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Test Object - Device Settings


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Substation/Bay:
Substation: WADI KABIR Substation address: 132kV CRP
Bay: E05 Bay address: CB130
. . .
Device:
Name/description: BREAKER FAILURE PROTN Manufacturer: GE
RELAY-1
Device type: C60 Device address: F50BF1
Serial/model number: AA8C16000327
Additional info 1:
Additional info 2:

Hardware Configuration
.
Test Equipment
Type Serial Number
CMC356 JA780R

Pause Module
Instruction Text:
1.CONNECT CONT FROM RELAY TO BI2 OF TEST EQUIPMENT
2.REDUCE TIMER 1 FROM 0.1SEC TO 0.00SEC IN ENERVISTA
3. ASSIGN TEMP CONTACT OUT PUT RELAY 24 FOR STAGE 1 TRIP ONLY

User Input:

Test State: Continue

R-PH PICK UP / DROP OFF:Test Settings


.
General
No. of ramp states: 2
Total steps per test: 452
Total time per test: 45.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I R / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 100.0 mA 300.0 mA
0.00 0.00
50.000 Hz 50.000 Hz
IY 0.000 A 0.000 A
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 100.0 mA 300.0 mA
Sig 1 To 300.0 mA 50.00 mA
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 251
Ramp Time 20.100s 25.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I R 200.0 mA 200.0 mA 10.00 mA 10.00 mA 0.000 A + 24.90 ms
Drop-off Ramp 2 Bin. in 2 1->0 I R 190.0 mA 193.0 mA 10.00 mA 10.00 mA 3.000 mA + 16.10 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed
Y-PH PICK UP / DROP OFF:Test Settings
.
General
No. of ramp states: 2
Total steps per test: 452
Total time per test: 45.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I Y / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 0.000 A 0.000 A
0.00 0.00
50.000 Hz 50.000 Hz
IY 100.0 mA 300.0 mA
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 100.0 mA 300.0 mA
Sig 1 To 300.0 mA 50.00 mA
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 251
Ramp Time 20.100s 25.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I Y 200.0 mA 200.0 mA 10.00 mA 10.00 mA 0.000 A + 23.10 ms
Drop-off Ramp 2 Bin. in 2 1->0 I Y 190.0 mA 193.0 mA 10.00 mA 10.00 mA 3.000 mA + 20.60 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

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Test State:
Test passed

B-PH PICK UP / DROP OFF:Test Settings


.
General
No. of ramp states: 2
Total steps per test: 452
Total time per test: 45.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I B / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 0.000 A 0.000 A
0.00 0.00
50.000 Hz 50.000 Hz
IY 0.000 A 0.000 A
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 100.0 mA 300.0 mA
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 100.0 mA 300.0 mA
Sig 1 To 300.0 mA 50.00 mA
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 251
Ramp Time 20.100s 25.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I B 200.0 mA 200.0 mA 10.00 mA 10.00 mA 0.000 A + 32.20 ms
Drop-off Ramp 2 Bin. in 2 1->0 I B 190.0 mA 193.0 mA 10.00 mA 10.00 mA 3.000 mA + 18.40 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1.CONNECT CONT FROM RELAY TO BI 1 OF TEST EQUIPMENT
2.INCREASE TIMER 1 FROM 0.00SEC TO 0.10SEC IN ENERVISTA

User Input:

Test State: Continue

STAGE 1 TIMING TEST:


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Test Settings
State PRE- R PH PRE- Y PH PRE- B PH
FAULT -1 STAGE-1 FAULT -2 STAGE-1 FAULT -3 STAGE-1
V R-N 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V
0.00 0.00 0.00 0.00 0.00 0.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V
-120.00 -120.00 -120.00 -120.00 -120.00 -120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V
120.00 120.00 120.00 120.00 120.00 120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
IR 0.000 A 400.0 mA 0.000 A 0.000 A 0.000 A 0.000 A
0.00 0.00 0.00 0.00 0.00 0.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
IY 0.000 A 0.000 A 0.000 A 400.0 mA 0.000 A 0.000 A
-120.00 -120.00 -120.00 -120.00 -120.00 -120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A 0.000 A 0.000 A 0.000 A 400.0 mA
120.00 120.00 120.00 120.00 120.00 120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz

