FEATURES
Output Current in Excess of 1A Output Voltages of -5, -6, -8, -12, -15, -18, -24V Internal Thermal Overload Protection Short Circuit Protection Output Transistor Safe-Area Compensation 1: GND 2: Input 3: Output
ORDERING INFORMATION
Device LM79XXCT LM79XXAT Output Voltage Tolerance 4% 2% Package TO-220 Operating Temperature 0 ~ +125 C
BLOCK DIAGRAM
GND
R1 VOLTAGE REFERENCE
R2
Out +
Q1
I1
I2
In
Rev. B
mV
Line Regulation
VO
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 11V, lO = 500mA, 0C T J +125C, CI =2.2F, CO = 1F, unless otherwise specified.) Test Conditions TJ = +25C IO = 5mA to 1A, PO 15W VI = - 9 to - 21V VI = - 8 to - 25V TJ = 25C VI= - 9 to -12V TJ =+ 25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -9 to -25V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz VI = 10V TJ=+ 25C IO = 1A TJ= +25C, VI = -35V TJ= +25C Min - 5.75 - 5.7 Typ -6 -6 10 5 10 3 3 Max - 6.25 - 6.3 120 60 120 mV 60 6 0.5 1.3 -0.5 130 54 60 2 300 2.2 mA mA mV/C V dB V mA A V mV Unit
Line Regulation
Load Regulation
Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 14V, lO = 500mA, 0C T J +125C, CI =2.2F, CO = 1F, unless otherwise specified.) Test Conditions TJ =+ 25C IO = 5mA to 1A, PO 15W VI = -1.5 to -23V VI = -10.5 to -25V TJ = 25C VI= -11 to -17V TJ =+ 25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -11.5 to -25V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz VI = 10V TJ=+ 25C IO = 1A TJ=+ 25C, VI = -35V TJ=+ 25C Min - 7.7 - 7.6 Typ -8 -8 10 5 12 4 3 0.05 0.1 -0.6 175 54 60 2 300 2.2 Max - 8.3 - 8.4 100 80 160 mV 80 6 0.5 1 mA mA mV/C V dB V mA A V Unit
mV
Load Regulation Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 14V, lO = 500mA, 0C T J + 125C, CI =2.2F, CO = 1F, unless otherwise specified) Test Conditions TJ =+ 25C IO = 5mA to 1A, PO 15W VI = -1.5 to -23V VI = -10.5 to -25V TJ = 25C VI= -11 to -17V TJ =+ 25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -11.5 to -25V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz VI = 10V TJ=+ 25C IO = 1A TJ= +25C, VI = -35V TJ =+25C Min - 8.7 - 8.6 Typ - 9.0 - 9.0 10 5 12 4 3 0.05 0.1 -0.6 175 54 60 2 300 2.2 Max - 9.3 - 9.4 180 90 180 mV 90 6 0.5 1 mA mA mV/C V dB V mA A V Unit
mV
Load Regulation Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI= 18V, lO =500mA, 0C T J +125C, CI =2.2F, CO = 1F, unless otherwise specified.) Test Conditions TJ = +25C IO = 5mA to 1A, PO 15W VI = -15.5 to -27V V = -14.5 to -30V TJ = 25C I VI= -16 to -22V TJ =+ 25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -15 to -30V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz VI = 10V TJ= +25C IO = 1A TJ=+ 25C, VI = -35V TJ=+ 25C Min -11.5 -11.4 Typ -12 -12 12 6 12 4 3 0.05 0.1 -0.8 200 54 60 2 300 2.2 Max -12.5 -12.6 240 120 240 mV 120 6 0.5 1 mA mA mV/C V dB V mA A V mV Unit
Load Regulation Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 23V, IO = 500mA, 0C T J +125C, CI =2.2F, CO = 1F, unless otherwise specified.) Test Conditions TJ =+ 25C IO = 5mA to 1A, PO 15W VI = -18 to -30V VI = -17.5 to -30V TJ = 25C VI= -20 to -26V TJ =+ 25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -18.5 to -30V IO = 5mA f = 10Hz to 100Khz TA =+ 25C f = 120Hz VI = 10V TJ=+25C IO = 1A TJ=+ 25C, VI = -35V TJ=+ 25C Min -14.4 -14.25 Typ -15 -15 12 6 12 4 3 0.05 0.1 -0.9 250 54 60 2 300 2.2 Max -15.6 -15.75 300 150 300 mV 150 6 0.5 1 mA mA mV/C V dB V mA A V mV Unit
