Content
Analytical strategies Introduction standardless analysis Omnian advantages Omnian features
Analytical strategies
Conventional calibration or Standardless analysis? PK?
Highest precision Highest accuracy
Full traceability
Full flexibility
Good accuracy without in-type standards Good comparative data/trend analysis / Ideal screening tool
Covers all common elements that can be measured by XRF: by default O-U O-UXRF Makes use of (a form of) Fundamental Parameter (FP) calculations to correct for all sample-matrix specific properties Handles most types of samples, including solids, pressed powders, fused beads, loose powders and liquids
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Two steps:
1. Determine which elements are present in the sample 2. Calculate the concentration of each element that is present. This gives the total sample composition
NOTE: A conventional analysis only has to deal with step 2, because the elements of interest are already known.
Omnian advantages
The right result every time
Having advanced algorithms for the determination of background, peak search & match and lineoverlaps
Providing an accurate background profile Superior to the estimations obtained from fixed background positions Providing a view of all peaks and backgrounds across the periodic table Reduces the chance of incorrect element identification
Easy to use
Handles almost all sample types with one calibration program
Solids, pressed powders, fused beads, loose powders and liquids
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Easy to use
Scaleable from routine to advanced usage
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Quick screening
For determination of the sample type (e.g. for further processing steps) For screening on presence of specific elements
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Failure analysis
To identify steps in a process where things might go wrong, e.g by analyzing: A particular bolt or screw A powder that was found in an instrument; it might come from components wear
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Omnian features
Advanced technology Boosting the accuracy with ASC
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Advanced technology
Omnians advanced FP algorithms deal with:
Finite thickness characteristics
High-energy lines will have a larger penetration depth in the sample than low energy lines The penetration depth in light matrices is larger than in heavy matrices
Oil
Steel
Irradiated and detected (Penetration depth) Not irradiated and detected
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FP corrects in case the sample is not infinite thick for all measured energies
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Advanced technology
Omnians advanced FP algorithms deal with:
Fluorescence Volume Geometry (FVG)
The irradiated area of a light-matrix sample is not only determined by the penetration depth
It is also determined by the geometry of the optical path
FP corrects for the FVG effect It takes into account the real geometry of the irradiated area, which is far more complex than the wedge-shape as drawn in the picture
(16 mm)Cd-Ka ( )
FVG / FT
Cd-Ka in thick PE sample
160 140 120 Concentration (ppm) 100 80 60 40 20 0 With FVG and FT No FVG, with FT No FVG, No FT Measured
1 disc
1 disc, no FT
S Cl Cr As Br Cd Sb (La) Hg Pb
Certified
914 98 18 300 19 75 10 36
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Advanced technology
FP calculates the Dark Matrix compounds from the measured Compton-scattered tube intensity
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Example: B in glass
This clearly indicates that using the Compton intensity gives a far more accurate result Example: LOI in Limestone There is not much difference between calculating LOI as balance or from the Compton line, but: this comparison gives a clear indication of the correctness of the results! ,
GBW07215a, Limestone fused bead Certified Measured Measured (wt%) (wt%) (wt%) 0.072 0.072 Na2O MgO 2.29 2.266 2.262 0.77 0.812 0.811 Al2O3 SiO2 1.8 1.951 1.947 SO3 0.755 0.716 0.714 0.168 0.134 0.133 K2O CaO 51.2 51.31 51.041 0.446 0.571 0.562 Fe2O3 SrO 0.041 0.039 Compton 40.549 Balance 42.42 L.O.I.:
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NBS 1411, glass Certified Measured Measured (wt%) (wt%) (wt%) 10.94 Compton 10.1 Balance 20.2 B2O3 F ~0.5 0 0 10.14 11.1 10.3 Na2O MgO 0.33 0.32 0.29 5.68 6.04 5.43 Al2O3 SiO2 58.04 57.9 51.6 K2O 2.97 2.7 2.33 2.18 2.2 1.89 CaO Fe2O3 0.05 0.059 0.049 3.85 4.04 3.36 ZnO SrO 0.09 0.092 0.076 5 5.33 4.35 BaO TiO2 0.02 0 0
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ASC automatically selects the calibration line that best corrects for: Specific sample matrices or concentration ranges Variations in sample preparation methods Enhancing the accuracy while maintaining the flexibility of standardless analysis
CKD 238 Al alloy Certified (wt%) 0.32 11.78 0.16 0.145 0.56 0.03 0.37 0.32 ASC Default Measured Measured (wt%) (wt%) 0.296 0.301 12.083 13.949 0.163 0.14 0.004 0.004 0.138 0.133 0.584 0.579 0.021 0.025 0.395 0.474 0.236 0.307 0.008 0.008 0.001 0.001 0.007 0.007 86.064 84.071
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Mg Si Ti Cr Mn Fe Ni Cu Zn Ga Zr Pb Al (bal)
FastScan analysis
FastScan analysis is a unique feature of Omnian coupled with an Axios spectrometer OmnianAxios
For a quick determination of all majors and minors
With a measurement time of about 1 minute the scan program covers the complete periodic table 1 Combining FastScan with selected peak measurements, the accuracy for critical or lowconcentration elements can be increased
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Easy comparison of data Print or transfer to files or LIMS LIMS Default measurement program can be easily extended with extra scans or peak measurements
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Omnian
Application examples
CKD 236 Al alloy CKD 240 Al alloy CKD 242 Al alloy CKD 245 Al alloy Default Default Default Default Certified Measured Certified Measured Certified Measured Certified Measured (wt%) (wt%) (wt%) (wt%) (wt%) (wt%) (wt%) (wt%) Mg 0.21 0.212 0.66 0.669 7.50 7.533 4.39 4.491 7.46 7.849 10.13 11.468 0.33 0.376 1.80 1.932 Si Ti 0.025 0.027 0.07 0.058 0.10 0.087 0.095 0.088 0.27 0.27 0.01 0.005 0.52 0.498 Mn Fe 0.23 0.227 0.45 0.452 0.05 0.051 0.74 0.727 Ni 0.36 0.361 0.91 1.069 0.209 0.21 0.237 0.7 0.831 0.005 0.008 0.19 0.225 Cu Zn 0.05 0.041 0.06 0.059 0.01 0.019 0.14 0.198 0.007 0.006 0.006 0.008 Ga Zr 0.001 0.002 0.001 0.023 90.945 85.1 92.001 91.588 Al (bal)
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Metal drillings
Certified Element Si P S V Cr Mn Fe Co Ni Cu As 0.04 6.26 15.2 0.78 (%) 0.42 0.016 0.016
Measured (%) 0.889 0.01 0.058 0.029 16.008 0.789 74.701 0.034 7.003 0.175 0.023
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