R1.7
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LEGAL INFORMATION
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Revision History
Author
Prepared
Date Document Version Reviewed by Approved by
by
2011-06-15 R1.0 Yan Xiao
R1.1 Sheng
2011-10-28
Jiye
Sheng
2011-12-22 R1.2
Jiye
Sheng
2012-01-18 R1.3
Jiye
Sheng
2012-05-08 R1.4
Jiye
2012-09-13 R1.5 Yin
Yazhang
R1.6 Wang
2013-10-30 Qiang/Xu
Wei
2014-3-27 R1.7 He Bo
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Proposal: Before reading this document, you had better have the following
knowledge and skills.
SEQ Knowledge and skills Reference material
Accompanying documents-product Unitrans ZXONE 8700(V1.10) Intelligent
1
description Optical Transfer Platform Product Description
Unitrans ZXONE 8700(V1.10) Intelligent
Accompanying documents-hardware
2 Optical Transfer Platform+Hardware
description
Description
Wavelength division related specifications ZXONE 8300&8500&8700 Product
3
test guide Acceptance Test Guide_R1.7
Follow-up document: After reading this document, you may need the following
information.
SEQ Reference material Information
1
2
3
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Summary
Chapter Description
1 Project Acceptance Organization Describes the personnel involved in the acceptance test.
2 Board Test Describes the single-system test specifications
3 System Test Describes the system test specifications
4 Acceptance Check Conclusion Conclusion
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TABLE OF CONTENTS
2 Board Test........................................................................................................2
2.1 Primary Power Supply Test................................................................................2
2.2 Fan Test............................................................................................................. 2
2.3 Alarm Functions Test..........................................................................................3
2.4 Optical Interface Test Records of the SOTU2.5G Board on the Line Side..........3
2.5 Optical Interface Test Records of the SOTU2.5G Board on the Client Side.......4
2.6 Optical Interface Test Records of the
SOTU10G/OTU10G/EOTU10G/EOTU10GB (for SDH/OTN Service) On the
Line Side...........................................................................................................4
2.7 Optical Interface Test Records of the
SOTU10G/OTU10G/EOTU10G/EOTU10GB Board (for SDH/OTN Service) on
the Client Side...................................................................................................5
2.8 Optical Interface Test Records of the SOTU10G/OTU10G/
EOTU10G/EOTU10GB Board (for Data Service) on the Line Side....................6
2.9 Optical Interface Test Records of the
SOTU10G/OTU10G/EOTU10G/EOTU10GB Board (for Data Service) on the
Client Side......................................................................................................... 6
2.10 Optical Interface Test Records of the SRM41 Board on the Line Side...............7
2.11 Optical Interface Test Records of the SRM41 Board on the Client Side.............7
2.12 Optical Interface Test Records of the SRM42 Board on the Line Side...............8
2.13 Optical Interface Test Records of the SRM42 Board on the Client Side.............8
2.14 Optical Interface Test Records of the GEM2/GEMF/GEM8 Board on the Line
Side................................................................................................................... 9
2.15 Optical Interface Test Records of the GEM2/GEMF/GEM8 Board on the Client
Side................................................................................................................. 10
2.16 Optical Interface Test Records of the SDSA Board on the Line Side................10
2.17 Optical Interface Test Records of the SDSA Board on the Client Side..............11
2.18 Optical Interface Test Records of the DSAC Board on the Client Side.............12
2.19 Optical Interface Test Records of the ASMA/B Board on the Line Side............12
2.20 Optical Interface Test Records of the ASMA/B Board on the Client Side..........13
2.21 Optical Interface Test Records of the SAUC Board on the Client Side.............14
2.22 Optical Interface Test Records of the COM/COMB Board on the Client Side...14
2.23 Optical Interface Test Records of the SMUBC Board on the Client Side..........15
2.24 Optical Interface Test Records of the SMUBC Board on the Client Side..........16
2.25 Optical Interface Test Records of the M2&M3CO2/M1&M2&M3&M4CQ2/M1CX2
Boards on the Customer Side..........................................................................17
2.26 Optical Interface Test Records of the M2&M3LO2/M1&M2&M3&M4LQ2 Boards
on the Line Side..............................................................................................18
2.27 Optical Interface Test Records of the CD2 Board on the Client Side................19
2.28 Optical Interface Test Records of the LD2/M2LD2B Board on the Line Side....20
2.29 Optical Interface Test Records of the M1&M2TST3 Board on the Line Side....20
2.30 Optical Interface Test Records of the M1&M2TST3 Board on the Client Side. .21
2.31 Optical Interface Test Records of the M1&M2MQT3 Board on the Line Side...22
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2.32 Optical Interface Test Records of the M1&M2MQT3 Board on the Line Side...22
2.33 Optical Interface Test Records of the M2&M3CS3 Board on the Client Side....23
2.34 Optical Interface Test Records of the M2&M3LS3 Board on the Line Side.......24
2.35 Optical Interface Test Records of the FCA Board on the Line Side..................25
