron powder diffraction data using the Rietveld method," J. Appl. and control," World Cem. 31 78-81.
Crystallogr. 20, 467-474. Mumme, W. G. (1995). "Crystal structure of tricalcium silicate from a
ICDD-PDF (1995). "The database of diffraction data compiled by the Portland cement clinker and its application to quantitative XRD analy-
JCPDS International Centre for Diffraction Data." sis," Neues Jahrb. Mineral., Abh. 169, 35-68.
Jenkins, R., and Snyder, R. (1996). Introduction to Powder Diffractometry
Rietveld, H. M. (1969). "A profile refinement method for nuclear and mag-
(Wiley, New York).
Klug, H. P., and Alexander, L. E. (1974). X-ray Diffraction Procedures for netic structures," J. Appl. Crystallogr. 2, 65-71.
Polycrystalline Materials, 2nd ed. (Wiley, New York). Taylor, H. F. W. (1990). Cement Chemistry (Academic, London).
Madsen, I. C , and Scarlett, N. V. Y. (1999). "Cement: Quantitative phase Taylor, J. C , and Rui, Z. (1992). "Simultaneous use of observed and cal-
analysis of Portland cement clinker," in Industrial Applications of X-ray culated standard profiles in quantitative XRD analysis of minerals by the
Diffraction, edited by F. H. Chung and D. K. Smith (Marcel Dekker, multiphase Rietveld method: The determination of pseudorutile in min-
New York). eral sands products," Powder Diffr. 7, 152-161.
Madsen, I. C , Scarlett, N. V. Y., Cranswick, L. M. D., and Lwin, T. (2001). Young, R. A. (1993). The Rietveld Method (Oxford University Press, Ox-
"Outcomes of the International Union of Crystallography Commission ford).