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Test Module
Name: OMICRON State Sequencer Version: 3.10
Test Start: 06-Dec-2016 09:45:41 Test End: 06-Dec-2016 09:45:47
User Name: Manager:
Company:

Test Results
.
Time Assessment
Name Ignore Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
R PH STG PRE- R PH Bin. in 1 100.0 ms 30.00 ms 30.00 ms 126.1 ms 26.10 ms +
1 FAULT -1 STAGE-1 0>1
Y PH STG PRE- Y PH Bin. in 1 100.0 ms 30.00 ms 30.00 ms 123.6 ms 23.60 ms +
1 FAULT -2 STAGE-1 0>1
B PH STG PRE- B PH Bin. in 1 100.0 ms 30.00 ms 30.00 ms 126.1 ms 26.10 ms +
1 FAULT -3 STAGE-1 0>1
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. ASSIGN TEMP CONTACT OUT PUT RELAY BO 15 FOR STAGE 2 TRIP ONLY
User Input:

Test State: Continue

STAGE 2 TIMING TEST:


.
Test Settings
State PRE- R PH PRE- Y PH PRE- B PH
FAULT -1 STAGE-2 FAULT -2 STAGE-2 FAULT -3 STAGE-2
V R-N 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V
0.00 0.00 0.00 0.00 0.00 0.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V
-120.00 -120.00 -120.00 -120.00 -120.00 -120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V 0.000 V
120.00 120.00 120.00 120.00 120.00 120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
IR 0.000 A 400.0 mA 0.000 A 0.000 A 0.000 A 0.000 A
0.00 0.00 0.00 0.00 0.00 0.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
IY 0.000 A 0.000 A 0.000 A 400.0 mA 0.000 A 0.000 A
-120.00 -120.00 -120.00 -120.00 -120.00 -120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A 0.000 A 0.000 A 0.000 A 400.0 mA
120.00 120.00 120.00 120.00 120.00 120.00
50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz 50.000 Hz

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Test Module
Name: OMICRON State Sequencer Version: 3.10
Test Start: 06-Dec-2016 09:47:54 Test End: 06-Dec-2016 09:47:59
User Name: Manager:
Company:

Test Results
.
Time Assessment
Name Ignore Start Stop Tnom Tdev- Tdev+ Tact Tdev Assess
before
R PH STG PRE- R PH Bin. in 1 200.0 ms 30.00 ms 30.00 ms 224.8 ms 24.80 ms +
2 FAULT -1 STAGE-2 0>1
Y PH STG PRE- Y PH Bin. in 1 200.0 ms 30.00 ms 30.00 ms 222.3 ms 22.30 ms +
2 FAULT -2 STAGE-2 0>1
B PH STG PRE- B PH Bin. in 1 200.0 ms 30.00 ms 30.00 ms 227.3 ms 27.30 ms +
2 FAULT -3 STAGE-2 0>1
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed
Pause Module
Instruction Text:
1. REMOVE TEMP OUT PUT RELAY BO 15 CONG

User Input:

Test State: Continue

Pause Module
Instruction Text:
1. CONNECT TRIP TESTING CONTACT TO BINARY INPUT 2 OF CMC 356.
2. ASSIGN TRIP TESTING CONTACT TO OVER CURRENT PICK UP FUNCTION.

User Input:

Test State: Continue

R-PH PICK UP / DROP OFF TEST:Test Settings


.
General
No. of ramp states: 2
Total steps per test: 502
Total time per test: 50.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I R / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 1.200 A 1.400 A
0.00 0.00
50.000 Hz 50.000 Hz
IY 0.000 A 0.000 A
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 1.200 A 1.400 A
Sig 1 To 1.400 A 1.100 A
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 301
Ramp Time 20.100s 30.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I R 1.300 A 1.301 A 100.0 mA 100.0 mA 1.000 mA + 30.40 ms
Drop-off Ramp 2 Bin. in 2 1->0 I R 1.300 A 1.261 A 100.0 mA 100.0 mA -39.00 mA + 22.50 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Y-PH PICK UP / DROP OFF TEST:Test Settings


