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  • Sathyabama University Centre for Nanoscience & Nanotechnology Requisition Form

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    madhu77
    7 tayangan1 halaman
    This document is a requisition form for various characterization techniques at the Centre for Nanoscience and Nanotechnology at Sathyabama University. It requests information from users such as name, designation, department, university/institution, contact details, type and number of samples, deposition methods required if applicable, and payment details. Notes provide guidelines for sample quantity, size, thickness, and surface quality for different techniques like XRD, AFM, FESEM. Users are requested to acknowledge the center in any publications using the characterization facilities.

    Deskripsi Asli:

    consultancy

    Judul Asli

    Consultancy Form 2015

    Hak Cipta

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    This document is a requisition form for various characterization techniques at the Centre for Nanoscience and Nanotechnology at Sathyabama University. It requests information from users such as name, designation, department, university/institution, contact details, type and number of samples, deposition methods required if applicable, and payment details. Notes provide guidelines for sample quantity, size, thickness, and surface quality for different techniques like XRD, AFM, FESEM. Users are requested to acknowledge the center in any publications using the characterization facilities.

    Hak Cipta:

    © All Rights Reserved
    Unduh sebagai DOC, PDF, TXT atau baca online dari Scribd
    Tandai sebagai konten tidak pantas
    7 tayangan1 halaman

    Sathyabama University Centre for Nanoscience & Nanotechnology Requisition Form

    Diunggah oleh

    madhu77
    This document is a requisition form for various characterization techniques at the Centre for Nanoscience and Nanotechnology at Sathyabama University. It requests information from users such as name, designation, department, university/institution, contact details, type and number of samples, deposition methods required if applicable, and payment details. Notes provide guidelines for sample quantity, size, thickness, and surface quality for different techniques like XRD, AFM, FESEM. Users are requested to acknowledge the center in any publications using the characterization facilities.

    Hak Cipta:

    © All Rights Reserved
    Unduh sebagai DOC, PDF, TXT atau baca online dari Scribd
    Tandai sebagai konten tidak pantas
    dari 1

    SATHYABAMA UNIVERSITY

    Centre for Nanoscience & Nanotechnology


    Requisition form for XRD/AFM/FESEM/EDAX/Ball milling/ UV-Vis Spec./Optical/ Inverted/Co-relative/
    Epifluorescence Microscopy/Thin film deposition methods/High Temp. Furnace/Cutting/Polishing/Pelletizer

    Name : Date:

    Designation :

    Department :

    Name of University/Institution/Industries :

    Email ID & Contact Number :

    Type of Analysis :

    Number of Samples : (Returnable/Non Returnable)

    Details of samples (Foil/Film/Powder/Crystal) :


    (if hazardous, please indicate the precautions)
    Deposition Methods Required (For thin film deposition only): (Thermal/EB-PVD/PLD & DC/RF Sputtering)

    XRD Samples (Mention 2 range & Temperature) :

    Total Amount :

    Payment Mode : DD/Cash

    If DD, Name of the Bank/ DD number & Date :

    Signature of the Guide/Head Signature of the User


    Note: Please bring previous literatures, if available,
    For powder samples : Quantity should be 0.5 g (minimum) for XRD and FESEM
    For AFM samples : Sample surface should be flat
    For thickness : Total sample thickness should below 3 mm for all analysis
    Size : Should below 11 cm2 for AFM and FESEM analysis
    The user may acknowledge Centre for Nanoscience and Nanotechnology, Sathyabama University,
    Chennai for any kind of publications.

    FOR OFFICE USE


    Name of the Operator: Date Completed:
    Signature of the Operator:..
    Bill No. :
    Forwarded by:

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