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Advanced TransPlay
1 Advanced TransPlay
Advanced TransPlay is used to import, edit and output transient data to a test
object. These transient data were created from real or simulated fault
occurrences beforehand and are available as a data file.
The main application field is seen in the reproduction of real fault occurrences.
The fault occurrences recorded with the integrated fault recorder of the
protection device are transmitted to a PC and stored in a corresponding file
format.
Of course, this data may also originate from another source than a fault recorder
as long as is is available in a compatible file format.
The following file formats used to import transient signals are supported:
Comtrade format with the following files:
- CFG: COMTRADE configuration file for the description of the failure
report channels (signal names, sample frequency etc.)
- DAT: COMTRADE file with the sample values of the failure report
channels.
- HDR: "Header file", that contains any data-related text that is not used
by the software.
L4 format with a PL4 file
TRF format with a TRF file
A detailed description about the supported file formats can be found in the
Advanced TransPlay online help under the table of contents entry "File Formats
and Size".
Using this data, a protection device can be optimally tested and adjusted under
real operation conditions.
Advanced TransPlay is also a suitable tool for testing protection devices (e.g.,
with simulated data) during the process of development.
The data output is started either via an external trigger (e.g., GPS), via binary
inputs, by pressing a key or immediately after pressing the S T A R T / C O N T I N U E
button.
Afterwards, the reaction of the test object is compared with given nominal values
or binary signals (reaction saved in the data record or user-defined) and
assessed in the test report.
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OMICRON Test Universe
Detail View
Measurement View
Report View
All settings necessary for the test are made in the Detail View. In the Detail View
the transient analog signals are routed individually to the analog CMC output
channels, the binary signals are interconnected and the trigger conditions are
defined.
The Time Signal View is active after loading (importing) a data record. This view
displays the transient current and voltage signals and the binary signals, if
available.
It is now possible using Advanced TransPlay to edit this data record and to adapt
it for the planned test. Any time sections can be repeated (e.g. to extend the
prefault time), state transitions can be marked, and new binary signals can be
inserted.
The nominal values for the time measurements are defined in the Measurement
View. During the test, each measurement condition is analyzed for the
observance of the tolerances and assessed with "Passed" or "Failed".
The test results are displayed in the Report View. The contents of the Report
View can be either defined by the user or standard default settings can be used.
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Advanced TransPlay
Analog Outputs
The Analog Outputs tab contains a table for setting the output magnitudes of
the available generators.
This table has five columns: Signal, Channel, Scale, Minimum, and Maximum.
Each line corresponds to one used analog output.
After loading a data file, the table is filled with the information stored in the data
record. The signals are routed to the analog outputs of the CMC on the basis of
the signal names. This assignment can be changed at any time. The Scale
column can be used to increase or decrease the voltage and current values that
are to be output. The result of the scaling is displayed in the Minimum and
Maximum fields.
Binary Outputs
The Binary Outputs tab shows the available binary outputs (as defined in the
hardware configuration) and what is interconnected with the binary signals.
Trigger
The Trigger tab defines the start conditions for the output of the transient
signals.
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OMICRON Test Universe
Figure 1-1:
Validity of trigger Test start
conditions
Test 1 Test 2 Test 3
General Tab
The General tab contains specifications for the entire test, such as the number
of test repetitions and the time between the individual test repetitions.
Additionally, the sampling rate can be specified with which the transient signals
are output.
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Advanced TransPlay
Cursor Slider
The sliders act as anchor points for the measuring cursors. In addition they are
used to move the cursor horizontally along the time axis. This is done either by
using the cursor arrow keys of the PC keyboard or by clicking and dragging with
the mouse to the position of your choice.
If you prefer to use the cursor arrow keys on your PC keyboard, use the <Tab>
key or <Shift> + <Tab> to switch between the cursor sliders.
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OMICRON Test Universe
Data Markers
In the Original mode repetition type data markers can be defined and displayed.
The data markers are represented by vertical lines in the diagram and with their
names in the state diagram. The representation of the lines can be individually
defined by the user.
State Markers
State markers are defined in the Expanded mode. As with the data markers,
they are depicted by vertical lines and their names.
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Advanced TransPlay
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OMICRON Test Universe
In the second table, binary signals are used for time comparison (Table 1-2).
