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MULTIJUNCTION SOLAR CELL ISO-JUNCTION DARK CURRENT STUDY

Kitt C. Reinhardt, Clay S. Mayberry, Brendan P.Lewis, Spacecraft Component Technology Branch
Air Force Research Laboratory, Space Vehicles Directorate (AFRUVSSV), Kirtland Air Force Base, NM
871 17-5776

Theodore L. Kreifels, Chief Scientist, Space & Aeronautics Technology Division


Jackson and Tull, Albuquerque, NM 87106

ABSTRACT maximum power point (MPP), is the short circuit


current, is the magnitude of dark current at
Single-crystal multijunction solar cells MPP, and Io and A are the values of reverse
show great promise for achieving 30-40% saturation current and ideality factor, respectively,
conversion efficiency under air mass zero (AMO) associated with ldmax. Clearly the magnitude of both
conditions, and have been identified as an and Io will critically affect P, and overall
enabling technology for next-generation efficiency. Consequently, a large volume of work
government and commercial satellites. In this [I-41 has been devoted to the identification and
note we report on an approach to better source reduction of dark current in solar cells,
understand the dark current-voltage (I-V) notably in single junction Si and GaAs solar cells.
behavior in multijunction solar cells and it’s effect
on conversion efficiency. This technique is based
on determining the impact of dark-current
behavior within individual p-n junctions on
monolithic triple-junction GaInP2/GaAs/Ge solar Area = 4 cm2
cell performance. The GaInP?/GaAs/Ge tandem
solar cells used in this study were developed, in
part, under the US Air Force’s Manufacturing 0.050
Technology (ManTech) Program and exhibited
measured efficiencies of 24-25% (AMO).
-
rl

15.2
Introduction 18.6 -
20.1 .
Today’s spacecraft have greater power 21.2
22.8 -
requirements than ever before. More electrical 24.4 .
energy is needed to run increasingly complicated
and diversified payloads that are assigned longer
.I .1
and more complex missions. To support these -0.075 - 4ls,=0.O61 to . I.
missions, the US Air Force Research Laboratory I
. .
(AFRL) has been involved in the research and 0.062 A !
-0.100
1.0
. ’
1.5
’ ’
2.01
’ ’
! 2.5
’ ’
3.0

3.5
development of high-efficiency 111-V
scmiconductor-based multijunction solar cells Voltage (V)
since 1990, including programs to develop the Fig. 1. Linear plot of dark and light I-V
first large-area 2-junction GaInPJGaAs, 3- characteristics of a GaInP2/GaAs/Ge solar cell. A
junction GaInP2/GaAs/Ge, and most recently, direct correlation is shown between decreasing
novel 4-junction solar cell designs. efficiency with increasing dark current.
Solar cell dark I-V behavior is known to
play an important role in limiting single junction
solar cell open-circuit voltage (V,& fill factor While detailed studies of dark I-V behavior for
GaInP: p-n diodes and solar cells have been
(ET),and conversion efficiency (q). This can be
reported [ 5 ] , detailed analysis of dark I-V behavior
seen from Equation 1,
of multijunction solar cells, and in particular,
monolithic GaInP2/GaAs/Ge solar cells, has not
been addressed in detail. In this study we
investigated the impact of individual (iso-) junction
where P,, I , and V,,, are the maximum power, dark current behavior on 3-junction solar cell
currcnt, and voltage, respectively, at the cell’s performance.

0-7803-5772-8/00/$10.00 Q 2000 IEEE 1118


1oo t . I . 1 ’ “turn-on” therefore critically limits photo-voltage at
Area = 4 cm2 MPP and overall efficiency.
Temp = 27 gC Values for Idiff, I,,,, Adir and A,, are generally
easily obtained for single junction solar cells using
1 o‘l the simplified diode equation

s (3)

where the dark current-voltage curve is generally


dominated by the A-2 current mechanism at lower
voltages than the A- 1 dark currents [ 5 ] .

