solidi
physica
Phys. Status Solidi B 246, No. 11–12, 2562–2567 (2009) / DOI 10.1002/pssb.200982329
status
b
www.pss-b.com
basic solid state physics
Elastic and frictional properties of
graphene
1 1 2 2 1 ,1
Changgu Lee , Xiaoding Wei , Qunyang Li , Robert Carpick , Jeffrey W. Kysar , and James Hone*
1
Mechanical Engineering, Columbia University, New York, NY 10025, USA
2
Mechanical Engineering, University of Pennsylvania, Philadelphia, PA 19104, USA
* Corresponding author: e-mail jh2228@columbia.edu, Phone: þ1 212 854 6244, Fax: þ1 212 854 3304
We describe studies of the elastic properties and frictional material. Experiments on samples with 1–3 atomic layers yield
characteristics of graphene samples of varying thickness using similar values for the intrinsic stiffness and strength of a single
an atomic force microscope. For tensile testing, graphene is sheet, but also reveal differences in mechanical behavior with
suspended over micron-sized circular holes and indented by thickness. The frictional force between an AFM tip and
atomic force microscope (AFM) tips. Fitting of the force- graphene decreases with thickness for samples from 1 to 4
displacement curves yields the prestress and elastic stiffness, layers, and does not depend on the presence of a substrate. High-
while comparison of the breaking force to simulation gives the resolution friction force imaging in stick-slip mode shows the
ultimate strength, which is the highest measured for any same trend, and allows direct imaging of the crystal lattice.
solidi
physica
status
2564 C. Lee et al.: Elastic and frictional properties of graphene
solidi
physica
status
2566 C. Lee et al.: Elastic and frictional properties of graphene
almost defect-free state of monolayer graphene. The [6] A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi,
measurement is possible because the area under high strain M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov,
is concentrated near the AFM tip, and is therefore unlikely to S. Roth, and A. K. Geim, Phys. Rev. Lett. 97, 187401 (2006).
have defects. Friction forces measured on mechanically [7] M. Tortonese and M. Kirk, Proc. SPIE 3009, 53 (1997).
exfoliated graphene decrease with thickness. Our obser- [8] R. N. Thurston and K. Brugger, Phys. Rev. 133, A1604
(1964).
vations exclude substrate effects, adhesion force variation,
[9] F. Liu, P. M. Ming, and J. Li, Phys. Rev. B 76, (2007).
scan rate, and load as possible explanations for the decrease
[10] K. Roopam, L. M. Steven, T. P. Jeffrey, Z. Sulin, B. Roberto,
in friction with increasing thickness. A rippling-rug effect is C. S. George, and B. Ted, Phys. Rev. B 75, 075412
proposed as a possible explanation for this phenomenon. We (2007).
are conducting more experiments and theoretical investi- [11] R. Al-Jishi and G. Dresselhaus, Phys. Rev. B 26, 4514
gations to test this hypothesis. (1982).
[12] J. F. Nye, Physical Properties of Crystals (Oxford University
Press, USA, 1985).
Acknowledgements We thank S. Berciaud for Raman [13] K.-T. Wan, S. Guo, and D. A. Dillard, Thin Solid Films 425,
spectroscopy of the graphene samples, and Namiki Inc. for AFM 150 (2003).
cantilevers, Jenny Hay and Warren Oliver (MTS Nano Instruments) [14] U. Komaragiri, M. R. Begley, and J. G. Simmonds, J. Appl.
for useful interactions, and Prof. Ju Li for helpful discussions. We Mech. 72, 203 (2005).
acknowledge support from the National Science Foundation under [15] O. L. Blakslee, J. Appl. Phys. 41, 3373 (1970).
awards CHE-0117752, CMMI-0500239, NSF grant CMMI- [16] N. M. Bhatia and W. Nachbar, Int. J. Non-lin. Mech. 3, 307
0800154, and DMR-0650555; the DARPA Center on Nanoscale (1968).
Science and Technology for Integrated Micro/Nano- [17] C. Lee, X. Wei, J. W. Kysar, and J. Hone, Science 321, 385
Electromechanical Transducers (iMINT, Award No: HR0011-06- (2008).
1-0048); AFOSR grant FA9550-06-1-0214; and New York State [18] B. Lawn, Fracture of Brittle Solids, second ed. (Cambridge
Office of Science, Technology, and Academic Research University Press, Cambridge, 1993).
(NYSTAR). This work used shared experimental facilities [19] C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang,
supported primarily by the MRSEC Program of the NSF under Phys. Rev. Lett. 59, 1942 (1987).
award DMR-0213574. [20] S. N. Medyanik, W. K. Liu, I.-H. Sung, and R. W. Carpick,
Phys. Rev. Lett. 97, 136106 (2006).
[21] J. C. Meyer, A. K. Geim, M. I. Katsnelson, K. S. Novoselov,
T. J. Booth, and S. Roth, Nature 446, 60 (2007).
References [22] S. V. Morozov, K. S. Novoselov, M. I. Katsnelson,
[1] B. Peng, M. Locascio, P. Zapol, S. Li, S. L. Mielke, G. C. F. Schedin, L. A. Ponomarenko, D. Jiang, and A. K. Geim,
Schatz, and H. D. Espinosa, Nature Nanotechnol. 3, 626 Phys. Rev. Lett. 97, 016801 (2006).
(2008). [23] M. Ishigami, J. H. Chen, W. G. Cullen, M. S. Fuhrer, and
[2] U. D. Schwarz, O. Zwörner, P. Köster, and R. Wiesendanger, E. D. Williams, Nano Lett. 7, 1643 (2007).
Phys. Rev. B 56, 6987 (1997). [24] A. Fasolino, J. H. Los, and M. I. Katsnelson, Nature Mater. 6,
[3] M.-F. Yu, O. Lourie, M. J. Dyer, K. Moloni, T. F. Kell, and 858 (2007).
R. S. Ruoff, Science 287, 637 (2000). [25] G. A. Tomlinson, Philos. Mag. 7, 905 (1929).
[4] P. Nemes-Incze, Z. Osváth, K. Kamarás, and L. P. Biró, [26] T. Filleter, J. L. McChesney, A. Bostwick, E. Rotenberg,
Carbon 46, 1435 (2008). K. V. Emtsev, S. Th, K. Horn, and R. Bennewitz, Phys. Rev.
[5] K. S. Novoselov, D. Jiang, F. Schedin, T. J. Booth, V. V. Lett. 102, 086102 (2009).
Khotkevich, S. V. Morozov, and A. K. Geim, Proc. Natl. [27] F. Liu, P. Ming, and J. Li, Phys. Rev. B 76, 064120
Acad. Sci. USA 102, 10451 (2005). (2007).