If the start condition and the stop condition are the same a measurement of 0 s
is recorded. It is not searched for a second appearance of a condition, i.e. the
time between the first and the second 0 -> 1 transition of a binary signal is not
measurable; the first 0 -> 1 transition fulfills both measurement conditions. In
order to measure such a condition the cursor measurement function in the Time
Signal View can be used.
Table 1-2:
Additional terms in the Additional terms in the measurement table 2
measurement table 2
Signal Binary signal which is to be played back in order to be
compared with the reference signal. Here, all the binary signals
which are set in the HCC dialog are available.
Reference Binary signal from the data record or self-defined signal which
signal serves as a reference for the comparison with the signal to be
played back.
Tact Here the measured time for the edge change of the played
back signal is entered. The edge change time with the
maximum deviation in relation to the reference signal is
entered for binary signals with several edge changes.
Tdev The (greatest) measured deviation of Tact in relation to Tnom
(this value can be either positive or negative).
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Advanced TransPlay
1.2 Example:
Distance Relay with a Transient Playback
Sample files:
AdvTransPlay-Transient_Playback.tra
AdvTransPlay-Transient_Playback.occ
Comtrade Example.cfg
Comtrade Example.dat
Stored at: ...OMICRON Test Universe installation path\
Test Library\Samples\SW Manual Examples\Advanced Protection
Task
A distance relay is to be tested with a transient "play back" test. The test file is
in COMTRADE format (Comtrade Example.cfg) and was created from a
fault recording. The prefault time should be extended to at least one second.
Also a measurement condition for the trip signal of the relay should be defined.
Solution
The OMICRON Test Universe offers a dedicated test module Advanced
TransPlay to "play back" any transient fault recording or simulation. This is the
only module that can fulfill the above task completely.
Assuming that this transient "play back" test is to become part of a complete
automatic test for a distance relay, this test module will be embedded into a test
document for the OMICRON Control Center.
If this test is a once-off test, the Advanced TransPlay module could also be used
in a stand-alone configuration, i.e. without the Control Center.
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OMICRON Test Universe
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1 3
1. Connection variants:
CMC 356, CMC 256plus or CMC 256-6 with the NET-1 or NET-1B option
via Ethernet (ETH connector on the test set's back side) Ethernet port
of your computer.
CMC 256plus with the PAR-1 option parallel printer port of your
computer.
CMC 256plus with the PAR-1 option CMUSB-P converter USB port
of your computer.
Standard CMC 256-6 with parallel Host Interface parallel printer port
of your computer.
CMC 156 with parallel Host Interface CMUSB-P converter USB
port of your computer.
2. Connection of the CMC's analog VOLTAGE OUTPUTS to feed the simulated
voltage signals to the corresponding voltage inputs of the test object.
3. Connection of the CMC's analog CURRENT OUTPUTS to feed the simulated
current signals to the corresponding current inputs of the test object.
4. Connection of the CMC's BINARY OUTPUTS to feed binary signals to the
corresponding binary inputs of the test object.
5. Connection of the test set's BINARY INPUTS to the corresponding binary
outputs of the test object to read the binary signals of the test object (and
therefore the reactions to the fed analog voltage and current signals).
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Advanced TransPlay
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OMICRON Test Universe
Figure 1-3:
Time Signal View
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Advanced TransPlay
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OMICRON Test Universe
5. Specify 50 repetitions.
Note that the value for "Time" and "Duration" is automatically entered from
the present position of the markers.
Figure 1-5:
Defining the signal to be
repeated
6. Click O K .
7. Select "expanded" as display mode (1).
Figure 1-6:
Complete signal with
prefault extended
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Advanced TransPlay
This function enables the definition of any signal to be measured: From, To, the
nominal trip time and the deviation in the negative and positive direction. The
actual measured "trip" time, actual deviation and the assessment will be shown
after a test has been performed.
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OMICRON Test Universe
The trip signal measurement together with an assessment will be shown in the
Measurement View.
Note that if the signal has been zoomed, it will also be shown in this zoomed
state in the Report View.
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Support
Support
When you are working with our products we want to provide you with the
greatest possible benefits. If you need any support, we are here to assist you!
OMICRON electronics GmbH, Oberes Ried 1, 6833 Klaus, Austria, +43 59495
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Support
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