Failure Analysis instruments: electron microscope

Instructor: Dr. Ashrafi Presented by: Elahe Shekari

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October 2011
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Agenda
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Secondary electron image Back scatter electron image Energy dispersive spectrum (EDS) Wavelength dispersive spectrum (WDS)

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Agenda
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Secondary electron image Back scatter electron image Energy dispersive spectrum (EDS) Wavelength dispersive spectrum (WDS)

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What are SE and BSE?

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Secondary electrons are low Backscattered (BS) energy electrons formed electrons are high-energy by inelastic scattering and have energy of less than electrons (>50 eV) from 50eV. the primary incident beam that are ejected back out from the samples.

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SE image
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The low energy of these electrons allows them to be collected easily. This is achieved by placing a positively biased grill on the front of the SE detector, which is positioned off to one side of the specimen. The major influence on
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Failure analysis of a river water circulating pump shaft

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Agenda
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Secondary electron image Back scatter electron image Energy dispersive spectrum (EDS) Wavelength dispersive spectrum (WDS)

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BSE image
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These BSE are used to produce a different kind of image. Such an image uses contrast to tell us about the average atomic number of the sample. The higher the average atomic number, the more
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SE and BSE images

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Agenda
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Secondary electron image Back scatter electron image Energy dispersive spectrum (EDS) Wavelength dispersive spectrum (WDS)

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Energy Dispersive Analysis

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Energy dispersive analysis, also known as EDS, is a technique used to identify the elemental composition of a sample or small area of interest on the sample.

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EDS
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During EDS, a sample is exposed to an electron beam inside a scanning electron microscope (SEM). These electrons collide with the electrons within the sample, causing some of them to be knocked out of their orbits. The vacated positions are filled by higher energy electrons which emit x-rays in the process.
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EDS analysis
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By analyzing the emitted x-rays, the elemental composition of the sample can be determined.

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Agenda
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Secondary electron image Back scatter electron image Energy dispersive spectrum (EDS) Wavelength dispersive spectrum (WDS)

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WDS
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Of the two X-ray microanalysis techniques for qualitative analysis, Wavelength Dispersive Spectrometry (WDS) analysis is distinctly different from energy dispersive (EDS) analysis. WDS identifies the
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WDS analysis
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The comparison between EDS and WSD?

WDS EDS
WDS is used to solve various spectral problems described elsewhere in this module the resolution of an WDS detector is considerably better than that of a EDS spectrometer.
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EDS is first used for element identification, for fast analysis of the entire spectrum Using EDS, all of the energies of the characteristic X-rays incident on the detector are measured simultaneously and data acquisition is therefore very rapid across the Abadan Institute of entire spectrum

The comparison between ESD and WSD 17

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The presence of tungsten in the ED spectrum (yellow) is masked by the Si K lines while the two are clearly distinguishable in the WD spectrum (blue).
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The comparison between ESD and WSD 18

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EDS and WDS in PbS

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SE, BSE and EDS mapping modes

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EDS mapping and line analysis

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References
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Severin, Kenneth P., 2004, Energy Dispersive Spectrometry of Common Rock Forming Minerals. Kluwer Academic Publishers, 225 p.--Highly recommended reference book of representative EDS spectra of the rock-forming minerals, as well as practical tips for spectral acquisition and interpretation. Goldstein, J. (2003) Scanning electron microscopy and x-ray microanalysis. Kluwer Adacemic/Plenum Pulbishers, 689
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References
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Petroglyph--An atlas of images using electron microscope, backscattered electron images, element maps, energy dispersive x-ray spectra, and petrographic microscope ( This site may be offline. ) -- Eric Chrisensen, Brigham Young University http://serc.carleton.edu/research_education/geoch emsheets/eds.html http://www.x-raymicroanalysis.com/x-raymicroanalysisexplained/pages/tutorial2/comparisonedswds.htm
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References
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Krinsley, David H., 1998, Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks,Cambridge University Press MLancha, MSerrano, JLapea, DGmezBriceo ,Failure analysis of a river water circulating pump shaft http://www.tau.ac.il/institutes/wamrc/Zahava/Zaha vaSEMExamples.pdf

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