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A New Transparent Conductor: Silver Nanowire Film


Buried at the Surface of a Transparent Polymer
By Xiao-Yan Zeng, Qi-Kai Zhang, Rong-Min Yu, and Can-Zhong Lu*

With the emergence of flexible plastic devices and the scarcity (Figure 1a). Unlike the highly coarse and porous AgNW film
of indium resources, great efforts have been made to develop on PET, a solid and smooth conductive surface was obtained
new flexible transparent conductors to replace indium tin oxide by burying the AgNW film at the surface of the PVA matrix. As
(ITO),[1,2] examples including conductive polymers,[3,4] carbon revealed by atomic force microscopy (AFM) (Figure 1b and c),
nanotubes (CNTs),[5–8] graphene,[9] metal grids,[10] and random the surface of AgNW–PVA film was composed of conductive
networks of metallic nanowires.[11,12] Among these contenders, AgNWs and insulating PVA, and the surface roughness (rms)
random silver nanowire (AgNW) networks show optoelectronic was significantly reduced from 30–100 nm (AgNWs on PET)
performances very close to that of ITO[11,13] and are regarded to 1–5 nm. Clearly, the unique structure of AgNW–PVA film
as the leading candidate material to replace ITO[14] (Table 1S is distinct from the previously reported Ag–PVA nanocompos-
in Supporting Information). There are two critical issues that ites composited in bulk phase,[20] or transparent CNT films on
currently prohibit AgNW films from large scale applications: PET[18,21] in which nanotubes are deposited on a preformed
AgNW films deposited on bare substrates are highly coarse[12] substrate.
and can be easily removed by adhesion or friction.[11] In this Unlike the low transparency and poor electric conductivity
work, both of these critical issues were resolved by burying of PVA–AgNW bulk composites,[24] high transparency and
the AgNW network just below the surface of a transparent low sheet resistance (Rs) were retained in AgNW–PVA films.
polymer matrix (such as polyvinyl alcohol, PVA) to form a trans- As shown in Figure 1d, except for the broad surface plasmon
parent surface conducting film. As a first demonstration of this resonance bands[25] in UV region, near-neutral color and high
method, PVA was selected as the matrix because of its high transparency are achieved across a wide range of the visual and
optical transparency. Compared with a AgNW film on a bare near-infrared spectrum. The latter merit is of special impor-
substrate,[11,12] overall improvements were observed in terms of tance in flexible thin film tandem solar cells, in which NIR
electrical conduction, surface roughness, mechanical resistance, photons need to be harvested effectively. It is notable that the
chemical robustness, and thermal stability. The potential of Rs of the AgNW–PVA film is about 10%–30% smaller than that
AgNW transparent electrodes for flexible devices was evaluated of AgNW film on bare PET prior to the coating of PVA solution
by depositing simple organic light-emitting devices (OLEDs) on (Figure 1e). The reduced Rs values verify the reduced contact
the AgNW electrodes; these devices showed higher power effi- resistance between the AgNWs, brought about by the tremen-
ciency than with conventional ITO electrodes. We believe that dous reduction in thickness when PVA is dried (about 92% for
the method might boost large-scale applications of AgNW films 10 wt% PVA solution). For the AgNW–PVA film produced with
in flexible optoelectronic devices. a deposition density of 32 mg/m2, the optical transmission at
AgNWs with an average length of 5.4 μm and average 550 nm is 88.0% with Rs around 182 Ω, whereas at a depo-
diameter of 49 nm (Figure 1S in the Supporting Information) sition density of 47.7 mg/m2 a transparent conducting film
were fabricated using an air-assisted polyol method.[15,16] The with an optical transmission of 87.5% (at 550 nm) and Rs of
wet-chemical fabrication of AgNW–PVA films is illustrated in 63 Ω was obtained, which is very close to the optoelectronic
Scheme 1S in the Supporting Information. Firstly, a uniform requirements for touch screen panels.[26] In Figure 1f, we fur-
AgNW network was deposited on a poly(ethylene terephtha- ther compare the optoelectronic performances of the AgNW–
late) (PET) substrate by vacuum filtration and transfer.[7,17–19] PVA film with its competitors, including ITO on PET, CNTs,
Then, an aqueous solution of PVA (10 wt%) was cast or spin- and poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)
coated over the AgNW network, during which process the PVA (PEDOT:PSS). The AgNW–PVA film is more conductive than
solution infiltrated through the pores and reached the surface the others, although the performances still lag behind those
of PET to form a smooth PVA/PET interface. After drying at of previously reported AgNW films on PET since the intrinsic
80 °C for 1 h and and 100 °C for 1 h, the dried PVA matrix electric resistance of AgNWs (average diameter 49 nm) is at
together with all AgNWs was peeled off the PET surface least 3 times of that of the AgNWs used previously[11] (average
diameter 84 nm).
The more important advantage of burying the AgNW film
[∗] X.-Y. Zeng, Q.-K. Zhang, R.-M. Yu, Prof. C.-Z. Lu at the surface of the PVA matrix is the excellent mechanical
The State Key Laboratory of Structural Chemistry robustness against adhesion, friction, and bending. In spite
Fujian Institute of Research on the Structure of Matter of the demonstrated robustness when an AgNW film depos-
Chinese Academy of Sciences ited on PET was bent to a curvature of 2.5 mm,[11] such
Fuzhou, Fujian Province, 350002 (PR China)
E-mail: czlu@fjirsm.ac.cn films cannot be adhered, wiped (seen in insert in Figure 2a)
or folded over. After being buried at the surface of PVA, the
DOI: 10.1002/adma.201001811 intrinsically fragile network becomes mechanically robust,