2.36 Optical Interface Test Records of the FCA Board on the Client Side................25
2.37 Optical Interface Test Records of the MOM2 Board on the Line Side...............26
2.38 Optical Interface Test Records of the MOM2 Board on the Client Side............27
2.39 Optical Interface Test Records of the M1&M2 MQA1/M1MQM1 Condensation
Wave 2.5-G Boards (Multiple Services) on the Line Side................................29
2.40 Optical Interface Test Records of the M1&M2 MQA1/M1MQM1 Condensation
Wave 2.5-G Boards (Multiple Services) on the Customer Side........................29
2.41 Optical Interface Test Records of the M1&M2 MQA2/M1MQM2 Condensation
Wave 10-G Boards (Multiple Services) on the Line Side.................................31
2.42 Optical Interface Test Records of the M1&M2 MQA2/M1MQM2 Condensation
Wave 10-G Boards (Multiple Services) on the Customer Side.........................32
2.43 Optical Interface Test Records of the M1 MJA/MJM Boards on the Customer
Side................................................................................................................. 34
2.44 Optical Interface Test Records of the M1 TD2C/TS2C/TS2CP Condensation
Wave (10-G SDH Service/Data Service) Boards on the Line Side...................36
2.45 Optical Interface Test Records of the M1 TD2C/TS2C/TS2CP Condensation
Wave (10-G SDH Service) Board on the Customer Side.................................36
2.46 Optical Interface Test Records of the M1 TD2C/TS2C/TS2CP Condensation
Wave (10-G Data Service) Board on the Customer Side.................................37
2.47 Optical Interface Test Records of the M2&M3 CH1 Boards on the Customer Side
37
2.48 Optical Interface Test Records of the M2&M3 TS4 Boards on the Line Side....39
2.49 Optical Interface Test Records of the M2&M3 TS4 Boards on the Customer Side
40
2.50 Optical Interface Test Records of the M2 MX2 Board on the Line Side............42
2.51 Optical Interface Test Records of the M2 MX2 Board on the Customer Side. . .42
2.52 Optical Interface Test Records of the M2 LS4 Board on the Line Side.............44
2.53 Optical Interface Test Records of the M2 CS4 Board on the Line Side............44
2.54 Test Record of the OMU Board........................................................................46
2.55 Test Record of the ODU Board........................................................................49
2.56 Test Record of the VMUX Board......................................................................52
2.57 Test Record of the OAD/SOAD Board..............................................................53
2.58 Test Record of the OGMD/SOGMD Board.......................................................56
2.59 Test Record of the OCI Board..........................................................................56
2.60 Test Record of the SDMT Board......................................................................57
2.61 Test Record of the SDMR Board......................................................................57
2.62 Test Record of the PDU Board.........................................................................57
2.63 Test Record of the WBU Board........................................................................58
2.64 Test Record of the WSUD Board......................................................................58
2.65 Test Record of the WSUA Board......................................................................59
2.66 Test Record of the LAC Board.........................................................................60
2.67 Test Record of the OA Board...........................................................................60
2.68 Test Record of the DRA Board.........................................................................61
2.69 Test Record of the SOSC/SOSCB Board.........................................................61
2.70 Test Record of the SOP Board.........................................................................62
2.71 Test Record of the SOPCS Board....................................................................62
2.72 Test of OTN Functions.....................................................................................63
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3 System Test....................................................................................................64
3.1 MPI-R and MPI-S.............................................................................................64
3.2 Protection Test.................................................................................................65
3.3 BER and Performance Test..............................................................................65
3.4 Layer-2 Switching Test.....................................................................................66
3.5 IP Phone System Test......................................................................................67
3.6 ROADM System Test.......................................................................................67
3.7 WASON System Test.......................................................................................68
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Arrangement Participants:
of the User’s
Personnel
Person in charge:
Arrangement Participants:
of ZTE’s
Personnel
Person in charge:
Arrangement
of Project Participants:
Supervisor’s
Personnel:
Person in charge:
Arrangement
of Participants:
Constructor’s
Personnel
Remarks
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2 Board Test
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
status indication
information.
