Siemens 7SA6x V4.6 Template Manual ENU TU2.22 V1.200

OMICRON PTL 7SA6x Distance Protection Test Template User Manual
OMICRON PTL
Protection Test Template PTT
Distance Protection
Siemens 7SA6x V4.6
User Manual
V1.200
© OMICRON electronics GmbH 1/22

Contents
1 General Information ..................................................................................................................................3

2 Quick Start Information ............................................................................................................................4
3 Using the Template ...................................................................................................................................5
3.1 Test Object ...........................................................................................................................................5
3.2 Hardware Configuration .......................................................................................................................5
4 Required Test Modules/SW Version/Hardware ......................................................................................8
5 Functional Range ......................................................................................................................................8
6 Not Supported Functions .........................................................................................................................9
7 OMICRON Test Strategy ...........................................................................................................................9
8 Template Structure .................................................................................................................................10
8.1 Wiring Test .........................................................................................................................................10
8.2 Initial Test ...........................................................................................................................................11
8.3 Distance Starting Overcurrent ............................................................................................................11
8.4 Distance Starting Impedance .............................................................................................................11
8.5 Distance Starting V/I...........................................................................................................................11
8.6 Distance Starting V/I Phi ....................................................................................................................13
8.6.1 V/I–(Phi) Starting ..........................................................................................................................14
8.6.2 V/I-(Phi) Starting – Phi above phi> ...............................................................................................14
8.6.3 V/I-(Phi) Starting – Phi below phi< ...............................................................................................14
8.6.4 V/I-(Phi) Starting – Phi above phi< ...............................................................................................14
8.6.5 V/I-(Phi) Starting – Phi below phi> reverse ..................................................................................14
8.6.6 V/I-(Phi) Starting – Phi above phi> reverse ..................................................................................14
8.6.7 V/I-(Phi) Starting – Phi below phi< reverse ..................................................................................14
8.6.8 V/I-(Phi) Starting – Phi above phi< reverse ..................................................................................14
8.7 Directional Test...................................................................................................................................14
8.8 Distance Zone Trip Times (Zone 1, Zone 2, Zone 3, Zone 4 and Zone 5) ........................................16
8.9 Distance Reach Zone (Zone 1, Zone 2, Zone 3, Zone 4 and Zone 5) ...............................................19
8.10 Distance Zone Trip Times (Zone Z1B) .............................................................................................20
8.11 Distance Reach Zone (Zone Z1B)....................................................................................................20
8.12 Pick-up and Drop-off of the BUOC (IDMT and DMT) Stages ..........................................................20
8.13 Trip Time of the BUOC (IDMT and DMT) Stages ............................................................................21
8.14 Switch onto Fault (SOTF).................................................................................................................21
8.15 Trip Time with Circuit Breaker Contacts...........................................................................................22

1 General Information
The 7SA6x distance protection template is used for testing the main protection functions of the Siemens
7SA6x relay. This template comprehends different modules for testing the most important protection
functions. It is designed and configured for use with the Siemens 7SA6x V4.6 XRIO converter which is
included in this template. For more information about the converter, see the Siemens user manual of the
7SA6x XRIO converter.
Note: The template is designed and built for the applications of the Test Universe 2.22 software.
The template is tested on the following relay:

Manufacturer: SIEMENS
MLFB: 7SA6312-5BA39-7PR7/BB M1K
Firmware Version: V4.6
Annotations:
• Although this template is developed particularly for the relay specified above, it can also be used
for testing similar protection relays of the 7SA6x line.
• The OMICRON PTTs are designed for an experienced OMICRON user. The user should be
familiar with the Test Universe software and the XRIO technology (see
http://www.omicron.at/products/training/ for training information).
Important: The "Relay Parameter Section" with its parameter and ID's has changed according to the
XRIO-Export of DIGSI 4.81. Thus the xRIO-Import for XRIO Converter from V1.100 is only working with
DIGSI 4.81. DIGSI 4.80 will not be compatible any longer by using the XRIO-Converter Series 1.1x.

