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ATOMIC EMISSION SPECTROSCOPY

ATOMIC EMISSION
- Technique is also known as
OPTICAL EMISSION SPECTROSCOPY (OES)

- The study of radiation emitted by excited atoms and


monatomic ions

- Relaxation of atoms in the excited state results in


emission of light

- Produces line spectra in the UV-VIS and the


vacuum UV regions
ATOMIC EMISSION

- Used for qualitative identification of elements present


in the sample

- Also for quantitative analysis from ppm levels to percent

- Multielement technique

- Can be used to determine metals, metalloids, and some


nonmetals simultaneously

Emission wavelength and energy are related by


ΔE = hc/λ
ATOMIC EMISSION
- Does not require light source

- Excited atoms in the flame emit light that reaches the


detector
(luminescence)

Techniques Based on Excitation Source


- Flame Photometry (flame OES)
- Furnace (Electrical Excitation)
- Inductively Coupled Plasma (ICP)
 Arc  Flame
 Higher Temperature
 Simpler, less expensive
 Lower interelement
interference instrumentation
 Single set of excitation  Lower operating costs
conditions can excite
multiple elements
 Greater reproducibility
 Permit low detection limits
for refractory complexes
 Larger linear range
 Can directly measure hard to
measure samples
FLAME ATOMIC EMISSION SPECTROSCOPY

- Known as Flame OES

- Also called flame photometry

- Solutions containing metals (or some nonmetals) are


introduced into a flame

- Very useful for elements in groups 1A and 2A


INSTRUMENTATION OF FLAME OES
- No external lamp is needed

- Flame serves as both the atomization source and the


excitation source

Main Components
- Burner assembly
- Flame
- Wavelength selection device
- Detector
INSTRUMENTATION OF FLAME OES
Burner Assembly

- The most commonly used is the Lundegarth or the premix burner

- Is the heart of the emission spectrometer

- Nebulizer introduces sample aerosol into the base of the flame

- Free atoms are formed and excited in flame

- Excited free atoms emit radiant energy

- Only about 5% of the aspirated sample reach the flame


INSTRUMENTATION OF FLAME OES
General Process in Flame

- Liquid samples enter nebulizer


- Sample droplets of liquid enter flame
- Fine solid particles form
- Particles decompose to free atoms
- Excited atoms form
- Excited atoms relax and emit radiation
- Oxidation of atoms occur
INSTRUMENTATION OF FLAME OES
Wavelength Selection Device

Monochromators
- Diffraction grating is used as the dispersion element

Filters
- Good for detection of alkali metals due to simple spectrum
- Material is transparent over a narrow spectral range
- Desired radiation passes through filter and others are absorbed
- One element is determined at a time (single channel)
INSTRUMENTATION OF FLAME OES
Wavelength Selection Device

Multichannel Flame Photometers


- Two or more filters are used simultaneously

- Each filter transmits its designated radiation

- Detector is PMT

- Permits the use of internal standard calibration


INSTRUMENTATION OF FLAME OES
Flame Excitation Source

- Two gases (fuel and oxidant) are used

- Oxidant: air or nitrous oxide

- Fuel: acetylene (commonly used), propane, butane, natural gas

- Increase in flame temperature increases emission intensity


of most elements (exception: Na, K, Li)

- Maxwell-Boltzmann equation applies (see chapter 6)


INSTRUMENTATION OF FLAME OES
- Each element emits different characteristic wavelength of light

- Emission lines are characterized by wavelength and intensity

Emission intensity depends on


- Analyte element concentration in sample
- Rate of formation of excited atoms in flame
- Rate of introduction of sample into flame
- Flame composition
- Flame temperature
INSTRUMENTATION OF FLAME OES
S = kN

S = intensity
k = proportionality constant
N = number of atoms in the excited state

- Increasing temperature increases N

- Atomic emission spectrometry is very sensitive to temperature

- Temperature must be carefully controlled for quantitative analysis


INSTRUMENTATION OF FLAME OES
- Elements with emission lines at shorter wavelengths give weak
emission intensity at low temperature

- High-temperature nitrous oxide-acetylene flame is used for


such elements

- High-energy electrical or plasma excitation sources may


also be used

- Ratio of fuel to oxidant also affects emission intensity

- The highest temperature is achieved when stoichiometric


mixture is used
INTERFERENCE

Two Classes

- Spectral interference

and

- Nonspectral interference
INTERFERENCE
Spectral Interference

Two types

Background Radiation
- Broad band emission by excited molecules and radicals in flame

Overlapping emission lines


- Emission by different elements of the same wavelength as
the analyte element
INTERFERENCE
Nonspectral Interference

Chemical Interference
- Occurs if anions that combine strongly with analyte element
are present in sample

Excitation Interference
- Result of collisions between unexcited atoms of an element with
excited atoms of a different element in sample

Ionization Interference
- Occurs when atoms ionize in flame and cannot emit atomic λs
APPLICATIONS OF FLAME OES
- For measurement of alkali metals in clinical samples such as
serum and urine

- Excellent method for qualitative determination of multiple


elements in sample

- Characteristic emission lines of analyte are compared


with literature (appendix 7.1)

