Anda di halaman 1dari 3

Volume 7, Number 12 APPLIED PHYSICS LETTERS 15 December 1965

have been repeated several times and examination parallel to the plane of the electric field from the
of other observations have been made to confirm solar radiation. A shift of 4 or 5 A could be sufficient
the findings described. From this exploration it has to put the return radiation outside of the narrow
been determined that the amplitude of the return bandpass of the receiver filter. The opposite effect
from scatterers in the atmosphere is strongly de- observed when transmitting at right angles to the
pendent upon the angle between the incident laser plane of the electric field from solar radiation might
radiation and incident solar radiation. produce the high level of back scattered energy re-
As yet no physical explanation for these variations ceived.
has been determined. Close examination of sur- These anomalies are being investigated to deter-
rounding geography and terrain has apparently mine, if possible, the exact nature of the effect of
eliminated a geographical explanation. solar radiation on atmospheric laser returns. If
It has been suggested that a physical orientation other investigators have observed this effect or if
of the individual scatterers is produced by the pres- they can provide a physical explanation for these
sure of the sunlight and/or alignment of scatterers observations, the authors would appreciate infor-
having dipole moments with the electric vector mation on such observations or explanations.
of the solar radiation. Such orientation would
seemingly however be difficult to maintain against
the random influences of thermal and mechanical 1 G. G. Goyer and R. Watson, Bulletin of the American Meteoro-

turbulence. logical Society, 44, No.9 (1963).


2 D. Atlas, Bulletin of the American Meteorological Society, 44, No.
This variation of backscatter intensity may be in-
12, (1963).
fluenced by the Raman effect or a similar effect. 3 M. Ligda, "Meteorological Observations with Lidar", Stanford
The vertically polarized laser radiation may be at- Research Institute report at Proceedings of First Conference on Laser
tenuated or shifted in wavelength when transmitted Technology, Vol. II, Office of Naval Research, Boston, Mass.

DIRECT PIEZOELECTRIC COUPLING TO SURFACE ELASTIC WAVES

R. M. White and F. W. Voltmer


(CdS, fused silica, and quartz; transducers; E) Department of Electrical Engineering, University of California
Berkeley, California
(Received 14 October 1965)

The methods used previously to generate and de- agating along the top of the crystalline quartz plate
tect surface elastic waves piezoelectrically! have in- of Fig. I a. There will be components of particle dis-
volved the mechanical coupling of a compressional placement in the x and y directions; both compo-
or shear wave transducer to the body on which the nents vary with x, becoming negligibly small at a
surface waves are to propagate. We report here di-
rect piezoelectric surface wave transduction by a
spatially periodic electrode on the plane surface of a Pulsed
Oscillator Receiver
piezoelectric plate. A periodic electric field is pro-
duced when an rf source is connected to the elec-
trode, thus permitting piezoelectric coupling to a
traveling surface wave. Direct coupling has a number
of advantages described below. Also described here
are measurements of surface wave velocity in quartz,
and the surface wave attenuation produced by thin
cadmium sulfide films.
Direct coupling to a surface elastic wave is pos- Quartz
sible at the boundary of a piezoelectric solid if any of
the components of strain at the surface is piezoelec- Fig. lao Arrangement for surface wave transduction by
trically active. For example, consider a wave prop- electrodes on crystalline quartz bar.

314

Downloaded 26 Sep 2010 to 143.248.72.176. Redistribution subject to AIP license or copyright; see http://apl.aip.org/about/rights_and_permissions
Volume 7, Number 12 APPLIED PHYSICS LETTERS 15 December 1965

distance of about one wavelength beneath the sur- used either as a source or as a receiving transducer,
face. The xy strain component (56) is coupled piezo- while a comb transducer mounted elsewhere on the
electrically to the y component of electric held, and bar served as the companion transducer for trans-
the xx(5 l ) strain is coupled to the x component of mission measurements. Pulses from the receiving
electric field. 3 Thus an oscillator or receiver con- transducer were identified as being surface waves
nected to an electrode on the quartz plate having the by their phase velocity as determined from the trans-
configuration shown in Fig. 1b will be coupled piezo- ducer separation and the pulse transit time, and bv
electrically to a propagating surface wave. The the large attenuation of the pulse produced when a
period, p, of the pattern is made equal to the sur- drop of acetone was placed on the surface between
face wavelength at the frequency of operation. The transducers. It is also possible with rf input pulses of
electrode pattern will also operate at integral mul- long duration to observe the characteristic trape-
tiples of its fundamental frequency. zoidally shaped received pulse resulting from the
This method of surface wave transduction some- finite time of transit of the wave across an extended
what resembles the use of the comb transducer,1.2 transducer. l
for both involve the creation or detection of spa- The pulse amplitude obtained using one electrode
tially periodic surface displacements. (The comb pattern and one comb transducer was about the same
transducer consists of a block, typically of metal, as that obtained using two identical comb tram-
upon whose plane upper surface a compressional ducers for generation and detection. The relative
wave transducer is mounted and whose serrated responses of the two types of transducer depend
lower surface provides spatially periodic contact to upon many factors including the number of periods
the body on which surface wave propagation oc- of each transducer, the type of piezoelectric ma-
curs.) terial used with each, and the means used to couple
We have observed the direct piezoelectric cou- the comb transducer to the surface (e.g. pressure
pling described above at 15 and 45 mc with the ar- alone or pressure together with an oil film).
rangements illustrated in Fig. 1a. The electrode The advantages of direct piezoelectric coupling
pattern used at both frequencies (see Fig. 1b) was include the following: it does not require contact
produced byo photoetching in a dilute NaOH solu- pressure and so produces no surface damage or
tion a 1000-A thick aluminum film which had been distortion; the transducer may be operated at ex-
vacuum-deposited on the quartz bar. Standard treme temperatures or in a vacuum; the transducer
photo-resist processes were used to mask the sur- may be easily handled and precisely fabricated: and
face prior to etching. The electrode pattern was the electrode pattern may be extended in the di-
rection of wave propagation so as to increase the
active transducer area and the energy density of the
surface wave without resulting in the substantial
coupling of energy back away from the surface which
results when comb transducers are made very long l
The most apparent disadvantage is the limitation
to suitably oriented piezoelectric materials. How-
ever, both the electrode pattern and a piezoelectric
him (e.g. cadmium sulfide) could be deposited on
a non piezoelectric substrate.
For connection
Surface wave velocities (necessary for design of
to oscillator
or receiver
w most surface wave transducers) were measured in
fused silica and in crystalline quartz. Velocities were
computed from the measured change in phase delay
of a pulse produced by one comb transducer as a
second comb transducer was moved a known dis-
tance along the surface. The values obtained were:
fused silica, velocity 3.37 ± 0.08 X lOs cm/sec:; quartz,
propagation along surface parallel to x axis, normal
Fig. lb. Electrode pattern used in (a) at 15 and 45 mc. Ap-
to y axis, velocity 3.20 ± 0.06 X 105 cm/sec; quartz,
proximate dimensions in inches: p = 0.008; W = 0.095; L = propagation along surface parallel to y axis, normal
0.079. to x axis, velocity 3.25 ± 0.06 X 105 cm/sec.

