Unggahan by erm1986

Walpole 8ed

Causas Del Suicidio

Double-sampling control charts for attributes

Bayesian tolerance interval control limits for attributes

Cartas de control Bayesianas para atributos y el tamaño de subgrupo grande en la carta

Statistical modelling and inference for multivariate and longitudinal discrete response data.pdf

Monitoring high-yields processes with defects count in nonconforming items by artificial neural network

Optimization of the new DS-u control chart. An application of Genetic Algorithms.

Optimization of the new DS-u control chart. An application of Genetic Algorithms.Perez et al. (2010)

Diseño de Planes de Muestreo con Niveles Fijos de Precisión del Pulgón Manchado de la Alfalfa, Therioaphis trifolii Monell (Homoptera

Muestreo Secuencial

CUMULATIVE SUM CHARTS FOR HIGH YIELD PROCESSES (Chan y Gan 2001)