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Optical I16≤-18dBm
Passed
2-5-2 receiver S16.1&S16.2≤-18dBm
sensitivity Failed
L16.1&L16.2≤-28dBm
Overload I16≥-3dBm
Passed
2-5-3 optical S16.1&S16.2≥0dBm
power Failed
L16.1&L16.2≥-9dBm
Maximum B1: 0.3UI Passed
2-5-4
output jitter B2: 0.1UI Failed
Maximum Passed
In accordance with the
2-5-5 input jitter
G.783 template Failed
tolerance
Jitter Passed
In accordance with the
2-5-6 transfer
G.783 template Failed
function
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
jitter B2: 0.1UI Failed
Maximum input Satisfies the Passed
2-11-5
jitter tolerance G.783 template; Failed
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
Optical I-1.1/I-4.1:≤-23dBm Passed
2-13-2 receiver
sensitivity SI-1.1/S-4.1:≤-28dBm Failed
Jitter Passed
satisfies the G.783
2-13-6 transfer
template; Failed
function
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Test
Test Test Conclusio Remark
Test Criteria Resul
No. Object n s
t
1000BASE-LX: ≥-3dBm
1000BASE-(LH,LH1,LH2): ≥-
3dBm
power 1000BASE-ZX: ≥-3dBm
1000BASE-EX: ≥-10dBm
FC service:
100-M6/M5-SN-I:≥0dBm
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Test
Test Test Conclusio Remark
Test Criteria Resul
No. Object n s
t
GE service:
1000BASE-SX: ≤-17dBm
1000BASE-LX: ≤-19dBm
1000BASE-LH: ≤-19dBm
1000BASE-LH1: ≤-18dBm
Optical 1000BASE-LH2: ≤-15dBm
2-22- receiver 1000BASE-ZX: ≤-18dBm Passed
2 sensitivit 1000BASE-EX: ≤-30dBm Failed
y SDH service:
I16:≤-18dBm
S16.1:≤-18dBm
S16.2:≤-18dBm
L16.1:≤-27dBm
L16.2:≤-28dBm
GE service:
1000BASE-SX: ≥0dBm
1000BASE-LX: ≥-3dBm
1000BASE-(LH,LH1,LH2): ≥-
3dBm
Overloa 1000BASE-ZX: ≥-3dBm
2-22- Passed
d optical 1000BASE-EX: ≥-10dBm
3 Failed
power SDH service:
I16:≥-3dBm
S16.1:≥0dBm
S16.2:≥0dBm
L16.1:≥-9dBm
L16.2:≥-9dBm
Maximu B1: 0.3UI Passed
2-22-
m output
4 B2: 0.1UI Failed
jitter
Maximu
m input SDH satisfies the G.783 template; Passed
2-22-
jitter OTN satisfies the G.8251
5 Failed
toleranc template;
e
Jitter SDH satisfies the G.783 template; Passed
2-22-
transfer OTN satisfies the G.8251
6 Failed
function template;
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
SDH service:
I64.1: ≤ -11 dBm
S64.2a: ≤ -18 dBm
S64.2b: ≤ -14 dBm
Optical Passed
2-25-2 receiver S64.2c: ≤ -26 dBm
sensitivity 10 GE service: Failed
10GBASE-LR/LW: ≤
-12.6 dBm
10GBASE-ER/EW :
≤ -14.1 dBm
SDH service:
I64.1: ≥ -1 dBm
S64.2a: ≥ -8 dBm
S64.2b: ≥ -1 dBm
Overload Passed
2-25-3 optical S64.2c: ≥ -9 dBm
power 10 GE service: Failed
10GBASE-LR/LW: ≥
+0 .5 dBm
10GBASE-ER/EW :
≥ -1 dBm
Maximum B1: 0.3UI Passed
2-25-4
output jitter B2: 0.1UI Failed
SDH: Satisfies the
Maximum G.783 template Passed
2-25-5 input jitter
tolerance OTN: Satisfies the Failed
G.8251 template
SDH: Satisfies the
Jitter G.783 template Passed
2-25-6 transfer
function OTN: Satisfies the Failed
G.8251 template
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Test
Test Test Conclusio
Test Criteria Resul Remarks
No. Object n
t
10GBASE-ER/EW :≥-1 dBm
Maximu B1: 0.3UI Passed
2-27-
m output
4 B2: 0.1UI Failed
jitter
Maximu SDH satisfies the G.783
2-27- m input template; Passed
5 jitter OTN satisfies the G.8251 Failed
tolerance template;
SDH satisfies the G.783
Jitter template; Passed
2-27-
transfer
6 OTN satisfies the G.8251 Failed