2 Quick Start Information

To test with the 7SA6x distance protection template:
1. Double click the file 7SA6x.occ to start the template-based procedure.
2. Open the global test object.
3. Load (Import) the latest XRIO converter version for the 7SA6x (TU2.22).
4. Enter or import your relay settings, and than click OK.
Figure 1: Relay settings in the XRIO converter
5. Open the Hardware Configuration.

6. Enter all necessary information for:
• General
• Analog Outputs
• Binary / Analog Inputs
• Binary Outputs
• DC Analog Inputs
7. Click OK.
8. Follow the wiring instructions.
9. Start testing.
10. Evaluate and archive the results.

3 Using the Template

The 7SA6x distance protection template is separated into three object groups: test object, hardware
configuration and the list of OMICRON test modules used for testing the relay's protection functions. The
template can be used for testing the following overcurrent protection functions:
• Distance protection function (21)
• Overcurrent protection function (50, 50N, 51, 51N)
• Switch onto fault (SOTF)
• CB auxiliary contacts
3.1 Test Object

The test object already contains the 7SA6x XRIO converter which includes all setting parameters of the
modeled 7SA6 protection functions. The setting parameters are built as an image of the
DIGSI software. For more information, see the Siemens 7SA6x V4.6 XRIO Converter User Manual.
3.2 Hardware Configuration

The hardware configuration offers different configuration options for voltage and current outputs. For
testing the 7SA6 relay with the 7SA6x distance template, the standard configuration shown in the
following figure is required.
Figure 2: Configuration of the voltage and current outputs
Note: If higher currents are needed for testing (e.g. relays with Inom = 5 A), the current output
configuration can be adapted (e.g. set to 3 x 25 A).

In the Analog Outputs dialog box, the voltage and current outputs have to be routed to the name
variables. Figure 3 illustrates the Analog Outputs configuration.
Figure 3: Analog Outputs configuration
In the Binary / Analog Inputs dialog box, configure the signals as follows:
• 3 trigger signals set to Trip Phase A, Trip Phase B and Trip Phase C
• 1 signal for the Manual-Close
• 1 pick up signal set to Relay PICKUP
• 3 signals for the circuit breaker auxiliary contacts set to CB Phase A (52a), CB Phase B (52a),
CB Phase C (52a)
Note: The binary inputs are preset to potential free. Change these predefined settings to the values
needed at the test site.
The following figure shows the Binary / Analog Inputs configuration.
Figure 4: Binary / Analogue Inputs configuration

Route the signals configured in the Binary / Analog Inputs dialog box to the following binary inputs:
• Trip Phase A to binary input 1
• Trip Phase B to binary input 2
• Trip Phase C to binary input 3
• Manual-Close to binary input 4
• Relay PICKUP to binary input 5
• CB Phase A (52a) to binary input 7
• CB Phase B (52a) to binary input 8
• CB Phase C (52a) to binary input 9
If the Start signal is not used, pick-up and drop-off of the distance protection function cannot be tested.
Note: The circuit breaker auxiliary contact is required for the trip test with circuit breaker. If the circuit
breaker auxiliary contact cannot be connected to the binary inputs, the trip test with circuit breaker can not
be performed.
Figure 5: Connecting the CMC 256-6 to the 7SA6 relay

