Electromagnetic Properties of Materials:

Characterization at Microwave Frequencies and Beyond

Shelley Begley
Application Development Engineer
Agilent Technologies

Agenda
Definitions
Measurement Techniques
Parallel Plate
Coaxial Probe
Transmission Line and Free-Space
Resonant Cavity
Summary

Definitions
Permittivity is a physical quantity that
describes how an electric field affects and is
affected by a dielectric medium and is
determined by the ability of a material to
polarize in response to an applied electric
field, and thereby to cancel, partially, the
field inside the material. Permittivity relates
therefore to a material's ability to transmit
(or "permit") an electric fieldThe
permittivity of a material is usually given
relative to that of vacuum, as a relative
permittivity, (also called dielectric constant
in some cases).- Wikipedia

''
rr

""
rr

Df
Df

Dk
Dk

Permittivity and Permeability Definitions

Permittivity
(Dielectric Constant)

'
"
r r j r
0
interaction of a material in the
presence of an external electric field.

Permittivity and Permeability Definitions

Permittivity
(Dielectric Constant)

'
"
r r j r
0
interaction of a material in the
presence of an external electric field.

Dk
Dk

Permittivity and Permeability Definitions

Permittivity
(Dielectric Constant)

Permeability

'
"
'
"
r j r
r r j r
0
0
interaction of a material in the
presence of an external electric field.

Dk
Dk

interaction of a material in the

presence of an external magnetic field.

Permittivity and Permeability Definitions

Permittivity
(Dielectric Constant)

Permeability

'
"
'
"
r j r
r r j r
0
0
interaction of a material in the
presence of an external electric field.

Dk
Dk

interaction of a material in the

presence of an external magnetic field.

Electromagnetic Field Interaction

STORAGE

Electric
Fields
Permittivity

'
r r

MUT

"
j r

Magnetic
Fields
Permeability

r
STORAGE

'
r

"
jr

Electromagnetic Field Interaction

STORAGE

Electric
Fields

LOSS

Permittivity

'
r r

Magnetic
Fields

MUT

"
j r

Permeability

r
STORAGE
LOSS

'
r

"
jr

Loss Tangent

tan
tan ' '
rr

""
rr

''
r

'
r

11
Energy
Lost
per
Cycle
Energy
Lost
per
Cycle
tan

tan D
QQ Energy
EnergyStored
Stored per
perCycle
Cycle

D
D

Df
Df

Dissipation
Factor

QQ Quality
Factor

Relaxation Constant
Water at 20o C

= Time required for 1/e of

an aligned system to return
to equilibrium or random
state, in seconds.

100

r'r'
10

11
11

cc 22ffcc

r"r"
1

Debye equation : ( )

most energy is lost at 1/

s
1 j

10

100

f,
GHz

Measurement Techniques

Parallel
Plate
Transmission
Line including
Free Space

Coaxial
Probe

Resonant
Cavity

Which Technique is Best?

It Depends

Which Technique is Best?

It Depends on
Frequency of interest
Expected value of er
Required measurement accuracy

Which Technique is Best?

It Depends on
Frequency of interest
Expected value of er
Required measurement accuracy
Material properties (i.e., homogeneous, isotropic)
Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions

Which Technique is Best?

It Depends on
Frequency of interest
Expected value of er
Required measurement accuracy
Material properties (i.e., homogeneous, isotropic)
Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions
Destructive or non-destructive
Contacting or non-contacting
Temperature

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Transmission line
Medium

Free Space
Parallel
Plate

Resonant Cavity

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Medium

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Medium

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Transmission line
Medium

Free Space

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Transmission line
Medium

Free Space

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Transmission line
Medium

Free Space
Parallel
Plate

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Measurement Techniques
vs. Frequency and Material Loss
Loss
High

Coaxial Probe

Transmission line
Medium

Free Space
Parallel
Plate

Resonant Cavity

Low

Frequency
50 MHz

Low frequency

5 GHz
RF

20 GHz
Microwave

40 GHz

60 GHz

500+ GHz
Millimeter-wave

Parallel Plate Capacitor System

LCR or Impedance
Analyzer

C
C
AA
00
tt
tan
tan D
D

''
rr

Dielectric Test
Fixture

(magnetic fixture
also available)

Impedance Analyzers and Fixtures

Measurement Techniques that use a

Vector Network Analyzer
Coaxial Probe
Transmission Line and Free-space
Resonant Cavity

Coaxial Probe System

Computer
(not required for
PNA)

Network Analyzer
(or E4991A Impedance
Analyzer)

GP-IB or
LAN

85070E Software
(included in kit)

85070E
Dielectric
Probe

Coaxial Probe
Material assumptions:
effectively infinite thickness
non-magnetic
isotropic
Reflection
(S1 )
1

homogeneous
no air gaps or bubbles

Three Probe Designs

High Temperature Probe

0.200 20GHz (low end 0.01GHz with impedance
analyzer)
Withstands -40 to 200 degrees C
Survives corrosive chemicals
Flanged design allows measuring flat surfaced
solids.

