Anda di halaman 1dari 77

NOT MEASUREMENT

SENSIUYE h
MIL-STWI05E
10 MAY 1989

SUPERSEDING
MIL-STD-105D
29 APRIL 1963

MILITARY STANDARD

SAMPLING PROCEDURES AND TABLES


FOR INSPECTION BY ATTRIBUTES

AMSC N/A AREA Qcil


~~~ & Approved for public reiesse; dktribution is Unlimfi


!QL-”SI’D105E

DEPA~ W DEFENSE
Washbgmn, DC 20301

SAT*LDG P~ T I!ND’ZABESFOR INSP=TI@JBYMTNBUES

1. Ttis tilitarystandad is approvedfor use by all Depsmmms and Jqencies


of - ~~~ of ~f-”
.
2. Beneficial~.ts Cemmm&tiom. additions,Wetions) and any
peeine.ntdatawhi~ may beef usein~this~ shouldbe
addressedto:

CnRInancier
Us. Amy AmamE!!!Rem-a, Dwelopnent and
‘+-king Ckmer
M-IN: SK?R-BAC-WBM!J . 6
Picatinnytisenal,NJ 07806-5000

by usi..gthe self-a=-essed&.andardizat
ion Dmmmt m~ PrepSal
(DD Fom 1426)~L-hq at the md of this docmmt or letter.

ii
MZL-S’IZ+1C5Z

mRE3m*”

ms providessawling proce&res and referwm tables for use in

on the pxobabiiis.icrecu.+mce 05 e%.ts when a sa~ies of-iots or bat~s are


produ~ ti a stableenvironmrt.

This publicationshouldbe-used to guide the user in the ~kpmnt of an


inspee.ionStratw that providesa co=. eff~ive qroach to attaining
cm-:idm~ in pro&t ~liance wi”thca%racaual te-&%i~ reqJ ats. The
user is warned of the assumedrisks relativeto the *sem sanple size and
w-.

~ifications shouldnot contakn requirement s for use of specific


Q.z?s, !23Z shxld “.!y provideAQL’s or H?D’s as a -~rmem.

pkns fc= coxinuous, ra’hr than lot inspection,are contm M

iii
~L-.STD-lO5E

GmTmTs
Page
Paragraph
1. SCOPE............................................... 1

1.1 -se ........................................... 1


1.2 *liation ....................................... 1

2. ~IxmPEurs- ............................... 1

2.1 W. qplicable .................................... 1

3. =INITIONS ......................................... 1

3.1 Acq.able Qdality Ievel WE) .................... 2


3.2 Average Outgo ~Quality(lQ) .................... 2
3.3 Averaoe OutqoingQualityWt (AOQIJ............. 2
3.4 Classificationof Defects......................... 2
3.5 CriticalDefect................................... 2
2.6 CriticalDefective................................ 2
3.7 Defect............................................ 2
3.e D@eccive................. ........................ 3
3.9 DefectsPer Ru@edUn its... ...................... 3
3.10 ~i~...... .................................. 3
3.11 ~aim by Attribxes .......................... 3
3.12 w&or Batdl...................................... 3
3.13 Im or Batch Size................................. 3
3.14 Major Defect...................................... 3
3.15 Major Defective................................... 3
3.16 Minor Defect .....................................
● 3
3.17 Minor Defeaive. .................................. 3
3.18 PercentDefective................................. 4
3.19 ~s Average................................... 4
3.20 Sanple............................................ 4
3.21 Sanple Size COde~tt=v ........................... 4
3.22 Salq?ling Plan..................................... 4
3.23 unit of Procalct................................... 4

4. ~mxm=’nm . . ... ....... ... ... . ... .. .. ...... 4

4.1 Written ~ ................................ 4


4.2 NmcVnfozmne .................................... 4
4.3 Fonmticm and Itificatim of ~ or =Cks. .. 5
4.4 ............................................... 5
4.4.1 ML use...0...........*... ........................ 5
4.4.2 Umkation ........ ...............................
● 5
4.4.3 choosingAQU ..................................... 5

iv
mL-sm-lo5E

CcNTmrs - Conttiued.
Page
Paragraph
~B~ ........................................
Sarrpling. 5
4.5.1 RepresentativeSan@.ing .......................... 5
4.5.2 The of Sanpling.................. ..............
● 5:
4.5.3 Double or MQtiple Sampling ...................... 5
4.6 ~on P~ .................... ....... ●

4.7 WitdlirlgP~ ............................. :


4.7.1 Normalto Tightened......0... .................... 6
4.7.2 Tight- to Normal .....0....
● ................... 6
4.7.3 Normalto ~ ..............*.....**...**.. .. ● 6
4.7.4 Rduced to Normal................................ 6
4.8 Disconthtion of~on... ................. “7
4.9 SanplingPlans................................... 7
4.9.1 ~ion Wvel .................0............... 7
4.9.2 Co& utters ..................................... 7
4.9.3 ~aining San@ing Plan.......................... 7
4.9.4 TYF= of sapling Pkns .......................... 8
4.10 Determinationof~ability. .................. 8
4.lC.1 P~Defective~ion. .................... 8
4.lC.1.A Single Sanql@ Plan............................. 8
4.1(?.1.2Double Sa@ing Plan............................. 8
4.10.1.3 FhltipleSanpling. Plan.......... *...............
● 8
4.10.1.4 ~ p~ for Redu*IrqeCtion ......... 8
4.10.2 DefectsPer ?lundmdt?nit s~ion ............ 9
4.11 Idniting@ality Protection.. .................... 9
4.12 ~s .................*......................... 9
4.12.1 ~t@~merkic ~ .................. 9
4.12.2 A~ge Sanple Size Comes... .................... 9

5. TABES .............*...*
...............*..
........... 11
Table
I. Sa@e Size Coda Mitters.............. o.......... 13
II-A. Single San@ing Plans for Normal-
~im Naster table)...................... 14
II-B. Single Smpliq Plms for Tightewd
~i~ ~=t~le) o..o-oooo===oo.=.e.... 15
II-C. Single Sapling Plans for ~
~ia (Mas@rtable)...................... 16
III-A. Double SamplingPlans for Normal
~i~ -a~le).. oo......o.BOO....... 17
III-B. Dcxble Sapling Plans for Tight-
~m ~er=e) ...................... 18
III-C. Double SamplimgP1.ansfor Reduced
~im (Mastertable)...................... 19

v
MIL-STW105E

mt’n’mrs- Conthued.

Page
Table
IV-A. Mltiple Sa@ing Plans for Norml
Inspectim M3ster-le) ...................... 20
IV-B. M.dtipleSanplingPlans for Tightened
~im (MastertaMe) ...................... 22
TV-c. Mdtiple SamplingPlans for ReduOed
Inspection(Mastertable)...................... 24
V-A. Average Outgoinguty IAmit F~s for
lwml~on (Sin@e Zq) .....-...o.. 26
V-B. ~ge Outgo* QualityLimit Fa=ors for
TightenedIMpeCtiOn (S=le ~1~).:...-..” 27
%3-A. uting Quality (h Perumt Def-iue) for
Wch a Pa = 10% (forNomal Inspemion,
S~le Saxrpling) ....................-..-...-*o” 28
V3-3. LimitingQuality (inDefectsper ~
Unks) for which the Pa = 10% (forNozmal
Inspection,Single Sanplhg).-..--------------- 29
XI-A. Unliziq Quality (inP~t mfecti=) fo~
khid. “thePa = 5% (forNom@ ~ionl
SingleSawling)................................ 33
VII-B. LimitingQuality (fiDefectsper Hmdma
Units) for which the Pa = 5% (f= W*
~m, Siwle S=@@ ....*.............. 31
~*~1- Li,mitNmbersfor ~ Inspection... .......... 32 “
IX. Auerage SampleSize Cumes for DDuble and
FmltipleS.mpliq .............-...--.-......-.c- 33
~ltig pl= and cparatirq~amic
Cumes (andData) for:
X-A. San@e Size ~ktter A........................ 34
X-3 . Sanple Size ~Utter B ......................... 36
x-c. Sanple Size Mkter C ..........e00-00o....... 38
X-D. San@e Size Co& LetterD ........................ 40
X-E. Sanple Size ~Utter E ........................ 42
X-F. San@e Size Mletter F ........................ 44
x-G . Sanple Size MUtter G ...............--..-..”- 46
X-H. ~le Size @ckletter H ........................ 48
X-J. qksM-~ J............*..”””””.”.” 50
X-K. Sauple Size MIetter K .......----------------- 52
X-L. ~le S~M~ L ........................ 54
x-M. Sanple Size M~M ...........e............ 56
X-N. San@eSizeM E~N . ....................... 58
x-P. Sal@esizeM wtterP . . . . . . . . . . . . . . . ..”....”. 60
x-Q. ~le S~Mk= Q.......*”+”*.==.*”+”*..= 62
X-R. ~le S@ Mk=R ..................=””~”” 64

vi
mL-sl’wlo5E

CCN’TS - Continued.

Page
x-s. ~~e size ~ ~tt~v S ........................ 66
Paragraph
6. ........*.............................. ● . . . . v

6.1 use...................................
Intf2nckci 67
6.2 Subject’I’em(keyuofi) tist~ ................” 67
6.3 ~fr~P~im Issw . . . . . . . . . . . . . . . . . . . . 67

mlmsAL. ............................. 68
F2L-S’ID-105S

1. ~~~

1.2 Pqse. This ~li=tim establisheslot or bat~ sapling plans and


proceduresfor ~ion by attributes. ‘1’nis publi=tion shallnot & irfter-
p.retedto superm3e or confli= with any amtraCtti ~ s. m words
“awqX”, “a~”, “acceptable”* e tc, refer only to the contractor’s use of
the sanplingpkms Writ- in this ~anddonotinplyana~ W
-theGove&mmnt to accept any prcdom. Deterfnination of aqability by the
Gwen ‘:=% shall k as desm~ in contractual~ts. me Sarfpling plans
*sdhd in Ws standad m awli-le to U’s of .01pe~t or ~~ and
ore not suitablefor ++lications where quality1-1s in the defemive
are‘the.ref
;az.s per million range m be realiz05.
are applicable,

a. ElrIc
items.