- Also used for quantitative analysis (application of Beer’s Law)

- Deviation from linearity is generally observed at


high concentrations
APPLICATIONS OF FLAME OES
- More free atoms are liberated in organic solvents than
in aqueous solutions

- Implies emission intensity is relatively higher in


nonaqueous solutions

- Atomization is exothermic and rapid in organic solvents

- Atomization is endothermic and relatively slow in aqueous


solutions

- External calibrations and standard addition methods are used


ATOMIC OPTICAL EMISSION SPECTROSCOPY
- Excitation and emission with the aid of electrical discharge,
glow discharge, or plasma excitation source

- Higher energy excitation sources than the flame source

- All metals, metalloids, and some nonmetals can be detected


at low concentrations

- Electrical and glow discharge sources are used for solids only

- Plasma source is used for liquids and solids

- Electrical source can be used for gases in a sealed quartz tube


ATOMIC OPTICAL EMISSION SPECTROSCOPY

Two Types of Line Spectra

- Atomic emission spectra from neutral atoms


(designated with I in tables of emission lines)

- Emission lines from ions (ion lines)


(lines from singly charged ions are designated II)
(lines from doubly charged ions are designated III)
FURNACE (ELECTRICAL) EXCITATION

- Produces electrical discharge between two electrodes


(the sample electrode and the counter electrode)

- A piece of metal analyte is the sample electrode

- Counter electrode is an inert electrode (tungsten or graphite)

Examples of Sources
- DC arc
- AC arc
- AC spark
FURNACE (ELECTRICAL) EXCITATION
- DC is primarily used for qualitative analysis of solids

- Spark source makes use of a switch, a capacitor, an inductor,


and a resistor

- Temperature is higher in spark than in DC arc

- More complex spectra in spark than in DC but more reproducible

- Spark is better for quantitative analysis

- Spark is used for precision and arc is used for sensitivity


FURNACE (ELECTRICAL) EXCITATION
Solid Sample Holders

- High purity carbon electrodes

- Well drilled in one end to hold powdered solid samples

- Powdered sample may be mixed with alumina or silica


(improves precision)

- Metallic samples in the form of rod or wire may be used


directly as one of the electrodes
FURNACE (ELECTRICAL) EXCITATION

Liquid Sample Holders

- Liquid samples are analyzed directly using rotating


disk electrodes

- This method is used for the determination of metals in


lubricating and fuel oils
FURNACE (ELECTRICAL) EXCITATION
- Spectrometers are multichannel

Three Types

Spectrographs
- Uses photographic film or plate to detect and record
emitted radiation

Polychromators
- Multichannel with PMTs as detectors

Array-Based Systems (Electronic Spectrographs)


- Radiation intensity is measured by PMT or array detectors
INTERFERENCE IN ARC & SPARK

- Limited to analysis of solids of trace elements

Matrix Effect
- Emission intensity of trace elements is greatly affected
by the matrix

Spectral Interference
- Two types
- Background interference and line overlap

- Background is due to thermal radiation, molecular emission,


and polyatomic species
APPLICATIONS OF ARC & SPARK

- Qualitative identification of elements

- Also used for quantitative analysis


PLASMA EMISSION SPECTROSCOPY

Plasma

- State of matter that contains electrons, ions, neutral species,


and radicals

- Highly energetic ionized gas

- Electrically conductive

- Affected by a magnetic field


PLASMA EMISSION SPECTROSCOPY

Excitation Sources

- Inductively Coupled Plasma (ICP) – operates at radiofrequency

- Direct Current Plasma (DCP)

- Helium Microwave Induced Plasma (MIP)

- Temperature in plasma excitation source is between


6500 K and 10000 K
PLASMA EMISSION SPECTROSCOPY

Dispersion Devices

Sequential spectrometer systems


- One wavelength is measured at a time

Simultaneous systems
- Contains either a polychromator or an Echelle spectrometer
- Measures multiple wavelengths at the same time

Combination systems
- Consists of both polychromators and monochromators
INTERFERENCE IN PLASMA EMISSION
Spectral Interference
- Much more common in plasma than in flame

Nonspectral Interference

Chemical Interference
- Rare in plasma emission due to efficiency of atomization

Ionization Interference
- Results in suppression and enhancement of signals from
easily ionized elements (EIE: alkali metals)
APPLICATIONS OF PLASMA EMISSION

- For analysis of environmental samples, geological samples,


clinical samples

- For characterization of metal alloys, glasses, ceramics,


polymers, oils

- For food and nutrition

- Forensics
HYPHENATED METHODS

ICP-MS

HPLC-ICP

GC-MIP
GLOW DISCHRGE EMISSION SPECTROSCOPY

Glow Discharge (GD)


- Reduced-pressure gas discharge generated between
two electrodes

- Tube is filled with inert gas (Ar)

Excitation Source
- DC GD
- RF GD
ATOMIC FLUORESCENCE SPECTROMETRY (AFS)