Three Probe Designs

Slim Form Probe

0.500 50GHz
Low cost consumable design
Fits in tight spaces, smaller sample sizes
For liquids and soft semi-solids only

Three Probe Designs

Performance Probe
Combines rugged high temperature
performance with high frequency
performance, all in one slim design.
0.500 50GHz
Withstands -40 to 200 degrees C
Hermetically sealed on both ends, OK for autoclave
Food grade stainless steel

Transmission Line System

Computer
(not required for
PNA)

Network Analyzer

GPIB or
LAN

85071E Materials
Measurement
Software
Sample holder
connected between coax
cables

Transmission Line
Material assumptions:
sample fills fixture cross section
no air gaps at fixture walls
flat faces, perpendicular to long axis

Known thickness > 20/360

Reflection
(S11 )

Transmission
(S21 )

Transmission Line Sample Holders

Coaxial

Waveguide

Transmission Algorithms
Algorithm

Measured S-parameters

Optimum
Length

Nicolson-Ross

S11,S21,S12,S22

/4

Precision (NIST)

S11,S21,S12,S22

Fast

S21,S12

Output

r and r

(85071E also has three reflection algorithms)

Transmission Free-Space System

Computer
(not required for
PNA)

Network Analyzer

GP-IB or
LAN

85071E Materials
Measurement
Software
Sample holder
fixtured between two antennae

Transmission Free-Space
Material assumptions:
Flat parallel faced samples
Sample in non-reactive region
Beam spot is contained in sample

Known thickness > 20/360

Reflectio
n
(S11 )

Transmissio
n
(S21 )

Non-Contacting method for High or Low

Temperature Tests.

Free Space with Furnace

75-110GHz Free Space System

Free Space 75-110GHz Quasi-Optical System

Agilent

Free Space 75-110GHz Quasi-Optical System

Free Space 75-110GHz Quasi-Optical System

Free Space 75-110GHz Quasi-Optical System

Free Space 75-110GHz Quasi-Optical System

Reflectivity Measurement System

Network
Analyzer with
Time Domain
option

Computer
(not required
for PNA)

GP-IB or
LAN

85071E
Materials
Measurement
Software
with Reflectivity
Option 200

NRL Arch Fixture with MUT

NRL Arch
Results in dB
port 1

port 2

S21
Reflect
ed
Wave

Inciden
t Wave

MUT

Resonant Cavity System

Computer
(not required for
PNA)

Network Analyzer

GP-IB or LAN

Resonant Cavity
Software
Resonant Cavity with
sample
connected between
ports.

Resonant Cavity Technique

empty cavity
fc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity

sample inserted
Qc

Qs

Qc = Q of Empty Cavity
Qs = Q of Filled Cavity

fs

Vs = Volume of Empty Cavity

Vc = Volume of Sample

ASTM 2520

fc

Resonant Cavity Fixtures

Agilent Split Cylinder

Resonator IPC TM-6502.5.5.5.13

ASTM 2520
Waveguide
Resonators

Split Post Dielectric

Resonators from
QWED

Resonant vs. Broadband Transmission

Techniques
Resonant

Broadband

Yes

No

er resolution 10-4

er resolution 10-2-10-3

Yes

No

Thin Films and Sheets

10GHz sample thickness

<1mm

10GHz optimum thickness ~

5-10mm

Calibration Required

No

Yes

Measurement Frequency
Coverage

Single Frequency

Broadband or Banded

Low Loss materials

Summary Technique and Strengths

Parallel Plate

Low Frequency
Best for thin flat sheets

Coaxial Probe

Broadband

Transmission Line

Best for liquids, semisolids

Broadband

Transmission Free
Space
Resonant Cavity

Best for machine-able

solids
Broadband, mm-wave
Non-contacting
Single frequency
High accuracy, Best for
low loss, or very thin
samples

Microwave Dielectric Measurement

Solutions
Model
Description
Number

85070
E

85071
E

85072
A

Dielectric Probe Kit

020
030
050

High Temperature Probe

Slim Form Probe
Performance Probe

Materials Measurement Software

100
200
300
E01
E03
E04

Free Space Calibration

Reflectivity Software
Resonant Cavity Software
75-110GHz Free Space Fixture
2.5GHz Split Post Dielectric Resonator
5GHz Split Post Dielectric Resonator

10GHz Split Cylinder Resonant Cavity

For More Information

Visit our website at:
www.agilent.com/find/materials
For Product Overviews, Application
Notes, Manuals, Quick Quotes,
international contact information

For More Information

Visit our website at:
www.agilent.com/find/materials
For Product Overviews, Application
Notes, Manuals, Quick Quotes,
international contact information

Call our on-line technical support:

+1 800 829-4444
For personal help for your application,
formal quotes, to get in touch with
Agilent field engineers in your area.

References
R N Clarke (Ed.), A Guide to the Characterisation of DielectricMaterials at RF and Microwave Frequencies, Published by The
Institute of Measurement & Control (UK) & NPL, 2003
J. Baker-Jarvis, M.D. Janezic, R.F. Riddle, R.T. Johnk, P. Kabos, C. Holloway, R.G. Geyer, C.A. Grosvenor, Measuring the
Permittivity and Permeability of Lossy Materials: Solids, Liquids, Metals, Building Materials, and Negative-Index Materials, NIST
Technical Note 15362005
Test methods for complex permittivity (Dielectric Constant) of solid electrical insulating materials at microwave frequencies and
temperatures to 1650, ASTM Standard D2520, American Society for Testing and Materials
Janezic M. and Baker-Jarvis J., Full-wave Analysis of a Split-Cylinder Resonator for Nondestructive Permittivity Measurements, IEEE
Transactions on Microwave Theory and Techniques vol. 47, no. 10, Oct 1999, pg. 2014-2020
J. Krupka , A.P. Gregory, O.C. Rochard, R.N. Clarke, B. Riddle, J. Baker-Jarvis, Uncertainty of Complex Permittivity Measurement by
Split-Post Dielectric Resonator Techniques, Journal of the European Ceramic Society
No. 10, 2001, pg. 2673-2676
Basics of Measureing the Dielectric Properties of Materials. Agilent application note. 5989-2589EN, April 28, 2005