b. Cmponents

c. Qerations

d. Materialsin process.

e. Su@ies in storage.

f. Maintenance~ations.

9. Data or records.

h. Mmbistrative ~-

Theseplans are intendedprimarilyto be used for a continuingseries of lots


0: batches. The plans may also be used for the inspectionof isolatedlots or
Mches, W., in MS latter=, m = K =i~ to ~t ~ ~m
characteristicmrves to find a plan whichwill yieldthe desiredprotectim
(see4.11).
2.

2.1 N&. -liable.

3. =INITICNS

1
FEL-S’IW105E

3.1 z ~able QualityLevel (ML) . When a mntinuous seriesof 10Es is


considered,the AQiiis tbe qualitylevelfib, for the roses of sa@@
~.ion, is the limitof a satisfactoryprocessaverage (Se 3.19).

NOTE: A sanpl~ plan and an AQL are chosenin accordanm with the risk assured.
Useofa@ueoflQL fora a2rtain&!fector group of &fec5s indicam that the
ql~ PM till acoeptthe -t majorityof the lots or bata pbded the
prooess -X level of ~ defectiwe (or&fects per huxlred units) in these
lots or batchesbe no greaterthan the ~ignated value of A& Thus, the AQL is
a ckignated value of ~ defective (or&facts per hundredunits) for fich
btswill~a~+m~oftk timbythesaqlingp ~re bing used. The
~liw pl~ prfi~ here~ ~ ~ ~ tit ~ p~i~ty of a~
at the ~ignat~ A@ ~ue ~ ~ the sanplesize,~ Z~N ~Xr
:0= 1~~ samples -n for mall ones, for a givenAQL. The AQL alone does not
idelm=if
y the chanoes of aqing or rejectingindividual10Ls or batches M m.-
..-y
dire- ~ relates to what might be ~ed frun a seriesof lots or batches,
prm”i- * steps indi=ted h -s publi~tion aze “taken. lt is ~sary to
=eYer to the operattigdarad.=”iscic ~ of t.teplan to *texmine the relative
risks.

3.3 Average Qxqoing QualityLimit (ADQL). The M(2L is the maximum ACQ fora
9L~ a9L~~ -lW pkn. Factors for ~@? ML tiues are givm M
Tabie V-A for each of “~ singlesaqlimg plans for normal irqection and in
Table V-3 for each of the singlesmpling plans foz tightened~ “on.

3.4 ClassifimEion of Defects. A classification of defectsis t!! enumerationof


pcsstiie defects of the unit of pxduct classifiedamrdirq to their seri~.

3.5 Czlti~ DefS&. A criticaldefect is a ~fect that j~ and ~ri=ce


~mte would result in~ hazardousor unsafeconditionsfor individualsUS*,
--, or ~upontheprodwt, ora ~fecttbat~ti
experim indicate is likely to prevent perf~ of ttE ~cal fun-on of a
major * itm SU* as a Ship, aixuaft # tank, nbsile, or ~ title.

3.6 Critidl Defective. A criticalckfectiveis a unit of prockt uhi~


contti one or mre criti~ defectsti may also contdn mejor and/or minor
defects.

3.7 Defect., A defect is any nonconformanm of the unit of product with


specimTEi%@l=mts .

2
laks’m-lo5E

3.8 Def-.ive. A def=~ive is a unit of productwhich containsone or mre


defe.s.

3.5 Defe.s per HunckedUnits. The nwber of defe=s per hundred units of ~Y
gim quantityof units of productis one hundredtimes the mm&r of &fects
con=zinedtherein (one or mme *fec&s being possible in any unit of product)
diviti by the total nunberof units of product,i.e.:

Defects p“ = Nunberof &fects x 100


hundredunits Nmbar of units ~~

3.2C Impaction. Inspectionis the processof ~imt ~gt testmt


cr o-.?m.isecmparing the unit of pmdu~. with the reqair-nts.
7,1i
--- ~io~
T by Attribtes. Inspectim by attributesis inspectionwhe~
eizher ‘& unit of productis classifiedsimplyas defectiveor non+ef=eive, or
~he number of defe~.sti the unit c= prcdue.is courted,with re~st to a givm
~~:i~m or set or requirements.

3.12 tit or -t&l. The term lot ox katch shall man “inspectionlot” or
“i==se.ion batcb.”,i.e., a collee.ionof units of product from whi~ a sanple
is EC be dram and i~ed md may dif5erfrm a mll-~ion of units designated
as a 10= or bat~ for 0“= purposes (e.g., production,shipnent,etc.).
3.13 bt or Batch Size. The lot or ~t~ size is the number of units of prtib
A a lot‘0:bata.

3.14 M3jor Defect. A major defecL is a -fact, other than criti-, that is
liKelyto resultin failure,or to reducemateriallythe usabilityof the unit
of productfor its int- ~-
3.15 ~ajor * f~i~. A major defectiveis a unit of product whid? containSone
0: mre major defects,* may alSO contain rrtiordefecLsbut containsno aiti-
defect.

3.16 Minor Defect. Anbm~i.Sa&fti~t isnot-yto~


materiallythe usabilityof the unit of productfox its int- puzpose~m is e
&par&m fran ~ ~WviIgU*~@m tkeffeCtiWUSec
operatim of the unit.
3-17
--- Minor
-— . . . Def-i-.
— A minor defectiveis a unit of P-a M* ~ ~
ox more minor &facts mtamtains no aititi or major *feet.

3
!!GL-SB105!2

3.16 Per-m Defective. The percent &femive of any givm quantityof units
of produe~is one hur&4 tires the n~- of defemive units of prda~. contairEd
thereindiviti by the total mmber of units of produa, i.e.:

?ercentDefective = Nmber of &fectives x 100


~“ of lmits ~ed

3..19ProcessAverage. The Drocess average is the average~t &fective or


averagenmber of &fects pez hw@red units (whichever is ~li~le) of product
szhitted by the sq@ier for originalinspection. Originalinspectionis ~
firstinspectionof a pa.z.zicula.r
quantityof produceas d.istinguis@dfran the
~ion of productwhi~ has been resu&nittedafterprior rejection.
3.2C Sa~le. A sampleconsi=.sof one or mre u..irsof productdrawn fran a 10=
or &z&, the units of the sem@e being sele~beda= randomwithoutr- to their
q~z:icy. ~ nmtx= C: units of product in the sample is the sarplesize.
3.22 SampleSize Coae Utter. The sanple size code letter is a deviceused
ElO.ngWitihthe WA fcr l-tins a sapling plan cm a table cf semplingplans.

3.22 Sa?’@hg Plan. A sanplingplan indc!caces


the nunt?erof units of product
fromeat’.io= or bat&. which m ad (sanplesize or seriesof
to be insoect
sa@e sizes)and the criteriafor cke.rmi.%ngthe acceptabilityof the lot or
batch (acceptan02anc rejectionnumbers).
?.23 ‘Unitof Prodxz . The unit of produ~. is the thing inspectedin o-r to
&.emme lts classif~mtion as defectiveor non-def-hive or to count the ~“
of +.fecbs. It my be a single article,a p&ir, a set, a hmgth, an =8 ~
operation,a volme, a cmpcmmt of an end product,or tlw end prociuaitself.
The unit of p~GL may or my not be the same as the unit of ~, SWPIY,
production,or sh.ipnent.

4. QN=AL RmJIm=m
4.1. Written P~ . Written p~ are o~ily davelopedami made
avaalablefor * Govemmm ~ “Ve’s~,lqmnmquast. --
writtenp~ indime me of this stmdard, they shall amply with -
mq’111
raErltsof this stmdard arxlZefermce appropriate~ as ~.

4.2 Nonconformance. ‘he extent of nonconf~ ofpro&ct sbaube=rP=-


eitherin terns Of peroentCkfectiveor in term of ckfectsper ~ titS.
MIPST’D-105E

4.3 Fo.mationand Identificationof Uts or Bat&es. Theproductshauke


as-led into i-tifiable lots, -lots, batches,or in - otkr manneras
may be paaibed . Ea* lot ox bat~ shall,as far as is practicable,mnsist
of units of prcduct of a singletype, grade, class,size, and composition,
.
manufacturedunder es-tially the sam renditions,and at ~ythesam
tine . The lots or bat- shall be itified by the contractorand shallbe ke
intar.in adequateand suitablestoragespace.

4.4 AQL.

4.4.1 AQL use. The AQL, to@ther with the SaupleSize b&
.
Letter,is used for
~
ln&?Lnc
. the sapling plans p.mcw herein.
4.4.2 Iimita:ion. The selectionor use of an AQL shallm. inplythat the
cwcractor has the right to sm@ y any defecEivewilt of product.

4.4.3 Chmshc ?@’&. Diff~t ~Ls IllSybe Chosenfor ~ of &fects


cms.ide.red
colle.+.ivel
y, or for individual&fee&s. An ML for a groupof &fec
my be tiosen in a~cion to AQM for individualdefects,or mkqraps, within
chat group. AQL values of 10.0 or less my be expressedeither in ~t
&fective or *. ~fects ~- hunckd units;those over 10.0 ZhaU be qressed ix
defe.s per h!mdmd
“ units only.