4 Required Test Modules/SW Version/Hardware

To use this template, you must have a valid test license for the OMICRON Test Universe 2.22 or higher
and the following test modules:
• Control Center
• Quick CMC
• Advanced Distance
• Ramping
• State Sequencer
• Overcurrent
• VI Starting
There are no restrictions on the hardware. You can use a CMC56, CMC156, a CMC256, a CMC256 plus
or a CMC 356 for testing (The development tests are performed with a CMC256-6).
5 Functional Range
The test modules are grouped according to the tested protection function. The 7SA6 distance protection
test template includes OMICRON test modules for the following protection functions:
• Pick-up and drop-off of the:
Distance protection starting overcurrent (21)
Distance protection starting impedance (21)
Distance protection starting V/I (21)
Distance protection starting V/I phi (21)
Overcurrent protection (50/51), (50N/51N)
• Trip time:
Distance zones quadrilateral or circle (21)
Distance extended zone quadrilateral or circle (21 – Z1B)
Overcurrent protection (50/51), (50N/50N)
• Reach:
Distance zones quadrilateral or circle (21)
Distance extended zone quadrilateral or circle (21 – Z1B)
• Switch onto fault (SOTF)
• Trip time with circuit breaker
The test modules are linked to the XRIO-Converter via the LinkToXRIO functionality and are therefore an
image of the active functions in the XRIO-Converter. Thus no further actions are needed to activate or
deactivate the necessary test modules.

6 Not Supported Functions

The following functions of the 7SA6 relay are not supported by the 7SA6 distance test template:
• Ground fault overcurrent protection
• Power swing
• Synchronism check
• Voltage protection (27), (59)
• Frequency protection (81 O/U)
• Circuit breaker failure protection (50BF)
• Fault locator
• Thermal overload (49)
• Autoreclosure (79)
The 7SA6 distance protection test template can be extended by the user to allow testing the protection
functions currently not supported. It is possible to add any test modules to the existing templates. The
additional test modules will not affect the template, but they will not be deactivated automatically.
7 OMICRON Test Strategy

The 7SA6 distance protection test template includes the pick-up and trip time value tests which are
performed in a standardized way. For the pick-up and drop-off value tests, the setting value is evaluated
by a ramp increasing the variable under test until the pick-up value is reached. The test of drop-off values
is done in a similar way by decreasing the tested value until the drop-off value is reached.
Note: For the V/I and V/I-Phi distance starting element tests, the OMICRON VI Starting test module is
used.
The trip times are tested by simulating a fault which exceeds the pick-up value and the specific
tolerances. This results in a trip command of the tested protection function. The time between the
simulation of the fault and the reception of the trip signal is measured and evaluated.
Note: Do not only rely on the automatic assessment of test points in the test modules but check the
plausibility of all test results manually to achieve maximum reliability of the test results.

8 Template Structure
The structure of the 7SA6x distance protection test template is shown below.
Figure 6: 7SA6x distance protection test template
8.1 Wiring Test

The wiring test is used to check the connections between the CMC test set and the relay. Therefore the
OMICRON QuickCMC test module is used to inject asymmetrical voltage and current values. The first
phase of the voltages is set to 95%, the second phase to 105% and the third phase to 100% of the
nominal value. The first phase of the currents is set to 95%, the second phase to 100% and the third
phase to 105%. If all connections are correct, the same values can be read out of the relay and the test
can be manually assessed.

Note: If the distance- or overcurrent Ipickup value is smaller than the nominal current the relative set test
currents for phase A, phase B and phase C of the wiring test can lead to a trip signal. In this case change
the relative test current according to your setting.
8.2 Initial Test

The initial test is used to check the connections between the CMC test set and the relay. If all connections
are correct, the test will pass, otherwise the test will fail. The OMICRON Advanced Distance test module
is used for the initial test. A three-phase fault is simulated with a shot to 50% of the line length which have
to be switched off by the relay.
8.3 Distance Starting Overcurrent

For testing the overcurrent pick-up and the drop-off value, the OMICRON Ramping test module is used.
This module allows testing the pick-up and drop-off of the overcurrent stage with the lowest pick-up value.
There are three test modules, each covering the pick-up and drop-off of the overcurrent stage with the
lowest pick-up value. The following fault types are tested:
• Fault type A-N
• Fault type B-C
• Fault type A-B-C
For the fault type A-N and the fault type A-B-C the fault condition is simulated on the line length. Thereby
the voltages keep their initial condition and the current(s) are simulated with the negative line angle. For
the Fault type B-C a second phase failure is simulated.
8.4 Distance Starting Impedance

