Material Analysis Report

10101 006 1015 Report #: M101015-006

CUSTOMER / REQUESTOR CUST INCIDENT # CUST PART# POINT OF FAILURE

Jing Robles

Product Information:
ON SEMICONDUCTOR PART # PRODUCT LINE BUSINESS UNIT

TQFP Socket
PRODUCT DESCRIPTION

N/a
TECHNOLOGY

N/a
PACKAGE TYPE

N/a

N/a

100 TQFP

Detailed Unit Information:

UNIT # QTY MARKING DATE CODE ASSY SITE ASSEMBLY LOT # TEST SITE WAFER FAB WAFER LOT #

1-3

Analysis Summary:
UNIT # FAILED TEST(S) FAILURE MECHANISM COMMENTS

Summary Narrative:
Process Engineering submitted three test sockets for Scanning Electron Microscope (SEM) imaging before and after cleaning. The requestor would like to determine the effectiveness of three different types of brushes used in cleaning the sockets. Representative SEM images were taken of the contactor pins of the three submitted sockets. Refer to Figures 1-6.

Team Information:
PRODUCT QUALITY: RELIABILITY ENGINEER: CONTRIBUTOR: PRODUCT ENGINEER: PRODUCT QUALITY: FAILURE ANALYST: REPORT REVIEW: CONTRIBUTOR:

Jasmin Navarro
LAB MANAGER:

Froilan Ubungen
Lab Submitted:

10.21.2010

Analysis Completed:

10.21.2010

Report Reviewed:

10.21.2010

ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027

Product Analysis Laboratory

Report #: M101015-006

Fig 1: SEM photos of the representative contactor pins from the Eraser socket.

Page 2 of 7
ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027

Product Analysis Laboratory

Report #: M101015-006

Fig 2: SEM photos of the representative contactor pins from the Eraser socket.

Page 3 of 7
ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027

Product Analysis Laboratory

Report #: M101015-006

Fig 3: SEM photos of the representative contactor pins from the Nylon socket.

Page 4 of 7
ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027

Product Analysis Laboratory

Report #: M101015-006

Fig 4: SEM photos of the representative contactor pins from the Nylon socket.

Page 5 of 7
ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027

Product Analysis Laboratory

Report #: M101015-006

Fig 5: SEM photos of the representative contactor pins from the Nanotech socket.

Page 6 of 7
ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027

Product Analysis Laboratory

Report #: M101015-006

Fig 6: SEM photos of the representative contactor pins from the Nanotech socket.

Page 7 of 7
ON Semiconductor Material Analysis Lab - ON Semiconductor Phils., LotC3-10 Carmelray Industrial Park II, Calamba, Laguna Philippines 4027