4.5 Saxlplinq.

4.5.1 Repmsmt ative (Stratified)Satrplinq.When ~ropriate, the rnzr&r of


units in the sanple shall & sel~ed in proportionto the size of subletsor
-bat-, or -s of tM lot or bat~, idmtified by q rationalcriterior
giswad,121e units
when represemathHaIcpMn franeaal Sublet,sub-batch or
part of the lot or batdi shall be select”ed
at ranch.
4.5.2 Time of San’Plhq A samplemay be dram after all the units caprising
the lot or batch have bi+enassembled,or sarrple
unitsmay be drawn duringassak
of the lot or bat~, in uhi~ case the size of the lot or M* till k *te*
kefore any ample units are dram. If tk sampleunits are drawn duringas~l~
oftklot or batda, mdif tkrejectionnmb2ris ~m!foreth lotis
Curpleted,that pomim of U lot almldy cxmpletedshallbe @ected. m a
oftkdefective ~shall bedmermined and ammctive actiontaken,after
&ichanewl otorbat*shgd.lk *.

4.5.3 Double or Mltiple Saup1~ WherI&&le or mkiple sauplingis to be


used, ea~ qle shall be selecte&Ovar the entire lot or bat~.

5
IaL-s’Iwlc5E

4.6 ~ion Pr~. Normal inspectionwink-at the startof


inspection. Normal,tightenedor redu~ -bion shall continueundwqed for
each class of def~s or &fectiws an sumsive lots ox batd7esexq. where the
%it~ p~ givm klw require -. m swit~ P~? *1
be -lied to each class of ckfecSs oz &2f_iveS ~
<Y”

4.7 %?it- P~es .

4.7.1 Normal to Tightened. ~ normal inspectionis in effect,ti@tened


*mim shallk institutedwhm 2 ouc of 2, 3, 4, or 5 comecutive lots or
batches have been rejetted on originalhspection (i.e.,ignoring~ “tted lots
0: btC!!S fOr thiS Fr~) .
4.?.2 Tig?l:enee
to No.mal. When tightened~ion is -b effect,no.mbal
inspecuon shailbe instituted*=I 5 consecutive10:s or baccbeshave -n
co.nsidey-a-ptable on original~ on.

4.7.3 No.mal to R@xed. When normal inspectionis in effect,reducedir++ion


shal1 be -.ituted providedthat all of the followi~ conditionsare satisfied:

6. Tne pretig 20 lots ox bat- (ormre, as indicatedby EYW note tc


Ta5~e VIII) have bee!!on no.mal ~ction aiidall have ben acceptedon original
inspection;and
b. The.total nurber of ckf-i= (orbf~) fi ~ ~~es ~ ~
p.re
ceding 10 lots or batches (orSU* Ot&r mmber as was used for condition“a”
-) is equal to or less than the a@i-le nmber given in TableVIII. If
dable or mikiple smpling is in use, all samplesinspectedshouldbe ~ti-,
+les only; imd

Pro@cLion is at a steadyrate; and

RE!cked~ “on is consi&rr &sirable.

4.7.4 RedWed to Normal. _ ~ ~ion is in effect,normal inspection


shallbe institutedif any of - follcwingomu on originalinq3acEcion:

a. A lot or bat~ is rejected;or

b. A le. Or batd) is comi- acceptaMe under the procedueS of


4.10.1.4,or

c. Productionbecmes -= or dela~; or
d. Other conditims ~ant that normal inspectionshallbe instituted.

6
MIL-SIW105E

4.8 Discontinuationof 1~ ion. If the cumulative nmber of lots not


acce~.edin a sequenceof mnsecmive LuLs on originaltightmed inspection
r~achesfive,the acceptan~ prm3dures of this standardshall be discontfiued.
Inqlm un~- the provisims of *thisstandardshallnot be ~ until
mrrective actionhas ~ takZ7. Tigthened~ion shall then be used as if
4.7.1had been invoked. .
4.9 SanplinqPlans.

4.9.1 InspectionM. The inspectionlevel &termines the rela+~onship~


the lo: or &t* size and the sanplesize. Thehspemion levelto be used for
any pa.mieti~-re@~c will be as prescribedby the contractor’swritten
P-~ -“-es. Three in.spec.ionlevels:I, II, and 111, are g:van in Table I for
ge-.-erai
use (see4.1). Normally,hspee~ion Level II is us-. Hmmmr,
In~=.ion @vel I my be used whm less dis=”wtion is needed,or Ievel 111
my be used for greaterdiscrtition. Four additionalspeciallevels:
S-1, S-2, S-3, mti S-4, am gimn in the same tabie and my be used where
relaciveiysmall sanpiesizesace necessaryand large sa@ing risks can or W.
& mlerat~.

N3TE: In the selectionof inspee.im ievelsS-1 tc S-4, ~ must be exercised


avoidAQii mm.asistent w“iti. these ~eion levels. Lm OLk” words, the ~
of the special inspemion levels is to keep sanplessmall when ~saxy. For
in.stanae, the code iectersunder S-1 go no funk: than D, equivalentto a siql
sanpleof size 8, but it is cf nc use to choose S-1 if the AQL is 0.10 ~. f
which the mhinm ample is 125.

4.9.2 Co& Letters. Sanplesizes are designatedby wck letters..-Table I shal


be used to find t& applicableco& letterfor the ~icular lot or batch size
and the p~iked impectl“on level.

4.’3.3retainingSallplillgPlan. TTieAQLandthe m& letter shall be usedto


=ain tne sanpl.irq plan fran Tables II, III, or IV. Whm no sapling plan is
availablefor a given cabination of AQL and code letter,the tables directthe
user tc a differentletter. Thesa@e size to beusedisgLvm bythenew co&
letter,not by t& originalletter. If this p~ leads to differentsample
sizes for diff~ classesof &fects, t& code letter m ~tothe .
~ sa@e size derivedmay be used for all Classesof defec+s. & an
alternativeto a sirqle sauplii plan with an ~ ~ofo, the plan
with an a~ m.mberof lwithitscomeqmmbg ly Mqer sauple size for e
&signated AQL (wkre available), may be ~.

7
MIL-S’ID-105E

4.9.4 Types of Sanpling Plans. Three types of sapling plans: Single,Double,


and Wlziple, are givm h Tables II, III, and IV, respectively. Whe!!several
:ypes of plans are availablefor a given AQL and code letter,any one may be used.
A decisionu to t= of plan, either single,double,or titipler ~ ~l~le
for a given ~ @ * letter, will ~ly & ~ ~ * ~ison bet=
the administrative diffitity and the ~ge sanple sizes of the availableplans.
7he averageszmplesize of multipleplans is less than for -Ie (~ M ~
case co.~ to si@e aqance n-- 1) and both of these m always
less than a si~le qle size (seeTable IX). US@lY m ~~a”~ve
difficultyfor singlesmpling and the cost per unit of the sanple are lessthan
for double or mltiple.

4.lG Daennina:ia of Amsmability.

4.2G.I Pe~nt Defeaive Inspection. To determinea~ ility of a lot or


bate!!mder percentdefectiveinspection,the appli-le. San@@ plan shallbe
used in accodance with 4.10.1.1,4.10.1.2,4.10.1-3,@ 4.3~.l.4.

4.IC.I.2 Shgie SanpLingPlan. The n-” of sanpleunits inspecxedshallbe


qua2 tc the sanplesize givm by the plan. If tk n-v of =f-.i- f- ~
the sample is equalto or less than the aqan~ rnmber,t& lot or bat~ shall
‘m consideredaqable. If the nmber of &feccives is equal to or great-”than
the mjemion nwker, the 10= or bat~ shall be rejected.
4.10.1.2 Double SamplinqPlan. Anuberof sa@eunkS6S?ud to the first
sa@e size giw by the plan shallbe inspected. If the mmber of def=ives
found m the firstsanple is equal to or less than the first~ nmber,
the lot or bat- shallbe consi- a~le. If tb ~ of W-W
found inthefirst sample is equal toorgmater than the firSt z@eCtim~l
the lot or batd shallbe rejected. If tb nmber of &fectives fomd in &
firstsanple is betweenthe first~c and rejectionxnzc&rs,a ~
sanpleof the sane size shallbe ~ed. TM ~ of a-i= f- in
the fixst and secmd aanpks shallbe ammlated. If the ~tiw ~ of
*fectives isaqualto or less thanthesemnda~ mmber, the lot or batd
shallh cmsickred a~le. If the cmdative rnmber of &fectives G equal
toorgreaterthan~~ rejectim~,t&lOtOrk* aballbe
= jetted.

4.10.1.4 special P~for~xnSJect im. - Xed13=d ~im *


Sanplingpmoadura may t~ Withult aith=ac=pt== or rejectionaiteria
m--” ~ *l~or=*~~be--
acceptable,but normal reinstatedstartingwith the next lot or
batch (see4.7.4.b) .

.
mL-Slmlo5E

4.10.2 Defectsw Hundredunits Inspection. To &temine ~ a-ability of a


lot Or batti k- &feCts ~“ hundredunits ~ ion, t& promdure specified
for pemem 63feGive inapecxionabove shallbe “-, ex~ that the woti
“defects”shallbe substitutedfor “ckfectives”.
4.~1 ~i” mg QualityProtection.The sanplingplans and associated~
given m this @liatim were designedfor use _ the units of product are
prodmed in a continuingseriesof lots or batches mer a period of tire.~t
‘” the lot or batti is of an isolatedmm, it is ~irable to limit the
=lec&im of sarrpling plans to those, associatedwith a ck2signated ML mlw, Z
prouidenot less than a ~fied limitingqualitypmtectim ● -W pldns for
this purpose-. be selectedby dmosing a LimitingQuality (L@ and a ~’s
risk to be associatedwith it. TablesVI and VII give values of W for the
the cmnonly used ‘bonsmer’srisks of 10 ~at and 5 ~t ~bively. If a
tiffe.mc value of co~’ s risk is recpired,the O.C. cumesandtheirtabu-
lazed valuesmy be used. The conceptof IQ may also be useful in specify+q the
L-L and ~~.i on Levels for a seriesof lots or bat-s, thus fixim mimmm
s*ie size-vhere there is saw reason for avoiding (withmre than a-gima
corsmer’s risk)more than & Limking p~rtion of def-kives (or defects)in any
single lot or bat~..