For testing the impedance pick-up and the drop-off value, the OMICRON Ramping test module is used.
This module allows testing the pick-up and drop-off of the impedance stage with the highest pick-up
impedance value. There are three test modules, each covering the pick-up and drop-off of the impedance
stage with the highest impedance pick-up value. The following fault types are tested:
• Fault type A-N
• Fault type B-C
For the fault type A-N and the fault type A-B-C the fault condition is simulated on the line length. Thereby
the voltages keep their initial condition and the current(s) are simulated with the negative line angle. For
the Fault type B-C a second phase failure is simulated.
8.5 Distance Starting V/I

For testing the starting V/I pick-up and the drop-off value, the OMICRON VI Starting test module is used.
This module allows testing the pick-up and drop-off of the starting V/I stage. There are three test modules,
each covering the pick-up and drop-off of the starting V/I stage. The following fault types are tested:
• Fault type A-N
• Fault type B-C
The V/I characteristic curve is tested with four test points. Two test points are designed for testing the
current limit, the other two test points are designed for testing the voltage characteristic curve. The test
verification is shown in Figure 7. The test point P1 tests the current limit Minimum current threshold (Iph>)
(or DIGSI parameter 1611). The test point P4 tests the current limit Pickup Overcurrent (Iph>>) (1610).
The test points P2 and P3 test the voltage characteristic curve between the Undervoltage (ph-g) at Iph>>
(1612) and Undervoltage (ph-g) at Iph> (1613) voltage limits for the phase-ground fault loops.
By changing the fault type into phase-phase fault loop, the test points P2 and P3 test the voltage
characteristic curve between the Undervoltage (ph-ph) at Iph>> and Undervoltage (ph-ph) at Iph> (1615)
voltage limits.

Figure 7: Verification of VI Starting
Note: If the settings for the V/I distance starting are changed in the converter settings, the test points
might be displaced. In this case remove all test points and set four new test points as shown in Figure 7.
The fault type A-N depends on the DIGSI function Pickup program V/I (1601). If this function is set to "Ph-
Gnd: Vph-ph/Ph-Ph: Vph-ph", the Fault type A-N test module should be deactivated.
The fault types B-C and A-B-C depen on the DIGSI function Pickup program V/I (1601). If this function is
set to "Ph-Gnd: Vph-g/Ph-Ph: Vph-g", the Fault type B-C and Fault type A-B-C test modules should be
deactivated. If this function is set to "Ph-Gnd: Vph-g/Ph-Ph: I>>", the evaluation test points should be set
according to Figure 8. Otherwise, the voltage characteristic curve would disappear, because only the
current limit Iph>> is available.
Figure 8: Fault type B-C and A-B-C with setting: Ph-Gnd: Vph-g/Ph-Ph: I>>

Note: For non-grounded systems, the DIGSI parameter Uph-ph unbal. (1223) and the DIGSI parameter
Delay 1ph-faults (1206) for maximum asymmetry for a single ground fault can delay the tripping time of
the zones. This effect is shown in the Figure 13. For more information ask the OMICRON Test Automation
Support.
8.6 Distance Starting V/I Phi