.
General
No. of ramp states: 2
Total steps per test: 502
Total time per test: 50.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I Y / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 0.000 A 0.000 A
0.00 0.00
50.000 Hz 50.000 Hz
IY 1.200 A 1.400 A
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 1.200 A 1.400 A
Sig 1 To 1.400 A 1.100 A
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 301
Ramp Time 20.100s 30.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I Y 1.300 A 1.301 A 100.0 mA 100.0 mA 1.000 mA + 26.40 ms
Drop-off Ramp 2 Bin. in 2 1->0 I Y 1.300 A 1.261 A 100.0 mA 100.0 mA -39.00 mA + 28.70 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.
.
Test State:
Test passed

B-PH PICK UP / DROP OFF TEST:Test Settings


.
General
No. of ramp states: 2
Total steps per test: 502
Total time per test: 50.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I B / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 0.000 A 0.000 A
0.00 0.00
50.000 Hz 50.000 Hz
IY 0.000 A 0.000 A
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 1.200 A 1.400 A
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 1.200 A 1.400 A
Sig 1 To 1.400 A 1.100 A
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 301
Ramp Time 20.100s 30.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I B 1.300 A 1.301 A 100.0 mA 100.0 mA 1.000 mA + 29.70 ms
Drop-off Ramp 2 Bin. in 2 1->0 I B 1.300 A 1.261 A 100.0 mA 100.0 mA -39.00 mA + 28.40 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. CONNECT TRIP TESTING CONTACT TO BINARY INPUT 1 OF CMC 356.
2. ASSIGN TRIP TESTING CONTACT TO OVER CURRENT TRIP FUNCTION.

User Input:

Test State: Continue

OVERCURRENT OPERATING TIME TEST:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes OVERCURRENT IEC Normal Inverse 1.30 Iref 0.14 0.95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EARTHFAULT IEC Normal Inverse 0.60 Iref 0.28 0.95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 3.10
Test Start: 07-Dec-2016 10:21:35 Test End: 07-Dec-2016 10:22:12
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a

.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1 OVERCURRENT 2.000 2.600 A n/a 1.404 s 1.246 s 1.593 s
L1 OVERCURRENT 3.000 3.900 A n/a 882.3 ms 802.1 ms 972.3 ms
L1 OVERCURRENT 4.000 5.200 A n/a 697.2 ms 633.1 ms 764.3 ms
L1 OVERCURRENT 5.000 6.500 A n/a 599.2 ms 541.2 ms 659.2 ms
L1 OVERCURRENT 6.000 7.800 A n/a 537.2 ms 482.7 ms 593.3 ms
L1 OVERCURRENT 7.000 9.100 A n/a 493.9 ms 441.6 ms 547.5 ms
L1 OVERCURRENT 8.000 10.40 A n/a 461.5 ms 410.7 ms 513.5 ms
L2 OVERCURRENT 2.000 2.600 A n/a 1.404 s 1.246 s 1.593 s
L2 OVERCURRENT 3.000 3.900 A n/a 882.3 ms 802.1 ms 972.3 ms
L2 OVERCURRENT 4.000 5.200 A n/a 697.2 ms 633.1 ms 764.3 ms
L2 OVERCURRENT 5.000 6.500 A n/a 599.2 ms 541.2 ms 659.2 ms
L2 OVERCURRENT 6.000 7.800 A n/a 537.2 ms 482.7 ms 593.3 ms
L2 OVERCURRENT 7.000 9.100 A n/a 493.9 ms 441.6 ms 547.5 ms
L2 OVERCURRENT 8.000 10.40 A n/a 461.5 ms 410.7 ms 513.5 ms
L3 OVERCURRENT 2.000 2.600 A n/a 1.404 s 1.246 s 1.593 s
L3 OVERCURRENT 3.000 3.900 A n/a 882.3 ms 802.1 ms 972.3 ms
L3 OVERCURRENT 4.000 5.200 A n/a 697.2 ms 633.1 ms 764.3 ms
L3 OVERCURRENT 5.000 6.500 A n/a 599.2 ms 541.2 ms 659.2 ms
L3 OVERCURRENT 6.000 7.800 A n/a 537.2 ms 482.7 ms 593.3 ms
L3 OVERCURRENT 7.000 9.100 A n/a 493.9 ms 441.6 ms 547.5 ms
L3 OVERCURRENT 8.000 10.40 A n/a 461.5 ms 410.7 ms 513.5 ms
.
Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Bin. in 1 1
Bin. in 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1 OVERCURRENT 2.000 2.600 A n/a 1.404 s 1.434 s 2.139 % No Passed
L1 OVERCURRENT 3.000 3.900 A n/a 882.3 ms 907.3 ms 2.837 % No Passed
L1 OVERCURRENT 4.000 5.200 A n/a 697.2 ms 719.8 ms 3.247 % No Passed
L1 OVERCURRENT 5.000 6.500 A n/a 599.2 ms 623.3 ms 4.029 % No Passed
L1 OVERCURRENT 6.000 7.800 A n/a 537.2 ms 553.2 ms 2.977 % No Passed
L1 OVERCURRENT 7.000 9.100 A n/a 493.9 ms 518.0 ms 4.883 % No Passed
L1 OVERCURRENT 8.000 10.40 A n/a 461.5 ms 488.7 ms 5.883 % No Passed
L2 OVERCURRENT 2.000 2.600 A n/a 1.404 s 1.437 s 2.339 % No Passed
L2 OVERCURRENT 3.000 3.900 A n/a 882.3 ms 914.0 ms 3.596 % No Passed
L2 OVERCURRENT 4.000 5.200 A n/a 697.2 ms 720.3 ms 3.318 % No Passed
L2 OVERCURRENT 5.000 6.500 A n/a 599.2 ms 621.8 ms 3.779 % No Passed
L2 OVERCURRENT 6.000 7.800 A n/a 537.2 ms 550.6 ms 2.493 % No Passed
L2 OVERCURRENT 7.000 9.100 A n/a 493.9 ms 510.5 ms 3.364 % No Passed
L2 OVERCURRENT 8.000 10.40 A n/a 461.5 ms 480.6 ms 4.128 % No Passed
L3 OVERCURRENT 2.000 2.600 A n/a 1.404 s 1.437 s 2.346 % No Passed
L3 OVERCURRENT 3.000 3.900 A n/a 882.3 ms 914.4 ms 3.642 % No Passed
L3 OVERCURRENT 4.000 5.200 A n/a 697.2 ms 712.5 ms 2.200 % No Passed
L3 OVERCURRENT 5.000 6.500 A n/a 599.2 ms 621.2 ms 3.678 % No Passed
L3 OVERCURRENT 6.000 7.800 A n/a 537.2 ms 551.3 ms 2.623 % No Passed
L3 OVERCURRENT 7.000 9.100 A n/a 493.9 ms 514.4 ms 4.154 % No Passed
L3 OVERCURRENT 8.000 10.40 A n/a 461.5 ms 489.0 ms 5.948 % No Passed
.
State:
21 out of 21 points tested.
21 points passed.
0 points failed.