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Figure 1. (a) Photograph of an AgNW–PVA film. Morphology images (tapping-AFM, 10 × 10 μm), section curves and roughness of AgNWs on bare PET
(b) and AgNW–PVA film (c) at deposition densities of 48 mg/m2 and 32 mg/m2, respectively. UV-Vis-NIR transmission spectra (d) and sheet resist-
ance (e) of AgNW–PVA film at different deposition densities. (f) Transmission (at 550 nm) and Rs values of AgNW–PVA films and typical transparent
conductors, including ITO on PET,[22] SWNT (Invisicon, Eikos),[21] PEDOT:PSS,[23] and AgNW film on PET reported by De and co-workers.[11]

since all the AgNWs are firmly anchored by the PVA matrix. comparable to that of PEDOT:PSS, CNT[28] and graphene[9,29]
As shown in Figure 2a, at all deposition densities, no obvious films.
increase in Rs was observed after a standard tape test or after We further tested the thermal and chemical stability of
being wiped over by finger, paper, or cloth. We further tested AgNW–PVA electrodes (Rs = 63 Ω, 3 mm × 30 mm). As shown
the change in electrical resistance when AgNW–PVA elec- in Figure 2c, electric resistance increased linearly up to 240 °C
trodes (Rs = 63 Ω, 3 mm × 30 mm) were totally folded to a with a thermal coefficient of (7.9 ± 0.3) × 10−3 Ω/K, which prob-
curvature of 100–200 μm (Figure 2b). An inorganic film of Al- ably originates from thermal expansion of polymer matrix.
doped ZnO (AZO) was deposited on polyimide tape (3 mm × From 240 °C to 290 °C, the gradual decrease in R indicates
30 mm) as a comparison. It is unsurprising that the AZO the fusing together of the contacts between the AgNWs.[12] The
film cracked and resistance increased by a factor of 10 after AgNW network is thermally stable at 330 °C, after which oxida-
10 cycles of tensile folding or 2 cycles of compressive folding. tion leads to an exponential increase in R. As a comparison, it
For the AgNW–PVA film (thickness 130 μm), the resistance was reported that an obvious rise in R occurred if AgNW films
increase was only 2–3 times, even after 250 cycles of tensile on Si were annealed in air at 200 °C for 1 h.[12] The burying of
or compressive folding. The rise in resistance originates from the AgNWs at the surface of PVA can also effectively protect
failed electrical contacts between AgNWs.[27] This result is them from chemical attack by corrosive liquids, such as sulfu-
superior to that of ITO film coated on PET substrate,[26] and ration. As seen in Figure 2d, under the attack of aqueous Na2S

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Figure 2. (a) The variation of Rs values of AgNW–PVA films after tape test using 3M Scotch tape. The insert photos are AgNWs film on PET destroyed
by finger friction and tape adhesion. (b) The increase in resistance after cycles of folding up. 140 nm thick AZO film RF-sputtered on 48 μm thick poly-
imide film (Kapton) was also tested as a comparison. (c) The evolution of resistance as increasing temperature (5 °C/min) in air. (d) Electric resistance
vs. time relationship of AgNW–PVA electrode under the attack of aqueous Na2S solution.