For testing the starting V/I Phi pick-up and the drop-off value, the OMICRON VI Starting test module is
used. This module allows testing the pick-up and drop-off of the starting V/I Phi value. There are thirteen
test modules, each covering the pick-up and drop-off of the starting V/I Phi stage. The following fault types
are tested:
• Fault type A-N
• Fault type B-N
• Fault type C-N
• Fault type A-B
• Fault type B-C
• Fault type C-A
The V/I Phi characteristic curve is tested with four test points. Two test points are designed for testing the
current limit and the other two test points are designed for testing the voltage characteristic curve. The
test evaluation is shown in Figure 7. The test point P1 tests the Minimum current threshold (Iph>) (1611)
current limit. The test point P4 tests the Pickup Overcurrent (Iph>>) (1610) or Minimum current threshold
(Iphi>) (1616) current limit. The test points P2 and P3 test the voltage characteristic curve between the
Undervoltage (ph-g) at Iph> (or 1613) and Undervoltage (ph-g) at Iph>> (or 1612) or Undervoltage (ph-g)
at Iphi> (or 1617) voltage limits for the phase-ground fault loops.
By changing the fault type into the phase-phase fault loop, the test points P2 and P3 test the voltage
characteristic curve between the Undervoltage (ph-ph) at Iph> (1615) and Undervoltage (ph-ph) at Iph>>
(1614) or Undervoltage (ph-ph) at Iphi> (1618) voltage limits.
Note: If the settings for the V/I or V/I Phi distance starting are changed in the converter settings, the test
points might be displaced. In this case remove all test points and set four test points as shown in Figure 7.
The fault types A-N, B-N and C-N depend on the DIGSI function Pickup program V/I (1601). If this
function is set to "Ph-Gnd: Vph-ph/Ph-Ph: Vph-ph", the Fault type A-N, B-N and C-N test modules should
be deactivated.
The fault types A-B, B-C, C-A and A-B-C depend on the DIGSI function Pickup program V/I (1601). If this
function is set to "Ph-Gnd: Vph-g/Ph-Ph: Vph-g", the Fault type A-B, B-C, C-A and A-B-C test modules
should be deactivated. If this function is set to "Ph-Gnd: Vph-g/Ph-Ph: I>>", the evaluation test points
should be set according to Figure 8. Otherwise, the voltage characteristic curve would disappear, because
only the current limit Iph>> (1610) or Iphi> (1616) is available.
Note: For testing the V/I Phi starting program, it is necessary to insert a right phase angle of the test
current. This phase angle depends on the DIGSI parameters PHI> pickup (1620) (lower set point) and
PHI< pickup (1621) (upper set point).
Support.
The following tests are available for the V/I Phi evaluation (Chapter 8.6.1 – 8.6.8 ):

8.6.1 V/I–(Phi) Starting

Condition: V/I-Phi starting program is activated. In this case calculate the sum between the negative
number of the DIGSI parameter "1620" and the value +6°. Insert this sum in the field "Phase angle of I (in
reference to V)".
Example:
DIGSI parameter "1620" = 40°
Enter: "Phase angle of I (in reference to V)" = - (phi>) + 6° = - 40° + 6° = -34°.
8.6.2 V/I-(Phi) Starting – Phi above phi>

Calculate the sum between the negative number of the DIGSI parameter "1620" and the value -6°. Insert
the sum in the field "Phase angle of I (in reference to V)".
8.6.3 V/I-(Phi) Starting – Phi below phi<

Calculate the sum between the negative number of the DIGSI parameter "1621" and the value +6°. Insert
the sum in the field "Phase angle of I (reference to V)".
8.6.4 V/I-(Phi) Starting – Phi above phi<

Calculate the sum between the negative number of the DIGSI parameter "1621" and the value -6°. Insert
the sum in the field "Phase angle of I (in reference to V)".
8.6.5 V/I-(Phi) Starting – Phi below phi> reverse

Calculate the sum between the negative number of the DIGSI parameter "1620" and the value +180° and
the value +6°. Insert the sum in the field "Phase a ngle of I (in reference to V)".
8.6.6 V/I-(Phi) Starting – Phi above phi> reverse

the value -6°. Insert the sum in the field "Phase a ngle of I (in reference to V)".
8.6.7 V/I-(Phi) Starting – Phi below phi< reverse

the value +6°. Insert the sum in the field "Phase a ngle of I (in reference to V)".
8.6.8 V/I-(Phi) Starting – Phi above phi< reverse

the value -6°. Insert the sum in the field "Phase a ngle of I (in reference to V)".
8.7 Directional Test