- Involves emission of a photon from a gas phase atom that has


been excited by the absorption of a photon

- Different from the excitation by thermal or electrical means

Interferences
- Chemical interference
- Spectral interference
Comparison of Plasma to Flame
Emission Sources
 Plasma sources offer significantly better quantitative
data than do other flame emission sources
- High stability
- Low noise
- Low background
- Freedom from interferences
Comparison between Atomic Absorption
& Emission Techniques
AAS AES
Instruments Requires HC lamp for each Flame/ sample is source
element Requires high quality MC
No high quality MC required
Operator Skill
Bkgd.Correction
Prec. &
Accuracy
Interferences

Detection limit
Comparison between Atomic Absorption
& Emission Techniques
AAS AES
Instruments Requires HC lamp for each Flame/ sample is source
element Requires high quality MC
No high quality MC required
Operator Skill Lower skill Higher skill
Bkgd.Correction
Prec. &
Accuracy
Interferences

Detection limit
Comparison between Atomic Absorption
& Emission Techniques
AAS AES
Instruments Requires HC lamp for each Flame/ sample is source
element Requires high quality MC
No high quality MC required
Operator Skill Lower skill Higher skill
Bkgd.Correction Harder to do Easier to do
Prec. &
Accuracy
Interferences

Detection limit
Comparison between Atomic Absorption
& Emission Techniques
AAS AES
Instruments Requires HC lamp for each Flame/ sample is source
element Requires high quality MC
No high quality MC required
Operator Skill Lower skill Higher skill
Bkgd.Correction Harder to do Easier to do
Prec. & Unskilled better Unskilled worse
Accuracy Same for skilled 
Interferences

Detection limit
Comparison between Atomic Absorption
& Emission Techniques
AAS AES
Instruments Requires HC lamp for each Flame/ sample is source
element Requires high quality MC
No high quality MC required
Operator Skill Lower skill Higher skill
Bkgd.Correction Harder to do Easier to do
Prec. & Unskilled better Unskilled worse
Accuracy Same for skilled 
Interferences Spectral interferences corrected Chemical interferences
in AES on AE (flame) bad,
plasma eliminated
Detection limit
Comparison between Atomic Absorption
& Emission Techniques
AAS AES
Instruments Requires HC lamp for each Flame/ sample is source
element Requires high quality MC
No high quality MC required
Operator Skill Lower skill Higher skill
Bkgd.Correction Harder to do Easier to do
Prec. & Unskilled better Unskilled worse
Accuracy Same for skilled 
Interferences Spectral interferences corrected Chemical interferences
in AES on AE (flame) bad,
plasma eliminated
Detection limit Flame some metals better on Plasma comparable to
AA than AES flame for some metals,
other metals plasma
better
Comparison of Metal Spectroscopic
Techniques
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES

Dynamic limited limited wide wide Wide


range

Qualitative
analysis

Elemental
range

Trace
analysis
Comparison of Metal Spectroscopic
Techniques
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES

Dynamic limited limited wide wide Wide


range

Qualitative poor poor excellent excellent excellent


analysis

Elemental
range

Trace
analysis
Comparison of Metal Spectroscopic
Techniques
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES

Dynamic limited limited wide wide Wide


range

Qualitative poor poor excellent excellent excellent


analysis

Elemental excellent excellent excellent excellent excellent


range

Trace
analysis
Comparison of Metal Spectroscopic
Techniques
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES

Dynamic limited limited wide wide Wide


range

Qualitative poor poor excellent excellent excellent


analysis

Elemental excellent excellent excellent excellent excellent


range

Trace excellent excellent excellent excellent excellent


analysis
Comparison of Metal Spectroscopic
Techniques
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES

Dynamic limited limited wide wide Wide


range

Qualitative poor poor excellent excellent excellent


analysis

Elemental excellent excellent excellent excellent excellent


range

Trace excellent excellent excellent excellent excellent


analysis
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Matrix high high high low low
interfernces
Spectral
Interferences
Precision &
Accuracy

Costs
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Matrix high high high low low
interfernces
Spectral low low low moderate high
Interferences
Precision &
Accuracy

Costs
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Matrix high high high low low
interfernces
Spectral low low low moderate high
Interferences
Precision & Better Worse
Accuracy for for
unskilled unskilled
Same same
skilled skilled
Costs
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Matrix high high high low low
interfernces
Spectral low low low moderate high
Interferences
Precision & Better Worse
Accuracy for for
unskilled unskilled
Same same
skilled skilled
Costs $$ $$$ $ $$$ $$$$
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Costs
Instrumentat low low low moderate high
ion
Maintenance

Sample
Preparation
Operator
skill
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Costs
Instrumentat low low low moderate high
ion
Maintenance low low low moderate high

Sample
Preparation
Operator
skill
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Costs
Instrumentat low low low moderate high
ion
Maintenance low low low moderate high

Sample moderate moderate low moderate moderate


Preparation
Operator
skill
Comparison of Metal Spectroscopic
Techniques continued
Performance Flame Electrothermal Flame DCP ICP
Criteria AA Sampling AES
Costs
Instrumentat low low low moderate high
ion
Maintenance low low low moderate high

Sample moderate moderate low moderate moderate


Preparation
Operator lower higher higher higher higher
skill

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