function
template;
Side-mode Passed
2-28-6 suppression ≥ 35dB
ratio Failed
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Test
Test Test Conclusio Remark
Test Criteria Resul
No. Object n s
t
e
Jitter SDH satisfies G.783 template; Passed
2-33-
transfer
7 OTN satisfies G.8251 template Failed
function
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Test
Test Test Conclusio Remark
Test Criteria Resul
No. Object n s
t
200-SM-LC-L:≥0dBm
400-SM-LC-L:≥-1dBm
GE service:
1000BASE-SX: ≥0dBm
1000BASE-LX: ≥-3dBm
1000BASE-(LH,LH1,LH2): ≥-
3dBm
1000BASE-ZX: ≥-3dBm
1000BASE-ZX: ≥-10dBm
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Test
Test Test Conclusio Remark
Test Criteria Resul
No. Object n s
t
S16.1:-5~0dBm
L16.1:-2~+3dBm
L16.2:-2~+3dBm
FC service:
100-SM-LC-L: -9~-3 dBm
200-SM-LC-L : -11~-3dBm
Optical
Power GE service:
1000BASE-SX: -9.5~-3dBm
1000BASE-LX: -11~-3dBm
1000BASE-(LH,LH1,LH2):-9.5~-
3dBm
1000BASE-ZX:0~+5dBm
1000BASE-EX:0~+5dBm
SDH service:
I16:≤-18dBm
S16.1:≤-18dBm
L16.1:≤-27dBm
L16.2:≤-28dBm
FC service:
Optical 100-SM-LC-L : ≤-18dBm
2-38- receiver 200-SM-LC-L: ≤-18dBm Passed
2 sensitivit GE service: Failed
y 1000BASE-SX: ≤-17dBm
1000BASE-LX: ≤-19dBm
1000BASE-LH: ≤-19dBm
1000BASE-LH1: ≤-18dBm
1000BASE-LH2: ≤-15dBm
1000BASE-ZX: ≤-18dBm
1000BASE-ZX: ≤-30dBm
SDH service:
I16:≥-3dBm
S16.1:≥0dBm
L16.1:≥-9dBm
L16.2:≥-9dBm
FC service:
Overloa 100-SM-LC-L: ≥-3dBm Passed
2-38-
d optical 200-SM-LC-L:≥0dBm
3 Failed
power GE service:
1000BASE-SX: ≥0dBm
1000BASE-LX: ≥-3dBm
1000BASE-(LH,LH1,LH2): ≥-
3dBm
1000BASE-ZX: ≥-3dBm
1000BASE-ZX: ≥-10dBm
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Test
Test Test Conclusio Remark
Test Criteria Resul
No. Object n s
t
Maximu B1: 0.3UI Passed
2-41-
m output
4 B2: 0.1UI Failed
jitter
Maximu
m input SDH satisfies the G.783 template; Passed
2-38-
jitter OTN satisfies the G.8251
5 Failed
toleranc template;
e
Jitter SDH satisfies the G.783 template; Passed
2-38-
transfer OTN satisfies the G.8251
6 Failed
function template;
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Maximum Passed
Satisfies the G.783
2-40-5 input jitter
template Failed
tolerance
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Side-mode Passed
2-41-6 suppression ≥ 35dB
ratio Failed
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Maximum Passed
Satisfies the G.783
2-42-5 input jitter
template Failed
tolerance
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Maximum Passed
Satisfies the G.783
2-43-5 input jitter
template Failed
tolerance
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Side-mode Passed
2-44-6 suppression ≥ 35dB
ratio Failed
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
Maximum Passed
2-48-5 spectrum width ≤ 1nm
(-20 dB) Failed
Side-mode Passed
2-48-6 suppression ≥ 35dB
ratio Failed
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Test
Test Conclusio
Test Object Test Criteria Resul Remarks
No. n
t
100GBASE
LR4/ER4 module
indexes:
4*25G/28G
Lane0: 1295.56
nm (range:
1294.53 to
1296.59 nm)
Lane1: 1300.05
nm (range:
1299.02 to
1301.09 nm)
Lane2: 1304.58
nm (range:
Center 1303.54 to
frequency/frequen 1305.63 nm) Passed It is
2-49-
cy and frequency Lane3: 1309.14 recommended
2 Failed
shift of the nm (range: not to test it.