For testing the directional characteristic, the OMICRON Advanced Distance test module is used. Each
zone can be set to Forward, Reverse or Non-Directional characteristic. To test the directional
characteristic, it is sufficient to attest the difference between the Forward and Non-Directional,
alternatively between the Reverse and Non-Directional characteristics.
For testing the Forward direction, enter one test shot on the right side of the forward left direction limit
(inside the zone), and one test shot on the left side of the forward left directional limit (outside the zone)
for Fault type A-N and B-C.
For testing the Reverse direction, enter one test shot on the right side of the reverse left direction limit
(inside the zone) and one test shot on the left side of the reverse direction limit (outside the zone) for the
Fault type A-N and B-C. Figure 9 and Figure 10 show examples for quadrilateral and circle zone
characteristics.

Figure 9: Quadrilateral zone characteristic
Figure 10: Circle zone characteristic

8.8 Distance Zone Trip Times (Zone 1, Zone 2, Zone 3, Zone 4 and Zone 5)
For testing the zone trip times, the OMICRON Advanced Distance test module is used. This module
allows testing the trip times of all active zones. There are three test modules for the quadrilateral or circle
zones. The following fault types are tested:
• Fault type A-N
• Fault type B-C
The zone trip time is tested by a test shot placed at 90% of each active zone and 110% of zone 5. These
shots are set on the impedance line direction.
Figure 11: Zone trip times
Note: Possibly there are more test shots than necessary in the test modules as shown in Figure 12. In
this case, delete all unnecessary test points. The unnecessary test points can be identified by a very small
impedance value - nearly zero (e.g. 8.333e-10 µΩ).

Figure 12: Unnecessary test points
Note: For the circle characteristic selection, it is not possible to set different zero sequence compensation
factors. In this case the parameters Zero seq. comp. factor RG/RL for Z1 (1116) and Zero seq. comp.
factor RG/RL for Z1B …Z5 (1118) should not be different, alternatively the parameters Zero seq. comp.
factor XG/XL for Z1 (1117) and Zero seq. comp. factor XG/XL for Z1B …Z5 (1119)
Furthermore the same conditions are also significant for the Digsi parameters Zero seq. comp. factor K0
for Zone Z1 (1120) and Zero seq. comp. factor K0 for, higher zones >Z1 (1122), alternatively for Zone
seq. comp. factor, higher zones >Z1 (1121) and Zone seq. comp. angle, higher zones >Z1 (1123).
Support.

Figure 13: Delay of the tripping zone times
Note: The test current of the test module is twice set to the maximum value - the nominal current and the
DIGSI parameter 1610. If the test current is too high, the module cannot execute the test as shown in
Figure 14. The tested and pink colored shot points are out of range. In this case remove the link of the test
current and set the ITest manually. Do it by using the pick-up program of the 21 Distance protection
(DIGSI parameter 0114) and enter a test current higher then the necessary pick-up current.
Figure 14: Test current too high

