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Circuit Characterization
and Performance
Estimation
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Resistance Estimation
• The resistance of uniform slab of
conducting material may be defined as
l
R
t w
where resistivity
t thicknes
l conductor length
w conductor width
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Resistance Estimation
• It also can be given as
l
R RS
w
where Rs is the sheet resistance having
units of Ω/square
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Resistance Estimation
• Thus to obtain the resistance of a
conductor on a layer, multiply the sheet
resistance Rs by the ratio of the length to
width of the conductor
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Resistance Estimation
• The
resistances
are equivalent
since the ratio
of length to
width is equal
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Resistance Estimation
• Typical
sheet
resistances
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Resistance Estimation
• The channel resistance may be given by
L
Rc k
W
1
Where k
cox Vgs Vt
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Resistance Estimation
• Resistance
of non-
rectangular
regions
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Resistance Estimation
• Resistance
of non-
rectangular
regions
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Resistance Estimation
• Table 4.2
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Resistance Estimation
Contacts and via resistance
• The resistance associated with them is
dependent on the contacted materials and
proportional to the area of the contact
• Reducing the contact size will increase the
resistance
• Typical range: 0.25 to few tens of Ωs
• For low resistance interlayer connections
multiple contacts are used
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Capacitance Estimation
• Dynamic response depends upon parasitic
capacitances
• Interconnection capacitances are formed
by metal, poly, and diffusion wires
• Total capacitance consists of
– Gate capacitance
– Diffusion capacitance
– Routing capacitance
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o Si
Cdep A
d
where d depletion layer depth
Si dielectric cons tan t of silicon, 12
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CoCdep
C gb
Co Cdep
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CoCdep
C gb Cmin High frequency
Co Cdep
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1 SiO2 0
C gd C gs A
2 tox
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2 SiO2 0
A
3 tox
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