transmitter 1308.09 to
1310.19 nm)
100GBASE
LR10 module
indexes: 10*10G
1520 – 1526,
1528 – 1534
1536 – 1542,
1544 – 1550
1552 – 1558,
1560 – 1566
1568 – 1574,
1576 – 1582
1584 – 1590,
1592 – 1598
100GBASE-LR4:
≤ -2.6 dBm
100GBASE-ER4: Passed
2-49- Optical receiver
≤ -11.4 dBm
3 sensitivity Failed
100GBASE-
LR10: ≤ -2.6
dBm
100GBASE-
LR4≥ +10.5 There is no
dBm overload even
2-49- Overload optical 100GBASE- Passed if a board is
4 power ER4≥ +8.9 dBm Failed self-loop. It is
100GBASE- recommended
LR10≥ +10.5 not to test it.
dBm
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Test
Test Conclusio
Test Object Test Criteria Resul Remarks
No. n
t
100GBASE-LR4:
-4.3 dBm – +4.5
dBm
Average optical 100GBASE-ER4: Passed It is
2-49-
transmit power of -2.9 dBm – +2.9 recommended
5 Failed
a single channel dBm not to test it.
100GBASE-
LR10: -8.2 dBm
– +0.5 dBm
100GBASE-LR4:
≤ -8.6 dBm
Optical receiver 100GBASE-ER4: Passed It is
2-49-
sensitivity of a ≤ -21.4 dBm recommended
6 Failed
single channel 100GBASE- not to test it.
LR10: ≤ -12.6
dBm
Side-mode Passed
2-50-6 suppression ≥ 35dB
ratio Failed
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
SDH: Satisfies the
Jitter G.783 template Passed
2-51-6 transfer
function OTN: Satisfies the Failed
G.8251 template
Side-mode Passed
2-52-6 suppression ≥ 35dB
ratio Failed
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Test
Test Conclusio
Test Object Test Criteria Resul Remarks
No. n
t
100GBASE
LR4/ER4 module
indexes:
4*25G/28G
Lane0: 1295.56
nm (range:
1294.53 to
1296.59 nm)
Lane1: 1300.05
nm (range:
1299.02 to
1301.09 nm)
Lane2: 1304.58
nm (range:
1303.54 to
Center 1305.63 nm)
frequency/frequen Passed It is
2-53- Lane3: 1309.14
cy and frequency recommended
2 nm (range: Failed
shift of the not to test it.
transmitter 1308.09 to
1310.19 nm)
100GBASE
LR10 module
indexes:
10*10G
1520 – 1526,
1528 – 1534
1536 – 1542,
1544 – 1550
1552 – 1558,
1560 – 1566
1568 – 1574,
1576 – 1582
1584 – 1590,
1592 – 1598
100GBASE-LR4:
≤ -2.6 dBm
100GBASE-ER4: Passed
2-53- Optical receiver
≤ -11.4 dBm
3 sensitivity Failed
100GBASE-
LR10: ≤ -2.6
dBm
100GBASE-
LR4≥ +10.5 There is no
dBm overload even
Passed if a board is
2-53- Overload optical 100GBASE- self-loop.
4 power ER4≥ +8.9 dBm Failed
It is
100GBASE- recommended
LR10≥ +10.5 not to test it.
dBm
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Test
Test Conclusio
Test Object Test Criteria Resul Remarks
No. n
t
100GBASE-LR4:
-4.3 dBm – +4.5
dBm
Average optical 100GBASE-ER4: Passed It is
2-53-
transmit power of -2.9 dBm – +2.9 recommended
5 Failed
a single channel dBm not to test it.
100GBASE-
LR10: -8.2 dBm
– +0.5 dBm
100GBASE-LR4:
≤ -8.6 dBm
Optical receiver 100GBASE-ER4: Passed It is
2-53-
sensitivity of a ≤ -21.4 dBm recommended
6 Failed
single channel 100GBASE- not to test it.