8.9 Distance Reach Zone (Zone 1, Zone 2, Zone 3, Zone 4 and Zone 5)
For testing the distance reach zone, the OMICRON Advanced Distance test module is used. This module
allows testing the reach of all active zones. There are three test modules for testing the quadrilateral
zones or circle zones. The trip times of the following fault types are tested:
• Fault type A-N
• Fault type B-C
The distance reach zone is tested by test shots placed at 94% and 106% of each active zone. These
shots are set on the 90° and 0° lines for all forwa rd directed zones, alternatively 180° and 270° for all
reverse directed zones.
Figure 15: Reach zone
impedance nearly zero (e.g. 8.333e-10 µΩ).
Note: For the circle characteristic selection it is not possible to set different zero sequence compensation
factors. In this case the parameters Zero seq. comp. factor RG/RL for Z1 (1116) and Zero seq. comp.
factor RG/RL for Z1B …Z5 (1118 should not be different), alternatively Zero seq. comp. factor XG/XL for
Z1 (1117) and Zero seq. comp. factor XG/XL for Z1B …Z5 (1119).
Furthermore the same conditions are also significant for the Digsi parameters Zero seq. comp. factor K0
for Zone Z1 (1120) and Zero seq. comp. factor K0 for, higher zones >Z1 (1122), alternatively for Zone
seq. comp. factor, higher zones >Z1 (1121) and Zone seq. comp. angle, higher zones >Z1 (1123).
Note: The test current of the test module is twice set to the maximum value of the nominal current and the
DIGSI parameter 1610. If the test current is too high, the module cannot execute the test as shown in
Figure 14. The tested and pink colored shot points are out of range. In this case remove the link of the test
current and set the ITest manually. Do it by using the pick-up program of the 21 Distance protection
(DIGSI parameter 0114) and enter the test current higher then the necessary pick-up current.

8.10 Distance Zone Trip Times (Zone Z1B)

For testing the zone trip times, the OMICRON Advanced Distance test module is used. This module
allows testing the trip times of the zone Z1B. There is one test module for testing the quadrilateral zone or
the circle zone. The trip times of the following fault types are tested:
• Fault type A-N
• Fault type B-C
The zone trip time is tested by test shot placed at 90% of the zone Z1B. These shots are set on the
impedance line direction.
Note: This test can only be executed if the zone Z1B can be activated.
Example: For the activation of the Z1B you can set the DIGSI parameter 121 85-21 Pilot Protection for
Distance prot at PUTT (Z1B). In this case simulate the receive signal from the opposite line end.
8.11 Distance Reach Zone (Zone Z1B)

For testing the distance reach zone, the OMICRON Advanced Distance test module is used. This module
allows testing the reach of the zone Z1B. There is one test module for the quadrilateral zone or for the
circle zone. The trip times of the following fault types are tested:
• Fault type A-N
• Fault type B-C
The distance reach zone is tested by test shots placed at 94% and 106% of the zone Z1B. These shots
are set on the impedance 90° and 0° directions.
Note: This test can only be executed if the zone Z1B can be activated.
Example: For the activation of the Z1B you can set the DIGSI parameter 121 85-21 Pilot Protection for
Distance prot at PUTT (Z1B). In this case simulate the receive signal from the opposite line end.
8.12 Pick-up and Drop-off of the BUOC (IDMT and DMT) Stages
For testing the pick-up and the drop-off value, the OMICRON Ramping test module is used. This module
allows testing the pick-up and drop-off values of the IDMT or DMT overcurrent stages. There are two test
modules. The pick-up and drop-off of the following fault types are tested:
• Fault type A-N
Note: The pick-up value of the IDMT stages is the setting parameter multiplied by 1.1. If the drop-off
characteristic is set to Disc Emulation in the relay, the drop-off test cannot be executed. In this case,
proceed as described below.

8.13 Trip Time of the BUOC (IDMT and DMT) Stages

For testing the trip time value of the IDMT and DMT overcurrent stages, the OMICRON Overcurrent test
module is used. Every fault loop is tested with a separate overcurrent module for each direction. The trip
times of the following fault types are tested in the forward direction:
• Fault type A-N
The test shots for each fault type are set relative to the pick-up setting values.
Figure 16: Trip time test for overcurrent stages
8.14 Switch onto Fault (SOTF)

For performing the SOTF test, the OMICRON State Sequencer test module is used. This test is divided
into two simulated faults with four sequencer states: 2 x pre-fault, fault and post-fault. The faults are three-
phase faults, within SOTF time (DIGSI parameter 1150A or 1132A, depending on the DIGSI parameter
selection 1134) and with expired SOTF time.
Note: For the SOTF test, the zones Z1 and Z2 have to be set to the forward direction and Z1 has to be
smaller than Z2.
Note: If the DIGSI parameter Recognition of Line Chosures with (1134) is set to Manual Close BI only, the
binary input 380 of the relay has to be activated. For any other selection of 1134, the binary input 380 of
the relay has to be deactivated.
Note: If the Manual Close signal (DIGSI parameter 356) is missing and the DIGSI parameter 1134 is not
set to Manual Close BI only, convert the test verification as follow:
• Set the trigger of the Prefault 1_1 state to on Key Pressed condition.
• Set the trigger of the Prefault 2_1 state to on Key Pressed condition.