solution (5 wt%) remarkable sulfuration occurred at 3–4 s for forward bias. When comparing the power efficiency of these
an unprotected AgNW film, whereas this time was prolonged OLED devices, it was astonishing that D2, the AgNW-based
up to 59 s for AgNW–PVA film. OLED device with PEDOT:PSS layer of 67 nm, shows a higher
As discussed above, AgNW–PVA film could be one of the power efficiency than that of the ITO-based OLED device at
most promising substitutes for ITO in low-cost plastic devices. current density <140 mA/cm2. It reaches 2.43 lm/W at current
Lee and co-workers have demonstrated the successful use of a density of 45.8 mA/cm2 (brightness of 1112 cd/m2). For the
AgNW electrode in organic solar cells.[12] Here, we examined ITO-based device, the highest power efficiency is 1.62 lm/W
the potential of AgNW–PVA films for applications by vacuum at current density of 277.2 mA/cm2. As for the D1 device with
depositing simple OLED devices (Figure 3a) on AgNW–PVA a PEDOT:PSS layer of 53 nm, the power efficiency is very low
electrodes: AgNW/PEDOT:PSS/NPB/Alq3/LiF/Al, in which due to large leakage current.
the PEDOT:PSS layer was used as the smooth layer and to There are at least two reasons for the higher power efficiency
adjust the work function of the anode. An OLED device was of the AgNW-based OLED device. Firstly, the AgNW film is
also deposited on commercially obtained ITO under the same composed of conductive AgNWs and an insulating surface of
conditions and used as a reference. The results are shown in PVA, so the current density on the AgNWs is higher than that
Figure 3b–d and Figure 6S in Supporting Information. upon PVA. Local current density around the AgNWs may be
As shown in Figure 3b, an OLED built on the AgNW elec- high enough to drive the local light-emitting layer into a highly
trode with a thick PEDOT:PSS layer (D2, 67 nm) was more efficient mode when the measured average current density is
luminous than one with a thin layer of PEDOT:PSS (D1, 53 nm). still very low. Secondly, the light extraction efficiency may be
But both AgNWs based OLED devices were less luminous improved due to light scattering by AgNWs.[12] At higher cur-
than that deposited on ITO (DR). The OLED turn-on voltage rent densities (>128 mA/cm2) the OLED device degrades due to
(defined at 1 cd/m2) was 3.6 V, 6.9 V, and 6.6 V for DR, D1, the failure of local organic layers. Thus the AgNW-based OLED
and D2 devices, respectively. At a forward bias >6 V, the current devices are more suitable to being operated at low current den-
density follows a DR > D1 > D2 order and thicker PEDOT:PSS sities. Undoubtedly, the performances will be further improved
leads to smaller current due to the poor conductivity of the after the optimization of OLED structure and materials.
PEDOT:PSS layer used here, whereas at smaller bias (3–5 V) In conclusion, we have demonstrated that a flexible trans-
remarkable leakage current was observed in D1. Evidently, parent conducting film of AgNWs with superior mechanical,
thicker PEDOT:PSS layer can more effectively cover “bad” spots thermal, and chemical robustness and ultralow surface rough-
and reduce leakage current. Removal of the PEDOT:PSS layer ness can be fabricated by burying a AgNW film at the surface
leads to a short-circuit of AgNW-based device even at small of a transparent PVA matrix. It is feasible to bury the nanowire

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Figure 3. (a) OLED device structure based on ITO and AgNWs–PVA electrodes with the pixel size of 3 × 3 mm2. (b) Brightness and (c) current density
vs applied forward bias for OLED devices deposited on ITO (DR) and AgNW–PVA electrode (D1 and D2). The photo of turned-on D2 is shown as insert
in (b). (d) Power efficiency as the function of current density.

films at the surface of other transparent polymers, such as poly- chamber. A 60 nm thick NPB and a 60 nm thick Alq3 layer were deposited
imide and PET. The work function of the nanowire film can be one after another. Finally, the cathode was fabricated by thermal evaporation
tuned by covering it with a thin layer of graphene (work func- of a LiF layer (1 nm) and then an Al layer (100 nm). The I-V-B of the OLED
devices was measured at ambient conditions with a Keithley 2400 Source
tion of 4.6 eV[30]) to match that of ITO (4.7 eV). Consequently, meter and a Keithley 2000 multimeter equipped with a calibrated silicon
AgNW-based transparent electrodes could be used in a wide photodiode. Since the PVA substrate is very flexible, it was held together
range of flexible and cheap devices such as OLEDs and solar with a 1 mm thick glass cover. No correction to brightness was made.
cells as an alternative to ITO. We believe that this work is a
major step towards the large-scale application of AgNW films
in emerging flexible optoelectronic devices. Supporting Information
Supporting Information is available from the Wiley Online Library or
from the author.
Experimental Section
Fabrication and characterization of AgNW–PVA film: AgNWs were
synthesized using an air-assisted polyol method,[15] and AgNWs films Acknowledgements
were deposited on PET by a vacuum filtration and transfer method.[11]
Aqueous solutions (10 wt%) of PVA (PVA124, Kuraray) were cast or spin- This work was supported by the 973 key program of MOST
coated (1500 rpm for 15 s) on the nanowire films, then the AgNW–PVA (2006CB932904, 2007CB815304, 2010CB933501), the NSFC program
film was peeled off PET after it was dried at 80 °C for 1 h and 100 °C for (20873150, 20821061, 20973173 and 50772113), the Chinese Academy of
another hour. Microstructure analysis of AgNWs was performed using Sciences (KJCX2-YW-M05, KJCX2-YW-319), the Youth Foundation of Fujian
SEM (Figure 1S in Supporting Information) and TEM (JEOL JEM-2010). Province (2008F3118), and China Postdoctoral Science Foundation.
AFM analysis was carried out on a Nanoscope Multimode IIIa (Veeco
Instruments) operated in tapping mode. Optical transmission spectra Received: May 17, 2010
(300–800 nm) were recorded on a Lambda 900 (PerkinElmer) equipped Revised: June 18, 2010
with a Φ150 mm integral labsphere. Sheet resistance was measured using Published online: August 3, 2010
the 4-probe method. The mechanical, thermal, and chemical tests of the
AgNW–PVA film are described in detail in Supporting Information.
Fabrication and measurement of OLED devices: A AgNW film on PET
(47.8 mg/m2) was patterned into two parallel electrodes by tape adhesion. [1] I. C. Cheng, S. Wagner, in Flexible Electronics, Vol. 11, Springer,
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