(tile-shaped) are clamped and is suited for all planar sample was enlarged due to its dispersive behaviour. Compared to
sizes. This way, the dimensions of the center conductor are the data given by the supplier, we observe that our samples
defined by the sample size (see [4] for details), and allow a show the maximum µ′ at a lower frequency (about 80 MHz)
non-destructive measurement of s-parameters with a vector and also that we measure a higher µ′. Fig. 4 shows results
network analyzer (VNA). This sample holder is currently 50 25.
Μ''
Μ'
boundaries ideally all around the samples to avoid HOM 20 10.
¶''
¶'
8 1.5
the center conductor. Note that radial air gaps can be cor- 7 1.
6 0.5
Center Conductor
5 0.
Acrylic 10 20 50 100 200 500 1000 2000
Glass Walls Ground planes freq@MHzD
with textbook Fig. 5 shows the complex µ from the tiles’ measurements
p formulae. The input impedance has to be mul-
tiplied by µr /ε r when the sample holder is loaded with ma- (solid line, (red)) compared to coaxial line measurements
√
terial and the propagation constant then reads k1 = k0 µr ε r .
By evaluating Eqs. (3) with k1 , the material parameters yield 50
0A
40
Z1 k 1 1 − R Z0 k 1 1 + R 30
εr = , and µr = . (4)
m'
Z0 k 0 1 + R Z1 k 0 1 − R 20
80 A
10
240 A
This way, unmodified material tiles can be used and machin- 0
ing of the ferrite can be avoided. 1 2 5 10 20 50 100
0A
20
MEASUREMENT RESULTS 15
m''
10
Reflection Measurements
5 80 A
Reflection measurements were carried out with a shorted 0
coaxial line to obtain material data for certain frequency 1 2 5 10 20 50 100
freq•@MHzD
ranges as input for simulation programs. Fig. 3 shows the
absorber material 4E2 from Ferroxcube for frequency ranges Figure 4: Measurements taken on G-510 in magnetic bias
of 10 MHz to 1 GHz and 2 GHz. The frequency range for ε r fields, showing the influence of different sample sizes.
ISBN 978-3-95450-132-8 07 Accelerator Technology Main Systems
3894 T06 Room Temperature RF
Proceedings of IPAC2014, Dresden, Germany THPRI054
taken by the supplier (dashed line, (blue)) and with our coax- the center conductor. Results from chamfered samples show
ial line set-up (dotted line, (black)). For completeness, Fig. 6 that chamfers make µr appear lower than it is (see Fig. 7).
gives the measured real part of the relative permittivity show-
ing a decrease of ε ′ with increasing frequency. Note that the 150
Μ'
agreement of the measurements with the supplier’s data, we 50
used the method on different absorbers of various sample
sizes as ingoing material tests. These measurements of the 0
1 5 10 50 100 5001000
80
200 70
60
150 50
Μ''
Μ'
40
100 30
50 20
10
0
1 5 10 50 100 500 1000 1 5 10 50 100 500 1000
freq@MHzD
100
80 Figure 8: Permeability measured on two different samples af-
ter heat treatment ((dashed, blue) and (dotted, black) graphs)
Μ''
60
40 compared to new (reference) data (solid, red).
20
150
effective Μ'
60.
We present a measurement method for em-parameters
Μ''
Μ'
100 40.
of ferrite tiles that avoids machining of the samples and
50 20. thus is suited e.g. for acceptance tests or for other quality
effective Μ''
1 5 10 50 100 500 1000
assurance purposes. The measurements were compared to
freq @MHzD 1-port measurements, as well as transmission and resonant
Figure 7: Influence of air gap on permeability due to chamfer- perturbation methods and show a very good agreement.
ing (solid), compared with un-chamfered samples (dashed).
REFERENCES
we measured the em-properties of absorber samples that un- [1] Baker-Jarvis, J., NIST-publication, no. 1355, 1990.
derwent an extended heat-treatment [6] at CERN consisting [2] Eberhardt, J. et. al., these proceedings.
of heating the samples for several hours to 1000 deg C in [3] Waldron, R. A., IEE, Monogr. 373 E, 1960.
vacuum before installing them in the accelerators. It was [4] Vollinger, C. et al., publication in process.
therefore not an option to cut the samples into any sample
[5] Barry, W., IEEE Trans. MTT-34, 1986.
holder’s shape. These samples are chamfered at all corners
[6] Aberle, O., CERN internal publication.
introducing a notable air gap when they are clamped around
07 Accelerator Technology Main Systems ISBN 978-3-95450-132-8
T06 Room Temperature RF 3895