4.X2 Cum?es.

4.12.1 @crating Characteristic ~s. The qerathg ~ctaistic mmes for


normal -~ion, shown in TableX, indi~=e the pe.roentage of lots or kt~
whAti may be ~ed to be acceptedunder the various sapling plans for a given
pmoess @ity. The mmes shown are for single sapling; cumes for tile and
mlziple saqling are xmtchedas closelyas p-i-le. The O.C. cumes shown
for AQIs greaterthan 10.0 are based on the Poisson&ibution ti are ~li-
~le fo= defectspax hundredunits i.nsp&tion;those for ~ of 10.0 or less and
sanplesizesof 80 or less are M on the binanialdistrikmim and azz
applicablefor per- defecLive~-ion; those for AQE of 10.0 or less and
sarplesizes1-- than 80 am based the Poissondistributionand m ~li-le
eim- for defeczsper hundredunits hsoection, or for percent de@ctive
inspection(thePoissm distribution &&g an ~te q~ .Onto the
timid distrih.tim - these conditions). TaMhted mluas,
selectedvalues or pmhabilitiesof aqanue (Pa,in ~) are gi- f= a&
ofth CUmes -, an& in addition,for tightenedimpectx“on, and for M-
perhundred units for ZoflO. O orlessand sauplesizesof800r less.
4.~2-2 Amage Sqle SizeOzrves. Averageample size mrves for ~le @
mltiple sanplingam in TableIX. = show the averagesa@e sizes wMA may
be qed to omzr un&r the varioussa@ing plans for q- levelsof prooess
quality. The cumailmnt of ~im aml are ~roximte
the m-t tha-m e= upon the Poissondistribution,and that the s&e
sizes for double and multiplesamli.ngare assmed to & 0.631n and 0.25n
respectively, where n is the size.
MIL-SlW105E

SEXZIC)N
5

TAW3SANOG7E7VES

.
<4< <ma C=W Vvu =aa”

CODI
LETTEN
1.3
SINGLE
NORMAL
14
TABLE 11-6 — Single satnpling ‘plans /or tighened itlspeclitm (Muster table)

(s0? 4.9.3 and 4.9.4)

— —
do.
b. M@ 0.40 I.e MO
Ialu —

ldJ km
.

4 ? I
e a
c s

a o
Ii n
r to 01

G
H
s
w
!
J #w

II M
L ao
u ns 01
..
m SW
P we 01

o la 1?

n 0 n 12 r) )4

9
MIb~105E

SINGLE
REDUCED 16
-SK)-105E

DOUBJ
17 NORMI
. .. .
(5ee4.9.3.ml 4.9.4)
.
I A,.,sl.l.l. 1,..,1. $, 1....1. I,,,b,. . ..l ,..,..,,,”8

l,+
,I,lbl ,Iti+, ( ● l
*V*?
Idle,
, It 1, l:. t. II 1. I 1. Il. 4. II h I b I 11 ,, I
I — * —
. .
_LL — .
? ;>
? II
.
t:
( .“ i
1-
b

61
13 I

II

— I *
n
n VI
I :

n
?!
6:
---l= — —

— —
- Ilu hew,+1., PI., l-k,. urn- 11s*w1..*I. ● .w,I.-. .,,...1. l.. e. tn. wh.,,. A tm ,.. ,., ,.,, -, ,,,.
e
II*
h,,,*,+ ’., ,1,. *I,,,., me
c--
m - n,,.~,rw. ● 8d94
. - Il.. e-a~w .,.aI, ..I,, IIW pha h, .h.m.11..l, .“ 441. . ...1..,+ 1-1.. .h. w . ..4.!1.1
DOUBI
mua
u
MULTIPLE
NORMAL
20
KUF~105E

.1

I
1

? I G .. -”--*
1.- ”----- .----~~ a---=:~ -.o===~
“-
.
.: ; ~ -.--.w.ei

I .8 ------
------- --.--*3
-“------
..- Z=Z: -00 ---------

}!-!
1
9
z “*----”
+ .. *+.-.. C.. --. -*j..-* ..-
-m-:=
*- *-..:
● ✍✍☛✍✎✍
✍✍✍
✍✍✍✚✝✝✚
D- i
H’ sl~l””-----
n-----
s ““----- .* ----- ‘------ “------ -

=m
*
.* .0---
””1----””l
.- o-a..
----””-
.--- m-.
- ““----- .-- ***-
f— i 4 . . .. ---- .0 ----- .. -”---
- -
-
. t 9 .. -.--” .0 ----- . ------ I
I1.-”----
r
9 .
“..”---?!
. ..0---
r. .. -----

. ..----1.*-”*-.
.-- *.-
II
I
1“
““* -..

. ..0---1
. “------

-------
!I
I

..

21
-,-
--- i
1===---=1A
-o=:~==

1=
o.”.-gn
---
“aa *--0-------
--.--------
0-...=:

.- . ...=

l=lsl”=”l -------I..-----1------- ----.-~


d -:

E’”
m -------
a I ------- i-----=: ‘~
---=:==

=1=1
2 a ------~ --.====
: .-- ”-.* .- ”---0 0“--.--
jz : +1:::::::
::::::: :::::::1::::::: .“-..”.,.- . . ..-
i
:-
.-
t
!-,. 10” ~ ;:::::: -------1-------, -----:=1--”-;2
I ● 00---. ● 0---.- --”” ”-0 0 “.0.=:
i:i
+ I 2 l+” II - ‘-----51------- 1‘------ i------- I‘-”---q

= .
e.i
Iiit d

:010 [11
ecw.
.. :.

MULTIPLE
TIGHTENED
22
MULTN
TIGHTEN
23
.

•!
r
:
=

MULTIPLE
REDUCED
24
MULTI
mu
25
TABLE V.A — Average Otdgoiug Qwdity Lhd Factors /or Ntmnd fwspecjion (Single Jam@iwK) ●

(see 3.3)

— — — — — — — — — — — — — — — —
SkO
).014 .01 ‘.02! 1.04( I06s L10 0.1! 02s ).60 Q& 1.( 1.s 2.s 4.0 6,5 to 1s 22 40 62 10I 12( 23( 4ot 6s in
— — — — — — — — — — — — — — — — —
2 10 42 69 91 la m 332 47q 73 1m
3 12 23 46 65 Ila Iw 22(
31a ml 7a 1la
s 74 Ii 27 39 63 9a m Iw
m ml 6(M
— — — — — — — — — —
22 9 46 II 17 24 4Q M w la M 270 410
1? 13 2.0 6.S 11 Is 24 34 60 72 Iia t7am .
r 20 1.0 4i 6.9 9,7 16 22 33 47 73
— — — —. — — — — —
32 1.2 2.6 4.3 6.1 9.9 14 21 29 46
30 L74 l.? 2.? 3q 6.3 9.0 13 19 n
20 ).46 1.1 1.7 2.4 4.4 5.6 a.2 12 10
— — — — — —
K 1% 1.29 ).6? 1.1 1.6 2.5 3.6 5.2 7,s 12

L m ).10 ).42 ).69 0.91 1.6 2.2 33 C.7 7.3

M 3is ).12 ).27 1.44 ).62 1.0( 1.4 2.1 3m 4.7


— — — — — — — —
N Soo 074 1.1? )21 ).39 ).63 0.9( 1,3 1.9 2.9

P Wo Ju ).11 1.17 ).24 L40 L56 O.ai 1.2 I.B

Q 12s) 1.02! .061 ).11 1.16 MS 1.% ).s2 ~.~: 1.2


.
— — . — — — —

w mo 041 .(M 16
.097 I. ).22).33L41 1,73

— — — — — — — — J — — — — — — — — — — —
lmPslwlo5E

I
I
I 3-
I : Z38
I Ss: I
-. I 0. I
~
1“ ==- 1

Id I

.A(
TWITEI
.
TAULE VI-A — Limiting Qua[it y (in percent de/atirv) for w~~ich P& = 10 Percent
(/or Norma! !mpeclht!, i%t~fp sdmi)hg)
(Sr?r? 4.11)

d
:O& Smple
Ntw size

0.010 0.015 0.025 0.040 0.065 0,10 0.Is 0.25 0,40 0.65 1.0 1.5 2.5 4.(J 6.5 10

A 2 68
II 3 54

c 5 37 58

0 8 25 41 54
r% 13 16 27 36 44
F 20 11 10 25 30 42

G 32 6.9 12 16 20 27 34
II 50 4.s 7.6 10 13 18 22 29
J no 2.0 4.8 6.5 8.2 11 14 19 24

u 125 IS(’I 3.1 4,3 5,4 77 9.4 12 16 T

L 200 I.2 2,0 2.7 3.3 4.6 5.9 7.7 10 14


w 31s 0.73 I.2 1.7 2.1 2.9 3.7 4.9 6.4 9.0

N 500 0.46 0.70 1.1 I.3 I.9 2.4 3,1 4.0 S.6
1’ 8W 0.29 0.49 0,67 o.a4 I,2 1.5 1.9 2.5 3.5

() 1250 0.18 0.31 0.43 0,53 0,74 0.9,4 1,2 1.6 2.3

2UO0 0.20 0.27 0.33 0.46 0.59 0.77 1.0 1.4

,
Accrpldll?