8.15 Trip Time with Circuit Breaker Contacts

For testing the trip time with circuit breaker contacts test, the OMICRON State Sequencer test module is
used. This test is divided into three sequencer states: pre-fault, fault and post-fault. The fault is a three-
phase fault in the direction of the first distance zone. The time between the trip command and the time
when the circuit breaker is opened is evaluated.

Siemens 7SA6x V4.6 Template Manual ENU TU2.22 V1.200

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OMICRON PTL 7SA6x Distance Protection Test Template User Manual

Protection Test Template PTT

Siemens 7SA6x V4.6

© OMICRON electronics GmbH 1/22

1 General Information ..................................................................................................................................3

© OMICRON electronics GmbH 2/22

The template is tested on the following relay:

© OMICRON electronics GmbH 3/22

2 Quick Start Information

Figure 1: Relay settings in the XRIO converter

5. Open the Hardware Configuration.

© OMICRON electronics GmbH 4/22

3 Using the Template

3.1 Test Object

3.2 Hardware Configuration

Figure 2: Configuration of the voltage and current outputs

© OMICRON electronics GmbH 5/22

Figure 3: Analog Outputs configuration

The following figure shows the Binary / Analog Inputs configuration.

Figure 4: Binary / Analogue Inputs configuration

© OMICRON electronics GmbH 6/22

Figure 5: Connecting the CMC 256-6 to the 7SA6 relay

© OMICRON electronics GmbH 7/22

4 Required Test Modules/SW Version/Hardware

© OMICRON electronics GmbH 8/22

6 Not Supported Functions

7 OMICRON Test Strategy

© OMICRON electronics GmbH 9/22

Figure 6: 7SA6x distance protection test template

8.1 Wiring Test

© OMICRON electronics GmbH 10/22

8.2 Initial Test

8.3 Distance Starting Overcurrent

8.4 Distance Starting Impedance

8.5 Distance Starting V/I

© OMICRON electronics GmbH 11/22

Figure 7: Verification of VI Starting

© OMICRON electronics GmbH 12/22

8.6 Distance Starting V/I Phi

© OMICRON electronics GmbH 13/22

8.6.1 V/I–(Phi) Starting

8.6.2 V/I-(Phi) Starting – Phi above phi>

8.6.3 V/I-(Phi) Starting – Phi below phi<

8.6.4 V/I-(Phi) Starting – Phi above phi<

8.6.5 V/I-(Phi) Starting – Phi below phi> reverse

8.6.6 V/I-(Phi) Starting – Phi above phi> reverse

8.6.7 V/I-(Phi) Starting – Phi below phi< reverse

8.6.8 V/I-(Phi) Starting – Phi above phi< reverse

8.7 Directional Test

© OMICRON electronics GmbH 14/22

Figure 9: Quadrilateral zone characteristic

Figure 10: Circle zone characteristic

© OMICRON electronics GmbH 15/22

Figure 11: Zone trip times

© OMICRON electronics GmbH 16/22

Figure 12: Unnecessary test points

© OMICRON electronics GmbH 17/22

Figure 13: Delay of the tripping zone times

Figure 14: Test current too high

© OMICRON electronics GmbH 18/22

Figure 15: Reach zone

© OMICRON electronics GmbH 19/22

8.10 Distance Zone Trip Times (Zone Z1B)

8.11 Distance Reach Zone (Zone Z1B)