*Correspondence to: Alireza Kassaee, Ph.D., Department of Radiation Oncology, 3400 Spruce Street, 2 Donner,
Philadelphia, PA 19104. Phone: (215) 662-6204; Fax: (215) 349-5978; E-mail: Kassaee@xrt.upenn.edu
Received 7 May 2001; Revised 21 September 2001; Accepted 2 October 2001
DOI 10.1002/ijc.10349
Published online 14 March 2002 in Wiley InterScience (www.interscience.wiley.com).
126 Kassaee et al.: Dose Near Surface for TBI
Fig. 2. Monte Carlo generated electron spectra in air and Fig. 4. Electron spectrum as a function of distance from
in vacuum 500 cm from the source. the 1-cm thick spoiler with spoiler-to-surface distances
(STSD) of 1, 30, 100 cm without the phantom.
Fig. 3. Electron fluence ⫻ L2 in air (circles) and in Fig. 5. Calculated depth dose, normalized to 5 mm depth,
vacuum (squares) as a function of distance L from the lead for the contaminating-electron component using the con-
plate used to simulate the treatment head. The error bars taminating-electron kernels at 1 (circles) and 30 cm
represent the standard deviation in the Monte Carlo simu- (squares) from the spoiler.
lations. The normalization point is at 1 cm from the lead
plate.
ergetic electrons corresponded to the electron spectra
at the phantom surface, with STSDs of 1 and 30 cm.
fluence exceeds that from the lead, as electrons are The kernel was incorporated in a superposition dose-
generated along the air path. calculation algorithm [11] and then was used to cal-
Variation of Electron Spectrum with Distances culate the depth dose for the contaminating electrons.
Monte Carlo results showed no significant change of Figure 5, in which the doses are normalized to 0.5 cm
the contaminating electron spectrum as a function of depth, demonstrates that the depth dose of the elec-
SSD with the spoiler in the beam. Thus, the electrons trons is nearly independent of distance from the
generated in the accelerator head and the air are spoiler for depths greater than 3 mm.
virtually completely absorbed in the spoiler, which Electron Fluence Profile
produces the entire electrons incident on the phantom. The in-air electron fluence profiles with or without a
The electron spectra at the surface of a phantom with spoiler, shown in Figure 6, were calculated with the
500 cm SSD and STSD of 1, 30, and 100 cm are Monte Carlo program, with air between the source
shown in Figure 4. and the phantom with an SSD of 500 cm. For calcu-
An energy-deposition kernel for the electrons lation with the spoiler, the STSD was 30 cm and the
from the spoiler at a fixed 500-cm SSD was generated electron fluence profiles are calculated in air at 1 and
by taking a weighted linear combination of kernels for 5 cm from the spoiler. Contaminating electrons from
monoenergetic electrons. The weights of the monoen- the accelerator head were neglected by removing the
128 Kassaee et al.: Dose Near Surface for TBI
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ments less than 1 mm. tion devices on the dose in the build-up region. Int J
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tween the spoiler and surface. The dose profile at the modifiers used with megavoltage therapy units. Radi-
ology 1979;130:233–236.
phantom surface with a spoiler is flatter inside the
10. Shiraz S, Kase K. Measurements of dose from second-
beam and sharper at the edges compared to that from
ary radiation outside a treatment field: effects of wedges
air-generated electrons. The profile at the surface at and blocks. Int J Radiat Oncol Biol Phys 1985;11:
extended SSD depends on SSD and spoiler–phantom 2171–2176.
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beams, especially when matching fields are used. Calculation of the dose in the build-up region for high
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