(JUdily l.cwl

— — — — — — — — — — — — — — — — — — — — —
tuer
).011 ).01! ‘.02! w Lti! ) 10 1 Is 0.2! 040 ).65 I .0 to 65 10 Is 25 40 65 la) 150 Z’io m MO I-MO
— — — — — — — — — — — —
A 2 Z G z RI z G iii 13M iii xi
42 3 f7 IJO 100 220 310 3W Slo 610 94[ w Iw

c s 78 I 10 130 190 24a 310 400 w 77( lot


— — — — — — — — — — —

22 a 49 67 04 120 150 ml 230 350 w 61(

2? 13 18 ul 41 51 71 91 120 MI 220 m 410

!’ 20 2 /7 33 46 59 71 100 140
— — — . — — — —

G w 7.2 !1 29 37 48 63 M

N so )6 78 19 24 31 40 56

J w 2.9 49 6.7 Is 19 25 35
- — — — — — -

a 125 I .0 3.1 43 54 12 }6 23
r&
L m 1.2 20 27 33 46 10 14

u 31s 0.73 1.2 17 21 2.9 37 90


— — — — — — —

Y Soo ).46 D.7m II 1.3 I .9 2.4 3.1

P Wo ).29 )49 0.61 D84 1.2 I .s 1.9 2.s

v 1220 ).10 0.31).43D.W 0.14 0,94 12 1.6 2.J


— — — — — — — —

Jam ).20 0.?1).33D.44 D.5Y D.71 1.0 14

— — — — — - — — — — — — — — — — — — — — —
TABLE Vii-A— Limiting Qwdity (iti fwcmt dtfeciil’e) \nr which Pa E j Percent
z (for iVoWnal Inspection, Shgle $dmplivlg) (:;W7 4.11)

g
n’
m Acceptable Quality lAvel
Q ~ semph
= leuet Qlze
0.10 0.15 0.25 0,40 0.65 1.0 I .s 2.5 4.0 6.5 10
0.010 0,015 0.025 0.040 0,065
g
m
A 2
63
8 3
45 66
c s

31 47 60
D 0
21 32 41 so
E 13
14 22 28 34 46
F 20
w 18 23 30 37
o 8,9 14
G 32
5.8 ● 9.1 12 15 26 2s 32
H so
3.7 5.8 7.7 9.4 13 16 20 26
J 00

3.fl S.o* 6.2 8.4 11 14 18 24


2.4
u 12s
2.4 3.2 3.9 5.3 6.6 8.S 11 15
1.5
L 200
1.s 2.0 2.5 3.3 4.2 5.4 7.0 9.6
M 315 0.95
-
1.3 1.6 2.1 2.6 3.4 4,4 6.1
O.tw o.%
N 500
0.59 0.79 0.97 1.3 1.6 2.1 2.7 3.8
P 800 0.30
0,30 0.50 0.62 O.ty 1.1 1.4 1.8 2.4
0 1230 0.24

0.24 0.32 0.39 0,53 0.66 o.rL5 1.1 1.5


R m

&
Accqmble Odity I.?vrl
Lkde Saaqh
— — — — — — — — — — — —
Imtt ●IU
0.011 ).01sm! I.ol{ 0.06!0.1( 0.1! 0.2s 0.40 0.6.5 I .0 1.5 2.5 4.0 6.5 10 Is a 40 6s l!ilm 4006M Ooo
— — — — — — — — — — — — — — — —
A 2 Isa 260 J2a 39( S30 66a Ma Ilm 1s0( m
B 3 100 144 210 2tM 3s( 449 s7fJ m moo 14a IWO

c 5 60 % IM 160 210 26a 340 44a 610 8]0 IIa


— — — — — — —
D 8 36 S9 79 97 lM 164 21C 270 3na sla 710
E 13 23 “ 31 46 u) 81 100 KM Im m .310 ua
F 20 15 24 32 39 !i3 66 6s I10 1s0
— — — . — —
G 32 9,4 Is 20 24 33 41 S3 66 9s
M so 6.0 9s 13 16 21 26 34 44 61

J 60 3.8 S.9 7.9 9.7 13 16 2t 27 M


— — — —

N
IS

31s

Soo 0,60
L9S

1.5
2.4

0.9!
1.s 2.0

1,3

2.6

1.6
3.0

3.2
2.s

?.1
S.o

3.9
3.3

2.6
6.2

5.3
4.2

3A
8.4

6.6
5.4

4.4
II

8.5
7.0

6.1
14

II
9.6
<
18

is
24

i
T
P Wo 0.36 0.s9 0,71 0,9 1.3 1.6 2,1 2.7 3.8

Q 12s0 0.24 Mm 0s0 0.6, O.(M 1.1 1.4 1.8 2.4


— — — — —

II ~ k24 L32 0.39 B.sj ),66 M 1.1 1.s

..
— — — — — . — — — — — — — — —
TAfJI.E Vlfl — I.;mh Ntimbws /or Redr~ced ltt~pection

(see 4.7.3)

Ac’co@.bl*
f)uolll~
bd
— — — — — — — — - — — — — — — — — — — —

Ion I01s Boa IN r as B.10 0.1$ 0.8 00 0M 1.0 1.s 4s 10 2s 40 42 100 IJO m am m Moo

— — — — — — — — — — — — — — — — — — — —
* ● ● . ● . . * ● * * . ● e
n.m 1 4 8 It n 40 42 11s 1s1
● ● ● ● * ● ● * ● ‘. ● ●
28.4Q o o 1 1 11 n n u 18s 118 m
● ● ● ● ● ● . ● * # ● .
S4. n 0 1 1 84 a u $) I 10 191 .ml
— — — — — — — — — —
* ● ● ● ● ● ● ● 9 ● ● ●
Q4. 12? 8 4 14 t4 41 44 10$ 101 n?
● ● . ● ● . . . ● . ●
IJO .194 o 4 1 2s $1 13 11s In ml WI
● ● * ● * . . . ● .
200. m o 0 8 It @ u 11s 101 m 4?1
— . — — — — — — — —
● ● ● * ● ● ● ● 9
2n.4w 0 o 1 It la * 113 la
b ● ● * ● ● ● 4
$n.lw 0 0 1 1 % w 110 M
* ● ● ● ● . .
Wo . 1?44 0 0 ? 4 1 u 4s M
— — — — — —

6 . ● ● ● ●
Iao .1440 0 o 1 I 1
IJ * 110
● ● ● ● ●
moo. wQ o s Y 4 0 It 2? Its 191
● ● ● . 4
mo . w o Q t 9 1$ ?4 24 Iw
. — — — — —
● ● ●
Ym. m 0 0 2 1 ? 14 )2 m 6)
,oom. IMW b b t t t t ? It N u a 10$
● IJ 20 m 0?
1.320. law e o ? o 1 )10 1$*
— — — — — — — —
e Q i 8 s 16 ?J 40 m 11s I*1
o 4 14 N 24 bl Ill 106
— —I — —@ — — — —..— — — .- . — — — — — — — — — — —
(WC 4.12.2)

.Srln

.2% t

,1.LiJz
o 1?s

t!
Q LILLJr
o ? lb 008 It

ii2 L_l_.IP
o I)SM

n B prqorllon Odatlvo
1* m w an * m ml Doe m 1,nl tm t ml Ilm 14m Ha I* Iml lc- Iw

4-II A1.11\ IIF SIIIWI f IWO I IITS 10 in I#w.rII ddwtw I.1, VII ‘* < 10; i. .+frrt. P hwdd WIl!s fw Wt.’, >101
● -., t t~.. “ . . . . . w 4,..~.&t, 4),.11..I ..*I. tmgl,.11. .*W1 l..p* ,1..

TA91,[ X-A-t - TAWt.ATEO VAtUES FOR OPERAllNG CMRACTIRISIIC CURV[S FOR SINGL[ SAMPLING PIJNS

Arrtfwdtlc 4Jdltf I.*wI* Ietwfndimqwrtim)

P. 6% 65 n o 6s 110 Iwlx12:a&1400]xJm ]~] IImo


I I I I I
@WI pmml# M.clid p Iin 4. I-K fur hmrlrwl mile)

Wo osol O.*) ?41 ?t R 412 W J 145 I 7s ?M J(I5 314 $17 *2V w 977

4s0 ?M 2s2 11a 409 68) Ill Iw 2.1s Zoa In I 4A2 622 14’1 97s 1122

s 13 521 %6. S51 91: Isa 2.IY 212 3s1 4:1? 51s 4JJ4 812 I07J Izm
900
7so 114 1!6 4AI Mt 127 21I ml 342 431 571 612 7W5 914 1?14 I .354

no 241 N.? (41.9 134 UN 284 JR3 4,U w m ?33 *yJ Ioml I lnl 1111
—. .
!nO 6? ) 11} 1% 2S -~ 311 – 4n4 S40 651 TM. 810 Ilal 124n I%m I m
250

1470 w.b 11s I*! 246 314 464 Sw 650 ?10 8n9 taut 12.M I 4W I ?48 1716
.— .—
30 ??s NO ?1) 31s 320 m ‘iii n2 4448 w? ln&- JJli . 1512 184!7 mls
I II 2w 11? 420 S02 6s5 nlll 1001 1141 1272 1s29 J7M ‘mm ?710

x 4n Is$ 100 ,$0 ;


; ‘“” x 4m x ‘w x ‘m x-
35
,

!$!

TAM.E X-O-1 - lAftUWIO VAIUIS FOR CWRAIMJC CMRACI’UIISTIC CURWS KIR SINGLE PLANS
SAMPLING

P. be Oe Is 2s w a 100 lxl’”.lxl~[x]mlx[’”lxl
! I I woo
I

99.0 0.334 0,33s 6.W 1$s ?7.6 w 3 94.* 11? 1s9 w m 34s 419 41? 6s1 w m?