3Fi

Downloaded 26 Sep 2010 to 143.248.72.176. Redistribution subject to AIP license or copyright; see http://apl.aip.org/about/rights_and_permissions
Volume 7, Number 12 APPLIED PHYSICS LETTERS 15 December 1965

Surface wave propagation and piezoelectric inter- Thus in CdS, the piezoelectric coupling of electrons
action with electrons in piezoelectric semiconductors to surface waves should be possible with either of
has been considered and preliminary measurements these orientations. The velocity for the first orienta-
have been made of the attenuation of a surface wave tion, as computed from Stoneley's determinantal
propagating along a fused silica plate on which a equation upon substitution of elastic constants for
very thin cadmium sulfide film has been deposited. CdS,6 is 1. 70 x 1Q5 cm/sec. Experiments with depos-
Substantial attenuation was observed. For films ited electrode transducers on CdS single crystals
ranging in thickness from 2 to 5 p. and having elec- are in progress. Electrically nonconducting glass
trical resistivities between 200 and 2000 O-cm, at- comb transducers (photoetched in HF after appli-
tenuation as high as 80 dB/cm was measured at 15 cation of KMER Photo-Resist with Additive D) are
mc even though the ratio of film thickness to wave- also being used in this study.
length (in the fused silica) was 2.2 x lO-2 or less. In This work was supported in part by the U.S. Army
contrast, attenuation less than I dB/cm was pro- Research Office-Durham under Grant DA-ARO-
duced by deposited aluminum films of comparable D-31-124-G678. The authors are grateful also to
thickness. The origin of the high loss in the CdS films K. Dransfeld and R. M. Arzt for substantial assist-
is not yet clear. The loss is not determined entirely ance, and to Mrs. D. McDaniel who photoetched the
by film resistivity as a change in illumination pro- transducers.
duced virtually no change in loss even though the
films were moderately photoconductive. 'I. A. Viktorov, Sov.-Phys. Acoustics 7,236 (1962).
Stoneley4.5 has shown that true surface wave prop- 2 R. M. Arzt and K. Dransfeld, Appl. Phys. Letters 7, 156 (1965).
agation is not always possible in an anisotropic solid. 3 H. B. Huntington, The Elastic Constants of Crystals (Academic

It is interesting to note that the elastic constants of Press, New York, 1958).
4R. Staneley, Geophys. Suppl. to Monthly Notes, Roy. Astron. Soc. 5,
CdS satisfy both the criterion developed by Stoneley4
343 (1949).
for surface wave propagation along a plane normal 5 R. Staneley, Proc. Roy. Soc. 232A, 447 (1955).
to the hexagonal axis, and the analogous criterion BD. Berlincourt, H. Jaffe, and L. R. Shiozawa, Phys. Rev. 129,
for propagation along a plane parallel to that axis. 1009 (1963).

THE MILLING OF SOFT METALS TO PRODUCE


VERY LARGE LATTICE STRAINS

D. Lewis and H. Pearson


(AI and Pb; cold working; AI,03 used; E) Battersea College of Technology
London, England
(Received 22 September 1965)

During recent years many studies have been made the end product is in a form which can be used most
of the effects of cold work on the crystallographic readily for diffractometer specimens. However, the
properties of metals, utilizing the line broadening effects of filing, so far as plastic deformation is con-
of x-ray diffraction patterns to analyze the results. cerned, vary widely from one metal to another and
In the course of these studies the behavior of differ- appear to be largely related to the recrystallization
ent metals has been compared and the influence of temperature of the metal. Taking the extreme ex-
such factors as temperature and impurities has been amples of tungsten (2,400°F) and aluminum
observed both in the process of cold working and (175°F), Williamson and HalF have obtained strain
during the subsequent removal of the line broaden- values of 0.62% and 0.045% respectively. The value
ing by annealing. for aluminum was increased to 0.14% by impurities
The mechanism which has been used for cold and also by filing the pure specimen in liquid
working in these investigations has been filing, nitrogen.
partially because of the ease with which it can be Since the magnitude of strain produced by filing
carried out in different environments and also since varies so widely, it cannot be regarded as an ideal

316

Downloaded 26 Sep 2010 to 143.248.72.176. Redistribution subject to AIP license or copyright; see http://apl.aip.org/about/rights_and_permissions

Anda mungkin juga menyukai