Of special interest was the use of Equation 3 to


determine values of A for the 3-junction solar cells
in Figure 1. Typical observed values for A near the
10‘~
1.o 1.5 2.0 2.5 3.0 MPP for well-behaved cells (24-2576 efficient) were
Voltage (V) A-4 - 5. For single junction solar cells a value of A
> 2 would normally indicate dominance of tunneling
dark current. However, multijunction solar cells
have multiple dark current mechanisms acting
Fig. 2. Dark I-V characteristics of a simultaneously in multiple junctions which
GaInPz/CaAs/Ge (3-junction) solar cell complicates the interpretation of A values.
correlated with voltage at the maximum power
point, VM, and efficiency. To understand the high observed values of A in
the 3-junction GaInPz/GaAs/Ge solar cells, we
Experimental

As shown in Figures 1 and 2, a direct


correlation is evident between high dark current
values and reduced MPP. In all cells measured V
(-30), I,, was nearly constant as shown in Figure
I , and significant variations in performance
resulted from large “leaky” dark currents. Figure
3 shows the basic equivalent circuit diagram for a
single junction p-n solar cell. The dark current
mechanisms shown by the diode symbols
represent current due to diffusion, recombination Fig. 3. Equivalent electrical circuit depicting
and tunneling. These dark currents directly dark current mechanisms for a multijunction
substract from the light-generation short-circuit device.
current (Isc) according to
analyzed the equivalent electrical circuit model
shown in Figure 4. We assumed that either a single
dark current mechanism dominates each junction at
MPP or a combination of diffusion and
where the contribution due to tunneling can be recombination dark current was present resulting in
neglected near the MPP for high quality devices. values of A between 1 and 2. Using KirchofSs
Idiff and I,, are the reverse saturation Currents due
voltage law, the sum of the voltage drops around the
to carrier diffusion and recombination, GaInP?/GaAs/Ge triple-junction circuit shown in
respectively, V is the voltage across the diode Figure 4 may be expressed as
junction. and biff-and A, are the diode ideality
-
factors. Values for Adiff 1.0 and A, 2 are-
predicted according to the classic Shockley and
Sah-Noyce-Shockley diodes models, respectively.
It is noted that premature dark current mechanism

1119
+v where
GalnP
-
Equation 9 explains the high observed values of A -
4 - 5 for the 3-junction solar cells, where typical
measured values of A for dark current at MPP for
individual junctions (discussed in next section) were
-

P
1.5 - 2. We also see from Equation 8 the
important role the values of reverse saturation
+V current, IGrlnP2, IGoAs, Ice for individual junctions
Ge play. It is noted that in good cells the values for
- reverse saturation currents are determined by the
dominant mechanism, diffusion or recombination,
where Idiff is generally many orders of magnitude
lower than I,, 151. The relative affect of reverse
Fig. 4. Equivalent electrical circuit model saturation current on total dark is shown in Figure 5,
assuming single dominant dark current where each value of I c a l n ~IcaAs,
, and Ice is varied
mechanism per junction. over 3 orders of magnitude, while the other two
values of reverse saturation current remain constant.

where V is the total voltage across the triple


~ , ~V,, , are the
junction device. and V C ~ V~G ~ ,and
voltage drops across their respective individual
junctions. Substituting Equation 4 into Equation 3
for the GaInPz junction yields

where IGUI~PZ VGUI~P~and AG~IOPZare the


saturation current, voltage, and ideality factor for
the GaInPl junction. Then, from Equation 3
Fig. 5. Results of sensitivity analysis showing
variation of forward current with three decades of
change in the reverse saturation current.