General Assessment: Test passed!

Pause Module
Instruction Text:
1. CONNECT TRIP TESTING CONTACT TO BINARY INPUT 2 OF CMC 356.
2. ASSIGN TRIP TESTING CONTACT TO EARTH FAULT PICK UP FUNCTION.

User Input:

Test State: Continue

EARTH FAULT PICK UP / DROP OFF TEST:Test Settings


.
General
No. of ramp states: 2
Total steps per test: 502
Total time per test: 50.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I Y / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
IR 0.000 A 0.000 A
0.00 0.00
50.000 Hz 50.000 Hz
IY 500.0 mA 700.0 mA
-120.00 -120.00
50.000 Hz 50.000 Hz
IB 0.000 A 0.000 A
120.00 120.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 500.0 mA 700.0 mA
Sig 1 To 700.0 mA 400.0 mA
Sig 1 Delta 1.000 mA -1.000 mA
Sig 1 d/dt 10.00 mA/s -10.00 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 201 301
Ramp Time 20.100s 30.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 I Y 600.0 mA 601.0 mA 100.0 mA 100.0 mA 1.000 mA + 27.80 ms
Drop-off Ramp 2 Bin. in 2 1->0 I Y 600.0 mA 582.0 mA 100.0 mA 100.0 mA -18.00 mA + 12.10 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. CONNECT TRIP TESTING CONTACT TO BINARY INPUT 1 OF CMC 356.
2. ASSIGN TRIP TESTING CONTACT TO EARTH FAULT TRIP FUNCTION.

