Technique for shaping scanning tunneling microscope tips

P. J. Bryant, H. S. Kim, Y. C. Zheng, and R. Yang

Citation: Review of Scientific Instruments 58, 1115 (1987); doi: 10.1063/1.1139618

View online: http://dx.doi.org/10.1063/1.1139618
View Table of Contents: http://scitation.aip.org/content/aip/journal/rsi/58/6?ver=pdfcov
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 Technique for shaping scanning tunneling microscope tips
P. J. Bryant, H. S. Kim, Y. C. Zheng, and R. Yang
Physics Department, University 0/ Missouri-Kansas City, Kansas City, l1;fissouri 64110
(Received 31 December 1986; accepted for publication 10 February 1987)

Two innovations have been applied to improve a method developed earlier for the production
of field-ion tips. The new technique produces sharper, smaller tips with low-aspect ratio shanks
to fulfill the specific needs of scanning tunneling microscopy.

Extremely sharp metal tips with low-aspect ratio shanks, to
minimize vibrations, are needed for scanning tunneling mi-
croscopy (STM) use. Ideally, the tip should have a sharp,
strong asperity to focus tunneling current on a sample area
of approximately 4 A2 to produce atomically resolved im-
ages. However, the process of electropolishing removes
asperities to produce relatively smooth hemispherical tips of
0.1-1. O-,um radii.
The technique described here produces sharp, work~
hardened asperities by a plastic deformation of a tungsten
wire and protects that ideal shape from electropolishing. The
method proceeds in the steps, illustrated in Fig. 1, as follows.
( 1) A tungsten wire center electrode is tapered near the low-
- _.
- .-
\
1- ~- -
r- -
FIG. 1. A pretapered O.6-mm tungsten wire (W) held by a micromanipula-
tor with end protected in air column while the shank is etched in 3%-5%
acqueous KOH. after dropping off the lower end is caught by the foam to
avoid damage afthe tip.
er end by direct electrochemical polishing in a 3%-5%
KOH solution. A 20-V ac potential is applied for initial
shaping. (2) The tip region is then protected from etching by
insertion into an air column, which is trapped in the 1.3~mm
Ld. of a glass capillary by the high surface tension of the
aqueous KOH solution. (3) Etching of the shank proceeds
until the tensile strength of the notched region can no longer
sustain the weight ofthe small lower end. The applied poten-
tial is reduced toward zero as the tip shank diminishes in
size. The etching current is approximately 1 rnA or less. (4)
Plastic deformation and work hardening I during the tensile
shearing of the shank should produce the strong asperities
desired.
Similar procedures leading to a drop off of the lower end
have been reported. The most similar was the use by Melmed
of an electrolyte droplet which forms a gas bubble around
the tip; for a comprehensive review see Ref. 1. There are two
important factors introduced here. First, the use of an air
column eliminates some problems, described earlier,l and
allows controlled shaping of the probe shank Second, the
small end which drops off is employed as the STM tip rather
than the upper probe, as in the earlier field ion applications.
These differences are crucial. The lower end disconnects
from the voltage of the upper electrode upon breaking away,
so that etching ceases leaving the sharp, desired asperities
intact. Continued etching of the upper electrode removes the
sharp asperities quickly. The upper electrode can remain
sharp enough for field ion use if further blunting is stopped
by an automated electronic shut-off control. However, that
precaution does not save the very sharp asperities desired for
STM. Evidence of the size of the tungsten tips has been ob-
tained from transmission electron micrographs. Tip diame-
ters are approximately 50 A. Smaller asperities are not re-
solved.
The use of the small drop-off end has been a serendipi-
tous innovation; it originally fulfilled the need for sharp
STM tips, now it is also providing the probes of small total
dimensions required for a new miniature STM design.
IE. W. Muller and T. T. Tsang, Field fon l'Jicroscopy (American Elsevier,
New York, 1969).

11 15 Rev. Sc!.lnstrum. 58 (6), June 1987 0034-6746/811061115-01$01.30 @ 1987 American Institute of Physics 1115

Reuse of AIP Publishing content is subject to the terms at: https://publishing.aip.org/authors/rights-and-permissions. Download to IP: 200.17.35.80 On: Wed, 06 Apr 2016
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