with similar results for VGe, Substituting these Iso-Junction Measurements


expressions for Vcd, and V G ~into Equation 5
yields To better understand the observed values for A and
the role that individual dark current mechanisms play
in each junction, we developed an "iso-junction" test
structure shown in Figure 6, to allow us to physically
probe individual junctions and measure individual
ideality factors and reverse saturation currents for the
3-junction GaInP/GaAs/Ge solar cell. Dark current
which may be re-written as
measurements were taken using standard equipment
from 0.0 V to a voltage corresponding to a current
limit of 0.1 A. In all cases, this range included the
knee of the diode I-V curve. Currents were
normalized to device area to produce current density

1120
from these cells revealed additional data where values
for ideality factor and reverse saturation current were
determined from fitting Equation 3 at the MPP of the
I-V curve. Values obtained for Ace= 1.4, JC,=lxlO-
6 '
Ncm-, A G ~ 1.4- ~ ~I .6,
~ JG%\~=
= 1x 1 0 " - l x 1O'I'Ncm',
ACalnP2= 1.9-2. I , and J c D l n ~ = 1x 1P A / c m ' .

Conclusions

Fig. 6. Three-dimensional sketch of an We have shown the impact of deleterious high dark
individual mesa of a GaInP/GaAs/Ge triple currents on 3-junction GaInP?/GaAs/Ge solar cell
junction solar cell. performance and identified the dominant dark current
mechanisms within individual GaInP?, GaAs, and Ge
solar cell p-n junctions as determined through voltage
dependencies. Dark current mechanisms due to carrier
diffusion and carrier recombination were identified
within the p-n junctions.

Acknowledgement

The authors wish to thank Dr. .Paul Sharps and


Jennifer Hills, Emcore Corporation, and John
Nocerino, Aerospace Corporation, for their valuable
insight. technical skills, and assistance.

[ I ] M. Wolf, G. T. Noel, and R. J. Stirn, Trans.


J L Electron Device 24, 1977, p.419.
lE.10 1 ' I [I1 B. B. Rao, S. Banerjee, W. A. Anderson, and M.
1 2 3 4
K. Han, IEEE Trans. Electron Device 32, 1985, p.
Vobge M
81 7.
[31 P. D. DeMoulin, S. P. Tobin, M. S. Lundstrom, M.
Fig. 7. Dark current data taken from iso- S. Carpenter, and M. R. Melloch, IEEE Electron
junction test structure. Device Lett. 9, 1988, p. 368.
[A] P. D. DeMoulin, C. S. Kyono, M. S. Lundstrom,
(J. A/cm'). Light I-V measurements were taken and M. R. Melloch, Proceedings of the 7dh /€€E
using an AM0 solar simulator calibrated with a Photovolalics Specialists Conference (IEEE, New
GaAs balloon standard. York, 1987), p. 368.
Although our first "iso-junction" test structure [5]K. C., Reinhardt, Y. K. Yeo, and R. L. Hengehold,
exhibited significant resistance at moderate current "Junction Characteristics of Gao.slno.sP n'p Diodes
densities. values measured at MPP were Ace= 1.5, and Solar Cells", J, Appl, Phys, 77 (ll), 1995, pp.
J G ~Ix
= 1 0 ' 6 y m ' (! is current density), AcnAs=I .5, 5763-5772.
Jc;dS= Ix I O-"Ncm-, AGdlnpZ=2.1, and JG.,~~E= 1 x 10-
I4
A/cm'. Values for Ace = 1.5 and AcaAs= 1.6
indicates dark current consistent with a mixture of
diffusion and recombination. The value of AcalnP2 =
2. I is consistent with recombination current that has
been reported before [SI.
To help eliminate the deleterious series resistance
effects, two alternative test structures were
fabricated and tested, The first was from a wafer
containing a large area, triple-junction
GaInPJGaAs/Ge solar cell that was successively
etched to reveal mesa diodes consisting of triple-
junction, dual-junctions, and single-junction
devices. The second was a set of structures
containing single junction CaInP?, GaAs, and Ge
iso-junction solar cells. Analysis of dark current

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