LR10: ≤ -12.6
dBm
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Tes
Test t Conclu
Test Object Test Criteria Remarks
No. Res sion
ult
Ch20
Ch21
Ch22
Ch23
Ch24
Ch25
Ch26
Ch27
Ch28
Ch29
Ch30
Ch31
Ch32
Ch33
Ch34
Ch35
Ch36
Ch37
Ch38
Ch39
Ch40
Biggest difference between Passed
2-54-2 insertion losses of ≤3dB
channels
Failed
Ch1-Ch2
Ch2-Ch3
Ch3-Ch4
Ch4-Ch5
Ch5-Ch6
Ch6-Ch7
Isolation of Passed
2-54-3 adjacent Ch7-Ch8 ≥22 dB
channels Ch8-Ch9 Failed
Ch9-Ch10
Ch10-Ch11
Ch11-Ch12
Ch12-Ch13
Ch13-Ch14
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Tes
Test t Conclu
Test Object Test Criteria Remarks
No. Res sion
ult
Ch14-Ch15
Ch15-Ch16
Ch16-Ch17
Ch17-Ch18
Ch18-Ch19
Ch19-Ch20
Ch20-Ch21
Ch21-Ch22
Ch22-Ch23
Ch23-Ch24
Ch24-Ch25
Ch25-Ch26
Ch26-Ch27
Ch27-Ch28
Ch28-Ch29
Ch29-Ch30
Ch30-Ch31
Ch31-Ch32
Ch32-Ch33
Ch33-Ch34
Ch34-Ch35
Ch35-Ch36
Ch36-Ch37
Ch37-Ch38
Ch38-Ch39
Ch39-Ch40
Chx-Ch3 X
indicates
Chx-Ch4
an
Chx-Ch5 integer
Chx-Ch6 ranging
from 1 to
Isolation of Chx-Ch7
Passed 40. Test
non-adjacent
2-54-4 Chx-Ch8 ≥25 dB this item
channels
Chx-Ch9 repeatedl
(Channel 1) Failed y at
Chx-Ch10 different
Chx-Ch11 ports.
However,
Chx-Ch12 the X
Chx-Ch13 cannot
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Tes
Test t Conclu
Test Object Test Criteria Remarks
No. Res sion
ult
Chx-Ch14
Chx-Ch15
Chx-Ch16
Chx-Ch17
Chx-Ch18
Chx-Ch19
Chx-Ch20
Chx-Ch21
Chx-Ch22
Chx-Ch23
Chx-Ch24
Chx-Ch25
Chx-Ch26
Chx-Ch27
be set to
Chx-Ch28 a value
Chx-Ch29 the same
as the
Chx-Ch30 number
Chx-Ch31 of the
port or
Chx-Ch32
that of
Chx-Ch33 adjacent
Chx-Ch34 ports of
the port
Chx-Ch35 X.
Chx-Ch36
Chx-Ch37
Chx-Ch38
Chx-Ch39
Chx-Ch40
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Isolation of Ch19-Ch20
Passed
2-55-3 adjacent Ch20-Ch21 ≥25 dB
channels Failed
Ch21-Ch22
Ch22-Ch23
Ch23-Ch24
Ch24-Ch25
Ch25-Ch26
Ch26-Ch27
Ch27-Ch28
Ch28-Ch29
Ch29-Ch30
Ch30-Ch31
Ch31-Ch32
Ch32-Ch33
Ch33-Ch34
Ch34-Ch35
Ch35-Ch36
Ch36-Ch37
Ch37-Ch38
Ch38-Ch39
Ch39-Ch40
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EONA2520:25d
B
EONA3320:33d
B
SEOLA2220:22d
B
Passed
2-67-4 Gain flatness ≤±1 dB
Failed
Passed
2-67-5 Gain Tilt ≤2dB/dB
Failed
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Test Test
Test Object Test Criteria Conclusion Remarks
No. Result
120km SFP:-
8dBm
140Km SFP:-
8dBm
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The functions of
Testing OPUk setting and Passed
2-72-1
Overhead monitoring OPUk Failed
overhead
The functions of
Testing ODUk setting and Passed
2-72-2
overhead monitoring ODUk Failed
overhead
The functions of
Testing OTUk setting and Passed
2-72-3
Overhead monitoring OTUk Failed
overhead
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3 System Test
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User’s
Representative
ZTE’s
Representative
Project
Supervisor’s
Representative
Constructor’s
Representative
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