I I .r@ 1.11 11.0 ?13 4$.s W.1 131 -x? 2ii— 2s m 41s 4s4 W m Iml t 1s2
9s0

mo 3CS Ml 1?.1 n.? !UJ.Y 10s 1ss 101 ?.1$ m 3L1 4s4 S41 116 w 1131 12ii—

150 *14 Ml )?.0 W,6 *.S 141 Iw Zm 2W 341 40s w 623 m W3 124? 1344

Wo 20.6 2s.t SS9 ml 123 Iao M mQ 3S6 al 409 4?2 la ??2 1021 tsw 14s?

2s0 3T0 4s2 @n 131 110 241 321 WI tli w m 124 8s2 100 11s? 1s0 1s44

10 n.s 1s4 231 m )35 411 SM ?41 u 1019 INS 1392 1513 19$1 lwb~

6s 6.$ 2s @ a ml ~ : ;L Ml ~ 400 ~ 6S0 x low ~

~-., W-14 d,d$m,--e 1. ~.., 4.1..,1 . ..-..,-,, P,,.- I. &l-,. p bhd ..11,
TAOL[ X- B-2 - SAMPLING PLANS “FOR SAMPLE SIZE CODE UTTER: B

Cml. — — — . —
Tppe e4
Ietiw Is 25 40 65 100 50 x 6S0 1000
99mplin# 40 65 x x x x
phm
●nple — — —
silt
c 11? c 114 c nl r It Ic n c II Cn r nl c h k n \c 16 c 16
— — — — — — — — —

12 14 5.6 B’ 4 15 lx 10 3 11 # 44!
Slnglc 3 v
— w? U** —

● 02 )3 14 2s 1. 1 3 1 14 1? 2’ ‘3 F s .11 2
2 v Cd@ do
Onubk .*WI ala ,euel
12 14 Is 61 B9 II 6 21 11 3 12 5 6 S1 4
4
.

A n c

Uulliple v * +4. +4. * * +t- -4+ 44 ++ +4- ++ ++

— — — —
es, than
6S 10 Is 2s 40 6S 100 t 50 65o x UxtfJ
6.5
— — — — — — — —

Accepabtc ouohty i.ru@t9 hiRht@ntd inq!rrtitln)


‘rArJLE x-c — “raf!les /or sample $ize code letter: C

.... ... .. . . .
hct.trtr n IP.)
la

$0

al

. 40

10
a

TAOLf X-C-I - TABIMTEO VALUES FOR OPIRATING CNARACIER ISTIC CURV[S FOR SINGLE SAMPLING PUNS

Atcrp*bfrUusliqI.rda Owrmtfkpr IinnI

f’, 2.s WI 4n ]* px+n[xIKOixlzsolx14@J p+o


I I I
p 1111
ddwts P? hwdmdWI-)
I P lb wucm A?fwlhd

09.0 0.201 J.?) 0.201 2.9? a.n m 37.s so. I 70.1 9s.4 In 1s0 ml m 34) Jw $46 61S
—.
woo Lo? ?.~ I.OJ ?.li fh 4 ??.3 $?.3 n.6 W* 12s 1s4 10s Z4* m m 449 6s9 691

90.0 2.W M.a ?.11 10,6 :2.0 34.9 &s.o 9). } MB m 17J mo nJ la 429 401 bl? 13J

n.o 3.29 19.4 C*15 19.? 345 w.? 04.4 119 IJ? t 72 m 24s Me m 46s 542 149 606

50.0 12.9 31,4 IJ.9 22.6 S1.s 11.6 113 1s3 I 73 21I ?sJ P) 373 41s S’IJ 6tJ au 891

25.0 ?4.3 4s.4 ?il $3.9 M4 }01 )40 IV4 116 WI J04 J48 4,s5 m 621 ml 92J *

10.0 n.? 50.4 40.1 Inn


n.o -.—. IJ4 10s 2 fs -&f Jf16 MO 4fIJ 495 $64 & 166 1010 lff16—
—— .
S.o as.I 6s.? w.? w.? I?n 1$s 210 2h.1 269 M4 M9 6s6 s]< 40s 74s mf4 m64 I f .11
...—
I .0 40? ??.0 ?2,t !3J 166 m Ybf m 346 M ON w 1171 1741

I 4,0 ~ 4.0 1$ 7s 40 6s x IOU x : ; : ; 400 x 6s0 x


1A(I[ X-C-2 - SAMPLING PIANS FOR SAMPLE SIZC CODf l.EIWR: ‘C

— — — — — —
M x 6.S 10 60 6s x MO x 250 x 600 6s0 Km
Pho — — — — — — — —
x

k-l u la u L.J d d! ~ It
J

slqh s ) 1: 7m o II 21 01 !? 2 H5 31 166! s
— — — —
U*
3 ●
CC* CUB D: z a7 61 1 16 5 31 CO*
3
MI* Lam I.otla
6 1: 6 89 51 621 6s 6
— r. D — — — — — — — n

W
w
Mllph ● ++ #- * 4+ * -w +$- * * * ++ ++

— — — —
b.@ 6.S 10 Is 6s x x x x law
— — — — — — — — —

..
r
I

D 40
.
TABLE X-D-2 - SAMPLING PUNS FOR SAMPIf SIZE CODE UTTER: D

GM. — —
!Bo tbw h hrt
hthe !.s 2.s 6.S 10 Is 2s 40 ~ ~ 100 x no ~ 2s0 ~ 4(M3 1~ *n
w+ 1.s x x
— —
e RI It m k Re Ac k AC nt Ac fle NC nt it [It Ar fh AC lb Ac f’hAc fk Ic n?Ac R? Ac f4r Ac 11? Ac N* Ac H(
— — —

64+ “o BI )2 23 34 S6 78 89 to 1! 12 13 lb Is la Ivl u 22 27 28 m 31 41 42 44 L5 A 8

the 4

s v 02 03 14 25 17 31 59 6 10 7 II 9 M II 16 is 20 17 23 ?3 n 2531 A 5
Zkbb Am mlItl
10 12 34 45 6? 09 t 12 12 13 15 16 10 19 23 24 /627 MIS 17 36 S2 $1 % s? to

c F . .

z v 01 ● 2 #3 84 04 04 0s 06 17 I a’ 29 3 10 4 )2 6 15 6 16 A 2

4 *2 03 03 Is )6 27 30 39 4 to 6 121 1 14 10 t7 II 19 lb 25 17 27 4

e 6 02 03 14 16 la 49 6 10 7 12 0 I.1 II 17 1319 11 24 Iv 27 ?6 36 29 3’+ 6

Muhlpfc 8 01 14 2s 31 s 10 6 II n 13 Ml Is 12 11 16 22 1? 2s 24 31 21 34 “)146 4049 8

10 13 24 36 so 1 II 9 1? II Is lb 17 17 20 222s 2s29 3? 3? 36 40 49 S5 Q2S2 10

12 13 3s 46 19 012 2 14 14 17 la 20 21 23 2729 N 33 40 43 4s 47 61 64 6S 66 12

M 23 4s 61 9 10 13 ta 4 M 10 19 21 2? 2s 26 32 33 )1 36 49 49 H 54 12 73 7178 t4

,.s thm 1$)


2.s 4.0 10 15 2s 40 % 1~ x x 2s0 ~ 400 x ‘I&
2s x M x
— — —

A.
v.
Ae w
He m
b=
1 1

E

x

z
x

x

I
-w
:- :
s
a
$

iii
~

42
TABU)(-E-2 - SAMPLING PUNS Fm s~f’u SIZE CODE LEITER: E

— — —
1.0 2<s m 6S 10 x 100 ~ m ~ no
x

k k Ae % At N At n. Ar W Ae Rc
: n k Re k l!? k Rt

I 2 23 S4 la 19 21 22 na 30 31 41 42 444s A
v
ha

m z 03 lb 9 14 11 16 6“ 20 l? n 2329 23 31 A
v te41 co&

0419 #ltu
73 24 26 n 34= 31 36 529 56 s?
la 34 4s

o (i
● # 2 92 83 1 8 29 3 10 4 12 6 15 6 16 3
3
6 12 7 14 1017 II 19 16 Z 17 n 6
6 # 2 03 03
9
02 03 14 II 11 13 19 17 24 19 n 2636 2939
9
b
u 6 22 19 % 24 11 2734 37 46 a 49 12
12 0 3 14 2s
Ihhlpto
Is
1 3 24 36 K 2S S29 3231 3440 49 35 5326
15
?7 29 31 33 #43 42 4161 64 6s46 10
19 13 1s 46

21
23 4s 61 )2 13 37 36 46 40 53 54 12 13 n 70
21

100 x ~~ ~ = x
1.s 2.s Lo 6.5 10 IS
— —

,.

(JM mat pNc’an96 0+0 du.edoIellef b lrutb Utxpmm d mph, ●** u, Wdldllo.
TABLE X-F-2 - SAMPLING PLANS FOR SAMPIESIZE CODE Lt71fR:f

Cnw [:Um”
TTP d
low. l~;fy lalt.r
OMlpllw I .0 Is 25 40 6.s Jo 15 23 6$
lb~lo IM+
pk 65
9h4 =-b- ●i w

Ie bb Ic 11? Ac lb AC R, Ac Rr tc n? 4C N* 4C N?
