5, 2011
DOI: 10.1007/s11664-011-1514-3
2011 TMS
696
High-Temperature Thermoelectric Properties of Co4Sb12-Based Skutterudites 697
with Multiple Filler Atoms: Ce0.1InxYbyCo4Sb12
CoSb3
+ Yb2O3
InSb In0.2Yb0.2Co4Sb12
*
Intensity (arb. units)
Ce0.1In0.15Yb0.15Co4Sb12
Ce0.1In0.1Yb0.2Co4Sb12
20 22 24 26 28 30 32 34 36 38 40 42 44
2θ (°)
Fig. 2. Cu Ka radiation x-ray diffraction (XRD) pattern for all samples (Rigaku Miniflex diffractometer).
High-Temperature Thermoelectric Properties of Co4Sb12-Based Skutterudites 699
with Multiple Filler Atoms: Ce0.1InxYbyCo4Sb12
Fig. 3. SEM and EDS results for the Ce0.1In0.1Yb0.2Co4Sb12 sample showing the presence of Yb-rich secondary phase.
700
Ce0.1In0.15Yb0.15Co4Sb12 density, an increase in the scattering parameter
600
T-1.5 may suggest enhancement of the Seebeck coefficient
as well.18 The temperature dependence of the See-
500
beck coefficient and electrical conductivity are
400 shown in Fig. 5a and b, respectively. An increase in
300 the Seebeck coefficient is evident in the Ce0.1I-
200 n0.1Yb0.2Co4Sb12 sample and is verified by lH. Also,
100
compared with the double-filled InxCeyCo4Sb12
samples of Li et al., as well as the Yb0.2InyCo4Sb12
0
0 50 100 150 200 250 300 samples of Peng et al., there is an increase in the
Temperature (K) Seebeck coefficient from 210 lV K1 to about
240 lV K1 when the third filler is introduced. The
Fig. 4. Temperature dependence of Hall mobility for Ce0.1InxYby-
Co4Sb12 samples. electrical conductivity, in Fig. 5b, is similar at high
temperatures. At low temperatures, however, there
is a decrease in electrical conductivity with respect
skutterudite structure.16 Field-emission scanning to the amount of In induced in the samples. The r
electron microscopy (FESEM Hitachi S4800) images of Peng’s double-filled Yb0.2In0.2Co4Sb12 has a
confirm Yb-rich sites on the grain boundaries of the maximum around 0.9 mX1 cm1, whereas the
fractured bulk ranging from approximately 20 nm Ce0.1In0.15Yb0.15Co4Sb12 sample (Fig. 5b) has a maxi-
to 400 nm in size (Fig. 3). To date, we have not veri- mum r at 1.1 mX1 cm1. Thus, we can conclude
fied the presence of InSb through SEM/EDS analy- that introduction of Ce as the proposed third filler
sis even though it is clearly visible in the HRXRD has improved the skutterudite’s electrical perfor-
analysis. mance at low temperatures. This improvement,
All of the samples discussed herein show n-type therefore, may be partially attributed to the InSb
heavily doped semiconductor behavior. As shown in secondary nanophases formed due to the Ce filling
Table I, densities are all greater than 97% of their more of the voids. Further studies to investigate the
theoretical value. Nominal composition, carrier role and location of the InSb nanophases are cur-
concentration (n), and density (q*) values at room rently in progress.
temperature are also listed in Table I. Mobility (lH) Figure 6a displays the temperature dependence
versus temperature is plotted in Fig. 4 for the of the total thermal conductivity (jT) from 300 K to
various samples. All of the samples exhibit a T3/2 850 K. Recall that jT is derived from measure-
behavior that is consistent with acoustic phonon ments of thermal diffusivity (D) using the equation
700 Graff, Zhu, Holgate, Peng, He, and Tritt
Lattice TC (W/m-K)
5
Seebeck Coefficient (microV/K)
-50 3
2
Ce0.1In0.1Yb0.2Co4Sb12 3.7 1
0
Ce0.1In0.15Yb0.15Co4Sb12 0 200 400 600 800
-100 3.5 Temperature (K)
3.3
-150
3.1
In0.2Yb0.2Co4Sb12
2.9
-200 Ce0.1In0.1Yb0.2Co4Sb12
Ce0.1In0.15Yb0.15Co4Sb12
2.7
300 400 500 600 700 800
-250
Temperature (K) Temperature (K)
In0.2Yb0.2Co4Sb12 1.4
5
Ce0.1In0.1Yb0.2Co4Sb12
1.2
Ce0.1In0.15Yb0.15Co4Sb12
4 1
3 ZT 0.8
In0.2Yb0.2Co4Sb12
0.6
2 Ce0.1In0.1Yb0.2Co4Sb12
0.4
Ce0.1In0.15Yb0.15Co4Sb12
1 0.2
0
0 300 400 500 600 700 800 900
0 100 200 300 400 500 600 700 800 900
Temperature (K) Temperature (K)
Fig. 5. Temperature dependence of (a) Seebeck coefficient and (b) Fig. 6. Temperature dependence of (a) thermal conductivity (jT)
electrical conductivity for Ce0.1InxYbyCo4Sb12 samples. with inset of lattice thermal conductivity (jL = jT jE) and (b)
dimensionless ZT for Ce0.1InxYbyCo4Sb12 samples.