Load Regulation
Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 27V, lO = 500mA, 0C T J +125C, CI =2.2F, CO = 1F, unless otherwise specified.) Test Conditions TJ =+ 25C IO = 5mA to 1A, PO 15W VI = -22.5 to -33V TJ = 25C VI= -21 to -33V VI= -24 to -30V TJ =+ 25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -22 to -33V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz VI = 10V TJ=+ 25C IO = 1A TJ=+ 25C, VI = -35V TJ=+ 25C Min -17.3 -17.1 Typ -18 -18 15 8 15 5 3 Max -18.7 -18.9 360 180 360 mV 180 6 0.5 1 mA mA mV/C V dB V mA A V mV Unit
Load Regulation Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 33V, lO = 500mA, 0C T J +125C, CI =2.2F, CO = 1F, unless otherwise specified.) Test Conditions TJ =+25C IO = 5mA to 1A, PO 15W VI = -27 to -38V VI = - 27 to - 38V TJ = 25C VI= - 30 to - 36V TJ = +25C IO = 5mA to 1.5A TJ =+ 25C IO = 250 to 750mA TJ =+ 25C IO = 5mA to 1A VI = -27 to -38V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz VI = 10V TJ= +25C IO = 1A TJ=+ 25C, VI = -35V TJ=+25C Min - 23 - 22.8 Typ - 24 - 24 15 8 15 5 3 Max - 25 - 25.2 480 180 480 mV 240 6 0.5 1 mA mA mV/C V dB V mA A V mV Unit
Load Regulation
Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
(VI = 10V, lO = 500mA, 0C T J +125C, CI =2.2F, CO =1F, unless otherwise specified.) Characteristic Output Voltage Symbol VO Test Conditions TJ =+ 25C IO = 5mA to 1A, PO 15W VI = -7 to -20V VI = -7 to -20V IO=1A TJ =+25C VI = -8 to -12V IO=1A VI = -7.5 to -25V VI= -8 to -12V IO=1A IO = 5mA to 1.5A Load Regulation Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current VO IQ IQ VO/T VN RR VD ISC IPK TJ =+ 25C IO = 250 to 750mA TJ = +25C IO = 5mA to 1A VI = -8 to -25V IO = 5mA f = 10Hz to 100KHz TA =+ 25C f = 120Hz, IO = -35V VI = 10V TJ=+ 25C IO = 1A TJ =+ 25C, VI = -35V TJ =+ 25C Min - 4.9 - 4.8 Typ - 5.0 -5.0 5 2 7 7 10 3 3 0.05 0.1 - 0.4 40 54 60 2 300 2.2 Max - 5.1 - 5.2 50 25 50 50 100 50 6 0.5 0.8 mV mA mA mV/C V dB V mA A V Unit
mV
Line Regulation
VO
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
Load Regulation Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
Load Regulation
Quiescent Current Quiescent Current Change Temperature Coefficient of VD Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current
* Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used.
Vin=10V Io=40mA
13 11 9 7 5 3 1 -1 -3 -5
Io=1.5A
Vin=25V Io=100mA
Io=0.75A
75
100
125
-40
-25
25
50
75
100
125
Io=1A
0.6 0.55 0.5 0.45 0.4 0.35 0.3 0.25 0.2 0.15 0.1 0.05 0 -0.05 -0.1 -40 -25 0 25 50 75 100 125
TYPICAL APPLICATIONS
Notes: (1) To specify an output voltage, substitute voltage value for XX (2) Required for stability. For value given, capacitor must be solid tantalum. If aluminum electronics are used, at least ten times value shown should be selected. CI is required if regulator is located an appreciable distance from power supply filter. (3) To improve transient response. If large capacitors are used, a high current diode from input to output (1N400l or similar) should be introduced to protect the device from momentary input short circuit.
+ 15V +
KA7812 2
3 +
+12V
1N4001
0.33F + 2.2F
1F 1F +
*
GND
1N4001
1 - 15V 2 KA7912 3
*
-12V
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