1 ——
*
20 v 01 12 23 34 5 670 10 II 12 13 14 Is 21 2? A m
I
w Un ——

& 02 03 14 53? 31 9
v Ce68 CO* 2 610711 14 II 16 A 11
Ikmbh L?*IWLMIH T
12 34 45 6 ? 8* II )1 IS 16 1$ 19 23 24 26 21 26

E N — —

● ● ● ●
● 2 2 3 4 04 0s 0 617 18 2 9 A 5
v
9 “t 03 03 I s 16 30 3 9410 6 1? 7 14 10
02 03 lb 2 6 38 6 10 ?12011 II 17 II 19 Is
ei
03 14 2s J 7 s 10 0 II 10 Is 12 1? f6 22 19 25 20
13

13

f
,.
24

3s

$s
3.

46

b?
6 s

9
n

9
?

10 12

10 I.1 IQ
It II

14

lb n
1s

11
T
14

10202123

I
17 17

2225
20

26
2225

2729

)2 31
2.5n

31

1?
33

311
25
.10
M

Is 40 6.5 N3 x “$
x IS x x 40 x
4
.
44
. .
L-
&“

46
TA8L[ X-C-2 - SAMPLING PWS FU? SAMPLf SIZE CODC LETTIR: G

Cum9.
l*lle*
O.a 0.64 x 1.0 1.s 2.s 6.0 6.S 10 x Is x 40 lum~le
●IW

Ie R* k RI it nt ie RI e m Ac Ik \c Ill At n~ \c It Ac h Ac He Ae W k Re

24* 32 v 01 12 21 34 Sm 71 89 10 11 12 13 !1 22 A 32

Un on
20 v 02 03 14 2s 31 37 39 10 I 16 A 20
coda Cti
I@tet

a 12 34 4s 67 a~ II 12 12 13 IS 16 627 40
F 1

9 v B 2 ● ’2 93 # 4 04 0 4 0 5 06 1?18 29 A a

M 02 03 03 Is 16 27 30 39 t10612 7 14 16

24 02 03 14 26 30 4’ 9 6 10 1 12 0
I
11 II 11 3 19 26

32 03 l{ 2s )7 s 10 6 11 e J3 10 15 2171622 925 32

40 13 24 36 se 1 11 9 12 11 Is 14 11 720222s S29 40

49 1’ J 3s 46 79 10 12 12 14 14 17 10 20 ‘1232724 It 33 a

S6 23 45 67 9 to 13 )4 lb Is 10 19 11 22 !S 263233 7 36 %

y
0.66 x I .0 1.s 2.s 4.0 6S 10 x IS x 2.s Xbo z
40
1
v m Uac mtmto&mptM wmplo SIW code ktter fat tchkh ucQptsmw ond ttltcliao M&rt ut ●vcilsblt.
Ac s Accepttnw ●*.
no - Me)actha WmbW.
. ...”.
r , 1 I 1 1 1 1-
i I

48
TAW X-t+2- $AMPLING PIANS FOR SAMPLE SIZE CODE KITER: H

cum..
Iollvt
scmfdr
02s 0.40 x 065 I .0 1.s 25 4.0 6.S x 10 x Is ~ 25
●ite

Ck k RI c n c m Ie RI k % k II* Ac n? k n* At fh Ac N? Ic m Ie lb Ac nt k M*

MO* v ml 12 23 34 5 6 10 09 10 II 12 13 4 Is ‘o 19 21 22 A
.
use k -—

● 2 5 37
32 v Codl Co40 )2 03 14 37 $9 6 10 7 11 9 lb II 16 A
fbblt Lctt& .*lltr
64 12 34 4s a 1 fJ9 II 12 12 13 IS 16 :0 19 !1 24 26 21
u J
● # m 3 ● t Ot 04 0s o 6 I T I n 2
13 v C2 2 A
26 -2 03 03 1 s 16 21 39 3 9 4 6 12 1

39 m2 03 14 2 6 Jn 4 Q 6 10 7 12 a 13 I 11 13

52 !t3 14 2s 1 7 5 10 6 II 8 13 10 Is 12 17 16 22 19

6S 13 24 36 5 8 7 II v 12 II 1s lb 17 12 25 2s 29

10 I.J 3s 46 r Q 10 12 12 14 14 17 N ?1 !7 29 31
I M

w 13 $5 61 Q to 13 14 lb 15 Ill tv 2t 2s 12 )1 J? 38


PD9Ihu
0.40 0.65 1.0 I .5 40 65 x 10 x Is
040 x “x
4
Em

w
:l=j=lgl~l.~

.
s

Is o

1)(1

51
TABLE X-K — Tabfes #or s~mpfe size code letter: K

CM4RT K -OPIRATING CNARACIIRISTIC CURVIS WR SINW SAMPLING PLANS


(Curwo f- &No ad ●.lllplo Su+lq m ●otcbd 90 Cloml? QBpmdcwt)

1 II
A(

lAtltE X-K-1 - IAO(RATID VAtU[S FOR WRAIINC CttARACTtRISTIC CURWS F(HI SINCtf SAMPLING PLANS

P. 0.10 0.00 0ss 1.0 1s 1.s M


I I I I I I I Xpolx I I Xpo I
p (h prmu &2wtlw * Mom @t kold oalwl

W.o O.= mi O.zw 0.6$9 La ?!Jl Ml 9.81 403 5.9$ 0.26 10.1
1
0.0$10 0.292 0.6s4 I .W 2.W J.10 J 76 e.w 6.1s 7<bo 9.9s 11.9
H.* .——. —
UI.Q 0.s023 Q.u$ 0.262 - .1.40 2$2 J.71 t.32 S.oz 6.92 0.24 10.9 130

1s.0 0.230 0.7W Lzoz w 3.W 4,70 s 61 6.90 0.32 9.?? 12.7 14.9
4
9.0 0.sss 1.22 2.14 2,94 4.s2 6.14 6.92 8.$3 10.1 11.T 14.9 1?3

2s.0 Llt 2.1s ~tb 4.W $94 1.75 0.64 106 W.* u.? 11.4 200

t.s? 3.11 4.30 B*M 1,42 9.22 10.4 12.3 14.2 M.t 19.8 22.3
10.0
J.w 6.20 O.u 10.s 11.s 13.6 1S.6 1?.$ ?1.4 ?4.2
S.O 2.09 5.03
3.02 9.1$ 6. ?2 8.04 10.3 129 18.3 \6 I 103 M.S
to

0.1s o.b9 1.0 1.s 2.s 4.0 6.$ z to G


x x
~105E
1 I I

● 9BQB

,,

I
!53
?fIL-sID-lo5E

1
54
rABIE X-L-? - SAMPLING PLANS F(XI SAMPLE S 17E COO[ LEITIR: L

cumu.
hllvc -
,?*O A
●al+b 0.66s o 06s 010 o. Is 0,2s 060 0 6S I .0 1.s x 25 x 4.0 x
aiae
x 6S

k n ,C II( k RF k R? k n? k R* Ic R* Ac n? Ac R. k ne k NC

S4+ 200 v 01 12 23 56 ?8 12 13 lb 15 18 19 21 22 A 200

u., Umo
12s Ceti 02 03 2s 37 37 6 10 7 2’;9 lb II 16 A 12s
● Ltuw
tbde v l.%
2s0 12 34 67 $V II 12 15 16 10 t9 23 24 26 2? 250

II N

● 9 2 ● 4 04 04 o s 0 6 1? 1 8 9 so
so v 92 A
100 # 2 03 1$ 16 2? 3 a 3 v 4 10 6 12 14 100

1s0 02 03 26 30 49 6 10 7 12 0 13 11 1? 19 1s0

20 03 lb 31 5 10 6 II e 13 10 Is 11 17 lb 25 200

2W 13 24 59 1 II 9 12 II 15 14 17 11 20 22 29 2.s0

m 13 3s 19 10 12 12
lb 10 t? 18 20 21 23 2? .uto
I
M 23 45 9 10 13 14 14 Is M 19 21 22 n26 32 M(I

t W thl 4.0 x
0.10 01$ 0.22 0.40 065 is x 2.s 6.S
o to x —

Acr?pttblr Qlrslilr Levels (Ilfimvl inspvclion)

..
“fAl?Ll! X-M — Tables for ~ample size code letter: M

CNART M - OPIIIATING CHARACIER IS TIC CURV[S FOR SINCII SAMPLING PLANS


w m Or I.o?l
mf:fm
“’$ 7!7 n? Iruwo lot &tM* ‘&d m,hipk ●qllna UQ mcwhd ●t drIwlI ● . prudc*bld
Im
w
m
m
a
w
a
m

I*

o S* *O so 6n V* 0.0 *.O 100


10 ?0

TAME X-M-I - TAWUTED VAtUtS FOR OPERATING CNARACTIRSTIC CURV[S FOR SINGLE SAMPLING PIANS

Aw*!*M* (judh~ 2,-..19 (m-of in.pwlk.o)

P* 0.040 Q,ls o.2s 0,40 O.* }.0 x I f.$ .0


I I I I I I I X1251X Id
p (h fwwd &fcellw @ h *f*l* p bwmkf mild

W.o” O,WI? 0,0411 O.IM 0.261 0.56? 0!?2Y 1.11 1.51 1.94 ?.11 3.29 3.W

%0 0.0103 0.11$ 0! 240 0.43? 0.020 1,26 1.4? 1.96 1.44 2.94 3.9s 4.73

W.e 0.0)2s 0.169 O,no 0.})6 Imo 1.48 1.72 2.23 2. M 3.Z7 4.34 5.f6

n.o 04913 O.ms 0.$40 040$ 1.34 1.69 2.17 1.74 u 3.8? SM S.9J

So.o 0.220 O.m 0.s49 1.17 1.s0 2.43 2,1s 3,,39 4.02 4.66 5.9) 660

as.o 0.640 0.0ss 124 1.62 2.36 .9.01 3.43 4.13 4.W “ 552 6.W 7.9?