User Input:

Test State: Continue

EARTH FAULT OPERATING TIME TEST:


Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0.04 s VT connection: n/a
TimeTolRel: 5.00 % CT starpoint connection: n/a
CurrentTolAbs: 0.05 Iref
CurrentTolRel: 5.00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
No OVERCURRENT IEC Normal Inverse 1.30 Iref 0.14 0.95 Non Directional
.
Elements - Residual:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes EARTHFAULT IEC Normal Inverse 0.60 Iref 0.28 0.95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 3.10
Test Start: 07-Dec-2016 10:28:36 Test End: 07-Dec-2016 10:29:00
User Name: Manager:
Company:
Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0.000 A
Load angle: n/a
Prefault time: 100.0 ms
Abs. max time: 240.0 s
Post fault time: 500.0 ms
Rel. max time: 100.0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50.00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L2-E EARTHFAULT 2.000 1.200 A n/a 2.808 s 2.491 s 3.186 s
L2-E EARTHFAULT 3.000 1.800 A n/a 1.765 s 1.604 s 1.945 s
L2-E EARTHFAULT 4.000 2.400 A n/a 1.394 s 1.279 s 1.521 s
L2-E EARTHFAULT 5.000 3.000 A n/a 1.198 s 1.104 s 1.300 s
L2-E EARTHFAULT 6.000 3.600 A n/a 1.074 s 993.1 ms 1.162 s
L2-E EARTHFAULT 7.000 4.200 A n/a 987.8 ms 915.0 ms 1.066 s
L2-E EARTHFAULT 8.000 4.800 A n/a 923.1 ms 856.4 ms 994.3 ms
L2-E EARTHFAULT 9.000 5.400 A n/a 872.6 ms 810.5 ms 938.6 ms
L2-E EARTHFAULT 10.00 6.000 A n/a 831.8 ms 773.4 ms 893.7 ms
.
Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Bin. in 1 1
Bin. in 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L2-E EARTHFAULT 2.000 1.200 A n/a 2.808 s 2.841 s 1.174 % No Passed
L2-E EARTHFAULT 3.000 1.800 A n/a 1.765 s 1.799 s 1.930 % No Passed
L2-E EARTHFAULT 4.000 2.400 A n/a 1.394 s 1.424 s 2.106 % No Passed
L2-E EARTHFAULT 5.000 3.000 A n/a 1.198 s 1.228 s 2.510 % No Passed
L2-E EARTHFAULT 6.000 3.600 A n/a 1.074 s 1.107 s 3.070 % No Passed
L2-E EARTHFAULT 7.000 4.200 A n/a 987.8 ms 1.011 s 2.322 % No Passed
L2-E EARTHFAULT 8.000 4.800 A n/a 923.1 ms 954.2 ms 3.370 % No Passed
L2-E EARTHFAULT 9.000 5.400 A n/a 872.6 ms 906.4 ms 3.876 % No Passed
L2-E EARTHFAULT 10.00 6.000 A n/a 831.8 ms 860.4 ms 3.442 % No Passed
.
State:
9 out of 9 points tested.
9 points passed.
0 points failed.

General Assessment: Test passed!

Pause Module
Instruction Text:
1. NORMALIZE TRIP TESTING CONTACT.

User Input:

Test State: Continue

Pause Module
Instruction Text:
1. INCREASE THE START TIMER TO BE MAXMINUM IN GE
2. ASSINE TRIP TEST CONNACT TO VIRTUAL OUT PUT 10
3. CONNECT TRIP CONTACT FROMRELAY TO BINARY INPUT 2 OF CMC
4. GIVE CLOSE COMMAND

User Input:

Test State: Continue

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 82
Total time per test: 8.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 75.00 V 55.00 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 75.00 V 55.00 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 75.00 V 55.00 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 75.00 V 55.00 V
Sig 1 To 55.00 V 75.00 V
Sig 1 Delta -500.0 mV 500.0 mV
Sig 1 d/dt -5.000 V/s 5.000 V/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 41 41
Ramp Time 4.100s 4.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 13:44:36 Test End: 11-Dec-2016 13:44:40
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 69.85 V 69.50 V 5.000 V 5.000 V -350.0 mV + 23.00 ms
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 69.85 V 70.50 V 5.000 V 5.000 V 650.0 mV + 28.10 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 82
Total time per test: 8.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 55.00 V 75.00 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 55.00 V 75.00 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 55.00 V 75.00 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 55.00 V 75.00 V
Sig 1 To 75.00 V 55.00 V
Sig 1 Delta 500.0 mV -500.0 mV
Sig 1 d/dt 5.000 V/s -5.000 V/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 41 41
Ramp Time 4.100s 4.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 13:44:44 Test End: 11-Dec-2016 13:44:47
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 57.15 V 57.50 V 5.000 V 5.000 V 350.0 mV + 28.30 ms
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 57.15 V 57.00 V 5.000 V 5.000 V -150.0 mV + 27.00 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 82
Total time per test: 8.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Phase
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 63.50 V 63.50 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 63.50 V 63.50 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 63.50 V 63.50 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 20.00 -20.00
Sig 1 To -20.00 20.00
Sig 1 Delta -1.00 1.00
Sig 1 d/dt -10 /s 10 /s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 41 41
Ramp Time 4.100s 4.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 13:44:51 Test End: 11-Dec-2016 13:44:55
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 10.00 9.00 2.00 2.00 -1.00 + 22.10 ms
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 10.00 11.00 2.00 2.00 1.00 + 40.70 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 82
Total time per test: 8.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Phase
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 63.50 V 63.50 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 63.50 V 63.50 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 63.50 V 63.50 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From -20.00 20.00
Sig 1 To 20.00 -20.00
Sig 1 Delta 1.00 -1.00
Sig 1 d/dt 10 /s -10 /s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 41 41
Ramp Time 4.100s 4.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 13:44:59 Test End: 11-Dec-2016 13:45:03
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- -10.00 -9.00 2.00 2.00 1.00 + 28.50 ms
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- -10.00 -12.00 2.00 2.00 -2.00 + 24.70 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed
Test Settings
.
General
No. of ramp states: 2
Total steps per test: 602
Total time per test: 1204.000
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Frequency
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 63.50 V 63.50 V
0.00 0.00
52.000 Hz 49.000 Hz
V Y-N 63.50 V 63.50 V
-120.00 -120.00
52.000 Hz 49.000 Hz
V B-N 63.50 V 63.50 V
120.00 120.00
52.000 Hz 49.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 52.000 Hz 49.000 Hz
Sig 1 To 49.000 Hz 52.000 Hz
Sig 1 Delta -10.000 mHz 10.000 mHz
Sig 1 d/dt -5.000 mHz/s 5.000 mHz/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 2.000 s 2.000 s
Ramp Steps 301 301
Ramp Time 602.000s 602.000s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 13:45:07 Test End: 11-Dec-2016 13:51:50
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 50.050 Hz 50.020 Hz 50.000 mHz 50.000 mHz -30.000 + 1.609 s
N, B-N mHz
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 50.050 Hz 50.030 Hz 50.000 mHz 50.000 mHz -20.000 + 619.2 ms
N, B-N mHz
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 802
Total time per test: 1604.000
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Frequency
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 63.50 V 63.50 V
0.00 0.00
48.000 Hz 52.000 Hz
V Y-N 63.50 V 63.50 V
-120.00 -120.00
48.000 Hz 52.000 Hz
V B-N 63.50 V 63.50 V
120.00 120.00
48.000 Hz 52.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 48.000 Hz 52.000 Hz
Sig 1 To 52.000 Hz 48.000 Hz
Sig 1 Delta 10.000 mHz -10.000 mHz
Sig 1 d/dt 5.000 mHz/s -5.000 mHz/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 2.000 s 2.000 s
Ramp Steps 401 401
Ramp Time 802.000s 802.000s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 13:51:54 Test End: 11-Dec-2016 13:58:36
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 49.950 Hz 49.980 Hz 50.000 mHz 50.000 mHz 30.000 mHz + 1.608 s
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 49.950 Hz 49.970 Hz 50.000 mHz 50.000 mHz 20.000 mHz + 600.0 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. INCREASE THE START TIMER TO BE MAXMINUM IN GE
2. ASSINE TRIP TEST CONNACT TO VIRTUAL OUT PUT 5
3. CONNECT TRIP CONTACT FROMRELAY TO BINARY INPUT 2 OF CMC
4. GIVE CLOSE COMMAND

User Input:

Test State: Continue


Test Settings
.
General
No. of ramp states: 2
Total steps per test: 42
Total time per test: 4.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 45.00 V 55.00 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 45.00 V 55.00 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 45.00 V 55.00 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 0.000 V 0.000 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 45.00 V 55.00 V
Sig 1 To 55.00 V 45.00 V
Sig 1 Delta 500.0 mV -500.0 mV
Sig 1 d/dt 5.000 V/s -5.000 V/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 21 21
Ramp Time 2.100s 2.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 14:03:19 Test End: 11-Dec-2016 14:03:22
User Name: Manager:
Company:
Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 50.80 V 51.00 V 5.000 V 5.000 V 200.0 mV + 29.20 ms
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 50.80 V 50.00 V 5.000 V 5.000 V -800.0 mV + 24.10 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. INCREASE THE START TIMER TO BE MAXMINUM IN GE
2. ASSINE TRIP TEST CONNACT TO VIRTUAL OUT PUT 6
3. CONNECT TRIP CONTACT FROMRELAY TO BINARY INPUT 2 OF CMC
4. GIVE CLOSE COMMAND

User Input:

Test State: Continue

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 236
Total time per test: 23.600
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V R-N, Y-N, B-N / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 63.50 V 5.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 63.50 V 5.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 63.50 V 5.000 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 110.0 V 110.0 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 63.50 V 5.000 V
Sig 1 To 5.000 V 63.50 V
Sig 1 Delta -500.0 mV 500.0 mV
Sig 1 d/dt -5.000 V/s 5.000 V/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 118 118
Ramp Time 11.800s 11.800s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 14:04:01 Test End: 11-Dec-2016 14:04:13
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V R-N, Y- 12.70 V 12.50 V 5.000 V 5.000 V -200.0 mV + 24.50 ms
N, B-N
Drop-off Ramp 2 Bin. in 2 1->0 V R-N, Y- 12.70 V 13.50 V 5.000 V 5.000 V 800.0 mV + 39.40 ms
N, B-N
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 62
Total time per test: 6.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V(2)-1 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 0.000 V 0.000 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 0.000 V 0.000 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 0.000 V 0.000 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 80.00 V 95.00 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 80.00 V 95.00 V
Sig 1 To 95.00 V 80.00 V
Sig 1 Delta 500.0 mV -500.0 mV
Sig 1 d/dt 5.000 V/s -5.000 V/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 31 31
Ramp Time 3.100s 3.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 14:04:24 Test End: 11-Dec-2016 14:04:28
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V(2)-1 88.00 V 88.50 V 5.000 V 5.000 V 500.0 mV + 23.60 ms
Drop-off Ramp 2 Bin. in 2 1->0 V(2)-1 88.00 V 87.00 V 5.000 V 5.000 V -1.000 V + 39.10 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. INCREASE THE START TIMER TO BE MAXMINUM IN GE
2. ASSINE TRIP TEST CONNACT TO VIRTUAL OUT PUT 5
3. CONNECT TRIP CONTACT FROMRELAY TO BINARY INPUT 2 OF CMC
4. GIVE CLOSE COMMAND

User Input:

Test State: Continue

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 102
Total time per test: 10.200
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
V(2)-1 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V R-N 63.50 V 63.50 V
0.00 0.00
50.000 Hz 50.000 Hz
V Y-N 63.50 V 63.50 V
-120.00 -120.00
50.000 Hz 50.000 Hz
V B-N 63.50 V 63.50 V
120.00 120.00
50.000 Hz 50.000 Hz
V(2)-1 40.00 V 15.00 V
30.00 30.00
50.000 Hz 50.000 Hz
Force abs. Phases Yes No
Sig 1 From 40.00 V 15.00 V
Sig 1 To 15.00 V 40.00 V
Sig 1 Delta -500.0 mV 500.0 mV
Sig 1 d/dt -5.000 V/s 5.000 V/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 51 51
Ramp Time 5.100s 5.100s
Trigger Bin Bin
Trigger Logic OR OR
Bin. in 1 X X
Bin. in 2 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.10
Test Start: 11-Dec-2016 14:05:33 Test End: 11-Dec-2016 14:05:39
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Bin. in 2 0->1 V(2)-1 22.00 V 22.00 V 5.000 V 5.000 V 0.000 V + 28.10 ms
Drop-off Ramp 2 Bin. in 2 1->0 V(2)-1 22.00 V 23.50 V 5.000 V 5.000 V 1.500 V + 21.30 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed

Pause Module
Instruction Text:
1. NORMALIZE THE START TIMER TO 30 SEC IN GE
2. NORMALIZE TRIP TEST CONTACT
User Input:

Test State: Continue