Anda di halaman 1dari 2

Test Settings

.
General
No. of ramp states: 2
Total steps per test: 42
Total time per test: 4.200 s
No. of test executions: 1

Input Mode: Direct


Fault Type:

Ramped Quantities
I L1 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V L1-E 69.28 V 69.28 V
0.00 0.00
60.000 Hz 60.000 Hz
V L2-E 69.28 V 69.28 V
-120.00 -120.00
60.000 Hz 60.000 Hz
V L3-E 69.28 V 69.28 V
120.00 120.00
60.000 Hz 60.000 Hz
I L1 4.000 A 5.000 A
0.00 0.00
60.000 Hz 60.000 Hz
I L2 0.000 A 0.000 A
-120.00 -120.00
60.000 Hz 60.000 Hz
I L3 0.000 A 0.000 A
120.00 120.00
60.000 Hz 60.000 Hz
Force abs. Phases Yes No
Sig 1 From 4.000 A 5.000 A
Sig 1 To 5.000 A 4.000 A
Sig 1 Delta 50.00 mA -50.00 mA
Sig 1 d/dt 500.0 mA/s -500.0 mA/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100.0 ms 100.0 ms
Ramp Steps 21 21
Ramp Time 2.100s 2.100s
Trigger Bin Bin
Trigger Logic OR OR
Trip X X
Start 1 0
Step back No No
Delay Time 0.000 s 0.000 s

. .
Test Module
Name: OMICRON Ramping Version: 3.00 SR 2
Test Start: 03-Dec-2017 17:08:34 Test End: 03-Dec-2017 17:08:36
User Name: Manager:
Company:
Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Start 0->1 I L1 4.750 A 4.800 A 50.00 mA 50.00 mA 50.00 mA + 87.36 ms
Drop-off Ramp 2 Start 1->0 I L1 4.500 A 4.500 A 50.00 mA 50.00 mA 0.000 A + 7.728 ms
Assess: + .. Passed x .. Failed o .. Not assessed
.

.
Test State:
Test passed
Test performed offline: Test results are simulated!

Anda mungkin juga menyukai