..—
10.0 0.1s1 la 1.69 ?.12 1.9C 3.76 4.13 4.m $.64 6.39 7.n6 n.%
—. —-
S.o 0.9s1 I .s1 Zm 1.46 3.34 4It SW 611 6<9S R.4r 9fAl
.— 450 .—.
1.0 1.46 2.21 261 J Iv 4.16 5.5? 640 ?,24 971 10v
b
o 06s 02s 040 ok% I .0 : I.!i ~ ~s ; 40 y_,
*
*

57
Ii!
TAIM X-N-I - TAOUATtO VAIUIS F(III OPIRATING CNARACIEfllSllC CURVES FOR SINGll SAMPLING PIANS

kcrpmblt (JUOIW L-wI. (manwl Im(wrtiea)

P. 0.02s 010 01$ 0.?s o do 065


I I I I I I X]’opc]lslxl?s
?{10
PmCal
d?kcti-
ah4dwlD
pot
hdfd
wild
W.o 0,00s01 0.0s0? 0!0012 o 16s o Ml o sol O.rol 0.%4 !32 I .9 20? t St

9s.0 00103 0.?11 0.1*4 o ?11 o s?.! o M o 9M I.zl 1.s9 10s 2.49 2.W

Wo 0.0211 0.10s 0.220 “o34$ 0620 0 ml 10s Iw 1.73 2.06 2.73 32s

1$.0 0.0s?s 0.N2 o )4s o so? 0044 1.1? I Jt I lZ 2.W Its 310 314

Soo o In am 0.s2s O,lw 1.13 1s3 1.13 2 D 3s2 2.?3 3.73 4 u

2s0 o 2?? 0.s3s 0104 102 1.4s I w 2M 260 304 3 as 4.1s 4W


10.0 0401 o.m I.M IJ4 1.05 2 IS 2W 3.0s 3% 4.03 49s S.u

so 0s?s o ?49 1% I 55 110 2 t3 209 3.3? 3.69 42s su 605


I.0 0921 1.39 14n f 01 26? 348 4s6 s.w 6.12 6117

0040 0 !s 02s 040 0 6S 1.s x,


: ‘o 2 x 2s

k~-bl? 01AII% I.CWIS Mphtwwd in,prrtimd


\ d
mm., Ml ..1-0 .I-. b +“ ,*IO *“4 “ ●d-4101 .lb*l.. “ - *.. !-$ I.. ,. lb Dld*l
.
in

x

x

z
o

#1,:,
.:!. I w, !. T“]
II ,! -,., ,., ..

P
Gz;-
I 1. I 1
1 .! . I

4D4i.e*-
.

m
to

TAMI X+ - TAWIATIO VALUES FM OPERATING CHARACTERISTIC CURVES FOR $lNGIE 5AAlPLlNG PIANS

Actrptmbk~dhf LWOISkmo~ isc~tid

P* 0.010 O.MO o rm 0.10 0.1s 0,2s 0.40


I I I I I I I Xpqx [’”
i
x I
~ (h mm *IV* u Mm- ~ kdm’d dlo
W.o O*W 0.011? ems 0.- 0,142 0 2j2 0.281 0 3s? 0.498 0.SQ8 O.am I Ot

9s.0 o.oosto 0.0204 Oow 0.10? 0.2W 0310 0.3?6 0494 0!61s 0140 0.s9s 1.19

$0. e 000W2 @.o@# o (m? 0.140 0.2s2 0.372 0.42s o SW O.m 0024 1.04 In

no O.mw 0.016? o. Iw 0103 03M 0.416 0.s4? O6W 0.034 0.9?9 Ill 1.49

w, 0,0sss 0.124 0.216 0.294 04ss 0.614 004 08s3 1.01 1.1? 1.49 1.13

2s.0 0.111 0.?1s 0.314 0.40s OS* 0.11s 0.664 I.@ 1.22 1.39 1.74 200

10.0 0.1$4 O.M1 e.424 0.ss4 0.742 0.942 I .04 1.2s La 1.61 I.w 22s

S.O 0.240 0.W9 O.sol O.w 0641 I .0s 1.1s 1.26 1.s6 Ida 2.16 2.b2

I .0 O.w 0.!21 o 67? o.no4 IC6 1.29 I.w 1.61 1.0.3 ;. ;


~, .
001s 0.04s 0.10 0 Is Ozs x 040 x O6S
Arrr@ahlc (&olhf Lcwl. (!I+I*w4 int ~ tie.)
\
a- All 4- #m b A- @lb bm*4 - W- 4*. IMI- -- -Iti- M ,b B$*I
TABLE
X+2 PLANS F(M SAMPll
- SAMPLING S12[ CO(M WIERt Q

C9a.
— J
1A, t4i+w
0.010 0.01s 0.0s 0.040 0.0ss 0.10 0.1s o.% x 0.40 x 0.6s x 1.0 lb-
etn
x x 4
Ic ft k R{ Ie Re he no Ae no Ie RO AC Rc k ,Ib Ae m Aa Ro he Ro AC no Ac h Ae R@
— i

I%o I 2 13 5 t 70 09 10 11 12 13 14 11 10 19 21 32 A
● 13!M

Uee Uee

600 * 02 03 14 2 s 31 31 59 $ 10 7 11 9 14 11 16 A 600
Lam@ ● buet
1- 12 34 4s 6 ? 99 11 12 12 13 IS 16 to t9 ~ 24 2427 Moo

n R

● U2 92 9 6 04 04 0s 06 11 1 8 29 A 31s
31s

020 qt “o 3 1 s It 27 30 39 4 10 6 11 r 14 w

us ?2 03 ? 6 30 49 6 10 1 11 0 13 II 11 13 19 94s

Wl$49 l= )3 14 ) T s 10 6 11 8 n 10 Is Is 11 M 22 19 2S 12s0

1s?s 13 Z4 ) o 7 11 9 12 11 Is 14 11 11 20 nn 2s29 1s7s

1020 13 3s r 9 1012 2 14 14 17 18 20 N n 2729 31 33 low

Eos 13 45 ) 101314 4 Is la 19 21 22 B* 3233 32s m%

0.010 0.01s %. 0.02s).040 0.066 0.10 0.1s o.% ~ 0.40 ~ 0,6s ~ }.0 ~ “/#’
:

t. ill I i 1!
},!, ! ,,, ,, .1,,

a
TAl)lE X-R-2 - SAMPLING PIANS FOR SAMPlf SIZE CODE lEIER: R

k+
QudltT
Acmpmblr (wmel IMPA-)

d
T7?C
0.010 0.015 0.0E4 O.oto O.MS 0.10 0.1s~ o,~ ~’ 0.40 x 06
x x
k nc k m c R Ic he Ac nc k RI k Re At R? Ac R, At Ih Ac ne k n. AC R?

$IU19 01 I 2 23 56 1 8 @ 9 10 11 12 13 14 Is 10 19 21 n mm

Ua on

I
MO 0 2 03 15 3 7 37 59 b 10; ✟ II 9 14 II Id 12s0
cede
MI* t%m talc!
I 2 34 61 o 9 11 12 12 13 IS 16 It )9 n24 2621 m

s —-
o 1

300 c 1 *3 ● 4 0 4 04 05 06 1? I o 29 *

low m z 03 15 I 6 21 30 39 4 10 4 11 1 14 1(CM

IWO 0 z 03 26 3 0 49 6,10 1 12 0 13 11 1? 13 19 IS(UJ

et
w mw 0 3 14 31 5 10 6 II o 13 ,0 is 12 11 M ?2 19 23 ‘mo

m t J 24 50 ? II ? 12 II Is 14 11 It 29 222s 2s29 m

mo I 3 3s ?9 10 12 12 14 16 it It ~ 21 n 2729 31 33 Mm

m 2 3 4s 9 10 II 14 14 Is la 19 21 a 2!334 32 N 31 36 Wo

0.04s O.oa O.wo O.m 0.10 0.1s x 0.% x 0.40 x


x
Ucdil?
AccoptcbhI#doMzhtwlcd
Iwpcctbw)
-

— — —
I

66 .
6. NvrEE

6.1 .Mtended use. sapling p~ and tables for ~i~ by


aztrh.es are titendedto be used in the acquisitionof Defensematerial.

6.2 subject Tam (Key word) Wzing .

-able QualityLeVel (AQL)


AverageWtgoing Quality (J@)

Defect

Lo: or Eat&.

%-s Average

San@e

SaTph’lg Plan

6.3 Changes from PreviousIssue. Verticallines or aste=isksare not used in


this revisionto identify-ges with respaGLto the previous issuedue to
*theextensivenessof the ~.

67
MIL-STW105E

mum.% MATERXAL

Cus’mdiam : PreparingActivity:
Amy - m Army-Al?
Na\’y- CS
fir Force - 23

Review ?kcceivities:
~- MI, EA, TE, AV, ER (Pro- CCIC-0085)
Navy - As, ECr FZ, CM, S&
Slitm, YD
DW - Es, Gs, Ss
OSD-IP, SO
User Ac+.i\-ities:
ArTIT’-m
DLA - Es, Ss

68
imu u - w)

)EPARTMEN7 OF THE ARMY

111111
p UWTEO -AT,
,
>FFOCtAL SuEt~
WNALTV ●OR ●RIVATE USE ~ BUSINESS
FIRE? CL-
REPLY MAIL
PERMtT No ts WASHINGTON D C

PO=AGE WILL SE ●AtD BY THE DEPARTMEN7 OF THE ARMY

PICATnwY ~, NJ 07806-5000

.
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
(&e Inmucn’ms - RmwxSi&)

Iu VEUOOR

Minat Terkait