phases to pinpoint their possible contributions to 2. G.A. Slack, CRC Handbook of Thermoelectrics, ed. D.M.
the observed enhancements of thermoelectric Rowe (Boca Raton, FL: CRC, 1995), pp. 407–440.
3. G.A. Slack and V.G. Tsoukala, J. Appl. Phys. 76, 1635
properties in these materials. The third filler ele- (1994).
ment Ce gives rise to further potential enhance- 4. C. Vining, Nat. Mater. 7, 765 (2008).
ment of electrical and thermal performance in these 5. L. Xi, J. Yang, C. Lu, Z. Mei, W. Zhang, and L. Chen, Chem.
materials as compared with Peng’s reported double- Mater. 22, 2384 (2010).
6. J. Peng, J. He, P. Alboni, and T.M. Tritt, J. Electron. Mater.
filled sample. The sustainability of a ZT >1 over a 38, 981 (2009).
broad temperature range allows for application of 7. X. Shi, J.R. Salvador, J. Yang, and H. Wang, J. Electron.
these materials within the specific temperature Mater. 38, 930 (2009).
range of 590 K to 800 K. A state-of-the-art maxi- 8. L. Zhang, A. Grytsiv, P. Rogl, E. Bauer, and M. Zehetbauer,
mum ZT of 1.4 at about 800 K was found in the J. Phys. D 42, 225405 (2009).
9. J.Y. Peng, J. He, Z. Su, P.N. Alboni, S. Zhu, and T.M. Tritt,
triple-filled Ce0.1In0.1Yb0.2Co4Sb12. J. Appl. Phys. 105, 084907 (2009).
10. G. Nolas, M. Kaeser, R.T. Littleton IV, and T.M. Tritt, Appl.
ACKNOWLEDGEMENTS Phys. Lett. 77, 12 (2000).
The work at Clemson University is supported by 11. J.P. Fleurial, A. Borshchevsky, T. Caillat, D.T. Morelli, and
G.P. Meisner, ICT 15th (1996), pp. 91–95.
DOE/EPSCoR Implementation Grant (#DE-FG02- 12. T. He, J. Chen, H.D. Rosenfeld, and M.A. Subramanian,
04ER-46139), and the SC EPSCoR cost sharing Chem. Mater. 18, 759 (2006).
program. One of the authors (J.P.) would like to 13. A.L. Pope, R.T. Littleton IV, and T.M. Tritt, Rev. Sci.
acknowledge the financial support from the Instrum. 72, 3129 (2001).
National Natural Science Foundation of China 14. A.L. Pope, B. Zawilski, and T.M. Tritt, Cryogenics 41, 725
(2001).
(Grant No. 50972047) and the Scientific Research 15. X.Y. Zhao, X. Shi, L.D. Chen, W. Zhang, S.Q. Bai, Y.Z. Pei,
Foundation for the Returned Overseas Chinese X.Y. Li, and T. Goto, Appl. Phys. Lett. 89, 092121 (2006).
Scholars, State Education Ministry. We would also 16. H. Li, X. Tang, Q. Zhang, and C. Uher, Appl. Phys. Lett. 94,
like to acknowledge Sloan Lindsay and Wenjie Xie 102114 (2009).
17. S. Ballikaya, G. Wang, K. Sun, and C. Uher, J. Electron.
for their time and support of the project. Mater. doi:10.1007/s11664-010-1454-3.
18. J.P. Heremans, C.M. Thrush, and D.T. Morelli, J. Appl.
REFERENCES Phys. Lett. 98, 063703 (2005).
1. T.M. Tritt and M.A. Subramanian, Guest Editors, MRS 19. J. Yang, D.T. Morelli, G.P. Meisner, W. Chen, J.S. Dyck, and
Bull. 31, 188 (2006). C. Uher, Phys. Rev. B 65, 094115 (2002).